Dynamic characteristic test system for power semiconductor device
By integrating high and low voltage capacitor modules and pluggable switches into the test host, the problems of large size, high cost and low reliability of existing power semiconductor device dynamic test systems are solved, realizing efficient and low-cost dynamic characteristic testing and adapting to the needs of different packaged devices.
CN114675152BActive Publication Date: 2026-06-23SHANGHAI BEILING
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- SHANGHAI BEILING
- Filing Date
- 2020-12-24
- Publication Date
- 2026-06-23
Smart Images
Figure CN114675152B_ABST
Abstract
The application discloses a kind of power semiconductor device dynamic characteristic test system, including test host, test host integrates high-voltage capacitor module, low-voltage capacitor module, second switching unit and at least one test topology circuit;High-voltage capacitor module is used to store preset high-voltage electric energy;Low-voltage capacitor module is used to store preset low-voltage electric energy;Test topology circuit includes first switching unit and is used to access the interface of the power semiconductor device to be measured, and first switching unit is used to switch test topology circuit, so that the power semiconductor device to be measured is in different test state;Second switching unit is used to select high-voltage capacitor module or low-voltage capacitor module to supply power for test topology circuit.By high-low voltage capacitor segmentation method, the wide voltage demand is met, the supporting components are reduced by test topology circuit, the volume of test system is reduced, the efficiency of test is improved, and the safety and reliability of system are improved.
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