Resistance test method and system based on simulation of resistance working conditions based on road spectrum power data

Abstract

The present invention provides a resistance test method and system for simulating resistance working conditions based on spectrum power data. The method matches the resistance properties of each test resistor to the corresponding on-board working type, selects multiple power spectrum working conditions applicable to the resistor, and then generates a test power use case for each test resistor based on the corresponding resistor operating status data, thereby determining a chopping test program that matches the test power use case data; when there is a test requirement, the corresponding chopping test program is selected according to the resistance properties of the resistor to be tested, and the test is performed based on the resistance test equipment. The test scheme of the present invention is used to pre-record and calculate the chopping test program for each test resistor for testing, which can significantly improve the execution speed during the test, and the test program data in the present invention can fully cover all possible working conditions of the resistor, and accurately simulate the real working conditions of the resistor from multiple aspects such as the power applied to the resistor and the fan status, effectively improving the accuracy and practicality of the resistance test results.

Description

Technical Field

[0001] The present invention relates to the technical field of resistor reliability testing and evaluation, and in particular to a resistor testing method and system for simulating resistor working conditions based on circuit spectrum power data. Background Art

[0002] The performance of a resistor is closely linked to the operating conditions of the equipment it supports. This is especially true for brake resistors used in new energy vehicles or rail transit. Their performance impacts not only the vehicle's operation but also potentially endangers passengers' lives. Therefore, accurate performance testing of resistors after they are manufactured or before they are put into operation is crucial.

[0003] Existing resistor testing methods mostly use constant power or fixed duty cycle chopping test methods to perform temperature rise tests on brake resistors. These methods cannot truly simulate the braking conditions of a vehicle during actual driving, or control the power-on time of the resistor based on a specific finite sample to achieve resistor performance testing. These methods cannot achieve comprehensive testing of various actual resistor operating conditions, and some actual resistor faults are always difficult to reproduce during the test, indicating that the test results are not reliable enough. Summary of the Invention

[0004] To solve the above problems, the present invention provides a resistance test method for simulating resistance working conditions based on spectrum power data. In one embodiment, the method includes:

[0005] Step S1: matching the corresponding on-vehicle working type based on the resistance properties of each test resistor, and selecting multiple power path spectrum working conditions applicable to each test resistor according to the on-vehicle working type;

[0006] Step S2: Generate a test power case for each test resistor based on the resistor operating status data corresponding to each power spectrum operating condition, wherein the test power case includes the real-time resistor applied power, vehicle operating speed, and fan switch status data of the tested resistor under each power spectrum operating condition;

[0007] Step S3: generating a chopping test program that matches the data in each test power case;

[0008] Step S4: selecting a corresponding chopping test program according to the resistance properties of the resistor to be tested, and using a matching resistance test device to load the chopping test program to perform a test to obtain a test result of the resistor to be tested.

[0009] Preferably, in one embodiment, the chopping test program includes a chopping opening size sequence, a chopping opening time sequence, a test fan state sequence and a test voltage;

[0010] The chopping opening size sequence is composed of a series of changing unit chopping opening sizes, the chopping opening time sequence is composed of a series of chopping unit opening times, and the test fan state sequence is composed of a series of changing unit test fan states.

[0011] Furthermore, in one embodiment, in step S3, the unit chopping turn-on size CDUTY matching the test power use case is determined by the following algorithm:

[0012] CDUTY=(power applied to the resistor at that moment*CDUTYmax) / Pmax

[0013] Where CDUTY represents the unit chopper switching size, CDUTYmax represents the maximum switching signal output by the chopper cabinet, and Pmax represents the maximum resistance applied power of the resistor to be tested.

[0014] In one embodiment, in step S3 , the chopping on time is matched with the unit chopping on size, and both follow a pulse width modulation mechanism.

[0015] In one embodiment, in step S4, before performing a test to obtain a test result of the resistor to be tested, the following steps are included:

[0016] After connecting the main circuit and the control circuit, the lower limit of the power supply voltage is used as the input of the chopper cabinet, and the chopper test program is loaded through the matching resistance test equipment to verify the correctness of the data in the chopper test program.

[0017] Furthermore, step S4 also includes: calculating the target test voltage of the resistor to be tested based on the sample resistance value of the resistor to be tested and the maximum resistance applied power in the test power use case, so that the power simulated when the chopper cabinet is fully opened is the maximum resistance applied power of the resistor to be tested.

