A rapid detection method of wide-spectrum high-cut-off filter

Abstract

The application discloses a rapid detection method of high-spectrum-range high-cut-off filter, a to-be-detected sample is installed on a detection platform, a light source emits composite light of a wide spectrum, the composite light passes through a collimating light path and then passes through the to-be-detected sample, the composite light enters a fiber spectrometer in a reflection or transmission mode, the fiber spectrometer can perform spectroscopic detection on the composite light and obtain data of different wavelengths of the composite light. The detection method can be used for batch rapid and accurate detection of high-cut-off depth filters greater than OD4, is simple and convenient to operate, and is low in detection cost; meanwhile, the detection speed is fast, each to-be-detected sample only needs 1-5s to complete detection, the detection error is controllable, and the demand of industrialized batch rapid full-sample detection can be met; meanwhile, different shaping filters and reference attenuation filters can be replaced to meet the demand of detection of different to-be-detected wave bands, and the application range is wide.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of optical detection method, and particularly relates to a rapid detection method of wide-spectrum-range high-cut-off optical filter. BACKGROUND

[0002] The cut-off depth is also called absorbance or optical density, which is usually referred to as OD, and represents the blocking ability of the detected object to light. The stronger the blocking ability is, the greater the cut-off depth is. When light passes through the detected object, part of the energy of the light is absorbed by the detected object. At a specific wavelength, the concentration of the same detected object is in a quantitative relationship with the absorbed energy. The optical density refers to the logarithm of the reciprocal of the transmittance. The calculation formula is: OD = lg(1 / T).

[0003] For the cut-off depth, generally speaking, the higher the better. For example, OD3 is better than OD2. According to OD = lg(1 / T), the smaller the transmittance is, the higher the cut-off depth is. For example, the optical filter, the lower the transmittance is in the cut-off band, the higher the cut-off depth is, and then the stronger the cut-off ability of the optical filter to light is.

[0004] The optical filter is an optical device that allows light of a certain wavelength to pass through while blocking light of other wavelengths. Its application is very wide, especially in optical equipment, such as mobile phone lenses, myopia glasses, CCD filters, various medical instruments, etc. In application, in addition to high requirements for the surface finish, reflectivity and transmittance of the optical filter, the cut-off depth is also an important standard for judging the performance of the optical filter. Therefore, before the optical filter is applied to the optical equipment, how to accurately and non-destructively detect the cut-off depth of the optical filter is directly related to the preparation and performance detection of the optical filter. The greater the cut-off depth of the optical filter is, the smaller the transmittance is, and the better the performance is. In order to effectively suppress the unwanted light, the cut-off depth is often increased as much as possible in the cut-off band when the optical filter is made.

[0005] The spectrophotometer can detect up to OD8 (usually for scientific research), but it can only detect one monochromatic light at a time. If full-spectrum detection is to be achieved, the spectrophotometer needs to be operated to let each monochromatic light pass through the exit slit of the monochromator in turn, and the cuvette in the sample cell needs to be cleaned before testing. Therefore, the testing speed of the spectrophotometer is slow, and it cannot meet the demand of rapid detection of batch samples. Usually, it takes 5-8 minutes to detect one sample by the spectrophotometer, so the spectrophotometer is usually used in the laboratory.

[0006] In recent years, due to the popularization of fiber spectrometer, more and more scientific research, laboratory and industrial online analysis users abandon the spectrophotometer used in traditional laboratory and turn to this new portable spectrometer. Fiber spectrometer has the advantages of good stability, small size, light weight, full spectrum rapid detection and low cost, but its test precision is relatively low; compared with spectrophotometer, the noise and stray light of fiber spectrometer are larger. Fiber spectrometer can be used for multi-sample and multi-site detection of samples in industrial production due to its fast detection speed (the light spot of spectrophotometer is larger than 2X5mm, which is not suitable for multi-site detection), which can better guarantee product quality. The existing fiber spectrometer can be used for rapid batch detection of OD3-OD4 filter, and the detection speed of each sample is several tens to several hundred milliseconds; but the filter larger than OD4 cannot be rapidly and effectively detected by fiber spectrometer.

