System and method for measuring sample dimensions

Abstract

An exemplary sample measurement device includes a clamp, a single actuator configured to control the clamp to position the sample with a clamping force, a measurement probe configured to contact the clamped sample with a probe force, and a single position sensor configured to measure the dimensions of the clamped sample based on detecting the position of the measurement probe.

Description

Technical Field

[0001] [Related Applications] This application claims the benefit of U.S. Provisional Patent Application No. 63 / 359,085, filed Jul. 7, 2022, entitled “SYSTEMS AND METHODS TO MEASURE SPECIMEN DIMENSIONS”. The entire disclosure of U.S. Provisional Patent Application No. 63 / 359,085 is incorporated herein by reference.

[0002] The present disclosure generally relates to a test specimen measurement system, and more particularly, to systems and methods for measuring specimen dimensions.

Background Art

[0003] Material testing systems, such as systems that test specimens with respect to tensile, compressive, torsional, strain, displacement, and / or other properties, typically use the physical dimensions of the test specimen to determine measurement results. Conventional measurements of physical dimensions may include calipers or similar devices.

[0004] By comparing such systems with the present disclosure, which will be described in the remainder of this application with reference to the drawings, the limitations and disadvantages of conventional and traditional approaches will become apparent to those skilled in the art.

Summary of the Invention

[0005] The present disclosure relates to systems and methods for measuring specimen dimensions, which are substantially illustrated in and / or described in connection with at least one of a plurality of drawings and more fully described in the claims.

[0006] In addition to these and other advantages, aspects, and novel features of the present disclosure, the detailed content of the illustrated examples of the present disclosure will be more fully understood from the following description and the drawings.

Brief Description of the Drawings

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Mode for Carrying Out the Invention

[0019] The drawings are not necessarily to scale. Where appropriate, like or identical reference numerals are used to refer to like or identical components.

[0020] The material testing system is used to measure the physical properties of a material sample such as tensile strength or compressive strength. The dimensions of the material sample are also measured to determine accurate measurement values. Conventional measurement of sample dimensions may be performed manually (e.g., using calipers) or automatically. Certain specific standards such as ASTM D5947-18 specify certain specific conditions under which the dimensions should be measured. However, conventional manual methods require a lot of manpower, which can increase costs and reduce throughput for test applications with a large sample volume. Furthermore, conventional automatic measuring devices may have insufficient accuracy, a narrow sample dimension envelope, and high costs.

[0021] The disclosed exemplary sample measurement device aligns and centers a material sample along a measurement axis over a range of sample thicknesses and / or widths. In some of the disclosed examples, each measurement axis is actuated using a single motor and measured using only a single encoder. By using a single motor and a single encoder per axis, the disclosed exemplary sample measurement device aligns and centers the sample along the measurement axis, firmly clamps the sample in place, and applies a repeatable probe force for both axes. The disclosed exemplary sample measurement device can be used as a stand-alone measurement device and / or as part of an automated material testing system.

[0022] The disclosed exemplary sample measuring device includes a sample width measuring instrument configured to measure the width dimension of a sample. The sample width measuring instrument includes a first measurement probe, a first clamp and a second clamp, wherein the first clamp and the second clamp are configured to align and clamp the sample with the first measurement probe in response to the operation of at least one of the first clamp or the second clamp, a first actuator configured to operate at least one of the first clamp or the second clamp, and a first position sensor configured to determine the position of the first measurement probe. The exemplary sample measuring device further includes a sample thickness measuring instrument configured to measure the thickness dimension of the sample. The sample thickness measuring instrument includes a second measurement probe oriented perpendicular to the first measurement probe, a third clamp and a fourth clamp, wherein the third clamp and the fourth clamp are configured to align and clamp the sample with the second measurement probe in response to the operation of at least one of the third clamp or the fourth clamp, a second actuator configured to operate at least one of the third clamp or the fourth clamp and the second measurement probe, and a second position sensor configured to determine the position of the second measurement probe. The exemplary sample measuring device further includes a processing circuit configured to control the first actuator to clamp the first clamp and the second clamp against the sample, engage the first measurement probe with the sample, control the second actuator to clamp the third clamp and the fourth clamp against the sample, engage the second measurement probe with the sample, determine the width of the sample based on the first position sensor, and determine the thickness of the sample based on the second position sensor.

[0023] In some exemplary sample measurement devices, the first actuator includes a twin lead screw configured to operate a first clamp and a first measurement probe in a first direction and to operate a second clamp in a second direction opposite to the first direction. In some exemplary sample measurement devices, the first actuator further includes a motor configured to rotate the twin lead screw, and the first sensor includes a current sensor configured to detect a motor current and determine whether a first force exceeds a first threshold force.

[0024] In some exemplary sample measurement devices, the first measurement probe includes a first spring configured to apply a predetermined engagement force to the first measurement probe toward the sample. In some exemplary sample measurement devices, the sample width measurer is configured to use a single actuator to restrain and clamp the sample at a predetermined location relative to the sample thickness measurer over a range of sample widths.

[0025] In some exemplary sample measurement devices, the sample width measurer is configured to measure the width of the sample in a horizontal direction. In some exemplary sample measurement devices, the first clamp includes a first arm and a second arm positioned on both sides of the first measurement probe. In some exemplary sample measurement devices, each of the sample thickness measurer and the sample width measurer includes only one position sensor. In some exemplary sample measurement devices, the first clamp and the second clamp are configured to align the sample with a second measurement probe.

[0026] In some exemplary sample measurement devices, the second actuator comprises a twin lead screw configured to actuate a third clamp and a third measurement probe in a first direction and to actuate a fourth clamp in a second direction opposite the first direction. In some exemplary sample measurement devices, the second actuator further comprises a motor configured to rotate the twin lead screw, and the second sensor includes a current sensor configured to detect a motor current and determine whether a second force exceeds a second threshold force.

[0027] In some exemplary sample measurement devices, the first clamp is positioned above the second clamp, the first clamp includes a first spring configured to apply a first clamping force, the second clamp includes a second spring configured to apply a second clamping force, and the second spring is preloaded such that the second clamping force is greater than the first clamping force such that the first clamp clamps the sample against a support surface prior to engagement of the second clamp with the sample. Some exemplary sample measurement devices further comprise a support surface configured to position the sample prior to measurement, and the second clamping force is set such that the second clamp lifts the sample above the support surface prior to engagement of the second measurement probe with the sample. In some exemplary sample measurement devices, the second measurement probe is configured to engage the sample after the sample is clamped.

[0028] In some exemplary sample measurement devices, the sample thickness gauge is configured to use a single actuator to restrain and clamp the sample at a predetermined location over a range of sample thicknesses. In some exemplary sample measurement devices, the clamping force between the first clamp and the second clamp is greater than the probe force between the first measurement sensor and the sample. In some exemplary sample measurement devices, the sample width gauge further includes a third measurement probe that faces the first measurement probe, and the first position sensor is configured to measure the location of the first measurement probe relative to the third measurement probe when the first measurement probe and the third measurement probe are each applying a probe force to the sample.

