Processing method, device, equipment and storage medium for display terminal screen self-test

Abstract

The present invention relates to the field of data processing and discloses a method, apparatus, device, and storage medium for processing a display terminal screen self-test. The method comprises: obtaining current switch tube conduction information based on the switch tube group; determining actual input information based on the current switch tube conduction information and initial input information of the main chip; determining an input value corresponding to the actual input information and an output value corresponding to a preset output position based on a preset value table; and locating screen self-test problems based on the output value and the input value. The present invention improves resource utilization during screen self-test processing.

Description

Technical Field

[0001] The present invention relates to the field of picture processing, and in particular to a method, device, equipment and storage medium for processing self-check of a display terminal picture. Background Art

[0002] With the rapid development of image processing technology, users have higher and higher requirements for image self-checking processing. While hoping to solve the image self-checking problems, they also hope to reduce the time of image self-checking processing, which also puts higher requirements on the accuracy and efficiency of image self-checking processing.

[0003] The traditional approach to handling screen self-tests involves replacing every component as soon as the self-test occurs, and then stopping replacements until the self-test stops. However, this approach has significant drawbacks, requiring the replacement of entire components. This means that it is not very resource-efficient. Summary of the Invention

[0004] The main purpose of the present invention is to provide a method, device, equipment and storage medium for processing self-check of a display terminal screen, aiming to solve the technical problem of how to improve resource utilization of processing self-check of the screen.

[0005] To achieve the above-mentioned object, the present invention provides a method for processing a self-test of a display terminal screen, characterized in that the display terminal includes a liquid crystal panel, and the method for processing a self-test of the display terminal screen is applied to the liquid crystal panel, the liquid crystal panel including a main chip, a first wiring group, a timing control chip, and a second wiring group, wherein the first wiring group is connected to the main chip and the input end of the timing control chip, and the second wiring group is connected to the VBO (V-By-One, digital interface) receiving module in the timing control chip and the input end of the timing control chip; a switch tube group and an output position are sequentially provided on the first wiring group and the second wiring group; the steps of the method for processing a self-test of the display terminal screen include:

[0006] Acquiring current switch tube conduction information based on the switch tube group;

[0007] Determining actual input information according to the current switch conduction information and the initial input information of the master chip;

[0008] Determine the input value corresponding to the actual input information according to the preset value table, and determine the output value corresponding to the preset output position;

[0009] Positioning and processing of the screen self-check problem are performed according to the output value and the input value.

[0010] Optionally, the switch tube group includes a first switch tube provided on the first wiring group and a second switch tube provided on the second wiring group, and the step of obtaining current switch tube conduction information based on the switch tube group includes:

[0011] Determining target positions of all switching tubes in the switching tube group, and determining first conduction information of all first switching tubes and second conduction information of all second switching tubes according to the target positions;

[0012] Aggregate the first conduction information to obtain a first group of current switch conduction information, and aggregate the second conduction information to obtain a second group of current switch conduction information, wherein the current switch conduction information includes the first group of current switch conduction information and the second group of current switch conduction information.

[0013] Optionally, the step of determining actual input information according to the current switch conduction information and the initial input information of the master chip includes:

[0014] Determining a first group of current switch tube conduction information in the current switch tube conduction information, and determining a first group of actual input information corresponding to the initial input information of the master chip based on the first group of current switch tube conduction information;

[0015] A second group of current switch tube conduction information in the current switch tube conduction information is determined, and a second group of actual input information corresponding to the first group of actual input information is determined according to the second group of current switch tube conduction information.

[0016] Optionally, the step of determining the input value corresponding to the actual input information according to a preset value table includes:

[0017] Acquire current switch tube group position information, and determine a binary value corresponding to the actual input information according to the current switch tube group position information;

[0018] An input value is determined by searching a preset value table according to the binary value, wherein the actual input information includes the first group of actual input information or the second group of actual input information.

[0019] Optionally, the step of determining an output value corresponding to the output position includes:

[0020] Determining the output position and position information of the first switching tube and the second switching tube;

[0021] If the position information is after the second switch tube, the output value of the preset output position is used as the second output value corresponding to the second set of actual input information;

[0022] If the position information is between the first switch tube and the second switch tube, the output value of the preset output position is used as the first output value corresponding to the first group of actual input information.

[0023] Optionally, the step of locating the screen self-check problem according to the output value and the input value includes:

[0024] detecting whether the output value matches the input value;

[0025] If the output value does not match the input value, current output position information is obtained, and the image self-check problem is located and processed according to the current output position information;

[0026] If the output value matches the input value, the screen is displayed normally.

