Method for detecting display device

Abstract

A detection method for a display device is provided. The detection method includes detecting a connection fault of a light-emitting element included in a pixel and connected in series based on a first control signal, a second control signal, and a voltage of an initialization power supply, wherein the pixel includes: a pixel circuit that controls a current flowing from the first power supply to a second node in response to a voltage of a first node; a first light-emitting element connected to the second node; a first transistor that controls the voltage of the initialization power supply supplied to the second node; a second light-emitting element electrically connected between the first light-emitting element and the second power supply; and a second transistor having a first electrode connected to a third node between the first light-emitting element and the second light-emitting element and a gate electrode connected to a first detection control line.

Description

[0001] This application claims priority to and the benefit of Korean Patent Application No. 10-2020-0032003, filed on March 16, 2020, which is hereby incorporated by reference in its entirety for all purposes as if fully set forth herein. Technical Field

[0002] Aspects of some example embodiments of the present invention relate to an electronic device, for example, to a display device and a detection method thereof. Background Art

[0003] A display device generally uses pixels connected to scan lines and data lines to display images. To this end, each pixel includes a light emitting element and a driving transistor.

[0004] The driving transistor controls the amount of current supplied to the light emitting element in response to a data signal supplied from the data line. The light emitting element emits light having a brightness corresponding to the amount of current supplied from the driving transistor (eg, a set or predetermined brightness).

[0005] For example, the brightness of light emitted from a light-emitting element can be controlled by the amount of current supplied to the light-emitting element, and the light-emitting element can have diode characteristics. When a single pixel includes multiple light-emitting elements, a structure in which the light-emitting elements are connected in series by current control can be advantageous in terms of power consumption compared to a structure in which the light-emitting elements are connected in parallel.

[0006] However, when one of the light emitting elements connected in series is open and / or short-circuited, the corresponding pixel does not emit light.Therefore, a technology for detecting a connection failure of each of the light emitting elements connected (or aligned) in series may be utilized.

[0007] The above information disclosed in this Background section is only for enhancement of understanding of the background technology and therefore the information discussed in this Background section does not necessarily constitute prior art. Summary of the Invention

[0008] Aspects of some example embodiments of the present invention include a detection method of a display device capable of detecting a connection failure of each of light emitting elements connected in series.

[0009] Aspects of some example embodiments of the present invention include a display device including a transistor connected to each of light emitting elements to detect a connection failure of each of the light emitting elements connected in series.

[0010] However, aspects of the embodiments according to the present invention are not limited to the above-described characteristics, and various extensions may be made without departing from the spirit and scope of the embodiments according to the present invention.

[0011] According to some example embodiments of the present invention, a detection method for a display device may include: detecting a connection failure of a light-emitting element included in a pixel and connected in series based on a first control signal, a second control signal, and a voltage of an initialization power supply. The pixel may include: a pixel circuit that controls a current flowing from the first power supply to a second node in response to a voltage of a first node; a first light-emitting element connected to the second node; a first transistor that controls the voltage of the initialization power supply supplied to the second node; a second light-emitting element electrically connected between the first light-emitting element and the second power supply; and a second transistor having a first electrode connected to a third node and a gate electrode connected to a first detection control line, the third node being between the first light-emitting element and the second light-emitting element.

[0012] According to some example embodiments, the first transistor may be connected between the second node and the sensing line, and the second electrode of the second transistor may be connected to the second power source. Checking for a connection failure of the light-emitting element may include: supplying an initialization power source of a first voltage level to the sensing line and turning on the first transistor and the second transistor; determining that a connection abnormality of the second light-emitting element occurs when the pixel emits light; and determining that a connection abnormality of the first light-emitting element occurs when the pixel does not emit light.

[0013] According to some example embodiments, the first transistor may be turned on in response to a first control signal, and the second transistor may be turned on in response to a second control signal supplied to the first detection control line.

[0014] According to some example embodiments, the pixel circuit may include: a third transistor connected between a first power source and a second node and having a gate electrode connected to the first node; a fourth transistor connected between the first node and a data line and having a gate electrode connected to a scan line; and a storage capacitor connected between the first node and the second node. The gate electrode of the first transistor may be connected to a control line transmitting a first control signal.

[0015] According to some example embodiments, the fourth transistor may be turned off during a period in which the first transistor and the second transistor are turned on.

[0016] According to some example embodiments, the first transistor may be connected between the second node and the sensing line, and the second electrode of the second transistor may be connected to a first detection power line supplying a voltage of an illumination detection power source. Checking for a connection failure of the light-emitting element may include: checking for a connection failure of the first light-emitting element based on an initialization power source; and checking for a connection failure of the second light-emitting element based on the illumination detection power source.

[0017] According to some example embodiments, checking for a connection failure of a first light-emitting element may include: supplying an initialization power supply having a first voltage level to a sensing line, and supplying an illumination detection power supply having a second voltage level lower than the first voltage level to a first detection power supply line; turning on a first transistor and a second transistor; determining that the connection of the first light-emitting element is normal when a pixel emits light; and determining that the connection of the first light-emitting element is abnormal when the pixel does not emit light.

[0018] According to some example embodiments, checking for a connection failure of the second light-emitting element may include: supplying an initialization power supply having a third voltage level lower than the first voltage level to a sensing line, and supplying an illumination detection power supply having a fourth voltage level higher than the second voltage level to a first detection power supply line; turning on the second transistor; determining that the connection of the second light-emitting element is normal when the pixel emits light; and determining that the connection of the second light-emitting element is abnormal when the pixel does not emit light.

[0019] According to some example embodiments, the second transistor may be turned on simultaneously with the first transistor.

[0020] According to some example embodiments, the pixel may further include: a third light-emitting element electrically connected between the second light-emitting element and the second power supply; and a fifth transistor having a first electrode connected to a fourth node and a gate electrode connected to the second detection control line, the fourth node being between the second light-emitting element and the third light-emitting element.

[0021] According to some example embodiments, a second electrode of the fifth transistor may be connected to a second power source, and in the step of checking a connection failure of the first light emitting element, the fifth transistor may be turned on simultaneously with the second transistor in response to a third control signal supplied to the second detection control line.

[0022] According to some example embodiments, the first voltage level may be higher than the second voltage level, and the fourth voltage level may be higher than or equal to the third voltage level.

[0023] According to some example embodiments, the fourth voltage level may be higher than a voltage level of the second power source, and the second voltage level may be lower than a voltage level of the second power source.

[0024] According to some example embodiments, the second electrode of the fifth transistor may be connected to the second power source, and in the step of checking for a connection failure of the second light emitting element, the fifth transistor may be turned on simultaneously with the second transistor in response to a third control signal supplied to the second detection control line.

[0025] According to some example embodiments, the second electrode of the fifth transistor may be connected to a second detection power line supplying a voltage of the additional lighting detection power. Checking a connection failure of the light emitting element may include checking a connection failure of the third light emitting element based on the additional lighting detection power.

[0026] According to some example embodiments, checking for a connection failure of the third light-emitting element may include: supplying an initialization power supply having a third voltage level to a sensing line, supplying an illumination detection power supply having a fourth voltage level to a first detection power supply line, and supplying an additional illumination detection power supply having a fifth voltage level higher than the fourth voltage level to a second detection power supply line; turning on the first transistor, the second transistor, and the fifth transistor; determining that the connection of the third light-emitting element is normal when the pixel emits light; and determining that the connection of the third light-emitting element is abnormal when the pixel does not emit light.

