A method, detection system and device for detecting voltage amplitude

Abstract

A method, detection system and device for detecting voltage amplitude provided by the present invention mainly include the following steps: comparing a first input signal with a first reference voltage and determining the positive peak value of the first input signal according to the comparison result; comparing the first input signal with a second reference voltage and determining the negative peak value of the first input signal according to the comparison result; the solution is to more simply implement the acquisition of the voltage amplitude at the pin under test in the existing radio frequency test. Based on the diode, the disturbance voltage amplitude is obtained through step-by-step comparison. By adjusting the input DC signal, the voltage amplitude detection for periodic interference can be realized without relying on waveform measurement instruments such as oscilloscopes. It has high cost performance and a higher applicable frequency range compared with the traditional peak detection circuit, and can be widely applied to the field of electromagnetic interference technology.

Description

Technical Field

[0001] The present invention relates to the technical field of electromagnetic interference, and in particular to a method, a detection system and a device for detecting voltage amplitude. Background Art

[0002] To improve the electromagnetic interference immunity of electronic products, in the related art, electromagnetic compatibility testing is an essential part of the design. As Figure 1 shown, in the radio frequency power direct injection method (DPI) test, an interference signal is injected into the pins of the chip under test through a radio frequency signal generator and a radio frequency power amplifier, and at the same time, the voltage disturbance value at the product observation point is recorded, and the immunity is obtained by integrating the data. To measure the voltage amplitude at the pins under test on the chip, measuring devices such as an oscilloscope are usually used to contact the pins and sample the complete waveform to achieve numerical sampling statistics.

[0003] However, in the related technical solutions, when using the DPI method for immunity testing, there are the following disadvantages: 1) When the wafer is contained inside the package, the oscilloscope probe cannot directly contact the electrodes of the transistor, and it is impossible to detect the voltage amplitude at the pins; 2) Common measuring instruments mainly based on oscilloscopes are relatively expensive devices. Such instruments are costly and have a certain volume, which will occupy a considerable area of the experimental table, and certain instrument training is required to master the operation. Summary of the Invention

[0004] In view of this, to at least partially solve the above technical problems, an object of the embodiments of the present invention is to provide a method for detecting the voltage amplitude of periodic disturbances, as well as a detection system and a device capable of implementing the detection method.

[0005] To this end, the technical solution of the present application provides a method for detecting voltage amplitude, including the following steps:

[0006] Obtain a disturbed voltage to get a first input signal, and obtain a first reference voltage and a second reference voltage generated by a field programmable gate array;

[0007] Input the first input signal and the first reference voltage into a first diode module in a positive peak detection module for comparison, and output a comparison result to obtain a first voltage value;

[0008] Input the first reference voltage into a second diode module in the positive peak detection module, and output to obtain a second voltage value;

[0009] Input the first input signal and the second reference voltage into a third diode module in a negative peak detection module for comparison, and output a comparison result to obtain a third voltage value;

[0010] Input the second reference voltage into the fourth diode module in the negative peak detection module, and output to obtain a fourth voltage value;

[0011] Perform a secondary comparison between the first voltage value and the second voltage value and output to obtain a first DC signal, and determine the positive peak value of the first input signal according to the first DC signal;

[0012] Perform a secondary comparison between the third voltage value and the fourth voltage value and output to obtain a second DC signal, and determine the negative peak value of the first input signal according to the second DC signal.

[0013] In a feasible embodiment of the solution of the present application, the first input signal includes a center voltage and a part to be measured for amplitude; the center voltage and the part to be measured for amplitude satisfy the following calculation formula:

[0014] V in =V DC +AMPsin(2πft)

[0015] Wherein, V in is the input signal, V DC is the center voltage, the AMP is the amplitude to be measured, f is the frequency, and t is the time.

[0016] In a feasible embodiment of the solution of the present application, the first reference voltage approaches the center voltage from the voltage peak value, and the second reference voltage approaches the center voltage from the voltage valley value.