[0027] Optionally, the step of locating the image self-check problem according to the current output position information includes:

[0028] Determining an output binary value corresponding to the output numerical value and an input binary value corresponding to the input numerical value;

[0029] A distinguishing position is determined according to the output binary value and the input binary value, and an actual wiring corresponding to the distinguishing position is determined according to the current output position, and the screen self-check problem is located and processed as the actual wiring.

[0030] In addition, to achieve the above-mentioned purpose, the present invention further provides a processing device for displaying terminal screen self-check, comprising:

[0031] A first acquisition module, configured to acquire current switch conduction information based on the switch tube group;

[0032] A second acquisition module is configured to determine actual input information based on the current switch conduction information and the initial input information of the master chip;

[0033] a detection module, configured to determine an input value corresponding to the actual input information according to a preset value table, and to determine an output value corresponding to a preset output position;

[0034] The processing module is used to locate and process the screen self-check problem according to the output value and the input value.

[0035] In addition, to achieve the above-mentioned purpose, the present invention also provides a processing device for display terminal screen self-checking, comprising: a memory, a processor, and a computer program stored on the memory and runnable on the processor, wherein the computer program, when executed by the processor, implements the steps of the processing method for display terminal screen self-checking described above.

[0036] In addition, to achieve the above-mentioned purpose, the present invention also provides a processing storage medium for display terminal screen self-test, on which a processing program for display terminal screen self-test is stored. When the processing program for display terminal screen self-test is executed by the processor, the steps of the processing method for display terminal screen self-test as described above are implemented.

[0037] The present invention provides two switching tube groups before and within a TCON IC (Timing Controller) to determine whether a circuit before or within the TCON IC is broken. Current switch conduction information is obtained, and actual input information is determined based on the current switch conduction information and initial input information of the main chip. Specifically, whether the switch is conducting is determined based on the current switch conduction information to determine whether a signal exists on the circuit. An input value corresponding to the actual input information is determined based on a preset value table, and an output value corresponding to a preset output position is also determined. The provided switching tube groups indicate that there will be two sets of input values and two sets of corresponding output values. Finally, the self-diagnosis problem is located based on the output and input values. By determining the different positions and actual positions of the output and input values, the actual circuit breakage can be determined. By comparing the different positions between the output value and the input value, the actual positions corresponding to the different positions can be determined, and the actual positions can be used as the source of the problem of the screen self-check, thereby avoiding the phenomenon in the existing technology that when the self-check screen appears, each component can only be directly replaced in turn. This screen self-check processing method not only does not need to directly replace the entire component, thereby improving resource utilization and shortening processing time, but also can accurately check different wiring groups, thereby improving the accuracy of locating screen self-check problems. BRIEF DESCRIPTION OF THE DRAWINGS

[0038] Figure 1 It is a schematic diagram of the structure of a processing device for display terminal screen self-test in a hardware operating environment involved in an embodiment of the present invention;

[0039] Figure 2 1. A flowchart of a first embodiment of a method for processing terminal screen self-checking according to the present invention;

[0040] Figure 3 A schematic diagram of a device module for processing a terminal screen self-check according to the present invention;

[0041] Figure 4 This is a flowchart of the processing technology solution for display terminal screen self-checking of the present invention;

[0042] Figure 5 This is a schematic diagram of the circuit design of the processing technology solution for the self-check of the display terminal screen of the present invention;

[0043] Figure 6 This is an example of a self-diagnosis screen showing the process of terminal screen self-diagnosis in the present invention.

[0044] The purpose, features and advantages of the present invention will be further described with reference to the accompanying drawings and in conjunction with the embodiments. DETAILED DESCRIPTION

[0045] It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention.

[0046] Reference Figure 1 , Figure 1 This is a schematic diagram of the structure of a processing device for display terminal screen self-check in a hardware operating environment according to an embodiment of the present invention.

[0047] like Figure 1 As shown, the processing device for the self-test of the display terminal screen may include: a processor 0003, such as a central processing unit (CPU), a communication bus 0001, an acquisition interface 0002, a processing interface 0004, and a memory 0005. Among them, the communication bus 0001 is used to realize the connection and communication between these components. The acquisition interface 0002 may include an information acquisition device and an acquisition unit such as a computer. Optionally, the acquisition interface 0002 may also include a standard wired interface and a wireless interface. The processing interface 0004 may optionally include a standard wired interface and a wireless interface. The memory 0005 may be a high-speed random access memory (RAM) or a stable non-volatile memory (NVM), such as a disk storage. The memory 0005 may also be a storage device independent of the aforementioned processor 0003.

