Temperature measurement method without calibration using extended lens of infrared temperature measurement equipment

Abstract

The present invention provides a calibration-free temperature measurement method for an infrared temperature measurement device with an extended lens, comprising the following steps: S1, measuring the RAW data of a corresponding high-temperature black body under a standard lens and an extended lens respectively under the same response rate of the infrared temperature measurement device; S2, calculating the ratio of the RAW data of the corresponding high-temperature black body under the standard lens and the extended lens as the lens attenuation coefficient; S3, compensating the temperature measurement parameters, shutter correction parameters, and lens correction parameters in the original RAW data correction formula according to the lens attenuation coefficient; S4, correcting the RAW data of the measured target using the RAW data correction formula corresponding to the compensation of the temperature measurement parameters, shutter correction parameters, and lens correction parameters; S5, obtaining the temperature corresponding to the target according to the corrected RAW data. The present invention only requires one measurement for one extended lens, does not require each device and extended lens to be adapted separately, reduces workload, and improves customer experience.

Description

Technical Field

[0001] The invention belongs to the technical field of infrared temperature measurement, and in particular relates to a calibration-free temperature measurement method for an infrared temperature measurement device with an extended lens. Background Art

[0002] As the application fields of infrared temperature measurement equipment continue to expand, the demand for adding extension lenses with different focal lengths to infrared temperature measurement equipment has increased. Currently, the commonly used types of extension lenses are wide-angle lenses, telephoto lenses, and medium-telephoto lenses. After adding the extension lenses, due to the influence of lens attenuation and equipment temperature rise, the original temperature measurement parameters of the standard lens will not be able to meet the temperature measurement accuracy. The current common practice is to readjust the response rate, calibrate the blackbody, and calculate the temperature measurement parameters.

[0003] After adding the extended lens, the response rate parameters need to be readjusted and the blackbody at all temperature points within the temperature measurement range needs to be calibrated. This leads to the following problems:

[0004] 1) Re-adjust the response rate and black body calibration, and add production processes;

[0005] 2) Recalibration requires storing more temperature measurement parameters and temperature measurement curves, which consumes device memory;

[0006] 3) For customers who have purchased infrared temperature measurement equipment, if they purchase an extended lens, considering the inconsistency between the equipment and the lens, customers are required to send the equipment back for recalibration.

[0007] Therefore, it is necessary to propose a calibration-free temperature measurement method for an infrared temperature measurement device with an extended lens. Summary of the invention

[0008] In order to solve at least some of the above problems existing in the prior art, the present invention provides a calibration-free temperature measurement method for an infrared temperature measurement device with an extended lens.

[0009] The present invention is achieved in that:

[0010] The present invention provides a calibration-free temperature measurement method for an infrared temperature measurement device using an extended lens, comprising the following steps:

[0011] S1. Under the same response rate of the infrared temperature measuring equipment, measure the RAW data of the corresponding high-temperature black body under the standard lens and the extended lens respectively;

[0012] S2, calculating the ratio of the RAW data of the corresponding high-temperature black body under the standard lens and the extended lens as the lens attenuation coefficient;

[0013] S3, compensating the temperature measurement parameter, shutter correction parameter, and lens correction parameter in the original RAW data correction formula according to the lens attenuation coefficient;

[0014] S4, correcting the RAW data of the measured target using a RAW data correction formula corresponding to the compensation of the temperature measurement parameters, the shutter correction parameters, and the lens correction parameters;

[0015] S5. Obtain the temperature corresponding to the target according to the corrected RAW data.

[0016] Furthermore, in step S1, the RAW data is measured after the infrared temperature measuring device is started and operated for at least one hour.

[0017] Furthermore, in the step S1, multiple groups of RAW data corresponding to different blackbody temperatures under the standard lens and the extended lens are measured; in the step S2, the ratio of the RAW data under the standard lens and the extended lens in each group of RAW data is calculated, and the average value is taken as the lens attenuation coefficient.

[0018] Furthermore, the RAW data is specifically Y16 data, and the measurement method of the Y16 data is as follows:

[0019] The detector of the infrared temperature measuring device receives the radiation flux, and after passing through the signal processing circuit, the original AD data is obtained, and the Y16 data is obtained after the non-uniformity correction is performed on the original AD data.

[0020] Furthermore, the formula for performing non-uniformity correction on the original AD data is as follows:

[0021] Y 16 =K·(XB)

[0022] Among them, K is the detector non-uniformity coefficient, X is the original AD data output by the signal processing circuit in real time, and B is the original AD data output when the scene observed by the infrared temperature measurement device is a uniform surface.

