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172results about "Caliper-like sensors" patented technology

Testing device for thickness of slice medium

The invention relates to a device for measuring thickness, in particular to a testing device for thickness of a slice medium. The testing device comprises a fixed mount, a reference shaft, a testing shaft, an elastic press sheet, a magnet, and a Hall sensor, wherein two ends of the reference shaft are installed on the fixed mount by bearings, the reference shaft is fixedly sleeved with a reference roller; two ends of the testing shaft are fixedly installed on the fixed mount; the testing shaft is provided with at least one testing roller base of which one end is rotated freely around the testing shaft; a free end of the testing roller base is provided with a testing roller which can rotate freely; the testing roller and the reference roller are formed in elastic contact; the elastic press sheet is arranged correspondingly to the testing roller base; one end of the elastic press sheet is fixed on the fixed mount and the other end of the elastic press sheet forms a free end and applies a pressing force to the testing roller base at the reference roller; the free end of the elastic press sheet is fixedly provided with the magnet on the opposite side to the testing roller; and the Hall sensor for testing the displacement of the magnet in a non-contact mode is fixed on the fixed mount opposed to the magnet.
Owner:GRG BAKING EQUIP CO LTD

Web Measurement Device

A sensor is provided that measures web caliper using optical and magnetic measuring devices. The optical measuring devices may employ a confocal chromatic aberration method to accurately determine the distance to the moving web and the magnetic devices may be ferrite core coil and target. Means of stabilizing a moving web are included for improving dynamic measurement accuracy.
Owner:ABB LTD

Measuring instrument and method for determination of the properties of an item and its surface

ActiveUS20120206710A1Affect qualityClear impact both on the production process quality assuranceCaliper-like sensorsOptical rangefindersOptical radiationMeasurement device
A measurement device for the determination of the characteristics of the object's surface by means of the optical radiation, wherein a measurement device comprises an optical radiation source and a detector to receive the radiation reflected from the surface being measured. In addition, a measurement device comprises an emitted optical radiation processing unit, which is adjusted to split optical radiation emitted by an optical source into separate wavelengths and to direct said separate wavelengths to the object being measured in a direction, that differs from the normal of the surface being measured so, that at least the shortest and the longest wavelengths of said wavelengths are focused on different halves and different heights of the measured object's surface, in the direction of the normal of the surface being measured. In addition, a measurement device comprises a reflected optical radiation processing unit, which is adjusted to receive an optical radiation reflected from the measured object at least in the direction of a specular reflection, which differs from the normal of the surface being measured, and to direct received optical radiation to said detector. Still further, the measurement device is adjusted to analyze an electric signal produced by the detector and proportional to the intensity of the radiation focused thereto, and to further determine a surface gloss (gloss degree) and / or thickness characteristic property of the measured object, based on the intensity of its wavelength, the focus point of which was located on the measured surface, and which wavelength was the strongest reflected from that point to the detector in the specular geometry.
Owner:FOCALSPEC

Measuring instrument and method for determination of the properties of an item and its surface

A measurement device for the determination of the characteristics of the object's surface by means of the optical radiation, wherein a measurement device comprises an optical radiation source and a detector to receive the radiation reflected from the surface being measured. In addition, a measurement device comprises an emitted optical radiation processing unit, which is adjusted to split optical radiation emitted by an optical source into separate wavelengths and to direct said separate wavelengths to the object being measured in a direction, that differs from the normal of the surface being measured so, that at least the shortest and the longest wavelengths of said wavelengths are focused on different halves and different heights of the measured object's surface, in the direction of the normal of the surface being measured. In addition, a measurement device comprises a reflected optical radiation processing unit, which is adjusted to receive an optical radiation reflected from the measured object at least in the direction of a specular reflection, which differs from the normal of the surface being measured, and to direct received optical radiation to said detector. Still further, the measurement device is adjusted to analyze an electric signal produced by the detector and proportional to the intensity of the radiation focused thereto, and to further determine a surface gloss (gloss degree) and / or thickness characteristic property of the measured object, based on the intensity of its wavelength, the focus point of which was located on the measured surface, and which wavelength was the strongest reflected from that point to the detector in the specular geometry.
Owner:LEMMAI TECH CO LTD

