An electronic transport coupling simulation method, system, storage medium, and electronic device

Abstract

This invention relates to the field of electron transport simulation technology, and more particularly to an electron transport coupling simulation method, system, storage medium, and electronic device. The method includes: establishing a simulation model incorporating physical and geometric information based on the electron transport problem to be simulated using the Monte Carlo method; pre-setting multiple counters in the simulation model, and dividing the simulation model into a first region and a second region according to the energy range of each counter; simulating the transport process of each electron in the simulation model using the Monte Carlo method and transport equations based on the first and second regions, and calculating the solution for each electron. Dividing the simulation model into a first and second region according to the energy range of each counter, and simulating the transport process of each electron in the simulation model using the Monte Carlo method and transport equations, effectively reduces simulation time and improves simulation efficiency while ensuring simulation accuracy.

Description

Technical Field

[0001] This invention relates to the field of electronic transport simulation technology, and in particular to an electronic transport coupling simulation method, system, storage medium, and electronic device. Background Technology

[0002] Electron transport plays a crucial role in nuclear science and technology, with wide applications in experimental nuclear physics, environmental monitoring, and detector research. Because the energy loss from each collision during electron transport within matter is minimal, the electron's trajectory consists of numerous small-energy-transfer collisions. To reduce computational complexity, Monte Carlo simulations of electrons typically employ the condensed history method. The main idea of ​​the condensed history method is to divide the actual physical random walk into several historical stages, such that each stage contains several walks. In other words, the condensed history method merges multiple random collisions into a single collision, with the energy loss and flight direction shift of each collision determined by multiple scattering theory. There are two types of condensed history methods: Type I Monte Carlo condensed history methods and Type II Monte Carlo condensed history methods, specifically:

[0003] The first type of Monte Carlo enrichment history method does not model any reaction separately, while the second type of Monte Carlo enrichment history method models and calculates reactions that are significantly affected by electronic states separately, such as bremsstrahlung, scattering, and ionization reactions.

[0004] Practice has shown that the second type of Monte Carlo enrichment history method has high accuracy, but it requires sampling of reaction types, which reduces simulation efficiency. The first type of Monte Carlo enrichment history method does not model the details of the reactions, making it unable to accurately simulate the entire electron transport problem, but it avoids sampling of nuclear reactions, resulting in higher simulation efficiency. Therefore, there is a need for an electron transport simulation method that can improve both simulation accuracy and efficiency. Summary of the Invention

[0005] The technical problem to be solved by the present invention is to address the shortcomings of the prior art by providing an electronic transport coupling simulation method, system, storage medium and electronic device.

[0006] The technical solution of the electronic transport coupling simulation method of the present invention is as follows:

[0007] Based on the electron transport problem to be simulated, a simulation model including physical and geometric information is established using the Monte Carlo method.

[0008] In the simulation model, multiple counts are preset, and the simulation model is divided into a first region and a second region according to the energy range of each count;

[0009] Based on the first region and the second region, the transport process of each electron in the simulation model is simulated using the Monte Carlo method and combined with the transport equation, and the solution for each electron is calculated.

[0010] The beneficial effects of the electronic transport coupling simulation method of the present invention are as follows:

[0011] Based on the energy range of each count in the simulation model, the simulation model is divided into a first region and a second region. The transport process of each electron in the simulation model is simulated by combining the Monte Carlo method and the transport equation. While ensuring the simulation accuracy, the simulation time can be effectively reduced and the simulation efficiency can be improved.

[0012] The technical solution of the electronic transport coupling simulation system of the present invention is as follows:

[0013] This includes module creation, module division, and calculation.

[0014] The establishment module is used to: establish a simulation model including physical and geometric information based on the electron transport problem to be simulated using the Monte Carlo method;

[0015] The partitioning module is used to: in the simulation model, preset multiple counts, and divide the simulation model into a first region and a second region according to the energy range of each count;

[0016] The calculation module is used to: simulate the transport process of each electron in the simulation model based on the first region and the second region, using the Monte Carlo method and combined with the transport equation, and calculate the solution for each electron.

