An elastic value testing device for a probe

By designing a probe elastic value test device including a base plate, a base and a flip plate, the problem of difficulty in determining the elastic value of the test probe in existing equipment is solved, rapid clamping and precise positioning are achieved, and production efficiency and market prospects are improved.

CN113049159BActive Publication Date: 2025-05-30WEINAN MUWANG INTELLIGENT TECH CO LTD
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Patent Information

Application Number
CN202110261473.7
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2021-03-10
Publication Date
2025-05-30
Estimated Expiration
2041-03-10

AI Technical Summary

Technical Problem

It is difficult for existing testing equipment to measure the elasticity value of the test probe, especially due to the special nature of the probe structure, it is impossible to directly clamp and perform data testing.

Method used

A probe elastic value test device is designed, including a base plate, a base and a flap. A U-shaped groove is provided on the side of the base for placing the probe. A clamping position and a clamping block are provided in the flap. The clamping block is pre-tightened by a locking screw to clamp the probe, and the precise positioning and elastic value determination of the probe and the test product are achieved through the cooperation between the flap and the base.

Benefits of technology

The device can quickly complete the clamping and precise positioning of probes of various shapes, realize elastic value measurement, have good market promotion prospects, and is simple in structure, convenient in operation, low manufacturing cost, and can greatly improve production efficiency.

✦ Generated by Eureka AI based on patent content.

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Abstract

The present invention provides an elastic value testing device for a probe, which comprises a bottom plate, a base and a flap; the base is arranged on the bottom plate, a U-shaped groove is arranged on the side of the base, and the U-shaped groove is used for placing the product for testing the elastic value of the probe; the flap is hinged to the side of the base, a clamping position is arranged in the flap, a clamping block is arranged in the clamping position, arc-shaped grooves for clamping the probe are formed on both the clamping block and the clamping position, and a locking screw is threadedly assembled on the outer edge of the flap, and the locking screw is used for pre-tightening the clamping block. This elastic value testing device for a probe solves the problem that it is difficult for the existing testing equipment to measure the elastic value of the testing probe.
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Description

Technical Field

[0001] The present invention belongs to the technical field of semiconductor detection equipment, and particularly relates to a device for testing the elastic force value of a probe. Background Art

[0002] Test probes are mainly used for detecting the electrical performance of electronic products. With the development of electronic products, they have been widely used in fields such as aviation, aerospace, military, medical, optoelectronics, etc., and have played a significant role in the development of modern science and technology.

[0003] The finished product inspection items of test probes mainly include resistance value, elastic force, etc. For the testing equipment, due to the increasingly special structure of test probe products, when testing the elastic force value of such products, it is impossible to directly clamp them on the testing equipment for data testing and adjustment.

[0004] Therefore, how to achieve the elastic force value test of such products will become very urgent and important. Summary of the Invention

[0005] The purpose of the present invention is to provide a device for testing the elastic force value of a probe, which solves the problem that it is difficult for existing testing equipment to measure the elastic force value of a test probe.

[0006] In order to achieve the above purpose, the technical solution adopted by the present invention is: a device for testing the elastic force value of a probe, including:

[0007] A bottom plate;

[0008] A base, the base is arranged on the bottom plate, and a U-shaped groove is arranged on the side of the base, and the U-shaped groove is used for placing the product for testing the elastic force value of the probe;

[0009] A flap, the flap is hinged on the side of the base, a clamping position is arranged in the flap, a clamping block is arranged in the clamping position, arc-shaped grooves for clamping the probe are formed on both the clamping block and the clamping position, and a locking screw is threadedly assembled on the outer edge of the flap, and the locking screw is used for pre-tightening the clamping block.

[0010] As a preferred technical solution of the present invention, it further includes two guide rails arranged on the bottom plate, and the base is slidably arranged on the two guide rails.

[0011] As a preferred technical solution of the present invention, two sliders are arranged on the lower side of the base, and a chute is arranged on the lower side of the two sliders, and the chute is sleeved on the two guide rails.

