Two-dimensional microscale measuring device and method based on double fiber bragg gratings

Abstract

The invention belongs to the technical field of precision instrument manufacture and measurement and provides a two-dimensional microscale measuring device and method based on double fiber bragg gratings. The device comprises a wideband light source, a spectrum analyzer, an optical circulator, a control computer, a multiplex photoswitch and an external reference grating. The multiplex photoswitch is communicated with a double-fiber-bragg-grating probe through a single mode optical fiber a and a single mode optical fiber b respectively. The upper end of the double-fiber-bragg-grating probe is fixed through a probe clamping device, the single mode optical fiber a and the single mode optical fiber b are connected with the double-fiber-bragg-grating probe to form a channel. The method comprises the following steps that the control computer controls the multipath photoswitch to switch optical paths, the spectrum analyzer is utilized to respectively measure reflectance spectrums of the fiber bragg gratings, and two-dimensional microscale measurement of non-temperature coupling is achieved by utilizing the differential data processing algorithm. The two-dimensional microscale measuring device and method based on the twin-core fiber bragg grating have the advantages of being high in precision, small in contact force and not influenced by the shadowing effect. In addition, the service life of the probe is long.

Description

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AI Technical Summary

Benefits of technology

This technology has several technical benefits that make it better than existing methods like scanning electron microscope (SEM) or atomic force microscopy (AFM). It achieves higher precision and durability compared to other techniques while being less invasively damaging their surfaces during testing. Additionally, this technique allows for both radial and axis direction sensors without affecting any part they measure. Overall, these improvements enhance the performance capabilities of probes used for various applications including structural health monitoring, material analysis, medical diagnosis, etc., making them more reliable and efficient at performing different types of tests under varying conditions.

Problems solved by technology

Technologies described involve various technical problem addressed in these inventions such as improving the precision and speed of electronic devices like cameras while also addressing issues related to the difficulty of achieving accurate measurements within minute spaces and challenges associated with conventional techniques.

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