[0027] According to some example embodiments, checking a connection failure of a light emitting element may include: before checking the connection failure of the light emitting element, causing all pixels included in a pixel unit to emit light; determining a pixel represented by a dark dot as a defective pixel by analyzing the brightness of the pixel; and checking the connection failure of the light emitting element relative to the defective pixel.

[0028] According to some example embodiments of the present invention, a display device may include: a pixel connected to a scan line, a control line, a detection control line, a data line, and a sensing line; a scan driver that supplies a scan signal to the scan line and a control signal to the control line; a data driver that supplies one of an image data signal and a sensing data signal to the data line; and a sensing circuit that senses a characteristic of the pixel based on a sensing value supplied through the sensing line. A pixel located on an i-th horizontal line among the pixels may include (where i is a natural number): a pixel circuit that controls a current flowing from a first power source to a second node in response to a voltage at a first node; a first light-emitting element connected to the second node; a first transistor that controls a voltage of an initialization power source supplied to the second node; a second light-emitting element electrically connected between the first light-emitting element and the second power source; and a second transistor having a first electrode connected to a third node and a gate electrode connected to the i-th first detection control line, the third node being between the first light-emitting element and the second light-emitting element.

[0029] According to some example embodiments, the pixel circuit may include: a third transistor connected between a first power source and a second node and having a gate electrode connected to the first node; a fourth transistor connected between the first node and one of the data lines and having a gate electrode connected to the i-th scan line; and a storage capacitor connected between the first node and the second node. The first transistor may be connected between the second node and one of the sensing lines, and may include a gate electrode connected to the i-th control line transmitting a first control signal. The second electrode of the second transistor may be connected to a first detection power line supplying a voltage of an illumination detection power source.

[0030] According to some example embodiments, when detecting a connection failure of the first light-emitting element, the first transistor and the second transistor may be turned on simultaneously, and the voltage of the initialization power supply supplied to the sensing line may be higher than the voltage of the illumination detection power supply. When detecting a connection failure of the second light-emitting element, the first transistor and the second transistor may be turned on simultaneously, the voltage of the initialization power supply supplied to the sensing line may be lower than the voltage of the illumination detection power supply, and the voltage of the illumination detection power supply may be higher than the voltage of the second power supply. BRIEF DESCRIPTION OF THE DRAWINGS

[0031] The accompanying drawings, which are included to provide a further understanding of the inventive concepts and are incorporated in and constitute a part of this specification, illustrate aspects of some example embodiments of the inventive concepts and together with the description serve to explain the principles of the inventive concepts.

[0032] Figure 1 is a block diagram illustrating a display device according to some example embodiments of the present invention.

[0033] Figure 2 It shows Figure 1 A block diagram of an example of a display device.

[0034] Figure 3 It is shown that the Figure 1 A circuit diagram of an example of a pixel in a display device.

[0035] Figure 4 It is shown that Figure 3 A timing diagram of an example of the operation of a pixel display device.

[0036] Figure 5 is a schematic diagram showing the Figure 1 A block diagram of an example of a configuration of an illumination detection device of a display device.

[0037] Figure 6A and Figure 6B This is a timing chart for explaining a detection method of a display device.

[0038] Figure 7It is shown that the Figure 1 A circuit diagram of another example of a pixel in a display device.

[0039] Figure 8 It is used to illustrate the Figure 7 A timing diagram of an example of a detection method of a pixel display device.

[0040] Figure 9 It is used to illustrate the Figure 7 A timing diagram of another example of a detection method of a pixel display device.

[0041] Figure 10 It is shown that the Figure 1 A circuit diagram of another example of a pixel in a display device.

[0042] Figure 11 It is used to illustrate the Figure 10 A timing diagram of an example of a detection method of a pixel display device.

[0043] Figure 12 It is used to illustrate the Figure 10 A timing diagram of another example of a detection method of a pixel display device.

[0044] Figure 13 It is shown that the Figure 1 A circuit diagram of yet another example of a pixel in a display device.

[0045] Figure 14 It is used to illustrate the Figure 13 A timing diagram of an example of a detection method of a pixel display device.

[0046] Figure 15 is a circuit diagram illustrating an example of a pixel included in a display device according to some example embodiments of the present invention. DETAILED DESCRIPTION

[0047] Hereinafter, aspects of some exemplary embodiments of the present invention will be described in more detail with reference to the accompanying drawings. In the accompanying drawings, the same reference numerals are used for the same components, and some repeated descriptions for the same components may be omitted.

[0048] Figure 1 is a block diagram illustrating a display device according to some example embodiments of the present invention. Figure 2 It shows Figure 1 A block diagram of an example of a display device.

[0049] Reference Figure 1 and Figure 2, the display device 1000 may include a pixel unit 100 , a scan driver 200 , a data driver 300 , a sensing circuit 400 , and a timing controller 600 .

[0050] The display device 1000 may be a flat panel display device, a flexible display device, a curved display device, a foldable display device, or a bendable display device. Furthermore, the display device 1000 may be applied to a transparent display device, a head-mounted display device, a wearable display device, or the like. Furthermore, the display device 1000 may be applied to various electronic devices (such as smartphones, tablets, smart boards, TVs, and monitors).

[0051] The display device 1000 may be implemented as an organic light-emitting display device, a liquid crystal display device, etc. However, this is an example, and the configuration of the display device 1000 is not limited thereto. For example, the display device 1000 according to some example embodiments may be a self-luminous display device including an inorganic light-emitting element.

[0052] According to some example embodiments, the display device 1000 may be driven by being divided into a display period for displaying an image and a sensing period for sensing characteristics of a driving transistor included in each of the pixels PX.

[0053] The pixel unit 100 may include pixels PX connected to data lines DL1 to DLm, scan lines SL1 to SLn, control lines CL1 to CLn, and sensing lines SSL1 to SSLm, where m and n are natural numbers. The pixels PX may be supplied with voltages of a first power source VDD and a second power source VSS from the outside.

[0054] Although Figure 1 , n scan lines SL1 to SLn are shown, but the present invention is not limited thereto. For example, one or more control lines, scan lines, and sensing lines may be additionally formed in the pixel unit 100 corresponding to the circuit structure of the pixel PX.

[0055] According to some example embodiments, the transistor included in the pixel PX may be an N-type oxide thin film transistor. For example, the oxide thin film transistor may be a low-temperature polycrystalline oxide (LTPO) thin film transistor. However, this is an example, and the N-type transistor is not limited thereto. For example, the active pattern (semiconductor layer) included in the transistor may include an inorganic semiconductor (e.g., amorphous silicon or polycrystalline silicon), an organic semiconductor, or the like. In addition, at least one of the transistors included in the display device 1000 and / or the pixel PX may be replaced with a P-type transistor.

[0056] The timing controller 600 may generate a data drive control signal DCS and a scan drive control signal SCS in response to a synchronization signal supplied from the outside. The data drive control signal DCS generated by the timing controller 600 may be supplied to the data driver 300 , and the scan drive control signal SCS may be supplied to the scan driver 200 .

[0057] In addition, the timing controller 600 may supply compensated image data CDATA compensated based on the input image data IDATA to the data driver 300. The input image data IDATA and the compensated image data CDATA may include grayscale information included in a grayscale range set in the display device.

[0058] The data drive control signal DCS may include a source start signal and a data clock signal. The source start signal may control the start time point for sampling data. The data clock signal may be used to control the sampling operation.

[0059] The scan drive control signal SCS may include a scan start signal, a control start signal, and a scan clock signal. The scan start signal may control the timing of the scan signal. The control start signal may control the timing of the control signal. The scan clock signal may be used to shift the scan start signal and / or the control start signal.

