A method for controlling a three-dimensional model mapping array

By setting multiple array parameters and dynamically adjusting the 3D model mapping array effect, the problem of inflexible pattern control in traditional methods is solved, and small file size, high definition and rich DIY effects are achieved.

CN114677471BActive Publication Date: 2025-10-03ZHEJIANG HUINAO INFORMATION TECH CO LTD
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Patent Information

Application Number
CN202210098630.1
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2022-01-27
Publication Date
2025-10-03
Estimated Expiration
2042-01-27

AI Technical Summary

Technical Problem

The traditional 3D model mapping array method cannot flexibly control the number of repetitions, distance, rotation angle and offset of the pattern in the horizontal and vertical directions, resulting in large mapping files and low clarity, which cannot meet user DIY needs.

Method used

By setting multiple array parameters such as scaling, offset, rotation, spacing, number and symmetry, the array effect of the 3D model map can be dynamically adjusted to achieve free adjustment and independent control of the pattern in the horizontal and vertical directions.

Benefits of technology

The texture file is small and high-definition, and the array mode can be dynamically adjusted to meet user DIY needs, providing rich pattern effects such as scale-like and single-line display.

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Abstract

The present invention discloses a method for controlling a three-dimensional model mapping array, which comprises a three-dimensional model, a plurality of mappings and corresponding array parameters, wherein the array parameters are composed of a scaling parameter, an array offset parameter, a repetition parameter, a spacing parameter, an array rotation parameter, a single image rotation parameter and a single image offset parameter; each vertex data of the three-dimensional model includes UV coordinates, and the scaling parameters, array offset parameters and array rotation parameters are used to scale, rotate and translate the UV coordinates, and then selectively eliminate them according to the repetition parameter and spacing parameter, and then rotate and translate them according to the single image rotation parameter and the single image offset parameter as the coordinates sampled from the mapping for each vertex, so that the surface of the three-dimensional model presents a corresponding pattern effect. The present invention not only realizes the scaling and offset of the mapping, but also realizes the effects of mapping spacing, number of repetitions, overall rotation, single image rotation, single image offset and the like, and is particularly suitable for DIY model mapping.
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Description

Technical Field

[0001] The present invention relates to the field of three-dimensional model production and display, and in particular to a control method for a three-dimensional model mapping array mode. Background Art

[0002] The array properties of traditional 3D model textures consist of texture scaling parameters and array offset parameters, which are used to display a continuous texture in all directions. This method uses a repeated display method to reduce the size of the texture file and improve the texture's clarity. However, this method cannot control requirements such as the number of horizontal and vertical pattern repetitions, the distance between patterns, the overall rotation angle of the array, the rotation angle of a single pattern about itself, and the offset distance of a single pattern within the array grid. This requirement is very real in practical applications, especially when overlaying patterns on an existing base map. If the entire array effect is manually pre-made in other drawing software before being applied to the model, the texture file will be very large or have reduced clarity, and the array effect cannot be easily modified. Summary of the Invention

[0003] The purpose of the present invention is to provide a method for controlling a three-dimensional model mapping array, which uses multiple array setting parameters to enable the same mapping to produce a variety of array effects such as pattern size, pattern spacing, number of array rows and columns, array rotation, single image rotation, and single image offset. In addition, each parameter can be dynamically adjusted and the effect can be displayed in real time, which is particularly suitable for DIY of three-dimensional model mapping effects.

[0004] The purpose of the present invention can be achieved through the following technical solutions:

[0005] A method for controlling a three-dimensional model mapping array, used for three-dimensional model mapping, comprises several groups of maps and corresponding array parameters, wherein the array parameters include a scaling parameter, an array offset parameter, an array rotation parameter, an array number parameter, a spacing parameter, a single-image rotation parameter, and a single-image offset parameter. Each vertex data of the three-dimensional model includes UV coordinates, i.e., initial position coordinates corresponding to the vertex sampled from the map, including a horizontal x value and a vertical y value. The initial position coordinates are scaled, rotated, and translated according to the scaling parameter, array offset parameter, and array rotation parameter, and then selectively eliminated according to the array number parameter and array spacing parameter. New sampling coordinates are obtained after rotation and translation according to the single-image rotation parameter and single-image offset parameter. Color information is obtained from the corresponding position on the map according to the sampled new coordinates and displayed on the surface of the three-dimensional model, so that the surface of the three-dimensional model presents an array pattern effect according to the array parameters.

