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167results about "Caliper-like sensors" patented technology

Testing device for thickness of slice medium

The invention relates to a device for measuring thickness, in particular to a testing device for thickness of a slice medium. The testing device comprises a fixed mount, a reference shaft, a testing shaft, an elastic press sheet, a magnet, and a Hall sensor, wherein two ends of the reference shaft are installed on the fixed mount by bearings, the reference shaft is fixedly sleeved with a reference roller; two ends of the testing shaft are fixedly installed on the fixed mount; the testing shaft is provided with at least one testing roller base of which one end is rotated freely around the testing shaft; a free end of the testing roller base is provided with a testing roller which can rotate freely; the testing roller and the reference roller are formed in elastic contact; the elastic press sheet is arranged correspondingly to the testing roller base; one end of the elastic press sheet is fixed on the fixed mount and the other end of the elastic press sheet forms a free end and applies a pressing force to the testing roller base at the reference roller; the free end of the elastic press sheet is fixedly provided with the magnet on the opposite side to the testing roller; and the Hall sensor for testing the displacement of the magnet in a non-contact mode is fixed on the fixed mount opposed to the magnet.
Owner:GRG BAKING EQUIP CO LTD

Measuring instrument and method for determination of the properties of an item and its surface

ActiveUS20120206710A1Affect qualityClear impact both on the production process quality assuranceCaliper-like sensorsOptical rangefindersOptical radiationMeasurement device
A measurement device for the determination of the characteristics of the object's surface by means of the optical radiation, wherein a measurement device comprises an optical radiation source and a detector to receive the radiation reflected from the surface being measured. In addition, a measurement device comprises an emitted optical radiation processing unit, which is adjusted to split optical radiation emitted by an optical source into separate wavelengths and to direct said separate wavelengths to the object being measured in a direction, that differs from the normal of the surface being measured so, that at least the shortest and the longest wavelengths of said wavelengths are focused on different halves and different heights of the measured object's surface, in the direction of the normal of the surface being measured. In addition, a measurement device comprises a reflected optical radiation processing unit, which is adjusted to receive an optical radiation reflected from the measured object at least in the direction of a specular reflection, which differs from the normal of the surface being measured, and to direct received optical radiation to said detector. Still further, the measurement device is adjusted to analyze an electric signal produced by the detector and proportional to the intensity of the radiation focused thereto, and to further determine a surface gloss (gloss degree) and / or thickness characteristic property of the measured object, based on the intensity of its wavelength, the focus point of which was located on the measured surface, and which wavelength was the strongest reflected from that point to the detector in the specular geometry.
Owner:FOCALSPEC

Method for calibrating a thickness gauge

A method for calibrating a thickness gauge, wherein the thickness gauge measures the thickness of a measurement object in a predefinable measuring direction (Z), comprising at least one displacement sensor (1, 2) operating in a contactless or scanning manner, wherein a reference object (3) having a known thickness and shape is moved into at least a partial region of the measurement field of the at least one displacement sensor (1, 2), comprises the following steps with respect to particularly precise and simple calibration. First, at least two independent measurement values are recorded by the at least one displacement sensor (1, 2) in at least two predefinable sites on a first surface of the reference object (3) at predefinable times tj, or as a function of predefinable positions pj of the reference object (3) in the measurement field, where j = 1, 2... Then the tilting or spatial position of the reference object in the measurement field is determined based on the measurement values recorded at the times tj, or as a function of the positions pj of the reference object (3). Then, a further measurement value is recorded by the at least one displacement sensor (1, 2) at a further site located in the measuring direction (Z) on a second surface disposed opposite the first surface, or on a surface region of the reference object (3) disposed opposite the first surface, in order to determine a thickness value of the reference object (3) in the measuring direction (Z).
Owner:MICRO EPSILON MESSTECHNIK GMBH & CO KG

Method and apparatus for moving an article relative to and between a pair of thickness measuring probes to develop a thickness map for the article

A method and apparatus for moving an article relative to and between a pair of distance sensing probes of a thickness measuring apparatus which are spaced apart a known distance D is described. In the method, the article is moved relative to and between the pair of probes in at least one direction in a plane normal to a common measurement axis Ac between the probes. A distance a along the common measurement axis Ac between the first probe and a point on the surface of the article nearest to the first probe of the pair that intersects the common measurement axis Ac is measured. A similar distance b between the second probe and the article is measured. From the measured distance a, the article is moved relative to the probes along the common measurement axis Ac so as to minimize any difference between the measured distance a and a desired distance ad along the common measurement axis Ac between the first probe and a point on the surface of the article nearest to the first probe that intersects the common measurement axis. The measured distances a and b and the position of the article relative to the probes in at least one direction are recorded at predetermined time intervals to develop a thickness map of the article. In a thickness computation, all of the measured distances a for each recorded position of the article are substantially the same.
Owner:ADE CORPORATION

Method and device for contactless determination of the thickness of a web of material, including correction of the alignment error

A method for the contactless determination of the thickness of a web of material, for example a web of fibrous material using a sensor array including at least two optical measurement units between which the web can be guided. Each of the optical measurement units includes a measurement plate on the side facing the web. The optical measurement units, which are arranged on opposite sides of the web, are used to measure the distance of the measurement units from the web, and an evaluation unit is used to determine the thickness of the web from the determined distances between the optical measurement units and the web and the distance between the optical measurement units arranged on opposite sides of the web. Multiple optical sensors which are disposed at a distance from each other are associated with the optical measurement units arranged on opposite sides of the web and the evaluation unit is used to determine the angle of inclination of the measurement plates relative to the web and/or an offset between the optical measurement units arranged on opposite sides of the web or between the measurement plates of said units on the basis of the measured values obtained from the optical sensors.
Owner:VOITH PATENT GMBH
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