A sensor testing method, device, equipment and readable storage medium

Abstract

The present application provides a sensor testing method, device, equipment and readable storage medium. The method includes: controlling a proton-irradiated APS image sensor to continuously collect N frames of images in a lightless environment during a first image acquisition stage, collecting a single frame of image in a light environment during a second image acquisition stage, and collecting M frames of images in a lightless environment during a third image acquisition stage; obtaining the average gray value of the N frames of images, and obtaining the target gray value of the last frame of image in the image acquisition period; calculating the image retention parameter of the proton-irradiated APS image sensor based on the average gray value and the target gray value. Through the implementation of the solution of the present application, the method of averaging multiple frames of images can eliminate accidental errors caused by single measurement. The testing method is simple, and the accuracy of image retention detection is high, which can provide effective support for the radiation damage assessment of APS image sensors.

Description

Technical Field

[0001] This application relates to the technical field of image sensors, and in particular, to a sensor testing method, apparatus, device, and readable storage medium. Background Art

[0002] Traditional types of image sensors include complementary metal oxide semiconductor (CMOS) image sensors, which have the advantages of small size, light weight, low power consumption, and high integration. They are widely used in space fields such as star sensors, sun sensors, and remote sensing imaging, and play an important role in space missions such as star recognition, star tracking, attitude determination, space docking, feature tracking, landing imaging for landing control, and target tracking. In recent years, image sensors based on CMOS Image Sensor (CIS) technology have developed rapidly and are increasingly widely used in fields such as automotive electronics, intelligent manufacturing, industrial monitoring, and military reconnaissance. However, when image sensors are applied in the above fields, they will be damaged by space proton irradiation, resulting in performance degradation or even functional failure of the image sensors. Therefore, it is of great significance to carry out research on proton irradiation damage of image sensors.

[0003] Image retention is one of the important indicators of the image quality collected by image sensors. It is a parameter that characterizes whether there are traces of the previous frame of image in this frame of image, and is an important parameter for evaluating the degree of proton irradiation damage of image sensors.

[0004] When the image sensor after proton irradiation continuously collects multiple frames of images, the first few frames of images may have a problem of relatively large gray values, resulting in inaccurate measurement of the image retention of the image sensor, seriously affecting the accuracy of the evaluation of the irradiation damage of the image sensor. Summary of the Invention

[0005] The embodiments of this application provide a sensor testing method, apparatus, device, and readable storage medium, which can at least solve the problem of relatively low accuracy in measuring image retention for image sensors after proton irradiation in related technologies.

[0006] The first aspect of the embodiments of this application provides a sensor testing method, including:

[0007] Control the APS image sensor after proton irradiation to continuously collect N frames of images in a lightless environment during the first image acquisition stage, collect a single frame of image in a light environment during the second image acquisition stage, and collect M frames of images in a lightless environment during the third image acquisition stage; where N is a positive integer greater than 1, M is a positive integer greater than or equal to 1, and a single image acquisition cycle includes the above-mentioned first image acquisition stage, second image acquisition stage, and third image acquisition stage that are continuous in time sequence;

[0008] Obtain the average gray value of the N frames of images, and obtain the target gray value of the last frame of image in the image acquisition cycle;

[0009] Calculate the image retention parameter of the APS image sensor after proton irradiation based on the average gray value and the target gray value.

[0010] The second aspect of the embodiments of the present application provides a sensor testing device, including:

[0011] An acquisition module, configured to control the APS image sensor after proton irradiation to continuously collect N frames of images in a lightless environment during the first image acquisition stage, collect a single frame of image in a light environment during the second image acquisition stage, and collect M frames of images in a lightless environment during the third image acquisition stage; where N is a positive integer greater than 1, M is a positive integer greater than or equal to 1, and a single image acquisition cycle includes the above-mentioned first image acquisition stage, second image acquisition stage, and third image acquisition stage that are continuous in time sequence;

[0012] An acquisition module, configured to obtain the average gray value of the N frames of images, and obtain the target gray value of the last frame of image in the image acquisition cycle;

[0013] A calculation module, configured to calculate the image retention parameter of the APS image sensor after proton irradiation based on the average gray value and the target gray value.

[0014] The third aspect of the embodiments of the present application provides a terminal device, including: a memory and a processor, where the processor is configured to execute a computer program stored on the memory, and when the processor executes the computer program, implement the steps in the sensor testing method provided in the first aspect of the embodiments of the present application.

