Scanning data processing method and device, computer device and storage medium

Abstract

This application relates to a scanning data processing method, apparatus, computer device, and storage medium. The method includes: locating the center position of a reference block in a test strip on a scanning curve in a test strip scanning data graph; locating an initial center position of the test block in the scanning curve based on the center position of the reference block and a preset interval between the reference block and a test block in the test strip; determining the rising edge and falling edge of the test block within a preset width on both sides of the initial center position in the scanning curve; and locating the center position of the test block based on the center position between the rising edge and the falling edge of the test block. This solution can improve the accuracy of scanning data processing.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of computer, in particular to a scanning data processing method and device, computer equipment and storage medium. BACKGROUND

[0002] With the development of science and technology, advanced detection means can play a significant role in many fields. Among them, test paper is one of the important detection tools. Usually, related analysis can be carried out based on the scanning data graph of test paper, and in many cases, the scanning data center of the color block in the test paper needs to be positioned based on the scanning data graph.

[0003] In the traditional method, the position of the reference block is set in advance, and the preset interval between the reference block and the color block is set in advance, so that the scanning data center of the color block (i.e. the center position of the scanning data corresponding to the color block) is positioned in the scanning data graph according to the preset position of the reference block and the preset interval. However, the above processing is only applicable to the scanning data graph in the standard case. In actual processing, there are often many reasons for deviation (such as color block position deviation in test paper or deviation caused by test paper use operation), so that the scanning data graph actually scanned is greatly deviated from the scanning data graph scanned in the standard case. Therefore, if the traditional method is still used to position the center position of the scanning data of the color block in the scanning data graph, it will be very inaccurate. SUMMARY

[0004] Therefore, it is necessary to provide a scanning data processing method, device, computer equipment and storage medium capable of improving the accuracy of scanning data processing in view of the above technical problems.

[0005] A scanning data processing method, the method comprising:

[0006] positioning the center position of the reference block in the test paper on the scanning curve in the test paper scanning data graph;

[0007] positioning the initial center position of the test block in the scanning curve according to the center position of the reference block and the preset interval between the reference block and the test block in the test paper;

[0008] determining the rising edge of the test block and the falling edge of the test block within the preset width on both sides of the initial center position in the scanning curve;

[0009] positioning the center position of the test block according to the center position between the rising edge of the test block and the falling edge of the test block.

[0010] In one of the embodiments, the positioning of the center position of the reference block in the test paper on the scanning curve in the test paper scanning data graph comprises:

[0011] Locate the preset center position of the reference block in the test strip on the scanning curve in the test strip scan data graph;

[0012] In the scanning curve, the rising edge and falling edge of the reference block located within a preset width on both sides of the preset center position are determined;

[0013] The center position of the reference block is located based on the center position between the rising edge and the falling edge of the reference block.

[0014] In one embodiment, locating the center position of the reference block based on the center position between the rising edge and the falling edge of the reference block includes:

[0015] Positions at the same height are selected on the rising edge and the falling edge of the reference block, respectively.

[0016] The point on the scan curve where the centers of two selected locations at the same height are located is determined as the center position of the reference block on the scan curve.

[0017] In one embodiment, the test strip scan data graph includes multiple scan curves, and the different scan curves are obtained by scanning the test strip at different wavelengths;

[0018] The step of locating the center position of the reference block based on the center position between the rising edge and the falling edge of the reference block includes:

[0019] The center position of the reference block on each scan curve is determined based on the center position between the rising edge and the falling edge of the reference block on each scan curve.

[0020] The final center position of the reference block is determined based on the center position of the reference block on each scan curve.

[0021] In one embodiment, locating the initial center position of the test block in the scanning curve based on the center position of the reference block and the preset interval between the reference block and the test block in the test strip includes:

[0022] Based on the center position of the reference block and the preset interval between the reference block and the test blocks in the test strip, the initial center position of at least some of the test blocks in the test strip is located in the scanning curve;

[0023] Based on the preset interval between test blocks and the initial center position of the already located test blocks, locate the initial center position of the remaining test blocks to be located in the scan curve.

[0024] In one embodiment, determining the rising edge and falling edge of the test block within a preset width on both sides of the initial center position in the scanning curve includes:

[0025] For each test block, on the scanning curve, curves of preset width are selected on both sides of the initial center position of the test block, and the sum of the widths of the curves selected on both sides is greater than the width of a single test block.

[0026] Based on the slope change of the selected curve, the rising edge and falling edge of the test block located within the preset width are determined in the scanning curve.

[0027] In one embodiment, locating the center position of the test block based on the center position between the rising edge and the falling edge of the test block includes:

[0028] Based on the rising edge and falling edge of the test block, determine whether the curve type corresponding to the test block on the scanning curve is peak-shaped or valley-shaped.

[0029] Based on the curve type, which is either peak-shaped or valley-shaped, select equal height points on the rising edge and falling edge of the test block, respectively.

[0030] The center position of the test block on the scanning curve is determined based on the center points of the two selected contour points.

[0031] In one embodiment, the method further includes:

[0032] The reasonableness of the interval between the center positions of adjacent test blocks obtained from the positioning is checked;

[0033] Remove the center position of the test block that failed the test;

[0034] Based on the center position of the test block that passed the test and the preset interval between the test blocks, the test block after the position was removed is repositioned.

[0035] A scanning data processing apparatus, comprising:

[0036] The positioning module is used to locate the center position of the reference block in the test strip on the scanning curve in the test strip scanning data graph; and to locate the initial center position of the test block in the scanning curve according to the center position of the reference block and the preset interval between the reference block and the test block in the test strip.

[0037] The positioning and correction module is used to determine the rising edge and falling edge of the test block within a preset width on both sides of the initial center position in the scanning curve; and to locate the center position of the test block according to the center position between the rising edge and the falling edge of the test block.

[0038] A computer device includes a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to implement the steps of the scanning data processing method of various embodiments of this application.

[0039] A computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the steps of the scan data processing methods in the embodiments of this application.