Wavelength selection method, film thickness measurement method, film thickness measurement apparatus, and system for producing thin film silicon device

An object is to reduce film thickness measurement error. Illumination light having different wavelengths is radiated onto a plurality of samples in which thin films having different film qualities and film thicknesses are provided on substrates, evaluation values related to the amounts of transmitted light when the illumination light of each wavelength is radiated are measured, film thickness characteristics, showing the relationship between the evaluation values and the film thicknesses for each film quality, are formed at each wavelength based on the measurement results, and among the film thickness characteristics, a wavelength at which a measurement difference between the evaluation values caused by the film qualities is in a predetermined range is selected.
Owner:MITSUBISHI HEAVY IND LTD

Scanner Belt Load and Stretch Compensation Control System

Upper to lower assembly analog position sensors in a dual scanning system measure alignment offsets. A controller uses error signals from the position sensors to calculate actuator error profiles that are used in the next scan in the same direction, with different error profiles being used for forward and reverse scans. Since the alignment error profiles are repeatable for a given set of scanner conditions, the actuator controller anticipates what the error signal will be before each scanning assembly reaches a given position. An optimized error correction can be calculated based on the error profiles and actuator bandwidth without concerns regarding feedback loop speed, overshoot, and unstable control oscillations. An actuation system driven from error profiles can correct for alignment offsets by actively changing belt tensions at the offsetting drive pulleys and / or changing the position of sensor assemblies relative to the drive belt systems.
Owner:HONEYWELL ASCA INC

Web Measurement Device

A sensor is provided that measures web caliper using optical and magnetic measuring devices. The optical measuring devices may employ a confocal chromatic aberration method to accurately determine the distance to the moving web and the magnetic devices may be ferrite core coil and target. Means of stabilizing a moving web are included for improving dynamic measurement accuracy.
Owner:ABB LTD

Determining surface and thickness

An optical radiation processing unit (112) directs different wavelengths of the optical radiation emitted by an optical source (104) to an object (114) being measured from a direction that differs from the normal (118) of a surface (116) being measured in such a manner that the different wavelengths focus on different heights in the direction of the normal (118) of the surface (116) being measured. A possible polarizer (120, 122) polarizes the reflected radiation in a direction perpendicular to the normal (118) of the surface (116). The optical radiation processing unit (112) directs to a detector (108) polarized optical radiation that it receives from the object (114) being measured. The signal processing unit (124) determines on the basis of a signal provided by the detector (112) from the detected radiation the wavelength on which the intensity of the radiation is the highest, and determines the location of the surface (116) by means of the determined wavelength. When measuring an object (114) from both sides, the thickness of the object (114) being measured is determinable using the locations of the surfaces.
Owner:LEMMAI TECH CO LTD

Method and apparatus for non-contact thickness measurement

The present invention provides a method and apparatus for use in measuring a thickness of a layer and / or variations in layer thickness for layers that are flat, curved or have curves. The apparatus comprises a light source to generate a light beam, a light beam detector to detect at least a portion of the light beam reflected, an eddy current field generator that induces an eddy current, an eddy current detector to detect the induced eddy current and a processor coupled with the light source, light detector, eddy current field generator and eddy current detector, wherein the processor controls the light detector, eddy current field generator and eddy current detector. A radial characteristic of a region of the surface can be determined, a scaling factor can be determined based on the radial characteristic and a measured distance can be scaled based on the scaling factor in determining a thickness.
Owner:THE BOEING CO

Sample observation method and sample observation device

An inspection method uses a charged particle microscope to observe a sample and view a defect site or a circuit pattern. A plurality of images is detected by a plurality of detectors and a mixed image is generated by automatically adjusting and mixing weighting factors required when the plurality of images are synthesized with each other. The sample is irradiated and scanned with a charged particle beam so that the plurality of detectors arranged at different positions from the sample detects a secondary electron or a reflected electron generated from the sample. The mixed image is generated by mixing the plurality of images of the sample with each other for each of the plurality of detectors, which are obtained by causing each of the plurality of detectors arranged at the different positions to detect the secondary electron or the reflected electron. The generated mixed image is displayed on a screen.
Owner:HITACHI HIGH-TECH CORP