[0017] The beneficial effects of the electronic transport coupling simulation system of the present invention are as follows:

[0018] Based on the energy range of each count in the simulation model, the simulation model is divided into a first region and a second region. The transport process of each electron in the simulation model is simulated by combining the Monte Carlo method and the transport equation. While ensuring the simulation accuracy, the simulation time can be effectively reduced and the simulation efficiency can be improved.

[0019] The present invention provides a storage medium storing instructions that, when read by a computer, cause the computer to execute any of the above-described electronic transport coupling simulation methods.

[0020] An electronic device according to the present invention includes a processor and the above-described storage medium, wherein the processor executes instructions in the storage medium. Attached Figure Description

[0021] Figure 1This is a flowchart illustrating an electronic transport coupling simulation method according to an embodiment of the present invention;

[0022] Figure 2 This is a schematic diagram of the first and second regions;

[0023] Figure 3 This is a schematic diagram of the structure of an electronic transport coupling simulation system according to an embodiment of the present invention. Detailed Implementation

[0024] like Figure 1 As shown, an embodiment of the present invention provides an electronic transport coupling simulation method, which includes the following steps:

[0025] S1. Based on the electronic transport problem to be simulated, a simulation model including physical and geometric information is established using the Monte Carlo method;

[0026] S2. In the simulation model, multiple counts are preset, and the simulation model is divided into a first region and a second region according to the energy range of each count.

[0027] S3. Based on the first and second regions, the transport process of each electron in the simulation model is simulated using the Monte Carlo method and combined with the transport equation, and the solution for each electron is calculated.

[0028] The electron transport problem to be simulated can be an abstraction of a practical application problem or a theoretical research problem. It mainly includes physical information and geometric information. Physical information includes the source, count, material, energy range of the simulation, bias method used, and other control parameters. Geometric information includes the geometric dimensions and their relative positions.

[0029] The number, location, and energy range of the counters are set by the user according to the actual problem being simulated.

[0030] Here, the solution is the electron fluence, and the electron fluence of any electron is used to evaluate the electron fluence, electron flow, energy deposition and dose at a specific location in the electron transport problem to be simulated.

[0031] Based on the solution for each electron, it is possible to simulate the shielding effect of an electron accelerator, the energy response of detectors such as photon detectors or electron detectors, and the therapeutic effect of photoelectron radiotherapy doses. Specifically:

[0032] 1) When simulating the shielding effect of an electron accelerator, if the shielding effect is not good, the structure of the shielding body can be improved, and the electron transport coupling simulation method of the present invention can be used to continue to improve it until the shielding effect meets the expected requirements.

[0033] 2) When simulating the energy response of detectors such as photon detectors or electronic detectors, data support is provided for the structural improvement of detectors such as photon detectors or electronic detectors;

[0034] 3) If the treatment effect of simulating the photoelectron radiotherapy dose is not good, the photoelectron radiotherapy dose can be modified, and the electronic transport coupling simulation method of this application can be used to continue to improve it until the treatment effect meets the expected requirements.

[0035] Based on the energy range of each count in the simulation model, the simulation model is divided into a first region and a second region. The transport process of each electron in the simulation model is simulated by combining the Monte Carlo method and the transport equation. While ensuring the simulation accuracy, the simulation time can be effectively reduced and the simulation efficiency can be improved.

[0036] Optionally, in the above technical solution, in S2, the simulation model is divided into a first region and a second region according to the energy range of each count, including:

[0037] S20. Calculate the upper limit of the effective electron range for each energy range according to the energy range of each count, and select the maximum effective electron range from all the upper limits of the effective electron ranges; specifically:

[0038] The energy range of each count includes an upper energy limit and an lower energy limit. The upper limit of the effective electron range of any count can be calculated based on the upper energy limit of its energy range, until the upper limits of the effective electron range of all counts are calculated. The maximum effective electron range is then determined from the upper limits of all effective electron ranges.

