Method and system for generating a merged b-scan
By generating merged B-scan views and automatically selecting and correlating representative ultrasonic responses, the inefficient defect screening problem in existing technologies is solved, achieving more efficient and accurate defect identification, significantly saving time, especially in complex weld inspections.
Patent Information
- Application Number
- CN202080068362.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Priority Date
- 2020-08-20
- Filing Date
- 2020-09-28
- Publication Date
- 2025-10-24
- Estimated Expiration
- 2040-09-28
AI Technical Summary
Existing phased array ultrasonic testing technology is inefficient in the defect screening process. Analysts need to switch repeatedly between multiple S-scan angles and B-scan images, which results in high time consumption and easy omission or incorrect characterization of defects.
By generating a single merged B-scan view, incorporating the principle of acoustic reciprocity, representative ultrasound responses are automatically selected and correlated, providing a holistic view to improve screening efficiency and accuracy.
The time of the screening process is significantly reduced, and the accuracy of defect identification is improved. In particular, it saves about one-half to one-third of the time in complex weld inspection and reduces the false detection rate.
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Figure CN114450603B_ABST
Abstract
Description
[0001] CLAIM OF PRIORITY
[0002] This application claims the benefit of priority to U.S. Provisional Patent Application Serial No. 62 / 907,836, filed September 30, 2019, and U.S. Patent Application Serial No. 16 / 998,198, filed August 20, 2020, the entire contents of which are hereby incorporated by reference herein. TECHNICAL FIELD
[0003] This application relates to ultrasonic testing. BACKGROUND
[0004] Phased array ultrasonic testing (PAUT) is an advanced non-destructive testing technique that uses an ultrasonic testing (UT) probe array composed of many small elements, each of which is individually pulsed by computer-calculated timing, and PAUT can be used to test more complex geometries that are difficult and much slower to test with a single probe. PAUT can be used to test almost any material that has been tested using traditional UT methods (e.g., weld testing, crack testing, and corrosion monitoring), and can be used in a wide range of industries, including aerospace, power generation, petrochemical, metal billet and pipe suppliers, pipeline construction and maintenance, structural metals, and general manufacturing.
[0005] PAUT has several advantages over other forms of UT: (i) PAUT can be performed more quickly than other forms of UT; (ii) it can be easily used for repeated scans due to its high repeatability; (iii) by sequentially firing beams at different angles, PAUT is able to create detailed and accurate cross-sections of a part; and (iv) it is particularly useful in situations where space for mechanical scanning is small, as PAUT testing is able to scan beams without moving the probe. The workflow for PAUT testing of a target (e.g., a weld) can be broken down into three main steps: screening (e.g., finding indications and defects), characterization (e.g., defect sizing and identification), and reporting (e.g., putting the measurements related to the defects together and making a judgment). While the actual PAUT scan can be performed quickly, the workflow can be quite time-consuming. SUMMARY
[0006] Examples described herein relate to methods, systems, and computer program products for performing assisted ultrasonic testing defect screening. The method includes analyzing a plurality of ultrasonic responses corresponding to a specified scan axis position and a specified ultrasonic axis position. For a plurality of respective scan axis-ultrasonic axis positions, a selected ultrasonic response is selected that represents the ultrasonic responses for the scan axis-ultrasonic axis position. The selected ultrasonic responses can then be correlated (e.g., merged or otherwise correlated) for use in ultrasonic testing defect screening.
