A three-temperature test fixture for CFP2 packaged optical modules

Abstract

The present invention provides a three-temperature test fixture for a CFP2 packaged optical module, comprising a fixture base, a fixture upper cover, a fixture air inlet cover and a fixture hinge cover, wherein a test circuit board is provided in the middle of the fixture base, a plug-in module reserved cavity is provided at one end of the fixture base, a module female seat is provided in the middle of the test circuit board, one end of the fixture upper cover is covered above the module female seat of the test circuit board to form a test cavity, the fixture air inlet cover is covered at the other end of the fixture upper cover to form a heat flow air inlet cavity connected to the test cavity, at least one air inlet connected to a heat flow meter is provided between the fixture air inlet cover and the fixture upper cover, the fixture upper cover is provided with a temperature measuring probe, and the fixture hinge cover is covered above the plug-in module reserved cavity and forms a sealed cavity connected to the test cavity. The present invention has a simple structure, a more stable test effect, high test efficiency, and more accurate test.

Description

Technical Field

[0001] The invention relates to the field of optical communications, and in particular to a three-temperature test fixture for a CFP2 packaged optical module. Background Art

[0002] The reliability requirements of optical communication module products have always been one of the factors that customers focus on. It is an important measure to measure whether the module products can operate stably for a long time in various harsh environments (high temperature and high humidity, etc.). Therefore, the reliability requirements of high-end optical module products with a transmission rate higher than 100Gb / s are particularly important. As one of the important indicators of reliability requirements, three-temperature testing has become an important link in the factory delivery of optical modules and a key inspection project for customers. In order to quickly obtain accurate three-temperature data, a hot and cold shock machine (also known as a heat flow meter) is usually used to achieve this. The specific implementation method is as follows: the module to be tested and the test board are fixed in the fixture, and the heat flow meter cover is buckled on the fixture to form a closed space. The gas generated by the heat flow meter is blown into the closed space through the air duct to achieve rapid temperature changes. The fixture is hollowed out around to facilitate the insertion of high-frequency cables, optical fiber jumpers, test board power cables and thermocouple cables to achieve module testing and temperature monitoring.

[0003] 1. The diameter of the heat flow meter cover on the market is 140mm, which is larger than the length and width of the CFP2 module (41.5mm x107.5mm). If the three-temperature test environment requires a heat flow meter cover, the fixture design needs to take the heat flow meter cover into consideration, and the designed fixture needs to include the entire test board. When doing a three-temperature test, the heat flow meter cover is buckled on the fixture and air is blown through the air inlet in the cover to achieve temperature changes. Because the fixture fixes the module and the entire test board, the airflow blown out from the heat flow meter passes through the entire test board and module. Compared with the airflow acting only on the module, the temperature change area in the traditional test fixture environment appears to be very large. At the same time, an overly large fixture will increase the risk of air leakage, which will lead to a longer waiting time for the temperature to reach the temperature point required for the three-temperature test, and low module temperature change efficiency.

[0004] 2. The heat flow meter cover will automatically drop to the groove of the fixture to fix the cover after the three-temperature test according to the program settings. Multiple lifting and lowering cannot guarantee that the cover can drop to the same position, that is, it cannot guarantee whether the cover and the fixture can be completely sealed. Sometimes the position of the cover needs to be manually adjusted before subsequent tests can be carried out. This increases the test time and instability during the test, and reduces efficiency.

[0005] 3. The temperature monitoring of the module is usually achieved by mechanically clamping the thermocouple so that the thermocouple probe is in close contact with the surface of the module shell. Long-term use cannot guarantee the reliability of the spring device and whether the probe can be in close contact. At the same time, because the probe is in contact with the module shell, heat exchange occurs between the probe and the module shell surface, resulting in the monitored temperature being lower than the actual temperature of the module surface, and the test data is not the test data of the actual temperature. Summary of the invention

[0006] In order to solve the problems in the prior art, the present invention provides a three-temperature test fixture for a CFP2 packaged optical module.

