Display panel and display device

Abstract

The embodiment of the present application provides a display panel and a display device, wherein the display panel has a display area and a non-display area, the display panel includes a component to be tested and a test element group, the test element group includes a test signal line, a first test electrode, a second test electrode, and a connecting lead, one end of the test signal line is used to connect the component to be tested, and the other end is connected to the first test electrode, the connecting lead connects the first test electrode and the second test electrode, the first test electrode and the second test electrode are located in the non-display area, and the second test electrode is configured to have a one-to-one position correspondence with the probe of the probe fixture. Since the position of the second test electrode corresponds to the position of the probe of the probe fixture, that is, the position of the second test electrode of different display panels is fixed, the TSP tests of different display panels can share the same probe fixture, which is conducive to reducing the difficulty of TSP testing and improving the efficiency of TSP testing.

Description

Technical Field

[0001] The present application relates to the field of display technology, and in particular to a display panel and a display device. Background Art

[0002] Flexible AM-OLED (Active Matrix Organic Light Emitting Diode) display panels are widely used in mobile phones and wearable products due to their advantages such as high chromaticity, high contrast, wide viewing angle and flexibility.

[0003] The flexible display panel generally includes a touch layer, which is provided with touch electrodes and touch signal lines. The touch signal lines are composed of touch signal transmitting lines and touch signal receiving lines. The touch signal lines are used to connect the touch electrodes and the driving circuit to realize the touch function of the display panel. In the stage of making the touch signal line, the display panel is generally subjected to TSP (Touch Sensor Panel) test to detect the open circuit or short circuit of the touch signal line. Specifically, a test element group is provided on the display panel, and the test element group includes a test signal line and a test electrode. The test electrode is arranged in the non-display area of ​​the display panel. During the TSP test, a voltage is applied to the test electrode using the probe of the probe fixture and the received test signal is judged to detect the open circuit or short circuit of the touch signal line.

[0004] In the related art, the positions of the test electrodes are arranged according to the display panel. For display panels of different sizes or specifications, the test electrodes are arranged at different positions. However, the arrangement positions of the probes in the probe fixture are fixed. This results in that the same probe fixture cannot be applied to TSP tests of different display panels, and TSP tests of display panels are more difficult. Summary of the invention

[0005] The purpose of the embodiments of the present application is to provide a display panel and a display device to solve the technical problem that the probe fixture cannot be applied to TSP tests of different display panels. The specific technical solution is as follows:

[0006] An embodiment of the first aspect of the present application provides a display panel having a display area and a non-display area, the display panel comprising: a component to be tested; a test element group, the test element group comprising a test signal line, a first test electrode, a second test electrode and a connecting lead, one end of the test signal line is used to connect the component to be tested, the other end of the test signal line is connected to the first test electrode, the connecting lead connects the first test electrode with the second test electrode, the first test electrode and the second test electrode are located in the non-display area, and the second test electrode is configured to have a one-to-one position correspondence with the probe of the probe fixture.

[0007] The display panel of the embodiment of the present application is provided with a first test electrode and a second test electrode, the first test electrode and the second test electrode are located in a non-display area, the position of the first test electrode is arranged according to the specifications of the display panel, and the second test electrode has a one-to-one correspondence with the probe of the probe fixture. The first test electrode is connected to the component to be tested through a test signal line, and the second test electrode is connected to the first test electrode through a connecting lead. When performing the TSP test, a voltage is applied to the second test electrode using the probe of the probe fixture and the received test signal is judged to detect the open circuit or short circuit of the component to be tested. For display panels of different specifications or different sizes, the arrangement position of the first test electrode may be different, but since the position of the second test electrode corresponds to the position of the probe of the probe fixture, that is, the position of the second test electrode of different display panels is fixed, the TSP test of different display panels can share the same probe fixture, which is conducive to reducing the difficulty of the TSP test, facilitating operation, and improving the efficiency of the TSP test.

[0008] In some embodiments of the present application, in the display area, the display panel includes a touch layer, the touch layer is provided with touch electrodes and touch signal lines, the touch electrodes include touch transmitting electrodes and touch receiving electrodes, the touch transmitting electrodes and the touch receiving electrodes are located in the display area, the touch signal lines include touch signal transmitting lines and touch signal receiving lines, and the component to be tested includes the touch signal lines.