[0015] The fourth aspect of the embodiments of the present application provides a computer-readable storage medium, on which a computer program is stored, and when the computer program is executed by a processor, implement the steps in the sensor testing method provided in the first aspect of the embodiments of the present application.

[0016] As can be seen from the above, according to the sensor testing method, device, equipment, and readable storage medium provided by the solution of the present application, the APS image sensor after proton irradiation is controlled to continuously collect N frames of images in a lightless environment during the first image acquisition stage, collect a single frame of image in a light environment during the second image acquisition stage, and collect M frames of images in a lightless environment during the third image acquisition stage; obtain the average gray value of the N frames of images, and obtain the target gray value of the last frame of the image acquisition cycle; calculate the image retention parameter of the APS image sensor after proton irradiation based on the average gray value and the target gray value. Through the implementation of the solution of the present application, the method of averaging multiple frames of images can eliminate accidental errors caused by single measurements, the testing method is simple, and the accuracy of image retention detection is high, which can provide effective support for the radiation damage assessment of APS image sensors. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 It is a schematic diagram of the basic process of a sensor testing method provided by the first embodiment of the present application;

[0018] Figure 2 It is a schematic diagram of the exposure time distribution of a sensor provided by the first embodiment of the present application;

[0019] Figure 3 It is a schematic diagram of the correlation between an image frame sequence and a gray value provided by the first embodiment of the present application;

[0020] Figure 4 It is a schematic diagram of the refined process of a sensor testing method provided by the second embodiment of the present application;

[0021] Figure 5 It is a schematic diagram of the program module of a sensor testing device provided by the third embodiment of the present application;

[0022] Figure 6 It is a schematic diagram of the structure of a terminal device provided by the fourth embodiment of the present application. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0023] To make the objectives, features, and advantages of the present application more obvious and understandable, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments of the present application, all other embodiments obtained by those skilled in the art without creative efforts shall fall within the protection scope of the present application.

[0024] In the description of the embodiments of the present application, it should be understood that the orientation or positional relationship indicated by the terms "length", "width", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc. is based on the orientation or positional relationship shown in the drawings. It is only for the convenience of describing the embodiments of the present application and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation. Therefore, it should not be construed as a limitation of the present invention.

[0025] In addition, the terms "first" and "second" are only used for descriptive purposes and cannot be understood as indicating or implying relative importance or implicitly specifying the quantity of the indicated technical features. Thus, the features defined with "first" and "second" may explicitly or implicitly include one or more of such features. In the description of the embodiments of the present application, the meaning of "a plurality" is two or more, unless otherwise specifically defined.

[0026] In the embodiments of the present application, unless otherwise clearly specified and limited, the terms "mounted", "connected", "connected to", "fixed", etc. should be understood in a broad sense. For example, it may be a fixed connection, a detachable connection, or integrated; it may be a mechanical connection or an electrical connection; it may be directly connected or indirectly connected through an intermediate medium, and it may be the communication inside two elements or the interaction relationship between two elements. For those of ordinary skill in the art, the specific meanings of the above terms in the embodiments of the present application can be understood according to specific circumstances.

[0027] The above are only the preferred embodiments of the present application and are not intended to limit the present invention. Any modifications, equivalent replacements, and improvements made within the spirit and principle of the present application shall be included in the protection scope of the present application.

[0028] To solve the problem of low accuracy in measuring image retention for an image sensor after proton irradiation in related technologies, the first embodiment of this application provides a sensor testing method, which is applied to an image retention testing system. The image retention system includes a light source, a dark box, a temperature control box, and a processor. Among them, the light source is used to provide a light environment during image retention testing, the dark box is used to provide a dark field environment during image retention testing, the temperature control box can provide a corresponding temperature environment, and the processor is used to control image acquisition, storage, processing, etc. of the APS image sensor. It should be noted that an active pixel sensor (APS) is a commonly used image sensor, and each pixel sensor unit has a photodetector and at least one active transistor. In a metal oxide semiconductor (MOS) active pixel sensor, a MOS field effect transistor (MOSFET) is used as an amplifier. There are various types of APS, including the early NMOS type APS and the more common complementary MOS (CMOS) type APS.