[0017] In a feasible embodiment of the solution of the present application, the method further includes the following steps:

[0018] Output the first DC signal to a first LED lamp, and visually represent the positive peak value of the first input signal through the first LED lamp;

[0019] Output the second DC signal to a second LED lamp, and visually represent the negative peak value of the first input signal through the second LED lamp.

[0020] In a feasible embodiment of the solution of the present application, the method further includes the following steps:

[0021] Obtain a historical record, and obtain the mapping relationship between the amplitude of the second input signal in the historical record and a third reference voltage;

[0022] Fit to obtain a calibration value according to the mapping relationship, and calibrate the first reference voltage and / or the second reference voltage according to the calibration value.

[0023] On the other hand, the technical solution of the present application also provides a method for implementing the voltage amplitude detection in the first aspect. The system mainly includes a positive peak detection module and a negative peak detection module;

[0024] The positive peak detection module is configured to compare a first input signal with a first reference voltage and determine the positive peak of the first input signal according to the comparison result;

[0025] The negative peak detection module is configured to compare the first input signal with a second reference voltage and determine the negative peak of the first input signal according to the comparison result;

[0026] Among them, the positive peak detection module includes a first diode module, a second diode module, and a first comparator; the input end of the first diode module is connected to the first input signal and the first reference voltage, and the output end of the first diode module is connected to the negative input of the first comparator; the input end of the second diode module is connected to the first reference voltage, and the output end of the second diode module is connected to the positive input of the first comparator;

[0027] The negative peak detection module includes a third diode module, a fourth diode module, and a second comparator; the input end of the third diode module is connected to the second reference voltage, and the output end of the third diode module is connected to the negative input of the second comparator; the input end of the fourth diode module is connected to the first input signal and the second reference voltage, and the output end of the fourth diode module is connected to the positive input of the second comparator.

[0028] In a feasible embodiment of the solution of the present application, the system further includes a first LED lamp and a second LED lamp;

[0029] Among them, the positive electrode of the first LED lamp is connected to the output end of the first comparator, and the negative electrode of the first LED lamp is grounded; the positive electrode of the second LED lamp is connected to the output end of the second comparator, and the negative electrode of the second LED lamp is grounded.

[0030] In a feasible embodiment of the solution of the present application, the first diode module in the system includes a first diode, a second diode, and a first RC sub-circuit; the negative electrode of the first diode is connected to one end of the first RC sub-circuit, the negative electrode of the second diode is connected to one end of the first RC sub-circuit, and the other end of the first RC sub-circuit is grounded; the structure of the second diode module is the same as that of the first diode module.

[0031] In a feasible embodiment of the solution of the present application, the third diode module in the system includes a third diode, a fourth diode, and a second RC sub-circuit; the negative electrode of the third diode is connected to one end of the second RC sub-circuit, the negative electrode of the fourth diode is connected to one end of the second RC sub-circuit, and the other end of the second RC sub-circuit is connected to a power supply voltage; the structure of the fourth diode module is the same as that of the third diode module.

[0032] On the other hand, the technical solution of the present application also provides a device for detecting voltage amplitude, and the device includes:

[0033] At least one processor;

[0034] At least one memory for storing at least one program;

[0035] When the at least one program is executed by the at least one processor, the at least one processor runs a method for detecting voltage amplitude as described in the first aspect.

