A camera module testing device

Abstract

The utility model discloses a camera module testing arrangement, including base, the base has the front and back, the front is provided with circuit board, the surface of circuit board is equipped with the board material, is provided with multiple sets of test lamp on the board material, has the probe row in the both sides of board material, two the probe row is symmetrically set up, be equipped with the conductive connection structure of test lamp electric connection with setting on the circuit board board material, to make multiple sets of test lamp energization simultaneously to realize simultaneous test action, the utility model discloses can through the setting of conductive connection structure, make multiple sets of test lamp energization simultaneously to realize simultaneous test action, and compared with each test lamp group in prior art all need to set the exclusive power supply circuit, and the application need not consider this problem.

Description

Technical Field

[0001] This utility model relates to the field of cameras, and in particular to a camera module testing device. Background Technology

[0002] In the camera module production and testing phase, the assembly sealing of module structural components (such as brackets and lens mounts) is crucial and needs to be verified through a specialized light leakage test. This test requires arranging a ring-shaped LED light source array on the side and rear of the module to simulate a strong lateral light environment and detect whether light will leak into the imaging area due to structural gaps or defects.

[0003] A representative example is the patent document with application number CN202421285110.2, which discloses a silver paste impedance testing device for camera modules. In this application, the test pins are fixedly set at the top cover. Therefore, each test can ensure that the test pins contact the same point of different camera modules, thereby improving the detection accuracy. At the same time, different test pins correspond to different test points, which can ensure that the testing device can complete the detection of different points of the camera module.

[0004] The above discloses a testing device for a camera module, but it still has limitations in practical use, specifically:

[0005] Traditional test fixture designs typically equip each workstation under test (e.g., two modules being tested side-by-side) with an independent LED light group and its driving circuit Q (see reference). Figure 1 Two driver circuits were set up for the two sets of LED lights.

[0006] This means that each workstation requires its own dedicated VPP (dedicated pin, mainly used for high-voltage drive or special function control) power supply line to light up the LED strip. Simultaneously, it's crucial to ensure that the module's digital ground (DGND) is strictly separated from the LED control circuit's ground within the fixture to avoid power-on failure or communication malfunctions due to grounding conflicts. While this design is functionally feasible, it inevitably leads to a significant increase in the number of components (LEDs, resistors, wiring) within the fixture, low space utilization, increased material costs, and higher wiring complexity. In other words, the repetitive LED strips and drive lines substantially encroach on the limited and expensive internal space of the fixture, driving up costs.

[0007] Therefore, how to overcome the shortcomings of the existing technology mentioned above has become the subject of this utility model. Utility Model Content

[0008] Therefore, it is necessary to provide a camera module testing device to address the aforementioned technical problems.

[0009] To solve the above-mentioned technical problems, the present invention adopts the following technical solution:

[0010] A camera module testing device includes a base having a front and a back. A circuit board is disposed on the front, and a plate is disposed on the surface of the circuit board. Multiple sets of test lights are disposed on the plate.

[0011] The plate has probe rows on both sides, and the two probe rows are symmetrically arranged.

[0012] The circuit board is provided with a conductive connection structure that is electrically connected to the test lamps disposed on the board, so that multiple sets of test lamps can be powered on at the same time to achieve simultaneous testing.

[0013] This invention enables multiple test lights to be powered on simultaneously through the setting of a conductive connection structure, thereby achieving simultaneous testing. Compared with the prior art where each test light group needs to be set up with a dedicated power supply line, this application does not need to consider this problem. For example, if there are two test lights, even if one side does not have a module powered on, the camera on the other side can still be powered on and tested normally.

[0014] The above design enables simultaneous independent power supply to multiple sets of test lamps:

[0015] Cost reduction and efficiency improvement: The single-path conductive connection structure replaces the traditional discrete power supply line, simplifies circuit design, reduces the number of wires and interfaces, and significantly reduces hardware costs and assembly complexity;

[0016] Parallel fault tolerance: Each group of test lamp circuits is independent of each other (such as the two groups in the example). When a single group of test lamps is not powered on (such as when the corresponding module is missing), other groups can still be powered on and tested normally through the shared conductive structure, avoiding the problem of the whole machine stopping due to a single circuit failure in the traditional solution and improving the continuity of testing.

[0017] Synchronous triggering: Multiple test lights are driven by a unified conductive connection structure to ensure that all modules start testing synchronously, eliminating the interference of time difference on test consistency.

[0018] Furthermore, the multiple sets of test lamps are divided into two evenly distributed groups. With the above design, the two symmetrically distributed sets of test lamps maximize the coverage of the contacts of the module under test (i.e., the fixed contacts of the entire electrical contact area), improve the parallel testing efficiency, and at the same time help balance the circuit load.