[0007] Examples described herein relate to a method for ultrasonic detection defect screening, comprising: receiving scan data for different scan axis positions and ultrasound axis positions, the scan data including a plurality of ultrasound responses for each of a plurality of intersecting scan axis-ultrasound axis positions; selecting, for each of the plurality of intersecting scan axis-ultrasound axis positions, a representative ultrasound response from the plurality of ultrasound responses for the respective scan axis-ultrasound axis position; and merging the selected ultrasound responses for the plurality of intersecting scan axis-ultrasound axis positions to generate an image. BRIEF DESCRIPTION OF DRAWINGS
[0008] The subject matter herein can be better understood by reference to the following description taken in connection with the accompanying drawings. The figures are not intended to be exhaustive or to limit the scope of the claims included herein to the precise details shown. For the purpose of clarity, not every element is labeled in every figure. The figures are not necessarily drawn to scale and emphasis is instead placed on illustrating the principles of the embodiments, principles and concepts underlying the present disclosure. Thus, the features of the present disclosure will become more fully apparent from the following description, the appended claims, and the accompanying figures, in which:
[0009] Figure 1 is a block diagram illustrating a system for ultrasonic detection defect screening, in accordance with example embodiments of the present subject matter;
[0010] Figure 2 is a flow diagram illustrating a method of ultrasonic detection defect screening, in accordance with example embodiments of the present subject matter;
[0011] Figures 3A to 3D is an annotated B-scan image generated by a system for ultrasonic detection defect screening, in accordance with example embodiments of the present subject matter;
[0012] Figure 4 is a block diagram illustrating an apparatus for ultrasonic detection defect screening, in accordance with example embodiments of the present subject matter; and
[0013] Figure 5 is an illustration of example embodiments of the present subject matter for ultrasonic detection defect screening, embodied in a machine-readable medium. DETAILED DESCRIPTION
[0014] Phased array ultrasonic detection (PAUT) detection data (e.g., indications) often includes geometric echoes, which can complicate the search for true defect echoes. In practice, detection analysts face a challenging task that includes balancing in their performance. There can be a tradeoff between the detection workload and the thoroughness of the detection performed by a single analyst.
[0015] Screening detection data (e.g., looking for indications and defect scanning is a complex process that typically involves analysts manually searching for defects in a dynamic and iterative manner. For example, an analyst can select an angle in an S-scan (fan scan) which then displays a corresponding B-scan in which the analyst can screen for indications that can be defects rather than simple geometries. However, the data available to the analyst can be limited to the selected S-scan angle and B-scan location. The analyst can then iterate through the angles to screen for indications in the corresponding B-scan images. Through this repetitive process, the analyst remembers or records the locations of indications for cross-referencing between angles to determine whether the indication is a defect or, for example, a weld geometry. This process typically involves a large number of repetitive motions back and forth between various angles in the S-scan and concentrated comparison of the corresponding B-scan images. This can be a challenging aspect of the screening process in which the analyst strives to ensure screening for defects without unnecessarily including non-defect indications.
[0016] Example embodiments of the present subject matter improve the efficiency of the screening process by providing a single consolidated B-scan view to aid in identifying indications, thereby eliminating the need to repeatedly switch back and forth (e.g., scan) between various S-scan angles and their corresponding B-scan images. Thus, example embodiments of the present subject matter provide savings in terms of reducing the time involved in the screening process and improve accuracy by reducing the likelihood of missed or mischaracterized indications. It is expected that the savings will be on the order of tenths or tenths of tenths for welds with difficult screening characteristics.
[0017] Figure 1 is a block diagram illustrating a system 100 for ultrasonic detection defect screening in accordance with example embodiments of the present subject matter. A typical ultrasonic detection system 100 includes several functional units, such as a processor 110, a pulse generator 115, a receiver 145, a probe (e.g., transducer) 125, and a display device 150. As Figure 1As shown, the system 100 includes an instrument 105 having a processor 110, a pulse generator 115, a receiver 145, a display 150, and a memory 155. The pulse generator 115 can generate high voltage electrical pulses. Under the control of the processor 110 and driven by a trigger 120 from the pulse generator 115, a probe 125 generates high frequency ultrasonic energy. The acoustic energy is introduced into and propagates through a target 130 material in the form of an incident wave 127. When there is a discontinuity or other indication 135 (e.g., a crack) in the wave path, a portion of the energy will be reflected back from the defect surface as a reflected wave 137. The reflected wave signal 137 is converted by the probe 125 into an electrical response signal 140 and received by the receiver 145, which can convert the response signal 140 into scan data 140' (e.g., A-scan data and scan axis position data). The processor 110 can then receive the scan data 140' for analysis. In some implementations, the scan data 140' is analyzed in real-time using the display 150 as it is received from the probe 125, and in other implementations, the scan data 140' can be stored to the memory 155 for offline analysis using the instrument display 150 or an external computer (not shown).