[0040] The aforementioned scanning data processing method, apparatus, computer equipment, and storage medium can locate the center position of a reference block on the scanning curve of the test strip scanning data graph. Then, based on the center position of the reference block and the preset interval between the reference block and the test block in the test strip, the initial center position of the test block is located on the scanning curve, i.e., preliminary positioning of the test block is performed. In the scanning curve, the rising and falling edges of the test block within a preset width on both sides of the initial center position are determined; the center position of the test block is located based on the center position between the rising and falling edges of the test block. This is equivalent to correcting the initial center position of the test block by combining the waveform characteristics of the test block scan, thus improving the positioning accuracy of the test block. Therefore, overall, by combining the waveform characteristics of the color block scan in the test strip and accurately performing positioning processing on the scanning data graph, the accuracy of scanning data processing is improved. Attached Figure Description

[0041] Figure 1 This is an application environment diagram of a scanning data processing method in one embodiment;

[0042] Figure 2 This is a flowchart illustrating a scanning data processing method in one embodiment;

[0043] Figure 3 This is a schematic diagram of a test strip in one embodiment;

[0044] Figure 4 This is a schematic diagram of test strip scan data in one embodiment;

[0045] Figure 5 This is a schematic diagram of the rising and falling edges in one embodiment;

[0046] Figure 6 This is a schematic diagram of test strip deviation in one embodiment;

[0047] Figure 7 This is a test strip scan data image of a non-standard test strip in one embodiment;

[0048] Figure 8 This is a structural block diagram of a scanning data processing device in one embodiment;

[0049] Figure 9 This is a structural block diagram of a scanning data processing device in another embodiment;

[0050] Figure 10 This is an internal structural diagram of a computer device in one embodiment;

[0051] Figure 11 This is a diagram of the internal structure of a computer device in another embodiment. Detailed Implementation

[0052] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0053] The scanning data processing method provided in this application can be applied to, for example... Figure 1 In the application environment shown, computer device 102 can acquire the test strip scan data image 106 of test strip 104. The test strip scan data image 106 is the scan data image obtained by scanning test strip 104. The scan data processing method in this embodiment is used to locate the center position of the test block in the test strip from the test strip scan data image 106. The computer device 102 can be a terminal or a server. Figure 1 This example uses a terminal as an illustration. Terminals can be, but are not limited to, various personal computers, laptops, smartphones, tablets, and portable wearable devices. Servers can be implemented using independent servers or server clusters composed of multiple servers.

[0054] In one embodiment, such as Figure 2 As shown, a scanning data processing method is provided. This embodiment illustrates the application of this method to a computer device, which can be a terminal or a server. It is understood that this method can also be applied to a system including a terminal and a server, and implemented through interaction between the terminal and the server. In this embodiment, the method includes the following steps:

[0055] Step 202: Locate the center position of the reference block in the test strip on the scanning curve in the test strip scan data graph.

[0056] The test strip scan data image is a scanned image obtained by scanning the test strip. Test strips are a type of paper that has been impregnated with chemicals and is used to detect the presence of certain substances by observing color changes.

[0057] The test strip includes a reference block and a test block. The reference block serves as a reference when positioning the test block. It should be noted that the reference function is only one aspect of the reference block; the color block acting as the reference block can also have other functions, which are not limited here.

[0058] In one embodiment, the reference block can be a black block on the test strip. The test block is a color block on the test strip other than the black block used for detection. In other embodiments, the reference block can also be other designated color blocks on the test strip (for example, a test block can be designated as the reference block), and there is no limitation thereto.

[0059] To facilitate understanding of the test strip, reference block, and test block, we will now combine... Figure 3 Provide a illustrative illustration. Figure 3 This is a schematic diagram of a test strip in one embodiment. (Refer to...) Figure 3 Black block 302 is the reference block, and blocks 304, 306, etc., are the test blocks. It can be understood that each test block can have a different color. Figure 3 Different shades of color blocks can represent the different colors of the test blocks in the test strip.

[0060] It is understood that the test strip can be a strip, i.e., in the shape of a strip. In other embodiments, the test strip may not be limited to a strip shape, but may be other shapes. The shape of the test strip is not limited here.

[0061] A scan curve is a graph formed by scanning the test strip at a preset wavelength. It can be understood that scanning the test strip at different wavelengths will generate different scan curves. A test strip scan data graph may include at least one scan curve.

[0062] Figure 4 This is a schematic diagram of test strip scan data in one embodiment. (Refer to...) Figure 4 The test strip scanning data graph includes four scanning curves p1 to p4, which are four scanning curves obtained by scanning the test strip at four different wavelengths.

[0063] Specifically, the computer device can acquire a scan data graph of the test strip obtained by scanning the test strip. The scan data graph can include scan curves, which can be one or more (i.e., at least one). The computer device can locate the center position of the reference block in the test strip on each scan curve. "Multiple curves" refers to at least two curves.

[0064] In one embodiment, the center position of the reference block can be a preset center position of the reference block, or a center position after correction of the preset center position of the reference block. There is no limitation in this regard.

[0065] In one embodiment, the computer device can acquire a preset center position for a reference block in the test strip, and locate the preset center position of the reference block on the scan curve in the test strip scan data graph, so as to use the preset center position as the center position of the reference block. In another embodiment, after locating the preset center position of the reference block on the scan curve, the computer device can correct the preset center position to obtain the center position of the reference block.

[0066] Step 204: Based on the center position of the reference block and the preset interval between the reference block and the test block in the test strip, locate the initial center position of the test block in the scanning curve.

[0067] The initial center position of the test block is the center position determined by preliminary positioning of the test block on the scanning curve. The preset interval between the reference block and the test block in the test strip is the pre-set interval between the reference block and the test block.

[0068] In one embodiment, a preset interval between the reference block and each test block can be set in advance. Then, the initial center position of each test block can be located in the scanning curve according to the center position of the reference block and the preset interval between the reference block and each test block.

[0069] In one embodiment, a preset interval between the reference block and some test blocks, as well as a preset interval between the test blocks, can be set in advance. Thus, based on the center position of the reference block, the preset interval between the reference block and the test blocks, and the preset interval between the test blocks, the initial center position of each test block can be located in the scanning curve.

[0070] It should be noted that the "interval" mentioned in the various embodiments of this application refers to the positional interval.