[0019] Furthermore, the conductive connection structure includes a power receiving area for supplying power to the two sets of test lamps;

[0020] The energized area is provided with a first positive energizing contact and a first negative energizing contact;

[0021] The energized area is also provided with a second positive energizing contact and a second negative energizing contact;

[0022] The conductive connection structure further includes a first conductive part and a second conductive part, wherein the first conductive part is electrically connected to the first positive contact.

[0023] The second conductive part is electrically connected to the second positive contact and the second negative contact. With the above design, the power supply of the two sets of test lamps is physically isolated by separating the first conductive part (dedicated to controlling the first group) and the second conductive part (dedicated to controlling the second group), ensuring that the operation of the other group is not affected when the state of one group is abnormal.

[0024] Furthermore, the first conductive portion has a first positive power input pin electrically connected to the first positive contact. This design clarifies the first set of power input paths, avoiding interference with other circuits.

[0025] Furthermore, the second conductive part has a second positive power input pin and a digital ground pin;

[0026] The second positive power input pin and the digital ground pin are electrically connected to the second positive contact and the second negative contact, respectively.

[0027] The first positive power input pin, the power-connected area, and the digital ground pin constitute a first current loop;

[0028] The second positive power input pin, the grounding area, and the digital grounding pin constitute a second current loop. This design reduces redundancy through grounding reuse: the digital grounding pin is reused as a second set of negative grounding contacts, reducing the need for dedicated grounding terminals and optimizing circuit layout space.

[0029] It can also be isolated by dual-loop mutual exclusion: the first and second current loops only physically intersect in the energized area, and the electrical paths are completely independent, eliminating signal crosstalk from the source.

[0030] Furthermore, the energized area is provided with fixed contacts that connect to the test lamp, and these fixed contacts are spaced apart. This design, by setting the intervals, avoids the risk of arcing or short circuits between the contacts, thus improving the safety of high-voltage testing scenarios.

[0031] Furthermore, the fixed contact includes a first contact and a second contact, which are electrically connected to the test lamp to simultaneously supply power to the test lamp. This design allows the two contacts to supply power to a single test lamp in parallel, forming a redundant path, ensuring the lamp group function is maintained even if a single contact fails.

[0032] Furthermore, the first contact and the second contact are spaced apart;

[0033] The distance between the first and second contacts is less than the set distance between fixed contacts. This design achieves localized compactness: the distance between the dual power supply contacts of the same test lamp is much smaller than the distance between contacts in different lamp groups, ensuring both the stability of power supply to the same lamp and maintaining a safe distance between lamp groups.

[0034] Furthermore, the fixed contact includes a positioning contact, and the positioning contact has an expansion contact on its periphery. This design ensures that the positioning contact precisely aligns with the test lamp pin, and the expansion contact increases the effective contact area, suppressing poor contact caused by assembly misalignment.

[0035] Furthermore, the expansion contact is a circular structure, with its edge at least abutting against the edge of the positioning contact. This design enables adaptive compensation: the circular expansion contact surrounds the positioning contact, and its edges abutting to form a continuous conductive ring, maintaining a stable electrical connection even with slight positional deviations in the test lamp.

[0036] In summary, this solution simplifies the circuit while ensuring the parallelism, fault tolerance, and contact reliability of multi-module testing through a layered conductive connection structure (independent power supply for each zone + redundant contact design) and adaptive contact layout (positioning + expansion dual contact collaboration).

[0037] Compared with the prior art, the present invention has the following beneficial effects:

[0038] This invention enables multiple test lights to be powered on simultaneously through the setting of a conductive connection structure, thereby achieving simultaneous testing. Compared with the prior art where each test light group needs to be set up with a dedicated power supply line, this application does not need to consider this problem. For example, if there are two test lights, even if one side does not have a module powered on, the camera on the other side can still be powered on and tested normally. Attached Figure Description

[0039] Figure 1 A schematic diagram of the driving circuit structure provided for the prior art;

[0040] Figure 2 A schematic diagram of the base structure provided by this utility model;

[0041] Figure 3 A schematic diagram of the power receiving area structure provided by this utility model;

[0042] Figure 4 A schematic diagram of the conductive connection structure provided by this utility model;

[0043] Figure 5 A schematic diagram of the first contact point structure provided by this utility model;

[0044] Figure 6A schematic diagram of the expansion contact structure provided by this utility model.