[0012] As a preferred technical solution of the present invention, a front limit block and a rear limit block are arranged between the two guide rails; the front limit block and the rear limit block are located on the moving track of the base.

[0013] As a preferred technical solution of the present invention, two pins are slidably inserted into the clamping position, and the clamping block is arranged on the two pins.

[0014] As a preferred technical solution of the present invention, a compression spring is sleeved on the lower end of the pin.

[0015] The beneficial effects of the present invention are as follows: (1) A device for testing the elastic force value of a probe according to the present invention can quickly complete the clamping of various-shaped probes and accurately position with the product for testing the elastic force value of the probe, so as to measure the elastic force value, and has a good market promotion and application prospect; (2) A device for testing the elastic force value of a probe according to the present invention has a simple structure, is convenient to operate, and has a low manufacturing cost, and can greatly improve the production efficiency. Description of the Drawings

[0016] The drawings described herein are used to provide a further understanding of the present invention and constitute a part of the present invention. The schematic embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute an improper limitation of the present invention. In the drawings:

[0017] Figure 1 is a schematic structural diagram of a device for testing the elastic force value of a probe according to the present invention when not tested;

[0018] Figure 2 is a schematic structural diagram of a device for testing the elastic force value of a probe according to the present invention when tested.

[0019] In the figure: 1. bottom plate, 2. guide rail, 3. front limit block, 4. rear limit block, 5. base, 6. flap, 7. compression spring, 8. locking screw, 9. clamping position, 10. clamping block, 11. slider, 12. probe, 13. U-shaped groove, 14. slider, 15. rotating shaft. Detailed Embodiments

[0020] The embodiments of the present invention will be described in detail below. The examples of the embodiments are shown in the drawings, in which the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the drawings are exemplary and are only used to explain the present invention and should not be construed as a limitation of the present invention.

[0021] In the description of the present invention, if the first and second are described only for the purpose of distinguishing technical features, they should not be construed as indicating or implying relative importance or implicitly indicating the quantity of the indicated technical features or implicitly indicating the sequence of the indicated technical features.

[0022] In the description of the present invention, unless otherwise clearly defined, terms such as "set", "installed", "connected", etc. should be understood in a broad sense, and those skilled in the art can reasonably determine the specific meanings of the above terms in the present invention in combination with the specific content of the technical solution.

[0023] As Figure 1 shown, a device for testing the elastic force value of a probe according to the present invention includes a bottom plate 1, a base 5 and a flap 6.

[0024] Among them, the base 5 is fixed on the bottom plate 1, and a U-shaped groove 13 is provided on the side of the base 5. The U-shaped groove 13 is used to place the product for testing the elastic force value of the test probe 12; the flap 6 is hinged on the side of the base 5, a clamping position 9 is provided in the flap 6, a clamping block 10 is provided in the clamping position 9, and arc-shaped grooves for clamping the probe 12 are formed on both the clamping block 10 and the clamping position 9. A locking screw 8 is threadedly assembled on the outer edge of the flap 6, and the locking screw 8 is used to pre-tighten the clamping block 10.

[0025] As Figure 1 shown, before testing the elastic force value of the test probe 12, the probe 12 is placed between the arc-shaped grooves formed on the clamping block 10 and the clamping position 9, and then the locking screw 8 is pre-tightened to make the clamping block 10 move downward until the probe 12 is clamped between the two arc-shaped grooves.

[0026] As Figure 2 shown, when testing the elastic force value of the test probe 12, the flip cover 6 is rotated counterclockwise by 90°, so that the flap 6 is pressed against the surface of the base 5. At this time, the product for testing the elastic force value of the test probe 12 placed in the U-shaped groove 13 contacts the probe 12, and the determination of the elastic force value can be completed by extrusion.

[0027] After the test is completed, rotate the flip cover 6 clockwise by 90°, loosen the locking screw 8, and remove the probe 12.

[0028] As Figure 1 shown, in a device for testing the elastic force value of a probe according to the present invention, two guide rails 2 provided on the bottom plate 1 are further included, and the base 5 is slidably arranged on the two guide rails 2.