[0048] Those skilled in the art will understand that Figure 1 The structure shown in the figure does not constitute a limitation on the processing device for displaying terminal screen self-diagnosis, and may include more or fewer components than shown in the figure, or combine certain components, or arrange the components differently.

[0049] like Figure 1 As shown, the memory 0005 as a storage medium may include an operating system, an acquisition interface module, a processing interface module, and a processing program for displaying terminal screen self-test.

[0050] exist Figure 1In the processing device for display terminal screen self-inspection shown, the communication bus 0001 is mainly used to realize the connection communication between components; the acquisition interface 0002 is mainly used to connect to the background server and communicate data with the background server; the processing interface 0004 is mainly used to connect to the deployment end (user end) and communicate data with the deployment end; the processor 0003 and the memory 0005 in the processing device for display terminal screen self-inspection of the present invention can be set in the processing device for display terminal screen self-inspection, and the processing device for display terminal screen self-inspection calls the display terminal screen self-inspection processing program stored in the memory 0005 through the processor 0003, and executes the display terminal screen self-inspection processing method provided by the embodiment of the present invention.

[0051] During the development of the technical solution of the present application, the conventional screen self-check processing method requires that each component be directly replaced as a whole until the screen no longer shows self-check after the component is replaced. This screen self-check processing method requires the replacement of the components as a whole, which results in low efficiency in the use of components and the need to replace them in sequence, resulting in a long processing time. In addition, the accuracy of locating the screen self-check problem is not high because the wiring in the components cannot be accurately checked.

[0052] In some embodiments of the present application, the display terminal includes a liquid crystal panel, and the display terminal screen self-test processing method is applied to the liquid crystal panel. The liquid crystal panel includes a main chip, a first wiring group, a timing control chip, and a second wiring group. The first wiring group connects the main chip and the input end of the timing control chip, and the second wiring group connects the VBO receiving module in the timing control chip and the input end of the timing control chip; the first wiring group and the second wiring group are sequentially provided with a switch tube group and an output position. In some embodiments, referring to Figure 5 The LCD panel includes a main chip (SoC), a first cable group (the portion before D0N-D7P enters the TCON IC), a timing control chip (TCON IC), and a second cable group (the portion where D0N-D7P enters the TCON IC). The first cable group connects the main chip and the input of the timing control chip, while the second cable group connects the VBO receiving module in the timing control chip and the input of the timing control chip. By pre-setting the switch groups and output positions, two MOS transistors are installed on each data line: one before entering the TCON IC, and the other after entering the TCON IC. By simultaneously detecting the drain or source status of each switch based on its input status, the specific location of the VBO signal disconnection can be determined, facilitating rapid problem location and analysis.

[0053] Based on the above hardware structure, an embodiment of a processing method for display terminal screen self-checking of the present invention is proposed.

[0054] The embodiment of the present invention provides a method for processing a display terminal screen self-check, referring to Figure 2 , Figure 2 FIG. 1 is a flow chart of a first embodiment of a method for processing a self-diagnosis of a display terminal screen according to the present invention.

[0055] In this embodiment, the method for processing the display terminal screen self-check includes:

[0056] Step S10, obtaining current switch conduction information based on the switch group;

[0057] The main reason for entering bist mode (self-test screen) or the panel entering "self-test" is abnormal VBO (V-By-One, image signal) signal input, but the TCON IC power supply is normal. There are many reasons for the abnormal reception of TCON IC VBO signal, such as no output of a certain Data trace of SOC (System-on-a-Chip, main chip), or the disconnection of this Data trace during the transmission process of the board, FFC cable, or connector. Since FFCs often need to be frequently plugged in and out during production or debugging, the most common problem is abnormal contact of the FFC gold finger. The VBO signal from the SOC cannot be given to the TCON IC VBO module, causing the TCON IC to enter bist mode. Even dirt on the FFC gold finger or the connector connected to it, or crooked insertion of the FFC can often cause self-test. The self-test screen refers to when the TCON IC triggers or starts the bist mode, the Open cell (LCD panel) will repeatedly run the screen according to the pattern (image) built into the TCON IC, for example Figure 6The following example displays the self-test screens of a display terminal, i.e., black screen -> white screen -> grayscale screen -> R screen -> G screen -> B screen -> grayscale transition 1 screen -> grayscale transition 2 screen -> black screen, etc. The TCON IC can preset a BIST pattern through register settings. For example, it can be set to cycle through only the three built-in screens (black, white, and gray), or only the three RBG screens. In the prior art, once a self-test problem occurs, it often requires extensive troubleshooting to ultimately determine whether it is a problem with the FFC, the TCON IC, or another issue. Traditional troubleshooting methods often fail to pinpoint the specific data trace that is broken; they can only determine the component causing the problem and then replace it. For example, if the self-test phenomenon disappears after replacing the FFC, the problem is likely caused by the FFC. Alternatively, if the self-test phenomenon disappears after replacing the TCON board, the self-test is likely caused by the TCON board's VBO receiver module, but it is impossible to determine which data trace is causing the self-test.