[0045] The markings in the diagram are explained as follows:

[0046] 1. Base; 2. Circuit board; 3. Board material; 4. Test lamp; 5. Probe array; 6. Grounding area; 7. First positive grounding contact; 8. First negative grounding contact; 9. Second positive grounding contact; 10. Second negative grounding contact; 11. First conductive part; 12. Second conductive part; 13. First positive power input pin; 14. Second positive power input pin; 15. Digital grounding pin; 16. Fixed contact; 17. First contact; 18. Second contact; 19. Positioning contact; 20. Expansion contact. Detailed Implementation

[0047] To enable those skilled in the art to better understand the present invention, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort should fall within the protection scope of the present invention.

[0048] As described in the background section, each workstation requires its own dedicated VPP (dedicated pin, mainly used for high-voltage drive or special function control) power supply line to illuminate the LED strip. Simultaneously, it is crucial to ensure strict separation between the module's digital ground (DGND) and the LED control circuit's ground within the fixture to avoid power-on failure or communication malfunctions due to grounding conflicts. While this design is functionally feasible, it inevitably leads to a significant increase in the number of components (LEDs, resistors, wiring) within the fixture, inefficient space utilization, higher material costs, and increased wiring complexity. In other words, the repetitive LED strips and drive lines drastically occupy the limited and expensive internal space of the fixture, driving up costs.

[0049] To solve this technical problem, this utility model provides a camera module testing device.

[0050] For details, please refer to Figures 2-6 A camera module testing device includes a base 1, which has a front and a back. A circuit board 2 is provided on the front, and a plate 3 is provided on the surface of the circuit board 2. Multiple sets of test lights 4 are provided on the plate 3.

[0051] The plate 3 has probe rows 5 on both sides, and the two probe rows 5 are symmetrically arranged.

[0052] The circuit board 2 is provided with a conductive connection structure that is electrically connected to the test lamps 4 disposed on the plate 3, so that multiple sets of test lamps 4 can be powered on at the same time to achieve simultaneous testing.

[0053] This utility model can achieve simultaneous testing by setting up a conductive connection structure so that multiple sets of test lights 4 can be powered on at the same time. Compared with the prior art, which requires a dedicated power supply line for each set of test lights 4, this application does not need to consider this problem. For example, if there are two sets of test lights 4, even if one side is not powered on, the camera on the other side can still be powered on and tested normally.

[0054] With the above design, multiple sets of test lamps 4 can be powered synchronously and independently:

[0055] Cost reduction and efficiency improvement: The single-path conductive connection structure replaces the traditional discrete power supply line, simplifies circuit design, reduces the number of wires and interfaces, and significantly reduces hardware costs and assembly complexity;

[0056] Parallel fault tolerance: Each group of test lamp 4 circuits is independent of each other (such as the two groups in the example). When a single group of test lamp 4 is not powered on (such as when the corresponding module is missing), other groups can still be powered on and tested normally through the shared conductive structure, avoiding the problem of the whole machine stopping due to a single circuit failure in the traditional solution and improving the continuity of testing.

[0057] Synchronous triggering: Multiple test lights 4 are driven by a unified conductive connection structure to ensure that all modules start testing synchronously, eliminating the interference of time difference on test consistency.

[0058] To enable those skilled in the art to better understand the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings.

[0059] It should be noted that, unless otherwise specified, the embodiments and features and technical solutions in the present invention can be combined with each other.

[0060] It should be noted that similar labels and letters in the following figures indicate similar items. Therefore, once an item is defined in one figure, it does not need to be further defined and explained in subsequent figures.

[0061] First Embodiment

[0062] A camera module testing device includes a base 1, which has a front and a back. A circuit board 2 is provided on the front, and a plate 3 is provided on the surface of the circuit board 2. Multiple sets of test lights 4 are provided on the plate 3.

[0063] The plate 3 has probe rows 5 on both sides, and the two probe rows 5 are symmetrically arranged.

[0064] The circuit board 2 is provided with a conductive connection structure that is electrically connected to the test lamps 4 disposed on the plate 3, so that multiple sets of test lamps 4 can be powered on at the same time to achieve simultaneous testing.

[0065] This utility model can achieve simultaneous testing by setting up a conductive connection structure so that multiple sets of test lights 4 can be powered on at the same time. Compared with the prior art, which requires a dedicated power supply line for each set of test lights 4, this application does not need to consider this problem. For example, if there are two sets of test lights 4, even if one side is not powered on, the camera on the other side can still be powered on and tested normally.

