System and method for over-the-air testing of electronic devices

Abstract

The invention relates to a system and a method for over-the-air testing of electronic devices. A system (100) for over-the-air testing of electronic devices (101), in particular DUTs, comprises a support surface (103), wherein the electronic devices (101) are arranged on the support surface (103), a test device (105), the test device (105) comprising a transceiver unit (107) and an RF beamformer (109), wherein the transceiver unit (107) is configured to emit RF test signals, wherein the RF beamformer (109) is configured to direct the RF test signals in the direction of the electronic devices (101), wherein the transceiver unit (107) is configured to receive RF response signals from the electronic devices (101), and wherein the test device (105) is configured to evaluate the electronic devices (101) based on the RF response signals.

Description

TECHNICAL FIELD

[0001] The present invention relates to a system and a method for over-the-air testing of electronic devices, in particular devices under test (DUTs). BACKGROUND

[0002] Many electronic devices are tested at first manufacturing or later in their life cycle. The testing can comprise a functional test, a performance test or a calibration check. Devices tested in this way are called devices under test (DUTs).

[0003] Many devices for wireless communication, radar applications or satellite communication have integrated antennas, in particular radio frequency (RF) antennas. The testing of these devices usually comprises RF performance tests, which are performed over the air (OTA). In order to ensure that no other signals are disturbed during the OTA, the OTA test system can be surrounded by an RF reflector. In particular, the device can be placed in a special OTA chamber, which shields external RF sources.

[0004] However, such reflectors or OTA chambers can require a lot of space in the test facility and lead to increased costs. SUMMARY

[0005] It is therefore an object to provide an improved system and an improved method for over-the-air testing of electronic devices, which avoids the above-mentioned drawbacks. In particular, it is an object to provide a system and a method for over-the-air testing, which does not require additional shielded chambers or OTA chambers.

[0006] The objects of the present invention are achieved by the solutions provided in the independent claims. Advantageous implementations of the present invention are further defined in the dependent claims.

[0007] According to a first aspect, the present invention relates to a system for over-the-air testing of electronic devices, in particular DUTs, comprising a support surface, wherein the electronic devices are arranged on the support surface, a test device, the test device comprising a transceiver unit and an RF beamformer, wherein the transceiver unit is configured to transmit RF test signals, wherein the RF beamformer is configured to direct the RF test signals in the direction of the electronic devices, wherein the transceiver unit is configured to receive RF response signals from the electronic devices, and wherein the test device is configured to evaluate the electronic devices based on the RF response signals. This achieves the advantage that the test signals are concentrated on the electronic devices.

[0008] In this way, the signal strength of the RF test signals at the electronic devices can be enhanced without using shielded chambers or OTA chambers.

[0009] Electronic devices can be communication devices, such as mobile phones, sensors, or measuring devices. These communication devices can be radar equipment or SATCOM (satellite communication) equipment.

[0010] Electronic devices can be further defined as chips (especially for wireless communication), dies, or packaged components.

[0011] The electronic device may include an RF antenna for receiving RF test signals and / or for transmitting RF response signals. The electronic device itself may include a beamforming integrated circuit. Specifically, the electronic device includes a processing unit that controls the RF antenna to transmit an RF response signal upon receiving an RF test signal.

[0012] RF test signals and / or RF response signals may include 3G, 4G or 5G signals, WiFi signals, Bluetooth signals, RFID signals and / or NFC signals.

[0013] In one embodiment, the RF beamformer is configured to selectively receive the RF response signal from the electronic device and forward the received RF response signal to the transceiver unit. This achieves the advantage that the RF response signal can be focused on the test equipment and interference with other signals can be avoided.

[0014] In one embodiment, the RF beamformer is configured to selectively receive the RF response signal by limiting the direction in which the RF beamformer faces the electronic device. This achieves the advantage that the RF response signal can be focused on the test equipment and interference with other signals can be avoided.

[0015] In one embodiment, the RF beamformer includes a phased array antenna. This achieves the advantage that the receiving direction of the RF beamformer can be effectively set.

[0016] In one embodiment, the RF beamformer includes a chipset having at least one integrated antenna, particularly an antenna-in-package (AIP) antenna. This achieves the advantage that the receiving direction of the RF beamformer can be effectively set.

[0017] In one embodiment, the support surface includes a conveyor belt configured to move the electronic device relative to the RF beamformer. This achieves the advantage that testing can be performed without delay during device manufacturing.

[0018] Preferably, the test equipment, especially the RF beamformer of the test equipment, is arranged above the conveyor belt.

[0019] In one embodiment, the RF beamformer is configured to actively adapt to the alignment of the RF test signal to compensate for movement of the electronic device. This achieves the advantage that testing can be performed on a moving device, for example, during device manufacturing.