[0036] The advantages and beneficial effects of the present invention will be partially given in the following description, and other parts can be obtained through the specific implementation manners of the present invention:

[0037] The technical solution of the present application is to more simply implement the acquisition of the voltage amplitude at the pin under test in the existing radio frequency test. Based on the diode, the disturbance voltage amplitude is obtained through step-by-step comparison. By adjusting the input DC signal, the voltage amplitude detection for periodic interference can be realized without relying on waveform measurement instruments such as oscilloscopes. It has high cost performance and a higher applicable frequency range compared with the traditional peak detection circuit. BRIEF DESCRIPTION OF THE DRAWINGS

[0038] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following will briefly introduce the drawings required for the description of the embodiments. Obviously, the drawings in the following description are only some embodiments of the present application. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0039] Figure 1 It is a schematic structural diagram of a voltage amplitude detection system in the related art;

[0040] Figure 2 It is a schematic structural diagram of a comparison-type periodic disturbance amplitude detector in the technical solution of the present application;

[0041] Figure 3 It is a circuit schematic diagram of a complete voltage amplitude detection system in the technical solution of the present application;

[0042] Figure 4This is the circuit schematic diagram of the Dio module in the technical solution of this application;

[0043] Figure 5 This is the circuit schematic diagram of another Dio module in the technical solution of this application;

[0044] Figure 6 This is the schematic diagram of the input and output waveforms of the Dio module in the technical solution of this application. Detailed implementation manners

[0045] The embodiments of the present invention will be described in detail below. The examples of the embodiments are shown in the accompanying drawings, where the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the accompanying drawings are exemplary and are only used to explain the present invention and should not be construed as a limitation to the present invention. For the step numbers in the following embodiments, they are only set for the convenience of description and explanation, and no limitation is imposed on the order between the steps. The execution order of each step in the embodiments can be adaptively adjusted according to the understanding of those skilled in the art.

[0046] When performing radio frequency interference injection, only the voltage perturbation value at the pin where the interference signal is injected needs to be collected, and the waveform is not concerned. The periodic perturbation includes two key parameters: amplitude and frequency. The interference frequency is set by the tester and belongs to known conditions. Therefore, only the amplitude of the perturbation needs to be measured. If only the amplitude needs to be measured, a relatively simple circuit can be used.

[0047] However, in the related technical solutions, when using the DPI method for immunity testing, there are problems that the oscilloscope probe cannot directly contact the electrode of the transistor, resulting in the inability to detect the voltage amplitude at the pin, as well as the high cost and cumbersome operation; and the solutions for voltage amplitude detection mainly focus on the peak detection and hold circuit, but the detectable frequency range of this circuit is relatively low, and it is mainly applied between the sensor device and the analog-to-digital converter (ADC), where the ADC collects and processes the signal, or for signal modulation in the detector, and for measuring the noise of the chip power supply and ground. The peak detection and hold circuit is not currently applied to the measurement of the voltage amplitude perturbed at the pins of the chip under test by the direct power injection method. The traditional peak detection and hold circuit pays more attention to following the input signal to achieve fast response. Limited by the bandwidth of the operational amplifier, the frequency of the input signal is usually below 100 MHz. In addition, the digital multimeter with the function of detecting the effective value of the AC voltage has a relatively low frequency, with a maximum of only 10 MHz. Therefore, neither of the above two devices can cover the frequency band required during DPI testing.

[0048] Based on the aforementioned technical theory, the technical solution of this application is to more simply implement the acquisition of the voltage amplitude at the pins to be measured in existing radio frequency tests. In the first aspect, the technical solution of this application proposes a simple system for detecting the voltage amplitude of periodic disturbances, which obtains the disturbance voltage amplitude through step-by-step comparison based on diodes and is applicable to the amplitude measurement of periodic interference signals. In an embodiment, the system mainly includes a positive peak detection module and a negative peak detection module.

[0049] Among them, the positive peak detection module, as Figure 2 shown, is mainly used to compare the first input signal with the first reference voltage and determine the positive peak of the first input signal according to the comparison result; the negative peak detection module is mainly used to compare the first input signal with the second reference voltage and determine the negative peak of the first input signal according to the comparison result.

