Semiconductor device structure and methods of forming the same

TW202628612APending Publication Date: 2026-07-01TAIWAN SEMICONDUCTOR MANUFACTURING CO LTD
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Patent Information

Application Number
TW114107838
Authority / Receiving Office
TW · TW
Patent Type
Applications
Current Assignee / Owner
Priority Date
2025-01-05
Filing Date
2025-03-04
Publication Date
2026-07-01
Patent Text Reader

Abstract

A semiconductor device structure and methods of forming the same are described. The method includes forming a fin structure over a substrate and depositing one or more spacers on a portion of the fin structure. The one or more spacers are deposited on sidewalls of the fin structure. The method further includes removing a first portion of the one or more spacers to expose the fin structure and recessing the fin structure. A first byproduct layer is formed on a second portion of the one or more spacers. The method further includes passivating the first byproduct layer, softening the first byproduct layer, removing a portion of the first byproduct layer to expose the recessed fin structure, and further recessing the fin structure.
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