[0018] In one embodiment, the power supply voltage is adjusted according to the target test voltage, and a chopping test program after verification is loaded and tested using a matching resistance test device.

[0019] Optionally, the temperature data of the resistor to be tested during the test process using an infrared camera is used.

[0020] Based on the methods described in the above embodiments, the present invention further provides a storage medium storing program codes that can implement the methods described in the above embodiments.

[0021] Based on other aspects of any one or more of the above embodiments, the present invention further provides a resistance test system for simulating resistance working conditions based on spectrum power data, the system comprising:

[0022] A working condition data selection module is configured to match the corresponding vehicle working type based on the resistance properties of each test resistor, and select multiple power path spectrum working conditions applicable to each test resistor according to the vehicle working type;

[0023] A power use case generation module is configured to generate a test power use case for each test resistor based on the resistor operating status data corresponding to each power spectrum operating condition. The test power use case includes the real-time resistor applied power, vehicle operating speed, and fan switch status data of the tested resistor under each power spectrum operating condition.

[0024] a chopping test program determination module configured to generate a chopping test program that matches data in each test power case;

[0025] The test execution module is configured to select a corresponding chopping test program according to the resistance property of the resistor to be tested, and use a matching resistance test device to load the chopping test program to perform a test to obtain a test result of the resistor to be tested.

[0026] Compared with the closest prior art, the present invention also has the following beneficial effects:

[0027] The present invention provides a resistor testing method and system for simulating resistor working conditions based on road spectrum power data. The testing method matches the resistance properties of each test resistor to the corresponding on-vehicle working type, selects multiple power road spectrum working conditions suitable for the resistor, and then generates a test power use case for each test resistor based on the corresponding resistor operating status data, and then determines a chopping test program that matches the test power use case data; the test scheme of the present invention is used to pre-record and calculate the chopping test program for each test resistor used for the test, which can significantly improve the execution speed during the test, and the test program data in the present invention can fully cover all possible working conditions of the resistor, avoiding the problem that abnormal conditions of some actual working conditions cannot be reproduced through experiments.

[0028] In addition, when there is a test requirement, the embodiment of the present invention selects a corresponding chopping test program according to the resistance properties of the resistor to be tested, and performs the test based on the resistance test equipment, which greatly reduces the time required for the test. The chopping test program of the present invention accurately simulates the actual working conditions of each test resistor from multiple aspects such as the power applied to the resistor and the fan status, which can overcome the shortcomings of the existing test methods and effectively improve the accuracy and practicality of the resistance test results.

[0029] Other features and advantages of the present invention will be described in the following description, and in part will become apparent from the description, or will be understood by practicing the present invention. The purposes and other advantages of the present invention can be realized and obtained by the structures particularly pointed out in the description, claims and drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] The accompanying drawings are used to provide a further understanding of the present invention and constitute a part of the specification. Together with the embodiments of the present invention, they are used to explain the present invention and do not constitute a limitation of the present invention. In the accompanying drawings:

[0031] Figure 1 1 is a flow chart of a resistance test method for simulating resistance working conditions based on circuit spectrum power data in one embodiment of the present invention;

[0032] Figure 2 This is an example diagram of actual power use case data of a resistance test method based on spectrum power data to simulate resistance working conditions in an embodiment of the present invention;

[0033] Figure 3 This is an example diagram of a chopping test procedure for a resistance test method based on circuit spectrum power data to simulate resistance working conditions in an embodiment of the present invention;

[0034] Figure 4 This is an example diagram of a data chart after embedding the test power use case and the chopping test program in an embodiment of the present invention;

[0035] Figure 5 2 is a schematic structural diagram of a resistance test system for simulating resistance working conditions based on spectrum power data provided by another embodiment of the present invention. DETAILED DESCRIPTION

[0036] The following will describe in detail the implementation methods of the present invention in conjunction with the accompanying drawings and embodiments, so that practitioners of the present invention can fully understand how the present invention applies technical means to solve technical problems and achieve the implementation process of technical effects, and can implement the present invention in accordance with the above implementation process. It should be noted that as long as no conflict exists, the various embodiments and various features of each embodiment in the present invention can be combined with each other, and the resulting technical solutions are all within the scope of protection of the present invention.