[0029] In some exemplary sample measurement devices, the clamping force between the third clamp and the fourth clamp is greater than the probe force between the second measurement sensor and the sample. In some exemplary sample measurement devices, the sample width gauge further includes a third measurement probe that faces the second measurement probe, and the second position sensor is configured to measure the location of the second measurement probe relative to the third measurement probe when the second measurement probe and the third measurement probe are each applying a probe force to the sample.

[0030] In some exemplary sample measurement devices, the processing circuit unit controls a first actuator to clamp a first clamp and a second clamp to the sample to align the sample with a second measurement probe, controls a second actuator to clamp a third clamp and a fourth clamp to the sample, and controls the first actuator to unclamp (release the clamp) the first clamp and the second clamp from the sample in response to at least one of the third clamp or the fourth clamp clamping the sample, controls the second actuator to align the sample with a first measurement probe via the third clamp and the fourth clamp, moves the second measurement probe to contact the sample, controls the first actuator to clamp the first clamp and the second clamp to the sample, and is configured to engage the first measurement probe with the sample.

[0031] Some exemplary sample measurement devices further include a first sensor configured to determine whether a first force in at least one of the first measurement probe, the first clamp, or the second clamp satisfies a first threshold force, and a second sensor configured to determine whether a second force in at least one of the second measurement probe, the third clamp, or the fourth clamp satisfies a second threshold force. In some exemplary sample measurement devices, the processing circuit unit is configured to control at least one of the first actuator or the second actuator based on at least one of the first position sensor or the second position sensor. In some exemplary sample measurement devices, the sample measurement device is configured to be added to a test system.

[0032] The disclosed exemplary sample measurement device includes a clamp, a single actuator configured to control the clamp to position the sample with a clamping force, a measurement probe configured to contact the clamped sample with a probe force, and a single position sensor configured to measure the dimensions of the clamped sample based on detecting the position of the measurement probe.

[0033]

[0033] In some exemplary sample measurement devices, a single actuator, a measurement probe, and a single position sensor are configured to measure the width of a sample. In some exemplary sample measurement devices, the single actuator includes a twin lead screw configured to actuate a clamp and a measurement probe in a first direction and to actuate a second clamp in a second direction opposite the first direction.

[0034] In some exemplary sample measurement devices, the single actuator further includes a motor configured to rotate the twin lead screw and further includes a current sensor configured to detect a motor current and determine whether a first force exceeds a first threshold force. In some exemplary sample measurement devices, the measurement probe includes a spring configured to apply a predetermined engagement force to the measurement probe toward the sample.

[0035] Some exemplary sample measurement devices further include a processing circuit configured to control the single actuator to clamp a first clamp and a second clamp against a sample, engage the measurement probe with the sample, and determine the width of the sample based on the single position sensor.

[0036]

[0034] In some exemplary sample measurement devices, the clamp is configured to restrain and clamp the sample at a predetermined location relative to a sample thickness gauge over a range of sample widths using the single actuator. In some exemplary sample measurement devices, the first clamp includes a first arm and a second arm positioned on opposite sides of the first measurement probe.

[0037] In some exemplary sample measurement devices, a single actuator, measurement probe, and single position sensor are configured to measure the thickness of a sample. In some exemplary sample measurement devices, the single actuator includes a twin lead screw configured to operate the clamp and the measurement probe in a first direction and to operate a second clamp in a second direction opposite the first direction.

[0038] In some exemplary sample measurement devices, the second actuator further includes a motor configured to rotate the twin lead screw, and the single position sensor includes a current sensor configured to detect the motor current and determine whether a second force exceeds a second threshold force. In some exemplary sample measurement devices, the clamp is positioned above the second clamp, the clamp includes a first spring configured to apply a first clamping force, the second clamp includes a second spring configured to apply a second clamping force, and a preload is applied to the second spring such that the second clamping force is greater than the first clamping force so that the clamp clamps the sample against the support surface before the second clamp engages the sample.

[0039] Some sample measurement devices further include a support surface configured to position the sample before measurement, and the second clamping force is set such that the second clamp lifts the sample above the support surface before the second measurement probe engages the sample. In some exemplary sample measurement devices, the second measurement probe is configured to engage the sample after the sample is clamped.

[0040] The disclosed exemplary test system includes a sample testing device configured to determine at least one mechanical property of a sample and a sample measurement device configured to measure at least one dimension of the sample using a single actuator and a single position sensor for each dimension to be measured.

[0041] In some such test systems, the sample measurement device is configured to measure at least one of the width or thickness of the sample.

[0042] FIG. 1 shows an example of an automatic test measurement system 100 including a sample measurement device 102, as well as a sample holder 104 and a sample test device 106. The exemplary automatic test measurement system 100 further includes a sample manipulator 108, such as a robotic arm, for moving a test sample among the sample holder 104, the sample measurement device 102, and the sample test device 106.

[0043] The exemplary sample holder 104 can be a rack or similar device into which the sample can be loaded in a manner accessible to the manipulator 108. The exemplary sample test device 106 is configured to perform one or more mechanical or other tests on the test sample within the sample holder 104. For example, the sample test device 106 can be a universal testing machine that performs tensile strength tests, compressive strength tests, torsion or bending tests, peel tests, tear tests, friction tests, shear tests, and / or any other type of test. Exemplary testing machines that can be used to implement the sample test device 106 include the 6800 series and / or the 3400 series of test systems sold by Instron (trademark), a division of Illinois Tool Works Inc. having an office in Norwood, Massachusetts.

[0044] In some examples, the sample manipulator 108 removes the test sample from the sample holder 104 and sets it in a predetermined position within the sample measurement device 102. The sample measurement device 102 measures the thickness and width of the sample, as will be disclosed in more detail below. Thereafter, the sample manipulator 108 can remove the sample from the sample measurement device 102 and set the sample within the sample test device 106.

[0045] FIG. 2 is a perspective view of an exemplary sample measurement device 200 that can be used to implement the sample measurement device 102 of FIG. 1. The exemplary sample measurement device 200 measures cross-sectional dimensions (e.g., thickness and width) of a sample 202 set on a support surface 204 of the sample measurement device 200. For this purpose, the exemplary sample measurement device 200 includes a sample width measuring instrument 206 and a sample thickness measuring instrument 208. Each of the sample width measuring instrument 206 and the sample thickness measuring instrument 208 includes a clamp and a measurement probe, as well as a sensor for detecting the clamping force and an encoder for performing position measurement.