[0029] As Figure 1 is a schematic diagram of the basic process of the sensor testing method provided in this embodiment. The sensor testing method includes the following steps:

[0030] Step 101: Control the APS image sensor after proton irradiation to continuously acquire N frames of images in a lightless environment during the first image acquisition stage, acquire a single frame of image in a light environment during the second image acquisition stage, and acquire M frames of images in a lightless environment during the third image acquisition stage.

[0031] Among them, N is a positive integer greater than 1 (for example, 10), M is a positive integer greater than or equal to 1 (for example, 5), and a single complete image acquisition cycle includes a first image acquisition stage, a second image acquisition stage, and a third image acquisition stage that are sequentially continuous in time series.

[0032] In this embodiment, first, the APS image sensor after proton irradiation is placed in a dark box so that the APS image sensor is in a lightless environment. Then, the APS image sensor is reset to clear the electronic residue of the image sensor. After that, multiple frames of images are collected in the first image acquisition stage in the lightless environment. Next, the light source is controlled to turn on, and a single frame of image is collected by the APS image sensor in the light environment in the second image acquisition stage. Finally, after the single frame of image in the second image acquisition stage is collected, the light source is immediately turned off to restore the lightless environment, and the image acquisition in the third image acquisition stage is continued. That is, in a single image acquisition cycle of this embodiment, it includes two lightless image acquisition stages and one light image acquisition stage. Only a single frame of image is collected in the light image acquisition stage, and this light image acquisition stage is located between the two lightless image acquisition stages. It should be noted that the light source in this embodiment preferably can be a pulsed light source, which is used to provide a uniform pulsed light environment during the image retention test. In practical applications, the duty cycle of the pulsed light beam is relatively small, the operation is convenient, and the front and rear frames do not affect each other, which is beneficial to improving the test accuracy.

[0033] In an alternative embodiment of this embodiment, before the step of controlling the APS image sensor after proton irradiation to continuously collect N frames of images in the lightless environment in the first image acquisition stage, it further includes: controlling the environmental temperature of the test environment of the APS image sensor to remain at a constant temperature.

[0034] Specifically, in practical applications, the imaging result of the image sensor after proton irradiation is often very sensitive to the environmental temperature. However, the traditional image sensor image retention measurement system generally ignores the temperature factor, which will lead to a large uncertainty in the image retention test of the irradiated image sensor due to the change of the environmental temperature. Even, it may occur that the change value of the image retention caused by the temperature fluctuation is greater than the degradation value of the image retention induced by the irradiation. Based on this, after the dark box of this embodiment is placed in the temperature control box, the temperature control box can be controlled to maintain a constant temperature to provide a constant temperature environment for the sensor test process. In this embodiment, the temperature of the temperature control box is preferably set to 25 °C, which can ensure the stability and accuracy of the sensor test.

[0035] In an alternative embodiment of this embodiment, the step of controlling the APS image sensor after proton irradiation to continuously collect N frames of images in the lightless environment in the first image acquisition stage includes: setting the initial value and the common difference of the arithmetic time series composed of N image acquisition times in the first image acquisition stage according to the image acquisition scene parameters of the APS image sensor; controlling the APS image sensor after proton irradiation to continuously collect N frames of images in the lightless environment in the first image acquisition stage according to the set arithmetic time series.

[0036] Specifically, the image acquisition scene parameters of this embodiment include at least one of the following: the light source working parameters of the illumination environment, the relative distance between the APS image sensor and the light source, and the maximum exposure duration of the APS image sensor. In this embodiment, the first image acquisition stage may include multiple equally spaced image acquisition times. This embodiment flexibly adjusts the time distribution of this image acquisition stage with reference to the actual image acquisition scene, ensuring the adaptability of the image data acquisition behavior to the actual scene and improving the effectiveness of the acquired image data. In addition, it should also be noted that the second image acquisition stage and the third image acquisition stage after the first image acquisition stage may also adopt the same exposure interval duration as the first image acquisition stage.

[0037] As Figure 2 shown in the schematic diagram of the exposure time distribution of a sensor provided by this embodiment. In this embodiment, the light source and the APS image sensor are controlled to work. The first 10 frames of the APS image sensor are equally spaced and exposed 10 times to obtain the gray values of the images in a lightless environment. At the 11th frame, while the processor controls the light source to emit a uniform pulsed light beam, the APS image sensor is controlled to expose, so as to achieve synchronization and avoid measurement errors caused by mutual influence between the front and back frames.