[0060] The timing controller 600 may control the operation of the sensing circuit 400. For example, the timing controller 600 may control the timing for supplying the voltage of the initialization power supply to the pixels PX through the sensing lines SSL1 to SSLm and / or the timing for sensing the current generated in the pixels PX through the sensing lines SSL1 to SSLm. Here, the initialization power supply is a term arbitrarily defined for convenience of description and is not to be construed as being limited to this term.

[0061] The scan driver 200 may receive a scan driving control signal SCS from the timing controller 600. The scan driver 200 receiving the scan driving control signal SCS may supply scan signals to the scan lines SL1 to SLn and control signals to the control lines CL1 to CLn.

[0062] For example, the scan driver 200 may sequentially supply scan signals to the scan lines SL1 to SLn. When the scan signals are sequentially supplied to the scan lines SL1 to SLn, the pixels PX may be selected in units of horizontal lines.

[0063] Similarly, the scan driver 200 can supply control signals to the control lines CL1 to CLn. The control signals can be used to sense (or extract) the driving current flowing through the pixel PX (i.e., the current flowing through the driving transistor). The timing and waveform of the scan signals and control signals can be set differently according to the display period and the sensing period.

[0064] According to some example embodiments, a control signal may be supplied for light emission of the light emitting element during illumination detection.

[0065] exist Figure 1 In the embodiment, one scan driver 200 outputs both scan signals and control signals, but the embodiment of the present invention is not limited thereto. For example, the scan driver 200 may include a first scan driver for supplying scan signals to the pixel unit 100 and a second scan driver for supplying control signals to the pixel unit 100.

[0066] The data driver 300 may receive a data driving control signal DCS from the timing controller 600. The data driver 300 may supply a data signal for detecting pixel characteristics (e.g., a sensing data signal) to the pixel unit 100 during a sensing period. The data driver 300 may supply a data signal for displaying an image to the pixel unit 100 based on the compensated image data CDATA during a display period.

[0067] The sensing circuit 400 can generate a compensation value to compensate for the characteristic value of the pixel PX based on the sensing value provided by the sensing lines SSL1 to SSLm. For example, the sensing circuit 400 can detect and compensate for changes in the threshold voltage and mobility of the driving transistor included in the pixel PX, changes in the characteristics of the light emitting element, etc.

[0068] According to some example embodiments, during a sensing period, the sensing circuit 400 may supply a reference voltage (e.g., a set or predetermined reference voltage) (or an initialization voltage) to the pixel PX through the sensing lines SSL1 to SSLm, and receive a current or voltage extracted from the pixel PX. The extracted current or voltage may correspond to a sensing value, and the sensing circuit 400 may detect a characteristic change of the driving transistor based on the sensing value. The sensing circuit 400 may calculate a compensation value for compensating the input image data IDATA based on the detected characteristic change. The compensation value may be provided to the timing controller 600 or the data driver 300.

[0069] During the display period, the sensing circuit 400 may supply a voltage (eg, a set or predetermined voltage) of an initialization power source for displaying an image to the pixel unit 100 through the sensing lines SSL1 to SSLm.

[0070] Although Figure 1The sensing circuit 400 is shown as having a structure separated from the timing controller 600, but at least a part of the structure of the sensing circuit 400 can be included in the timing controller 600. For example, the sensing circuit 400 and the timing controller 600 can be formed by one driver IC. In addition, the data driver 300 can also be included in the timing controller 600.

[0071] At least some of the sensing circuit 400, the data driver 300, and the timing controller 600 may be formed of one driver IC. Figure 2 As shown in FIG, the panel driver 700 implemented as one driving IC may perform all functions of the sensing circuit 400, the data driver 300, and the timing controller 600.

[0072] Figure 3 It is shown that the Figure 1 A circuit diagram of an example of a pixel in a display device.

[0073] exist Figure 3 In FIG. 1 , for convenience of description, the pixel 10 located on the i-th horizontal line and connected to the j-th data line DLj is shown.

[0074] Reference Figure 1 and Figure 3 , the pixel 10 may include a plurality of light emitting elements LD1 and LD2 , a first transistor T1 , a second transistor T2 , and a pixel circuit PXC.

[0075] According to some example embodiments, the pixel circuit PXC may include a third transistor T3 (driving transistor), a storage capacitor Cst, and a fourth transistor T4.

[0076] According to some example embodiments, the light emitting elements LD1 and LD2 may include a first light emitting element LD1 and a second light emitting element LD2 connected in series. However, this is an example, and the pixel 10 may further include a light emitting element connected in series with the first light emitting element LD1 and the second light emitting element LD2. In addition, the pixel 10 may further include a light emitting element connected in parallel with the first light emitting element LD1 or the second light emitting element LD2.

[0077] According to some example embodiments, the first light-emitting element LD1 and the second light-emitting element LD2 may be ultra-small light-emitting elements having a size as small as nanometer to micrometer. These ultra-small light-emitting elements may include a material having an inorganic crystal structure, and the material having the inorganic crystal structure may emit light. However, this is merely an example, and at least one of the first light-emitting element LD1 and the second light-emitting element LD2 may be an organic light-emitting element.

[0078] A first electrode (e.g., an anode) of the first light-emitting element LD1 may be connected to the second node N2, and a second electrode (e.g., a cathode) of the first light-emitting element LD1 may be connected to the third node N3. A first electrode of the second light-emitting element LD2 may be connected to the third node N3, and a second electrode of the second light-emitting element LD2 may be electrically connected to the second power supply VSS. The first light-emitting element LD1 and the second light-emitting element LD2 may emit light having a brightness (e.g., a set or predetermined brightness) corresponding to the amount of current supplied from the pixel circuit PXC or the third transistor T3. In other words, the first light-emitting element LD1 and the second light-emitting element LD2 may be driven by current and may have driving characteristics similar to those of a light-emitting diode.

[0079] The pixel circuit PXC can control the current flowing from the first power supply VDD to the second node N2 in response to the voltage of the first node N1. The pixel circuit PXC can include various known transistor connection relationships. For example, the pixel circuit PXC can include four or more transistors including a driving transistor.

[0080] A first electrode of the third transistor T3 may be connected to the first power supply VDD, and a second electrode of the third transistor T3 may be connected to the second node N2. A gate electrode of the third transistor T3 may be connected to the first node N1. The third transistor T3 may control the amount of current flowing through the first light emitting element LD1 and the second light emitting element LD2 in response to the voltage of the first node N1.

[0081] A first electrode of the fourth transistor T4 may be connected to the data line DLj, and a second electrode of the fourth transistor T4 may be connected to the first node N1. A gate electrode of the fourth transistor T4 may be connected to the scan line SLi. The fourth transistor T4 may be turned on when a scan signal is supplied to the scan line SLi to transmit the data signal from the data line DLj to the first node N1.

[0082] The first transistor T1 may be connected between the sensing line SSLj and the second electrode of the third transistor T3 (i.e., the second node N2). The gate electrode of the first transistor T1 may be connected to the control line CLi. The first transistor T1 may be turned on when a first control signal is supplied to the control line CLi to electrically connect the sensing line SSLj and the second node N2 (i.e., the second electrode of the third transistor T3).

[0083] According to some example embodiments, when the first transistor T1 is turned on, the voltage of the initialization power supply Vint may be supplied to the second node N2 . According to some example embodiments, when the first transistor T1 is turned on, the current generated by the third transistor T3 may be supplied to the sensing circuit 400 .