[0037] The performance of a resistor is closely linked to the operating conditions of the equipment it supports. This is especially true for brake resistors used in new energy vehicles or rail transit. Their performance impacts not only the vehicle's operation but also potentially endangers passengers' lives. Therefore, accurate performance testing of resistors after they are manufactured or before they are put into operation is crucial.

[0038] Existing resistor testing methods mostly use constant power or fixed duty cycle chopping test methods to perform temperature rise tests on brake resistors. These methods cannot truly simulate the braking conditions of a vehicle during actual driving, or control the power-on time of the resistor based on a small number of specific samples to achieve resistor performance testing. Comprehensive testing of various actual resistor operating conditions is impossible, and some actual resistor faults are always difficult to reproduce during the test, indicating that the test results are not reliable enough.

[0039] In order to solve the above problems, the present invention provides a resistance test method and system based on the simulation of resistance working conditions based on the spectrum power data.

[0040] Various embodiments of the present invention will be described below with reference to the accompanying drawings.

[0041] Example 1

[0042] Figure 1 The flow chart of the resistance test method based on the road spectrum power data simulation resistance working condition provided by the first embodiment of the present invention is shown. Figure 1 It can be seen that the method includes the following steps.

[0043] Step S110 : matching the corresponding on-vehicle working type based on the resistance properties of each test resistor, and selecting a plurality of power spectrum working conditions applicable to each test resistor according to the on-vehicle working type.

[0044] Taking into account that different resistors have different working scenarios in different fields, and different working scenarios determine that the same or different resistors will be applied to different working types, for example, when braking resistors are applied to rail vehicles of different specifications or passenger capacities, their working types are not exactly the same, or when braking resistors are applied to rail vehicles and mountain construction vehicles, there must be various different working conditions. Therefore, the present invention counts the matching on-board working types according to the set test resistor set, and pre-acquires a variety of power spectrum working conditions corresponding to various on-board working types as a reference database for service and resistance testing. Specifically, the test resistor can be selected according to the actual test requirements, so as to cover all possible resistors to be tested. Of course, when a new type of resistor appears or if there is a resistor that has not appeared in the test process, the corresponding power spectrum working condition can also be selected based on the resistance properties and working type of the resistor to update the original power spectrum working condition.

[0045] In one embodiment, the resistor attributes may include resistor category, resistor model, and manufacturer or brand data.

[0046] In actual application, the power road spectrum data includes the resistance properties of the vehicle to which the test resistor belongs, the vehicle type, the vehicle's service life, the vehicle's working scene, working time, the resistor operating condition data, and the equipment data and operating data related to the resistor, wherein the resistor operating condition data is obtained based on the vehicle's road power spectrum density data.

[0047] It should be noted that the acquired power spectrum conditions can be labeled and partitioned as needed. If a test is required, all or part of the data can be selected as a reference. For example, the resistor category and resistor model in the resistor properties can be selected as labels, and the power spectrum condition data for different models under each resistor category can be stored independently. The power spectrum condition data is intended to ensure that the input test conditions can cover all possible conditions that the resistor to be tested may encounter. The richer the data it contains, the more accurate the judgment basis can be.

[0048] In one embodiment, for a test resistor, a power spectrum operating condition to be detected corresponding to the test resistor is extracted from each corresponding power spectrum operating condition, and all resistance applied power, vehicle operating speed, and fan switch status data of the test resistor are extracted from the relevant data as a test power use case for the test resistor. Therefore, this embodiment of the present invention includes: step S120, generating a test power use case for the test resistor based on the resistor operating status data corresponding to each power spectrum operating condition, wherein the test power use case includes real-time resistance applied power, vehicle operating speed, and fan switch status data of the test resistor under each power spectrum operating condition.

[0049] In one embodiment, considering that the data measurement values ​​of the original test power use case extracted from the actual power spectrum working condition may be decimals with relatively high precision and a large number of accurate digits, it is not convenient for the test setting and calculation, such as Figure 2 As shown, in Figure 2 The "Time (seconds)" column indicates the moment, i.e., the second; the "Resistor Power (kW)" column indicates the power applied to the resistor at that moment; the "Speed ​​(km / h)" column indicates the vehicle's operating speed at that moment; and the "Fan On / Off" column indicates the on / off status of the resistor's fan at that moment. Therefore, before extracting the test power use case for the test resistor, the relevant actual operating condition data is simplified, shortening or removing decimal places in the data to simplify test data calculations and improve test efficiency. For example, the simplified operating condition data of some resistor power spectrums is shown in the following table:

[0050] Time(s) Resistor applied power (kW) Speed ​​(km / h) Fan switch status 0 0 0 0 1 0 10 0 2 0 20 0 3 0 30 0 4 500 25 1 5 400 20 1 6 300 15 1 7 200 10 1 8 100 5 1 9 0 0 0 10 0 0 0

[0051] Based on the above operations, it can be seen that the test power use case of the present invention not only includes the applied power level of the resistor, but also includes the fan switch status data. Based on the corresponding equipment in the test environment, it can simulate the actual fan operating environment of the test resistor, and can more accurately simulate the actual operating state of the resistor. In addition, the driving speed data included in the test power use case can provide users with a more intuitive understanding of the actual needs that the resistor can meet under different test power use case data, making it easier for users to determine the applicable scenarios of the current resistor. Even personnel without extensive professional knowledge can reliably complete data extraction or testing processes.

[0052] In the present invention, the power of the braking resistor is controlled by a chopping method during the test. The test equipment is externally connected to a constant DC voltage source, and the equipment uses pulse width modulation to control the power-on time applied to the braking resistor, thereby forming a series of pulse waves to control the heating power of the braking resistor. Furthermore, in one embodiment, the chopping test program (editing the test program) for the test resistor is set based on the test power use case. The purpose of this operation is to enable the control signal output by the chopping cabinet to act on the tested resistor to accurately simulate the situation of the resistor to achieve each test power use case, and effectively describe the braking condition of the resistor during the actual driving process of the vehicle. Therefore, there is step S130, generating a chopping test program that matches the data in each test power use case.

[0053] Specifically, in one embodiment, the chopping test program includes a chopping opening size sequence, a chopping opening time sequence, a test fan state sequence and a test voltage; Figure 3 As shown, in Figure 3 In the program, CDUTY indicates the size of the chopper cabinet opening (output), 32767 indicates the maximum chopper cabinet opening signal size in the program, and 0 indicates that the disconnection power is 0. CNUM: indicates the chopper cabinet opening (output) time, opening time (s) = CNUM column value × 0.05s. SSTAT: indicates the fan status: "0" means "off", "1" means "on", SNUM: indicates the fan opening time, opening time (s) = CNUM column value × 0.05s, among which, since each chopper signal lasts for 1 second, each power level corresponding to the chopper signal 1 The CNUM value = 1 / 0.05 = 20.

[0054] Specifically, the chopping test procedure of the embodiment of the present invention can also be expressed and recorded in the form of the following table:

[0055] Chopping time (×50ms) Chopping opening size Fan control Fan time (×50ms) 20 0 0 20 20 0 0 20 20 0 0 20 20 0 0 20 20 500 1 20 20 400 1 20 20 300 1 20 20 200 1 20 20 100 1 20 20 0 0 20 20 0 0 20

[0056] The chopping opening size sequence is composed of a series of changing unit chopping opening sizes.

[0057] The on-time sequence is composed of a series of chopping unit on-times, and the test fan state sequence is composed of a series of changing unit test fan states.

[0058] Considering that the test power use case data and chopping test program data of the resistor both contain multiple elements, the embodiment of the present invention uses an EXCEL table to express them, which is convenient for viewing and retrieval, and can be better converted into the power path spectrum.

[0059] Preferably, the chopping on time is matched with the unit chopping on power, and both follow a pulse width modulation mechanism.

[0060] In actual application, in one embodiment, the mapping relationship between the CDUTY (chopper cabinet output size) value in the chopper test program and the resistance power in the test power use case table can be obtained by the following formula, that is, the unit chopper opening size CDUTY matching the test power use case is determined by the following algorithm:

[0061] CDUTY=(power applied to the resistor at that moment*CDUTYmax) / Pmax

[0062] Wherein, CDUTY represents the unit chopper opening size, CDUTYmax represents the maximum opening signal output by the chopper cabinet. In practical applications, the maximum opening signal of the chopper cabinet is usually selected as 32767, and Pmax represents the maximum resistance applied power of the resistor to be tested. The maximum resistance applied power of the resistor to be tested is obtained by consulting the power spectrum operating condition data corresponding to the resistor or the maximum resistance power in the test power use case table. It should be noted that the conversion relationship between the chopper opening size and the resistance applied power in the embodiments of the present invention is not particularly limited, that is, the chopper opening size can also be calculated using other reasonable means.