[0018] Figure 1 The remainder of the description can be described in connection with Figure 2 , Figure 2 is a flowchart illustrating a method of ultrasonic detection defect screening according to an example implementation of the present subject matter. As shown, example implementations of the present subject matter help the analyst identify indications by providing a single consolidated B-scan 195 view (e.g., which can be produced on the instrument display 150 or an external display (not shown) of an external computer), thereby improving the efficiency of the screening process. Figure 1
[0019] To generate a merged B-scan 195, an example embodiment of the present subject matter receives and analyzes scan data 140' for a scan axis position 180 and an ultrasonic axis position 185 (step 210). The scan axis may refer to a common axis shared by the probe 125 and the target 130 (e.g., the component being inspected) along an inspection path (e.g., the path of the probe 125 traversing the target 130). For example, for weld inspection, the scan axis may be defined as an axis parallel to the long axis of the weld line, wherein the scan axis defines the inspection path of the probe. The ultrasonic axis may refer to a direction of propagation along which ultrasonic waves (e.g., incident waves 127 and reflected waves 137) propagate, for example, represented as rays extending toward or from echogenic features within the inspected target 130. For each intersecting corresponding scan axis-ultrasonic axis position 187, the processor 110 selects a representative ultrasonic response 190 that represents the ultrasonic response for the scan axis-ultrasonic axis position 185 (step 220). In other words, as Figure 1 As shown, at a scan axis position 180, there are multiple data points available at each ultrasound axis position 185 for each corresponding step angle 175 that defines the angular range of the S-scan 170 (e.g., a subset of the A-scan data for the ultrasound axis position in each corresponding B-scan within the angular range of the S-scan 170). Example embodiments of the present subject matter analyze the subset of available A-scan 160 data for the ultrasound axis position for each step angle 175 and select a representative subset of the A-scan 160 data to represent the scan axis-ultrasound axis position 187 of the S-scan within the angular range of the S-scan 170.
[0020] The example embodiments of the present subject matter then correlate the selected ultrasonic responses for ultrasonic inspection defect screening (step 230). Having analyzed the corresponding A-scans for each step angle 175 within the angular range of the S-scan 170 for each scan-axis-ultrasonic axis position 187, the example embodiments of the present subject matter have selected a subset of the A-scan 160 data for each ultrasonic axis position as a representative ultrasonic response 190 for each scan-axis-ultrasonic axis position 187 in the plurality of B-scans 165 and the plurality of S-scans 170. This collection of the selected subsets of A-scan data (e.g., the correlated ultrasonic responses) is referred to as a merged B-scan 195 and, similar to conventional B-scans in the B-scans 165, can be plotted in both the ultrasonic axis and the scan axis. Those skilled in the art will appreciate that, when presented to an analyst or operator for ultrasonic inspection defect screening, the merged B-scan 195 provides a summary view of the plurality of S-scans 170 for scan-axis positions based on the selection criteria to simplify screening.
[0021] In certain embodiments of the present subject matter, to select a representative A-scan for the scan-axis-ultrasound-axis location, the processor 110 can perform operations on the set of A-scans 160 for the scan angle range of the S-scan 170 for the scan-axis-ultrasound-axis location 187, such as operations on the A-scan amplitude values or on the magnitudes of such values. In other embodiments of the present subject matter, to select a representative A-scan for the scan-axis-ultrasound-axis location, the processor 110 can select the maximum amplitude value from the plurality of A-scans 160 for the scan angle range of the S-scan 170 for the scan-axis-ultrasound-axis location 187. The processor 110 can then compile the selected A-scans 160 with the maximum amplitude value for each scan-axis-ultrasound-axis location and merge them to generate the merged B-scan 195.