[0066] With the above design, multiple sets of test lamps 4 can be powered synchronously and independently:

[0067] Cost reduction and efficiency improvement: The single-path conductive connection structure replaces the traditional discrete power supply line, simplifies circuit design, reduces the number of wires and interfaces, and significantly reduces hardware costs and assembly complexity;

[0068] Parallel fault tolerance: Each group of test lamp 4 circuits is independent of each other (such as the two groups in the example). When a single group of test lamp 4 is not powered on (such as when the corresponding module is missing), other groups can still be powered on and tested normally through the shared conductive structure, avoiding the problem of the whole machine stopping due to a single circuit failure in the traditional solution and improving the continuity of testing.

[0069] Synchronous triggering: Multiple test lights 4 are driven by a unified conductive connection structure to ensure that all modules start testing synchronously, eliminating the interference of time difference on test consistency.

[0070] Furthermore, the multiple sets of test lamps 4 are divided into two evenly distributed groups. With the above design, the two symmetrically distributed sets of test lamps 4 maximize the coverage of the contacts of the module under test (i.e., the fixed contacts 16 of the entire power-on area 6), improve the parallel testing efficiency, and at the same time help balance the circuit load.

[0071] Furthermore, the conductive connection structure includes a power receiving area 6, which is used to supply power to the two sets of test lamps 4;

[0072] The energized area 6 is provided with a first positive energizing contact 7 and a first negative energizing contact 8;

[0073] The energized area 6 is also provided with a second positive energizing contact 9 and a second negative energizing contact 10;

[0074] The conductive connection structure further includes a first conductive part 11 and a second conductive part 12, wherein the first conductive part 11 is electrically connected to the first positive contact 7;

[0075] The second conductive part 12 is electrically connected to the second positive contact 9 and the second negative contact 10. With the above design, the power supply of the two sets of test lamps 4 is physically isolated by separating the first conductive part 11 (which controls the first group) and the second conductive part 12 (which controls the second group), ensuring that the operation of the other group is not affected when the state of one group is abnormal.

[0076] Furthermore, the first conductive part 11 has a first positive power input pin 13 that is electrically connected to the first positive contact 7. With the above design, the first set of power input paths is clearly defined, avoiding interference with other circuits.

[0077] Furthermore, the second conductive part 12 has a second positive power input pin 14 and a digital ground pin 15;

[0078] The second positive power input pin 14 and the digital ground pin 15 are electrically connected to the second positive contact 9 and the second negative contact 10, respectively.

[0079] The first positive power input pin 13, the power receiving area 6 and the digital ground pin 15 form a first current loop;

[0080] The second positive power input pin 14, the grounding area 6, and the digital grounding pin 15 form a second current loop. This design reduces redundancy through grounding reuse: the digital grounding pin 15 is reused as a second set of negative grounding contacts, reducing the need for dedicated grounding terminals and optimizing circuit layout space.

[0081] It can also be isolated by dual-loop mutual exclusion: the first and second current loops only physically intersect in the energized area 6, and the electrical paths are completely independent, eliminating signal crosstalk from the source.

[0082] Furthermore, the power receiving area 6 is provided with fixed contacts 16 connected to the test lamp 4, and the fixed contacts 16 are spaced apart. This design avoids the risk of arcing or short circuits between contacts by setting the intervals, thus improving the safety of high-voltage testing scenarios.

[0083] Second Embodiment

[0084] Furthermore, the fixed contact 16 includes a first contact 17 and a second contact 18, which are electrically connected to the test lamp 4 to simultaneously supply power to the test lamp 4. This design enables the two contacts to supply power to a single test lamp 4 in parallel, forming a redundant path, ensuring the lamp group function is maintained even if a single contact fails.

[0085] Furthermore, the first contact 17 and the second contact 18 are spaced apart;

[0086] The distance between the first contact 17 and the second contact 18 is less than the set distance between the fixed contacts 16. With the above design, local compactness is achieved: the distance between the dual power supply contacts of the same test lamp 4 is much smaller than the distance between contacts of different lamp groups, which ensures the stability of power supply for the same lamp and maintains a safe distance between lamp groups.

[0087] Third Embodiment

[0088] Furthermore, the fixed contact 16 includes a positioning contact 19, and an expansion contact 20 is provided on the periphery of the positioning contact 19. With this design, the positioning contact 19 precisely aligns with the test lamp pin 4, and the expansion contact 20 increases the effective contact area, suppressing poor contact caused by assembly misalignment.

[0089] Furthermore, the expansion contact 20 has a circular structure, and the edge of the circular structure at least abuts against the edge of the positioning contact 19. With the above design, adaptive compensation is achieved: the circular expansion contact 20 surrounds the positioning contact 19, and its edges abut against each other to form a continuous conductive ring, so that even if there is a slight positional deviation of the test lamp 4, a stable electrical connection can still be maintained through the ring.