[0063] In an optional embodiment, in order to facilitate management, the chopping test program data and the test power case data of the test resistor can also be embedded and processed. Specifically, the following can be obtained: Figure 4 In the data table shown, the data in the program SSTAT column is consistent with the value in the fan switch column, and the data in the program SNUM column is consistent with the data in the program CNUM column.

[0064] It should be noted that when a new type of resistor appears or if there is a resistor that has never appeared in the test process, the corresponding power spectrum operating condition is selected based on the resistance properties and working type of the resistor. On the basis of updating the original power spectrum operating condition, the test power use case and chopping test procedure corresponding to the resistor are also updated.

[0065] In addition, considering that the actual power spectrum operating condition data of the new resistor is limited, in order to ensure the comprehensiveness and reliability of its test results, it is possible to temporarily refer to the power spectrum operating condition data of similar resistors for improvement, and obtain its actual power spectrum operating condition data from time to time for supplementation or adjustment. Among them, similar resistors refer to resistors with similar resistance properties and vehicle operating types as the new resistor;

[0066] Furthermore, the embodiment of the present invention performs tests on each test resistor through the following steps: Step S140, selecting a corresponding chopping test program according to the resistance properties of the resistor to be tested, and using a matching resistance test device to load the chopping test program to perform a test to obtain a test result of the resistor to be tested.

[0067] In one embodiment, before performing a test to obtain a test result of a resistor to be tested, the process includes:

[0068] After connecting the main circuit and control circuit, the lower limit of the power supply voltage is used as the input of the chopper cabinet. The chopper test program is loaded through the matching resistance test equipment to verify the correctness of the data in the chopper test program. In actual application, the lower limit of the power supply voltage can be input to the chopper cabinet first. The correctness of the chopper test program (time and fan status) can be verified by loading the chopper test program through the power resistance ground test program.

[0069] Specifically, when the time data and fan status data obtained by verification are consistent with the time and fan status data in the chopping test program, it means that the data in the chopping test program is correct, and the next step is executed. Otherwise, check whether the data setting of the chopping test program during loading is incorrect, that is, whether the data loaded and set when executing the test is consistent with the data in the chopping test program. If they are consistent, regenerate the corresponding chopping test program according to the data in each test power use case. If they are inconsistent, re-set and load the data in the existing chopping test program to execute the verification test until the verification result is correct.

[0070] This operation verifies the chopping test program and prevents incorrect test results or resistor damage caused by incorrect chopping test program data during the test. The lower limit of the power supply voltage is used for testing to control the input voltage and minimize the risk of abnormalities.

[0071] Specifically, in one embodiment, the target test voltage of the resistor to be tested is calculated based on the sample resistance value and the maximum resistance applied power in the test power use case, and the voltage is adjusted so that the power simulated by its control signal when the chopper cabinet is fully open is the maximum resistance applied power of the resistor to be tested.

[0072] Furthermore, based on the above operation, the power supply voltage is adjusted according to the target test voltage. After the voltage is confirmed, the test is performed using a matching resistance test device to load the verified chopping test program. In actual application, the test can be performed using existing resistance test equipment or a power resistance ground test program to load the verified chopping test program.

[0073] In an optional embodiment, the temperature data of the resistor under test is collected during the test using an infrared camera. For example, during the test, an infrared thermal imager is placed in a suitable position to measure the temperature of the resistor strip. It should be noted that the present invention can also test other characteristics of the resistor under test that meet test requirements based on the above test logic.

[0074] By adopting the test scheme in any one or more of the above-mentioned embodiments of the present invention, all possible power spectrum conditions of different resistors are obtained in advance based on the working type data of each resistor, providing data reference for the test power use case of the test, and ensuring that the power data of various working conditions that may be applied to each test resistor can be fully simulated during the test, thereby ensuring the comprehensiveness of the test results to the greatest extent.

[0075] In addition, the test method of the embodiment of the present invention can also simulate the fan environment when the resistor is actually operating based on the fan operation data in the test power use case, further ensuring the authenticity and accuracy of the resistor performance detection, enabling the laboratory to truly simulate the actual working conditions of the brake resistor, and effectively reproduce all faults of the brake resistor on site, which helps to promote the optimization of product quality.