[0084] The storage capacitor Cst may be connected between the first node N1 and the second node N2. The storage capacitor Cst may store a voltage corresponding to a voltage difference between the first node N1 and the second node N2.

[0085] According to some example embodiments, a first electrode of the second transistor T2 may be connected to the third node N3, and a second electrode of the second transistor T2 may be connected to the second power supply VSS. A gate electrode of the second transistor T2 may be connected to a detection control line CCLi (or a first detection control line).

[0086] The second transistor T2 can be turned on when the second control signal is supplied to the detection control line CCLi to electrically connect the third node N3 and the second power supply VSS. In other words, when the second transistor T2 is turned on, a bypass can be formed between the first light-emitting element LD1 and the second power supply VSS. The second transistor T2 can be used to detect (and check) the connection state of the first light-emitting element LD1 between the second node N2 and the third node N3.

[0087] When the second light emitting element LD2 is normally connected, the second transistor T2 may maintain a turned-off state during a display period for displaying an image.

[0088] However, when the second light emitting element LD2 is in an electrically disconnected state between the third node N3 and the second power source VSS, the second transistor T2 may maintain a turned-on state during the display period for bypassing.

[0089] In the embodiment of the present invention, the structure of the pixel circuit PXC of the pixel 10 is not limited to Figure 3 Example of .

[0090] Figure 4 It is shown that Figure 3 A timing diagram of an example of the operation of a pixel display device.

[0091] Figure 4 An example of signals supplied to pixels arranged on a j-th vertical line (or pixel column) is shown.

[0092] Reference Figure 1 、 Figure 3 and Figure 4 The display device 1000 can be divided into a display period DP for displaying an image and a period for sensing an image included in a pixel PX (refer to FIG. Figure 1 ) is driven by a sensing period SP of the characteristics of the third transistor T3 in each of the transistors.

[0093] According to some example embodiments, in the sensing period SP, image data may be compensated based on the sensed characteristic information.

[0094] During the display period DP, the voltage of the initialization power source Vint having a voltage level (e.g., a set or predetermined voltage level) may be supplied to the sensing lines SSL1 to SSLm. According to some example embodiments, the voltage of the initialization power source Vint supplied during the display period DP may be set to a value higher than the voltage of the second power source VSS.

[0095] During the display period DP, the scan driver 200 may sequentially supply scan signals to the scan lines SL1 to SLn. In addition, during the display period DP, the scan driver 200 may sequentially supply control signals to the control lines CL1 to CLn.

[0096] According to some example embodiments, the length of the control signal supplied in the display period DP may be longer than that of the scan signal. In addition, a portion of the control signal supplied to the i-th control line CLi in the display period DP may overlap with the scan signal supplied to the i-th scan line SLi.

[0097] When the fourth transistor T4 is turned on, a data signal corresponding to image data can be supplied to the first node N1. When the first transistor T1 is turned on, the initialization power supply Vint can be supplied to the second node N2. Therefore, the storage capacitor Cst can store a voltage corresponding to the voltage difference between the data signal and the initialization power supply Vint.

[0098] Here, since the initialization power source Vint is set to a constant voltage during the display period DP, the voltage stored in the storage capacitor Cst may be stably determined by the data signal.

[0099] When supply of the scan signal and the control signal to the i-th scan line SLi and the i-th control line CLi stops, the first transistor T1 and the fourth transistor T4 may be turned off.

[0100] Thereafter, the third transistor T3 can control the amount of current (driving current) supplied to the first and second light emitting elements LD1 and LD2 in response to the voltage stored in the storage capacitor Cst. Therefore, the first and second light emitting elements LD1 and LD2 can emit light with brightness corresponding to the driving current.

[0101] According to some example embodiments, the scan driver 200 may sequentially supply scan signals to the scan lines SL1 to SLn during the sensing period SP. Also, the scan driver 200 may sequentially supply control signals to the control lines CL1 to CLn during the sensing period SP.

[0102] According to some example embodiments, the length of the control signal supplied in the sensing period SP may be longer than the length of the control signal supplied in the display period DP. In addition, in the sensing period SP, a portion of the control signal supplied to the i-th control line CLi may overlap with the scan signal supplied to the i-th scan line SLi.

[0103] When the scan signal and the control signal are supplied simultaneously, the first transistor T1 and the fourth transistor T4 are turned on. When the fourth transistor T4 is turned on, a sensing data signal SGV (or a sensing data voltage) for sensing can be supplied to the first node N1 via the data line DLj. Simultaneously, when the first transistor T1 is turned on, the voltage of the initialization power supply Vint can be supplied to the second node N2. Therefore, a voltage corresponding to the voltage difference between the sensing data signal SGV and the initialization power supply Vint can be stored in the storage capacitor Cst.

[0104] Thereafter, when the supply of the scan signal stops, the fourth transistor T4 may be turned off. When the fourth transistor T4 is turned off, the first node N1 may float. As a result, the voltage of the second node N2 may increase, and a sensing current may be generated through the third transistor T3. During the voltage increase, the sensing current may flow to the sensing line SSLj. The sensing circuit 400 may compensate for the image data by analyzing the sensing current.

[0105] According to some example embodiments, the sensing period SP may be performed at least once before the display apparatus 1000 is shipped. In this case, initial characteristic information of the third transistor T3 may be stored before the display apparatus 1000 is shipped, and by compensating the input image data IDATA using the characteristic information, the pixel unit 100 may display an image with uniform image quality.

[0106] In addition, even when the display device 1000 is in use, the sensing period SP can be performed in each time period (e.g., each set or predetermined time period). For example, the sensing period SP can be arranged in a portion of the time when the display device 1000 is turned on and / or turned off. Then, even if the characteristics of the third transistor T3 of each of the pixels PX change according to the amount of use, the characteristic information can be updated in real time to reflect the characteristic information in the generation of the data signal. However, this is an example, and the sensing period SP can be between the display periods (e.g., set or predetermined display periods) DP. Therefore, the pixel unit 100 can continuously display an image with uniform image quality.

[0107] Figure 5 is a schematic diagram showing the Figure 1 A block diagram of an example of a configuration of an illumination detection device of a display device.

[0108] Reference Figure 1 、 Figure 3 and Figure 5 , when executing pixel PX (refer to Figure 1 ), the pixel unit 100 included in the display device 1000 can be controlled by the illumination tester 102.

[0109] According to some example embodiments, when inspecting the display apparatus 1000 in a motherboard state, the lighting tester 102 may be connected to the pixel unit 100. According to some example embodiments, when using the display apparatus 1000, the lighting tester 102 may be connected to the pixel unit 100 by a user command or the like.

[0110] The illumination tester 102 may be included in the display device 1000 or may be connected to the pixel unit 100 from the outside of the display device 1000. Alternatively, some components of the illumination tester 102 may be included in the display device 1000.

[0111] Reference Figure 3 and Figure 5 , the lighting tester 102 may be connected to the control line CLi and the detection control line CCLi of the pixel 10. In addition, the lighting tester 102 may be connected to the scan line SLi and the sensing line SSLj of the pixel 10.

[0112] The lighting tester 102 can supply a first control signal CS1 to the control line CLi and a second control signal CS2 to the detection control line CCLi. Furthermore, the lighting tester 102 can supply the voltage of the initialization power supply Vint to the sensing line SSLj and a scan signal to the scan line SLi. Thus, lighting testing and connection fault detection can be performed on the light-emitting elements LD1 and LD2.