[0071] It is understandable that when there are multiple scan curves, step 204 will be performed for each scan curve to locate the initial center position of each test block on each scan curve.

[0072] Step 206: In the scanning curve, determine the rising edge and falling edge of the test block within a preset width on both sides of the initial center position of the test block.

[0073] The preset width on both sides of the initial center position of the test block refers to the range on both sides of the initial center position of the test block, respectively, within the preset width of the initial center position of the test block.

[0074] The rising edge of the test block is a curve with a gradually increasing slope within a preset width on one side of the initial center position of the test block. The falling edge of the test block is a curve with a gradually decreasing slope within a preset width on one side of the initial center position of the test block. It can be understood that the rising and falling edges of the test block are portions of the scanning curve, located within preset widths on either side of the initial center position of the test block.

[0075] In one embodiment, if the preset center position of the test block in the scan curve is a trough, then the rising edge of the test block is after the test block, and the falling edge of the test block is before the test block. If the preset center position of the test block in the scan curve is a peak, then the rising edge of the test block is before the test block, and the falling edge of the test block is after the test block.

[0076] for example, Figure 5 In the diagram, test block S2 corresponds to the trough position. The rising edge of the test block is after test block S2, and the falling edge of the test block is before test block S2.

[0077] Specifically, the computer device can select a portion of a curve of a preset width on both sides of the initial center position of the test block on the scanning curve, where the sum of the widths of the selected curves on both sides is greater than the width of the test block. For each selected curve, the computer device can calculate the slope change of the selected curve, and based on the slope change, determine the rising edge and falling edge of the test block within the preset width on both sides of the initial center position of the test block. That is, the curve with a gradually increasing slope is taken as the rising edge of the test block, and the curve with a gradually decreasing slope is taken as the falling edge of the test block.

[0078] It can be understood that the initial center position of the test block can be equivalent to a local extreme point (e.g., a trough) on the scanning curve. Then, within a preset width on both sides of the initial center position of the test block, there is a curve segment, one of which is the rising edge and the other is the falling edge. Therefore, the curve with the larger slope can be selected as the rising edge of the test block, and the curve with the larger slope can be selected as the falling edge of the test block.

[0079] In one embodiment, when the test strip scan data graph includes multiple scan curves, the computer device can perform step 206 for each scan curve, that is, in each scan curve, determine the rising edge and falling edge of the test block located within a preset width on both sides of the initial center position of the test block.

[0080] Step 208: Locate the center position of the test block based on the center position between the rising edge and the falling edge of the test block.

[0081] Specifically, the computer device can locate the center position between the rising edge and the falling edge of the test block on the scan curve, and determine the center position of the test block on the scan curve based on the center position.

[0082] In one embodiment, the computer device may select a set of symmetrical points (i.e., a set of position pairs) on the rising edge and falling edge of the test block, respectively, and determine the center positions of the rising and falling edges of the test block based on the center positions of the symmetrical points. The symmetrical points may include at least one of the following: points located at the same height, and points equidistant from the initial center position of the test block. It is understood that the computer device may also select multiple sets of symmetrical points (i.e., select multiple sets of position pairs) and determine the center positions of the rising and falling edges of the test block based on the center positions of the multiple sets of symmetrical points.

[0083] In other embodiments, the computer device may also select a set of asymmetric points and determine the center positions of the rising edge and falling edge of the test block based on the height difference between the asymmetric points and the distance difference between the asymmetric points and the center position of the test block. This application does not limit the method for determining the center positions of the rising edge and falling edge of the test block.

[0084] In one embodiment, when the test strip scan data graph includes only one scan curve, the computer device can directly take the center position between the rising edge and the falling edge of the test block on the scan curve as the center position of the test block.

[0085] In one embodiment, when the test strip scan data graph includes multiple scan curves, the computer device can determine the center position of the test block on each scan curve based on the center position between the rising edge and the falling edge of the test block on each scan curve. Then, based on the center position of the test block determined on each scan curve, the final center position of the test block can be determined. For example, one final position can be selected from the center positions of the test block determined on each scan curve as the final center position of the test block. Alternatively, the center positions of the test block determined on each scan curve can be integrated to obtain the final center position of the test block.

[0086] It can be understood that locating the center position of the test block in step 208 is equivalent to correcting the initial center position of the test block by combining the waveform characteristics of the test block scan, so it is more accurate.

[0087] To more intuitively understand the effects of this application's solution, the following is combined with... Figure 4 , Figure 6 as well as Figure 7 Provide a illustrative illustration. Figure 4The scan data graphs of the standard test strip without any color block position deviation are shown at four wavelengths (i.e., test strip scan data graphs). Figure 4 The intersection of the vertical line and the scanning curve is the center position of each test block. This is understandable. Figure 4 The center position of the test block is determined using a positioning method pre-set for the standard test strip. Clearly... Figure 4 The positioning deviation of the center position of each test block is relatively small.

[0088] However, if the positioning method preset for standard test strips is used to locate the test block on non-standard test strips, significant deviations will occur. Non-standard test strips are those that deviate from the position of the standard test strip; for example, the reference block position may be incorrect. Figure 6 The middle part refers to the test strip with deviations, from... Figure 6 It is known that there are certain deviations between the black blocks (i.e. reference blocks) in several test strips. Therefore, if the positioning method specified for a certain standard test strip is still used (for example, using the preset center position of the black block as a reference and combining the preset interval to position other test blocks in turn), there will be certain deviations in the positioning of the center position of the test blocks in other test strips. Figure 7 The image in the middle is a graph of test strip scanning data obtained from scanning non-standard test strips. Figure 7 The intersection of the vertical line and the scanning curve is the center position of the test block, located using the positioning method specified for the standard test strip. Figure 7 It can be seen that the center positions of these determined test blocks have a large deviation and are very inaccurate.