[0076] Based on the method described in the above embodiments of the present invention, the present invention further proposes a storage medium, which stores program codes that can implement the method proposed by the present invention.

[0077] Example 2

[0078] Based on other aspects of any one or more of the above embodiments of the present invention, the present invention further provides a resistance test system that simulates resistance working conditions based on spectrum power data. Figure 5 FIG. 4 shows a schematic diagram of a resistance test system for simulating resistance working conditions based on spectrum power data according to an embodiment of the present invention. Figure 5 As shown, the system includes:

[0079] The operating condition data selection module 51 is configured to match the corresponding vehicle operating type based on the resistance properties of each test resistor, and select multiple power path spectrum operating conditions applicable to each test resistor according to the vehicle operating type;

[0080] A power use case generation module 53 is configured to generate a test power use case for each test resistor based on the resistor operating status data corresponding to each power spectrum operating condition. The test power use case includes the real-time resistor applied power, vehicle operating speed, and fan switch status data of each test resistor under each power spectrum operating condition.

[0081] a chopping test program determination module 55 configured to generate a chopping test program that matches data in each test power case;

[0082] The test execution module 57 is configured to select a corresponding chopping test program according to the resistance properties of the resistor to be tested, and use a matching resistance test device to load the chopping test program to perform a test to obtain a test result of the resistor to be tested.

[0083] Specifically, in one embodiment, the chopping test program generated by the chopping test program determination module 55 includes a chopping opening size sequence, a chopping opening time sequence, a test fan state sequence, and a test voltage;

[0084] The chopping opening size sequence is composed of a series of changing unit chopping opening sizes, the chopping opening time sequence is composed of a series of chopping unit opening times, and the test fan state sequence is composed of a series of changing unit test fan states.

[0085] Furthermore, the chopping test program determination module 55 determines the unit chopping turn-on size CDUTY that matches the test power use case through the following algorithm:

[0086] CDUTY=(resistance applied at that moment*CDUTYmax) / Pmax

[0087] Where CDUTY represents the unit chopper turn-on size, CDUTYmax represents the maximum turn-on signal output by the chopper cabinet, and Pmax represents the maximum resistance applied power of each test resistor.

[0088] In one embodiment, the chopping on time is matched with the unit chopping on size, and both follow a pulse width modulation mechanism.

[0089] In one embodiment, before performing a test to obtain a test result of the resistor to be tested, the test execution module 57 is further configured to:

[0090] After connecting the main circuit and the control circuit, the lower limit of the power supply voltage is used as the input of the chopper cabinet, and the chopper test program is loaded through the matching resistance test equipment to verify the correctness of the data in the chopper test program.

[0091] Furthermore, the test execution module 57 is also configured to calculate the target test voltage of the resistor to be tested based on the sample resistance value and the maximum resistance applied power in the test power use case, so that the power simulated by the opening signal of the chopper cabinet when it is fully open is the maximum resistance applied power of the resistor to be tested.

[0092] In one embodiment, the test execution module 57 is specifically configured to adjust the power supply voltage according to the target test voltage, and use a matching resistance test device to load the verified chopping test program to perform the test.

[0093] In the resistance test system for simulating resistance working conditions based on spectrum power data provided by the embodiment of the present invention, each module or unit structure can operate independently or in combination according to the test requirements to achieve corresponding technical effects.

[0094] It should be understood that the embodiments disclosed herein are not limited to the specific structures, processing steps, or materials disclosed herein, but should extend to equivalent substitutions of these features understood by those skilled in the relevant art. It should also be understood that the terminology used herein is for the purpose of describing specific embodiments only and is not intended to be limiting.

[0095] The phrase "one embodiment" mentioned in the specification means that a particular feature, structure, or characteristic described in conjunction with the embodiment is included in at least one embodiment of the present invention. Therefore, the phrase "one embodiment" appearing in various places throughout the specification does not necessarily refer to the same embodiment.

[0096] Although the embodiments disclosed herein are as described above, the contents described herein are merely embodiments for facilitating understanding of the present invention and are not intended to limit the present invention. Any person skilled in the art may make any modifications and variations in the form and details of the embodiments without departing from the spirit and scope of the present invention. However, the scope of patent protection of the present invention shall remain subject to the scope defined by the appended claims.