[0050] The specific circuit principle and connection relationship, as Figure 3 shown, the positive peak detection module includes a first diode module, a second diode module and a first comparator; the input end of the first diode module is connected to the first input signal and the first reference voltage, and the output end of the first diode module is connected to the negative input of the first comparator; the input end of the second diode module is connected to the first reference voltage, and the output end of the second diode module is connected to the positive input of the first comparator; the negative peak detection module includes a third diode module, a fourth diode module and a second comparator; the input end of the third diode module is connected to the second reference voltage, and the output end of the third diode module is connected to the negative input of the second comparator; the input end of the fourth diode module is connected to the first input signal and the second reference voltage, and the output end of the fourth diode module is connected to the positive input of the second comparator. It should be noted that the first to fourth diode modules are the Figure 3 Dio modules in Figure 3 and the first comparator and the second comparator are the

[0051] CMP modules in in with the DC signal V ref as inputs for a comparison respectively, and the other group of inputs are both DC signals V ref as a control. The two groups of outputs are then compared twice by the comparator. Based on the device characteristics of the diode that conducts forward and cuts off backward, the output of the diode module is determined by the higher input value of the two diodes. Therefore, by sequentially changing the input V refImplement to change its output V 1 The difference between the output V of the diode module compared with the control, thus changing the comparator output, and then the LED directly reflects the change in the output level as a display. It can be considered that the input V that causes the comparator to jump 2 is the peak value of the signal to be measured at this time, and the amplitude can be calculated. ref

[0052] Since the Dio module compares the input signal Vin with the reference voltage Vref and converts it into a DC voltage output, the comparator is equivalent to comparing two DC voltages, greatly reducing the requirement for the comparison speed. Relatively speaking, only a diode with a suitable operating frequency needs to be selected, and this amplitude detector can be applied to the common frequency band of DPI injection tests.

[0053] In some alternative embodiments, the system further includes a first LED and a second LED, as Figure 3 shown, the positive pole of the first LED is connected to the output terminal of the first comparator, and the negative pole of the first LED is grounded; the positive pole of the second LED is connected to the output terminal of the second comparator, and the negative pole of the second LED is grounded.

[0054] Specifically in the embodiment, in order to make the signal be significantly characterized, imitating the experimental conditions of board-level testing, an LED is selected for output visualization processing, and the comparator output signal is used to control the turning on and off of the LED.

[0055] In some alternative embodiments, as Figure 4 shown, the first diode module includes a first diode, a second diode, and a first RC sub-circuit; the negative pole of the first diode is connected to one end of the first RC sub-circuit, the negative pole of the second diode is connected to one end of the first RC sub-circuit, and the other end of the first RC sub-circuit is grounded; the structure of the second diode module is the same as that of the first diode module. Further, as Figure 4 shown, the third diode module includes a third diode, a fourth diode, and a second RC sub-circuit; the negative pole of the third diode is connected to one end of the second RC sub-circuit, the negative pole of the fourth diode is connected to one end of the second RC sub-circuit, and the other end of the second RC sub-circuit is connected to the supply voltage; the structure of the fourth diode module is the same as that of the third diode module.

[0056] It can be understood that the first diode module and the second diode module in the embodiment refer to the diode modules in the positive peak detection module. Correspondingly, the third diode module and the fourth diode module refer to the diode modules in the negative peak detection module.

[0057] Specifically as Figure 4 ​As shown, the diode module (i.e., Dio module) consists of two diodes of the same type and an RC, similar to a half-wave rectifier circuit. Since the two detection parts are used to scan the input voltages V p and V n which approach the center voltage from the peak value and the valley value respectively, the Dio modules of the two are slightly different in structure. In Figure 4 , the Dio module on the left is for the positive peak detection part, and the one on the right is for the negative peak detection part. The disturbed voltage at the observation point of the chip under test is used as the input signal V in , whose center voltage is V DC , the frequency f is known from the injected interference signal, and the amplitude to be measured is AMP, which can be written as:

[0058] V in = V DC + AMPsin(2πft)

[0059] where V in is the said input signal, V DC is the said center voltage, the said AMP is the amplitude to be measured, f is the frequency, and t is the time.