[0089] The scanning data processing methods in the various embodiments of this application are precisely designed to solve the problems existing in traditional methods, such as... Figure 7 The above-described scanning data processing method addresses the issue of inaccurate data center positioning of the test block. In this method, the center position of a reference block is located on the scanning curve in the test strip scanning data graph. Then, based on the center position of the reference block and the preset interval between the reference block and the test block in the test strip, the initial center position of the test block is located on the scanning curve, i.e., preliminary positioning of the test block is performed. In the scanning curve, the rising and falling edges of the test block within a preset width on both sides of the initial center position are determined; the center position of the test block is located based on the center position between the rising and falling edges. This is equivalent to correcting the initial center position of the test block by incorporating the waveform characteristics of the test block scan, thus improving the positioning accuracy of the test block. Therefore, overall, by combining the waveform characteristics of the color block scan in the test strip and accurately performing positioning processing in the scanning data graph, the accuracy of scanning data processing is improved.

[0090] Furthermore, since the scanning data center of the color patch is located by combining the waveform characteristics of the color patch scan, if there is a failure to locate it, it indicates a problem with the scanned waveform characteristics. Problems with waveform characteristics are usually caused by incorrect test strips (e.g., using the wrong test strip or improper operation such as tilting the test strip). Therefore, test strip errors can be identified during the center position positioning process, which is something traditional methods cannot achieve by directly relying on preset center positions and preset intervals. It is understandable that after identifying test strip errors, the test strip error status can be reported to the user for automated alerts.

[0091] In one embodiment, step 202, locating the center position of the reference block in the test strip on the scanning curve of the test strip scan data graph, includes: locating a preset center position of the reference block in the test strip on the scanning curve of the test strip scan data graph; determining the rising edge and falling edge of the reference block located within a preset width on both sides of the preset center position of the reference block in the scanning curve; and locating the center position of the reference block based on the center position between the rising edge and the falling edge of the reference block.

[0092] The preset width on both sides of the preset center position of the reference block refers to the area within the preset width on both sides of the preset center position of the reference block.

[0093] The rising edge of the reference block is a curve with a gradually increasing slope within a preset width to one side of the preset center position of the reference block. The falling edge of the reference block is a curve with a gradually decreasing slope within a preset width to one side of the preset center position of the reference block. It can be understood that the rising and falling edges of the reference block are portions of the scan curve, located within preset widths on either side of the preset center position of the reference block.

[0094] In one embodiment, when the reference block is a black block, the preset center position of the black block in the scan curve belongs to the trough position. Therefore, the rising edge of the reference block is after the black block, and the falling edge of the reference block is before the black block. For example, Figure 5 In the diagram, the reference block is black block S1. The rising edge of the reference block is after black block S1, and the falling edge of the reference block is before black block S1. It can be understood that when the preset center position of the reference block in the scan curve is the peak position, then the rising edge of the reference block is before the black block, and the falling edge of the reference block is after the black block.

[0095] Specifically, the computer device can select a portion of a curve of a preset width on both sides of the preset center position of the reference block on the scanning curve, where the sum of the widths of the selected curves on both sides is greater than the width of the reference block. For each selected curve, the computer device can calculate the slope change of the curve, and determine the rising edge and falling edge of the reference block on both sides of the preset center position of the reference block based on the slope change. That is, the curve with a gradually increasing slope is taken as the rising edge of the reference block, and the curve with a gradually decreasing slope is taken as the falling edge of the reference block. The computer device can locate the center position between the rising edge and the falling edge of the reference block on the scanning curve, and determine the center position of the reference block based on this center position.

[0096] It's understandable that in the scanned data graph of the test strip, the scanned data of each color block is usually located in an extreme value region (e.g., a peak or trough). The preset center position of the reference block can be equivalent to a local extreme point (e.g., a trough) on the scan curve. Therefore, within a preset width on both sides of the preset center position of the reference block, there is a curve segment, one of which is the rising edge and the other is the falling edge. Thus, the curve with the larger slope can be selected as the rising edge of the reference block, and the curve with the larger slope can be selected as the falling edge of the reference block.

[0097] For ease of understanding, we will also use... Figure 5 For example, curves c1 and c2 are selected on both sides of the black block S1. It can be seen that the slope of c1 gradually decreases and the slope of c2 gradually increases. Therefore, the curve region where c1 is located is the falling edge of the reference block, and the curve region where c2 is located is the rising edge of the reference block.

[0098] In one embodiment, when the test strip scan data graph includes only one scan curve, the computer device can directly take the center position between the rising edge and the falling edge of the reference block on the scan curve as the center position of the reference block.

[0099] In one embodiment, when the test strip scan data graph includes multiple scan curves, the computer device can determine the rising edge and falling edge of the reference block within a preset width on both sides of the preset center position of the reference block in each scan curve, and determine the final center position of the reference block based on the center position between the rising edge and the falling edge of the reference block on each scan curve.

[0100] In the above embodiments, the preset center position of the reference block is corrected by combining the waveform characteristics of the reference block scan, which is more accurate than the preset center position.

[0101] In one embodiment, locating the center position of the reference block based on the center position between the rising edge and the falling edge of the reference block includes: selecting positions at the same height on the rising edge and the falling edge of the reference block respectively; and determining the point on the scan curve where the center of the two selected positions at the same height is located as the center position of the reference block on the scan curve.

[0102] Specifically, the computer device can select a position at the same height on both the rising edge and the falling edge of the reference block (i.e., two positions at the same height can be obtained). The computer device can determine the point on the scan curve where the center of these two selected positions at the same height is located. It can be understood that the point on the scan curve where the center of these two positions is located is equivalent to the center position between the rising edge and the falling edge of the reference block, and can be used as the center position of the reference block on the scan curve.

[0103] In the above embodiments, by taking the center point at a position of equal height, the center position of the reference block on the scanning curve can be quickly and accurately located.

[0104] In one embodiment, the test strip scan data graph includes multiple scan curves, each obtained by scanning the test strip at a different wavelength. In this embodiment, locating the center position of the reference block based on the center position between the rising and falling edges of the reference block includes: determining the center position of the reference block on each scan curve based on the center position between the rising and falling edges of the reference block on each scan curve; and obtaining the final center position of the reference block based on the center position of the reference block on each scan curve.

[0105] Specifically, the computer device can use the center position between the rising and falling edges of the reference block on each scan curve as the center position of the reference block on each scan curve. The computer device can determine the final center position of the reference block based on the center position of the reference block on each scan curve.