Claims

1. A resistance test method based on spectrum power data to simulate resistance working conditions, characterized in that: The method comprises Step S1: matching the corresponding on-vehicle working type based on the resistance properties of each test resistor, and selecting multiple power path spectrum working conditions applicable to each test resistor according to the on-vehicle working type; Step S2: Generate a test power case for each test resistor based on the resistor operating status data corresponding to each power spectrum operating condition, wherein the test power case includes the real-time resistor applied power, vehicle operating speed, and fan switch status data of the tested resistor under each power spectrum operating condition; Step S3: generating a chopping test program that matches the data in each test power case; Step S4: selecting a corresponding chopping test program according to the resistance properties of the resistor to be tested, and using a matching resistance test device to load the chopping test program to perform a test to obtain a test result of the resistor to be tested; In step S1, when a new type of resistor or a resistor that has not appeared in the test process appears, the corresponding power spectrum operating condition is selected based on the resistance properties and working type of the resistor to update the original power spectrum operating condition; In step S3, the chopping test program includes a chopping opening size sequence, a chopping opening time sequence, a test fan state sequence and a test voltage; The chopping opening size sequence is composed of a series of changing unit chopping opening sizes, the chopping opening time sequence is composed of a series of chopping unit opening times, and the test fan state sequence is composed of a series of changing unit test fan states. The unit chopping turn-on size CDUTY that matches the test power use case is determined by the following algorithm: CDUTY = (resistor applied power at the corresponding moment of chopper unit on-time * CDUTYmax) / Pmax Where CDUTY represents the unit chopper switching size, CDUTYmax represents the maximum switching signal output by the chopper cabinet, and Pmax represents the maximum resistance applied power of the resistor to be tested.

2. The method according to claim 1, characterized in that In step S3, the chopping on time and the unit chopping on size are matched and set, and both follow the pulse width modulation mechanism.

3. The method according to claim 1, characterized in that In step S4, before performing a test to obtain the test result of the resistor to be tested, the following steps are included: After connecting the main circuit and the control circuit, the lower limit of the power supply voltage is used as the input of the chopper cabinet, and the chopper test program is loaded through the matching resistance test equipment to verify the correctness of the data in the chopper test program.

4. The method according to claim 1 or 3, characterized in that Step S4 also includes: calculating the target test voltage of the resistor to be tested based on the sample resistance value of the resistor to be tested and the maximum resistance applied power in the test power use case, so that the power simulated when the chopper cabinet is fully opened is the maximum resistance applied power of the resistor to be tested.

5. The method according to claim 4, characterized in that The power supply voltage is adjusted according to the target test voltage, and the chopping test program after verification is loaded using a matching resistance test device to perform the test.

6. The method according to claim 1, characterized in that An infrared camera is used to measure the temperature data of the resistor to be tested during the test.

7. A storage medium, characterized in that: The storage medium stores program code that can implement the method according to any one of claims 1 to 6.

8. A resistance test system for simulating resistance working conditions based on spectrum power data, characterized in that: The system comprises: A working condition data selection module is configured to match the corresponding vehicle working type based on the resistance properties of each test resistor, and select multiple power path spectrum working conditions applicable to each test resistor according to the vehicle working type; A power use case generation module is configured to generate a test power use case for each test resistor based on the resistor operating status data corresponding to each power spectrum operating condition. The test power use case includes the real-time resistor applied power, vehicle operating speed, and fan switch status data of the tested resistor under each power spectrum operating condition. a chopping test program determination module configured to generate a chopping test program that matches data in each test power case; A test execution module is configured to select a corresponding chopping test program according to the resistance properties of the resistor to be tested, and load the chopping test program using a matching resistance test device to perform a test to obtain a test result of the resistor to be tested; The chopping test program determination module sets the chopping test program to include a chopping opening size sequence, a chopping opening time sequence, a test fan state sequence and a test voltage; The chopping opening size sequence is composed of a series of changing unit chopping opening sizes, the chopping opening time sequence is composed of a series of chopping unit opening times, and the test fan state sequence is composed of a series of changing unit test fan states. The chopping test program determination module determines the unit chopping turn-on size CDUTY that matches the test power use case through the following algorithm: CDUTY = (resistor applied power at the corresponding moment of chopper unit on-time * CDUTYmax) / Pmax Where CDUTY represents the unit chopper switching size, CDUTYmax represents the maximum switching signal output by the chopper cabinet, and Pmax represents the maximum resistance applied power of the resistor to be tested.

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