[0046] As disclosed in more detail below, the exemplary sample measurement device 200 includes only one actuator per measurement axis and uses mechanical sequencing for all steps of alignment, restraint, and measurement. The sample measurement device 200 provides a measurement force independent of the clamping force and uses electromechanical control and springs to provide accurate, precise, and repeatable control of clamping and positioning to meet the relevant measurement standards (e.g., ASTM D5947-18). The exemplary sample measurement device 200 centers or aligns the sample along both measurement axes regardless of its dimensions (within the measurement limits). As a result, the sample measurement device 200 can adapt to a variety of samples and shapes within the measurement limits.

[0047] To perform mechanical sequencing and execute measurements, the exemplary sample measurement device 200 includes a computing device 210, such as a computer or a similar processing device, that controls the operation of the sample width measuring instrument 206 and the sample thickness measuring instrument 208 and receives, processes, and / or stores sensor data associated with feedback and / or measurement inputs. The exemplary computing device 210 can be an integrated stand-alone computing device of the sample measurement device 200 and / or part of another component of the system 100 (e.g., the sample testing device 106) that communicates with the sample measurement device 102.

[0048] The exemplary sample thickness measuring device 208 has an asymmetric preload in the clamp of the sample thickness measuring device 208 such that the top clamp always contacts the sample 202 first and clamps the sample 202 against the support surface 204, and then the bottom clamp raises the sample 202 from the support surface 204 to a predetermined measurement position. The clamping force applied by the sample thickness measuring device 208 is proportional to the thickness of the sample 202.

[0049] The exemplary sample width measuring device 206 and the sample thickness measuring device 208 restrain the sample 202 while reducing (e.g., minimizing, eliminating) the deformation and deflection of the sample 202 during measurement, thereby reducing the measurement error.

[0050] FIG. 3 is a side view of the sample width measuring device 206 of FIG. 2 in the open position. FIG. 4 is a top view of the sample width measuring device 206 in the open position. FIG. 5 is a top view of the sample width measuring device 206 in the fully clamped position (fully clamped position). The sample width measuring device 206 is shown by the support surface 204 and the sample 202 of FIG. 2.

[0051] The exemplary sample width measuring device 206 includes measurement probes 302a, 302b and clamps 304a, 304b positioned on both sides of the support surface 204. The exemplary clamps 304a, 304b of FIGS. 3-5 each include tapping arms 306a, 306b, 306c, 306d, and the measurement probes 302a, 302b are positioned between each pair of the tapping arms 306a-306d.

[0052] The measurement probes 302a, 302b and the clamps 304a, 304b are mounted and supported via respective carriages 308a, 308b mounted on the mounting rail 310 via bearings. The measurement probes 302a, 302b and the clamps 304a, 304b are actuated simultaneously via a twin lead screw 312 driven via an electric motor 314 (e.g., directly, via a belt and pulley system, via a gear system, etc.). The twin lead screw 312 has threads extending in opposite directions at different ends of the twin lead screw 312. When the twin lead screw 312 rotates, the twin lead screw 312 drives the carriages 308a, 308b and the measurement arms in opposite directions (e.g., according to the actuation direction of the twin lead screw 312, towards each other or away from each other). However, in other examples, the twin lead screw 312 can be replaced with a single direction lead screw and the carriages 308a, 308b can be provided with opposite thread directions.

[0053] The exemplary measurement probes 302a, 302b extend through the clamps 304a, 304b (e.g., between the tapping arm 306a and the tapping arm 306b, and between the tapping arm 306c and the tapping arm 306d) and contact the sample 202. The measurement probes 302a, 302b include springs 314a, 314b that apply a probe force to the measurement probes 302a, 302b to perform the measurement. The springs 314a, 314b are compressed between the measurement probes 302a, 302b and the clamps 304a, 304b. However, other elastic devices can be used instead of the springs 314a, 314b to apply a desired probe force.

[0054] In the examples of FIGS. 3-5, the position sensor 316 determines the location of at least one of the measurement probes 302a, e.g., the distance between the two measurement probes 302a, 302b. For example, the position sensor 316 can be attached to the carriage 308a and be an encoder that determines a location along a measurement tape or a spar connected to the carriage 308b and determines the distance between the measurement probes 302a, 302b. Other exemplary position sensors 316 can include capacitive sensors, linear variable displacement transducers (LVDTs), laser displacement sensors, and / or any other type of position sensor. In some examples, a plurality of measurements obtained by the position sensor 316 can be filtered (e.g., averaged) to determine the measured dimension. The position sensor 316 and / or the computing device 210 can transmit the measurements to an external system for recording, sample tracking, and / or any other purpose.

[0055] In some examples, the sample width gauge 206 further includes a force sensor that determines whether the probe force at one or both of the measurement probes 302a, 302b is within a predetermined force range. When the probe force is within the predetermined force range, the measurement output of the position sensor 316 can be determined and stored as the width of the sample 202.

[0056] During operation, the twin lead screw 312 is actuated to close the clamps 304a, 304b against the sample 202 on the support surface 204, whereby the clamps 304a, 304b align the sample 202 with the probes 302a, 302b and center the sample 202 with the probe of the sample thickness gauge 208. FIG. 5 shows the clamps 304a, 304b in the closed position. While the sample 202 is on the support surface 204, the measurement probes 302a, 302b may not be in full contact with the sample 202 or may not even be in partial contact, depending on the thickness of the sample.

[0057] When the clamp 604a of the sample thickness measuring instrument 208 clamps the sample 202 against the support surface 204, the exemplary twin lead screw 312 can be actuated in the reverse direction to release the clamps 304a, 304b from the sample 202. By releasing the clamps 304a, 304b, the clamp of the sample thickness measuring instrument 208 can lift the sample 202 to the measurement position above the support surface 204. Thereafter, the twin lead screw 312 can be actuated in the first direction to clamp the sample 202 again with the clamps 304a, 304b, and the measurement probes 302a, 302b can be engaged with a probe force to perform a width measurement. As a result of the movement of the clamps 304a, 304b and the forces applied by the springs 314a, 314b to the measurement probes 302a, 302b, the measurement probes 302a, 302b contact and move relative to the sample 202 so as to disengage from the contact. When the clamps 304a, 304b are in contact with the sample 202, the springs 314a, 314b apply a repeatable probe force independent of the clamping force to the measurement probes 302a, 302b against the sample 202 (e.g., in accordance with the relevant measurement standards).

[0058] At the end of the measurement, the twin lead screw 312 is actuated in the reverse direction to unclamp the sample 202, enabling additional measurements and / or removal of the sample 202 from the sample measuring device 200 (e.g., for transfer to a sample testing device).

[0059] The exemplary sample width measuring instrument 206 of FIGS. 3 - 5 includes two carriages 308a, 308b that support the clamps 304a, 304b and the measurement probes 302a, 302b, but in other examples, the clamps 304a, 304b can include a carriage separate from the carriage that supports the measurement probes 302a, 302b.