[0113] According to some example embodiments, first, the pixel PX (refer to Figure 1 ) can emit light. The lighting tester 102 can analyze the pixel PX (refer to Figure 1 ) to determine the pixel represented by the dark spot as a defective pixel. For example, the lighting tester 102 may use a camera to detect the pixel PX (refer to Figure 1 ) of each. Optionally, the illumination detection may also be performed as a process including analyzing the input / output value of the signal for detection, analyzing the brightness of each pixel PX (refer to Figure 1 ) The brightness and / or color coordinates of the emitted light, etc. Such illumination detection can be performed by various known methods.

[0114] Subsequently, a test for inspecting the light emitting element (e.g., Figure 3The system detects a connection failure of the light-emitting elements LD1 and LD2 (shown in FIG). That is, when at least one of the series-connected light-emitting elements LD1 and LD2 is electrically disconnected or short-circuited, the pixel including the at least one light-emitting element appears darker than a properly connected pixel. After specifying such a defective pixel, the at least one light-emitting element detected as having a connection failure among the series-connected light-emitting elements LD1 and LD2 can be detected by using a bypass between the light-emitting elements LD1 and LD2.

[0115] Will refer to Figure 6A etc. will be described in detail about the method and pixel structure for detecting the connection failure of the light emitting elements LD1 and LD2.

[0116] Figure 6A and Figure 6B This is a timing chart for explaining a detection method of a display device.

[0117] Reference Figure 3 、 Figure 6A and Figure 6B , the inspection method of the display device may include a first period P1 for determining a defective pixel and a second period P2 for checking a connection failure of the first light emitting element LD1 and the second light emitting element LD2.

[0118] exist Figure 6A and Figure 6B In this paper, we will mainly describe Figure 3 The driving of the pixel 10 is also applicable to a plurality of pixels.

[0119] like Figure 6A As shown in FIG, in the first period P1, a scan signal at a gate-on level is supplied to the scan line SLi, and a first control signal at a gate-on level is supplied to the control line CLi. The second control signal may not be supplied during the first period P1. For example, a second control signal at a gate-off level (e.g., represented by L) may be supplied to the detection control line CCLi during the first period P1.

[0120] In addition, an initialization power source Vint having a first voltage level V1 may be supplied through the sensing line SSLj. The initialization power source Vint may be supplied to stably calculate a driving current generated by the third transistor T3 by maintaining a voltage of the second node N2 at a constant value.

[0121] According to some example embodiments, the first voltage level V1 may be higher than the voltage level of the second power supply VSS. For example, the difference between the first voltage level V1 and the voltage level of the second power supply VSS may be equal to or greater than the sum of the threshold voltages of the first light emitting element LD1 and the second light emitting element LD2.

[0122] because Figure 6AOperation and reference of pixel 10 in Figure 4 The operations of the display period DP described are basically the same, so some repeated descriptions may be omitted.

[0123] When a dark spot is generated in the pixel 10 or the brightness of the pixel 10 is lower than that of other pixels, an operation for checking a connection failure of the light emitting elements LD1 and LD2 of the pixel 10 may be performed during the second period P2 .

[0124] In the second period P2, the supply of the scan signal to the scan line SLi may be stopped. For example, a scan signal of a gate-off level (eg, represented by L) may be supplied. Therefore, the fourth transistor T4 may remain in the off state in the second period P2.

[0125] In addition, in the second period P2, the first control signal can be supplied to the control line CLi, and the second control signal can be supplied to the detection control line CCLi. Therefore, the first transistor T1 and the second transistor T2 can be turned on at the same time. The initialization power supply Vint of the first voltage level V1 can be supplied to the sensing line SSLj.

[0126] Therefore, in the second period P2, a current path may be formed from the sensing line SSLj through the second node N2, the first light emitting element LD1, the third node N3, and the second transistor T2 to the second power supply VSS. When the first light emitting element LD1 is normally connected or aligned between the second node N2 and the third node N3, the first light emitting element LD1 may emit light due to a voltage difference between the first voltage level V1 of the initialization power supply Vint and the voltage level of the second power supply VSS.

[0127] In other words, when the pixel 10 emits light, it can be determined that the connection of the first light emitting element LD1 is normal. At this time, because the pixel 10 appears darker than other pixels, it can be determined (or inferred) that the connection of the second light emitting element LD2 is abnormal.

[0128] When the pixel 10 does not emit light during the second period P2, it can be determined that the first light-emitting element LD1 has a connection abnormality. For example, the first light-emitting element LD1 may be electrically disconnected, or an unexpected short circuit may have occurred between the second node N2 and the third node N3. The results of the inspection for the connection failure between the light-emitting elements LD1 and LD2 can be stored in a memory or the like. For example, the coordinates of the defective pixel, the location of the light-emitting element in which the connection failure has occurred, and the like can be recorded in a storage medium such as a memory at the same time as the second period P2 or after the second period P2.

[0129] Repair processing, repair driving, bypass processing, bypass driving, etc. can be additionally performed on the abnormally connected light emitting element in various known methods.

[0130] As described above, the display device 1000 including the pixel 10 according to the embodiment of the present invention (see Figure 1 ) and its driving method can relatively accurately detect a light emitting element in which a connection failure has occurred using a transistor (for example, a second transistor T2) connected between the light emitting elements LD1 and LD2 connected in series and a second control signal supplied to a detection control line for controlling the transistor. Therefore, repair or compensation driving can be easily performed later. Therefore, the display device 1000 (refer to FIG. 1 ) including a plurality of light emitting elements LD1 and LD2 connected in series can be improved. Figure 1 ) reliability.

[0131] Figure 7 It is shown that the Figure 1 A circuit diagram of another example of a pixel in a display device.

[0132] exist Figure 7 The same reference numerals are used to refer to Figure 3 In addition, except for the connection of the second transistor T2, Figure 7 The pixel 11 may have Figure 3 The pixels 10 are of substantially the same or similar construction.

[0133] Reference Figure 7 The pixel 11 may include a plurality of light emitting elements LD1 and LD2, a first transistor T1, a second transistor T2, a third transistor T3 (driving transistor), a storage capacitor Cst, and a fourth transistor T4. The pixel 11 may be connected to a detection power supply line CHLj that supplies a lighting detection power supply Vcheck.

[0134] The light emitting elements LD1 and LD2 may include a first light emitting element LD1 and a second light emitting element LD2 connected in series.

[0135] According to some example embodiments, a first electrode of the second transistor T2 may be connected to the third node N3, and a second electrode of the second transistor T2 may be connected to the detection power line CHLj. A gate electrode of the second transistor T2 may be connected to the detection control line CCLi.

[0136] When checking for a connection fault in the first light-emitting element LD1, the voltage level of the illumination detection power supply Vcheck may be lower than the voltage level of the initialization power supply Vint, causing the first light-emitting element LD1 to emit light. Alternatively, the voltage level of the illumination detection power supply Vcheck may be equal to or lower than the voltage level of the second power supply VSS, causing the second light-emitting element LD2 to not emit light.

[0137] When checking for a connection failure in the second light-emitting element LD2, the voltage level of the illumination detection power supply Vcheck may be equal to or greater than the voltage level of the initialization power supply Vint, so that the first light-emitting element LD1 does not emit light. Alternatively, the voltage level of the illumination detection power supply Vcheck may be greater than the voltage level of the second power supply VSS, so that the second light-emitting element LD2 emits light.

[0138] Figure 8 It is used to illustrate the Figure 7 A timing diagram of an example of a detection method of a pixel display device.

