Test machine adapter

Abstract

The present invention discloses a test machine switching device, including a test machine fixing module and a switching module, wherein the switching module is detachably mounted on the test machine fixing module, and the test machine fixing module is used to place the test machine; a circuit board for switching is installed at the bottom of the switching module, and the circuit board is connected to the test machine through a probe, and a circuit board for switching is also arranged on the top of the switching module, and the contacts of the top circuit board are electrically connected to the bottom circuit board through welded wires, and the switching module also includes a double-sided probe disk, and probes are arranged on both sides of the double-sided probe disk, and the probes on one side of the double-sided probe disk are connected to the top circuit board, and the probes on the other side are used to connect to the device to be tested. When testing devices of different models, there is no need to re-weld the wires, and the contacts of the double-sided probe disk connected to the top circuit board or the probe disk can be selected, which is more convenient to use.

Description

Technical Field

[0001] The invention relates to the technical field of semiconductor testing, and in particular to a testing machine switching device. Background Art

[0002] The EVA100 measurement system combines digital and analog test functions and can be applied to analog, mixed signal and sensor semiconductor measurements with a small number of pins. It supports a new test solution with multiple component test functions and can be applied from engineering development to mass production.

[0003] When testing a device, the existing test machine needs to be wired. First, the test machine is connected to a PCB board through a probe, and a wire is welded on the PCB board. Then, the other end of the wire is welded to a probe plate, and the device to be tested is connected through the probe plate. For different devices or equipment, the test requirements are different, and the test channels are also different. At this time, the wire needs to be re-welded, which is a lot of work. It is inconvenient to use. Summary of the invention

[0004] The technical problem to be solved by the present invention is to solve the deficiencies of the above-mentioned prior art and to provide a test machine adapter with a wide range of applications and universality.

[0005] In order to solve the deficiencies of the above-mentioned prior art, the technical solution adopted by the present invention is: a test machine adapter device, comprising a test machine fixing module and an adapter module, wherein the adapter module is detachably mounted on the test machine fixing module, and the test machine fixing module is used to place the test machine; a circuit board for adapter is installed at the bottom of the adapter module, and the circuit board and the test machine are connected by probes, and a circuit board for adapter is also arranged on the top of the adapter module, and the contacts of the top circuit board are electrically connected to the bottom circuit board by welded wires, and the adapter module also includes a double-sided probe disk, and probes are arranged on both sides of the double-sided probe disk, and the probes on one side of the double-sided probe disk are connected to the top circuit board, and the probes on the other side are used to connect to the device to be tested.

[0006] Furthermore, the adapter module includes a base plate with a plurality of slots provided on the base plate and wedge-shaped portions provided at the slots; the test machine fixing module includes a slidable fixing plate with a clamping wheel provided on the fixing plate, the clamping wheel can extend into the slot, and the clamping wheel can roll along the wedge-shaped portion to gradually press the base plate of the adapter module onto the test machine fixing module.

[0007] Furthermore, the testing machine fixing module includes a slide plate and a cam. The fixing plate is connected to the slide plate. The cam is provided with a handle, which is used to rotate the cam. The cam is provided with a pin shaft, and the slide plate is provided with a transverse groove. The pin shaft is located in the transverse groove. The pin shaft is eccentrically arranged on the cam, and the rotation of the cam drives the slide plate to slide.

[0008] Furthermore, it also includes an elastic pin, and the cam is provided with a pin hole, and the pin can be inserted into the pin hole of the cam to lock the cam.

[0009] Furthermore, the test machine fixing module also includes a slide rail and a slider, the slider is fixed on the slider, the slider can slide along the slide rail, and the slide rail is used to limit the sliding direction of the slide rail.

[0010] Furthermore, the adapter module on the fixing module of the testing machine is provided with locking hooks that fit together and can be unlocked. When the fixing module and the adapter module are docked, the locking hooks are locked together.

[0011] From the above technical solution, it can be seen that the present invention has the following advantages: when testing devices of different models, there is no need to re-solder the wires, and only the contacts of the double-sided probe disc connected to the top circuit board can be selected or the probe disc can be replaced, which is more convenient to use. BRIEF DESCRIPTION OF THE DRAWINGS

[0012] Figure 1 It is a structural schematic diagram of the present invention;

[0013] Figure 2 A half-section diagram of the adapter module of the present invention;

[0014] Figure 3 It is a schematic diagram of the structure of the fixing module of the testing machine in the present invention. DETAILED DESCRIPTION

[0015] The specific implementation modes of the present invention are described in detail below with reference to the accompanying drawings.

[0016] like Figure 1 As shown, the test machine adapter device of the present invention comprises a test machine fixing module 1 and an adapter module 2. The adapter module 2 can be detachably mounted on the test machine fixing module. The test machine fixing module is used to place the test machine.