[0060] In some other examples, instead of operating the clamps 304a, 304b from opposite directions, the sample width measuring device 206 can include one clamp coupled to an actuator (e.g., a lead screw) and a second clamp in a stationary position. In such an example, the sample thickness measuring device 208 can also be configured to move with the actuated clamp of the sample width measuring device 206 such that the sample thickness measuring device 208 aligns with the sample 202 as soon as the sample width measuring device 206 clamps the sample 202.

[0061] FIG. 6 is a front view of the sample thickness measuring device 208 of FIG. 2 in an open position. FIG. 7 is a side view of the sample thickness measuring device 208 in an open position. FIG. 8 is a side view of the sample thickness measuring device 208 in a fully clamped position, and FIG. 9 is a front view of the sample thickness measuring device 208 in a fully clamped position. As described above, the sample thickness measuring device 208 operates in sequence with the sample width measuring device 206 of FIGS. 3-5 to align, position, and measure the sample 202.

[0062] The exemplary sample thickness measuring device 208 includes measurement probes 602a, 602b and clamps 604a, 604b. The measurement probes 602a, 602b and the clamps 604a, 604b are aligned with the measurement axis 606 of the sample thickness measuring device 208, and the measurement probes 602a, 602b are configured to apply a probe force to the sample 202 positioned on the support surface 204, and the support surface 204 is also aligned with the measurement axis 606 of the sample thickness measuring device 208 by the clamping by the clamps 304a, 304b.

[0063] The upper clamp 604a includes a clamping post 608a positioned at the center of the load balancing platform 610a. The load balancing platform 610a is connected to three or more pistons 612a that apply a balanced force to the load balancing platform 610a to reduce or eliminate the moment on the sample 202 by the upper clamp 604a. In some examples, the clamping post 608a and the load balancing platform 610a are implemented as a single integrated component. However, alternatively, the clamping post 608a and the load balancing platform 610a may be assembled into a fixed assembly.

[0064] The piston 612a is connected to a carriage 614a that is connected to the mounting rail 616 via a bearing and maintains alignment with the measurement axis 606. The piston 612a includes a corresponding spring 618a, and the spring 618a applies a balanced clamping force collectively to the head of the piston 612a, and as a result, to the load balancing platform 610a, the clamping post 608a, and the sample 202.

[0065] The clamping post 608a has a hole 609a through which the measurement probe 602a extends internally to contact the sample 202. The measurement probe 602a includes a spring 622a configured to apply a probe force to the measurement probe 602a within a predetermined range of probe forces, and the predetermined range of probe forces can be the same as or different from the range of probe forces in the measurement probes 302a, 302b. The measurement probe 602a is mounted on the mounting rail 616 via a separate carriage 614b, and the spring 622a is compressed between the measurement probe 602a and the main body 628a of the clamp 604a such that the probe force applied by the spring 622a is applied independently of the clamping force applied by the clamp 604a via the spring 618a. For this purpose, the twin lead screw 620 is connected to the carriage 614a that controls the clamp 604a, but is not directly connected to the carriage 614b. The spring 622a applies a probe force to the measurement probe 602a via the movement of the carriage 614a and the pressing against the main body 628a of the clamp 604a. In this way, the probe force is always established substantially independently of the clamping force applied by the clamp 604a.

[0066] The exemplary lower clamp 604b is positioned on the opposite side of the sample 202 from the upper clamp 604a and includes similar components such as a clamping post 608b, a load balancing platform 610b, a piston 612b, and a spring 618b, which are mounted on a carriage 614c. The load balancing platform 610b has a hole 609b through which the measurement probe 602b extends internally to contact the sample 202.

[0067] The measurement probe 602b includes a spring 622b configured to apply a probe force within a predetermined range of probe forces to the measurement probe 602b, and the predetermined range of probe forces can be the same as or different from the range of probe forces in the measurement probes 302a, 302b. The measurement probe 602b is mounted on the mounting rail 616 via the carriage 614d, and the spring 622b is compressed between the measurement probe 602b and the main body 628b of the clamp 604b such that the probe force applied by the spring 622b is applied independently of the clamping force applied by the clamp 604b via the spring 618b. The twin lead screw 620 is connected to the carriage 614c that controls the clamp 604b, but is not directly connected to the carriage 614d. The spring 622b applies a probe force to the measurement probe 602b via the movement of the carriage 614c and the pressing against the main body 628b of the clamp 604b. In this way, the probe force is always established substantially independently of the clamping force applied by the clamp 604b. Instead of the springs 618a, 618b, 622a, 622b, other elastic devices may be used to apply the desired clamping force and / or probe force.

[0068] Carriages 614a - 614d are driven by a twin lead screw 620 in the same manner as the twin lead screws 312 and carriages 308a, 308b of FIGS. 3 - 5. In the example of FIGS. 6 - 9, carriages 614a, 614b (e.g., upper measurement probes 602a and upper clamps 604a) are driven in a first direction, and carriages 614c, 614d (e.g., lower measurement probes 602b and lower clamps 604b) are driven in a second direction opposite to the first direction in response to the twin lead screw 620 rotating in the first direction (e.g., moving carriages 614a, 614b towards carriages 614c, 614d). When the twin lead screw 620 rotates in the opposite direction, movement of carriages 614a, 614b and carriages 614c, 614d in the opposite direction occurs (e.g., moving carriages 614a, 614b away from carriages 614c, 614d).

[0069] The exemplary sample thickness gauge 208 further includes a position sensor 624. In the example of FIGS. 3 - 5, the position sensor 624 determines the location of at least one of the measurement probes 602a, 602b, e.g., the distance between the two measurement probes 602a, 602b. For example, the position sensor 624 can be attached to carriage 614c and determine a location along a measurement tape or a spar connected to carriage 614d to determine the distance between measurement probes 602a, 602b. In some examples, the sample thickness gauge 208 further includes a force sensor that determines whether the probe force at one or both of the measurement probes 602a, 602b is within a predetermined force range. When the probe force is within the predetermined force range, the measurement output of the position sensor 624 can be determined and stored as the thickness of the sample 202. The position sensor 624 can be implemented according to any of the examples described above with respect to the position sensor 316.

[0070] The exemplary twin lead screw 620 of FIGS. 6 - 9 is driven via an electric motor 626 (e.g., directly, via a belt and pulley system, via a gear system, etc.).

[0071] In the examples of FIGS. 6-9, a preload is applied to the lower clamp 604b. For example, pistons 612a, 612b can be implemented by screwing or bolting pistons 612a, 612b to carriages 614a, 614c such that the initial loads in springs 618a, 618b can be set by tightening or loosening screws. By applying a preload to the lower clamp 604b, clamps 604a, 604b are configured such that, in response to actuation via the twin lead screw 620 (before contact by the lower clamp 604b), the upper clamp 604a contacts the sample 202, the lower clamp 604b contacts the sample 202, and the preload in the lower clamp 604b causes the lower clamp 604b to execute a sequence of lifting the sample 202 above the support surface 204 when the force between the lower clamp 604b and the upper clamp 604a becomes partially or fully equal.