[0106] In one embodiment, the computer device can average the center positions of the reference blocks on each scan curve to obtain the final center position of the reference blocks.

[0107] In one embodiment, the computer device can take the arithmetic average or weighted average of the center positions of the reference blocks on each scan curve to obtain the final center position of the reference blocks. It is understood that different weights can be assigned to the scan curves corresponding to different wavelengths based on the degree of influence of wavelength on scanning accuracy, thereby performing a weighted average calculation of the center positions of the reference blocks on each scan curve to obtain the final center position of the reference blocks.

[0108] In other embodiments, the computer device may randomly select a center position from the center positions of the reference block on each scan curve, or select a center position closest to a preset center position of the reference block, as the final center position of the reference block. This application does not limit the specific implementation method for determining the final center position of the reference block based on the center positions of the reference blocks on each scan curve.

[0109] It is understandable that before determining the final center position of the reference block based on the center position of the reference block on each scan curve, the rationality of the center position of the reference block located on each scan curve can be verified. After the rationality verification is passed, the final center position of the reference block can be determined based on the center position of the reference block on each scan curve.

[0110] In one embodiment, before determining the final center position of the reference block based on the center position of the reference block on each scanning curve, at least one of the following reasonableness checks can be performed on the center position of the reference block located on each scanning curve: checking whether the center position of the reference block located on each scanning curve is within the range of the preset center position of the reference block; checking whether the deviation between the center positions of the reference blocks located on each scanning curve meets the preset deviation condition.

[0111] In one embodiment, before determining the final center position of the reference block based on the center position of the reference block on each scan curve, the method further includes a step of verifying whether the deviation between the center positions of the reference blocks located on each scan curve meets a preset deviation condition. Specifically, this includes the following steps: calculating the difference between the center positions of the reference blocks on each scan curve pairwise; if the difference between the maximum and minimum differences is within a preset range, then the final center position of the reference block is determined based on the center position of the reference block on each scan curve.

[0112] Specifically, the computer device can calculate the differences between each pair of center positions of the reference block on each defined scanning curve, obtaining multiple differences. The computer device can then select the maximum and minimum differences from these differences. The computer device can perform a second difference calculation on the maximum and minimum differences, comparing the difference between them with a preset difference. If the difference is less than the preset difference, it indicates that the deviation is within a reasonable range (i.e., it meets the preset deviation condition), and the final center position of the reference block can be determined based on its center position on each scanning curve.

[0113] It is understandable that if the deviation is greater than a preset difference, it indicates that the deviation is too large, and the step of determining the final center position of the reference block based on the center position of the reference block on each scan curve cannot be performed. In one embodiment, for cases where the deviation is greater than the preset difference, the computer device can cluster the center positions of the reference blocks on each scan curve and determine the final center position of the reference block based on the center positions of the reference blocks near the cluster center. Alternatively, the position of the cluster center can be used as the final center position of the reference block.

[0114] In the above embodiments, the final center position of the reference block can be obtained more accurately based on the center position of the reference block on each scanning curve.

[0115] In one embodiment, locating the initial center position of a test block in a scanning curve based on the center position of a reference block and a preset interval between the reference block and the test blocks in the test strip includes: locating the initial center position of at least a portion of the test blocks in the test strip in the scanning curve based on the center position of the reference block and the preset interval between the reference block and the test blocks in the test strip; and locating the initial center position of the remaining test blocks to be located in the test strip in the scanning curve based on the preset interval between the test blocks and the initial center positions of the already located test blocks.

[0116] The preset interval between the reference block and the test block is a pre-set interval between the reference block and the test block. The preset interval between the test blocks is a pre-set interval between the test blocks. The initial center position of the test block is the initial center position of the initially located test block.

[0117] It is understandable that a preset interval can be set between the reference block and some or all (i.e., at least some) of the test blocks. Then, the computer device can preliminarily predict and locate the initial center position of at least some of the test blocks in the test strip based on the center position of the reference block and the preset interval between the reference block and the test blocks in the test strip in the scanning curve.

[0118] It should be noted that the computer device also has a preset interval between test blocks. If the initial center position of all test blocks cannot be located based on the center position of the reference block and the preset interval between the reference block and the test blocks in the test strip, the initial center position of the remaining test blocks to be located can be located in the scanning curve based on the preset interval between the test blocks and the initial center positions of the already located test blocks.

[0119] In one embodiment, a preset interval between the reference block and the first test block can be pre-set. After locating the center position of the reference block, the initial center position of the first test block can be preliminarily located by combining the preset interval between the reference block and the first test block. The first test block can be the test block closest to the reference block. If the computer device pre-records the preset intervals between any two adjacent test blocks, then starting from the second test block, the current test block can be selected sequentially. Based on the preset interval between the current test block and the previous test block, and the initial center position already located for the previous test block, the initial center position of the current test block is determined. The next test block to be located is then taken as the current test block, and the process of determining the initial center position of the current test block based on the preset interval between the current test block and the previous test block, and the initial center position already located for the previous test block, continues until the initial center positions of all test blocks are located.

[0120] For example, when locating the initial center position of the second test block, the initial center position of the second test block can be determined based on the already located initial center position of the first test block and the preset interval between the first and second test blocks. Then, the third test block to be located is taken as the current test block, and the initial center position of the third test block is determined based on the already located initial center position of the third test block and the preset interval between the second and third test blocks. This process is repeated until the initial center position of the last test block is located.

[0121] It should be noted that the first test block is not limited to the test block closest to the reference block; it can be any test block.

[0122] In the above embodiments, positioning is performed step by step based on preset intervals and the initial center position of the already located test blocks. This takes into account the reasonableness of the intervals between test blocks and can improve the accuracy of the initial positioning of the test blocks.

[0123] In one embodiment, determining the rising edge and falling edge of the test block within a preset width on both sides of the initial center position in the scanning curve includes: for each test block, selecting curves of preset width on both sides of the initial center position of the test block on the scanning curve, wherein the sum of the widths of the selected curves on both sides is greater than the width of a single test block; and determining the rising edge and falling edge of the test block located within the preset width in the scanning curve based on the slope change of the selected curves.

