Positioning carrier applied to high-precision micrometer

By designing a clamping fixture and a positioning carrier for the probe, the problems of product deformation and measurement inaccuracy during micrometer measurement were solved, resulting in higher measurement accuracy and product yield.

CN223551014UActive Publication Date: 2025-11-14SUZHOU LINGYU ELECTRONICS TECH CO LTD
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Patent Information

Application Number
CN202423075288.7
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2024-12-12
Publication Date
2025-11-14
Estimated Expiration
2034-12-12

AI Technical Summary

Technical Problem

In existing technologies, using a micrometer to measure products can easily lead to product deformation and measurement inaccuracies.

Method used

Design a positioning carrier including a clamping fixture, a positioning bracket, and a probe. The clamping fixture is held against the inside of the product. The positioning bracket is snapped onto the clamping fixture. The probe is snapped onto the positioning bracket. The first contact of the probe contacts the anvil of the micrometer, and the second contact contacts the micrometer screw, ensuring that the product position is parallel to the micrometer screw.

Benefits of technology

It reduces the impact of human intervention on measurement accuracy, prevents product deformation, improves measurement accuracy and product yield, and enhances market competitiveness.

✦ Generated by Eureka AI based on patent content.

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Abstract

The utility model discloses a positioning carrier applied to a high-precision micrometer. The positioning carrier comprises a clamping jig, a positioning bracket and a measuring head, the clamping jig can abut against the interior of a product and clamp the product, the positioning support can be clamped on the clamping jig, and the measuring head can be clamped on the positioning support; the measuring head comprises a first contact and a second contact, one end of the first contact can be in contact with a measuring anvil of the micrometer, the other end of the first contact can be in contact with the outer side of a product, one end of the second contact can be in contact with a micrometric screw of the micrometer, and the other end of the second contact can be in contact with the outer side of the product. The first contact can be matched with the second contact to abut against the outer side of the product.
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Description

Technical Field

[0001] This application relates to the field of machining, and more particularly to a positioning carrier used on a high-precision micrometer. Background Technology

[0002] An outside micrometer, also called a screw micrometer, is often simply referred to as a "micrometer". It is a more precise length measuring instrument than a vernier caliper, with accuracies of 0.01mm, 0.02mm, and 0.05mm. Including the estimated reading of 1 decimal place, it can be read to 3 decimal places (thousandths), hence the name micrometer.

[0003] An outside micrometer consists of a fixed frame, an anvil, a micrometer screw, a fixed sleeve, a micrometer drum, a force measuring device, and a locking device. When measuring the outside diameter of a product, the anvil and micrometer screw rest against the outside of the product to measure its diameter.

[0004] like Figure 8 As shown in the image, the product is a fingerprint recognition button used in a tablet computer. When measuring its outer diameter with a micrometer, the operator needs to squeeze the fingerprint recognition button to the appropriate position before using the micrometer. However, because the fingerprint recognition component has a hollow center and thin side walls, it is difficult to control the squeezing force when measuring by hand, which can lead to product deformation. Furthermore, the measurement position of the product is not easily parallel to the micrometer screw, which will increase the measurement error. In addition, during measurement, it is difficult for the operator to control the force of rotating the micrometer. The micrometer screw may squeeze the product and deform it as it gets closer to the anvil, ultimately resulting in inaccurate product dimensions. Summary of the Invention

[0005] The purpose of this application is to propose a positioning carrier for use on high-precision micrometers, so as to solve the problem that product deformation and measurement inaccuracy occur when using micrometers to measure products in the prior art.

[0006] A positioning carrier for use on a high-precision micrometer includes a clamping fixture, a positioning bracket, and a probe; the clamping fixture can abut against the inside of the product and clamp the product, the positioning bracket can be snapped onto the clamping fixture, and the probe can be snapped onto the positioning bracket.

[0007] The probe includes a first contact and a second contact. One end of the first contact can contact the anvil of the micrometer, and the other end of the first contact can contact the outside of the product. One end of the second contact can contact the micrometer screw of the micrometer, and the other end of the second contact can contact the outside of the product. The first contact can cooperate with the second contact to abut against the outside of the product.

[0008] Its beneficial effects are as follows: This positioning carrier replaces the method of positioning the product by the measuring personnel, reducing the interference of the measuring personnel on the measurement accuracy and preventing product deformation caused by manual intervention; the clamping fixture can abut against the inside of the product and clamp the product, providing effective support for the product from the inside out, preventing the problem of the micrometer screw constantly moving closer to the anvil during measurement and squeezing the product and deforming it; the setting of the probe ensures that the position of the product is always parallel to the micrometer screw, improving the measurement accuracy, and ultimately improving the product yield and enhancing the product's market competitiveness.