[0072] The sequence further includes engagement of the measurement probes 602a, 602b with the sample 202 after the clamps 604a, 604b have moved the sample 202 to the measurement position (e.g., on the support surface 204). The clamps 604a, 604b also orient the sample 202 orthogonally to the probes 602a, 602b at the location of the measurement probes 602a, 602b. The sequence can be coordinated with the actuation of the probes 302a, 302b and / or the clamps 304a, 304b of the exemplary sample width gauge 206. FIGS. 8 and 9 show exemplary measurement probes 602a, 602b and clamps 604a, 604b in the fully closed position (fully closed position) with the sample 202 in the measurement position.

[0073] The examples of FIGS. 2-9 use twin lead screws, but in other examples, the twin lead screws can be replaced with other types of actuators such as synchronous lever(s), pneumatic actuator, hydraulic actuator, opposed belt drive and / or gears, and / or any other type of actuator. Additionally or alternatively, it is advantageous to use a single encoder for each measurement axis, but measurements can be performed using multiple encoders (e.g., one encoder per measurement probe) on one or both axes.

[0074] In some examples, the sample measurement device 200 can include a sample detection sensor that automatically detects the presence of a sample 202 (e.g., on the support surface 204). In some examples, the sample detection sensor supplies an output in response to detecting the sample 202 at the measurement position. The output can cause a warning or other output to notify the operator that the sample has been detected and / or that the measurement procedure is about to be started, and / or to trigger the start of the measurement sequence (e.g., via the computing device 210).

[0075] Additionally or alternatively, the sample detection sensor can be interlocked with an actuator such that the operation of the sample measurement device 200 is permitted only upon detection of the sample. In some examples, the sample detection sensor is configured to detect the presence of the sample 202 in a manner that cannot be easily replicated by the operator's hand or by another object that is not the sample, e.g., by image recognition and / or presence detection at multiple remote locations.

[0076] In some examples, the support surface 204 can include a stage or other actuator that moves the support surface 204 along the aligned length dimension of the sample (e.g., orthogonal to the axes of both the sample width gauge 206 and the sample thickness gauge 208). By moving the support surface 204 in the width dimension, the sample measurement device 200 can acquire width and / or thickness measurements at multiple locations along the length of the sample 202.

[0077] In some examples, an actuator (e.g., motor 314, motor 626) further includes an actuator force sensor(s) that detects when the force(s) in one or both of the actuators is higher than a threshold force (e.g., higher than a configured clamping force). Detection of a force above the threshold force can cause the computing device 210 to control the actuator (e.g., motor 314, motor 626) to stop and / or reverse direction.

[0078] In some examples, the computing device 210 can control an actuator (e.g., motor 314, motor 626) based on location measurements from location sensors 316, 624. For example, the computing device 210 can operate the actuator at a faster speed at a greater distance, for example, and at a slower speed when the location sensors 316, 624 detect that the clamps 304a, 304b and / or 604a, 604b are approaching the sample 202, based on the location measurements, to control the speed of the actuator (e.g., motor 314, motor 626). For example, the computing device 210 can have one or more distance or location thresholds that control the speed range used to control the actuator. Additionally or alternatively, when the sample 202 is clamped, the computing device 210 can limit the distance by which the clamps 304a, 304b and / or 604a, 604b are moved after the sample 202 is unclamped, when the next clamp (e.g., next measurement) is to be made on the same sample 202. By controlling the actuator based on the location detected by the location sensors 316, 624, the time taken to obtain sample measurements can be reduced in the disclosed examples.

[0079] FIG. 10 shows an exemplary flowchart of machine-readable instructions that an exemplary computing device 210 of FIG. 2 can execute to perform a measurement process using the sample measurement device 200 of FIGS. 2-9. Exemplary instruction 1000 is described below with respect to the operation sequence of the sample measurement device 200 shown in FIGS. 11A-11F. FIG. 11A shows the sample width gauge 206 and the sample thickness gauge 208 in an initial open position where the sample 202 can be set on the support surface 204.

[0080] In block 1002, the computing device 210 controls a width actuator (e.g., motor 314 of FIG. 3) to rotate a width twin lead screw (e.g., twin lead screw 312) to close the width clamp (e.g., clamps 304a, 304b, tamping arms 306a-306d) against a sample (e.g., sample 202 positioned on the support surface 204).

[0081] In block 1004, the computing device 210 determines whether a threshold width clamp force has been reached. For example, the computing device 210 can read the motor current of the motor 314 to determine the amount of force applied between the clamps 304a, 304b. If the threshold width clamp force has not been reached (block 1004), control returns to block 1002 to continue closing the width clamps 304a, 304b.

[0082] If the threshold width clamp force has been reached (block 1004), in block 1006, the computing device 210 stops the width actuator (e.g., motor 314). FIG. 11B shows an exemplary sample measurement device 200 at the completion of block 1006 when the width clamps 304a, 304b are clamped against the sample 202.

[0083] In block 1008, the computing device 210 controls a thickness actuator (e.g., motor 626 in FIG. 6) to rotate a thickness twin lead screw (e.g., twin lead screw 620 in FIG. 6) to close thickness clamps (e.g., clamps 604a, 604b in FIG. 6) against the sample 202.

[0084] In block 1010, the computing device 210 determines whether the threshold thickness clamp force has been reached. For example, the computing device 210 can monitor a current sensor coupled to measure the current in the motor 626 to determine the load or force in the clamps 604a, 604b. If the threshold thickness clamp force has not been reached (block 1010), the control returns to block 1008 to continue closing the clamps 604a, 604b.

[0085] If the threshold thickness clamp force has been reached (block 1010), in block 1012, the computing device 210 stops the motor 626. FIG. 11C shows an exemplary sample measurement device 200 at the completion of block 1012 when the thickness clamps 604a, 604b are clamped against the sample 202.

[0086] In block 1014, the computing device 210 controls a width actuator (e.g., motor 314) to rotate a width lead screw 312 to open width clamps 304a, 304b. The operation in block 1014 is in a direction opposite to the operation in block 1002.

[0087] In block 1016, the computing device 210 determines whether the threshold probe distance has been reached. For example, based on the position sensor 316, the computing device 210 can determine that the carriages 308a, 308b have increased their distance from block 1006 by at least the threshold amount and / or that the carriages 308a, 308b are at least the threshold distance apart. If the threshold probe distance has not been reached (block 1016), control returns to block 1014 and continues to control the width actuator (e.g., motor 314).

[0088] When at least the threshold probe distance has not been reached (block 1016), in block 1018, the computing device 210 stops the width actuator (e.g., motor 314). FIG. 11D shows an exemplary sample measurement device 200 at the completion of block 1016 when the width clamps 304a, 304b are unclamped from the sample 202.