[0017] Specifically, the switching module is as follows Figure 2 As shown, the bottom plate 25 is installed with a circuit board 26 for transfer, and the circuit board 26 is connected to the test machine through a probe (the probe is located on the other side of the bottom plate, not shown in the figure), and a circuit board for transfer is also arranged on the top of the transfer module, and the contacts of the top circuit board 21 are electrically connected to the bottom circuit board through welded wires (the wires are not shown in the figure), and the transfer module also includes a double-sided probe disk 22, and probes are arranged on both sides of the double-sided probe disk 22, and the probe on one side of the double-sided probe disk is connected to the top circuit board 21, and the probe on the other side is used to connect to the device to be tested.

[0018] The above device can connect the test channel of the test machine with the device to be tested to test the device. When testing different models of devices, there is no need to re-solder the wires. Just select the contact point where the double-sided probe plate is connected to the top circuit board or replace the probe plate, which is more convenient to use.

[0019] The bottom plate 25 of the adapter module is provided with a plurality of notches 27, and the notches 27 are provided with wedge-shaped portions 28. Figure 3 As shown, it includes a slidable fixing plate 12, on which a clamping wheel 11 is arranged. The clamping wheel 11 can extend into the slot and roll along the wedge-shaped portion to gradually press the bottom plate of the adapter module onto the fixing module of the testing machine.

[0020] Specifically, the test machine fixing module also includes a slide plate 17 and a cam 13, the fixing plate 12 is connected to the slide plate 17, the cam 13 is provided with a handle 13, the handle 13 is used to rotate the cam, the cam 13 is provided with a pin 18, the slide plate is provided with a transverse groove 14, the pin 18 is located in the transverse groove 14, the pin is eccentrically arranged on the cam, and the rotation of the cam pushes the slide plate to slide. The test machine fixing module is also provided with a slide rail 16 and a slider, the slide plate is fixed on the slider, the slider can slide along the slide rail, and the slide rail is used to limit the sliding direction of the slide plate.

[0021] The present invention also provides an elastic pin, and the cam is provided with a pin hole, and the pin can be inserted into the pin hole of the cam to lock the cam. When the cam reaches a specific position, the pin hole can be inserted into the cam to prevent the cam from being rotated by mistake.

[0022] In addition, the adapter module on the test machine fixing module is provided with mutually fitting and unlockable locking hooks, and when the fixing module and the adapter module are docked, the locking hooks are locked. When the clamping wheel opens the wedge-shaped portion, the locking hooks can still keep the test machine fixing module 1 and the adapter module 2 fixed, achieving multiple protections.

Claims

1. A test machine adapter, characterized in that: The adapter module comprises a test machine fixing module and an adapter module, wherein the adapter module can be detachably mounted on the test machine fixing module, and the test machine fixing module is used to place the test machine; a circuit board for transfer is mounted at the bottom of the adapter module, and the circuit board and the test machine are connected via probes; a circuit board for transfer is also arranged at the top of the adapter module, and the contacts of the circuit board at the top are electrically connected to the circuit board at the bottom via welded wires; the adapter module also comprises a double-sided probe disk, and probes are arranged on both sides of the double-sided probe disk, and the probes on one side of the double-sided probe disk are connected to the circuit board at the top, and the probes on the other side are used to connect to the circuit board to be tested The device comprises a transfer module including a base plate, a plurality of slots are provided on the base plate, and a wedge-shaped portion is provided at the slots; the test machine fixing module comprises a slidable fixing plate, a clamping wheel is provided on the fixing plate, the clamping wheel can extend into the slot, and the clamping wheel can roll along the wedge-shaped portion so as to gradually press the base plate of the transfer module onto the test machine fixing module; the test machine fixing module comprises a slide plate and a cam, the fixing plate is connected to the slide plate, a handle is provided on the cam, the handle is used to rotate the cam, a pin is provided on the cam, a transverse groove is provided on the slide plate, the pin is located in the transverse groove, the pin is eccentrically provided on the cam, and the rotation of the cam drives the slide plate to slide.

2. The test machine adapter according to claim 1, characterized in that: It also includes an elastic pin, a pin hole is arranged on the cam, and the pin can be inserted into the pin hole of the cam to lock the cam.

3. The test machine adapter according to claim 2, characterized in that: The testing machine fixing module also includes a slide rail and a slider. The slider is fixed on the slider. The slider can slide along the slide rail. The slide rail is used to limit the sliding direction of the slider.

4. The test machine adapter according to claim 3, characterized in that: The adapter module on the fixing module of the testing machine is provided with locking hooks that fit together and can be unlocked. When the fixing module and the adapter module are docked, the locking hooks are locked together.

Images