[0139] exist Figure 8 The same reference numerals are used to refer to Figure 6B The components described are described in detail, and some repeated descriptions of these components may be omitted.

[0140] Reference Figure 7 and Figure 8 , the detection method of the display device may include a second period P2 for checking a connection failure of the first light emitting element LD1 and a third period P3 for checking a connection failure of the second light emitting element LD2.

[0141] According to some example embodiments, the same signal may be supplied to the control line CLi and the detection control line CCLi. For example, a control signal output from one control signal source may be supplied to both the control line CLi and the detection control line CCLi. However, this is an example, and the method for supplying signals to the control line CLi and the detection control line CCLi is not limited thereto.

[0142] In the second period P2, the first transistor T1 and the second transistor T2 may be turned on in response to the first control signal supplied to the control line CLi and the second control signal supplied to the detection control line CCLi. At this time, the fourth transistor T4 may be turned off.

[0143] During the second period P2, the initialization power supply Vint may have a first voltage level V1, and the illumination detection power supply Vcheck may have a second voltage level V2. The first voltage level V1 may be set higher than the second voltage level V2 so that the first light-emitting element LD1 emits light. Alternatively, the second voltage level V2 may be set lower than the second power supply VSS so that the second light-emitting element LD2 does not emit light.

[0144] Therefore, in the second period P2 , a current path connected from the sensing line SSLj to the detection power line CHLj through the second node N2 , the first light emitting element LD1 , the third node N3 , and the second transistor T2 may be formed.

[0145] When the pixel 11 emits light, it can be determined that the connection of the first light emitting element LD1 is normal. However, when the pixel 11 does not emit light, it can be determined that the connection of the first light emitting element LD1 is abnormal (short-circuited or disconnected).

[0146] In the third period P3, the first transistor T1 and the second transistor T2 may be turned on in response to the first control signal supplied to the control line CLi and the second control signal supplied to the detection control line CCLi. At this time, the fourth transistor T4 may be turned off.

[0147] During the third period P3, the initialization power supply Vint may have a third voltage level V3, and the illumination detection power supply Vcheck may have a fourth voltage level V4. The fourth voltage level V4 may be set higher than the voltage level of the second power supply VSS so that the second light-emitting element LD2 emits light. Alternatively, the third voltage level V3 may be set lower than or equal to the fourth voltage level V4 so that the first light-emitting element LD1 does not emit light.

[0148] Therefore, in the third period P3, a current path connected from the detection power line CHLj through the third node N3 and the second light emitting element LD2 to the second power source VSS may be formed.

[0149] In the third period P3, when the pixel 11 emits light, the connection of the second light emitting element LD2 can be determined to be normal. However, when the pixel 11 does not emit light, the connection of the second light emitting element LD2 can be determined to be abnormal (short circuit or open circuit).

[0150] exist Figure 8 In the embodiment, the second period P2 and the third period P3 are driven at intervals (eg, set or predetermined intervals). However, in some cases, only one of the second period P2 and the third period P3 may be driven.

[0151] As mentioned above, Figure 7 The Pixel 11 and Figure 8 The detection method for driving the pixel 11 can individually check (and detect) a connection failure (or conduction) in each of the first light emitting element LD1 and the second light emitting element LD2. Therefore, the accuracy of detecting a light emitting element in which a connection failure has occurred can be further improved.

[0152] Figure 9 It is used to illustrate the Figure 7 A timing diagram of another example of a detection method of a pixel display device.

[0153] exist Figure 9 The same reference numerals are used to refer to Figure 8 In addition, in addition to the waveform of the first control signal supplied in the third period P3', Figure 9 The detection method can be used with Figure 8 The detection methods are basically the same or similar.

[0154] Reference Figure 7 and Figure 9 , the detection method of the display device may include a second period P2 for checking a connection failure of the first light emitting element LD1 and a third period P3 ′ for checking a connection failure of the second light emitting element LD2 .

[0155] In the third period P3', the first control signal may not be supplied to the control line CLi, and the first transistor T1 may be turned off. Whether the second light emitting element LD2 emits light may be detected in the third period P3'. Therefore, the first transistor T1 may be turned off to reduce power consumption.

[0156] Figure 10 It is shown that the Figure 1 A circuit diagram of another example of a pixel in a display device.

[0157] exist Figure 10 The same reference numerals are used to refer to Figure 7 In addition, in addition to the third light emitting element LD3 and the fifth transistor T5, Figure 10 The pixel 12 may have Figure 7 The pixels 11 are basically of the same or similar construction.

[0158] Reference Figure 10 The pixel 12 may include a plurality of light emitting elements LD1, LD2, and LD3, a first transistor T1, a second transistor T2, a third transistor T3, a storage capacitor Cst, a fourth transistor T4, and a fifth transistor T5. The pixel 12 may be connected to a detection power line CHLj that supplies a lighting detection power source Vcheck.

[0159] The third light emitting element LD3 may be electrically connected between the second light emitting element LD2 and the second power source VSS. That is, the first to third light emitting elements LD1, LD2, and LD3 may be connected in series.

[0160] A gate electrode of the second transistor T2 may be connected to the first detection control line CCL1_i. A second control signal may be supplied to the first detection control line CCL1_i.

[0161] A first electrode of the fifth transistor T5 may be connected to a fourth node N4 between the second light-emitting element LD2 and the third light-emitting element LD3, and a second electrode of the fifth transistor T5 may be connected to the second power supply VSS. A gate electrode of the fifth transistor T5 may be connected to the second detection control line CCL2_i. A third control signal may be supplied to the second detection control line CCL2_i.

[0162] The fifth transistor T5 may be turned on when the third control signal is supplied to the second detection control line CCL2_i to form a bypass between the fourth node N4 and the second power supply VSS. The fifth transistor T5 may be used to detect (and check) a connection state of the third light emitting element LD3.

[0163] The pixel 12 may further include at least one light emitting diode and at least one corresponding transistor connected in series for forming a bypass.

[0164] Figure 11 It is used to illustrate the Figure 10 A timing diagram of an example of a detection method of a pixel display device.

[0165] exist Figure 11 The same reference numerals are used to refer to Figure 6B and Figure 8 The components described are described in detail, and some repeated descriptions of these components may be omitted.

[0166] Reference Figure 10 and Figure 11 , the detection method of the display device may include a second period P2 for checking a connection failure of the first light emitting element LD1 and a third period P3 for checking a connection failure of the second light emitting element LD2 and the third light emitting element LD3 .

[0167] According to some example embodiments, except for the configuration in which the fifth transistor T5 is turned off, the driving method for detection in the second period P2 is the same as that of the reference Figure 8 and Figure 9 The driving method described in the second period P2 is substantially the same. For example, in the second period P2, the third control signal may not be supplied, and the fifth transistor T5 may be turned off. Because the second voltage level V2 of the voltage of the third node N3 (i.e., the illumination detection power supply Vcheck) is lower than the voltage level of the second power supply VSS, a connection fault of the first light-emitting element LD1 can be detected.

[0168] During the second period P2, the first and second transistors T1 and T2 may be turned on, forming a current path from the sense line SSLj through the second node N2, the first light-emitting element LD1, the third node N3, and the second transistor T2 to the detection power line CHLj. Therefore, it is possible to determine whether the first light-emitting element LD1 is properly connected. Because the illumination detection power supply Vcheck of the second voltage level V2, which is lower than the voltage level of the second power supply VSS, is supplied to the third node N3, the second and third light-emitting elements LD2 and LD3 may not emit light.