[0009] In some embodiments of the present application, the touch layer includes a first touch metal layer and a second touch metal layer, the display panel also includes an array substrate, and the first test electrode includes a first electrode portion formed on the array substrate and a second electrode portion arranged on the same layer as the first touch metal layer or the second touch metal layer.

[0010] In some embodiments of the present application, the touch layer includes a first touch metal layer and a second touch metal layer, and the second test electrode is disposed in the same layer as the first touch metal layer or the second touch metal layer.

[0011] In some embodiments of the present application, the touch transmitting electrode and the touch receiving electrode are arranged in the same layer, the touch transmitting electrode and the touch receiving electrode are located in the first touch metal layer, or the touch transmitting electrode and the touch receiving electrode are located in the second touch metal layer, and the second test electrode is arranged in the same layer as the touch electrode.

[0012] In some embodiments of the present application, the touch transmitting electrode and the touch receiving electrode are arranged in different layers, the touch transmitting electrode is located in one of the first touch metal layer or the second touch metal layer, the touch receiving electrode is located in the other of the first touch metal layer or the second touch metal layer, the second test electrode is arranged in the same layer as the touch transmitting electrode, or the second test electrode is arranged in the same layer as the touch receiving electrode.

[0013] In some embodiments of the present application, the display panel includes an array substrate, the array substrate includes a planarization layer, the touch layer also includes a touch insulation layer arranged between the first touch metal layer and the second touch metal layer, the second test electrode is arranged on the same layer as the second touch metal layer, and the touch insulation layer extends to the non-display area and is located between the planarization layer and the second test electrode.

[0014] In some embodiments of the present application, a plurality of the first test electrodes and the second test electrodes are provided, the first test electrodes are connected to the second test electrodes in a one-to-one correspondence, and the lead lengths between the first test electrodes and the second test electrodes are equal.

[0015] In some embodiments of the present application, there are multiple first test electrodes and multiple second test electrodes, the number of second test electrodes is greater than the number of first test electrodes, some of the second test electrodes are connected to the first test electrodes one-to-one, and some of the second test electrodes are reserved test electrodes.

[0016] An embodiment of a second aspect of the present application provides a display device, comprising a display panel according to any of the above embodiments.

[0017] The display device of the embodiment of the present application includes a display panel, the display panel is provided with a first test electrode and a second test electrode, the first test electrode and the second test electrode are located in a non-display area, the position of the first test electrode is arranged according to the specifications of the display panel, and the second test electrode has a one-to-one correspondence with the probe of the probe fixture. The first test electrode is connected to the component to be tested through a test signal line, and the second test electrode is connected to the first test electrode through a connecting lead. When performing a TSP test, a voltage is applied to the second test electrode using the probe of the probe fixture and the received test signal is judged to detect the open circuit or short circuit of the component to be tested. For display panels of different specifications or different sizes, the arrangement position of the first test electrode may be different, but since the position of the second test electrode corresponds to the position of the probe of the probe fixture, that is, the position of the second test electrode of different display panels is fixed, the TSP test of different display panels can share the same probe fixture, which is conducive to reducing the difficulty of the TSP test, facilitating operation, and improving the efficiency of the TSP test. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application, and for ordinary technicians in this field, other embodiments can also be obtained based on these drawings.

[0019] Figure 1 A schematic plan view of a display panel according to an embodiment of the present application;

[0020] Figure 2 A cross-sectional view of a touch layer at AA of a display panel according to the first embodiment of the present application;

[0021] Figure 3 A cross-sectional view of a touch layer at AA of a display panel according to a second embodiment of the present application;

[0022] Figure 4 A schematic diagram of the arrangement of a test element group of a display panel according to an embodiment of the present application;

[0023] Figure 5 The film layer structure of the first test electrode of the display panel according to the embodiment of the present application;

[0024] Figure 6 The film layer structure of the non-display area where the second test electrode of the display panel of the embodiment of the present application is located;

[0025] Figure 7 Schematic diagram of the structure of an array substrate of a display panel according to an embodiment of the present application. DETAILED DESCRIPTION

[0026] The following will be combined with the drawings in the embodiments of the present application to clearly and completely describe the technical solutions in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all of the embodiments. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in this field based on the present application belong to the scope of protection of the present application.