[0039] S21. Extend the counting region of each count in the simulation model outward by one maximum effective electron range to form multiple extended counting regions. Extend the source region in the simulation model outward by one maximum effective electron range to form an extended source region.

[0040] S22. Connect each expanded counting region to the expanded source region using tangent line segments. Define the union of each expanded counting region, the expanded source region, and the enclosing region as the second region. Define the region in the simulation model excluding the second region as the first region. The enclosing region refers to all regions formed by connecting each expanded counting region to the expanded source region. The source region refers to the preset electron source region in the simulation model used for emitting electrons. For example, using two counting regions:

[0041] like Figure 2As shown, the two counts are labeled as the first count and the second count, respectively. The counting region of the first count is extended outward by one maximum effective electron range to form the extended first counting region, denoted as A1. The counting region of the second count is extended outward by one maximum effective electron range to form the extended second counting region, denoted as A2. The source region in the simulation model is extended outward by one maximum effective electron range to form the extended source region, denoted as O1. Then:

[0042] 1) Connect A1 and O1 by means of line segments tangent to each other, connect A2 and O1, and the union of all regions formed by connecting A1, A2, O1, and A1 and O1, and all regions formed by connecting A2 and O1, is determined as the second region;

[0043] 2) Define the region in the simulation model other than the second region as the first region.

[0044] Optionally, in the above technical solution, the Monte Carlo method includes the first type of Monte Carlo enrichment history method. In S3, the process of calculating the solution for each electron includes:

[0045] S30. The sum of the upper limit of the energy range of all counted energy ranges and the energy loss of any electron in the simulation model when it completes one effective range is determined as the threshold. When any electron enters the second region, and when the energy of any electron in the second region is not greater than the threshold, the transport process of any electron is simulated using a preset method. When any electron enters the first region, the transport process of any electron is simulated using the first type of Monte Carlo condensed history method combined with the transport equation, until the energy of any electron is less than the preset minimum energy threshold. The transport process of any electron is then simulated until the transport process of every electron in the simulation model is simulated, and the solution for each electron in the simulation model is calculated. Specifically:

[0046] Let E be the upper limit of the energy range for all counts. max Let Q be the energy loss of any electron in the simulation model when it completes one effective range, and let the threshold T be: T = E max +Q.

[0047] Specifically, the energy upper limit of the energy range for all counts is determined as follows: obtain the energy upper limit of the energy range for each count, select the largest energy upper limit, and determine the largest energy upper limit as the energy upper limit of the energy range for all counts.

[0048] Optionally, in the above technical solution, in S30, the Monte Carlo method further includes a second type of Monte Carlo concentration history method. When any electron enters the second region, and when the energy of any electron in the second region is not greater than a threshold, a preset method is used to simulate the transport process of any electron, including:

[0049] S300. When any electron enters the second region, and if the energy of any electron in the second region is not greater than the threshold, the step size of the electron step is recalculated. The energy loss, angle deflection, and position caused by the updated electron step size are calculated. The electron is then simulated using the first type of Monte Carlo enrichment history method and the transport equation. After the electron step simulation with the updated step size is completed, the second type of enrichment history method is used to simulate the electron. Specifically:

[0050] The step size s of the electronic step for any electron is calculated using the first formula, which is: E represents the energy of any electron in the second region, and q represents the energy loss rate per unit distance.

[0051] The calculation of the energy loss, angular deflection, and position of any electron caused by the updated electronic step size includes:

[0052] The energy loss ΔE caused by any electron is calculated using the second formula, where ΔE = ET. The angular deflection is calculated using the third formula. Calculate the position using the fourth formula Where F is the angle deflection release function.