[0009] In some embodiments, the clamping fixture includes

[0010] A positioning block, which has a through hole;

[0011] A pull rod that can pass through a through hole and move within the through hole;

[0012] The elastic element is sleeved on the tie rod;

[0013] The clamping block is fixedly connected to the pull rod and located on one side of the positioning block. The clamping block can move towards or away from the positioning block under the action of the pull rod. The clamping block can abut against the inside of the product and clamp the product.

[0014] Its beneficial effects are: the measuring personnel can push the bottom of the pull rod, so that the clamping block moves with the pull rod, and a space that can accommodate the product is formed between the clamping block and the positioning block. After the product is fixed on the clamping block, the measuring personnel stop pushing the pull rod. Under the action of the elastic element, the pull rod returns to its original position, and the pull rod drives the clamping block to return to its original position, and finally the product is fixed on the positioning block by the clamping block.

[0015] In some embodiments, the clamping block is provided with a clamping part, the shape of which can match the inner shape of the product.

[0016] Its beneficial effect is that the clamping part can tightly abut against and support the product from the inside to fix the product and prevent the product from shifting.

[0017] In some embodiments, the positioning bracket has a hollow center and a groove is provided on the inner side of the positioning bracket.

[0018] In some implementations, the positioning block is provided with protrusions that match the groove.

[0019] Its beneficial effects are: the cooperation between the groove and the protrusion facilitates the assembly and disassembly of the positioning bracket and the positioning block.

[0020] In some embodiments, the positioning bracket is further provided with a locking part, and a gap is provided between the locking part and the positioning bracket to accommodate the probe.

[0021] Its beneficial effect is that the gap setting facilitates the disassembly and assembly of the probe.

[0022] In some embodiments, the engaging portion is provided with an inclined surface that can contact the probe, and the inclined surface is used to guide the probe.

[0023] In some implementations, the positioning block is also provided with a boss, on which the product can be placed and held by the clamping block.

[0024] In some implementations, both the first contact and the second contact include

[0025] The contact tip can contact the anvil or micrometer screw of the micrometer;

[0026] The snap-fit ​​terminal connects to the other end of the contact terminal;

[0027] The fixing end is connected to the snap-fit ​​end and can abut against the outside of the product to fix the product in place.

[0028] Its beneficial effects are: the contact end needs to be in direct contact with the anvil or micrometer screw, so sufficient contact strength is required; the snap-fit ​​end facilitates the disassembly of the probe within the gap; and the fixed end will directly contact the outside of the product. Attached Figure Description

[0029] To more clearly illustrate the technical solutions in the specific embodiments of this application or the prior art, the drawings used in the description of the specific embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of this application. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0030] Figure 1 This is a schematic diagram of the structure of this application.

[0031] Figure 2 for Figure 1 The front view.

[0032] Figure 3 This is a schematic diagram of the internal structure of the clamping fixture.

[0033] Figure 4 This is a schematic diagram of the clamping fixture.

[0034] Figure 5 for Figure 1 Top view.

[0035] Figure 6 This is a schematic diagram of the positioning bracket.

[0036] Figure 7 This is a schematic diagram of the structure of the first or second contact.

[0037] Figure 8 This is a structural diagram of the product.

[0038] Explanation of the reference numerals in the attached diagram:

[0039] 1. Clamping fixture; 2. Positioning bracket; 3. Probe; 11. Positioning block; 12. Pull rod; 13. Elastic element; 14. Clamping block; 21. Groove; 22. Engaging part; 23. Inclined surface; 31. First contact; 32. Second contact; 111. Protrusion; 112. Boss; 141. Clamping part; 311. Contact end; 312. Engaging end; 313. Fixed end; Detailed Implementation

[0040] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only some, not all, of the embodiments of this application, and are used merely to explain this application and are not intended to limit it. All other embodiments obtained by those skilled in the art based on the embodiments of this application without inventive effort are within the scope of protection of this application.

[0041] In the description of this application, it should be noted that the terms "center," "upper," "lower," "left," "right," "front," "rear," "vertical," "horizontal," "inner," "outer," "both ends," "both sides," "bottom," and "top," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are used only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the elements referred to must have a specific orientation or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on this application. In addition, the terms "first," "second," "upper-level," "lower-level," "main," and "secondary," etc., are used for descriptive purposes only and can be simply used to more clearly distinguish different components, and should not be construed as indicating or implying relative importance.