[0027] like Figure 1 and Figure 4 As shown, an embodiment of the first aspect of the present application provides a display panel 10. The display panel 10 has a display area AA and a non-display area, and the display panel 10 includes a component to be tested and a test element group 100. The test element group 100 includes a test signal line 103, a first test electrode 101, a second test electrode 102 and a connecting lead 104, one end of the test signal line 103 is used to connect the component to be tested, the other end of the test signal line 103 is connected to the first test electrode 101, the connecting lead 104 connects the first test electrode 101 and the second test electrode 102, the first test electrode 101 and the second test electrode 102 are located in the non-display area, and the second test electrode 102 is configured to have a one-to-one position correspondence with the probe of the probe fixture.

[0028] The display panel 10 of the embodiment of the present application is provided with a first test electrode 101 and a second test electrode 102, the first test electrode 101 and the second test electrode 102 are located in the non-display area, the position of the first test electrode 101 is arranged according to the specification of the display panel 10, and the second test electrode 102 has a one-to-one position correspondence with the probe of the probe fixture. The first test electrode 101 is connected to the component to be tested through the test signal line 103, and the second test electrode 102 is connected to the first test electrode 101 through the connecting lead 104. When performing the TSP test, a voltage is applied to the second test electrode 102 using the probe of the probe fixture and the received test signal is judged to detect the open circuit or short circuit of the component to be tested. For display panels 10 of different specifications or sizes, the arrangement position of the first test electrode 101 may be different, but since the second test electrode 102 corresponds one-to-one to the position of the probe of the probe fixture, that is, the position of the second test electrode 102 of different display panels 10 is fixed, the TSP tests of different display panels 10 can share the same probe fixture, which is beneficial to reduce the difficulty of TSP testing, facilitate operation, and improve TSP testing efficiency.

[0029] like Figure 1As shown, in some embodiments of the present application, in the display area AA, the display panel 10 includes a touch layer 200, the touch layer 200 is provided with touch electrodes and touch signal lines, the touch electrodes include touch transmitting electrodes 201 and touch receiving electrodes 202, the touch transmitting electrodes 201 and the touch receiving electrodes 202 are located in the display area AA, the touch signal lines include touch signal transmitting lines and touch signal receiving lines, and the component to be tested includes touch signal lines. In the embodiment of the present application, the touch function is realized by setting the touch layer 200. The touch function can be implemented using the mutual capacitance touch principle. Specifically, when the user touches the touch layer 200, the capacitance between the touch transmitting electrode 201 and the touch receiving electrode 202 at the touch position will change. The driving circuit of the display panel 10 transmits the transmission signal to the touch transmitting electrode 201 through the touch signal transmitting line, and receives the signal from the touch receiving electrode 202 through the touch signal receiving line, thereby obtaining the capacitance value of the intersection of the touch transmitting electrode 201 and the touch receiving electrode 202, that is, the capacitance value of the two-dimensional plane of the entire display panel 10. According to the change in the capacitance value, the coordinates of the touch point are calculated, thereby realizing the touch function.

[0030] In some embodiments of the present application, the touch layer 200 is directly formed on the display panel 10 using the Flexible Multilayer OnCell (FMLOC) technology. The touch layer 200 may include a touch metal layer, a touch insulating layer, a barrier layer, and a protective film layer, etc. These film layers are directly made on the encapsulation layer of the display panel 10 through processes such as deposition, exposure, development, and etching, thereby achieving integration with the display panel 10, which is conducive to the thinning of the display device. Among them, the touch metal layer is used to form touch electrodes and touch signal lines.

[0031] In some embodiments of the present application, the touch layer 200 includes a first touch metal layer 220 and a second touch metal layer 240, the display panel 10 further includes an array substrate 300, and the first test electrode 101 includes a first electrode portion 1011 formed on the array substrate 300 and a second electrode portion 1012 disposed in the same layer as the first touch metal layer 220 or the second touch metal layer 240. Thus, the first test electrode 101 can be used to test the thin film transistor 310 of the array substrate 300, and can also be used to test the touch layer 200.