[0007] With the increasing demand for high-quality filters in fast-moving consumer goods such as mobile phones, there is a need for detection instruments to rapidly and batch detect samples larger than OD4 in full spectrum and multi-site. The traditional technical method of fiber spectrometer or spectrophotometer cannot meet the detection needs. Therefore, there is an urgent need for a fast and efficient technical method that can accurately and stably detect high-cut-off depth filters. SUMMARY

[0008] In view of the above problems, the present application aims to provide a fiber spectrometer rapid detection method with fast detection speed and capable of detecting wide-spectrum high-cut-off filters with OD greater than 4.

[0009] To achieve the technical purpose, the present application provides a high-cut-off depth rapid detection device, comprising a fiber spectrometer, a light source and a detection platform, wherein the detection platform is provided with a to-be-detected sample, the light source emits a wide-spectrum composite light which passes through a collimating light path and then passes through the to-be-detected sample, the composite light enters the fiber spectrometer in a reflective or transmissive manner, and the fiber spectrometer can perform spectroscopic detection on the composite light and obtain data of different wavelengths of the composite light.

[0010] A light blocking mechanism is further arranged on the light path between the light source and the fiber spectrometer, which can allow the light in the light path to enter or not enter the fiber spectrometer.

[0011] The light source is one or more of a halogen lamp or a deuterium lamp.

[0012] The detection platform is provided with a composite light collecting mechanism, and the fiber spectrometer is connected to the composite light collecting mechanism through an optical fiber.

[0013] The composite light collecting mechanism is an integrating sphere or a collecting lens.

[0014] As preferred, a reference attenuation filter is further arranged between the light source and the light path of the fiber spectrometer, the reference attenuation filter is mounted on a first switching mechanism, the first switching mechanism is used to change the position of the reference attenuation filter, so that the light on the light path passes through or does not pass through the reference attenuation filter.

[0015] As preferred, a shaping filter is further arranged between the light source and the sample to be measured, the shaping filter is mounted on a second switching mechanism, the second switching mechanism is used to change the position of the shaping filter, so that the light on the light path passes through or does not pass through the shaping filter.

[0016] As preferred, the transmittance of the shaping filter in the measured wavelength range of the high cutoff of the sample to be measured is above 50%, and the transmittance in the non-cutoff wavelength range of the sample to be measured is below 10%.

[0017] As preferred, the detection platform has an angle adjusting mechanism, which can change the angle between the sample to be measured and the incident light in the range of 5°-90°.

[0018] As preferred, the transmittance of the reference attenuation filter at each wavelength in the measured wavelength range is 0.1-10%.

[0019] A rapid detection method of a wide spectral range high cutoff filter, using a high cutoff depth rapid detection device, specifically including the following steps:

[0020] S1, select an attenuation filter with suitable transmittance as a reference attenuation filter, and pre-import the data F of each wavelength of the attenuation filter into the computer λ ;

[0021] S2, turn on the light source until the light source is stable;

[0022] S3, switch the reference attenuation filter to the light path between the light source and the fiber spectrometer, so that the light in the light path passes through the reference attenuation filter, the light blocking mechanism is in the light passing state, at this time, the sample to be measured is not placed, the position of the composite light collection mechanism is adjusted, so that the composite light emitted through the collimation light path completely enters the composite light collection mechanism, the integration time of the fiber spectrometer is adjusted to t1, so that the fiber spectrometer reaches the normal working state, and the energy distribution R of each wavelength measured by the fiber spectrometer is saved λ ;

[0023] S4, start the light blocking mechanism, so that the light blocking mechanism is in the light blocking state, and save the energy distribution DR of each wavelength λ ;

[0024] S5, place the sample to be measured on the measuring platform, the light blocking mechanism is in the light passing state, modulate to the angle needed to be measured, adjust the position of the composite light collection mechanism so that the light passing through the sample to be measured enters the composite light collection mechanism completely, switch the reference attenuation filter out of the light path between the light source and the fiber spectrometer so that the light in the light path does not pass through the reference attenuation filter, adjust the integration time of the fiber spectrometer to t2, so that the fiber spectrometer reaches the normal working state, save the energy distribution S of each wavelength measured by the fiber spectrometer λ ;

[0025] S6, close the light blocking mechanism so that the light blocking mechanism is in the light blocking state, save the energy distribution DS of each wavelength λ , when t2 and t1, DS λ is equal to DR λ , then DS λ does not need to be measured again;

[0026] S7, calculate the transmittance T of the wavelength to be measured of the high cutoff of the sample to be measured λ , the cutoff depth OD λ value calculation formula as follows:

[0027]

[0028] OD λ = -log (T λ ).

