An ICLED test fixture

Abstract

The utility model relates to the technical fields of LED detection fixture, solved the technical problem that LED detection process is complicated, especially involve a kind of test and add ICLED fixture, including as the support base of support foundation, the support base top end is fixedly connected with two storage seat, the detection component for detecting LED appliance is set up in the storage seat, the storage seat top end is provided with the closure trigger component for triggering detection component to operate, the detection component includes the placement card slot of top end in storage seat, the pin insertion slot is evenly seted up in the bottom end four corners of placement card slot, the bottom end four corners of storage seat are seted up with the limit back sliding groove of pin insertion slot intercommunication. The utility model is due to the setting of detection component, can more simply detect whether LED is normal, intercommunication two parallel LED, whether the same judgment detected object is normal by observing whether the detected object and reference object are lit up simultaneously after electrification, and color.

Description

Technical Field

[0001] This utility model relates to the technical field of LED testing fixtures, and in particular to a testing fixture for IC LEDs. Background Technology

[0002] Currently, testing IC LED materials requires manually fabricating a standard LED first. However, testing the signal output of IC LED materials is cumbersome. The current testing method typically only checks the signal output of IC LED materials. A common approach is to solder two materials together with solder wire, connecting the signal output of the first material to the signal input of the second material, and observing whether the two materials can synchronize their color changes. This method is used to determine if the four pins of the material are functioning correctly. However, this testing method is very tedious, and improper operation during testing can damage the tested LED, thus increasing production costs. Utility Model Content

[0003] To address the shortcomings of existing technologies, this utility model provides a test fixture for ICLEDs, which solves the technical problem of cumbersome LED testing processes and achieves the goal of improving testing efficiency.

[0004] To solve the above technical problems, the present invention provides the following technical solution: a test fixture for ICLED, including a support base as a support foundation, two storage seats fixedly connected to the top of the support base, a detection component for testing LED devices being provided on the storage seats, and a closing trigger component for triggering the detection component to operate being provided at the top of the storage seats;

[0005] The detection component includes a placement slot at the top of the storage base, pin slots at the four corners of the bottom of the placement slot, and limit return grooves at the four corners of the bottom of the storage base that communicate with the pin slots. A conductive rod is slidably connected to the inner side of the pin slots and the limit return grooves. A docking guide plate is fixedly connected to the top of the conductive rod. A limit plate is fixedly connected to the part of the conductive rod inside the limit return groove. A return spring is sleeved on the bottom of the docking guide plate outside the conductive rod. An LED bead is placed inside the placement slot, and LED bead pins are connected to the four corners of the bottom of the LED bead.

[0006] Preferably, the lamp bead pin is slidably connected to the inner side of the pin slot that is close to it, and the bottom end of the lamp bead pin is in contact with the top end of the close mating guide plate.

[0007] Preferably, the pin slot, the limiting slide groove, the docking guide plate, and the limiting plate have the same maximum diameter.

[0008] Preferably, the diameter of the connection between the pin slot and the limiting slide groove is the same as the diameter of the conductive rod, and the diameter of the conductive rod is smaller than the diameter of the limiting slide groove. The limiting plate is in contact with the top inner side of the limiting slide groove, and the bottom end of the rebound spring is connected to the bottom inner side of the pin slot.

[0009] Preferably, the closing trigger assembly includes a glass closing cover rotatably connected to the top of the two storage seats via a rotating shaft. Two symmetrical limiting buckles are fixedly connected to the end of the glass closing cover away from its connection with the storage seat. A gas spring rod is rotatably connected to the storage seat and the glass closing cover near the connection via a base. Two symmetrical connecting rods are fixedly connected to the end of the storage seat away from the gas spring rod.

[0010] Preferably, the connecting rod is engaged with the adjacent limiting buckle, and a plurality of external conductive plates are fixedly connected at equal intervals to the bottom inner side of the support base, wherein the external conductive plates are not in contact with the bottom end of the adjacent conductive rod.

[0011] By employing the above technical solution, this utility model provides a test fixture for ICLEDs, which has at least the following beneficial effects:

[0012] 1. Due to the setting of the detection component, this utility model can more easily detect whether the LED is normal. By connecting two LEDs in parallel, it can be determined whether the tested object is normal by observing whether the tested object and the reference object light up at the same time after being powered on and whether the colors are the same.

[0013] 2. Due to the setting of the closed trigger component, the LED beads in the detection component can be pressed down by the cover, so that the two LED beads can be powered on at the same time, ensuring that the circuit will not encounter a short circuit. Moreover, the glass cover made of glass does not affect the observation of the operator. Attached Figure Description

[0014] The accompanying drawings, which are provided to further illustrate this application and form part of this application, illustrate exemplary embodiments of this application and are used to explain this application, but do not constitute an undue limitation of this application.