[0022] It will be appreciated by those of ordinary skill in the art that example embodiments of the present subject matter can be applied not only to sectorial scanning, but also to linear scanning, compound scanning, and other electronic scanning techniques now known in the art and hereafter discovered.
[0023] Figures 3A to 3D is an annotated B-scan image generated by a system for ultrasonic detection of defects screening according to an example embodiment of the present subject matter. As shown, example embodiments of the present subject matter display real defects alongside weld geometry echoes in a single picture without the need to dynamically search for them by selecting various S-scan angles. Thus, the analyst can have an immediate overall view of the weld (or portions thereof). Figures 3A to 3D
[0024] Another advantage provided by example embodiments of the present subject matter is that the sharpness of the merged B-scan image and the resolution of each point enables pre-characterization, as some defect types also appear to have specific features or patterns from direct signals and mode converted signals (e.g., lack of penetration, embedded defects, heat-affected zone cracks, outside and inside diameter surface cracks, centerline cracks, toe cracks). Thus, by employing example embodiments of the present subject matter, a skilled operator can inspect the merged B-scan and be aided in characterizing the indications shown in the merged B-scan image.
[0025] Further, straightening can be applied to the merged B-scan described herein. Some B-scan images can include a weld geometry artifact at which a drift can be observed. The drift is typically caused by a mechanical offset error or varying weld geometry at the time of scanning, or a combination of both. Regardless, the drift can be compensated for by straightening the weld geometry signal. To compensate for the drift, an indication (e.g., a weld) in the merged B-scan can be detected, and then the indication is straightened to remove the drift. Straightening can be implemented using a time-of-flight correction to straighten the weld geometry artifact and correct for the drift seen in the B-scan image.
[0026] Figure 4 is a block diagram of an example implementation apparatus 405 for acquiring phased array ultrasound detection data utilizing the principle of acoustic reciprocity according to example implementations of the present subject matter. The apparatus 405 can be part of the system 400 and includes a memory 410 storing program logic 415, a processor 420 for executing processes 425, and a communication I / O interface 430 connected via a bus 435. The example apparatus 405 is discussed for illustrative purposes only and should not be construed as limiting to the implementations or scope of the present disclosure. In some cases, some apparatuses can be added to or removed from the computer system 400 based on the particular situation.
[0027] The processes can be implemented in a computer program executing on programmable computing machines / computers, each comprising a processor, a storage medium readable by the processor (including volatile and non-volatile memory and / or storage elements), at least one input device, and one or more output devices. Program code can be applied to data entered using the input device to perform the processes and generate output information. The storage 410 can include machine readable media on which are stored sets or sequences of instructions describing procedures and functions to be implemented by any one or more of the techniques or functions described herein.
[0028] In some implementations, the system can be implemented by one or more programmable processors executing one or more computer programs to perform the functions of the system. In some other implementations, all or part of the system can be implemented as special-purpose logic circuitry (e.g., an application-specific integrated circuit (ASIC) and / or a field-programmable gate array (FPGA)). In some other implementations, all or part of the system can be implemented using the following electronic hardware circuitry that includes electronic devices such as at least one of a processor, a memory, a programmable logic device, or a logic gate.
[0029] In one implementation, the methods described herein are not limited to the specific examples described. In another implementation, any of the method steps can instead be reordered, combined or removed as desired, or performed in parallel or serially, to achieve the results described above.
[0030] In some implementations, the system can be implemented at least in part by a computer program product (for example, in a non-transitory machine-readable storage medium such as a non-transitory computer-readable medium) that is executed by, or controls the operation of, data processing apparatus (for example, a programmable processor, a computer, or multiple computers). In some implementations, each such program can be implemented in a high-level procedural or object-oriented programming language to communicate with a computer system. However, in some other implementations, the programs can be implemented in assembly or machine language. In some implementations, the language can be a compiled or interpreted language, and it can be deployed in any form, including as a stand-alone program or as a module, component, subroutine, or other unit suitable for use in a computing environment. In some other implementations, the computer program can be deployed to perform on a single computer or multiple computers that are located at one site or distributed across multiple sites and are interconnected by a communication network.