[0029] As preferred, the shaping filter is selected according to the spectral characteristics of the sample, which is high transmittance in the high cutoff part of the sample to be measured, and high attenuation in the high transmittance part of the sample to be measured, the data H of each wavelength of the shaping filter is imported in the computer in advance λ ,

[0030] In step S4, the shaping filter is switched into the light path between the light source and the fiber spectrometer, so that the composite light in the light path passes through the shaping filter before entering the fiber spectrometer for detection, and the energy distribution S of each wavelength measured by the fiber spectrometer is saved λ ';

[0031] In step S7 calculation, the transmittance T of the wavelength to be measured of the high cutoff of the sample to be measured λ ', the cutoff depth OD λ ' value calculation formula as follows:

[0032]

[0033] OD λ ' = -log (T λ ).

[0034] Preferably, the light spot diameter on the surface of the sample to be measured is adjusted to 0.1-4mm after the light source is stabilized in step S2.

[0035] In the normal working state of the fiber spectrometer in steps S3 and S5, no saturation occurs in the measurement wavelength range of the fiber spectrometer or the wavelength range with a high measurement cutoff depth of the sample to be measured, and the maximum signal intensity at a certain wavelength in the range is not less than 10% of the maximum value of the fiber spectrometer at the wavelength.

[0036] The detection method of the present application has the advantages that it can be used for batch rapid detection of optical filters with OD values of 4-8, is simple and convenient to operate, has low detection cost, and has fast detection speed, and each sample to be measured only needs 1-5s to complete the detection, the detection error is controllable, and the needs of industrial batch rapid full-sample detection can be met; in addition, different shaping filters and reference attenuation filters can be replaced to meet the needs of detection of different to-be-detected wavebands, and the application range is wide. BRIEF DESCRIPTION OF DRAWINGS

[0037] Figure 1 The transmittance spectrum of the attenuation filter selected for the first and second embodiments of the present application;

[0038] Figure 2 The transmittance spectrum of the shaping filter selected for the second embodiment of the present application;

[0039] Figure 3 The OD value measurement graph of the S1 filter by the first embodiment method of the present application;

[0040] Figure 4 The OD value measurement graph of the S1 filter by the existing ordinary measurement method;

[0041] Figure 5 The OD value comparison graph of the S1 filter by the first embodiment method and the ordinary measurement;

[0042] Figure 6 The OD value measurement graph of the BLP-785R filter published by the manufacturer;

[0043] Figure 7 The OD value measurement graph of the BLP-785R filter by the existing ordinary measurement method;

[0044] Figure 8 The OD value measurement graph of the BLP-785R filter by the second embodiment method of the present application;

[0045] Figure 9 The OD value comparison graph of the BLP-785R filter by different methods;

[0046] Figure 10Positional schematic diagram of high cut-off depth rapid detection device of the present application;

[0047] Figure 11 Light path reference diagram of high cut-off depth rapid detection device of the present application. DETAILED DESCRIPTION

[0048] The present application will be further described in detail below in combination with the drawings and specific embodiments.

[0049] As shown in the drawings, Figures 1-11 the specific embodiment of the present application is a high cut-off depth rapid detection device, a to-be-detected sample is installed on a detection platform, a light source emits a wide-spectrum composite light which passes through the to-be-detected sample in a reflection or transmission manner, a collection device collects the composite light and then enters a fiber spectrometer, and the fiber spectrometer can perform spectroscopic detection on the composite light and obtain data of different wavelengths of the composite light.

