Small darkroom applied to EMI (Electro-Magnetic Interference) test

By designing a small anechoic chamber, combined with a signal line placement chamber, a testing chamber, and wireless transmission components, the problem of designers being unable to conduct EMI testing in real time was solved, enabling low-cost and efficient EMI testing and improving the efficiency and quality of product design.

CN223955652UActive Publication Date: 2026-02-27CHENGDU KINGBRI FREQUENCY TECH
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Patent Information

Application Number
CN202520437656.3
Authority / Receiving Office
CN · China
Patent Type
Utility models(China)
Current Assignee / Owner
Filing Date
2025-03-13
Publication Date
2026-02-27
Estimated Expiration
2035-03-13

AI Technical Summary

Technical Problem

In the existing technology, designers are unable to build their own darkrooms, which prevents them from conducting EMI testing during the initial design verification process, affecting product verification and delivery.

Method used

A small anechoic chamber was designed, comprising a signal cable placement chamber and a testing chamber. It is equipped with an antenna, a wireless transceiver chip, a signal amplifier, a sensor, a microcontroller, and a display screen to enable wireless signal transmission and real-time monitoring, supporting testing over long distances and in complex environments.

Benefits of technology

It reduced testing costs, improved the efficiency and quality of design verification, ensured the accuracy and flexibility of testing, and shortened the R&D cycle.

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Abstract

The utility model provides a small darkroom applied to an EMI (Electro-Magnetic Interference) test in order to solve the problem that a designer cannot conveniently carry out the EMI test in an initial design verification process due to the fact that a darkroom of the designer is not established in the prior art. The small darkroom comprises a signal line placing room, a test room, an antenna, a wireless transceiver chip and a signal amplifier. The common surface of the signal line placing chamber and the test chamber is provided with at least one hole connected with a test probe; at least one hole is formed in at least one of the other surfaces of the signal line placing chamber except the surface which is common with the test chamber and is used for connecting an external test instrument and measuring parameters of a tested piece; connectors are used at all the holes, and a closed space is formed indoors; a wave-absorbing material is adhered to the inner wall of the testing chamber; a test probe and a tested piece are arranged in the test chamber; wireless transmission can be realized through the antenna, the wireless transceiver chip and the signal amplifier, and the test convenience is enhanced.
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