[0032] Specifically, if Figure 7As shown, the array substrate 300 is located below the touch layer 200. The array substrate 300 includes a substrate layer 301, a driving layer 302, a display layer 303 and a packaging layer 304. The driving layer 302 includes a first insulating layer 3021, a second insulating layer 3022, an interlayer dielectric layer 3023 and a planarization layer stacked in sequence. The array substrate 300 is provided with a thin film transistor 310. The thin film transistor 310 includes a gate 312, an active area 311, a source 313 and a drain 314. The source 313 and the drain 314 are arranged in the same layer. The layer where the source 313 and the drain 314 are located is a source-drain electrode layer. The source 313 and the drain 314 are connected to the active area 311 respectively. The array substrate 300 is also provided with an organic light-emitting device 330, which includes an anode 331, a light-emitting layer 332 and a cathode 333. The drain electrode 314 of the thin film transistor 310 is connected to the anode 331 of the organic light-emitting device 330, and the thin film transistor 310 is used to control the organic light-emitting device 330. During manufacturing, the first electrode portion 1011 of the first test electrode 101 is formed while the source and drain electrodes of the thin film transistor 310 are formed, and the thin film transistor 310 of the array substrate 300 is tested through the first electrode portion 1011. The second electrode portion 1012 of the first test electrode 101 is formed while the touch electrode is formed, and the touch layer 200 is tested through the second electrode portion 1012.

[0033] like Figure 5 and Figure 7 As shown, in some embodiments of the present application, a first source-drain electrode layer 321 and a second source-drain electrode layer 322 are disposed on the array substrate 300, and a first electrode portion 1011 of the first test electrode 101 includes both a portion formed in the first source-drain electrode layer 321 and a portion formed in the second source-drain electrode layer 322, and the first test electrode 101 can test the thin film transistor. The second electrode portion 1012 is disposed in the same layer as the second touch metal layer 240.

[0034] In some embodiments of the present application, the touch layer 200 includes a first touch metal layer 220 and a second touch metal layer 240, and the second test electrode 102 is disposed in the same layer as the first touch metal layer 220 or the second touch metal layer 240. In the embodiment of the present application, the second test electrode 102 is used to perform a TSP test on the touch layer 200, and the second test electrode 102 is disposed in the same layer as the first touch metal layer 220 or the second touch metal layer 240, so that the process of the second test electrode 102 is relatively simple.

[0035] In some embodiments of the present application, the touch transmitting electrode 201 and the touch receiving electrode 202 are arranged in the same layer, the touch transmitting electrode 201 and the touch receiving electrode 202 are located in the first touch metal layer 220, or the touch transmitting electrode 201 and the touch receiving electrode 202 are located in the second touch metal layer 240, and the second test electrode 102 is arranged in the same layer as the touch electrode. Therefore, the second test electrode 102 can be formed with the touch electrode through a single patterning process, thereby reducing the preparation process and saving costs.

[0036] like Figure 2 As shown, in a specific embodiment, the touch layer 200 includes a buffer layer 210, a first touch metal layer 220, an insulating layer 230, a second touch metal layer 240 and a protective film layer 250 which are stacked in sequence, wherein the touch transmitting electrode 201 and the touch receiving electrode 202 are both located in the second touch metal layer 240, one of the touch transmitting electrode 201 or the touch receiving electrode 202 is directly connected to the second touch metal layer 240, and the other of the touch transmitting electrode 201 or the touch receiving electrode 202 is connected through the first touch metal layer 220, and the first touch metal layer 220 is used to form a bridge layer. The second test electrode 102 is arranged in the same layer as the second touch metal layer 240. The second electrode portion of the first test electrode 101 is also arranged in the same layer as the second touch metal layer 240, thereby facilitating the arrangement of the test signal line 103 and the arrangement of the connecting lead 104 between the first test electrode 101 and the second test electrode 102.

[0037] In some embodiments of the present application, the touch transmitting electrode 201 and the touch receiving electrode 202 are arranged in different layers, the touch transmitting electrode 201 is located in one of the first touch metal layer 220 or the second touch metal layer 240, and the touch receiving electrode is located in the other of the first touch metal layer 220 or the second touch metal layer 240. The second test electrode 102 is arranged in the same layer as the touch transmitting electrode 201. Therefore, the second test electrode 102 can be formed with the touch transmitting electrode 201 through a single patterning process, thereby reducing the preparation process and saving costs.