[0124] Specifically, the computer device can select curves of preset widths on both sides of the initial center position of the test block on the scanning curve. The sum of the widths of the selected curves on both sides is greater than the width of a single test block. This selection method ensures that the combined area of ​​the curves selected on both sides of the initial center position of the test block covers and exceeds the width of the entire test block, and that the excess width on both sides is equal, thus ensuring consistency in the subsequent slope judgment benchmark.

[0125] In one embodiment, the computer device can select curves of a preset test block width on both sides, starting from the initial center position of the test block on the scanning curve. The preset test block width is a pre-defined width. It can be understood that the width of each test block is essentially consistent with the preset test block width. Therefore, selecting a curve segment on both sides according to the preset test block width is equivalent to selecting curves with a width equal to two test blocks, which is necessarily greater than the width of a single test block, thus covering and exceeding the width of a single test block. It can be understood that in other embodiments, the width of two test blocks may not be used, as long as it covers and exceeds the width of a single test block.

[0126] Furthermore, the computer device can calculate the slope of the selected curve on each side, and determine the rising edge and falling edge of the test block within a preset width on both sides of the initial center position of the test block based on the change in the slope of the selected curve on each side.

[0127] In the above embodiments, by selecting curves of preset width on both sides of the initial center position of the test block, the rising edge and falling edge of the test block can be accurately and quickly determined according to the slope changes of the curves on both sides.

[0128] In one embodiment, locating the center position of the test block based on the center position between the rising edge and the falling edge of the test block includes: determining whether the curve type corresponding to the test block on the scanning curve is peak-shaped or valley-shaped based on the rising edge and the falling edge of the test block; selecting contour points on the rising edge and the falling edge of the test block based on the peak-shaped or valley-shaped curve type; and determining the center position of the test block on the scanning curve based on the center point of the two selected contour points.

[0129] The curve type corresponding to the test block on the scan curve refers to the type of curve on the scan curve that the test block corresponds to. This can be understood as the curve type being either peak-shaped or valley-shaped. For example, the position of the test block on the scan curve can be a peak or a trough.

[0130] Specifically, for each test block, the computer device can determine the curve type corresponding to the test block on the scan curve based on the rising and falling edges of the test block. For example, it can determine whether the curve corresponding to the test block on the scan curve is peak-shaped or valley-shaped. It can be understood that if the rising edge comes first and the falling edge comes second, the curve type is peak-shaped; if the rising edge comes second and the falling edge comes first, the curve type is valley-shaped.

[0131] Furthermore, the computer device can select contour points on the rising and falling edges of the test block based on the peak or valley curve type. The computer device can then determine the center position of the test block on the scanning curve based on the corresponding points on the scanning curve where the centers of the two selected contour points are located.

[0132] In the above embodiments, the curve type corresponding to the test block on the scanning curve is determined based on the rising edge and falling edge of the test block; then, according to the curve type, contour points can be accurately and reasonably selected on the rising edge and falling edge of the test block, thereby improving the accuracy of the center position positioning of the test block on the scanning curve.

[0133] In one embodiment, selecting contour points on the rising edge and falling edge of the test block according to the peak or valley curve type includes: determining the extreme value region corresponding to the test block on the scanning curve according to the peak or valley curve type; when there are contour regions with widths that meet preset conditions on both sides of the extreme value region, selecting contour points on the curves located within the contour regions on the rising edge and falling edge of the test block respectively.

[0134] An extreme region is the area where a local extreme point is located. For example, the area corresponding to a wave crest or trough is an extreme region. A local extreme point is a point where a value is locally maximum or locally minimum.

[0135] Specifically, the computer device can determine the extreme value region corresponding to the test block that matches the curve type on the scan curve. For example, if the extreme value region corresponding to the test block is determined to be peak-shaped, the peak region corresponding to the test block can be determined on the scan curve. If the extreme value region corresponding to the test block is determined to be valley-shaped, the valley region corresponding to the test block can be determined on the scan curve.

[0136] Furthermore, the computer device can determine whether there are equal-height portions on both sides of the extreme value region targeted by the test block, thereby determining the equal-height region. The computer device can determine whether the width of the equal-height region meets preset conditions. If it does, it selects equal-height points on the curve within the equal-height region from the rising edge and falling edge of the test block, and determines the center position of the test block on the scanning curve corresponding to the two selected equal-height points as the center position of the test block on the scanning curve.

[0137] In one embodiment, the computer device can select a contour reference point from either the rising edge or the falling edge of the test block within the contour region. Then, it selects a point on the other curve that is closest to the contour reference point, thus obtaining two contour points. That is, both the rising and falling edges of the test block have a section of curve within the contour region. A contour reference point can be selected from either of these two sections, and then a point on the other curve that is closest to the contour reference point (i.e., the point with the closest height to the contour reference point) is selected, thus obtaining two contour points.

[0138] In one embodiment, after determining the extreme value region corresponding to the test block, the computer device can also detect whether the width of the extreme value region is within a preset range. If so, the equal height regions on both sides of the extreme value region are then determined.

[0139] In one embodiment, before selecting contour points on curves located within the contour region at the rising edge and falling edge of the test block, respectively, the computer device may further detect whether the width of the determined contour region is within a preset contour width range. If so, the step of selecting contour points on curves located within the contour region at the rising edge and falling edge of the test block is then executed.

[0140] In the above embodiments, based on the peak or valley curve type, the extreme value region corresponding to the test block on the scanning curve can be conveniently and accurately determined. If there are contour regions with widths that meet preset conditions on both sides of the extreme value region, it indicates that the contour regions are within a reasonable range. Therefore, selecting contour points on the curves of the rising and falling edges of the test block within the reasonable contour regions can improve the accuracy of locating the center position of the test block on the scanning curve.

[0141] In one embodiment, the method further includes: performing a spacing rationality test on the center positions of adjacent test blocks obtained from the positioning; removing the center positions of test blocks that fail the test; and repositioning the test blocks after removing the positions according to the center positions of the test blocks that pass the test and the preset interval between the test blocks.

[0142] Among them, the interval rationality detection is used to detect whether the interval between the center positions of adjacent test blocks is reasonable.