Apparatus and Method for Measuring the Thickness of a Measurement Object

An apparatus for measuring the thickness of a measurement object, preferably a measurement object in the form of a web or piece goods, in a measuring gap, with a measuring mechanism which is fitted to a machine frame, wherein the measuring mechanism for measuring the thickness comprises one or more travel measurement sensor(s) aimed at the measurement object, is characterized in that a compensation sensor which is coupled to a travel measurement sensor measures the distance to a reference rule in order to detect and compensate for a change in the measuring gap, in that the reference rule is in the form of a side of a frame-shaped reference device integrated in the measuring mechanism, and in that the reference device is configured in such a manner that the distance between the reference rule and that side of the reference device which is opposite the reference rule is known during the thickness measurement. A corresponding method for measuring the thickness is also stated.
Owner:MICRO EPSILON MESSTECHNIK GMBH & CO KG

Method for calibrating a thickness gauge

A method for calibrating a thickness gauge, wherein the thickness gauge measures the thickness of a measurement object in a predefinable measuring direction (Z), comprising at least one displacement sensor (1, 2) operating in a contactless or scanning manner, wherein a reference object (3) having a known thickness and shape is moved into at least a partial region of the measurement field of the at least one displacement sensor (1, 2), comprises the following steps with respect to particularly precise and simple calibration. First, at least two independent measurement values are recorded by the at least one displacement sensor (1, 2) in at least two predefinable sites on a first surface of the reference object (3) at predefinable times tj, or as a function of predefinable positions pj of the reference object (3) in the measurement field, where j = 1, 2... Then the tilting or spatial position of the reference object in the measurement field is determined based on the measurement values recorded at the times tj, or as a function of the positions pj of the reference object (3). Then, a further measurement value is recorded by the at least one displacement sensor (1, 2) at a further site located in the measuring direction (Z) on a second surface disposed opposite the first surface, or on a surface region of the reference object (3) disposed opposite the first surface, in order to determine a thickness value of the reference object (3) in the measuring direction (Z).
Owner:MICRO EPSILON MESSTECHNIK GMBH & CO KG

Web measurement device

A sensor is provided that measures web caliper using optical and magnetic measuring devices. The optical measuring devices may employ a confocal chromatic aberration method to accurately determine the distance to the moving web and the magnetic devices may be ferrite core coil and target. Means of stabilizing a moving web are included for improving dynamic measurement accuracy.
Owner:ABB LTD

Method and apparatus for moving an article relative to and between a pair of thickness measuring probes to develop a thickness map for the article

A method and apparatus for moving an article relative to and between a pair of distance sensing probes of a thickness measuring apparatus which are spaced apart a known distance D is described. In the method, the article is moved relative to and between the pair of probes in at least one direction in a plane normal to a common measurement axis Ac between the probes. A distance a along the common measurement axis Ac between the first probe and a point on the surface of the article nearest to the first probe of the pair that intersects the common measurement axis Ac is measured. A similar distance b between the second probe and the article is measured. From the measured distance a, the article is moved relative to the probes along the common measurement axis Ac so as to minimize any difference between the measured distance a and a desired distance ad along the common measurement axis Ac between the first probe and a point on the surface of the article nearest to the first probe that intersects the common measurement axis. The measured distances a and b and the position of the article relative to the probes in at least one direction are recorded at predetermined time intervals to develop a thickness map of the article. In a thickness computation, all of the measured distances a for each recorded position of the article are substantially the same.
Owner:ADE CORPORATION