[0031] The methods and apparatus of the present disclosure can take the form of program code (i.e., instructions) embodied in tangible, non-transitory media (e.g., a floppy disk, a CD-ROM, a hard drive, a random access or read-only memory, or any other machine-readable storage medium). When the program code is loaded into and executed by a machine, such as a computer, the machine becomes an apparatus for practicing the example of the subject matter. When implemented on a general-purpose processor, the program code combines with the processor to provide a unique apparatus that operates like specific logic circuits. Thus, a general-purpose digital machine can be transformed into a specific digital machine. In some other implementations, the non-transitory machine-readable medium can include, without limitation, a hard disk drive, a compact disk, a flash memory, a nonvolatile memory, a volatile memory, a magnetic disk, and the like, but not a transitory signal per se. Figure 4 When the program code is loaded into and executed by a machine, such as a computer, the machine becomes an apparatus for practicing the example of the subject matter. When implemented on a general-purpose processor, the program code combines with the processor to provide a unique apparatus that operates like specific logic circuits. Thus, a general-purpose digital machine can be transformed into a specific digital machine. In some other implementations, the non-transitory machine-readable medium can include, without limitation, a hard disk drive, a compact disk, a flash memory, a nonvolatile memory, a volatile memory, a magnetic disk, and the like, but not a transitory signal per se.
[0032] The term "machine-readable medium" or "machine-readable storage medium" may include any medium that can store, encode, or carry instructions for execution by a machine and that causes the machine to perform any one or more of the techniques of this disclosure, or any medium that can store, encode, or carry data structures used by or associated with such instructions. Non-limiting examples of machine-readable media may include solid-state memory and optical and magnetic media. Thus, a machine-readable medium is not a transient propagating signal. Specific examples of mass-capacity machine-readable media may include: non-volatile memory, such as semiconductor memory devices (e.g., electrically programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM)) and flash memory devices; magnetic or other phase-change or state-change memory circuits; magnetic disks, such as internal hard disks and removable disks; magneto-optical disks; and CD-ROM and DVD-ROM disks.
[0033] Figure 5 5 is a block diagram of a computer program product 500 including program logic 555 encoded as computer-executable code on a computer-readable medium 560, the computer-executable code configured to acquire phased array ultrasonic inspection data utilizing the acoustic reciprocity principle according to an exemplary embodiment of the present subject matter. The logic for performing the method can be implemented as part of the aforementioned system useful for performing the method described with reference to the illustrated embodiment. In one embodiment, the program logic 555 can be loaded into a memory and executed by a processor. In another embodiment, the program logic 555 can also be the same program logic 555 on a computer-readable medium.
[0034] Although the foregoing examples have been described in some detail for the purpose of clear understanding, it is obvious that certain changes and modifications can be put into practice within the scope of the appended claims. The scope of the present invention is limited only by the claims, and the present invention includes many alternatives, modifications and equivalents. Many specific details have been set forth in the above description in order to provide a thorough understanding of the present invention. These details are provided for the purpose of example, and the present invention can be practiced according to the claims without some or all of these specific details. For the sake of clarity, technical materials known in the technical field related to the present invention are not described in detail so that the present invention will not be unnecessarily obscured. Therefore, the above implementation is considered to be illustrative rather than restrictive, and the present invention is not limited to the details given herein, but can be modified within the scope of the appended claims and their equivalents.