[0006] Furthermore, a symmetry-on parameter is provided, and its on states are divided into off, left-right symmetry, top-down symmetry, and left-right-top-bottom-bottom symmetry; when the symmetry-on parameter is turned on for left-right symmetry, the surface pattern of the three-dimensional model is displayed left-right symmetrically by converting the x value of the initial position coordinate; when the symmetry-on parameter is turned on for top-bottom symmetry, the surface pattern of the three-dimensional model is displayed top-bottom symmetrically by converting the y value of the initial position coordinate; when the symmetry-on parameter is turned on for left-right-top-bottom symmetry, the surface pattern of the three-dimensional model is displayed left-right-top-bottom symmetrically by converting the x value and y value of the initial position coordinate.

[0007] Furthermore, the mapping includes texture mapping and feature mapping, the color information is obtained by sampling the texture mapping, and the feature information is obtained by sampling the feature mapping, such as normal, height, metalness or smoothness. The texture mapping (21) and feature mapping in the same group are sampled with the same new sampling coordinates after conversion.

[0008] Furthermore, the spacing parameters include a horizontal spacing parameter jx and a vertical spacing parameter jy, which are used to set the horizontal spacing and vertical spacing between each pattern in the array displayed on the model surface.

[0009] Furthermore, the array number parameter includes a horizontal array number parameter rx and a vertical array number parameter ry, which are used to set the number of columns and rows of the array displayed on the model surface.

[0010] Furthermore, the single-image rotation parameters are used to set the angle at which each image in the array rotates around itself; and the array rotation parameters are used to set the angle at which the entire image array rotates around the array center; the two are used in combination to achieve array rotation while the single image rotates in the opposite direction, thereby keeping the single image from rotating for the user.

[0011] Furthermore, the scaling parameters include a horizontal scaling parameter sx and a vertical scaling parameter sy, so that each pattern of the texture is scaled and deformed in the horizontal and vertical directions respectively.

[0012] Furthermore, the array offset parameters include a horizontal array offset parameter mx and a vertical array offset parameter my, so that the entire array map is offset by a specified distance in the horizontal and vertical directions on the model surface.

[0013] Furthermore, the single image offset parameters include a horizontal single image offset parameter nx and a vertical single image offset parameter ny, so that each single image in the array is offset by a specified distance in the horizontal and vertical directions within the grid of the array.

[0014] Beneficial effects of the present invention:

[0015] 1. Compared with the traditional array method, this invention adds parameters such as pattern spacing, number of repetitions, array rotation, single image rotation and single image offset, achieving rich effects such as free adjustment of pattern spacing in the horizontal and vertical directions, free setting of array number, independent adjustment of array rotation and single image rotation, and independent offset of single image in the array grid;

[0016] 2. Compared with prefabricated array patterns, the present invention has the advantages of small texture files, high definition, and the array mode can be dynamically adjusted and displayed, which can meet the user's DIY requirements;

[0017] 3. The present invention can achieve some special effects, such as setting the pattern spacing to less than 1 to produce a scale-like superposition effect; or setting the vertical repetition number to 1 to produce an effect in which the pattern is repeated only in the horizontal direction, etc. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] The present invention will be further described below with reference to the accompanying drawings.

[0019] Figure 1 This is a schematic diagram of the calculation process of each group of mapping arrays in a method for controlling a three-dimensional model mapping array of the present invention.

[0020] Figure 2 This is an effect diagram of the model surface displayed without setting array parameters for the mapping according to an embodiment of the present invention;

[0021] Figure 3 This is an effect diagram displayed on the model surface after setting scaling parameters for a map according to an embodiment of the present invention;

[0022] Figure 4 An effect diagram displayed on the model surface after setting scaling and array offset parameters for a mapping according to an embodiment of the present invention;

[0023] Figure 5 This is an effect diagram displayed on the model surface after setting the scale, spacing, and array number of the mapping in one embodiment of the present invention;

[0024] Figure 6 for Figure 5 The effect diagram displayed on the model surface after adding array rotation parameters;

[0025] Figure 7 for Figure 5 The effect image displayed on the model surface after adding the single image rotation parameters;

[0026] Figure 8 for Figure 6 Add single image rotation parameters to perform reverse rotation and display the effect on the model surface;

[0027] Figure 9This is a diagram showing the scale-like effect of a texture displayed on a model surface when the spacing parameter is less than 1 according to an embodiment of the present invention;

[0028] Figure 10 This is a single-row effect diagram of a map displayed on a model surface when the array parameter y is 1 according to an embodiment of the present invention;

[0029] Figure 11 This is an effect diagram displayed on the model surface after setting the single image offset parameters for mapping according to an embodiment of the present invention;

[0030] Figure 12 This is a diagram showing the effect of the model surface when the texture symmetry parameter is not turned on according to an embodiment of the present invention;

[0031] Figure 13 for Figure 12 The effect displayed on the model surface after the Symmetry On parameter turns on the left-right symmetry mode. DETAILED DESCRIPTION

[0032] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making any creative efforts shall fall within the scope of protection of the present invention.