[0042] In the description of this application, it should be noted that, unless otherwise expressly specified and limited, the terms "installation," "connection," and "linking" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, an integral connection, a mechanical connection, an electrical connection, a direct connection, or an indirect connection through an intermediate medium, or a connection within two components. Those skilled in the art can understand the specific meaning of the above terms in this application based on the specific circumstances.

[0043] A positioning carrier for use on a high-precision micrometer includes a clamping fixture 1, a positioning bracket 2, and a probe 3; the clamping fixture 1 can abut against the inside of the product and clamp the product, the positioning bracket 2 can be snapped onto the clamping fixture 1, and the probe 3 can be snapped onto the positioning bracket 2.

[0044] The probe 3 includes a first contact 31 and a second contact 32. One end of the first contact 31 can contact the anvil of the micrometer, and the other end of the first contact 31 can contact the outside of the product. One end of the second contact 32 can contact the micrometer screw of the micrometer, and the other end of the second contact 32 can contact the outside of the product. The first contact 31 and the second contact 32 can cooperate to abut against the outside of the product.

[0045] When measuring the outer diameter of a product, the product is fixed on the clamping fixture 1. The clamping fixture 1 can fix the product by "internal support". At this time, the measuring personnel then place the micrometer's anvil against the first contact 31. At the same time, the first contact 31 is also against one end of the outer side of the product. The micrometer's micrometer screw is adjusted to move closer to the anvil to contact the second contact 32 until the second contact 32 is against the other end of the outer side of the product. After completing the above steps, the outer diameter of the product is finally measured.

[0046] Its beneficial effects are as follows: the positioning carrier replaces the method of positioning the product by the measuring personnel, reduces the interference of the measuring personnel on the measurement accuracy, and prevents product deformation caused by manual intervention; the clamping fixture 1 can abut against the inside of the product and clamp the product, providing effective support for the product from the inside out, preventing the problem of the micrometer screw constantly moving closer to the anvil during measurement and squeezing the product to deform; the setting of the probe 3 ensures that the position of the product is always parallel to the micrometer screw, improving the measurement accuracy, and ultimately improving the product yield and enhancing the product's market competitiveness.

[0047] Preferably, the clamping fixture 1 includes

[0048] Positioning block 11, with a through hole provided on it;

[0049] Pull rod 12, pull rod 12 can pass through the through hole, pull rod 12 can move within the through hole;

[0050] Elastic element 13 is sleeved on pull rod 12. Elastic element 13 is preferably a spring and is used to reset pull rod 12.

[0051] The clamping block 14 is fixedly connected to the pull rod 12 and located on one side of the positioning block 11. The clamping block 14 can move towards or away from the positioning block 11 under the drive of the pull rod 12. The clamping block 14 can abut against the inside of the product and clamp the product.

[0052] Its beneficial effects are: the measuring personnel can push the bottom of the pull rod 12, so that the clamping block 14 moves with the pull rod 12, and a space that can accommodate the product is formed between the clamping block 14 and the positioning block 11. After the product is fixed on the clamping block 14, the measuring personnel stop pushing the pull rod 12. Under the action of the elastic element 13, the pull rod 12 resets, and the pull rod 12 drives the clamping block 14 to reset, and finally the product is fixed on the positioning block 11 by the clamping block 14.

[0053] Preferably, the clamping block 14 is provided with a clamping part 141, the shape of which can match the inner shape of the product. In this embodiment, two clamping parts 141 protrude from the clamping block 14 and are respectively provided on both sides of the inner length direction of the product, for supporting and fixing the product from the inside out.

[0054] Its beneficial effect is that the clamping part 141 can tightly abut against and support the product from the inside to fix the product and prevent the product from shifting.

[0055] Preferably, the positioning bracket 2 has a hollow center and a groove 21 is provided on the inner side of the positioning bracket 2.

[0056] Preferably, the positioning block 11 is provided with a protrusion 111 that matches the groove 21.

[0057] In this embodiment, the groove 21 is arranged circumferentially along the inner side of the bracket, and the protrusion 111 on the positioning block 11 can lock the positioning block 11 into the groove 21 to prevent the positioning block 11 from falling and to provide vertical support for the positioning block 11.

[0058] Its beneficial effect is that the cooperation between the groove 21 and the protrusion 111 facilitates the assembly and disassembly of the positioning bracket 2 and the positioning block 11.

[0059] During assembly, the hollowed-out part in the middle of the positioning bracket 2 allows the clamping fixture 1 to pass through, and the positioning bracket 2 is fixed on the positioning block 11 by the cooperation of the groove 21 and the protrusion 111.

[0060] Preferably, the positioning bracket 2 is further provided with a locking part 22, and a gap is provided between the locking part 22 and the positioning bracket 2 to accommodate the probe 3.