[0050] The light source is one or more of a halogen lamp or a deuterium lamp; for example, an LS-3000 type halogen lamp with a wavelength range of 360-2000 nm. Alternatively, a light source with a wavelength range of 200-2000 nm is selected; or a light source with a wavelength range of 360-1000 nm is selected. A composite light collection mechanism is arranged in the detection platform, and the fiber spectrometer is connected to the composite light collection mechanism through an optical fiber; the composite light collection mechanism is an integrating sphere, and the composite light collection mechanism can be rotated to collect light transmitted or reflected by the sample at different angles. As shown in the drawings, Figure 11 , Figure 11 The collimated light and the sample of the device can be placed at different angles, and the light collection device collects light reflected or transmitted by the sample at the same position.

[0051] In order to facilitate the selection of appropriate detection time and avoid the saturation of a certain wavelength, a reference attenuation filter is further arranged between the light path of the light source and the fiber spectrometer, the reference attenuation filter is installed on a first switching mechanism, and the first switching mechanism can be used to change the position of the reference attenuation filter. The transmittance of the reference attenuation filter at each wavelength in the to-be-detected wavelength range is 0.1-10%. In order to better meet the testing requirements, the transmittance of the reference attenuation filter at each wavelength is preferably small in amplitude difference and accurately measured, the transmittance value at each wavelength in the to-be-detected wavelength range is the same or the amplitude difference is less than 10%, and the error between the measured value and the actual value of the transmittance at each wavelength is not more than 10%.

[0052] A shaping filter is further arranged between the light source and the to-be-detected sample, the shaping filter is installed on a second switching mechanism, and the second switching mechanism can be used to change the position of the shaping filter so that the light on the light path passes through or does not pass through the shaping filter.

[0053] The light shaping filter is arranged between the light source and the sample to be measured, and has a transmittance of 50% or more in the wavelength range of the sample to be measured, and a transmittance of 10% or less in the wavelength range of the sample not to be measured.

[0054] In order to facilitate the measurement of different incident light angles, the detection platform has an angle adjusting mechanism which can change the angle between the sample to be measured and the incident light in the range of 5°-90°.

[0055] In order to facilitate the light blocking operation, the measurement of dark current, and the light path between the light source and the optical fiber spectrometer, a light blocking mechanism is arranged on the light path, which can make the light in the light path enter or not enter the optical fiber spectrometer.

[0056] A high cutoff depth rapid detection method of an optical fiber spectrometer, using a high cutoff depth rapid detection device, the specific steps are as follows:

[0057] S1, selecting an appropriate transmittance attenuation filter as a reference attenuation filter, and importing the data F of each wavelength of the attenuation filter into the computer in advance λ ; Selecting appropriate reference attenuation filter and first opening light has no order. The position of the reference attenuation filter can be selected at any position between the light source and the optical fiber spectrometer, and there is no order of position before and after.

[0058] S2, turn on the light source until the light source is stable;

[0059] S3, switch the reference attenuation filter to the light path between the light source and the optical fiber spectrometer, so that the light in the light path passes through the reference attenuation filter, the light blocking mechanism is in the light passing state, at this time, no sample to be measured is placed, the position of the composite light collecting mechanism is adjusted, so that the collimated light emitted through the collimated light path completely enters the composite light collecting mechanism, the integration time of the optical fiber spectrometer is adjusted to t1, so that the optical fiber spectrometer reaches the normal working state, and the energy distribution R of each wavelength measured by the optical fiber spectrometer is saved λ .

[0060] S4, start the light blocking mechanism, so that the light blocking mechanism is in the light blocking state, and save the energy distribution DR of each wavelength λ . This step S4 belongs to saving dark current, which can be done first if the approximate integration time is known; if it has been saved before, it can not be done, and it can be directly called.