[0060] Exemplarily, taking the peak measurement as an example to explain its working principle. The FPGA is used to generate the reference voltage V p . The inputs of the reference group are all V p , and the output is V 1 , which serves as the comparison reference; the inputs of the comparison group are V in and V p , and after the initial comparison by the diodes, V 2 is obtained. V 1 and V 2 are secondarily compared by the comparator and converted into a DC output V 0 . To make this signal be clearly characterized, imitating the board-level test experimental conditions, an LED is selected for output visualization processing, and the output signal of the comparator is used to control the turning on and off of the LED.

[0061] More specifically, in the embodiment, as in Figure 5 , if the output of the Dio module of the comparison group shown only connects a resistor without a capacitor, its input and output waveforms are as shown in Figure 6 . As the comparison group, due to the forward conduction and reverse cut-off characteristics of the diode, when the two diodes with different inputs share the output, the output value will be determined by the higher input. While for the reference group, since the inputs are all V p , the output is only determined by V p . Figure 6 In p , when the reference voltage V inmax is higher than V 1= 2 ; the lower part is the reference voltage V p Lower than V inmax When, D1 and D2 conduct alternately, and the output has periodic pulses. If a capacitor is connected later, the voltage can be charged and accumulated. Therefore, V 1 > V 2 . Based on this, by changing V ref For voltage scanning, starting from a voltage value higher than the maximum value of the signal to be measured and gradually decreasing to a value lower than the maximum value, it can be observed that the output of the comparator switches from low level to high level, and more obviously, it can be characterized by the on and off of the LED. It can be considered that the V p When the output level changes is the input V inmax . Similarly, the valley value can be measured and the amplitude can be calculated.

[0062] In addition, the ideal comparator has an infinite gain and a highly symmetric circuit structure without input offset voltage, and the output can be quickly flipped when the difference between the input signals jumps. However, limited by the input offset voltage and finite gain, the comparator requires a certain difference between the input signals to output a flip. Therefore, the recorded V ref Will be smaller than the actual value. To reduce the error, calibration processing is required. By sampling in advance to obtain the relationship between the amplitude AMP of V in And V ref , the calibration value is obtained by fitting. During actual application, the measured V ref Is calibrated according to the calibration table.

[0063] On the other hand, the technical solution of the present application also provides a method for detecting voltage amplitude implemented based on the system for detecting voltage amplitude in the first aspect. The method mainly includes steps S100 - S700:

[0064] S100. Obtain the disturbed voltage to get the first input signal, and obtain the first reference voltage and the second reference voltage generated by the field programmable gate array;

[0065] S200. Input the first input signal and the first reference voltage into the first diode module in the positive peak detection module for comparison, and output the comparison result to obtain the first voltage value;

[0066] S300. Input the first reference voltage into the second diode module in the positive peak detection module, and output to obtain the second voltage value;

[0067] S400. Input the first input signal and the second reference voltage into the third diode module in the negative peak detection module for comparison, and output the comparison result to obtain the third voltage value;

[0068] S500. Input the second reference voltage into the fourth diode module in the negative peak detection module, and output to obtain a fourth voltage value;

[0069] S600. Perform a secondary comparison on the first voltage value and the second voltage value and output to obtain a first DC signal, and determine the positive peak value of the first input signal according to the first DC signal;

[0070] S700. Perform a secondary comparison on the third voltage value and the fourth voltage value and output to obtain a second DC signal, and determine the negative peak value of the first input signal according to the second DC signal.

[0071] Specifically in the embodiment, a group of diode modules takes the signal V to be measured at the chip pin in and a DC signal V ref as inputs respectively for a primary comparison. The other group of inputs are all DC signals V ref as a control. The outputs of the two groups are then subjected to a secondary comparison by a comparator. Based on the device characteristics of the diode that conducts forwardly and cuts off reversely, the output of the diode module is determined by the higher input value among the two diodes. Therefore, by sequentially changing the input V ref it is possible to change the difference between its output V 1 and the output V 2 of the control diode module, thereby changing the comparator output, and then directly reflecting the high and low changes of the output level by using an LED as a display. It can be considered that the input V ref that causes the comparator to jump is the peak value of the signal to be measured at this time, and the amplitude can be calculated.