[0143] Specifically, the computer device can detect whether the interval between the center positions of adjacent test blocks obtained from the positioning is reasonable. The computer device can remove the center positions of test blocks that fail the test and retain the center positions of test blocks that pass the test. The computer device can then reposition the test blocks after removing the positions based on the center positions of the test blocks that pass the test and the preset interval between the test blocks; that is, it can reposition the center positions of the test blocks that fail the test.

[0144] In one embodiment, the computer device can calculate the interval between the center positions of adjacent test blocks that have been located, and compare it with a corresponding preset interval. If the difference between the measured interval and the preset interval is within a preset deviation range, the test is considered passed. Conversely, if the difference between the measured interval and the preset interval exceeds the preset deviation range, the test is considered failed.

[0145] In the above embodiments, the center position of the predicted test block is verified and detected, which can effectively eliminate unreasonable predicted center positions. Then, based on the reasonable predicted center position of the test block, the test block after the position is removed is repositioned, thereby improving the positioning accuracy.

[0146] It should be understood that although the steps in the flowcharts of the various embodiments of this application are shown sequentially according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless explicitly stated herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least a portion of the steps in the flowcharts of the various embodiments of this application may include multiple steps or multiple stages. These steps or stages are not necessarily completed at the same time, but can be executed at different times. The execution order of these steps or stages is not necessarily sequential, but can be performed alternately or in turn with other steps or at least a portion of steps or stages in other steps.

[0147] like Figure 8 As shown, in one embodiment, a scanning data processing apparatus is provided, the apparatus comprising: a positioning module 802 and a positioning correction module 804; wherein:

[0148] The positioning module 802 is used to locate the center position of the reference block in the test strip on the scanning curve in the test strip scanning data graph; and to locate the initial center position of the test block in the scanning curve according to the center position of the reference block and the preset interval between the reference block and the test block in the test strip.

[0149] The positioning correction module 804 is used to determine the rising edge and falling edge of the test block within a preset width on both sides of the initial center position in the scanning curve; and to locate the center position of the test block based on the center position between the rising edge and the falling edge of the test block.

[0150] In one embodiment, the positioning module 802 is further configured to locate the preset center position of the reference block in the test strip on the scanning curve of the test strip scan data graph. The positioning correction module 804 is further configured to determine the rising edge and the falling edge of the reference block located within a preset width on both sides of the preset center position in the scanning curve; and locate the center position of the reference block according to the center position between the rising edge and the falling edge of the reference block.

[0151] In one embodiment, the positioning correction module 804 is further configured to select positions at the same height on the rising edge and the falling edge of the reference block, respectively; and determine the point on the scanning curve where the center of the two selected positions at the same height is on the scanning curve as the center position of the reference block on the scanning curve.

[0152] In one embodiment, the test strip scan data graph includes multiple scan curves, and different scan curves are obtained by scanning the test strip at different wavelengths; the positioning correction module 804 is also used to determine the center position of the reference block on each scan curve based on the center position between the rising edge and the falling edge of the reference block on each scan curve; and to determine the final center position of the reference block based on the center position of the reference block on each scan curve.

[0153] In one embodiment, the positioning module 802 is further configured to locate the initial center position of at least a portion of the test blocks in the test strip in the scanning curve based on the center position of the reference block and the preset interval between the reference block and the test blocks in the test strip; and to locate the initial center position of the remaining test blocks to be positioned in the test strip in the scanning curve based on the preset interval between the test blocks and the initial center position of the already located test blocks.

[0154] In one embodiment, the positioning correction module 804 is further configured to, for each test block, select curves of preset width on both sides of the initial center position of the test block on the scanning curve, wherein the sum of the widths of the selected curves on both sides is greater than the width of a single test block; and determine the rising edge and falling edge of the test block located within the preset width in the scanning curve according to the slope change of the selected curves.

[0155] In one embodiment, the positioning correction module 804 is further configured to determine whether the curve type corresponding to the test block on the scanning curve is peak-shaped or valley-shaped based on the rising edge and falling edge of the test block; select contour points on the rising edge and falling edge of the test block respectively based on the peak-shaped or valley-shaped curve type; and determine the center position of the test block on the scanning curve based on the center point of the two selected contour points respectively.

[0156] like Figure 9 As shown, in one embodiment, the device further includes:

[0157] The detection module 806 is used to detect the reasonableness of the spacing between the center positions of adjacent test blocks obtained by positioning; and to remove the center positions of test blocks that fail the detection.

[0158] The positioning correction module 804 is also used to reposition the test block after the position is removed based on the center position of the test block that has passed the test and the preset interval between the test blocks.

[0159] Specific limitations regarding the scanning data processing device can be found in the limitations of the scanning data processing method above, and will not be repeated here. Each module in the aforementioned scanning data processing device can be implemented entirely or partially through software, hardware, or a combination thereof. These modules can be embedded in or independent of the processor in a computer device in hardware form, or stored in the memory of a computer device in software form, so that the processor can call and execute the operations corresponding to each module.

[0160] In one embodiment, a computer device is provided, which may be a server, and its internal structure diagram may be as follows: Figure 10 As shown, the computer device includes a processor, memory, and a network interface connected via a system bus. The processor provides computing and control capabilities. The memory includes a non-volatile storage medium and internal memory. The non-volatile storage medium stores the operating system and computer programs. The internal memory provides an environment for the operation of the operating system and computer programs stored in the non-volatile storage medium. The network interface is used to communicate with external terminals via a network connection. When the computer program is executed by the processor, it implements a scanning data processing method.

[0161] In one embodiment, a computer device is provided, which may be a terminal, and its internal structure diagram may be as follows: Figure 11As shown, the computer device includes a processor, memory, communication interface, display screen, and input devices connected via a system bus. The processor provides computing and control capabilities. The memory includes non-volatile storage media and internal memory. The non-volatile storage media stores the operating system and computer programs. The internal memory provides an environment for the operation of the operating system and computer programs stored in the non-volatile storage media. The communication interface is used for wired or wireless communication with external terminals; wireless communication can be achieved through Wi-Fi, carrier networks, NFC (Near Field Communication), or other technologies. When executed by the processor, the computer program implements a scanning data processing method. The display screen can be an LCD screen or an e-ink screen. The input devices can be a touch layer covering the display screen, buttons, a trackball, or a touchpad on the computer device's casing, or an external keyboard, touchpad, or mouse.