[0053] The transport equation is as follows:

[0054] Φ represents the position. The energy at point E is in the direction of The electron flux at time t;

[0055] S is the electron source;

[0056] ν is the velocity of the electron;

[0057] I[Φ] represents an electron collision.

[0058] The state of an electron at different times is represented by a series of values: ..., where s is the electron path length.

[0059] The solution for each electron in the simulation model is calculated. This solution is mainly used to evaluate the electron fluence, electron flow rate, energy deposition, and dose at a specific simulated location.

[0060] This application discloses an electron transport coupling simulation system, which is a Monte Carlo electron transport coupling simulation method based on energy and spatial partitioning, belonging to the field of electron radiation field calculation and analysis in nuclear physics and nuclear technology applications. Based on the condensed history electron Monte Carlo simulation, and combined with the geometric and physical characteristics of the simulation model, it performs Monte Carlo simulations on the entire model by dividing the energy threshold and spatially decomposing, using different Monte Carlo simulation strategies in different regions and energy bands. When converting from the first type of Monte Carlo condensed history method to the second type, a method of recalculating the electron step size is used, ensuring that the energy of the electron step after multiple scatterings is exactly at the threshold, thus avoiding a single electron step spanning two simulation regions. This invention uses different Monte Carlo strategies for different regions and energy bands, effectively improving simulation efficiency while maintaining accuracy.

[0061] In the above embodiments, although the steps are numbered S1, S2, etc., they are only specific embodiments given in this application. Those skilled in the art can adjust the execution order of S1, S2, etc. according to the actual situation, which is also within the protection scope of this invention. It can be understood that in some embodiments, some or all of the above embodiments may be included.

[0062] like Figure 3 As shown, an electronic transport coupling simulation system 200 according to an embodiment of the present invention includes a setup module 210, a partitioning module 220 and a calculation module 230;

[0063] Module 210 is used to: establish a simulation model including physical and geometric information based on the electronic transport problem to be simulated using the Monte Carlo method;

[0064] The partitioning module 220 is used to: in the simulation model, preset multiple counts, and divide the simulation model into a first region and a second region according to the energy range of each count;

[0065] The calculation module 230 is used to: simulate the transport process of each electron in the simulation model based on the first region and the second region, using the Monte Carlo method and in combination with the transport equation, and calculate the solution for each electron.

[0066] Based on the energy range of each count in the simulation model, the simulation model is divided into a first region and a second region. The transport process of each electron in the simulation model is simulated by combining the Monte Carlo method and the transport equation. While ensuring the simulation accuracy, the simulation time can be effectively reduced and the simulation efficiency can be improved.

[0067] Optionally, in the above technical solution, the partitioning module 220 is specifically used for:

[0068] For each energy range of the count, calculate the upper limit of the effective electron range corresponding to each energy range, and select the maximum effective electron range from all the upper limits of the effective electron range.

[0069] The counting region of each count in the simulation model is extended outward by one maximum effective electron range to form multiple extended counting regions. The source region in the simulation model is extended outward by one maximum effective electron range to form an extended source region.

[0070] By connecting each expanded counting region to the expanded source region using tangent line segments, the union of each expanded counting region, the expanded source region, and the enclosing region is defined as the second region. The region in the simulation model other than the second region is defined as the first region. The enclosing region refers to all regions formed after connecting each expanded counting region to the expanded source region.

[0071] Optionally, in the above technical solution, the Monte Carlo method includes a first type of Monte Carlo condensed history method, and the calculation module 230 is specifically used for:

[0072] The upper limit of the energy range of all counted energy ranges and the sum of the energy loss of any electron in the simulation model when it moves to complete an effective range are determined as the threshold. When any electron enters the second region, and when the energy of any electron in the second region is not greater than the threshold, the transport process of any electron is simulated using a preset method. When any electron enters the first region, the transport process of any electron is simulated using the first type of Monte Carlo condensed history method combined with the transport equation until the energy of any electron is less than the preset minimum energy threshold. The transport process of any electron is then simulated until the transport process of every electron in the simulation model is simulated, and the solution for each electron in the simulation model is calculated.