[0038] Step 102: Obtain the average gray value of N frames of images and the target gray value of the last frame of the image acquisition cycle.

[0039] As Figure 3 shown in the schematic diagram of the correlation between the image frame sequence and the gray value provided by this embodiment. The first to 10th frames are the 10 frames of images acquired in the first image acquisition stage. The 11th frame of the image is the single frame of image acquired in the second image acquisition stage. The 12th to 16th frames are the five frames of images acquired in the third image acquisition stage. Since the illumination behaviors of the image acquisition environments in the three stages are different, the gray values of the acquired images also show certain differences. It should be understood that the above Figure 3 is only to show the differences in the gray values of the images under different illumination behaviors. In practical applications, the gray values of multiple frames of images acquired under the same illumination behavior usually also have certain differences, rather than being constant as shown in the figure. In addition, according to Figure 3 the example, the average gray value of N frames of images is also Figure 3 the average value of the gray values of the first to 10th frames of images in Figure 3 and the target gray value of the last frame of the image is also

[0040] the gray value of the 16th frame of the image in

[0041] In this embodiment, by adopting the method of averaging multiple frames of images, random errors caused by single measurement can be excluded. Also, by emitting pulsed light beams, errors caused by the mutual influence between front and back frame images can be avoided, improving the measurement accuracy of image persistence of APS image sensors after proton irradiation. It has the advantages of good stability, high measurement accuracy, and simple measurement method, and is applicable to the precise measurement of image persistence of APS image sensors after proton irradiation, providing effective technical support for the radiation damage assessment of APS image sensors.

[0042] Further, in this embodiment, the above steps 101 and 102 can also be respectively executed in multiple image acquisition cycles. Then, in step 103, a first mean value is obtained for the average gray values of multiple image acquisition cycles, and a second mean value is obtained for the target gray values of multiple image acquisition cycles. Then, based on the first mean value and the second mean value, the image persistence parameter of the APS image sensor after proton irradiation is calculated. In this way, accidental errors in a single image acquisition cycle are avoided, further ensuring the accuracy of image persistence measurement.

[0043] In an alternative implementation manner of this embodiment, the step of calculating the image persistence parameter of the APS image sensor after proton irradiation based on the average gray value and the target gray value includes: inputting the average gray value and the target gray value into a preset image persistence calculation formula to calculate the image persistence parameter of the APS image sensor after proton irradiation; the image calculation formula is expressed as: I lag =(u lag -u dark ) / k; where, I lag represents the image persistence parameter, u lag represents the target gray value, u dark represents the average gray value, and k represents the system gain constant of the APS image sensor.

[0044] In an alternative implementation manner of this embodiment, before the step of calculating the image persistence parameter of the APS image sensor after proton irradiation based on the average gray value and the target gray value, it further includes: determining whether the gray values of the images collected in the second image acquisition stage and the third image acquisition stage meet a preset condition; if so, execute the step of calculating the image persistence parameter of the APS image sensor after proton irradiation based on the average gray value and the target gray value.

[0045] Specifically, in this embodiment, before performing image persistence measurement based on the gray values of the collected images, a condition judgment can be first performed on the image gray values to determine the validity of the collected images. If it is determined that the current image supports effective image persistence measurement, the subsequent image persistence measurement steps are further triggered, thereby ensuring the accuracy of image persistence measurement.

[0046] Further, in an alternative embodiment of this embodiment, the step of determining whether the gray values of the images collected in the second image acquisition stage and the third image acquisition stage meet the preset conditions includes: determining whether there is a single-frame image in the images collected in the second image acquisition stage and the third image acquisition stage whose gray value meets the preset relational expression: u y = 200k; where u y represents the gray value of a single-frame image, and k represents the system gain constant of the APS image sensor.

[0047] Specifically, in this embodiment, based on the system gain constant of the image sensor, it is determined whether the currently acquired image is suitable for performing image retention measurement. When any one of the images acquired after the first image acquisition stage has a gray value that is 200 times the system gain constant, it is determined that the current image acquisition behavior meets the image retention measurement standard. Of course, in practical applications, other conditional relational expressions can also be set based on the actual application scenario, and this embodiment does not make a unique limitation in this regard.