[0007] The present invention provides a three-temperature test fixture for a CFP2 packaged optical module, comprising a fixture base, a fixture upper cover, a fixture air inlet cover and a fixture hinge cover, wherein a test circuit board is provided in the middle of the fixture base, a plug-in module reserved cavity is provided at one end of the fixture base, a module female seat is provided in the middle of the test circuit board, one end of the fixture upper cover is covered above the module female seat of the test circuit board to form a test cavity, the fixture air inlet cover is covered at the other end of the fixture upper cover to form a heat flow air inlet cavity connected with the test cavity, at least one air inlet connected with a heat flow meter is provided between the fixture air inlet cover and the fixture upper cover, a temperature measuring probe is provided on the fixture upper cover, and the fixture hinge cover covers above the plug-in module reserved cavity and forms a sealed cavity connected with the test cavity.

[0008] As a further improvement of the present invention, one end of the clamp hinge cover is connected to one side of the plug-in module reserved cavity by a hinge, and a lock is provided between the other end of the clamp hinge cover and the other side of the plug-in module reserved cavity.

[0009] As a further improvement of the present invention, a guide track is provided along the length direction of the clamp upper cover at the lower end of the clamp upper cover located above the module base.

[0010] As a further improvement of the present invention, the connection between the test cavity and the heat flow air inlet cavity is a first connection slope connection and is provided with a first foam layer.

[0011] As a further improvement of the present invention, the connection between the test cavity and the reserved cavity of the plug-in module is a second connection slope and is provided with a second foam layer.

[0012] As a further improvement of the present invention, the test circuit board, the fixture upper cover and the fixture air inlet cover are all fixed to the fixture base by a plurality of fixing bolts.

[0013] As a further improvement of the present invention, a wire outlet reserved hole is further provided at one end of the clamp hinge cover away from the clamp upper cover.

[0014] The beneficial effects of the present invention are: the present invention has a simple structure, a more stable test effect, a high test efficiency, and a more accurate test. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 It is a structural schematic diagram of a three-temperature test fixture for a CFP2 packaged optical module of the present invention;

[0016] Figure 2 It is a structural schematic diagram of another angle of a three-temperature test fixture for a CFP2 packaged optical module of the present invention;

[0017] Figure 3 It is a structural schematic diagram of the structure of a fixture base of a three-temperature test fixture for a CFP2 packaged optical module of the present invention;

[0018] Figure 4 It is a structural schematic diagram of a fixture upper cover of a three-temperature test fixture for a CFP2 packaged optical module of the present invention;

[0019] Figure 5 It is a structural schematic diagram of another angle of the fixture cover of the three-temperature test fixture of a CFP2 packaged optical module of the present invention.

[0020] Figure markings: 1-clamp base; 11-plug-in module reserved cavity; 2-clamp upper cover; 21-guide rail; 3-clamp air inlet cover; 4-clamp hinge cover; 41-hinge; 42-lock; 5-test circuit board; 6-test module; 7-temperature measuring probe; 8-air inlet; 91-first foam layer; 92-second foam layer. DETAILED DESCRIPTION

[0021] like Figures 1 to 5As shown, the present invention discloses a three-temperature test fixture for a CFP2 packaged optical module, comprising a fixture base 1, a fixture upper cover 2, a fixture air inlet cover 3 and a fixture hinge cover 4. A test circuit board 5 is provided in the middle of the fixture base 1, a plug-in module reserved cavity 11 is provided at one end of the fixture base 1, a module female seat is provided in the middle of the test circuit board 5, one end of the fixture upper cover 2 covers the module female seat of the test circuit board 5 to form a test cavity, and other electronic components on the test circuit board 5 are arranged on the test circuit board 5 outside the fixture upper cover 2, so that it can be ensured that the components on the test circuit board 5 are not immersed in an environment of high and low temperature changes during the three-temperature test, thereby eliminating the failure of components due to frequent high and low temperature changes, and the fixture air inlet cover 3 covers the other end of the fixture upper cover 2 to form a heat flow air inlet cavity connected to the test cavity. At least one air inlet 8 connected to the heat flux meter is provided between the fixture air inlet cover 3 and the fixture upper cover 2, and the heat flux meter air inlet part is fixed on the fixture base 1. During testing, only the test module 6 needs to be plugged in and out and the fixture hinge cover 4 needs to be flipped over to achieve three-temperature testing. This not only increases the stability of the test system, but also directly connects to the heat flux meter outlet pipe. There is no need to install a heat flux meter cover separately, and also solves the problem of increased test time due to the need for manual alignment when the heat flux meter cover moves up and down. The fixture upper cover 2 is provided with a temperature measuring probe 7. The temperature measuring probe is provided above the module to be tested, which not only enables direct measurement, but also reduces the test cavity space, which can further improve the accuracy of temperature control. The fixture hinge cover 4 covers the reserved cavity 11 of the plug-in module and forms a sealed cavity connected to the test cavity, thereby ensuring the accuracy of the test.