[0073] Optionally, in the above technical solution, the Monte Carlo method also includes a second type of Monte Carlo condensed history method, and the calculation module 230 is further specifically used for:

[0074] When any electron enters the second region, and if the energy of any electron in the second region is not greater than the threshold, the step size of the electron step is recalculated. The energy loss, angle deflection, and position caused by the updated electron step size are calculated. The electron is simulated by combining the first type Monte Carlo enrichment history method and the transport equation. After the electron step simulation with the updated electron step size is completed, the second type enrichment history method is used to simulate the electron.

[0075] The parameters and steps for implementing the corresponding functions of each unit module in the electronic transport coupling simulation system 200 of the present invention described above can be referred to the parameters and steps in the embodiments of the electronic transport coupling simulation method described above, and will not be repeated here.

[0076] An embodiment of the present invention provides a storage medium storing instructions, which, when read by a computer, cause the computer to execute any of the above-mentioned electronic transport coupling simulation methods.

[0077] An electronic device according to an embodiment of the present invention includes a processor and the aforementioned storage medium. The processor executes instructions in the storage medium. The electronic device may be a computer or a mobile phone, etc.

[0078] Those skilled in the art will know that this invention can be implemented as a system, method, or computer program product.

[0079] Therefore, this disclosure can be implemented in the following forms: it can be entirely hardware, entirely software (including firmware, resident software, microcode, etc.), or a combination of hardware and software, generally referred to herein as a "circuit," "module," or "system." Furthermore, in some embodiments, the invention can also be implemented as a computer program product in one or more computer-readable media, the computer-readable medium containing computer-readable program code.

[0080] Any combination of one or more computer-readable media may be used. A computer-readable medium can be a computer-readable signal medium or a computer-readable storage medium. A computer-readable storage medium can be, for example, but not limited to, an electrical, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any combination thereof. More specific examples (a non-exhaustive list) of computer-readable storage media include: an electrical connection having one or more wires, a portable computer disk, a hard disk, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), optical fiber, portable compact disk read-only memory (CD-ROM), optical storage device, magnetic storage device, or any suitable combination thereof. In this document, a computer-readable storage medium can be any tangible medium that contains or stores a program that can be used by or in connection with an instruction execution system, apparatus, or device.

[0081] Although embodiments of the present invention have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting the present invention. Those skilled in the art can make changes, modifications, substitutions and variations to the above embodiments within the scope of the present invention.

Claims

1. A method for simulating electron transport coupling, characterized in that, include: Based on the electron transport problem to be simulated, a simulation model including physical and geometric information is established using the Monte Carlo method. In the simulation model, multiple counts are preset, and the simulation model is divided into a first region and a second region according to the energy range of each count; Based on the first region and the second region, the transport process of each electron in the simulation model is simulated using the Monte Carlo method and combined with the transport equation, and the solution for each electron is calculated. The step of dividing the simulation model into a first region and a second region based on the energy range of each count includes: For each energy range of the count, calculate the upper limit of the effective electron range corresponding to each energy range, and select the maximum effective electron range from all the upper limits of the effective electron range. The counting region of each count in the simulation model is extended outward by one maximum effective electron range to form multiple extended counting regions. The source region in the simulation model is extended outward by one maximum effective electron range to form an extended source region. By connecting each expanded counting region to the expanded source region in a tangent manner, the union of each expanded counting region, the expanded source region, and the enclosing region is defined as the second region, and the region in the simulation model other than the second region is defined as the first region. The enclosing region refers to all regions formed after each expanded counting region is connected to the expanded source region. The Monte Carlo method includes the first type of Monte Carlo enrichment history method, and the process of calculating the solution for each electron includes: The upper limit of the energy range of all counted energy ranges and the sum of the energy loss of any electron in the simulation model when it completes one effective range are determined as the threshold. When any electron enters the second region, and when the energy of any electron in the second region is not greater than the threshold, the transport process of any electron is simulated using a preset method. When any electron enters the first region, the transport process of any electron is simulated using the first type of Monte Carlo condensed history method combined with the transport equation until the energy of any electron is less than the preset minimum energy threshold, and the transport process of any electron is simulated. The simulation is completed until the transport process of each electron in the simulation model is completed, and the solution of each electron in the simulation model is calculated.

