Dual-wavelength laser test assembly
Through the dual-wavelength laser testing component, the problem of difficult high-precision detection of laser and laser equipment parameters is solved, and efficient measurement of laser power stability, longitudinal mode mode, M2 value, polarization degree and short-term noise is achieved. It is especially suitable for high-precision lasers with line widths less than kHz.
Patent Information
- Application Number
- CN202421777569.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Utility models(China)
- Current Assignee / Owner
- Filing Date
- 2024-07-25
- Publication Date
- 2025-07-22
- Estimated Expiration
- 2034-07-25
AI Technical Summary
The prior art is difficult to detect the parameters of lasers and laser equipment with high accuracy, especially for high-precision lasers with line widths less than kHz, and traditional testing devices lack the measurement accuracy.
The dual-wavelength laser testing component is adopted, including a dual-wavelength beam output device, an optical power meter, a longitudinal mode measurement mechanism and a beam quality analyzer. The beam A and beam B are separated by a spectrometer, combined with a PBS prism, a convex lens and a half-wave plate to judge the beam polarization degree and longitudinal mode mode. The F-P cavity analyzer and an oscilloscope are used to detect short-term noise, and the line width is measured by delayed non-zero beat-heterodyne method.
It realizes high-precision measurement of laser power stability, longitudinal mode mode, M2 value, polarization degree and short-term noise parameters. It is suitable for high-precision lasers with line widths less than kHz. It has high test accuracy and low cost, and has fast synchronous testing efficiency for multiple parameters.
Smart Images
Figure CN223138946U_ABST
Abstract
Description
Technical Field
[0001] The utility model relates to the technical field of laser parameter testing devices, and more specifically to a dual-wavelength laser testing component. Background Art
[0002] The laser is the core component of a laser device. There is little research and development on the supporting detection device for laser parameters in China. Most laser devices and their lasers cannot perform relevant tests during application, which affects the normal performance of the functions of laser devices. Therefore, it is particularly urgent to research and develop an intelligent detection device for laser parameters and apply it to lasers and laser devices. Thus, it is an urgent need in the industry to provide a laser power characteristic tester. In addition, for the measurement of extremely high-precision lasers such as single-frequency lasers, the bandwidth is a measure of the monochromaticity of the light source. The better the monochromaticity, the longer the coherence time. Therefore, it is necessary to accurately measure the linewidth of these lasers to evaluate the performance of single-frequency lasers. However, for linewidths less than the kHz level, traditional testing devices have problems with insufficient testing accuracy when measuring such narrow linewidths. Summary of the Utility Model
[0003] In order to overcome the above-mentioned defects of the prior art, the utility model provides a dual-wavelength laser testing component to solve the problems that it is difficult to detect the parameters of lasers and laser devices and that high-precision lasers cannot be accurately tested in the above-mentioned background art.
[0004] The utility model provides the following technical solution: A dual-wavelength laser testing component includes a dual-wavelength beam output device, an optical power meter, a longitudinal mode measurement mechanism, and a beam quality analyzer. The optical power meter is used for testing the output beam power stability of a dual-wavelength laser. The beam quality analyzer is used for measuring the M 2 value of the output beam of the laser. The longitudinal mode measurement mechanism is used for judging the single-mode and multi-mode of the longitudinal mode of the laser;
[0005] The dual-wavelength beam output device includes a dual-wavelength laser. The dual-wavelength laser emits a composite beam. A shaping mirror, a first half-wave plate, and a first PBS prism are sequentially arranged on the composite beam. The composite beam is split into beam A and beam B with different wavelengths by a beam splitter. The irradiation angle of beam B is adjusted by a reflecting mirror. A first convex lens, a second half-wave plate, a second PBS prism, and a third PBS prism are sequentially arranged on both beam A and beam B. The beam separated by the first PBS prism passes through a third convex lens and irradiates onto the probe head of the optical power meter. The beams separated by the third PBS prism on beam A and beam B respectively pass through two fourth convex lenses and irradiate onto the probe heads of two beam quality analyzers. The ends of beam A and beam B respectively pass through two second convex lenses and irradiate onto the beam receiving end of the longitudinal mode measurement mechanism.