[0038] like Figure 3As shown, in a specific embodiment, the touch layer 200 includes a buffer layer 210, a first touch metal layer 220, an insulating layer 230, a second touch metal layer 240 and a protective film layer 250 which are stacked in sequence. The touch transmitting electrode 201 is located in the second touch metal layer 240, and the touch receiving electrode 202 is located in the first touch metal layer 220. The second test electrode 102 and the second electrode portion of the first test electrode 101 are arranged in the same layer as the touch transmitting electrode 201, so that the test signal line 103 is in the same layer as the touch signal transmitting line and is directly connected, and the test signal line 103 is connected to the touch signal receiving line formed in the first touch metal layer 220 through a via arranged in the touch insulating layer 230.

[0039] In some embodiments of the present application, the touch transmitting electrode 201 and the touch receiving electrode 202 are arranged in different layers, the touch transmitting electrode 201 is located in one of the first touch metal layer 220 or the second touch metal layer 240, the touch receiving electrode 202 is located in the other of the first touch metal layer 220 or the second touch metal layer 240, and the second test electrode 102 is arranged in the same layer as the touch receiving electrode 202. Therefore, the second test electrode 102 can be formed with the touch receiving electrode 202 through a single patterning process, thereby reducing the preparation process and saving costs.

[0040] In some embodiments of the present application, the display panel 10 includes an array substrate 300, the array substrate 300 includes a planarization layer, the touch layer 200 further includes a touch insulation layer 230 disposed between the first touch metal layer 220 and the second touch metal layer 240, the second test electrode 102 is disposed in the same layer as the second touch metal layer 240, and the touch insulation layer 230 extends to a non-display area and is located between the planarization layer and the second test electrode 102. Considering that when a probe is used to perform a TSP test, the probe will apply a certain pressure to the second test electrode 102, by extending the touch insulation layer 230 to the non-display area and being located between the planarization layer and the second test electrode 102, the planarization layer and the touch insulation layer 230 can provide support for the second test electrode 102, thereby preventing the second test electrode 102 from being pierced by the probe during the TSP test.

[0041] Specifically, if Figure 2 , Figure 3 , Figure 6 as well as Figure 7 As shown, the planarization layer may include a first planarization layer 3024 and a second planarization layer 3025. Thus, the support of the planarization layer to the second test electrode 102 can be further increased, effectively preventing the second test electrode 102 from being pierced by a probe during TSP testing.

[0042] like Figure 4As shown, in some embodiments of the present application, a plurality of first test electrodes 101 and second test electrodes 102 are provided, the first test electrodes 101 and the second test electrodes 102 are connected one-to-one, and the lead lengths between the first test electrodes 101 and the second test electrodes 102 are equal. In the embodiment of the present application, by connecting the first test electrodes 101 and the second test electrodes 102 one-to-one, the arrangement of the connecting lead 104 is simple and convenient. The lead lengths between the first test electrode 101 and the second test electrode 102 are equal, which can effectively reduce the impedance between the connecting leads 104, reduce the influence of the impedance on the test effect, and improve the accuracy of the test.

[0043] like Figure 4 As shown, in some embodiments of the present application, a plurality of first test electrodes 101 and second test electrodes 102 are provided, the number of second test electrodes 102 is greater than that of first test electrodes 101, some second test electrodes 102 are connected to first test electrodes 101 in a one-to-one correspondence, and some second test electrodes 102 are reserved test electrodes. Considering that as the product is updated, the function of the product will be expanded accordingly, and the number of touch signal lines may also increase, by setting the reserved test electrode, the second test electrode 102 can be used for TSP testing of the updated product.

[0044] An embodiment of a second aspect of the present application provides a display device, comprising a display panel 10 of any of the above embodiments.