[0048] Further, in another alternative embodiment of this embodiment, after the step of determining whether the gray values of the images collected in the second image acquisition stage and the third image acquisition stage meet the preset conditions, it further includes: if not, reset the exposure duration of the APS image sensor and / or the light source working parameters of the lighting environment, and then return to execute the step of controlling the APS image sensor after proton irradiation to continuously collect N frames of images in a lightless environment in the first image acquisition stage.

[0049] Specifically, in this embodiment, if it is determined based on the image gray value that the current image acquisition behavior cannot meet the image retention measurement standard, at least one of the working parameters of the image sensor and the light source working parameters is adjusted, and then the foregoing steps 101 and 102 are executed again to ensure that the image gray value for finally performing the image retention measurement meets the image retention measurement standard and improve the accuracy of the image retention measurement.

[0050] Based on the technical solution of the embodiment of the present application described above, control the APS image sensor after proton irradiation to continuously collect N frames of images in a lightless environment during the first image acquisition stage, collect a single frame of image in a light environment during the second image acquisition stage, and collect M frames of images in a lightless environment during the third image acquisition stage; obtain the average gray value of the N frames of images, and obtain the target gray value of the last frame of image in the image acquisition cycle; calculate the image retention parameter of the APS image sensor after proton irradiation based on the average gray value and the target gray value. Through the implementation of the solution of the present application, the method of averaging multiple frames of images can eliminate accidental errors caused by single measurements, the test method is simple, and the accuracy of image retention detection is high, which can provide effective support for the radiation damage assessment of the APS image sensor.

[0051] Figure 4 The method in [reference] provides a refined sensor test method for the second embodiment of the present application. This sensor test method includes:

[0052] Step 401: Control the environmental temperature of the test environment of the APS image sensor to remain at a constant temperature.

[0053] Specifically, in this embodiment, after the dark box used to provide a dark field environment for image retention testing is placed in the temperature control box, the temperature control box can be controlled to maintain a constant temperature to provide a constant temperature environment for the sensor testing process.

[0054] Step 402: Control the APS image sensor after proton irradiation to continuously collect N frames of images in a lightless environment during the first image acquisition stage, collect a single frame of image in a light environment during the second image acquisition stage, and collect M frames of images in a lightless environment during the third image acquisition stage.

[0055] In this embodiment, N is a positive integer greater than 1, M is a positive integer greater than or equal to 1, and a single image acquisition cycle includes a first image acquisition stage, a second image acquisition stage, and a third image acquisition stage that are continuous in time sequence.

[0056] It should be understood that in a single image acquisition cycle of this embodiment, it includes two lightless image acquisition stages and one light image acquisition stage. Only a single frame of image is collected in the light image acquisition stage, and this light image acquisition stage is located between the two lightless image acquisition stages.

[0057] Step 403: Obtain the gray values of all the collected images.

[0058] Step 404: Determine whether, among the images collected in the second image acquisition stage and the third image acquisition stage, there is a single frame of image whose gray value satisfies the preset relational expression: u y = 200k; if so, execute step 405, if not, execute step 407.

[0059] Among them, u y represents the gray value of a single-frame image, and k represents the system gain constant of the APS image sensor.

[0060] Step 405: Obtain the average gray value of N frames of images in the first image acquisition stage, and obtain the target gray value of the last frame of the image acquisition cycle.

[0061] It should be noted that in this embodiment, the N frames of images are all the images collected in the first image acquisition stage, and the last frame of the image acquisition cycle is the last frame of the images collected in the third image acquisition stage.

[0062] Step 406: Input the average gray value and the target gray value into the preset image retention calculation formula: I lag =(u lag -u dark ) / k to calculate the image retention parameter of the APS image sensor after proton irradiation.

[0063] In this embodiment, I lag represents the image retention parameter, u lag represents the target gray value, u dark represents the average gray value, and k represents the system gain constant of the APS image sensor.

[0064] Step 407: Reset the exposure duration of the APS image sensor and the light source working parameters of the light environment; then return to execute Step 402.

[0065] Specifically, before measuring the image retention based on the gray value of the collected image in this embodiment, conditional judgment can be performed on the image gray value to determine the validity of the collected image. If it is determined that the current image supports effective image retention measurement, the calculation of the image retention parameter is further triggered. Otherwise, at least one of the working parameters of the image sensor and the light source working parameters is adjusted, and then image acquisition is performed again until an image that meets the image retention measurement conditions is collected, thereby ensuring the accuracy of the image retention measurement to the greatest extent.