[0020] Preferably, the RF beamformer is also configured to actively adapt its receiving direction to compensate for the movement of the electronic device. This achieves the advantage that testing can be performed on moving devices.

[0021] In other words, an RF beamformer can be configured to follow the movement of an electronic device by utilizing the alignment of an RF test signal and / or its receiving direction for an RF response signal.

[0022] Preferably, the RF beamformer is configured to electronically control the alignment and / or reception direction of the RF test signal while remaining stationary.

[0023] In one embodiment, the support surface includes a retaining device having at least one retainer designed to accommodate the electronic device, particularly a recess in the retaining device. This achieves the advantage that the electronic device can be held in a fixed position, allowing RF test signals to be effectively directed to that fixed position.

[0024] In one embodiment, the system further includes an absorption unit configured to absorb RF signals, wherein the absorption unit at least partially surrounds the support surface and / or the test equipment. This achieves the advantage of avoiding interference caused by reflections of RF test signals or RF response signals.

[0025] In one embodiment, the RF beamformer is configured to align the RF test signal in a direction toward at least one other electronic device on the support surface, wherein the transceiver unit is configured to receive another RF response signal from the at least one other electronic device, and wherein the test equipment is configured to evaluate the at least one other electronic device based on the other RF response signal. This achieves the advantage that multiple electronic devices can be tested simultaneously or closely sequentially.

[0026] The at least one other electronic device may be arranged on the support surface at a certain distance from the first electronic device.

[0027] According to a second aspect, the present invention relates to a method for air-to-air testing of electronic equipment, the method comprising: arranging the electronic equipment on a support surface; transmitting an RF test signal from a transceiver unit of the test equipment; aligning the RF test signal in a direction toward the electronic equipment via an RF beamformer; receiving an RF response signal from the electronic equipment at the transceiver unit; and evaluating the electronic equipment based on the RF response signal. This achieves the advantage of focusing the test signal onto the electronic equipment.

[0028] In this way, the signal strength of RF test signals at electronic devices can be enhanced without using a shielded room or OTA room.

[0029] In one embodiment, the RF beamformer is configured to selectively receive the RF response signal from the electronic device, particularly by limiting the direction of the RF beamformer toward the receiving direction of the electronic device, and to forward the received RF response signal to the transceiver unit. This achieves the advantage that the RF response signal can be focused on the test equipment and interference with other signals can be avoided.

[0030] In one embodiment, the support surface is configured to allow the electronic device to move relative to the RF beamformer. This achieves the advantage that testing can be performed without delay during device manufacturing.

[0031] In one embodiment, the RF beamformer is configured to actively adapt to the alignment of the RF test signal to compensate for movement of the electronic device. This achieves the advantage that testing can be performed on a moving device, for example, during device manufacturing.

[0032] Preferably, the RF beamformer is also configured to actively adapt its receiving direction to compensate for the movement of the electronic device. This achieves the advantage that testing can be performed on moving devices.

[0033] In particular, the support surface includes a conveyor belt and / or a retaining device having at least one fastener designed to accommodate the electronic device, especially a recess in the retaining device.

[0034] In one embodiment, the method further includes the steps of: aligning the RF test signal with the RF beamformer in a direction relative to at least one other electronic device on the support surface; receiving at least one other RF response signal from the at least one other electronic device at the transceiver unit; and evaluating the at least one other electronic device based on the at least one other RF response signal. This achieves the advantage that multiple electronic devices can be tested simultaneously or closely sequentially.

[0035] The above description of the system according to the invention is also applicable to the method according to the invention. Attached Figure Description

[0036] The invention will now be explained in conjunction with the accompanying drawings.

[0037] Figure 1 A schematic diagram of a system for over-the-air testing electronic equipment according to one embodiment is shown;

[0038] Figure 2 A schematic diagram of a support surface according to one embodiment is shown; and

[0039] Figure 3 A schematic diagram of a method for testing electronic equipment over the air according to one embodiment is shown. Detailed Implementation

[0040] Figure 1 A schematic diagram of a system 100 for over-the-air testing electronic equipment 101 according to one embodiment is shown.

[0041] The system 100 includes: a support surface 103, on which an electronic device 101 is disposed; a test device 105, which includes a transceiver unit 107 and an RF beamformer 109, wherein the transceiver unit 107 is configured to transmit an RF test signal, wherein the RF beamformer 109 is configured to align the RF test signal in the direction of the electronic device 101, wherein the transceiver unit 107 is configured to receive an RF response signal from the electronic device 101, and wherein the test device 105 is configured to evaluate the electronic device 101 based on the RF response signal.

[0042] Test equipment 105 can be configured to evaluate the functionality, performance, or calibration of electronic device 101 based on RF response signals.

[0043] Test equipment 105 may be a bidirectional test equipment for transmitting modulated signals and / or continuous wave signals to electronic equipment 101 and receiving modulated signals and / or continuous wave signals from electronic equipment 101.