[0006] Further, the half-wave plate two and the PBS prism two are cooperatively used for measuring the polarization degree of a light beam. The half-wave plate two is a λ / 2 wave plate @532 nm, and the PBS prism two is a PBS @532 nm. The light beam separated by the PBS prism two is received by an optical eliminator.
[0007] Further, the longitudinal mode measurement mechanism includes two F-P cavity analyzers for receiving light beam A and light beam B, a high-voltage amplifier, an F-P cavity controller, an oscilloscope, a signal source, and a detector one. The CH1 of the signal source is connected to the Signal_in of the high-voltage amplifier. The Out of the high-voltage amplifier is divided by 100 and connected to CH2 of the oscilloscope. The HV_Out of the high-voltage amplifier is connected to the PZT of the F-P cavity analyzer. The Sync_Out of the signal source is connected to the EXT_Trig of the oscilloscope. The detector one is connected to CH1 of the oscilloscope. The F-P cavity analyzer is electrically connected to the F-P cavity controller. The focal length of the convex lens two is 200 mm.
[0008] Further, the longitudinal mode measurement mechanism can also be used to detect short-term noise. The light beam is injected into the detector one. The oscilloscope displays the DC voltage as P1, and the time is set to 10 ms , switch to the AC signal, measure the RMS value of the period as P2, and the short-term noise is expressed as P2:P1.
[0009] A high-precision laser test device includes a high-precision laser, a coupler one, a coupler two, a detector two, and a spectrum analyzer. The laser output by the high-precision laser is divided into light beam C and light beam D through the coupler one. The light beam C is delayed through an optical fiber delay line, and the light beam D is frequency-shifted through an optical frequency shifter. The light beam C and the light beam D are beat through the coupler two, and the beat signal is detected by the detector two and displayed on the spectrum analyzer.
[0010] The technical effects and advantages of the present utility model:
[0011] A dual-wavelength laser test component of the present utility model, through the cooperation of a dual-wavelength light beam output device, a optical power meter, a longitudinal mode measurement mechanism, and a light beam quality analyzer, can uniformly measure the laser power stability, longitudinal mode measurement judgment, M 2 value, polarization degree, and short-term noise parameters. The test accuracy is high, the cost is low, the synchronous test efficiency of multiple parameters is fast, and the applicable range is wide;
[0012] A high-precision laser test device, adopting the principle of delayed non-zero beat self-heterodyne method to measure the line width, can accurately measure the laser line width, judge the performance of the laser through the laser line width, and is more suitable for high-precision lasers with a line width less than the kHz magnitude. Description of the drawings
[0013] Figure 1Schematic diagram of the overall structure of a dual-wavelength laser test component of the present utility model;
[0014] Figure 2 Schematic diagram of the overall structure of a high-precision laser test device of the present utility model.
[0015] Reference numerals are: 1, dual-wavelength laser; 2, shaping mirror; 3, first half-wave plate; 4, first PBS prism; 5, beam splitter; 6, reflecting mirror; 7, first convex lens; 8, second half-wave plate; 9, second PBS prism; 10, third PBS prism; 11, second convex lens; 12, F-P cavity analyzer; 13, F-P cavity controller; 14, oscilloscope; 15, third convex lens; 16, optical power meter; 17, fourth convex lens; 18, beam quality analyzer; 19, extinction device; 20, high-precision laser; 21, first coupler; 22, fiber optic delay line; 23, optical frequency shifter; 24, second coupler; 25, second detector; 26, spectrum analyzer. Specific embodiments
[0016] The following combines the attached Figure 1-2 A detailed description of the specific embodiments of the present utility model will be given.