[0066] It should be understood that the magnitudes of the serial numbers of the steps in this embodiment do not mean the order of execution of the steps. The order of execution of each step should be determined by its function and internal logic, and should not constitute a unique limitation on the implementation process of the embodiments of the present application.

[0067] Figure 5 This is a sensor test device provided in the third embodiment of the present application. This sensor test device can be used to implement the sensor test method in the foregoing embodiments. As Figure 5As shown, the sensor testing device mainly includes:

[0068] An acquisition module 501, configured to control the APS image sensor after proton irradiation to continuously acquire N frames of images in a lightless environment during the first image acquisition stage, acquire a single frame of image in a light environment during the second image acquisition stage, and acquire M frames of images in a lightless environment during the third image acquisition stage; where N is a positive integer greater than 1, M is a positive integer greater than or equal to 1, and a single image acquisition cycle includes a first image acquisition stage, a second image acquisition stage, and a third image acquisition stage that are sequential in time series;

[0069] An acquisition module 502, configured to obtain the average gray value of the N frames of images, and obtain the target gray value of the last frame of image in the image acquisition cycle;

[0070] A calculation module 503, configured to calculate the image retention parameter of the APS image sensor after proton irradiation based on the average gray value and the target gray value.

[0071] In some embodiments of this embodiment, the calculation module is specifically configured to: input the average gray value and the target gray value into a preset image retention calculation formula to calculate the image retention parameter of the APS image sensor after proton irradiation; the image calculation formula is expressed as: I lag =(u lag -u dark ) / k; where I lag represents the image retention parameter, u lag represents the target gray value, u dark represents the average gray value, and k represents the system gain constant of the APS image sensor.

[0072] In some embodiments of this embodiment, the sensor testing device further includes: a judgment module, configured to judge whether the gray values of the images acquired in the second image acquisition stage and the third image acquisition stage meet a preset condition. Correspondingly, the calculation module is specifically configured to: when the gray values of the images acquired in the second image acquisition stage and the third image acquisition stage meet the preset condition, calculate the image retention parameter of the APS image sensor after proton irradiation based on the average gray value and the target gray value.

[0073] Furthermore, in some embodiments of this embodiment, the judgment module is specifically configured to: judge whether there is a single frame of image in the images acquired in the second image acquisition stage and the third image acquisition stage whose gray value meets the preset relational expression: u y =200k; where u y represents the gray value of the single frame of image, and k represents the system gain constant of the APS image sensor.

[0074] Further, in some other embodiments of the present embodiment, the sensor testing device further includes: a reset module, configured to reset the exposure duration of the APS image sensor and / or the light source working parameters of the illumination environment when the grayscale values of the images collected in the second image acquisition stage and the third image acquisition stage do not meet the preset conditions, and trigger the acquisition module to re-execute its functions.

[0075] In some embodiments of the present embodiment, when the acquisition module executes the function of controlling the proton-irradiated APS image sensor to continuously acquire N frames of images in the first image acquisition stage in a lightless environment, it is specifically configured to: set the initial value and the common difference of the arithmetic progression time series composed of N image acquisition moments in the first image acquisition stage according to the image acquisition scene parameters of the APS image sensor, where the image acquisition scene parameters include at least one of the following: the light source working parameters of the illumination environment, the relative distance between the APS image sensor and the light source, and the maximum exposure duration of the APS image sensor; and control the proton-irradiated APS image sensor to continuously acquire N frames of images in the first image acquisition stage in a lightless environment according to the set arithmetic progression time series.

[0076] In some embodiments of the present embodiment, the sensor testing device further includes: a control module, configured to control the environmental temperature of the test environment of the APS image sensor to maintain a constant temperature.

[0077] It should be noted that the sensor testing methods in the first and second embodiments can both be implemented based on the sensor testing device provided in the present embodiment. Those of ordinary skill in the art can clearly understand that for the convenience and simplicity of description, the specific working process of the sensor testing device described in the present embodiment can refer to the corresponding process in the foregoing method embodiments and will not be elaborated herein.