[0072] Since the Dio module compares the input signal V in with the reference voltage V ref and converts it into a DC voltage output, the comparator is equivalent to comparing two DC voltages, greatly reducing the requirement for the comparison speed. Relatively speaking, only a diode with a suitable operating frequency needs to be selected, and this amplitude detector can be applied to the common frequency band of DPI injection testing.

[0073] In some selectable embodiments, the first input signal includes a center voltage and a part of the amplitude to be measured; the center voltage and the part of the amplitude to be measured satisfy the following calculation formula:

[0074] V in =V DC +AMPsin(2πft)

[0075] where, V in is the input signal, V DC is the center voltage, the AMP is the amplitude to be measured, f is the frequency, and t is the time.

[0076] In some alternative embodiments, the first reference voltage approaches the center voltage from the voltage peak, and the second reference voltage approaches the center voltage from the voltage valley.

[0077] In some alternative embodiments, the method may further include steps S700 - S800:

[0078] S700. Output the first DC signal to the first LED lamp, and visually characterize the positive peak value of the first input signal through the first LED lamp;

[0079] S800. Output the first DC signal to the first LED lamp, and visually characterize the positive peak value of the first input signal through the first LED lamp.

[0080] Specifically in the embodiment, the input and output waveforms of the embodiment are as Figure 6 shown. As a comparison group, due to the forward - conduction and reverse - cut - off characteristics of the diode, when two diodes with different inputs are co - output, the output value will be determined by the higher input. And for the reference group, since the inputs are all V p , the output is only determined by V p . Figure 6 In p , when the reference voltage V inmax is higher than V 1 , ideally D2 conducts and D1 cuts off, and V 2 = V p ; in the lower half, when the reference voltage V inmax is lower than V 1 , D1 and D2 conduct alternately, and the output has periodic pulses. If a capacitor is connected later, it can be charged to accumulate voltage. Therefore, V 2 . Based on this, by changing V ref for voltage scanning, gradually decreasing from a voltage value higher than the maximum value of the signal to be measured to a value lower than the maximum value, it can be observed that the output of the comparator switches from low level to high level, and more obviously, it can be characterized by the on - off of the LED. It can be considered that the V p when the output level changes is the input V inmax . Similarly, the valley value can be measured, and the amplitude can be calculated.

[0081] In some alternative embodiments, the method of the embodiment may further include steps S900 - S910:

[0082] S900. Obtain the historical record, and obtain the mapping relationship between the amplitude of the second input signal and the third reference voltage in the historical record;

[0083] S910. Obtain the calibration value according to the mapping relationship, and calibrate the first reference voltage and / or the second reference voltage according to the calibration value.

[0084] Specifically, in the embodiment, the ideal comparator has an infinite gain and a highly symmetric circuit structure without input offset voltage, and the output can be quickly flipped when the difference between the input signals jumps. However, limited by the input offset voltage and finite gain, the comparator requires a certain difference between the input signals to output a flip. Therefore, the recorded V ref will be smaller than the actual value. To reduce the error, calibration processing is required. By sampling in advance to obtain the relationship between the amplitude AMP of V at different frequencies and V in and fitting to obtain the calibration value, the measured V ref is calibrated according to the calibration table during actual application. ref

[0085] It should be noted that in the embodiment, an external FPGA can be used to generate the reference signal V ref , and the output of the comparator is digitally processed and connected to the PC side. The PC side program determines whether V ref is adjusted in place, so that the entire system can achieve automation.