[0023] Furthermore, the original RAW data correction formula in step S3 is as follows:

[0024] Y 16_correct1 =KF·(Y 16 +ΔY shutter +ΔY len +Y shutter )+b

[0025] ΔY shutter =K 2 ΔT shutter

[0026] ΔY len =K4·ΔT len

[0027] Among them, Y 16_correctis the Y16 data obtained after the correction formula of the original RAW data, KF and b are the original temperature measurement parameters, K2 is the original shutter correction parameter, K4 is the original lens correction parameter, ΔT shutter is the temperature change of the shutter, ΔT len is the temperature change of the lens, Y shutter It is the Y16 data corresponding to the shutter.

[0028] Furthermore, in step S3, the temperature measurement parameters, shutter correction parameters, and lens correction parameters are compensated as follows:

[0029] KF'=KF / γ

[0030] K2'=K2

[0031] K4'=K4

[0032] b'=b

[0033] Among them, KF and b are original temperature measurement parameters, K2 is original shutter correction parameter, K4 is original lens correction parameter, γ is lens attenuation coefficient, KF' and b' are compensated temperature measurement parameters, K2' is compensated shutter correction parameter, and K4' is compensated lens correction parameter.

[0034] Furthermore, in step S5, obtaining the temperature corresponding to the target according to the corrected RAW data specifically includes:

[0035] The temperature corresponding to the target is obtained according to the corrected RAW data and a calibration curve corresponding to the RAW data and the temperature acquired in advance.

[0036] Compared with the prior art, the present invention has the following beneficial effects:

[0037] The infrared temperature measuring device extended lens calibration-free temperature measuring method provided by the present invention calculates the ratio of the RAW data of the corresponding high-temperature black body under the standard lens and the extended lens as the lens attenuation coefficient, and compensates the temperature measurement parameters, shutter correction parameters, and lens correction parameters in the original RAW data correction formula according to the lens attenuation coefficient, thereby obtaining the RAW data of the measured target and further obtaining the temperature of the measured target. Compared with the traditional method of re-adjusting the response rate and black body calibration, the temperature measurement accuracy can reach 3°C or ±3%, and an extended lens only needs to be measured once to adapt the extended lens to any device of the same model, without the need for separate adaptation of each device and the extended lens, thereby reducing workload and improving customer experience. BRIEF DESCRIPTION OF THE DRAWINGS

[0038] Figure 1 A flowchart of a calibration-free temperature measurement method for an infrared temperature measurement device with an extended lens is provided in an embodiment of the present invention. DETAILED DESCRIPTION

[0039] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0040] like Figure 1 As shown, an embodiment of the present invention provides a calibration-free temperature measurement method for an infrared temperature measurement device with an extended lens, comprising the following steps:

[0041] S1. Under the same response rate of the infrared temperature measuring equipment, measure the RAW data of the corresponding high-temperature black body under the standard lens and the extended lens respectively.

[0042] During the operation of the infrared temperature measuring device, the internal temperature of the device continues to rise due to the heat generated by the components. In this embodiment, in order to avoid the influence of the device temperature rise on the measurement data, the RAW data is measured after the infrared temperature measuring device is turned on and operated for at least one hour and the internal temperature is stabilized.

[0043] In this embodiment, the RAW data is specifically Y16 data, and in other embodiments, it may also be other RAW data, such as Y8 data. The measurement method of the Y16 data is as follows:

[0044] The detector of the infrared temperature measuring equipment receives the radiation flux, and after the signal processing circuit, the original AD data is obtained. Due to the inconsistency of the response output of each detection unit in the detector array, a unique response non-uniformity is caused, so non-uniformity correction is required. After the non-uniformity correction of the original AD data, Y16 data is obtained. The corrected Y16 data is used to indicate the strength of the target radiation flux. The correction formula is as follows:

[0045] Y 16 =K·(XB)

[0046] Among them, K is the detector non-uniformity coefficient, which can be collected manually. The non-uniformity coefficient of each detector is different. X is the original AD data output by the signal processing circuit in real time. B is the original AD data output when the scene observed by the infrared temperature measurement device is a uniform surface.

[0047] Preferably, in step S1, multiple groups of RAW data corresponding to different blackbody temperatures under a standard lens and an additional extended lens are measured, so that the subsequent calculation of the lens attenuation coefficient is more accurate.

[0048] S2. Calculate the ratio of the RAW data of the corresponding high-temperature black body under the standard lens and the extended lens as the lens attenuation coefficient. The calculation formula is as follows:

[0049] γ=Y 16_2 / Y 16_1 (1)

[0050] where Y 16_1 It represents the Y16 data of high temperature black body measured under standard lens, Y 16_2 It represents the Y16 data of the high temperature black body measured with the extension lens, and γ is the lens attenuation coefficient.