[0017] Referring to Figure 1 , the present utility model provides a dual-wavelength laser test component, including a dual-wavelength beam output device, an optical power meter 16, a longitudinal mode measurement mechanism, and a beam quality analyzer 18. The optical power meter 16 is used for testing the output beam power stability of the dual-wavelength laser 1, and the beam quality analyzer 18 is used for measuring the M 2 value of the laser output beam, and the longitudinal mode measurement mechanism is used for judging the single-mode and multi-mode of the laser longitudinal mode;
[0018] The dual-wavelength beam output device includes a dual-wavelength laser 1. The dual-wavelength laser 1 emits a composite beam. A shaping mirror 2, a first half-wave plate 3, and a first PBS prism 4 are sequentially arranged on the composite beam. The composite beam is split into beam A and beam B passing through different wavelengths by a beam splitter 5. The irradiation angle of beam B is adjusted by a reflecting mirror 6. A first convex lens 7, a second half-wave plate 8, a second PBS prism 9, and a third PBS prism 10 are sequentially arranged on both beam A and beam B. The beam separated by the first PBS prism 4 passes through the third convex lens 15 and irradiates onto the probe of the optical power meter 16. The beams separated by the third PBS prism 10 on beam A and beam B respectively pass through two fourth convex lenses 17 and irradiate onto the probes of two beam quality analyzers 18. The ends of beam A and beam B respectively pass through two second convex lenses 11 and irradiate onto the beam receiving end of the longitudinal mode measurement mechanism. The parallel light passing through the fourth convex lens is injected into the beam quality analyzer 18, and the M of the laser output beam can be directly measured 2Value, record the change data of the power value measured by the power meter within 3h of measurement time. The difference between the maximum and minimum power within the measurement time is P1, and the average power is P2. According to the formula, the power stability within the measurement time can be obtained.
[0019] Furthermore, the half-wave plate II 8 and the PBS prism II 9 are used in combination for measuring the degree of polarization of the light beam. The half-wave plate II 8 is a λ / 2 wave plate @532nm, and the PBS prism II 9 is a PBS @532nm. The light beam separated by the PBS prism II 9 is received by the extinction device 19. By measuring the maximum transmitted light intensity P max and the minimum transmitted light intensity P min of the light beam passing through the PBS @532nm, the degree of polarization of the light beam can be expressed as: P max : P min .
[0020] Furthermore, the longitudinal mode measurement mechanism includes two F-P cavity analyzers 12 for receiving light beam A and light beam B, a high-voltage amplifier, an F-P cavity controller 13, an oscilloscope 14, a signal source, and a detector I. The signal source CH1 is connected to the Signal_in of the high-voltage amplifier. The Out of the high-voltage amplifier is divided by 100 and connected to the CH2 of the oscilloscope 14. The HV_Out of the high-voltage amplifier is connected to the PZT of the F-P cavity analyzer 12. The Sync_Out of the signal source is connected to the EXT_Trig of the oscilloscope 14. The detector I is connected to the CH1 of the oscilloscope 14. The F-P cavity analyzer 12 is electrically connected to the F-P cavity controller 13. The focal length of the convex lens II 11 is 200mm. After the light beam is focused by the convex lens II 11 and passes through the F-P cavity analyzer 12, it is normally incident on the photosensitive surface of the detector I. A triangular wave signal of 30KHz is used by the signal source, amplified by the DC high-voltage amplifier and output to the piezoelectric ceramic of the F-P cavity analyzer 12, and the output signal is appropriately attenuated and then connected to the CH2 of the oscilloscope 14 as a trigger signal. The DC signal of the detector I is connected to the CH1 of the oscilloscope 14. By adjusting the bias voltage and gain voltage values of the piezoelectric ceramic of the scanning F-P cavity analyzer 12, a series of transmission peaks can be displayed on the CH1 channel of the oscilloscope 14. These transmission peaks are used to measure the longitudinal mode of the laser. When operating in single longitudinal mode, there are no other small peaks within the two transmission peaks of one free spectral range.
[0021] Furthermore, the longitudinal mode measurement mechanism can also be used to detect short-term noise. The light beam is injected into the detector I. The oscilloscope 14 shows that the DC voltage is P1, and the time is set to 10 ms . Switch to the AC signal, and measure the periodic RMS value as P2. The short-term noise is expressed as P2:P1.