[0086] On the other hand, the technical solution of the present application also provides a device for detecting the voltage amplitude, and the device includes:

[0087] At least one processor;

[0088] At least one memory for storing at least one program;

[0089] When the at least one program is executed by the at least one processor, the at least one processor runs a method for detecting the voltage amplitude as described in the first aspect.

[0090] From the above specific implementation process, it can be summarized that the technical solution provided by the present invention has the following advantages or advantages compared with the prior art:

[0091] The technical solution of the present application can realize the detection of the voltage amplitude of periodic interference without relying on waveform measurement instruments such as oscilloscopes by adjusting the input DC signal, has high cost performance, and has a higher applicable frequency range than the traditional peak detection circuit.

[0092] In some alternative embodiments, the functions / operations recited in the block diagrams may not occur in the order presented in the operational illustrations. For example, depending on the functions / operations involved, two blocks shown in succession may actually be executed substantially simultaneously or the blocks may sometimes be executed in reverse order. Further, the embodiments presented and described in the flowcharts of the present invention are provided by way of example in order to provide a more thorough understanding of the technology. The disclosed methods are not limited to the operations and logic flows presented herein. Alternative embodiments are envisioned in which the order of various operations is altered and in which sub-operations described as part of a larger operation are executed independently.

[0093] Moreover, although the present invention has been described in the context of functional modules, it should be understood that one or more of the functions and / or features may be integrated in a single physical device and / or software module unless otherwise stated to the contrary, or one or more functions and / or features may be implemented in separate physical devices or software modules. It should also be understood that a detailed discussion of the actual implementation of each module is not necessary for an understanding of the present invention. Rather, given the attributes, functions, and internal relationships of the various functional modules in the devices disclosed herein, the actual implementation of such modules would be within the ordinary skill of an engineer. Accordingly, those of ordinary skill in the art will be able to implement the present invention as set forth in the claims without undue experimentation. It should also be understood that the specific concepts disclosed are illustrative only and are not intended to limit the scope of the present invention, which is determined by the full scope of the appended claims and their equivalents.

[0094] The logic and / or steps represented in the flowchart or otherwise described herein, for example, can be considered a sequenced listing of executable instructions for implementing logical functions and can be embodied in any computer-readable medium for use by or in connection with an instruction execution system, apparatus, or device, such as a computer-based system, a system including a processor, or other systems that can fetch and execute instructions from the instruction execution system, apparatus, or device.

[0095] In the description of this specification, the descriptions with reference to the terms "one embodiment", "some embodiments", "example", "specific example", or "some examples", etc. mean that the specific features, structures, materials, or characteristics described in connection with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials, or characteristics described may be combined in any one or more embodiments or examples in a suitable manner.

[0096] Although embodiments of the present invention have been shown and described, those of ordinary skill in the art can understand that various changes, modifications, substitutions, and variations can be made to these embodiments without departing from the principles and spirit of the present invention. The scope of the present invention is defined by the claims and their equivalents.

[0097] The above is a specific description of the preferred embodiments of the present invention, but the present invention is not limited to the above embodiments. Those skilled in the art can make various equivalent deformations or substitutions without departing from the spirit of the present invention, and these equivalent deformations or substitutions are all included within the scope defined by the claims of this application.

Claims

1. A method for detecting voltage amplitude, characterized in that, it includes the following steps: Obtain the disturbed voltage to get the first input signal, and obtain the first reference voltage and the second reference voltage generated by the field programmable gate array; Input the first input signal and the first reference voltage into the first diode module in the positive peak detection module for comparison, and output the comparison result to obtain the first voltage value; Input the first reference voltage into the second diode module in the positive peak detection module, and output to obtain the second voltage value; Input the first input signal and the second reference voltage into the third diode module in the negative peak detection module for comparison, and output the comparison result to obtain the third voltage value; Input the second reference voltage into the fourth diode module in the negative peak detection module, and output to obtain the fourth voltage value; Perform a secondary comparison on the first voltage value and the second voltage value and output to obtain the first DC signal, and determine the positive peak of the first input signal according to the first DC signal; Perform a secondary comparison on the third voltage value and the fourth voltage value and output to obtain the second DC signal, and determine the negative peak of the first input signal according to the second DC signal.

