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653 results about "Shadow effect" patented technology

Organic light-emitting display panel and display apparatus

The invention discloses an organic light-emitting display panel and a display apparatus. The organic light-emitting display panel comprises a display area and a non-display area, wherein the display area comprises a substrate, a driving circuit layer and an light-emitting device layer disposed on the driving circuit layer; and the non-display area comprises a retaining wall arranged to encircle the display area, the retaining wall comprises at least one support layer, a barrier layer disposed on the support layer and multiple projections formed on the barrier layer, and the multiple projections are successively arranged along a direction away from the display area. The organic light-emitting display panel further comprises a packaging layer which covers the display area and the surfaces of a part of the projections. According to the invention, through designing the multiple projections at the top end of the retaining wall, the edge of the packaging layer can be sealed only by use of one retaining wall, the frame width of the display panel is reduced, the multiple projections generate deformation to make up for slits when being extruded by a mask, through the multiple projections, diffusion paths of reaction gas during deposition are also increased, diffusion can be ended in the multiple projections, and a shadow effect is eliminated.
Owner:SHANGHAI TIANMA MICRO ELECTRONICS CO LTD

Wafer-level aca flip chip package using double-layered aca/nca

A method of manufacturing a wafer-level flip chip package is capable of being used to produce a flip chip package by directly coating a flip chip package using anisotropic conductive adhesives (ACA) and non conductive adhesives (NCA) in a solution state as a double layer on a wafer. The method can be used to manufacture a non-conductive mixed solution and a conductive mixed solution and directly coat them on a substrate, such that it is possible to: increase productivity; simplify a manufacturing process; suppress a shadow effect; easily perform thickness control that is difficult with the anisotropic conductive adhesive paste or the non-conductive adhesive paste; and obtain the non-conductive layer and the anisotropic conductive layer in an initial state of a B-stage with a level not losing latent of hardening through a simple drying process to volatilize an organic solvent. Above all, the non-conductive layer and the anisotropic conductive layer is sequentially stacked on the substrate formed with the non-solder bump, making it possible to make the selectivity of electrical conduction and the stability of a connection process excellent, shorten process time and costs, and dramatically reduce consumption of the conductive particles which account for a large portion of total production costs.
Owner:KOREA ADVANCED INST OF SCI & TECH

Two-dimensional microscale measuring device and method based on double fiber bragg gratings

The invention belongs to the technical field of precision instrument manufacture and measurement and provides a two-dimensional microscale measuring device and method based on double fiber bragg gratings. The device comprises a wideband light source, a spectrum analyzer, an optical circulator, a control computer, a multiplex photoswitch and an external reference grating. The multiplex photoswitch is communicated with a double-fiber-bragg-grating probe through a single mode optical fiber a and a single mode optical fiber b respectively. The upper end of the double-fiber-bragg-grating probe is fixed through a probe clamping device, the single mode optical fiber a and the single mode optical fiber b are connected with the double-fiber-bragg-grating probe to form a channel. The method comprises the following steps that the control computer controls the multipath photoswitch to switch optical paths, the spectrum analyzer is utilized to respectively measure reflectance spectrums of the fiber bragg gratings, and two-dimensional microscale measurement of non-temperature coupling is achieved by utilizing the differential data processing algorithm. The two-dimensional microscale measuring device and method based on the twin-core fiber bragg grating have the advantages of being high in precision, small in contact force and not influenced by the shadowing effect. In addition, the service life of the probe is long.
Owner:HARBIN INST OF TECH

Two-dimensional microscale measuring device and method based on three-core fiber bragg grating

The invention belongs to the technical field of precision instrument manufacture and measurement and provides a two-dimensional microscale measuring device and method based on a three-core fiber bragg grating. The device comprises a wideband light source, a spectrum analyzer, an optical circulator, a control computer, a multiplex photoswitch and an external reference grating. The multiplex photoswitch is communicated with a three-core optical fiber fan-out device through three single mode optical fibers respectively. One end of the three-core optical fiber is connected to the three-core optical fiber fan-out device, a three-core fiber bragg grating probe is fixedly arranged at the other end of a three-core fiber through a probe clamping device, and the three-core fiber and the three-core fiber bragg grating probe are connected to form a channel. The method comprises the following steps that the control computer controls the multipath photoswitch to switch optical paths, the spectrum analyzer is utilized to respectively measure reflectance spectrums of the fiber bragg grating, and two-dimensional microscale measurement of non-temperature coupling is achieved by utilizing the differential data processing algorithm. The two-dimensional microscale measuring device has the advantages of being high in precision, small in contact force and not influenced by the shadowing effect. In addition, the service life of the probe is long.
Owner:HARBIN INST OF TECH

Two-dimensional microscale measuring device and method based on twin-core fiber bragg grating

The invention belongs to the technical field of precision instrument manufacture and measurement and provides a two-dimensional microscale measuring device and method based on twin-core fiber bragg grating. The device comprises a wideband light source, a spectrum analyzer, an optical circulator, a control computer, a multiplex photoswitch and an external reference grating. Two single mode fibers respectively enable the multiplex photoswitch to be communicated with a double-core fiber fan-out device. One end of a double-core fiber is connected to the double-core fiber fan-out device, the other end of the double-core fiber is fixedly provided with a double-core fiber bragg grating probe through a probe clamping device, and the double-core fiber and the double-core fiber bragg grating probe are connected to form a channel. The method comprises the following steps that the control computer controls the multiplex photoswitch to switch light paths, the spectrum analyzer is utilized to respectively measure reflectance spectrums of the fiber bragg grating, and two-dimensional microscale measurement of non-temperature coupling by utilizing the differential data processing algorithm is achieved. The two-dimensional microscale measuring device and method based on the twin-core fiber bragg grating have the advantages of being high in precision and small in contact force. In addition, the two-dimensional microscale measuring device is not influenced by the shadowing effect, and the service life of the probe is long.
Owner:HARBIN INST OF TECH
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