Systems, methods, and computer-readable media for utilizing a sifrian inversion to build a model to generate an image of a surveyed medium.

TN2024000410A1Undetermined Publication Date: 2026-07-01TECH INNOVATION INST SOLE PROPRIETORSHIP LLC
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Patent Information

Application Number
TN2024000410P0
Authority / Receiving Office
TN · TN
Patent Type
Applications
Current Assignee / Owner
Filing Date
2024-12-10
Publication Date
2026-07-01
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Abstract

Systems, methods, and computer-readable media for using full waveform inversion for imaging surveyed media are provided. The full waveform inversion uses a Sifrian functional to fully leverage Hessian information and update a model by augmenting and assembling data derived from the Sifrian functional when equilibrated. The Sifrian inversion produces high resolution images of the surveyed medium typically only seen with full Hessian inversions and can produce such images without requiring supercomputer computation power or extremely long computation time
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