[0162] Those skilled in the art will understand that Figure 10 The structure shown in Figure 11 is merely a block diagram of a portion of the structure related to the present application and does not constitute a limitation on the computer device to which the present application is applied. A specific computer device may include more or fewer components than those shown in the figure, or combine certain components, or have different component arrangements.

[0163] In one embodiment, a computer device is also provided, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to implement the steps in the above method embodiments.

[0164] In one embodiment, a computer-readable storage medium is provided having a computer program stored thereon that, when executed by a processor, implements the steps in the above method embodiments.

[0165] Those skilled in the art will understand that all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium, and when executed, it can include the processes of the embodiments of the methods described above. Any references to memory, storage, databases, or other media used in the embodiments provided in this application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, or optical storage, etc. Volatile memory can include random access memory (RAM) or external cache memory. By way of illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM), etc.

[0166] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0167] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the invention patent. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this patent application should be determined by the appended claims.

Claims

1. A scanning data processing method, characterized in that, The method includes: On the scanning curves in the test strip scan data graph, the center position of the reference block located on each scanning curve is checked for reasonableness. When the reasonableness check is passed, the center position of the reference block in the test strip is located. The test strip scan data graph is a scan data graph obtained by scanning the test strip. The test strip scan data graph includes multiple scanning curves. The scanning curves are curves formed by scanning data obtained by scanning the test strip according to a preset wavelength. The center position of the reference block is the center position after correcting the preset center position of the reference block. The center position of the reference block is determined according to the center position of the reference block on each scanning curve. Based on the center position of the reference block and the preset interval between the reference block and the test block in the test strip, the initial center position of the test block is located in the scanning curve; For each test block, in the scanning curve, starting from the initial center position of each test block on the scanning curve, a curve with a preset test block width is selected to both sides. The slope of the selected curve on each side is calculated. Based on the change in the slope of the selected curve on each side, the rising edge and falling edge of each test block located within the preset test block width on both sides of the initial center position of each test block are determined. The center position of each test block is located based on the center position between the rising edge and the falling edge of each test block; During the process of locating the center position, after identifying the error of the test strip, the error status of the test strip is reported to the user for automated alarm.

2. The method according to claim 1, characterized in that, Locating the center position of the reference block in the test strip on the scanning curve of the test strip scanning data graph includes: Locate the preset center position of the reference block in the test strip on the scanning curve in the test strip scan data graph; In the scanning curve, the rising edge and falling edge of the reference block located within a preset width on both sides of the preset center position are determined; The center position of the reference block is located based on the center position between the rising edge and the falling edge of the reference block.

3. The method according to claim 2, characterized in that, The step of locating the center position of the reference block based on the center position between the rising edge and the falling edge of the reference block includes: Positions at the same height are selected on the rising edge and the falling edge of the reference block, respectively. The point on the scan curve where the centers of two selected locations at the same height are located is determined as the center position of the reference block on the scan curve.

4. The method according to claim 2, characterized in that, The different scanning curves are obtained by scanning the test strip at different wavelengths; The step of locating the center position of the reference block based on the center position between the rising edge and the falling edge of the reference block includes: The center position of the reference block on each scan curve is determined based on the center position between the rising edge and the falling edge of the reference block on each scan curve. The final center position of the reference block is determined based on the center position of the reference block on each scan curve.

5. The method according to claim 1, characterized in that, The step of locating the initial center position of the test block in the scanning curve based on the center position of the reference block and the preset interval between the reference block and the test block in the test strip includes: Based on the center position of the reference block and the preset interval between the reference block and the test blocks in the test strip, the initial center position of at least some of the test blocks in the test strip is located in the scanning curve; Based on the preset interval between test blocks and the initial center position of the already located test blocks, locate the initial center position of the remaining test blocks to be located in the scan curve.

6. The method according to claim 1, characterized in that, The step of locating the center position of the test block based on the center position between the rising edge and the falling edge of the test block includes: Based on the rising edge and falling edge of the test block, determine whether the curve type corresponding to the test block on the scanning curve is peak-shaped or valley-shaped. Based on the curve type of peak or valley, select equal height points on the rising edge and falling edge of the test block, respectively. The center position of the test block on the scanning curve is determined based on the center points of the two selected contour points.

7. The method according to any one of claims 1 to 6, characterized in that, The method further includes: The reasonableness of the spacing between the center positions of adjacent test blocks obtained from the positioning is checked; Remove the center position of the test block that failed the test; Based on the center position of the test block that passed the test and the preset interval between the test blocks, the test block after the position was removed is repositioned.

8. A scanning data processing apparatus, characterized in that, The device includes: The positioning module is used to verify the rationality of the center position of the reference block located on each scanning curve in the test strip scanning data graph. Once the rationality verification is passed, the center position of the reference block in the test strip is located. The test strip scanning data graph is a scanning data graph obtained by scanning the test strip, and includes multiple scanning curves. Each scanning curve is a curve formed by scanning data obtained by scanning the test strip according to a preset wavelength. The center position of the reference block is the center position after correcting the preset center position of the reference block, and the center position of the reference block is determined based on the center position of the reference block on each scanning curve. Based on the center position of the reference block and the preset interval between the reference block and the test block in the test strip, the initial center position of the test block is located in the scanning curve. The positioning and correction module is used to, for each test block, select curves of a preset test block width on both sides of the scanning curve, starting from the initial center position of each test block on the scanning curve; calculate the slope of the selected curves on each side; and determine the rising edge and falling edge of each test block within the preset test block width on both sides of the initial center position of each test block based on the change in the slope of the selected curves on each side. The module also locates the center position of each test block based on the center position between the rising edge and the falling edge of each test block. During the center position positioning process, after identifying an error in the test strip, the module reports the error status of the test strip to the user for automated alarm purposes.

9. A computer device comprising a memory and a processor, wherein the memory stores a computer program, characterized in that, When the processor executes the computer program, it implements the steps of the method according to any one of claims 1 to 7.

10. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by a processor, it implements the steps of the method according to any one of claims 1 to 7.

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