[0033] like Figures 1 to 11 As shown, the method for controlling the three-dimensional model mapping array of the present invention includes a three-dimensional model 1, a plurality of groups of mapping Figure 2 and corresponding array parameters, wherein the array parameters include scaling parameters 31, array offset parameters 32, array rotation parameters 33, array number parameters 34, spacing parameters 35, single image rotation parameters 36 and single image offset parameters 37; each vertex data of the three-dimensional model 1 includes UV coordinates, that is, the vertex is from the sticker Figure 2 The initial position coordinates 11 corresponding to the sampling include the x value in the horizontal direction and the y value in the vertical direction; after scaling, rotating, and translating the initial position coordinates 11 according to the scaling parameter 31, the array offset parameter 32, and the array rotation parameter 33, selective elimination is performed according to the array number parameter 34 and the array spacing parameter 35, and then rotation and translation are performed according to the single image rotation parameter 36 and the single image offset parameter 37 to obtain new sampling coordinates, and the new sampling coordinates are obtained from the patch according to the sampling new coordinates. Figure 2 The color information obtained at the corresponding position is displayed on the surface of the three-dimensional model 1, so that the surface of the three-dimensional model 1 presents an array pattern effect according to the array parameters.

[0034] like Figure 12 and Figure 13As shown, there is also a symmetry opening parameter, and its opening state is divided into off, left-right symmetry, top-down symmetry, and left-right and top-down symmetry; when the symmetry parameter is turned on for left-right symmetry, the x value of the initial position coordinate 11 is converted to make the surface pattern of the three-dimensional model 1 symmetrical on the left and right; when the symmetry parameter is turned on for top-down symmetry, the y value of the initial position coordinate 11 is converted to make the surface pattern of the three-dimensional model 1 symmetrical on the top and bottom; when the symmetry parameter is turned on for left-right and top-down symmetry, both the x value and the y value of the initial position coordinate 11 are converted to make the surface pattern of the three-dimensional model 1 symmetrical on the left and right and top-down. Figure 12 The effect diagram of the model surface is shown when the symmetry parameter is not turned on. Figure 13 for Figure 12 The effect displayed on the model surface after turning on the bilateral symmetry mode.

[0035] like Figure 1 As shown, the sticker Figure 2 It includes a texture map 21 and a feature map 22. The texture map 21 samples color information, and the feature map 22 samples feature information such as normal, height, metalness or smoothness. The texture map 21 and the feature map 22 in the same group sample the same converted new sampling coordinates.

[0036] like Figure 3 、 Figure 5 and Figure 9 As shown, the spacing parameters 35 include a horizontal spacing parameter jx and a vertical spacing parameter jy, which can set the horizontal spacing and vertical spacing between each pattern in the array displayed on the model surface; Figure 3 This shows the effect of patterns being close together when the spacing is equal to 1. Figure 5 This shows the effect of pattern sparseness when the spacing is greater than 1. Figure 9 Shows the scaly effect exhibited by a spacing parameter less than 1.

[0037] like Figure 5 and Figure 10 As shown, the array number parameter 34 includes a horizontal array number parameter rx and a vertical array number parameter ry, which can set the number of columns and rows of the array displayed on the model surface; Figure 10 It shows the effect of the pattern being displayed in a single row when the number of vertical arrays is 1.

[0038] like Figure 6 As shown, the single image rotation parameter 36 is used to set the angle at which each image in the array rotates around itself; Figure 7 As shown, the array rotation parameter 33 is used to set the angle of rotation of the entire mapping array around the array center; Figure 8As shown, the combination of the two can also realize array rotation while the single image is reversely rotated, thereby maintaining the effect of the single image remaining unchanged for the user.

[0039] like Figure 2 、 Figure 3 As shown, the scaling parameter 31 includes a horizontal scaling parameter sx and a vertical scaling parameter sy, which can make each pattern of the map scaled and deformed in the horizontal and vertical directions respectively; Figure 2 Shows the effect of the pattern when the scaling parameter is 1.

[0040] like Figure 4 As shown, the array offset parameter 32 includes a horizontal array offset parameter mx and a vertical array offset parameter my, which causes the entire array map to be offset by a specified distance in the horizontal and vertical directions on the model surface.

[0041] like Figure 11 As shown, the single image offset parameter 37 includes a horizontal single image offset parameter nx and a vertical single image offset parameter ny, which causes each single image in the array to be offset by a specified distance in the horizontal and vertical directions within the grid of the array.