[0044] Test equipment 105 may include RF test instruments to perform RF tests. In particular, RF tests include modulation performance testing of electronic device 101. Specifically, RF beamformer 109 is arranged in the far field of electronic device 101.

[0045] Preferably, the test device 105 includes a processing unit 113 configured to evaluate electronic devices based on RF response signals (i.e., by detecting and analyzing the radio frequency characteristics of the RF response signals).

[0046] The transceiver unit 107 and the RF beamformer 109 can form a single unit of the test equipment 105.

[0047] Electronic device 101 may include an RF antenna, particularly a beamforming integrated circuit configured to receive RF test signals and transmit RF response signals.

[0048] The RF beamformer 109 can be configured to receive an RF test signal from the transceiver unit 107 and align it along the signal path Tx in the direction of the electronic device 101.

[0049] RF beamformer 109 can be configured to selectively receive RF response signals from electronic device 101, particularly by limiting the receiving direction of the signal path Rx from electronic device 101 to RF beamformer 109. Focusing the RF test signal onto electronic device 101 and selectively receiving RF response signals from electronic device 101 helps avoid interference and the detection and use of erroneous signals (such as signals from other nearby devices). Therefore, shielding or a dedicated test chamber is not required to perform OTA testing.

[0050] Preferably, the RF beamformer 109 includes a phased array antenna. The phased array antenna may include an antenna array that can be electronically controlled to point in the direction of an electronic device for relaying and / or receiving RF signals, particularly RF test signals and RF response signals.

[0051] Specifically, the RF beamformer 109 includes a chipset having at least one integrated antenna, particularly an antenna in package (AIP).

[0052] Figure 1 The system also includes a conveyor belt 111, wherein the support surface 103 is the surface of the conveyor belt 111.

[0053] Test device 105 can be arranged above conveyor belt 111, such that the conveyor belt can be configured to move electronic device 101 past test device 105. In particular, test device 105 is configured to transmit RF test signals along the direction of moving electronic device 101 on the conveyor belt if electronic device 101 has reached a specific position relative to test device 105.

[0054] The RF beamformer 109 can be an active RF beamformer. The RF beamformer can be configured to change its orientation according to the movement of the electronic device 101, particularly for guiding and receiving RF test or response signals.

[0055] Figure 1Another electronic device 101a is shown on the support surface 103. The other electronic device 101a can be tested simultaneously or immediately after the first electronic device 101.

[0056] Another electronic device 101a may be of the same type as electronic device 101.

[0057] The test of another electronic device 101a can be performed in the same manner as described above for electronic device 101, that is, RF beamformer 109 directs RF test signals toward the other electronic device 101a on the support surface, transceiver unit 107 receives another RF response signal from the other electronic device 101a, and test equipment 105 evaluates the other electronic device 101a based on the other RF response signal.

[0058] RF beamformer 109 can be configured to selectively receive another RF response signal from another electronic device 101a in the same manner as described above for electronic device 101.

[0059] System 100 may also include an absorption unit (not shown) configured to absorb RF signals. The absorption unit may be arranged to at least partially surround the support surface 103 and / or the electronic device 101, electronic device 101a. In particular, the absorption unit is arranged behind the electronic device and / or the RF beamformer 109.

[0060] The size of the absorption unit can be adapted to the beamwidth of the RF beam emitted by the RF beamformer 109 and / or the electronic device 101.

[0061] Figure 2 A schematic diagram of a support surface 103 according to one embodiment is shown.

[0062] Figure 2 The support surface 103 includes a holding device 201 configured to accommodate a plurality of electronic devices 101, 101a-101e. In particular, the holding device 201 includes a tray or plate.

[0063] The retaining device 201 may include fasteners 203 and 203a-203e to accommodate electronic devices 101 and 101a-101e. In particular, fasteners 203 and 203a-203e are recesses in the retaining device 201.

[0064] like Figure 1 The conveyor belt 111 shown may include a holding device 201. In particular, the holding device 201 is a component of the carrier medium of the conveyor belt 111.

[0065] Figure 3A schematic diagram of a method 300 for testing electronic equipment 101 over the air according to one embodiment is shown.

[0066] The method 300 includes the following steps: arranging (301) an electronic device 101 on a support surface 103; transmitting (303) an RF test signal from a transceiver unit 107 of a test device 105; aligning (305) the RF test signal in the direction of the electronic device 101 via an RF beamformer 109; receiving (307) an RF response signal from the electronic device 101 at the transceiver unit 107; and evaluating (309) the electronic device 101 based on the RF response signal.