[0061] S5, place the sample to be measured on the measuring platform, the light blocking mechanism is in the light passing state, modulate to the angle to be measured, adjust the position of the composite light collection mechanism so that the light passing through the sample to be measured enters the composite light collection mechanism completely (if it is a light transmission path, no adjustment is needed at this time, if it is a reflected light path, the position of the collection device needs to be adjusted), switch the reference attenuation filter out of the light path between the light source and the fiber spectrometer, so that the light in the light path does not pass through the reference attenuation filter, adjust the integration time of the fiber spectrometer to t2, so that the fiber spectrometer reaches the normal working state, save the energy distribution S λ ;

[0062] S6, close the light blocking mechanism, so that the light blocking mechanism is in the light blocking state, save the energy distribution DS λ , when t2 and t1, DS λ is equal to DR λ , then DS λ does not need to be measured again;

[0063] S7, calculate the transmittance T λ of the sample to be measured at the wavelength of the high cutoff, and the cutoff depth OD λ value calculation formula as follows:

[0064]

[0065] OD λ = -log (T λ ).

[0066] The above steps S1-S6 record data respectively, the order can be different, and will not affect the final calculation result. Due to the influence of the performance of the spectrometer, the calculated value of the transmittance T λ may be negative, when T λ is negative, the absolute value of T λ is taken and substituted into the formula to calculate the OD λ value.

[0067] In step S1, select a suitable shaped filter with transmittance, and import the data H λ of each wavelength of the shaped filter in the computer in advance; the position of the shaped filter can be selected at any position between the light source and the spectrometer, and there is no position sequence.

[0068] In step S4, switch the shaped filter into the light path between the light source and the fiber spectrometer, so that the composite light in the light path passes through the shaped filter before entering the fiber spectrometer for detection, and save the energy distribution S λ ' measured by the fiber spectrometer at each wavelength;

[0069] In step S7, the transmittance T of the sample to be measured at the wavelength to be measured of the high cutoff is calculated λ ' or the cutoff depth OD λ ' is calculated according to the following formula:

[0070]

[0071] OD λ ' = -log (T λ ').

[0072] The selection of a suitable shaped filter with transmittance can reduce the influence of stray light of the spectrometer.

[0073] After the light source is stabilized in step S2, the spot diameter on the surface of the sample to be measured is adjusted to 0.1-4 mm; in steps S3 and S5, the normal working state of the fiber spectrometer is that no saturation occurs in the measurement wavelength range of the fiber spectrometer or the wavelength range of the high cutoff depth of the sample to be measured, and the maximum signal intensity at a certain wavelength in the range is not less than 10% of the maximum value of the fiber spectrometer at the wavelength position.

[0074] Example 1

[0075] The experimental instruments include an LS-3000 high-power halogen lamp light source, a QE65000 visible ultraviolet fiber spectrometer (the wavelength range of the light source is 360-2000 nm, which meets the full spectrum requirements of the experiment), a computer installed with spectral analysis software, a 2-4% transmittance sample (as a reference attenuation filter), a filter S1 as a sample to be measured (the OD value of S1 is about 5-8), an optical fiber, and a USB bus. The workbench selected is a TMS-III type, which is used to place the sample to be detected and contains an integrating sphere inside to collect light propagating along the platform light path. The QE65000 visible ultraviolet fiber spectrometer receives light collected by the integrating sphere, performs spectral detection and data acquisition, and then transmits the data to the computer through the USB bus for operation and processing. The wavelength range to be measured is 400-1100 nm, and the scanning wavelength range is 400-1100 nm.

[0076] The filter S1 is used as the sample to be measured, and the cutoff depth of the filter is OD value about 5-8. The cutoff depth limit value that can be tested by the QE65000 visible ultraviolet fiber spectrometer used in this experiment is OD4-6.

[0077] Detection process: Turn on the light source, adjust the positions of all components in the optical path so that the collimated light path is positioned at a 90° angle to the sample and enters the integrating sphere. Switch the reference attenuation filter into the optical path, without placing the test filter S1. Adjust the light source brightness and the spectrometer integration time to ensure normal operation and non-saturation of the spectral analysis. Set the integration time, averaging count, and smoothing width of the spectral analysis software to 2000ms, 2, and 2 respectively. The product of the integration time and the averaging count equals 4000ms, meaning the spectral analysis software takes 4 seconds to scan once. Acquire spectral data R. λ Place the black plate (light-blocking mechanism) into the optical path and collect spectral data (DR). λ Place the black plate (light-blocking mechanism) out of the optical path, and simultaneously switch the reference attenuation filter out of the optical path. Place the filter to be tested S1 at a 90° angle to the measurement position with the collimated optical path, and collect spectral data S. λ In the implementation case, because the integration time was not adjusted, DS λ equal to DR λ Substitute the known transmittance data F of the reference attenuation filter. λ Specific data are shown in Table 1. The formula can be used to calculate the OD value of the filter S1 under test, see [link to formula]. Figure 3 .