[0051] In this embodiment, after the device is run for 1 hour, multiple groups of Y16 data corresponding to different black body temperatures under the standard lens and the wide-angle lens are measured, and the ratio of the Y16 data under the standard lens and the wide-angle lens in each group of Y16 data is calculated as the attenuation coefficient of each group of Y16 data. The specific measured Y16 data and the calculated attenuation coefficient data are shown in the following table:

[0052]

[0053] It can be seen that after the equipment has been running for 1 hour, the temperature rise of the equipment is basically stable, the blackbody temperature is in the range of 100℃~800℃, the variance of the lens attenuation coefficient calculated according to Y16 is small, and the consistency is good. The attenuation coefficient of the lens is calculated by taking the average value of the attenuation coefficient of each group of Y16 data, which makes the calculation result of the lens attenuation coefficient more accurate.

[0054] S3. Compensating the temperature measurement parameter, shutter correction parameter, and lens correction parameter in the original RAW data correction formula according to the lens attenuation coefficient.

[0055] In this embodiment, the original RAW data correction formula is as follows:

[0056]

[0057] Among them, Y 16_correct1 is the Y16 data obtained after the correction formula of the original RAW data, KF and b are the original temperature measurement parameters, where KF is the temperature measurement coefficient, b is the temperature measurement constant, K2 is the original shutter correction parameter, K4 is the original lens correction parameter, ΔT shutter is the temperature change of the shutter, ΔT len is the temperature change of the lens, ΔY shutter is the Y16 compensation corresponding to the temperature change of the shutter, ΔY len Y is the Y16 compensation corresponding to the temperature change of the lens, shutter It is the Y16 data corresponding to the shutter.

[0058] In this embodiment, after adding the extended lens, the temperature measurement parameter, shutter correction parameter, and lens correction parameter in the original RAW data correction formula are compensated according to the lens attenuation coefficient as follows:

[0059] KF'=KF / γ

[0060] K2'=K2

[0061] K4'=K4

[0062] b'=b

[0063] Among them, KF and b are original temperature measurement parameters, K2 is original shutter correction parameter, K4 is original lens correction parameter, γ is lens attenuation coefficient, KF' and b' are compensated temperature measurement parameters, K2' is compensated shutter correction parameter, and K4' is compensated lens correction parameter.

[0064] The corresponding RAW data correction formula after compensating the temperature measurement parameters, shutter correction parameters, and lens correction parameters is as follows:

[0065] Y 16_correct2 =KF'·(Y' 16 +ΔY' shutter +ΔY' len +Y' shutter )+b'

[0066] ΔY' shutter =K' 2 ·ΔT' shutter

[0067] ΔY' len =K4'·ΔT' len

[0068] Among them, Y 16_correct2 is the Y16 data obtained after correction by the compensated RAW data correction formula, KF' and b' are the compensated temperature measurement parameters, K2' is the compensated shutter correction parameter, and K4' is the compensated lens correction parameter.

[0069] Since the lens attenuation coefficient after adding the extension lens is γ,

[0070] Y' 16 =Y 16 γ

[0071] ΔY' shutter =ΔY shutter γ

[0072] ΔY' len =ΔY len γ

[0073] Y'shutter =Y shutter γ

[0074] Also because

[0075] KF'=KF / γ

[0076] K2'=K2

[0077] K4'=K4

[0078] b'=b

[0079] Then 'Y 16_correct1 =Y 16_correct2 , which ensures that the temperature measurement results of the equipment before and after the extension lens are added are consistent.

[0080] S4. Correcting the RAW data of the measured target using a RAW data correction formula corresponding to the compensation of the temperature measurement parameters, the shutter correction parameters, and the lens correction parameters.

[0081] S5. Obtain the temperature corresponding to the target according to the corrected RAW data.

[0082] In this embodiment, the temperature corresponding to the target is obtained according to the corrected Y16 data and the calibration curve corresponding to the Y16 data and the temperature obtained in advance.

[0083] The method for obtaining the calibration curve corresponding to the Y16 data and the temperature is as follows: using a certain number of black bodies, setting different temperature points, collecting the Y16 corresponding to the different temperature points, and obtaining a calibration curve with Y16 as the horizontal coordinate and the target temperature as the vertical coordinate.

[0084] Using the extended lens temperature measurement parameters and shutter and lens barrel correction parameters obtained in this embodiment, the extended lens was mounted on three devices respectively, and the temperature of the black body at 20°C to 800°C was measured. The measurement results are shown in the following table:

[0085]

[0086]

[0087] The above temperature measurement results show that the calibration-free temperature measurement method for the extended lens only needs to complete the Y16 measurement of the standard lens and the extended lens on one device to obtain the corresponding temperature measurement parameters and shutter and barrel correction parameters, and achieve a temperature measurement accuracy of ±3°C or ±3% on different devices.