[0035] Various implementations of the disclosure have been described in reference to the drawing figures. It can be understood that these example implementations are only meant to be illustrative and are not intended to limit the scope of the disclosure in any way. It is therefore noted that numerous modifications and substitutions can readily occur to those skilled in the art, which can be made in the light of the aforegoing description without departing from the scope of the disclosure as claimed. It is also noted that the foregoing description is only meant to be illustrative and is not meant to limit the scope of the disclosure in any way. Based on the foregoing description, those skilled in the art can conceive of alternative implementations having the structures and methods disclosed herein, and such alternative implementations can be used without departing from the principles of the disclosure claimed in the present disclosure.
[0036] It can be noted that the flowcharts and block diagrams in the drawings can illustrate devices, methods, and architectures, functions and operations that can be performed by a computer program product in accordance with various implementations of the present disclosure. In this regard, each block in the flowcharts or block diagrams can represent a module, a program segment, or a portion of code, which can include one or more executable instructions for performing the specified logical function. It should also be noted that in some alternative implementations, the functions represented by the blocks can occur in an order other than that shown in the figures. For example, two blocks shown in succession can in some cases be executed substantially in parallel, or sometimes in reverse order, depending on the functions involved. It should also be noted that each block in the block diagrams or flowcharts and combinations of blocks can be implemented by a dedicated, hardware-based system for performing the specified functions or operations, or by a combination of special-purpose hardware and computer instructions.
[0037] The terms "comprise", "comprising", their derivatives, and similar expressions are to be understood in an open-ended manner, i.e., "comprising but not limited to". The term "based on" means "based at least in part on", the term "one embodiment" means "at least one embodiment", and the term "another embodiment" means "at least one other embodiment". Related definitions of other terms are provided.
[0038] In this document, the terms“a” or“an” are used, as is common in patent documents, to include one or more than one, independent of any other instances or usages of“at least one” or“one or more.” In this document, the term“or” is used to refer to a nonexclusive or, such that“A or B” includes“A but not B,”“B but not A,” and“A and B,” unless otherwise indicated. In this document, the terms“including” and“in which” are used as the plain-English equivalents of the respective terms“comprising” and“wherein.” Also, in the following claims, the terms“including” and“comprising” are open-ended, that is, a system, device, article, composition, formulation, or process that includes elements in addition to those listed after such a term in a claim are still deemed to fall within the scope of that claim. Moreover, in the following claims, the terms“first,”“second,” and“third,” etc. are used merely as labels, and are not intended to impose numerical requirements on their objects.
[0039] Method examples described herein can be machine or computer- implemented at least in part. Some examples can include a computer-readable medium or machine-readable medium encoded with instructions operable to configure an electronic device to perform methods as described in the above examples. An implementation of such methods can include code, such as microcode, assembly language code, a higher-level language code, or the like. Such code can include computer readable instructions for performing various methods. The code can form portions of computer program products. Additionally, in an example, the code can be tangibly embodied on one or more volatile or non-volatile, tangible computer-readable media. Examples of these tangible computer-readable media can include, but are not limited to, hard disks, removable magnetic disks, removable optical disks (e.g., compact disks and digital video disks), magnetic cassettes, memory cards or sticks, random access memories (RAMs), read only memories (ROMs), and the like.
[0040] The above description is intended to be illustrative, and not restrictive. For example, the above-described examples (or one or more aspects thereof) can be used in combination with each other. Other implementations can be utilized, such as by one of ordinary skill in the art having the benefit of the above description. The Abstract is provided to allow a quick determination of the technical field of the disclosure. The Abstract is submitted with the understanding that it will not be used to interpret or limit the scope or meaning of the claims. Also, in the above Detailed Description, various features can be grouped together or described in a single implementation for the purpose of streamlining the disclosure. This should not be interpreted as intending that an unclaimed disclosure cannot be made claim to multiple implementations. Rather, inventive subject matter can be implemented in a single claim or as multiple, separate claims. The recitation of multiple implementations within a single claim should not be interpreted as requiring the grant of multiple patent rights. The scope of the application should be determined with reference to the appended claims, along with the full scope of equivalents to which such claims are entitled.