[0089] In block 1020, the computing device 210 controls the thickness actuator (e.g., motor 626) to rotate the thickness twin lead screw 620 to close the thickness clamps 604a, 604b against the sample 202, lift the sample 202 above the support surface 204 (e.g., when at least a certain clamping force has been reached based on the thickness of the sample 202), and move the thickness probes 602a, 602b towards the sample 202 (e.g., when the sample 202 has been lifted above the support surface 204 by equalizing the clamping force by the clamps 604a, 604b). FIG. 11E shows an exemplary sample measurement device 200 at the completion of block 1020 when the thickness clamps 604a, 604b have clamped the sample 202, lifted the sample 202 above the support surface 204, and the thickness probes 602a, 602b have engaged the sample 202.

[0090] In block 1022, computing device 210 determines whether the threshold thickness probe force has been reached. For example, computing device 210 can determine that the threshold probe force has been reached when at least a certain threshold clamping force has been reached (e.g., based on the current of motor 626). Additionally or alternatively, computing device 210 can receive measurements from a force sensor configured to read the force in one or both of measurement probes 602a, 602b. If the threshold thickness probe force has not been reached (block 1022), control returns to block 1020 and continues to control the thickness actuator (e.g., motor 626). When the threshold thickness probe force has been reached (block 1022), in block 1024, computing device 210 stops the thickness actuator (e.g., motor 626).

[0091] In block 1026, computing device 210 controls the width actuator (e.g., motor 314) to rotate the width twin lead screw 312 to close the width clamps 304a, 304b against the sample 202. FIG. 11F shows an exemplary sample measurement device 200 at the completion of block 1026 when the width clamps 304a, 304b clamp the sample 202 and the width probes 302a, 302b engage the sample 202.

[0092] In block 1028, computing device 210 determines whether the threshold width clamp force has been reached. Block 1028 can be performed in a manner similar or identical to block 1004. If the threshold width clamp force has not been reached (block 1028), control returns to block 1026 and continues to control the width actuator (e.g., motor 314). When the threshold width clamp force has been reached (block 1028), in block 1030, computing device 210 stops the width actuator (e.g., motor 314).

[0093] In block 1032, computing device 210 measures the width of sample 202 based on a signal from sample width position sensor 316. In block 1034, computing device 210 measures the thickness of sample 202 based on a signal from sample thickness position sensor 624. Position sensors 316, 624 can be calibrated to convert the measured position or distance to the corresponding distance between probes 302a, 302b or probes 602a, 602b, which can further be based on the probe force measured via force sensors coupled to probes 302a, 302b and / or probes 602a, 602b.

[0094] Exemplary instruction 1000 then ends. In some examples, computing device 210 can control actuators (e.g., motors 314, 626) to reverse the sequence, return sample 202 to the table, and unclamp sample 202 for removal of sample 202 (e.g., manually and / or via sample manipulator 108).

[0095] FIG. 12 is a block diagram of an exemplary embodiment of computing device 210 of FIG. 2. Exemplary computing device 210 can be a general purpose computer, laptop computer, tablet computer, mobile device, server, all-in-one computer, and / or any other type of computing device.

[0096] The exemplary computing device 210 of FIG. 12 includes a processor 1202. The exemplary processor 1202 can be any general-purpose central processing unit (CPU) from any manufacturer. In some other examples, the processor 1202 can include one or more dedicated processing devices such as a RISC processor having an ARM core, an image processing device, a digital signal processor, and / or a system-on-chip (SoC). The processor 1202 executes machine-readable instructions 1204 that can be locally stored in the processor (e.g., in a built-in cache or SoC), in random access memory 1206 (or other volatile memory), in read-only memory 1208 (or other non-volatile memory such as flash memory), and / or in mass storage device 1210. The exemplary mass storage device 1210 can be a hard drive, a solid-state storage drive, a hybrid drive, a RAID array, and / or any other mass data storage device.

[0097] Bus 1212 enables communication between the processor 1202, RAM 1206, ROM 1208, mass storage device 1210, network interface 1214, and / or input / output interface 1216.

[0098] The exemplary network interface 1214 includes hardware, firmware, and / or software that connects the computing device 210 to a communication network 1218 such as the Internet. For example, the network interface 1214 can include IEEE 1202.X compliant wireless and / or wired communication hardware for transmitting and / or receiving communications.

[0099] The exemplary I / O interface 1216 of FIG. 12 includes hardware, firmware, and / or software for connecting one or more input / output devices 1220 to the processor 1202 to provide inputs to and / or outputs from the processor 1202. For example, the I / O interface 1216 can include an image processing device for interfacing with a display device, a universal serial bus port for interfacing with one or more USB-compliant devices, FireWire (registered trademark), a field bus, and / or any other type of interface. The exemplary computing device 210 includes a display device 1224 (e.g., an LCD screen) coupled to the I / O interface 1216. Other exemplary I / O device(s) 1220 can include a keyboard, a keypad, a mouse, a trackball, a pointing device, a microphone, an audio speaker, a display device, an optical media drive, a multi-touch touch screen, a gesture recognition interface, a magnetic media drive, and / or any other type of input and / or output device.

[0100] The exemplary computing device 210 can access a non-transitory machine-readable medium 1222 via the I / O interface 1216 and / or the I / O device(s) 1220. Examples of the machine-readable medium 1222 of FIG. 12 include optical disks (e.g., compact disks (CDs), digital versatile / video disks (DVDs), Blu-ray (registered trademark) disks, etc.), magnetic media (e.g., floppy (registered trademark) disks), portable storage media (e.g., portable flash drives, secure digital (SD) cards, etc.), and / or any other type of removable and / or installed machine-readable medium.

[0101] The exemplary sample measurement device disclosed can be incorporated or integrated into a test system and / or implemented as an add-on module to a test system. For example, the exemplary sample measurement device disclosed herein can be implemented on the same frame as a universal testing device or other test system such that the same computing device or other processing circuitry and / or control circuitry controls both the sample measurement process and the sample testing process. Alternatively, the exemplary sample measurement device disclosed can be attached to or set near a test system for ease of access and for transfer of samples between the sample measurement device as a test system.

[0102] The method and / or system can be realized in hardware, software, or a combination of hardware and software. The method and / or system can be realized centrally in at least one computing system or in a distributed manner in which different elements are distributed over several interconnected computing and / or remote computing systems. Any kind of computing system or other device adapted to execute the methods described herein is suitable. A typical combination of hardware and software can be a general-purpose computing system having a program or other code that, when loaded and executed, controls the computing system to execute the methods described herein. Another typical embodiment can include application-specific integrated circuits or chips. Some embodiments can include non-transitory machine-readable (e.g., computer-readable) media (e.g., flash drives, optical disks, magnetic storage disks, etc.), such non-transitory machine-readable media storing one or more instructions executable by a machine (e.g., lines of code) that thereby cause the machine to execute a process as described herein.