[0042] Compared with the existing technology, the method for controlling the three-dimensional model mapping array described in the present invention adds parameters such as pattern spacing, number of repetitions, array rotation, single image rotation and single image offset, and realizes rich effects such as free adjustment of pattern spacing in the horizontal and vertical directions, free setting of array number, independent adjustment of array rotation and single image rotation, and independent offset of single images in the array grid. It also has the advantages of small mapping file size, high clarity, dynamic adjustment of array mode and display, and can meet user DIY requirements.

[0043] The present invention is described in this specification only for some preferred embodiments and is not intended to be limiting. Those skilled in the art may, based on the concepts and spirit of the present invention, add functions such as cropping, deformation, and color change to the stickers, and such functions shall still fall within the scope of protection of the present invention.

Claims

1. A method for controlling a three-dimensional model mapping array, for mapping a three-dimensional model (1), comprising a plurality of groups of mappings (2) and corresponding array parameters (3), characterized in that: The array parameters include a scaling parameter (31), an array offset parameter (32), an array rotation parameter (33), an array number parameter (34), a spacing parameter (35), a single image rotation parameter (36) and a single image offset parameter (37); each vertex data of the three-dimensional model (1) includes UV coordinates, that is, the initial position coordinates (11) corresponding to the vertex sampled from the texture (2), including the x value in the horizontal direction and the y value in the vertical direction; after scaling, rotating and translating the initial position coordinates (11) according to the scaling parameter (31), the array offset parameter (32) and the array rotation parameter (33), selectively eliminating them according to the array number parameter (34) and the array spacing parameter (35), and then rotating and translating them according to the single image rotation parameter (36) and the single image offset parameter (37) to obtain new sampling coordinates (12), and obtaining color information from the corresponding position on the texture (2) according to the sampled new coordinates and displaying it on the surface of the three-dimensional model (1), so that the surface of the three-dimensional model (1) presents the pattern effect of the array according to the array parameters; A symmetry opening parameter is also provided, and its opening states are divided into non-opening, left-right symmetry, top-bottom symmetry, and left-right and top-bottom symmetry; when the symmetry opening parameter is turned on for left-right symmetry, the surface pattern of the three-dimensional model (1) is displayed in a left-right symmetric manner by converting the x value of the initial position coordinate (11); when the symmetry opening parameter is turned on for top-bottom symmetry, the surface pattern of the three-dimensional model (1) is displayed in a top-bottom symmetric manner by converting the y value of the initial position coordinate (11); when the symmetry opening parameter is turned on for left-right and top-bottom symmetry, the surface pattern of the three-dimensional model (1) is displayed in a left-right and top-bottom symmetry by converting both the x value and the y value of the initial position coordinate (11); The map (2) includes a texture map (21) and a feature map (22). The texture map (21) is sampled to obtain color information, and the feature map (22) is sampled to obtain feature information such as normal, height, metalness or smoothness. The texture map (21) and the feature map (22) in the same group sample the same converted new sampling coordinates.

2. The method for controlling a three-dimensional model mapping array according to claim 1, wherein: The spacing parameters (35) include a horizontal spacing parameter jx and a vertical spacing parameter jy, which are used to set the horizontal spacing and vertical spacing between each pattern in the array displayed on the model surface.

3. The method for controlling a three-dimensional model mapping array according to claim 1, wherein: The array number parameter (34) includes a horizontal array number parameter rx and a vertical array number parameter ry, which are used to set the number of columns and rows of the array displayed on the model surface.

4. The method for controlling a three-dimensional model mapping array according to claim 1, wherein: The single image rotation parameter (36) is used to set the angle at which each image in the array rotates around itself; and the array rotation parameter (33) is used to set the angle at which the entire image array rotates around the array center; the two are used together to achieve array rotation while the single image rotates in the opposite direction, thereby keeping the single image from rotating for the user.

5. The method for controlling a three-dimensional model mapping array according to claim 1, wherein: The scaling parameters (31) include a horizontal scaling parameter sx and a vertical scaling parameter sy, so that each pattern of the map is scaled and deformed in the horizontal and vertical directions respectively.

6. The method for controlling a three-dimensional model mapping array according to claim 1, wherein: The array offset parameter (32) includes a horizontal array offset parameter mx and a vertical array offset parameter my, which causes the entire array map to be offset by a specified distance in the horizontal and vertical directions on the model surface.

7. The method for controlling a three-dimensional model mapping array according to claim 1, wherein: The single image offset parameters (37) include a horizontal single image offset parameter nx and a vertical single image offset parameter ny, which cause each single image in the array to be offset by a specified distance in the horizontal and vertical directions within the grid of the array.