[0078] According to the sensor testing device provided in the present embodiment, control the proton-irradiated APS image sensor to continuously acquire N frames of images in the first image acquisition stage in a lightless environment, acquire a single frame of image in the second image acquisition stage in a lighted environment, and acquire M frames of images in the third image acquisition stage in a lightless environment; obtain the average grayscale value of the N frames of images and the target grayscale value of the last frame of the image acquisition cycle; and calculate the image retention parameter of the proton-irradiated APS image sensor based on the average grayscale value and the target grayscale value. By implementing the solution of the present application, the method of averaging multiple frames of images can eliminate the accidental errors caused by single measurements. The testing method is simple, and the accuracy of image retention detection is high, which can provide effective support for the radiation damage assessment of APS image sensors.

[0079] Figure 6A terminal device provided for the fourth embodiment of this application. This terminal device can be used to implement the sensor testing method in the foregoing embodiments, and mainly includes:

[0080] A memory 601, a processor 602, and a computer program 603 stored on the memory 601 and executable on the processor 602. The memory 601 and the processor 602 are communicatively connected. When the processor 602 executes the computer program 603, the method in the first or second foregoing embodiment is implemented. Among them, the number of processors can be one or more.

[0081] The memory 601 can be a high-speed random access memory (RAM), or a non-volatile memory, such as a disk memory. The memory 601 is used to store executable program codes, and the processor 602 is coupled to the memory 601.

[0082] Furthermore, an embodiment of the present application also provides a computer-readable storage medium. This computer-readable storage medium can be disposed in the electronic devices in the foregoing embodiments. This computer-readable storage medium can be the memory in the foregoing Figure 6 illustrated embodiments.

[0083] A computer program is stored on this computer-readable storage medium. When this program is executed by a processor, the sensor testing method in the foregoing embodiments is implemented. Furthermore, this computer-readable storage medium can also be various media such as a USB flash drive, a mobile hard disk, a read-only memory (ROM), a RAM, a magnetic disk, or an optical disc that can store program codes.

[0084] In several embodiments provided by the present application, it should be understood that the disclosed devices and methods can be implemented in other ways. For example, the device embodiments described above are merely illustrative. For example, the division of modules is only a logical function division. In actual implementation, there can be other division methods. For example, multiple modules or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the displayed or discussed couplings or direct couplings or communication connections to each other can be through some interfaces. The indirect couplings or communication connections of devices or modules can be electrical, mechanical, or other forms.

[0085] The modules described as separate components may or may not be physically separated. The components displayed as modules may or may not be physical modules, that is, they can be located in one place, or they can be distributed to multiple network modules. Some or all of the modules can be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0086] In addition, in each embodiment of the present application, each functional module can be integrated into one processing module, or each module can exist physically alone, or two or more modules can be integrated into one module. The above-mentioned integrated modules can be implemented in the form of hardware or in the form of software functional modules.

[0087] If the integrated module is implemented in the form of a software functional module and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on such an understanding, the technical solution of the present application, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. The computer software product is stored in a readable storage medium and includes several instructions for causing a computer device (which can be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the methods in each embodiment of the present application. The foregoing readable storage medium includes: various media such as USB flash drives, mobile hard disks, ROM, RAM, magnetic disks, or optical discs that can store program codes.

[0088] It should be noted that for the foregoing method embodiments, for the sake of simplicity of description, they are all expressed as a series of action combinations. However, those skilled in the art should know that the present application is not limited by the described action sequence, because according to the present application, certain steps can be performed in other sequences or simultaneously. Secondly, those skilled in the art should also know that the embodiments described in the specification are all preferred embodiments, and the actions and modules involved are not necessarily all essential to the present application.

[0089] In the above embodiments, the descriptions of each embodiment have their own emphases. For the parts not detailed in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0090] The above is the description of the sensor testing method, device, equipment, and readable storage medium provided by the present application. For those skilled in the art, according to the idea of the embodiments of the present application, there will be changes in the specific implementation manner and application scope. In summary, the content of this specification should not be construed as a limitation to the present application.

