Low-carbon intelligent one-way freezing and thawing cycle test system

A freeze-thaw cycle and test system technology, which is applied in the direction of instruments, lighting and heating equipment, and machine operation methods, can solve the problems of inaccurate reflection of material performance, unrealized freeze-thaw cycle intelligent control, and high cost. Achieve the effect of reducing the impact of human intervention and manual operation errors, reducing the impact of personnel and the environment, and low delay

CN114739043APending Publication Date: 2022-07-12HARBIN INST OF TECH
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Patent Information

Authority / Receiving Office
CN · China
Current Assignee / Owner
Publication Date
2022-07-12

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Abstract

The invention discloses a low-carbon intelligent one-way freezing and thawing cycle test system, which comprises a semiconductor temperature controller fixed at the top of a test piece; the semiconductor temperature controller comprises a semiconductor chilling plate, the semiconductor chilling plate is fixed on an aluminum plate, and the aluminum plate is arranged at the top of the test piece; the contact surface of the semiconductor chilling plate and the aluminum plate is a working surface, the other surface is a heat exchange surface, and the heat exchange surface of the semiconductor chilling plate is provided with a heat exchange device. And the control system is used for controlling the semiconductor temperature controller to heat / cool the test piece and controlling the circulating process and the circulating frequency of the semiconductor temperature controller to heat and cool the test piece. One output end of the control system is connected with a first switch module arranged on a connecting line of the direct-current power supply and the semiconductor chilling plate; and the other output end of the control system is connected with a second switch module arranged on a connecting line of the first switch module and the direct-current power supply. The test result accurately reflects the performance of the material in the real freeze-thaw cycle.
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Description

technical field

[0001] The invention belongs to the field of material testing instruments, and relates to a low-carbon intelligent one-way freeze-thaw cycle test system. Background technique

[0002] In northern China and plateau areas, there are significant positive and negative changes in annual temperature, and even at the transition of winter and spring, there are significant positive and negative changes in daily temperature, which will cause building materials such as asphalt and concrete to undergo freeze-thaw cycles. Freeze-thaw cycle refers to the repeated freezing and thawing process of materials under the action of periodic positive and negative temperatures. This repeated freezing and thawing process will seriously affect the stability of the properties of building materials such as asphalt and concrete, and greatly reduce the performance and life of the corresponding structures of the building materials. To this end, it is necessary to carry out research on the...

Examples

Embodiment Construction

[0053] The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0054] A low-carbon intelligent one-way freeze-thaw cycle test system, the structure is as follows figure 1 shown, including:

[0055] Semiconductor thermostat 1, the semiconductor thermostat 1 is fixed on the top of the test piece, used for heating / cooling the test piece, and performing freeze-thaw cycle test;

[0056] The semiconductor thermostat 1 includes:

[0057] The semiconductor refrigeration sheet 4, the semiconductor refr...