[0045] The display device of the embodiment of the present application includes a display panel 10, and the display panel 10 is provided with a first test electrode 101 and a second test electrode 102. The first test electrode 101 and the second test electrode 102 are located in a non-display area, and the position of the first test electrode 101 is arranged according to the specification of the display panel 10, and the second test electrode 102 has a one-to-one position correspondence with the probe of the probe fixture. The first test electrode 101 is connected to the component to be tested through a test signal line 103, and the second test electrode 102 is connected to the first test electrode 101 through a connecting lead 104. When performing a TSP test, a voltage is applied to the second test electrode 102 using the probe of the probe fixture and the received test signal is judged to detect the open circuit or short circuit of the component to be tested. For display panels 10 of different specifications or sizes, the arrangement position of the first test electrode 101 may be different, but since the second test electrode 102 corresponds one-to-one to the position of the probe of the probe fixture, that is, the position of the second test electrode 102 of different display panels 10 is fixed, the TSP tests of different display panels 10 can share the same probe fixture, which is beneficial to reduce the difficulty of TSP testing, facilitate operation, and improve TSP testing efficiency.

[0046] It should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the sentence "comprise a ..." do not exclude the existence of other identical elements in the process, method, article or device including the elements.

[0047] Each embodiment in this specification is described in a related manner, and the same or similar parts between the embodiments can be referred to each other, and each embodiment focuses on the differences from other embodiments. In particular, for the system embodiment, since it is basically similar to the method embodiment, the description is relatively simple, and the relevant parts can be referred to the partial description of the method embodiment.

[0048] The above are only preferred embodiments of the present application and are not intended to limit the protection scope of the present application. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principles of the present application are included in the protection scope of the present application.

Claims

1. A display panel, characterized in that: The display panel has a display area and a non-display area, and includes: Components to be tested; A test element group, the test element group comprising a test signal line, a first test electrode, a second test electrode and a connecting lead, one end of the test signal line is used to connect the component to be tested, the other end of the test signal line is connected to the first test electrode, the connecting lead connects the first test electrode and the second test electrode, the first test electrode and the second test electrode are located in the non-display area, and the second test electrode is configured to have a one-to-one position correspondence with the probe of the probe fixture; The display panel includes a touch layer; the touch layer includes a first touch metal layer and a second touch metal layer; The display panel further includes an array substrate; the array substrate is located below the touch layer; The first test electrode includes a first electrode portion formed on the array substrate and a second electrode portion disposed in the same layer as the first touch metal layer or the second touch metal layer.

2. The display panel according to claim 1, characterized in that: In the display area, the touch layer is provided with touch electrodes and touch signal lines, the touch electrodes include touch transmitting electrodes and touch receiving electrodes, the touch transmitting electrodes and the touch receiving electrodes are located in the display area, the touch signal lines include touch signal transmitting lines and touch signal receiving lines, and the component to be tested includes the touch signal lines.

3. The display panel according to claim 2, characterized in that: The second test electrode is disposed in the same layer as the first touch metal layer or the second touch metal layer.

4. The display panel according to claim 3, characterized in that: The touch transmitting electrode and the touch receiving electrode are arranged in the same layer, and the touch transmitting electrode and the touch receiving electrode are located in the first touch metal layer, or the touch transmitting electrode and the touch receiving electrode are located in the second touch metal layer, and the second test electrode and the touch electrode are arranged in the same layer.

5. The display panel according to claim 3, characterized in that: The touch transmitting electrode and the touch receiving electrode are arranged in different layers, the touch transmitting electrode is located in one of the first touch metal layer or the second touch metal layer, the touch receiving electrode is located in the other of the first touch metal layer or the second touch metal layer, the second test electrode and the touch transmitting electrode are arranged in the same layer, or the second test electrode and the touch receiving electrode are arranged in the same layer.

6. The display panel according to claim 3, characterized in that: The array substrate includes a planarization layer, the touch layer also includes a touch insulation layer arranged between the first touch metal layer and the second touch metal layer, the second test electrode is arranged in the same layer as the second touch metal layer, and the touch insulation layer extends to the non-display area and is located between the planarization layer and the second test electrode.

7. The display panel according to claim 1, characterized in that: A plurality of the first test electrodes and the second test electrodes are provided, the first test electrodes are connected to the second test electrodes in a one-to-one correspondence, and the lead lengths between the first test electrodes and the second test electrodes are equal.

8. The display panel according to claim 1, characterized in that: There are multiple first test electrodes and multiple second test electrodes, the number of the second test electrodes is greater than the number of the first test electrodes, some of the second test electrodes are connected to the first test electrodes in a one-to-one correspondence, and some of the second test electrodes are reserved test electrodes.

9. A display device, characterized in that: The invention comprises a display panel according to any one of claims 1 to 8.

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