[0015] In the attached diagram:

[0016] Figure 1 This is a three-dimensional structural diagram of the present invention;

[0017] Figure 2 This is a schematic diagram of the installation structure of the storage base of this utility model;

[0018] Figure 3 This is a schematic diagram of the connecting rod installation structure of this utility model;

[0019] Figure 4 This is a schematic diagram of the LED lamp bead installation structure of this utility model.

[0020] In the diagram: 1. Support base; 2. Storage seat; 3. Closure trigger assembly; 31. Glass closing cover; 32. Limiting buckle; 33. Gas spring rod; 34. Connecting rod;

[0021] 4. Detection component; 41. Placement slot; 42. Pin slot; 43. Limiting return groove; 44. Conductive rod; 45. Docking guide plate; 46. Limiting plate; 47. Return spring; 48. LED bead; 49. LED bead pin; 5. External conductive plate. Detailed Implementation

[0022] The technical solutions of the present utility model will be clearly and completely described below with reference to the accompanying drawings of the embodiments. Obviously, the described embodiments are only some embodiments of the present utility model, and not all embodiments. Based on the embodiments of the present utility model, all other embodiments obtained by those of ordinary skill in the art without creative effort are within the protection scope of the present utility model.

[0023] Example 1

[0024] Currently, testing IC LED materials typically involves checking the signal output. A common method is to solder two materials together with solder wire, connecting the signal output of the first material to the signal input of the second, and observing whether the two materials can synchronize their color changes. This method is used to determine if the four pins of the material are functioning correctly. However, this testing method is very cumbersome, and improper operation during testing can damage the tested LED, thus increasing production costs. Please refer to [reference needed]. Figures 1-4 This embodiment provides a test fixture for IC LEDs, solving the technical problem of cumbersome LED testing processes. The device includes a support base 1 serving as a foundation, with two storage seats 2 fixedly connected to the top of the support base 1. Each storage seat 2 is equipped with a testing component 4 for testing LED devices, and a closing trigger component 3 is located at the top of each storage seat 2 to trigger the operation of the testing component 4. The LED device is placed and tested using the testing component 4, and the operation of the testing component 4 is triggered by the closing trigger component 3.

[0025] The existing testing method requires placing the material in a specific position on the LED test fixture, and then using an internal metal probe to contact the LED metal pad to achieve conductivity. Finally, an IC test board is connected to the end of the wire at the tail of the fixture, and then the IC test board is connected to a regulated power supply for testing. This testing method is too cumbersome. In order to solve this problem, testing component 4 is proposed. The detection component 4 includes a placement slot 41 at the top of the storage base 2. Each of the four corners of the placement slot 41 has a pin slot 42. Each of the four corners of the storage base 2 has a limiting return groove 43 connected to the pin slot 42. A conductive rod 44 is slidably connected to the inner side of the pin slot 42 and the limiting return groove 43. A docking guide plate 45 is fixedly connected to the top of the conductive rod 44. A limiting plate 46 is fixedly connected to the portion of the conductive rod 44 inside the limiting return groove 43. A spring 47 is sleeved on the bottom of the docking guide plate 45 outside the conductive rod 44. An LED bead 48 is placed inside the placement slot 41. Each of the four corners of the bottom of the LED bead 48 has a bead pin 49 connected to it. The bead pin 49 is slidably connected to the inner side of the pin slot 42, and the bottom of the bead pin 49 is in contact with the top of the adjacent docking guide plate 45. During testing, the LED bead 48 to be tested has its bottom pin 49 slidably connected to the pin slots 42 at the four corners of the bottom of the placement slot 41. During this time, the LED bead 48 will slide and connect inside the placement slot 41, and the LED bead pin 49 will be in contact with the mating guide plate 45 inside the pin slot 42. After placement is completed, another tested LED bead 48 is placed in another placement slot 41 in the same way. Then, the operator triggers the closing trigger component 3. At that time, the components inside the closing trigger component 3 will press down on the LED bead 48, and the LED bead 48 will press down on the mating guide plate 45. The mating guide plate 45 will then drive the conductive rod 44 connected to it to move downward until it contacts the external conductive plate 5. At that time, the circuit is completed. If the two parallel LED beads 48 light up at the same time, it means that the tested LED bead 48 is fine. If the lighting time is different, it means that the LED bead 48 has a problem.

[0026] To prevent the conductive rod 44, located inside the limiting return groove 43, from sliding into the pin slot 42, the pin slot 42, the limiting return groove 43, the docking guide plate 45, and the limiting plate 46 have the same maximum diameter. The diameter at the connection between the pin slot 42 and the limiting return groove 43 is the same as the diameter of the conductive rod 44, and the diameter of the conductive rod 44 is smaller than the diameter of the limiting return groove 43. The limiting plate 46 is in contact with the top inner side of the limiting return groove 43, and the bottom end of the return spring 47 is connected to the bottom inner side of the pin slot 42. The return spring 47 ensures that the conductive rod 44 can return to its original position after being pressed down.