[0029] The base 5 can slide on the guide rails 2, which can enable the probe 12 to be disassembled and assembled at a preset position, and the flap 6 rotates counterclockwise by 90° at the preset position to complete the elastic force value test.

[0030] As Figure 1 shown, in a device for testing the elastic force value of a probe according to the present invention, two sliders 14 are provided on the lower side of the base 5, and chutes are provided on the lower sides of the two sliders 14, and the chutes are sleeved on the two guide rails 2 for convenient sliding.

[0031] As Figure 1As shown, in a device for testing the elastic force value of a probe according to the present invention, a front limit block 3 and a rear limit block 4 are provided between two guide rails 2; the front limit block 3 and the rear limit block 4 are located on the moving track of the base 5.

[0032] When the base 5 moves to the front limit block 3, the flap 6 rotates counterclockwise by 90° to perform the test; when the base moves to the rear limit block 4, the flap 6 rotates clockwise by 90°, and the disassembly and assembly of the probe 12 can be carried out, which is convenient for accurate different operations.

[0033] As Figure 1 shown, in a device for testing the elastic force value of a probe according to the present invention, two pins 11 are slidably inserted into the clamping position 9, and the clamping block 10 is arranged on the two pins 11, which can ensure that the clamping block 10 slides along a certain track.

[0034] As Figure 1 shown, in a device for testing the elastic force value of a probe according to the present invention, a compression spring 7 is sleeved on the lower end of the pin 11.

[0035] When the clamping block 10 moves downward, the compression spring 7 contracts; when the clamping block 10 moves upward, under the elastic force of the compression spring 7, the clamping block 10 will quickly reset.

[0036] In summary, compared with the prior art, a device for testing the elastic force value of a probe according to the present invention has the following advantages: (1) A device for testing the elastic force value of a probe according to the present invention can quickly complete the clamping of various shaped probes and accurately position with the product for testing the elastic force value of the probe, so as to measure the elastic force value, and has a good market promotion and use prospect; (2) A device for testing the elastic force value of a probe according to the present invention has a simple structure, convenient operation and low manufacturing cost, and can greatly improve the production efficiency.

[0037] The above description shows and describes several preferred embodiments of the invention. However, as mentioned above, it should be understood that the invention is not limited to the form disclosed herein, should not be regarded as excluding other embodiments, but can be used in various other combinations, modifications and environments, and can be changed within the scope of the inventive concept described herein through the above teachings or the technology or knowledge in the relevant field. And the changes and modifications made by those skilled in the art without departing from the spirit and scope of the invention should all be within the protection scope of the appended claims of the invention.

Claims

1. A test device for the elastic value of a probe, characterized in that, it includes: a bottom plate (1); a base (5), the base (5) is arranged on the bottom plate (1), and a U-shaped groove (13) is arranged on the side of the base (5), and the U-shaped groove (13) is used for placing products for testing the elastic value of the test probe (12); a flap (6), the flap (6) is hinged to the side of the base (5), a clamping position (9) is arranged in the flap (6), a clamping block (10) is arranged in the clamping position (9), arc grooves for clamping the probe (12) are formed on both the clamping block (10) and the clamping position (9), and a locking screw (8) is threadedly assembled on the outer edge of the flap (6), and the locking screw (8) is used for pre-tightening the clamping block (10); it also includes two guide rails (2) arranged on the bottom plate (1), and the base (5) is slidably arranged on the two guide rails (2); two sliders (14) are arranged on the lower side of the base (5), a chute is arranged on the lower side of the two sliders (14), and the chute is sleeved on the two guide rails (2); two pins (11) are slidably inserted into the clamping position (9), and the clamping block (10) is arranged on the two pins (11); a compression spring (7) is sleeved on the lower end of the pin (11).

Citation Information

Patent Citations

  • Probe clamping plate

    CN209006369U

  • Elastic force testing structure for multiple groups of probes

    CN209802616U

  • Test fixture for flexible circuit board

    CN211478541U

  • Rapid and accurate test fixture for probe detection

    CN215116363U