Method for calibrating three-dimensional measurement system based on fringe structured light and three-dimensional measurement method
By using Fourier transform and frequency-weighted averaging, combined with multi-frequency phase-shifting grating projection and OpenCV calibration methods, carrier frequency phase interference is eliminated, improving the accuracy and robustness of the 3D measurement system. It is applicable to various object surfaces and complex scenes, and solves the problem of carrier frequency phase influence in 3D measurement.
CN122408664APending Publication Date: 2026-07-17JILIN COMM POLYTECHNIC
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Patent Information
- Application Number
- CN202610610648.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2026-05-06
- Publication Date
- 2026-07-17
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Figure CN122408664A_ABST
Abstract
本发明涉及三维测量领域，尤其涉及一种基于条纹结构光的三维测量系统标定方法及三维测量方法。标定阶段通过采集标定板图像，投影竖、横条纹，经傅里叶变换和反变换去除载频相位，计算绝对相位，建立相机与投影仪像素坐标对应关系，标定三维测量系统的内参与外参；三维测量阶段采集条纹图像，同样去载频后计算绝对相位，结合标定模型计算三维坐标。本发明能够有效消除载频相位的影响，提升三维轮廓测量的精度。
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