[0078] Table 1: Data on partial wavelengths of filter S1 under test

[0079] Sequence Wavelength DS λ (DR λ )]]> [R λ ]]> [SA λ ]] F λ ]]> [CAT λ ]]> OD λ ]]> 1 400 20.2 1226.8 21.3 2.69％ 2.31E-05 4.64 2 450 18.3 5669.8 21.4 2.62％ 1.43E-05 4.84 3 500 23.4 13374.0 26.6 2.68％ 6.39E-06 5.19 4 550 19.9 25420.6 23.6 2.83％ 4.12E-06 5.38 5 600 19.4 37869.2 22.1 2.97％ 2.1E-06 5.68 6 650 21.1 48387.1 24.0 3.07％ 1.89E-06 5.72 7 700 18.8 53828.7 22.2 3.14％ 1.98E-06 5.70 8 800 19.5 49149.7 43.6 3.29％ 1.61E-05 4.79 9 900 20.9 34945.2 471.8 3.46％ 4.47E-04 3.35 10 950 20.2 15725.3 4078.0 3.53％ 9.11E-03 2.04 11 1000 22.5 15006.1 82.1 3.58％ 1.42E-04 3.85 12 1050 21.7 4822.5 61.7 3.61％ 3.02E-04 3.52

[0080] have Figure 5 It is evident that the measurement method of this application can detect lower OD values ​​than traditional measurement methods. Traditional methods can only detect a minimum OD value of 5, while this application can detect a minimum OD value of 6. The method of this application can more accurately analyze the cutoff depth of the S1 filter at different wavelengths.

[0081] Example 2

[0082] The experimental instrument includes LS-3000 high-power halogen lamp light source, QE65000 visible ultraviolet fiber spectrometer (the wavelength range of the light source is 360-2000 nm, which meets the full spectrum of the experimental requirements), a computer installed with spectral analysis software, 2-4% transmittance sample (as a reference attenuation filter), infrared attenuation filter (as a shaping filter), BLP-785R filter of Semrock as the sample to be measured (the filter is high cut-off before 785 nm, and the OD value is about 6-8, and it is high transmittance after 785 nm), optical fiber, USB bus. The workbench selected is TMS-III type, which is used for placing the sample to be detected and contains an integrating sphere inside to collect the light propagating along the platform light path. The QE65000 visible ultraviolet fiber spectrometer receives the light collected by the integrating sphere, performs spectral detection and data acquisition, and then transmits the data to the computer through the USB bus for operation and processing. The wavelength range to be measured is 400-700 nm, and the scanning wavelength range is 400-1100 nm.

[0083] The BLP-785R filter is used as the sample to be measured, and the cutoff depth of 400-700 nm published by the manufacturer is about OD 6-8, which can be seen in Figure 6 (Published by the manufacturer), and the cutoff depth limit value that can be tested by the QE65000 visible ultraviolet fiber spectrometer used in this experiment is OD 4-6.