[0061] Its beneficial effect is that the gap setting facilitates the disassembly and assembly of the probe 3.

[0062] Preferably, the engaging part 22 is provided with an inclined surface 23 that can contact the probe 3, and the inclined surface 23 is used to guide the probe 3.

[0063] Preferably, the positioning block 11 is also provided with a boss 112, and the product can be placed on the boss 112 and held by the clamping block 14.

[0064] Preferably, both the first contact 31 and the second contact 32 include

[0065] The contact end 311 is capable of contacting the anvil or micrometer screw of a micrometer, and the shape of the contact end 311 is configured as a cylinder.

[0066] The snap-fit ​​end 312 is connected to the other end of the contact end 311. The size of the snap-fit ​​end 312 can match the size of the gap so that the gap can accommodate the snap-fit ​​end 312.

[0067] The fixing end 313 is connected to the snap-fit ​​end 312 and can abut against the outside of the product to secure it. It should be noted that the fixing end 313 needs to be in direct contact with the product, so a flexible material can be used to reduce damage to the product's shape and structure.

[0068] Its beneficial effects are: the contact end 311 needs to be in direct contact with the anvil or micrometer screw, so it needs sufficient contact strength; the snap-fit ​​end 312 is provided to facilitate the disassembly of the probe 3 in the gap; and the fixed end 313 will directly contact the outside of the product.

[0069] The above descriptions are merely some embodiments of this application, used only to illustrate the technical solutions of this application, and not to limit it. It should be understood that those skilled in the art can make improvements or substitutions based on the above descriptions without departing from the inventive concept of this application, and all such improvements and substitutions should fall within the protection scope of the appended claims. In this case, all details can be replaced with equivalent elements, and the materials, shapes, and sizes can also be arbitrary.

Claims

1. A positioning carrier for use on a high-precision micrometer, characterized in that, It includes a clamping fixture (1), a positioning bracket (2), and a probe (3); the clamping fixture (1) can abut against the inside of the product and clamp the product, the positioning bracket (2) can be snapped onto the clamping fixture (1), and the probe (3) can be snapped onto the positioning bracket (2). The probe (3) includes a first contact (31) and a second contact (32). One end of the first contact (31) can contact the anvil of the micrometer, and the other end of the first contact (31) can contact the outside of the product. One end of the second contact (32) can contact the micrometer screw of the micrometer, and the other end of the second contact (32) can contact the outside of the product. The first contact (31) can cooperate with the second contact (32) to abut against the outside of the product.

2. A positioning carrier for use on a high-precision micrometer according to claim 1, characterized in that, The clamping fixture (1) includes Positioning block (11), wherein a through hole is provided on the positioning block (11); A pull rod (12) that can pass through a through hole and move within the through hole; An elastic element (13) is sleeved on the pull rod (12); The clamping block (14) is fixedly connected to the pull rod (12) and located on one side of the positioning block (11). The clamping block (14) can move towards or away from the positioning block (11) under the drive of the pull rod (12). The clamping block (14) can abut against the inside of the product and clamp the product.

3. A positioning carrier for use on a high-precision micrometer according to claim 2, characterized in that, The clamping block (14) is provided with a clamping part (141), the shape of which can match the inner shape of the product.

4. A positioning carrier for use on a high-precision micrometer according to claim 3, characterized in that, The positioning bracket (2) has a hollow center and a groove (21) is provided on the inner side of the positioning bracket (2).

5. A positioning carrier for use on a high-precision micrometer according to claim 4, characterized in that, The positioning block (11) is provided with a protrusion (111) that matches the groove (21).

6. A positioning carrier for use on a high-precision micrometer according to claim 4, characterized in that, The positioning bracket (2) is also provided with a locking part (22), and there is a gap between the locking part (22) and the positioning bracket (2) that can accommodate the probe (3).

7. A positioning carrier for use on a high-precision micrometer according to claim 6, characterized in that, The engaging part (22) is provided with an inclined surface (23) that can contact the probe (3), and the inclined surface (23) is used to guide the probe (3).

8. A positioning carrier for use on a high-precision micrometer according to claim 2, characterized in that, The positioning block (11) is also provided with a boss (112), and the product can be placed on the boss (112) and held by the clamping block (14).

9. A positioning carrier for use on a high-precision micrometer according to claim 1, characterized in that, Both the first contact (31) and the second contact (32) include The contact end (311) is capable of contacting the anvil or micrometer screw of a micrometer. A snap-fit ​​terminal (312) is connected to the other end of the contact terminal (311); A fixing end (313) is connected to a snap-fit ​​end (312) and can abut against the outside of the product to fix the product.