Claims

1. A sensor testing method, characterized in that, The sensor testing method includes: Controlling the proton-irradiated APS image sensor to continuously collect N frames of images in a lightless environment during the first image acquisition stage, collect a single frame of image in a light environment during the second image acquisition stage, and collect M frames of images in a lightless environment during the third image acquisition stage; where N is a positive integer greater than 1, M is a positive integer greater than or equal to 1, and a single image acquisition cycle includes the above-mentioned first image acquisition stage, second image acquisition stage, and third image acquisition stage that are sequential in time series; Obtaining the average gray value of the N frames of images, and obtaining the target gray value of the last frame of image in the image acquisition cycle; Calculating the image retention parameter of the proton-irradiated APS image sensor based on the average gray value and the target gray value; The step of calculating the image retention parameter of the proton-irradiated APS image sensor based on the average gray value and the target gray value includes: Input the average gray value and the target gray value into a preset image retention calculation formula to calculate the image retention parameter of the APS image sensor after proton irradiation; the image retention calculation formula is expressed as: I lag =(u lag -u dark ) / k; Among them, I lag represents the image retention parameter, u lag represents the target gray value, u dark represents the average gray value, and k represents the system gain constant of the APS image sensor.

2. The sensor testing method according to claim 1, wherein Before the step of calculating the image retention parameter of the proton-irradiated APS image sensor based on the average gray value and the target gray value, it further includes: Judging whether the gray values of the images collected in the second image acquisition stage and the third image acquisition stage meet a preset condition; If so, execute the step of calculating the image retention parameter of the proton-irradiated APS image sensor based on the average gray value and the target gray value.

3. The sensor testing method according to claim 2, wherein The step of judging whether the gray values of the images collected in the second image acquisition stage and the third image acquisition stage meet a preset condition includes: Determine whether there is a single-frame image in the images collected in the second image acquisition stage and the third image acquisition stage whose gray value satisfies the preset relational expression: u y = 200k; Among them, u y represents the gray value of the single-frame image, and k represents the system gain constant of the APS image sensor.

4. The sensor testing method according to claim 2, wherein After the step of judging whether the gray values of the images collected in the second image acquisition stage and the third image acquisition stage meet a preset condition, it further includes: If not, reset the exposure duration of the APS image sensor and / or the light source working parameters of the light environment, and then return to execute the step of controlling the proton-irradiated APS image sensor to continuously collect N frames of images in a lightless environment during the first image acquisition stage.

5. The sensor testing method according to claim 1, characterized in that, The step of controlling the proton-irradiated APS image sensor to continuously collect N frames of images in a lightless environment during the first image acquisition stage includes: According to the image acquisition scene parameters of the APS image sensor, setting the initial value and the common difference of the arithmetic time series composed of N image acquisition moments in the first image acquisition stage; where the image acquisition scene parameters include at least one of the following: the light source working parameters of the light environment, the relative distance between the APS image sensor and the light source, and the maximum exposure duration of the APS image sensor; Controlling the proton-irradiated APS image sensor to continuously collect N frames of images in a lightless environment during the first image acquisition stage according to the set arithmetic time series.

6. The sensor testing method according to any one of claims 1 to 5, characterized in that Before the step of controlling the proton-irradiated APS image sensor to continuously collect N frames of images in a lightless environment during the first image acquisition stage, it further includes: Controlling the environmental temperature of the test environment of the APS image sensor to maintain a constant temperature.

7. A sensor testing device, characterized in that, The sensor testing device includes: The acquisition module is used to control the APS image sensor after proton irradiation to continuously acquire N frames of images in a lightless environment during the first image acquisition stage, acquire a single frame of image in a light environment during the second image acquisition stage, and acquire M frames of images in a lightless environment during the third image acquisition stage; where N is a positive integer greater than 1, M is a positive integer greater than or equal to 1, and a single image acquisition cycle includes the sequentially continuous first image acquisition stage, the second image acquisition stage, and the third image acquisition stage; The obtaining module is used to obtain the average gray value of the N frames of images and obtain the target gray value of the last frame of image in the image acquisition cycle; A calculation module, configured to input the average grayscale value and the target grayscale value into a preset image retention calculation formula to calculate an image retention parameter of the APS image sensor after proton irradiation; the image retention calculation formula is expressed as: I lag =(u lag -u dark ) / k; Among them, I lag represents the image retention parameter, u lag represents the target gray value, u dark represents the average gray value, and k represents the system gain constant of the APS image sensor.

8. A terminal device, characterized in that, It includes a memory and a processor, where: The processor is used to execute the computer program stored on the memory; When the processor executes the computer program, it implements the steps in the method described in any one of claims 1 to 6.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by the processor, it implements the steps in the method described in any one of claims 1 to 6.

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