[0169] During the third period P3, the first transistor T1, the second transistor T2, and the fifth transistor T5 may be turned on in response to the first control signal supplied to the control line CLi, the second control signal supplied to the first detection control line CCL1_i, and the third control signal supplied to the second detection control line CCL2_i. During the third period P3, the initialization power supply Vint may have a third voltage level V3, and the illumination detection power supply Vcheck may have a fourth voltage level V4. Therefore, during the third period P3, a current path may be formed from the detection power supply line CHLj through the second light-emitting element LD2 and the fifth transistor T5 to the second power supply VSS.

[0170] Pixel 12 is a defective pixel, and after checking the normal connection of the first light emitting element LD1 in the second period P2, the third period P3 can be performed. When the pixel 12 emits light in the third period P3, it can be determined that the connection of the second light emitting element LD2 is normal and the connection of the third light emitting element LD3 is abnormal.

[0171] However, after the pixel is determined as a defective pixel, when the pixel 12 does not emit light in the third period P3 , it may be determined that the connection of the second light emitting element LD2 is abnormal (short-circuited or disconnected).

[0172] Figure 12 It is used to illustrate the Figure 10 A timing diagram of another example of a detection method of a pixel display device.

[0173] exist Figure 12 The same reference numerals are used to refer to Figure 11 In addition, in addition to the waveform of the third control signal supplied in the second period P2', Figure 12 The detection method can be used with Figure 11 The detection methods are basically the same or similar.

[0174] Reference Figure 10 and Figure 12, the detection method of the display device may include a second period P2 ′ for checking a connection failure of the first light emitting element LD1 and a third period P3 for checking a connection failure of the second light emitting element LD2 .

[0175] During the second period P2', a third control signal may be supplied, and the first transistor T1, the second transistor T2, and the fifth transistor T5 may all be turned on. At this time, because the illumination detection power supply Vcheck, which has a second voltage level V2 lower than the voltage level of the second power supply VSS, is supplied to the third node N3, the second and third light-emitting elements LD2 and LD3 may not emit light. Furthermore, a current path may be formed from the sense line SSLj through the second node N2, the first light-emitting element LD1, the third node N3, and the second transistor T2 to the detection power supply line CHLj. When the first light-emitting element LD1 is properly connected, it may emit light.

[0176] Because the operation in the third period P3 is consistent with the reference Figure 11 The operations in the third period P3 described are substantially the same, so some repeated descriptions may be omitted.

[0177] According to some example embodiments, the same signal (control signal) may be supplied to at least two of the control line CLi, the first detection control line CCL1_i, and the second detection control line CCL2_i.

[0178] Figure 13 It is shown that the Figure 1 A circuit diagram of yet another example of a pixel in a display device.

[0179] exist Figure 13 In the Figure 10 In addition, except for the connection of the fifth transistor T5, Figure 13 The pixel 13 may have Figure 10 The pixels 12 are of substantially the same or similar construction.

[0180] Reference Figure 13 Pixel 13 may include a plurality of light emitting elements LD1, LD2, and LD3, a first transistor T1, a second transistor T2, a third transistor T3, a storage capacitor Cst, a fourth transistor T4, and a fifth transistor T5. Pixel 13 may be connected to a second detection power line CHL2_j that supplies a second illumination detection power source Vcheck2 (or an additional illumination detection power source).

[0181] According to some example embodiments, a first electrode of the second transistor T2 may be connected to a third node N3. A second electrode of the second transistor T2 may be connected to a first detection power line CHL1_j supplying a first illumination detection power Vcheck1. A gate electrode of the second transistor T2 may be connected to a first detection control line CCL1_i supplying a second control signal.

[0182] A first electrode of the fifth transistor T5 may be connected to the fourth node N4. A second electrode of the fifth transistor T5 may be connected to the second detection power line CHL2_j. A gate electrode of the fifth transistor T5 may be connected to the second detection control line CCL2_i that supplies the third control signal. The fifth transistor T5 may be used to detect (and check) the connection state of the third light-emitting element LD3.

[0183] When checking for a connection fault in the second light-emitting element LD2, the voltage level of the first illumination detection power supply Vcheck1 can be equal to or higher than the voltage level of the initialization power supply Vint, preventing the first light-emitting element LD1 from emitting light. The voltage level of the first illumination detection power supply Vcheck1 can be greater than the voltage level of the second power supply VSS, preventing the second light-emitting element LD2 from emitting light. Furthermore, the voltage level of the second illumination detection power supply Vcheck2 can be less than the voltage level of the second power supply VSS, preventing the third light-emitting element LD3 from emitting light.

[0184] When checking for a connection fault in the third light-emitting element LD3, the voltage level of the first illumination detection power supply Vcheck1 can be equal to or higher than the voltage level of the initialization power supply Vint, so that the first light-emitting element LD1 does not emit light. The voltage level of the first illumination detection power supply Vcheck1 can be lower than the voltage level of the second illumination detection power supply Vcheck2, so that the second light-emitting element LD2 does not emit light. Furthermore, the voltage level of the second illumination detection power supply Vcheck2 can be higher than the voltage level of the second power supply VSS, so that the third light-emitting element LD3 emits light.

[0185] Figure 14 It is used to illustrate the Figure 13 A timing diagram of an example of a detection method of a pixel display device.

[0186] exist Figure 14 The same reference numerals are used to refer to Figure 6B 、 Figure 8 and Figure 11 The components described are described in detail, and some repeated descriptions of these components may be omitted.

[0187] Reference Figure 13 and Figure 14The detection method of the display device may include a second period P2 for checking a connection failure of the first light emitting element LD1, a third period P3 for checking a connection failure of the second light emitting element LD2, and a fourth period P4 for checking a connection failure of the third light emitting element LD3.

[0188] According to some example embodiments, the second illumination detection power source Vcheck2 may have the second voltage level V2 in the second period P2 and the third period P3. Therefore, the third light emitting element LD3 does not emit light in the second period P2 and the third period P3.

[0189] In the fourth period P4, the initialization power Vint of the third voltage level V3 may be supplied to the sensing line SSLj, the first illumination detection power Vcheck1 of the fourth voltage level V4 may be supplied to the first detection power line CHL1_j, and the second illumination detection power Vcheck2 of the fifth voltage level V5 higher than the fourth voltage level V4 may be supplied to the second detection power line CHL2_j.

[0190] In the fourth period P4, the first transistor T1, the second transistor T2, and the fifth transistor T5 may all be turned on. Because the voltage of the third node N3 is higher than the voltage of the second node N2, the first light-emitting element LD1 may be turned off. In addition, because the voltage of the fourth node N4 is higher than the voltage of the third node N3, the second light-emitting element LD2 may be turned off.

[0191] Therefore, in the fourth period P4 , a current path connected from the second detection power line CHL2_j to the second power source VSS through the fifth transistor T5 and the third light emitting element LD3 may be formed.

[0192] In the fourth period P4, when the pixel 13 emits light, it can be determined that the connection of the third light emitting element LD3 is normal. However, when the pixel 13 does not emit light, it can be determined that the connection of the third light emitting element LD3 is abnormal (short circuit or open circuit).

[0193] Therefore, even when three or more light emitting elements are connected in series, it is possible to check for a connection failure in each of the light emitting elements. Figure 13 In the embodiment, three light emitting elements are connected in series, but the embodiment of the present invention is not limited thereto. Even when four or more light emitting elements are connected in series, the reference Figures 10 to 14 The contents are described, and connection failures of each of the light emitting elements can be checked.