[0022] In the present technical solution, one end of the clamp hinge cover 4 is connected to one side of the reserved cavity 11 of the plug-in module through a hinge 41, and a lock 42 is provided between the other end of the clamp hinge cover 4 and the other side of the reserved cavity 11 of the plug-in module, so that the reserved space of the plug-in module can be quickly opened and closed, which greatly facilitates the plugging and unplugging of the test module 6.

[0023] In the present technical solution, the lower end of the clamp cover 2 is located above the module base and is also provided with a guide track 21 arranged along the length direction of the clamp cover 2, which can be used to guide the test module 6 to be inserted into the socket of the test board and effectively limit the test module 6.

[0024] In the present technical solution, the connection between the test cavity and the heat flow air inlet cavity is a first connection bevel connection and is provided with a first foam layer 91, and the connection between the test cavity and the plug-in module reserved cavity 11 is a second connection bevel connection and is provided with a second foam layer 92. The first connection bevel is a 45° inclined surface, and the second connection bevel is a 45° inclined surface arranged opposite to the first connection bevel, which improves the sealing effect and prevents condensation from entering the test cavity and causing a short circuit between the test module 6 and the test circuit board 5.

[0025] In the technical solution, the test circuit board 5, the fixture upper cover 2 and the fixture air inlet cover 3 are all fixed to the fixture base 1 by a plurality of fixing bolts, so the fixing effect is good and the operation is more stable.

[0026] In the technical solution, the end of the clamp hinge cover 4 away from the clamp upper cover 2 is also provided with a wire outlet reserved hole, which can leave space for the optical fiber jumper.

[0027] The present invention has a simple structure, a more stable test effect, a high test efficiency, and a more accurate test.

[0028] The above contents are further detailed descriptions of the present invention in combination with specific preferred embodiments, and it cannot be determined that the specific implementation of the present invention is limited to these descriptions. For ordinary technicians in the technical field to which the present invention belongs, several simple deductions or substitutions can be made without departing from the concept of the present invention, which should be regarded as falling within the scope of protection of the present invention.

Claims

1. A three-temperature test fixture for CFP2 packaged optical modules, characterized in that: The clamp comprises a fixture base, a fixture upper cover, a fixture air inlet cover and a fixture hinge cover, wherein a test circuit board is provided in the middle of the fixture base, a plug-in module reserved cavity is provided at one end of the fixture base, a module female seat is provided in the middle of the test circuit board, one end of the fixture upper cover covers the module female seat of the test circuit board to form a test cavity, the fixture air inlet cover covers the other end of the fixture upper cover to form a heat flow air inlet cavity connected with the test cavity, at least one air inlet connected with a heat flow meter is provided between the fixture air inlet cover and the fixture upper cover, the fixture upper cover is provided with a temperature measuring probe, the fixture hinge cover covers the plug-in module reserved cavity and forms a sealed cavity connected with the test cavity, the connection between the test cavity and the heat flow air inlet cavity is a first connecting inclined surface and a first foam layer is provided, and the connection between the test cavity and the plug-in module reserved cavity is a second connecting inclined surface and a second foam layer is provided.

2. The three-temperature test fixture for CFP2 packaged optical module according to claim 1, characterized in that: One end of the clamp hinge cover is connected to one side of the plug-in module reserved cavity through a hinge, and a lock is provided between the other end of the clamp hinge cover and the other side of the plug-in module reserved cavity.

3. The three-temperature test fixture for CFP2 packaged optical module according to claim 1, characterized in that: The lower end of the clamp upper cover is located above the module base and is also provided with a guide track arranged along the length direction of the clamp upper cover.

4. The three-temperature test fixture for CFP2 packaged optical module according to claim 1, characterized in that: The test circuit board, the fixture upper cover and the fixture air inlet cover are all fixed on the fixture base by a plurality of fixing bolts.

5. The three-temperature test fixture for CFP2 packaged optical module according to claim 1, characterized in that: An end of the clamp hinge cover away from the clamp upper cover is also provided with a wire outlet reserved hole.

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