[0090] In summary, this solution simplifies the circuit while ensuring the parallelism, fault tolerance, and contact reliability of multi-module testing through a layered conductive connection structure (independent power supply for each zone + redundant contact design) and adaptive contact layout (positioning + expansion dual contact collaboration).

[0091] The camera module testing device provided by this utility model is used as follows: This utility model can enable multiple test lights 4 to be powered on simultaneously through the setting of conductive connection structure, thereby realizing simultaneous testing. Compared with the prior art, which requires a dedicated power supply line for each test light 4 group, this application does not need to consider this problem. For example, if there are two test lights 4, even if one side is not powered on, the camera on the other side can still be powered on and tested normally.

[0092] In this utility model, unless otherwise explicitly specified and limited, the terms "installation," "connection," "joining," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection, an electrical connection, or a connection that allows communication between them; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components, unless otherwise explicitly limited. Those skilled in the art can understand the specific meaning of the above terms in this utility model according to the specific circumstances.

[0093] Obviously, the embodiments described above are only some embodiments of this utility model, not all embodiments. The accompanying drawings show preferred embodiments of this utility model, but do not limit the patent scope of this utility model. This utility model can be implemented in many different forms; rather, the purpose of providing these embodiments is to provide a more thorough and comprehensive understanding of the disclosure of this utility model. Although this utility model has been described in detail with reference to the foregoing embodiments, those skilled in the art can still modify the technical solutions described in the foregoing specific embodiments, or make equivalent substitutions for some of the technical features. Any equivalent structures made using the content of this utility model specification and drawings, directly or indirectly applied to other related technical fields, are similarly within the patent protection scope of this utility model.

Claims

1. A camera module testing device, characterized in that, Includes a base (1), the base (1) has a front and a back, the front is provided with a circuit board (2), the surface of the circuit board (2) is provided with a plate (3), and multiple sets of test lamps (4) are provided on the plate (3). The plate (3) has probe rows (5) on both sides, and the two probe rows (5) are symmetrically arranged; The circuit board (2) is provided with a conductive connection structure that is electrically connected to the test lamps (4) set on the plate (3) so that multiple sets of test lamps (4) are powered on at the same time to achieve simultaneous testing.

2. The camera module testing device according to claim 1, characterized in that, The multiple test lamps (4) are divided into two groups that are equally distributed.

3. The camera module testing device according to claim 1, characterized in that, The conductive connection structure includes a power receiving area (6), which is used to supply power to the two sets of test lamps (4); The energized area (6) is provided with a first positive energizing contact (7) and a first negative energizing contact (8). The energized area (6) is also provided with a second positive energizing contact (9) and a second negative energizing contact (10). The conductive connection structure further includes a first conductive part (11) and a second conductive part (12), wherein the first conductive part (11) is electrically connected to the first positive contact (7); The second conductive part (12) is electrically connected to the second positive contact (9) and the second negative contact (10).

4. The camera module testing device according to claim 3, characterized in that, The first conductive part (11) has a first positive power input pin (13) that is electrically connected to the first positive contact (7).

5. The camera module testing device according to claim 4, characterized in that, The second conductive part (12) has a second positive power input pin (14) and a digital ground pin (15). The second positive power input pin (14) and the digital ground pin (15) are electrically connected to the second positive contact (9) and the second negative contact (10), respectively. The first positive power input pin (13), the power receiving area (6), and the digital ground pin (15) constitute the first current loop; The second positive power input pin (14), the power receiving area (6), and the digital ground pin (15) constitute the second current loop.

6. The camera module testing device according to claim 3 or 5, characterized in that, The power receiving area (6) is provided with fixed contacts (16) connected to the test lamp (4), and the fixed contacts (16) are spaced apart.

7. The camera module testing device according to claim 6, characterized in that, The fixed contact (16) includes a first contact (17) and a second contact (18), which are electrically connected to the test lamp (4) to supply power to the test lamp (4) simultaneously.

8. The camera module testing device according to claim 7, characterized in that, The first contact (17) and the second contact (18) are spaced apart; The interval between the first contact (17) and the second contact (18) is less than the set interval between the fixed contacts (16).

9. The camera module testing device according to claim 6, characterized in that, The fixed contact (16) includes a positioning contact (19), and an expansion contact (20) is provided on the periphery of the positioning contact (19).

10. The camera module testing device according to claim 9, characterized in that, The expansion contact (20) is a circular structure, and the edge of the circular structure at least abuts against the edge of the positioning contact (19).

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