2. The electron transport coupling simulation method according to claim 1, characterized in that, The Monte Carlo method further includes a second type of Monte Carlo enrichment history method, wherein when any electron enters the second region, and when the energy of any electron in the second region is not greater than the threshold, a preset method is used to simulate the transport process of any electron, including: When any electron enters the second region, and when the energy of any electron in the second region is not greater than the threshold, the step size of the electron step is recalculated. The energy loss, angle deflection, and position caused by the updated electron step size are calculated. The electron is then simulated using the first type of Monte Carlo enrichment history method and the transport equation. After the electron step simulation with the updated electron step size is completed, the second type of Monte Carlo enrichment history method is used to simulate the electron.

3. An electronic transport coupling simulation system, characterized in that, This includes module creation, module division, and calculation. The establishment module is used to: establish a simulation model including physical and geometric information based on the electron transport problem to be simulated using the Monte Carlo method; The partitioning module is used to: in the simulation model, preset multiple counts, and divide the simulation model into a first region and a second region according to the energy range of each count; The calculation module is used to: simulate the transport process of each electron in the simulation model based on the first region and the second region, using the Monte Carlo method and combined with the transport equation, and calculate the solution for each electron; The partitioning module is specifically used for: For each energy range of the count, calculate the upper limit of the effective electron range corresponding to each energy range, and select the maximum effective electron range from all the upper limits of the effective electron range. The counting region of each count in the simulation model is extended outward by one maximum effective electron range to form multiple extended counting regions. The source region in the simulation model is extended outward by one maximum effective electron range to form an extended source region. By connecting each expanded counting region to the expanded source region in a tangent manner, the union of each expanded counting region, the expanded source region, and the enclosing region is defined as the second region, and the region in the simulation model other than the second region is defined as the first region. The enclosing region refers to all regions formed after each expanded counting region is connected to the expanded source region. The Monte Carlo method includes a first-class Monte Carlo condensed history method, and the computation module is specifically used for: The upper limit of the energy range of all counted energy ranges and the sum of the energy loss of any electron in the simulation model when it completes one effective range are determined as the threshold. When any electron enters the second region, and when the energy of any electron in the second region is not greater than the threshold, the transport process of any electron is simulated using a preset method. When any electron enters the first region, the transport process of any electron is simulated using the first type of Monte Carlo condensed history method combined with the transport equation until the energy of any electron is less than the preset minimum energy threshold, and the transport process of any electron is simulated. The simulation is completed until the transport process of each electron in the simulation model is completed, and the solution of each electron in the simulation model is calculated.

4. The electronic transport coupling simulation system according to claim 3, characterized in that, The Monte Carlo method also includes a second type of Monte Carlo condensed history method, and the computation module is further specifically used for: When any electron enters the second region, and when the energy of any electron in the second region is not greater than the threshold, the step size of the electron step is recalculated. The energy loss, angle deflection, and position caused by the updated electron step size are calculated. The electron is then simulated using the first type of Monte Carlo enrichment history method and the transport equation. After the electron step simulation with the updated electron step size is completed, the second type of Monte Carlo enrichment history method is used to simulate the electron.

5. A storage medium, characterized in that, The storage medium stores instructions that, when read by a computer, cause the computer to execute an electronic transport coupling simulation method as described in any one of claims 1 to 2.

6. An electronic device, characterized in that, It includes a processor and the storage medium of claim 5, wherein the processor executes instructions in the storage medium.

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