[0067] The RF beamformer 109 can be configured to selectively receive the RF response signal from the electronic device 101, particularly by limiting the receiving direction toward the electronic device 101. Focusing the RF test signal onto the electronic device 101 and selectively receiving the RF response signal from the electronic device 101 helps to avoid interference and the detection and use of erroneous signals (such as signals from other nearby devices). Therefore, shielding or a dedicated test chamber is not required to perform OTA testing.

[0068] The support surface 103 can be configured to move the electronic device 101 relative to the RF beamformer 109. In particular, the support surface 103 includes a conveyor belt 111 or a surface forming the conveyor belt 111.

[0069] Preferably, the method 300 further includes the steps of: aligning an RF test signal with an RF beamformer 109 in the direction of at least one other electronic device 101a on the support surface 103; receiving at least one other RF response signal from at least one other electronic device 101a at a transceiver unit 107; and evaluating at least one other electronic device 101a based on at least one other RF response signal.

[0070] RF test signals can be simultaneously or closely and continuously directed toward two electronic devices 101, 101a on the support surface 103.

[0071] The RF test signal used for electronic device 101 and for at least one other electronic device 101a can be the same signal. Alternatively, the RF test signal can be different for each device 101, 101a. Transceiver unit 107 can be configured to transmit two RF test signals.

[0072] All features of all embodiments described, shown and / or claimed herein can be combined with each other.

Claims

1. A system (100) for over-the-air testing of electronic devices (101), comprising: a support surface (103), wherein the electronic devices (101) are arranged on the support surface (103), a test device (105), the test device (105) comprising a transceiver unit (107) and an RF beamformer (109), wherein the transceiver unit (107) is configured to transmit an RF test signal, wherein the RF beamformer (109) is configured to direct the RF test signal in the direction of the electronic device (101), wherein the transceiver unit (107) is configured to receive an RF response signal from the electronic device (101), wherein the test device (105) is configured to evaluate the electronic device (101) based on the RF response signal, wherein the support surface (103) comprises a conveyor belt (111) configured to move the electronic device (101) relative to the RF beamformer (109), and wherein the RF beamformer (109) is configured to actively adapt the direction of the RF test signal to compensate for the movement of the electronic device (101).

2. The system (100) according to claim 1, wherein The RF beamformer (109) is configured to selectively receive the RF response signal from the electronic device (101) and to forward the received RF response signal to the transceiver unit (107).

3. The system (100) of claim 2, wherein, The RF beamformer (109) is configured to selectively receive the RF response signal by limiting the receiving direction of the RF beamformer (109) towards the electronic device (101).

4. The system (100) according to any one of claims 1 to 3, wherein, The RF beamformer (109) comprises a phased array antenna.

5. The system (100) according to any one of claims 1 to 3, wherein, The RF beamformer (109) comprises a chipset with at least one integrated antenna.

6. The system (100) according to any one of claims 1 to 3, wherein, The support surface (103) comprises a holding device (201) with at least one fixture (203, 203a-203e) designed to accommodate the electronic device (101).

7. The system (100) according to any one of claims 1 to 3, wherein, The system (100) further comprises an absorption unit configured to absorb RF signals, wherein the absorption unit at least partially surrounds the support surface (103) and / or the test device (105).

8. The system (100) according to any one of claims 1 to 3, wherein, The RF beamformer (109) is configured to direct the RF test signal in the direction of at least one further electronic device (101a-101e) on the support surface (103), wherein the transceiver unit (107) is configured to receive a further RF response signal from the at least one further electronic device (101a-101e), and the test device (105) is configured to evaluate the at least one further electronic device (101a-101e) based on the further RF response signal.

9. A method (300) for over-the-air testing of electronic devices (101), comprising: - arranging (301) the electronic device (101) on a support surface (103); - transmitting (303) an RF test signal from a transceiver unit (107) of a test device (105); - directing (305) the RF test signal by an RF beamformer (109) in direction of the electronic device (101); - receiving (307) an RF response signal from the electronic device (101) at the transceiver unit (107); and - evaluating (309) the electronic device (101) based on the RF response signal, wherein the support surface (103) is configured to move the electronic device (101) relative to the RF beamformer (109), wherein the RF beamformer (109) is configured to actively adapt the directing of the RF test signal to compensate for the movement of the electronic device (101).

10. The method (300) of claim 9, wherein, The RF beamformer (109) is configured to selectively receive the RF response signal from the electronic device (101) by limiting a receiving direction of the RF beamformer (109) towards the electronic device (101) and to forward the received RF response signal to the transceiver unit (107).

11. The method (300) according to claim 9 or 10, further comprising the steps of: - directing (305) the RF test signal by the RF beamformer (109) in direction of at least one further electronic device (101a-101e) on the support surface (103), - receiving at least one further RF response signal from the at least one further electronic device (101a-101e) at the transceiver unit (107), and - evaluating the at least one further electronic device (101a-101e) based on the at least one further RF response signal.

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