[0022] Refer to Figure 2, a high-precision laser test device, including a high-precision laser 20, a first coupler 21, a second coupler 24, a second detector 25, and a spectrum analyzer 26. The laser output by the high-precision laser 20 is divided into beam C and beam D through the first coupler 21. Beam C is delayed through an optical fiber delay line 22, and beam D is frequency-shifted through an optical frequency shifter 23. Beam C and beam D are beat through the second coupler 24, and the beat signal is detected by the second detector 25 and displayed on the spectrum analyzer 26. By using the principle of measuring the line width with the delayed non-zero beat self-heterodyne method and analyzing the spectral characteristics of the spectrum analyzer 26, the line width of the high-precision laser 20 can be accurately obtained.
[0023] The above shows and describes the basic principle, main features and advantages of the present invention. The present invention is not limited by the above embodiments. What is described in the above embodiments and the specification only illustrates the principle of the present invention. Without departing from the spirit and scope of the present invention, the present invention will have various changes and improvements, and these changes and improvements all fall within the scope of the present invention claimed. The scope of protection required by the present invention is defined by the appended claims and their equivalents.
Claims
1. A dual-wavelength laser test component, characterized in that: It includes a dual-wavelength beam output device, an optical power meter (16), a longitudinal mode measurement mechanism, and a beam quality analyzer (18). The optical power meter (16) is used for testing the output beam power stability of the dual-wavelength laser (1). The beam quality analyzer (18) is used for measuring the M2 value of the laser output beam. The longitudinal mode measurement mechanism is used for judging the single-mode and multi-mode of the longitudinal mode of the laser; The dual-wavelength beam output device includes a dual-wavelength laser (1). The dual-wavelength laser (1) emits a composite beam. A shaping mirror (2), a half-wave plate 1 (3), and a PBS prism 1 (4) are sequentially arranged on the composite beam. The composite beam is split into beam A and beam B with different wavelengths by a beam splitter (5). The irradiation angle of beam B is adjusted by a reflecting mirror (6). Convex lens 1 (7), half-wave plate 2 (8), PBS prism 2 (9), and PBS prism 3 (10) are sequentially arranged on both beam A and beam B. The beam separated by the PBS prism 1 (4) passes through the convex lens 3 (15) and irradiates the probe head of the optical power meter (16). The beams separated by the PBS prism 3 (10) on beam A and beam B respectively pass through two convex lenses 4 (17) and irradiate the probe heads of two beam quality analyzers (18). The ends of beam A and beam B respectively pass through two convex lenses 2 (11) and irradiate the beam receiving end of the longitudinal mode measurement mechanism.
2. The dual-wavelength laser test component according to claim 1, wherein: The half-wave plate 2 (8) and the PBS prism 2 (9) are used in combination for measuring the beam polarization degree. The half-wave plate 2 (8) is a λ / 2 wave plate @532nm, and the PBS prism 2 (9) is a PBS @532nm. The beam separated by the PBS prism 2 (9) is received by an extinction device (19).
3. The dual-wavelength laser test component according to claim 1, characterized in that: The longitudinal mode measurement mechanism includes two F-P cavity analyzers (12) for receiving beam A and beam B, a high-voltage amplifier, an F-P cavity controller (13), an oscilloscope (14), a signal source, and a detector 1. The signal source CH1 is connected to the Signal_in of the high-voltage amplifier. The Out of the high-voltage amplifier is divided by 100 and connected to CH2 of the oscilloscope (14). The HV_Out of the high-voltage amplifier is connected to the PZT of the F-P cavity analyzer (12). The Sync_Out of the signal source is connected to the EXT_Trig of the oscilloscope (14). The detector 1 is connected to CH1 of the oscilloscope (14). The F-P cavity analyzer (12) is electrically connected to the F-P cavity controller (13). The focal length of the convex lens 2 (11) is 200mm.
4. The dual-wavelength laser test component according to claim 3, characterized in that: The longitudinal mode measurement mechanism can also be used to detect short-term noise. The light beam is injected into detector 1, and the oscilloscope (14) shows that the DC voltage is P1, and the time is set to 10 ms , switch to the AC signal, measure the periodic RMS value as P2, and the short-term noise is expressed as P2:P1.