[0088] To summarize, the calibration-free temperature measurement method for the extended lens of an infrared temperature measurement device provided in an embodiment of the present invention calculates the ratio of the RAW data of the corresponding high-temperature blackbody under the standard lens and the extended lens as the lens attenuation coefficient, and compensates the temperature measurement parameters, shutter correction parameters, and lens correction parameters in the original RAW data correction formula according to the lens attenuation coefficient, thereby obtaining the RAW data of the measured target and further obtaining the temperature of the measured target. Compared with the traditional method of re-adjusting the response rate and blackbody calibration, the temperature measurement accuracy can reach 3°C or ±3%, and an extended lens only needs to be measured once to adapt the extended lens to any device of the same model, without the need for separate adaptation of each device and the extended lens, thereby reducing workload and improving customer experience.

[0089] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims

1. A calibration-free temperature measurement method for an infrared temperature measurement device with an extended lens, characterized in that: The following steps are involved: S1. Under the same response rate of the infrared temperature measuring equipment, measure the RAW data of the corresponding high-temperature black body under the standard lens and the extended lens respectively; S2, calculating the ratio of the RAW data of the corresponding high-temperature black body under the standard lens and the extended lens as the lens attenuation coefficient; S3, compensating the temperature measurement parameter, shutter correction parameter, and lens correction parameter in the original RAW data correction formula according to the lens attenuation coefficient; S4, correcting the RAW data of the measured target using a RAW data correction formula corresponding to the compensation of the temperature measurement parameters, the shutter correction parameters, and the lens correction parameters; S5. Obtain the temperature corresponding to the target according to the corrected RAW data.

2. The calibration-free temperature measurement method for infrared temperature measurement equipment with extended lens as claimed in claim 1, characterized in that: In step S1, the RAW data is measured after the infrared temperature measuring device is started and operated for at least one hour.

3. The calibration-free temperature measurement method for infrared temperature measurement equipment with extended lens as claimed in claim 1, characterized in that: In the step S1, multiple groups of RAW data corresponding to different blackbody temperatures under the standard lens and the extended lens are measured; in the step S2, the ratio of the RAW data under the standard lens and the extended lens in each group of RAW data is calculated, and the average value is taken as the lens attenuation coefficient.

4. The infrared temperature measurement device extended lens calibration-free temperature measurement method according to claim 1, characterized in that: The RAW data is specifically Y16 data, and the measurement method of the Y16 data is as follows: The detector of the infrared temperature measuring device receives the radiation flux, and after passing through the signal processing circuit, the original AD data is obtained, and the Y16 data is obtained after the non-uniformity correction is performed on the original AD data.

5. The infrared temperature measurement device extended lens calibration-free temperature measurement method according to claim 4, characterized in that: The formula for performing non-uniformity correction on the original AD data is as follows: Y 16 =K·(X-B) Among them, K is the detector non-uniformity coefficient, X is the original AD data output by the signal processing circuit in real time, and B is the original AD data output when the scene observed by the infrared temperature measurement device is a uniform surface.

6. The calibration-free temperature measurement method for infrared temperature measurement equipment with extended lens as claimed in claim 4, characterized in that: The original RAW data correction formula in step S3 is as follows: Y 16_correct1 =KF·(Y 16 +ΔY shutter +ΔY len +Y shutter )+b ΔY shutter =K2·ΔT shutter ΔY len =K4·ΔT len Among them, Y 16_correct1 is the Y16 data obtained after the correction formula of the original RAW data, KF and b are the original temperature measurement parameters, K2 is the original shutter correction parameter, K4 is the original lens correction parameter, ΔT shutter is the temperature change of the shutter, ΔT len is the temperature change of the lens, Y shutter It is the Y16 data corresponding to the shutter.

7. The calibration-free temperature measurement method for infrared temperature measurement equipment with extended lens as claimed in claim 6, characterized in that: In step S3, the temperature measurement parameters, shutter correction parameters, and lens correction parameters are compensated as follows: KF'=KF / γ K2'=K2 K4'=K4 b'=b Among them, KF and b are original temperature measurement parameters, K2 is original shutter correction parameter, K4 is original lens correction parameter, γ is lens attenuation coefficient, KF' and b' are compensated temperature measurement parameters, K2' is compensated shutter correction parameter, and K4' is compensated lens correction parameter.

8. The calibration-free temperature measurement method for infrared temperature measurement equipment with extended lens as claimed in claim 1, characterized in that: The step S5 in which the temperature corresponding to the target is obtained according to the corrected RAW data specifically includes: The temperature corresponding to the target is obtained according to the corrected RAW data and a calibration curve corresponding to the RAW data and the temperature acquired in advance.

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