[0103] As used herein, the term "for example" begins a list of one or more non-limiting examples, instances, or illustrations.

[0104] As used herein, the terms "coupled," "coupled to," and "coupled with" mean a structural and / or electrical connection, whether by attachment, adhesion, connection, joining, fastening, linking, and / or otherwise fixing. As used herein, the term "attaching" means attaching, coupling, connecting, joining, fastening, linking, and / or otherwise fixing. As used herein, the term "connecting" means attaching, coupling, connecting, joining, fastening, linking, and / or otherwise fixing.

[0105] As used herein, the terms "circuit" and "circuitry" refer to physical electronic components (i.e., hardware), and any software and / or firmware ("code") that can configure the hardware, that the hardware can execute, and / or that can otherwise be associated with the hardware. As used herein, for example, a particular processor and memory can include a first "circuit" when executing a first one or more lines of code, and can include a second "circuit" when executing a second one or more lines of code. As used herein, circuitry is "operable" and / or "configured" to perform its function whenever it includes the hardware and code (if either is required) necessary to perform that function, regardless of whether the performance of that function is disabled (e.g., by user-configurable settings, factory trim, etc.) or enabled.

[0106] As used herein, a control circuit can include digital and / or analog circuitry, discrete and / or integrated circuitry, microprocessors, DSPs, etc., software, hardware, and / or firmware, that form part or all of a controller and / or are located on one or more substrates used to control a device such as a welding process and / or a power supply and wire feeder.

[0107] As used herein, the term "processor" means a processing device, apparatus, program, circuit, component, system, and subsystem, whether implemented in hardware, in tangibly embodied software, or both, and whether programmable or not. As used herein, the term "processor" includes, without limitation, one or more computing devices, circuits connected by wiring, devices and systems that change signals, devices and machines for controlling a system, a central processing unit, programmable devices and systems, field programmable gate arrays, application specific integrated circuits, system on chips, systems comprising individual elements and / or circuits, state machines, virtual machines, data processors, processing facilities, and any combination of the foregoing. A processor can be, for example, any type of general-purpose microprocessor or general-purpose microcontroller, a digital signal processing (DSP) processor, an application specific integrated circuit (ASIC), a graphics processing unit (GPU), a reduced instruction set computer (RISC) processor incorporating an advanced RISC machine (ARM) core, and the like. A processor may be coupled to and / or integrated with a memory device.

[0108] As used herein, the terms "memory", "memory circuit section" and / or "memory device" mean computer hardware or a circuit section that stores information for use by a processor and / or other digital devices. The memory, memory circuit section, and / or memory device can be any suitable type of computer memory or any other type of electronic storage device medium, for example, read-only memory (ROM), random access memory (RAM), cache memory, compact disc read-only memory (CDROM), electro-optical memory, magneto-optical memory, programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM), computer-readable medium, etc. Examples of the memory include non-transitory memory, non-transitory processor-readable medium, non-transitory computer-readable medium, non-volatile memory, dynamic RAM (DRAM), volatile memory, ferroelectric RAM (FRAM (registered trademark)), first-in first-out (FIFO) memory, last-in first-out (LIFO) memory, stack memory, non-volatile RAM (NVRAM), static RAM (SRAM), cache, buffer, semiconductor memory, magnetic memory, optical memory, flash memory, flash card, compact flash (registered trademark) card, memory card, secure digital memory card, micro card, mini card, expansion card, smart card, memory stick, multimedia card, picture card, flash storage, subscriber identity module (SIM) card, hard drive (HDD), solid state drive (SSD), etc. The memory can be configured to store code, instructions, applications, software, firmware, and / or data, and can be external to, internal to, or both with respect to the processor.

[0109] As used herein, "and / or" means any one or more of the items in the list connected by "and / or". By way of example, "x and / or y" means any of the three elements of the set {(x), (y), (x, y)}. In other words, "x and / or y" means "one or both of x and y". As another example, "x, y and / or z" means any of the seven elements of the set {(x), (y), (z), (x, y), (x, z), (y, z), (x, y, z)}. In other words, "x, y and / or z" means "one or more of x, y and z". As used herein, the term "exemplary" means serving as a non-limiting example, instance or illustration. As used herein, the term "for example" begins a list of one or more non-limiting examples, instances or illustrations.

[0110] Although the method and / or system has been described with reference to certain embodiments, those skilled in the art will understand that various changes can be made and equivalents can be substituted without departing from the scope of the method and / or system. For example, the blocks and / or components of the disclosed examples can be combined, divided, rearranged, and / or otherwise changed. Additionally, many modifications can be made to adapt the teachings of the present disclosure to specific situations or materials without departing from the scope of the present disclosure. Accordingly, the method and / or system is not limited to the specific embodiments disclosed. Instead, the method and / or system includes all embodiments that fall within the scope of the appended claims, literally or under the doctrine of equivalents.

Claims

1. A sample measurement device, comprising: a clamp; a single actuator configured to control the clamp to position a sample with a clamping force; a measurement probe configured to contact the clamped sample with a probe force; a single position sensor configured to measure the dimensions of the clamped sample based on detecting the position of the measurement probe; A sample measurement device comprising the above.

2. The sample measurement device according to claim 1, wherein the single actuator, the measurement probe, and the single position sensor are configured to measure the width of the sample.

3. The sample measurement device according to claim 2, wherein the single actuator is a twin lead screw, and is configured to operate the clamp and the measurement probe in a first direction, and operate a second clamp in a second direction opposite to the first direction.

4. The sample measurement device according to claim 3, wherein the single actuator further comprises a motor configured to rotate the twin lead screw, and further comprises a current sensor configured to detect a motor current and determine whether the first force exceeds the first threshold force.

5. The sample measurement device according to claim 2, wherein the measurement probe comprises a spring configured to apply a predetermined engagement force towards the sample to the measurement probe.

6. A processing circuit unit, comprising: controlling the single actuator to clamp the first clamp and the second clamp to the sample, and engage the measurement probe with the sample; determining the width of the sample based on the single position sensor; The sample measurement device according to claim 2, further comprising a processing circuit unit configured as above.

7. The sample measurement device according to claim 2, wherein the clamp is configured to use the single actuator to restrain and clamp the sample at a predetermined location relative to a sample thickness gauge over a range of sample widths.

8. The sample measurement device according to claim 2, wherein the first clamp comprises a first arm and a second arm positioned on both sides of the first measurement probe.

9. The sample measuring device according to claim 1, wherein the single actuator, the measurement probe, and the single position sensor are configured to measure the thickness of the sample.

10. The sample measuring device according to claim 9, wherein the single actuator is a twin lead screw configured to operate the clamp and the measurement probe in a first direction and to operate a second clamp in a second direction opposite to the first direction.