2. The method for detecting voltage amplitude according to claim 1, characterized in that, the first input signal includes a center voltage and a part to be measured for amplitude; The center voltage and the part to be measured for amplitude satisfy the following calculation formula: V in = V DC + AMPsin(2πft) where V in is the input signal, V DC is the center voltage, the AMP is the amplitude to be measured, f is the frequency, and t is the time.

3. The method for detecting voltage amplitude according to claim 2, characterized in that, the first reference voltage approaches the center voltage from the voltage peak, and the second reference voltage approaches the center voltage from the voltage valley.

4. The method for detecting voltage amplitude according to claim 1, characterized in that, the method further includes the following steps: Output the first DC signal to the first LED lamp, and visually characterize the positive peak of the first input signal through the first LED lamp; Output the second DC signal to the second LED lamp, and visually characterize the negative peak of the first input signal through the second LED lamp.

5. The method for detecting voltage amplitude according to claim 1, characterized in that, the method further includes the following steps: Obtain the historical record, and obtain the mapping relationship between the amplitude of the second input signal in the historical record and the third reference voltage; Fit the calibration value according to the mapping relationship, and calibrate the first reference voltage and / or the second reference voltage according to the calibration value.

6. A system for detecting voltage amplitude, characterized in that, used to implement the method for detecting voltage amplitude according to any one of claims 1-5, and the system includes a positive peak detection module and a negative peak detection module; The positive peak detection module is used to compare according to the first input signal and the first reference voltage, and determine the positive peak of the first input signal according to the comparison result; The negative peak detection module is used to compare according to the first input signal and the second reference voltage, and determine the negative peak of the first input signal according to the comparison result; The positive peak detection module includes a first diode module, a second diode module, and a first comparator; the input end of the first diode module is connected to the first input signal and the first reference voltage, and the output end of the first diode module is connected to the negative input of the first comparator; the input end of the second diode module is connected to the first reference voltage, and the output end of the second diode module is connected to the positive input of the first comparator; The negative peak detection module includes a third diode module, a fourth diode module, and a second comparator; the input end of the third diode module is connected to the second reference voltage, and the output end of the third diode module is connected to the negative input of the second comparator; the input end of the fourth diode module is connected to the first input signal and the second reference voltage, and the output end of the fourth diode module is connected to the positive input of the second comparator.

7. The system for voltage amplitude detection according to claim 6, wherein, the system further includes a first LED lamp and a second LED lamp; the positive electrode of the first LED lamp is connected to the output end of the first comparator, and the negative electrode of the first LED lamp is grounded; the positive electrode of the second LED lamp is connected to the output end of the second comparator, and the negative electrode of the second LED lamp is grounded.

8. The system for voltage amplitude detection according to claim 6, wherein, the first diode module includes a first diode, a second diode, and a first RC sub-circuit; the negative electrode of the first diode is connected to one end of the first RC sub-circuit, the negative electrode of the second diode is connected to one end of the first RC sub-circuit, and the other end of the first RC sub-circuit is grounded; the structure of the second diode module is the same as that of the first diode module.

9. The system for voltage amplitude detection according to claim 6, wherein, the third diode module includes a third diode, a fourth diode, and a second RC sub-circuit; the negative electrode of the third diode is connected to one end of the second RC sub-circuit, the negative electrode of the fourth diode is connected to one end of the second RC sub-circuit, and the other end of the second RC sub-circuit is connected to the supply voltage; the structure of the fourth diode module is the same as that of the third diode module.

10. A device for voltage amplitude detection, wherein, it includes: at least one processor; at least one memory for storing at least one program; when the at least one program is executed by the at least one processor, the at least one processor runs a method for voltage amplitude detection according to any one of claims 1-5.

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