Claims
1. A method for ultrasonic defect screening, comprising: receiving scan data for different scan-axis positions and ultrasound-axis positions, the scan data including a plurality of ultrasound responses for each of a plurality of intersecting scan-axis-ultrasound-axis positions; for each of the plurality of intersecting scan-axis-ultrasound-axis positions, selecting a representative ultrasound response having a maximum amplitude value from a plurality of ultrasound responses for the corresponding scan-axis-ultrasound-axis position; combining representative ultrasound responses selected for the plurality of intersecting scan-axis-ultrasound-axis positions to generate an image; detecting a geometry of the weld in the image; as well as The geometry of the weld is straightened to remove drift in the image.
2. The method of claim 1, wherein, The plurality of ultrasound responses for each of the plurality of intersecting scan-axis-ultrasound axis positions include a plurality of A-scans for a scan angle range in an S-scan for the corresponding scan-axis-ultrasound axis position.
3. The method according to claim 1, further comprising: The image is displayed, wherein the image is a merged B-scan image.
4. The method of claim 1, wherein, Receiving the scan data includes retrieving the scan data from a memory.
5. The method of claim 1, wherein, Selecting the representative ultrasound response includes performing an operation on a plurality of ultrasound responses for corresponding scan-axis-ultrasound-axis positions.
6. A system comprising: one or more processors of the machine; as well as a memory storing instructions that, when executed by the one or more processors, cause the machine to perform operations comprising: receiving scan data for different scan-axis positions and ultrasound-axis positions, the scan data including a plurality of ultrasound responses for each of a plurality of intersecting scan-axis-ultrasound-axis positions; for each of the plurality of intersecting scan-axis-ultrasound-axis positions, selecting a representative ultrasound response having a maximum amplitude value from a plurality of ultrasound responses for the corresponding scan-axis-ultrasound-axis position; combining representative ultrasound responses selected from the plurality of intersecting scan axis-ultrasound axis positions to generate an image; detecting the geometry of the weld in the image; and The geometry of the weld is straightened to remove drift in the image.
7. The system of claim 6, wherein, The plurality of ultrasound responses for each of the plurality of intersecting scan-axis-ultrasound axis positions include a plurality of A-scans for a scan angle range in an S-scan for the corresponding scan-axis-ultrasound axis position.
8. The system according to claim 6, further comprising: A display device for displaying the image, wherein the image is a merged B-scan image.
9. The system according to claim 6, further comprising: An ultrasound probe is used to capture the scan data.
10. The system of claim 6, wherein, Selecting the representative ultrasound response includes performing an operation on a plurality of ultrasound responses for corresponding scan-axis-ultrasound-axis positions.
11. A machine-readable storage medium, which, when executed by a machine, causes the machine to perform operations comprising: receiving scan data for different scan-axis positions and ultrasound-axis positions, the scan data including a plurality of ultrasound responses for each of a plurality of intersecting scan-axis-ultrasound-axis positions; selecting, for each of the plurality of intersecting scan axis-ultrasound axis locations, a representative ultrasound response from the plurality of ultrasound responses for the respective scan axis-ultrasound axis location having a largest magnitude value; combining the representative ultrasound responses selected for the plurality of intersecting scan axis-ultrasound axis locations to generate an image; detecting a geometry of a weld in the image; and straightening the geometry of the weld to remove drift in the image.
12. The machine-readable storage medium of claim 11, wherein, The plurality of ultrasound responses for each of the plurality of intersecting scan axis-ultrasound axis locations includes a plurality of A-scans for a range of scan angles in an S-scan for the respective scan axis-ultrasound axis location.
13. The machine-readable storage medium of claim 11, further comprising: displaying the image, wherein the image is a combined B-scan image.
14. The machine-readable storage medium of claim 11, wherein, Receiving the scan data includes retrieving the scan data from a memory.
15. The machine-readable storage medium of claim 11, wherein, Selecting the representative ultrasound response includes performing an operation on the plurality of ultrasound responses for the respective scan axis-ultrasound axis location.
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