11. The sample measuring device according to claim 10, wherein the second actuator further includes a motor configured to rotate the twin lead screw, and the single position sensor includes a current sensor configured to detect a motor current and determine whether the second force exceeds the second threshold force.

12. The clamp is positioned above the second clamp, the clamp includes a first spring configured to apply a first clamping force, the second clamp includes a second spring configured to apply a second clamping force, and the second spring is preloaded such that the clamp clamps the sample against a support surface before the second clamp engages the sample, and the second clamping force is greater than the first clamping force. The sample measuring device according to claim 10.

13. The sample measuring device according to claim 12, further comprising a support surface configured to position the sample before measurement, wherein the second clamping force is set such that the second clamp lifts the sample above the support surface before the second measurement probe engages the sample.

14. The sample measuring device according to claim 12, wherein the second measurement probe is configured to engage the sample after the sample is clamped.

15. A sample measuring device, A sample width measuring instrument configured to measure the width dimension of a sample, A first measurement probe, A first clamp and a second clamp configured to align and clamp a sample with the first measurement probe in response to operation of at least one of the first clamp or the second clamp. a first actuator configured to activate at least one of the first clamp or the second clamp; a first position sensor configured to determine the location of the first measurement probe; A sample width measuring device comprising: A sample thickness measuring device configured to measure the thickness dimension of a sample, a second measurement probe oriented perpendicular to the first measurement probe; a third clamp and a fourth clamp configured to align and clamp the sample with the second measurement probe in response to activation of at least one of the third clamp or the fourth clamp; a second actuator configured to activate at least one of the third clamp or the fourth clamp and the second measurement probe; a second position sensor configured to determine the location of the second measurement probe; A sample thickness measuring device comprising: a processing circuit unit, controlling the first actuator to clamp the first clamp and the second clamp to the sample and engage the first measurement probe with the sample, controlling the second actuator to clamp the third clamp and the fourth clamp to the sample and engage the second measurement probe with the sample, determining the width of the sample based on the first position sensor, determining the thickness of the sample based on the second position sensor, a processing circuit unit configured as such; A sample measuring device comprising:

16. The sample measuring device according to claim 15, wherein the first actuator is a twin lead screw configured to operate the first clamp and the first measurement probe in a first direction and the second clamp in a second direction opposite to the first direction.

17. The sample measuring device according to claim 16, wherein the first actuator further comprises a motor configured to rotate the twin lead screw, and the first sensor includes a current sensor configured to detect a motor current and determine whether the first force exceeds a first threshold force.

18. The sample measuring device according to claim 15, wherein the first measurement probe includes a first spring configured to apply a predetermined engaging force to the first measurement probe toward the sample.

19. The sample width measuring device according to claim 15, wherein the sample width measuring device is configured to use a single actuator to restrain and clamp the sample at a predetermined location with respect to the sample thickness measuring device over a range of sample widths.

20. The sample measuring device according to claim 15, wherein the sample width measuring device is configured to measure the width of the sample in the horizontal direction.

21. The sample measuring device according to claim 15, wherein the first clamp includes a first arm and a second arm positioned on both sides of the first measurement probe.

22. The sample measuring device according to claim 15, wherein each of the sample thickness measuring device and the sample width measuring device includes only one position sensor.

23. The sample measuring device according to claim 15, wherein the first clamp and the second clamp are configured to align the sample with the second measurement probe.

24. The sample measuring device according to claim 15, wherein the second actuator is a twin lead screw, and the twin lead screw is configured to operate the third clamp and the third measurement probe in a first direction and operate the fourth clamp in a second direction opposite to the first direction.

25. The sample measuring device according to claim 24, wherein the second actuator further includes a motor configured to rotate the twin lead screw, and the second sensor includes a current sensor configured to detect a motor current and determine whether the second force exceeds the second threshold force.

26. The first clamp is positioned above the second clamp, the first clamp includes a first spring configured to apply a first clamping force, the second clamp includes a second spring configured to apply a second clamping force, and a preload is applied to the second spring such that the first clamp clamps the sample against a support surface before the second clamp engages with the sample, and the second clamping force is greater than the first clamping force. The sample measuring device according to claim 15.

27. The sample measuring device according to claim 26, further comprising a support surface configured to position the sample before measurement, wherein the second clamping force is set such that the second clamp lifts the sample above the support surface before the second measuring probe engages with the sample.

28. The sample measuring device according to claim 26, wherein the second measuring probe is configured to engage with the sample after the sample is clamped.

29. The sample thickness measuring device according to claim 15, wherein the sample thickness measuring device is configured to restrain and clamp the sample at a predetermined location over a range of sample thicknesses using a single actuator.

30. In the sample measuring device according to claim 15, the clamping force between the first clamp and the second clamp is greater than the probe force between the first measuring sensor and the sample.

31. The sample width measuring device according to claim 30, further comprising a third measuring probe facing the first measuring probe, and the first position sensor is configured to measure the location of the first measuring probe relative to the third measuring probe when the first measuring probe and the third measuring probe apply the probe force to the sample, respectively.

32. In the sample measuring device according to claim 15, the clamping force between the third clamp and the fourth clamp is greater than the probe force between the second measuring sensor and the sample.

33. The sample width measuring device further includes a third measurement probe facing the second measurement probe, and the second position sensor is configured to measure the position of the second measurement probe relative to the third measurement probe when the second measurement probe and the third measurement probe are each applying the probe force to the sample. The sample measuring device according to claim 32.

34. The processing circuit unit controls the first actuator to clamp the first clamp and the second clamp to the sample, and align the sample with the second measurement probe. controls the second actuator to clamp the third clamp and the fourth clamp to the sample. controls the first actuator to unclamp the first clamp and the second clamp from the sample in response to at least one of the third clamp or the fourth clamp clamping the sample. controls the second actuator to align the sample with the first measurement probe via the third clamp and the fourth clamp, and move the second measurement probe to contact the sample. controls the first actuator to clamp the first clamp and the second clamp to the sample, and engage the first measurement probe with the sample. The sample measuring device according to claim 15, configured as described above.

35. Furthermore, a first sensor configured to determine whether a first force in at least one of the first measurement probe, the first clamp, or the second clamp satisfies a first threshold force; a second sensor configured to determine whether a second force in at least one of the second measurement probe, the third clamp, or the fourth clamp satisfies a second threshold force; The sample measuring device according to claim 15, comprising.

36. The processing circuit unit is configured to control at least one of the first actuator or the second actuator based on at least one of the first position sensor or the second position sensor. The sample measuring device according to claim 15.

37. The sample measuring device according to claim 15, configured to be added to a test system.

38. A test system, comprising: a sample testing device configured to determine at least one mechanical property of the sample; and a sample measuring device configured to measure at least one dimension of the sample using a single actuator and a single position sensor for each dimension to be measured; The test system comprising the same.

39. The test system according to claim 38, wherein the sample measuring device is configured to measure at least one of the width or the thickness of the sample.

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