Thickness detecting experimental platform

The invention discloses a thickness detecting experimental platform. The platform comprises a motion simulation module and a thickness detection module, the motion simulation module drives a to-be-detected product to execute predetermined simulation motions which are used to simulate different motions of the production in a practical production line, and the thickness detection module is used to detect the thickness of the to-be-detected product driven by the motion simulation module. According to the platform, the motion simulation module drives the to-be-detected product to simulate the different motions in the practical production line, the condition of the product in the practical production line can be reproduced in a lab, and thus, thickness detection equipment can be debugged offline in the lab, online debugging is not needed, normal production of the production line is not influenced, and debugging is convenient.
Owner:TYCO ELECTRONICS (SHANGHAI) CO LTD +2

Thickness measurement system and thickness measurement method

An objective of the present invention is to allow removing the effect of measurement error caused when the distance between support points of a pair of laser rangefinders of a thickness measurement device fluctuates due to temperature changes, and to allow contiguous measurement without special measures being required for safety management. Thickness measurement devices (1, 2) are set with a predetermined gap (Ld), while the first thickness measurement device (1) executes a thickness correction process with a thickness reference plate (5c), and while the second measurement device (2) which is placed on the downstream side of a movement direction executes a measurement process, an operation mode setting unit (3) sets the first thickness measurement device (1) to "measurement", instructs the second thickness measurement device (2) to commence a "thickness correction" process, delays a first thickness measurement value (1) to a location corresponding to a gap in the movement direction, derives the difference between the first thickness measurement value (1) and a second thickness measurement value (2) thereof as a correction value, and executes a thickness correction without interrupting the measurement by the second thickness measurement device (2).
Owner:KK TOSHIBA

Internal crack detecting method and internal crack detecting apparatus

A method for detecting an internal crack in a wafer includes a first image recording step of applying near infrared light having a transmission wavelength to a reference wafer having the same configuration as a target wafer to be subjected to the detection of the internal crack, thereby obtaining a first image of the reference wafer having no internal crack and then recording the first image, a processing step of processing the target wafer, a second image recording step of applying the near infrared light to the target wafer, thereby obtaining a second image of the processed target wafer and then recording the second image, and an internal crack detecting step of removing the same image information between the first image and the second image from the second image to obtain a residual image, thereby detecting the residual image as the internal crack in the target wafer.
Owner:DISCO CORP

Noncontact scanning system

A noncontact object scanning system includes a horizontal table rotatable on a vertical axis, one or more scanners above the table and one or more scanners below the table. The table allows passage of radiant energy therethrough due to its transparency or construction as a nonreflective grid. A controller automatically steps the scanners through a scanning sequence, each scan associated with a segment of the object's exterior surface. Surface segments scanned from above the table and from below the table combine to provide a comprehensive scan of the entire exterior surface. Adjacent surface segments overlap one another to provide redundant data used to overcome shadowing effects from the grid and to accurately align and merge the segments into a three dimensional representation of the complete exterior shape of the object. The scanners can incorporate color responsive light detectors whereby the three dimensional representation portrays color and shape.
Owner:CYBEROPTICS

Method and apparatus for non-contact thickness measurement

The present invention provides a method and apparatus for use in measuring a thickness of a layer and / or variations in layer thickness for layers that are flat, curved or have curves. The apparatus comprises a light source to generate a light beam, a light beam detector to detect at least a portion of the light beam reflected, an eddy current field generator that induces an eddy current, an eddy current detector to detect the induced eddy current and a processor coupled with the light source, light detector, eddy current field generator and eddy current detector, wherein the processor controls the light detector, eddy current field generator and eddy current detector. A radial characteristic of a region of the surface can be determined, a scaling factor can be determined based on the radial characteristic and a measured distance can be scaled based on the scaling factor in determining a thickness.
Owner:THE BOEING CO

Sheet Stabilization With Dual Opposing Cross Direction Air Clamps

ActiveUS20090260772A1Accurate thicknessAccurate other measurementCaliper-like sensorsDryer sectionEngineeringCalipers
An air stabilization system employing two parallel, opposite facing Coanda nozzles, that are positioned adjacent a flexible moving web, with each nozzle exhausting gas at opposite directions, subjects the moving web to opposing forces effective to stabilize the web. Each nozzle includes an elongated slot that is parallel to the path of the moving web. The two Coanda nozzles serve as separate points along the machine direction for controlling the height of the moving web. By modulating the flow, pressure and other parameters of gases exiting the Coanda nozzles, the shape of the moving web between the nozzles can be manipulated to present a planar contour for measurements. The air stabilization system can be incorporated into a scanner head to measure the caliper of paper, plastic, and other flexible web products.
Owner:HONEYWELL ASCA INC