[0084] Detection process: turn on the light source, adjust the positions of each part of the light path, so that the collimated light path can be placed at a 90-degree angle of incidence and enter the collection integrating sphere, switch the reference attenuation filter into the light path, do not place the filter to be measured BLP-785R, adjust the light source brightness and the integration time of the spectrometer, so that the spectral analysis works normally and is not saturated, set the integration time, average number and smoothing width of the spectral analysis software to 2000 ms, 2 and 2 respectively, and the product of the integration time and the average number is equal to 4000 ms, that is, the spectral analysis software takes 4s to scan once. Collect spectral data R λ Put the black sheet (light blocking mechanism) into the light path and collect spectral data DR λ Take the black sheet (light blocking mechanism) out of the light path, at the same time, switch the reference attenuation filter out of the light path, switch the shaping filter into the light path, and place the filter to be measured BLP-785R at a 90-degree angle of the collimated light path to the measurement position, and collect spectral data S λ In the implementation case, the integration time is not adjusted, so DS λ is equal to DR λ . The transmittance data F λ of the known reference attenuation filter and the transmittance data H λ of the shaping filter are brought in, and the specific data is shown in Table 2, and the transmittance of the filter to be measured is calculated by The formula can calculate the OD value of the filter BLP-785R to be measured, and the OD value is shown in Table 2. Figure 8 .

[0085] Table 2: Data table of BLP-785R filter partial wavelength

[0086] Sequence Wavelength DS λ (DR λ )]]> [R λ ]]> [SA λ ]] F λ ]]> H λ ]]> [TECHNICAL FIELD] λ ]] OD λ ]]> 1 400 16.2 1140.6 15.9 2.620％ 0.07351 9.57E-05 4.02 2 450 16.8 5049.1 17.9 2.701％ 0.93193 5.85E-06 5.23 3 500 18.7 12086.0 19.1 2.863％ 0.93012 9.08E-07 6.04 4 550 18.5 22784.0 19.0 2.992％ 0.93561 6.04E-07 6.22 5 600 18.0 33666.4 19.4 3.085％ 0.93956 1.35E-06 5.87 6 650 18.3 42778.2 18.4 3.147％ 0.94720 4.97E-08 7.30 7 700 17.5 47345.7 18.4 3.217％ 0.06981 8.46E-06 5.07 8 750 18.9 46268.9 22.0 3.297％ 0.00177 1.26E-03 2.90 9 800 23.7 42829.5 40.8 3.394％ 0.00054 2.50E-02 1.60 10 850 28.3 37196.4 807.8 3.469％ 0.00090 8.04E-01 0.09

[0087] As shown in Figure 9 , the OD value of the detection method of the present application is closer to the data published by the manufacturer, which is much better than the OD value measured by the ordinary measurement method. The data published by the manufacturer is generally measured by ultraviolet spectrophotometer, and the measurement accuracy is high, but the speed is relatively slow. The detection method of the present application has the characteristics of fast speed and high detection sensitivity, and can meet the requirements of OD4-7 high cutoff depth detection.

[0088] The detection method of the present application can be used for batch rapid detection of filters with OD value 4-8 high cutoff depth, and has the characteristics of simple operation, low detection cost, fast detection speed, controllable detection error, and wide application range.

[0089] The above is only a preferred embodiment of the present application, and is not used to limit the present application. Any slight modification, equivalent replacement and improvement made according to the technical essence of the present application to the above embodiment shall be included in the protection scope of the technical solution of the present application.