[0027] Example 2

[0028] Based on Example 1, Example 1 solved the technical problem of the cumbersome LED detection process, but it still had the problem of two LED beads 48 not being able to be turned on at the same time, causing a short circuit. Combined with... Figures 1-4 As shown, the specific implementation process is as follows: In order to ensure that the two LED beads 48 can be connected at the same time, thereby triggering the closed connection of the circuit, the closed triggering component 3 includes a glass closing cover 31 rotatably connected to the top of the two storage seats 2 via a rotating shaft. Two symmetrical limiting buckles 32 are fixedly connected to the end of the glass closing cover 31 away from the connection point with the storage seat 2. A gas spring rod 33 is rotatably connected to the storage seat 2 and the glass closing cover 31 near the connection point via a base. Two symmetrical connecting rods 34 are fixedly connected to the end of the storage seat 2 away from the gas spring rod 33.

[0029] To ensure that the circuit is in an open state under normal conditions, the connecting rod 34 engages with the nearby limiting buckle 32, and several external conductive plates 5 are fixedly connected at equal intervals to the bottom inner side of the support base 1. The external conductive plates 5 are not in contact with the bottom of the nearby conductive rod 44.

[0030] It should be noted that, in this document, the terms “comprising,” “including,” or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, article, or apparatus.

[0031] Although embodiments of the present invention have been shown and described, it will be understood by those skilled in the art that various changes, modifications, substitutions and alterations can be made to these embodiments without departing from the principles and spirit of the present invention, the scope of which is defined by the appended claims and their equivalents.

Claims

1. A test fixture for ICLEDs, comprising a support base (1) as a supporting foundation, characterized in that: The top of the support base (1) is fixedly connected to two storage seats (2). The storage seats (2) are provided with a detection component (4) for detecting LED devices. The top of the storage seats (2) is provided with a closing trigger component (3) for triggering the detection component (4) to operate. The detection component (4) includes a placement slot (41) at the top of the storage base (2). The placement slot (41) has pin slots (42) at the four corners of its bottom. The storage base (2) has limit return grooves (43) at the four corners of its bottom that are connected to the pin slots (42). A conductive rod (44) is slidably connected to the inner side of the pin slots (42) and the limit return grooves (43). A docking guide plate (45) is fixedly connected to the top of the conductive rod (44). A limit plate (46) is fixedly connected to the part of the conductive rod (44) inside the limit return groove (43). A spring spring (47) is sleeved on the bottom of the docking guide plate (45) outside the conductive rod (44). An LED bead (48) is placed inside the placement slot (41). A bead pin (49) is connected to the four corners of the bottom of the LED bead (48).

2. The test fixture for ICLED according to claim 1, characterized in that: The lamp bead pin (49) is slidably connected to the inside of the pin slot (42) that is close to it, and the bottom end of the lamp bead pin (49) is in contact with the top end of the close mating guide plate (45).

3. The test fixture for ICLED according to claim 1, characterized in that: The pin slot (42), the limiting slide groove (43), the docking guide plate (45), and the limiting plate (46) have the same maximum diameter.

4. The test fixture for ICLED according to claim 1, characterized in that: The diameter of the connection between the pin slot (42) and the limiting slide groove (43) is the same as the diameter of the conductive rod (44), and the diameter of the conductive rod (44) is smaller than the diameter of the limiting slide groove (43). The limiting plate (46) is in contact with the top inner side of the limiting slide groove (43), and the bottom end of the rebound spring (47) is connected to the bottom inner side of the pin slot (42).

5. A test fixture for ICLED according to claim 1, characterized in that: The closing trigger assembly (3) includes a glass closing cover (31) rotatably connected to the top of the two storage seats (2) via a rotating shaft. Two symmetrical limiting buckles (32) are fixedly connected to the end of the glass closing cover (31) away from the connection point with the storage seat (2). A pneumatic spring rod (33) is rotatably connected to the storage seat (2) and the glass closing cover (31) near the connection point via a base. Two symmetrical connecting rods (34) are fixedly connected to the end of the storage seat (2) away from the pneumatic spring rod (33).

6. A test fixture for ICLED according to claim 5, characterized in that: The connecting rod (34) is fitted with the nearby limiting buckle (32), and several external conductive plates (5) are fixedly connected at equal intervals on the inner bottom end of the support base (1). The external conductive plates (5) are not attached to the bottom end of the nearby conductive rod (44).

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