Device for the contactless three-dimensional inspection of a mechanical component with toothing

An inspection device for contactless three-dimensional inspection of a circular, mechanical component with toothing having a main axis of rotation. The device is configured to scan the teeth by at least one first pair of laser measurement modules and rotationally drive the component about the main axis relative to the laser measurement modules. The device then rebuilds a virtual three-dimensional representation of the component using data coming from said scanning and performs a dimensional inspection using the three-dimensional representation. Each pair of modules includes a first module oriented towards a first face of a tooth and a second module oriented towards a second face of a tooth. The modules are oriented relative to the component so that during a rotation of the component, the laser measurement modules scan the first and second faces of each tooth throughout their thickness and depth.
Owner:DWFRITZ AUTOMATION INC

Method and device for contactless determination of the thickness of a web of material, including correction of the alignment error

A method for the contactless determination of the thickness of a web of material, for example a web of fibrous material using a sensor array including at least two optical measurement units between which the web can be guided. Each of the optical measurement units includes a measurement plate on the side facing the web. The optical measurement units, which are arranged on opposite sides of the web, are used to measure the distance of the measurement units from the web, and an evaluation unit is used to determine the thickness of the web from the determined distances between the optical measurement units and the web and the distance between the optical measurement units arranged on opposite sides of the web. Multiple optical sensors which are disposed at a distance from each other are associated with the optical measurement units arranged on opposite sides of the web and the evaluation unit is used to determine the angle of inclination of the measurement plates relative to the web and / or an offset between the optical measurement units arranged on opposite sides of the web or between the measurement plates of said units on the basis of the measured values obtained from the optical sensors.
Owner:VOITH PATENT GMBH

Thickness Determination of Web Product by Mid-infrared Wavelength Scanning Interferometry

Non-contacting caliper measurements of free-standing sheets detect mid-IR interferometric fringes created by the reflection of light from the top and bottom surfaces of the sheet. The technique includes directing a laser beam at a selected angle of incidence onto a single spot on the exposed outer surface and scanning the laser beam through a selected wavelength range as the laser beam is directed onto the exposed outer surface and measuring the intensity of an interference pattern that forms from the superposition of radiation that is reflected from the exposed outer surface and from the inner surface. Alternatively, the intensity of an interference pattern formed from the superposition of radiation that is directly transmitted through the web and radiation that is transmitted through the web after internal reflections from the internal surfaces of the web. Thickness can be extracted from the fringe separation in the interference pattern.
Owner:HONEYWELL ASCA INC

Sensors for measuring water/solute content and thickness of plant tissue

Systems and methods for non-invasively determining a water content, a solute content, and a thickness of plant tissue are disclosed. A system includes a sensing device having a first piece and a second piece, where the first piece and the second piece are coupled together to form a clip. The system further includes a capacitive tissue sensor including a capacitor. The capacitor includes a plurality of coplanar conductive plates. The first piece and the second piece are biased in a closed position to provide a gripping force around the plant tissue such that at least a portion of the plant tissue contacts the plurality of coplanar conductive plates.
Owner:PENN STATE RES FOUND

Laser thickness gauge and method including passline angle correction

A laser thickness gauge has three laser displacement sensors each transmitting a laser beam onto a target web. Two sensors are spaced along the web and face one surface of the web and the third sensor faces the opposite surface. The thickness of a web that is positioned along a passline plane between the sensor is measured even when the passline plane is not perpendicular to the beams of the sensors. A data processor computes the passline angle from the distance measurements communicated from the three sensors. During setup and calibration, data representing physical characteristics of the gauge are measured and stored and during operation are processed with currently measured data to generate correction factors that are used to correct thickness measurements determined from the three laser sensors.
Owner:ADVANCED GAUGING TECH
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