[0194] As described above, a display device and detection method thereof according to an embodiment of the present invention can relatively accurately detect connection failures in each light-emitting element using a transistor connected between the series-connected light-emitting elements and a control signal supplied to a detection control line to control the transistor. Consequently, repair or compensatory driving can be easily performed later. Consequently, the reliability and image quality of a display device including multiple light-emitting elements connected in series can be improved.

[0195] Figure 15 is a circuit diagram illustrating an example of a pixel included in a display device according to an embodiment of the present invention.

[0196] exist Figure 15 In the Figure 3 Components described above, and some repeated descriptions of these components may be omitted. In addition, in addition to the configuration of the pixel circuit PXC1, Figure 15 The pixel 14 may have Figure 3 The pixels 10 are of substantially the same or similar construction.

[0197] Reference Figure 15 , the pixel 14 may include a pixel circuit PXC1 , a first transistor T1 , a second transistor T2 , a first light emitting element LD1 , and a second light emitting element LD2 .

[0198] According to some example embodiments, the pixel 14 may compensate for a threshold voltage of the third transistor T3 (driving transistor) through the pixel circuit PXC1 .

[0199] Because it has been referenced Figure 3 etc. describe the connection and operation of the first transistor T1 and the second transistor T2 , so some repeated descriptions may be omitted.

[0200] The pixel circuit PXC1 may include third to eighth transistors T3 to T8 .

[0201] The third transistor T3 (driving transistor) may control current flowing from the first power source VDD to the second node N2 in response to the voltage of the first node N1 .

[0202] The fourth transistor T4 may be connected between the data line DLj and the first electrode of the third transistor T3. The gate electrode of the fourth transistor T4 may be connected to the scan line SLi. The fourth transistor T4 may be turned on by a scan signal to transmit the data signal from the data line DLj to the first electrode of the third transistor T3.

[0203] The fifth transistor T5 may be connected between the first node N1 and the second node N2. The gate electrode of the fifth transistor T5 may be connected to the scan line SLi. The third transistor T3 may be diode-connected by turning on the fifth transistor T5. A voltage corresponding to the difference between the data signal and the threshold voltage of the third transistor T3 may be supplied to the second node N2.

[0204] The sixth transistor T6 may be connected between the first node N1 and a wiring supplying an initialization power supply Vint. The gate electrode of the sixth transistor T6 may be connected to the control line CLi. When the sixth transistor T6 is turned on, the voltage of the initialization power supply Vint may be supplied to the first node N1. The seventh transistor T7 may be connected between the first power supply VDD and the first electrode of the third transistor T3, and the eighth transistor T8 may be connected between the second node N2 and the first electrode of the first light-emitting element LD1. The gate electrodes of the seventh and eighth transistors T7 and T8 may be connected to the emission control line ELi. When the seventh and eighth transistors T7 and T8 are turned on, the first and second light-emitting elements LD1 and LD2 may emit light based on the drive current.

[0205] As such, the pixel circuit PXC1 may be implemented in various known structures or structures for causing the light emitting elements LD1 and LD2 to emit light.

[0206] A display device and detection method thereof according to an embodiment of the present invention can relatively accurately detect connection failures in each light-emitting element using a transistor connected between the series-connected light-emitting elements and a control signal supplied to a detection control line to control the transistor. This allows for easy repair or compensatory driving later. Consequently, the reliability and image quality of a display device including multiple series-connected light-emitting elements can be improved.

[0207] However, the effects and characteristics according to the embodiment of the present invention are not limited to the above-described effects, and various extensions can be made without departing from the spirit and scope of the present invention.

[0208] As described above, aspects of some exemplary embodiments of the present invention have been described with reference to the accompanying drawings. However, those skilled in the art will appreciate that various modifications and changes may be made to the exemplary embodiments according to the present invention without departing from the spirit and scope of the invention as set forth in the claims and their equivalents.

Claims

1. A method for detecting a display device, the method comprising: checking for a connection failure of light emitting elements included in a pixel and connected in series based on a first control signal, a second control signal, and a voltage of an initialization power supply, The pixels include: a pixel circuit that controls a current flowing from a first power source to a second node in response to a voltage at the first node; a first light-emitting element connected to the second node; a first transistor having a first electrode connected to the second node, a second electrode connected to a sensing line supplying a voltage of the initialization power source, and a gate electrode connected to a control line; a second light emitting element electrically connected between the first light emitting element and a second power source; and a second transistor having a first electrode connected to a third node between the first light emitting element and the second light emitting element, a second electrode connected to a first detection power supply line supplying a voltage of an illumination detection power supply, and a gate electrode connected to a first detection control line; The checking of the connection failure of the light emitting element comprises: checking the connection failure of the first light emitting element based on the voltage of the initialization power supply; and checking the connection failure of the second light emitting element based on the voltage of the lighting detection power supply. wherein checking for a connection failure of the first light emitting element comprises: supplying the initialization power supply having a first voltage level to the sensing line, and supplying the illumination detection power supply having a second voltage level lower than the first voltage level and the voltage level of the second power supply to the first detection power line; wherein checking for a connection failure of the second light emitting element comprises: supplying the initialization power supply having a third voltage level to the sensing line, and supplying the illumination detection power supply having a fourth voltage level to the first detection power supply line, and The fourth voltage level is higher than or equal to the third voltage level and higher than the voltage level of the second power source.

2. The detection method according to claim 1, wherein The pixel circuit further includes: a third transistor connected between the first power source and the second node and having a gate electrode connected to the first node; a fourth transistor connected between the first node and the data line and having a gate electrode connected to the scan line; and A storage capacitor is connected between the first node and the second node.

3. The detection method according to claim 1, wherein Checking for a connection failure of the first light-emitting element further includes: turning on the first transistor and the second transistor; and Whether the connection of the first light emitting element is normal or abnormal is determined based on whether the pixel emits light.

4. The detection method according to claim 3, wherein Checking for a connection failure of the second light-emitting element further includes: turning on the second transistor; and determining whether the connection of the second light emitting element is normal or abnormal based on whether the pixel emits light, wherein the third voltage level is lower than the first voltage level, and The fourth voltage level is higher than the second voltage level.

5. The detection method according to claim 4, wherein The pixel further comprises: a third light-emitting element electrically connected between the second light-emitting element and the second power source; and A fifth transistor has a first electrode connected to a fourth node between the second light emitting element and the third light emitting element and a gate electrode connected to a second detection control line.

6. The detection method according to claim 5, wherein A second electrode of the fifth transistor is connected to the second power supply, and When checking for a connection failure of the first light emitting element, the fifth transistor is turned on simultaneously with the second transistor in response to a third control signal supplied to the second detection control line.

7. The detection method according to claim 5, wherein A second electrode of the fifth transistor is connected to the second power supply, and When checking for a connection failure of the second light emitting element, the fifth transistor is turned on simultaneously with the second transistor in response to a third control signal supplied to the second detection control line.

8. The detection method according to claim 5, wherein A second electrode of the fifth transistor is connected to a second detection power line that supplies a voltage of an additional lighting detection power source, The steps for checking the connection failure of the light emitting element include: checking for a connection failure of the third light emitting element based on the additional lighting detection power supply, The step of checking the connection failure of the third light emitting element includes: supplying the initialization power having the third voltage level to the sensing line; supplying the illumination detection power having the fourth voltage level to the first detection power line; supplying the additional lighting detection power having a fifth voltage level higher than the fourth voltage level to the second detection power line; turning on the first transistor, the second transistor, and the fifth transistor; and Whether the connection of the third light emitting element is normal or abnormal is determined based on whether the pixel emits light.

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