Claims

1. A rapid detection method for a wide-spectral-range high-cutoff filter, characterized in that: A high cutoff depth rapid detection device includes a fiber optic spectrometer, a light source, and a detection platform. The sample to be tested is mounted on the detection platform. The light source emits a broadband composite light that passes through a collimated optical path and then through the sample to be tested. The composite light enters the fiber optic spectrometer by reflection or transmission. The fiber optic spectrometer can perform spectroscopic detection on the composite light and obtain data on different wavelengths of the composite light. A light-blocking mechanism is also provided in the optical path between the light source and the fiber optic spectrometer. This light-blocking mechanism allows light in the optical path to enter or not enter the fiber optic spectrometer at all. The specific steps are as follows: S1. Select a suitable attenuation filter with appropriate transmittance as a reference attenuation filter, and import the wavelength data of each wavelength of the attenuation filter into the computer beforehand. λ ; S2. Turn on the light source until it is stable; S3. Switch the reference attenuation filter to the optical path between the light source and the fiber optic spectrometer, so that the light in the optical path passes through the reference attenuation filter and the light-blocking mechanism is in the light-passing state. At this time, do not place the sample to be measured. Adjust the position of the composite light acquisition mechanism so that the composite light emitted from the collimated optical path completely enters the composite light acquisition mechanism. Adjust the integration time of the fiber optic spectrometer to t1 to bring the fiber optic spectrometer to normal working state. Save the energy distribution R of each wavelength measured by the fiber optic spectrometer. λ ; S4. Activate the light-blocking mechanism to put it in the light-blocking state and preserve the energy distribution DR of each wavelength. λ ; S5. Select a shaping filter based on the spectral characteristics of the sample. In the high-cutoff region of the sample, the shaping filter should have high transmittance; in the high-transmittance region, the shaping filter should have high attenuation. Import the wavelength data H of the shaping filter into the computer beforehand. λ Place the sample to be tested on the measurement platform, with the light-blocking mechanism in the light-transmitting state. Modulate the light to the angle to be measured and adjust the position of the composite light acquisition mechanism so that all the light passing through the sample enters the composite light acquisition mechanism. Simultaneously, switch the reference attenuation filter out of the optical path and switch the shaping filter into the optical path, so that the light in the optical path does not pass through the reference attenuation filter, and the composite light in the optical path passes through the shaping filter before entering the fiber optic spectrometer for detection. Adjust the integration time of the fiber optic spectrometer to t2 to bring the fiber optic spectrometer to normal operating status and save the energy distribution S of each wavelength measured by the fiber optic spectrometer. λ '; S6. Close the light-blocking mechanism to keep it in the light-blocking state and preserve the energy distribution of each wavelength. λ When t2 and t1, DS λ equal to DR λ Then DS λ No further measurement is required; S7. Calculate the transmittance T of the sample at the high cutoff wavelength of the target wavelength. λ ', Cutoff Depth OD λ The formula for calculating the 'value' is as follows: ； 。 2. The rapid detection method for a wide spectral range high cutoff filter according to claim 1, characterized in that: The light source is one or more of a halogen lamp or a deuterium lamp; The detection platform is equipped with a composite light acquisition mechanism, and the fiber optic spectrometer is connected to the composite light acquisition mechanism via an optical fiber. The composite light acquisition mechanism is an integrating sphere or an acquisition lens.

3. The rapid detection method for a wide spectral range high cutoff filter according to claim 1, characterized in that: A reference attenuation filter is also provided between the light source and the optical path of the fiber optic spectrometer. The reference attenuation filter is installed on a first switching mechanism. The first switching mechanism can be used to change the position of the reference attenuation filter so that the light in the optical path passes through the reference attenuation filter completely or not.

4. The rapid detection method for a wide spectral range high cutoff filter according to claim 1, characterized in that: A shaping filter is also provided between the light source and the sample to be tested. The shaping filter is installed on the second switching mechanism. The second switching mechanism can be used to change the position of the shaping filter so that the light in the optical path passes through the shaping filter completely or not.

5. The rapid detection method for a wide spectral range high cutoff filter according to claim 4, characterized in that: The shaped filter has a transmittance of more than 50% in the high-cutoff wavelength range of the sample under test, and a transmittance of less than 10% in the non-cutoff wavelength range of the sample under test.

6. The rapid detection method for a wide spectral range high cutoff filter according to claim 1, characterized in that: The detection platform has an angle adjustment mechanism that can change the placement angle between the sample to be tested and the incident light within the range of 5° to 90°.

7. The rapid detection method for a wide spectral range high cutoff filter according to claim 3, characterized in that: The transmittance of the reference attenuation filter is between 0.1% and 10% for each wavelength within the test band.

8. The rapid detection method for a wide spectral range high cutoff filter according to claim 1, characterized in that: In step S2, after the light source is stabilized, adjust the diameter of the light spot on the surface of the sample to be tested to 0.1-4 mm. In steps S3 and S5, the normal operating condition of the fiber optic spectrometer is that there is no saturation in the measurement wavelength range of the fiber optic spectrometer or the wavelength range of the sample to be measured with a high cutoff depth, and the maximum signal intensity of a certain wavelength in the range is not less than 10% of the maximum reading of the fiber optic spectrometer at that wavelength position.

Images