[0058] In this embodiment, if Figure 5As shown, the LCD panel includes a main chip (SoC), a first cable group (the portion before D0N-D7P enters the TCON IC), a timing control chip (TCON IC), and a second cable group (the portion where D0N-D7P enters the TCON IC). The first cable group connects the main chip and the input of the timing control chip, while the second cable group connects the VBO receiving module in the timing control chip and the input of the timing control chip. Switch groups and output positions are sequentially provided on the first and second cable groups. By pre-setting the switch groups and output position signal detection methods, two MOS transistors are installed on each data line: one before entering the TCON IC and the other after entering the TCON IC. By simultaneously detecting the drain or source state of each switch, the specific location of the VBO signal disconnection can be determined, facilitating rapid problem location and analysis. Specifically, based on the connection relationship, the mainboard PCB1 (SoC), connector CNN1, gold finger 1, FFC, gold finger 2, connector CNN2, and the TCON board PCB2 (timing control chip) are shown. The first MOS transistor is placed before the PCB of the TCON board, and a detection position is set after the first MOS transistor. At the same time, the second MOS transistor is placed before and after the PCB of the TCON board, and a detection position is set after the second MOS transistor. By comparing the input before the two MOS transistors with the input at the detection position after the two MOS transistors, the specific location of the VBO signal disconnection can be determined. After the pre-setting is performed, the current switch tube conduction information will be obtained based on the preset switch tube group. The step of obtaining the current switch tube conduction information based on the switch tube group includes:

[0059] Step C11, determining target positions of all switching tubes in the switching tube group, and determining first conduction information of all first switching tubes and second conduction information of all second switching tubes according to the target positions;

[0060] In this embodiment, the role played by the switch tube is similar to the on and off role of the switch, so it is necessary to determine the input information based on the on and off of the switch tube. By determining the target position of all the switch tubes in the preset switch tube group, the first conduction information of all the first switch tubes and the second conduction information of all the second switch tubes at the target position will be determined based on the target position. The switch tube group refers to a group of switch tubes for judging the input, the target position refers to which data line (Data line) the switch tube is set on, the first conduction information refers to the conduction information of the first switch tube, and the second conduction information refers to the conduction information of the second switch tube. For example, Figure 5The figure shows a circuit design diagram for a display terminal screen self-test processing technology solution. The switch groups refer to switches M1-M16 and M17-M32. For example, when switch M1 is determined, the target position is D3P. Based on the target position D3P, the conduction information of the two switches on D3P is determined. Specifically, the conduction information of M1 is determined as the first conduction information, and the conduction information of M32 is determined as the second conduction information. By comparing the second conduction information with the first conduction information, the conduction status of the target position can be determined, providing a basis for determining the data transmission status at the target position.

[0061] Step C12: Aggregate the first conduction information to obtain a first group of current switch tube conduction information, and aggregate the second conduction information to obtain a second group of current switch tube conduction information, wherein the current switch tube conduction information includes the second group of current switch tube conduction information and the first group of current switch tube conduction information, and the first switch tube is before the second switch tube.

[0062] After obtaining the second conduction information and the first conduction information of the target position, the first conduction information of the target position is aggregated to obtain the first set of current switch conduction information, and the second conduction information is aggregated to obtain the second set of current switch conduction information. The first set of current switch conduction information and the second set of current switch conduction information are the current switch conduction information. The current switch conduction information refers to the two sets of switch conduction information ( Figure 5 The conduction status of M1-M16, M17-M32 in the figure is determined. As can be seen from the position of the switch tubes, the first switch tube is before the second switch tube. That is, for the target position D3P, the first switch tube refers to M1 and the second switch tube refers to M32. By determining the conduction information of the current switch tubes, the accuracy of the input data can be guaranteed.

[0063] Step S20, determining actual input information according to the current switch conduction information and the initial input information of the master chip;

[0064] After obtaining the current switch tube conduction information, the actual input information will be determined based on the current switch tube conduction information and the initial input information of the master chip. The initial input information refers to the original input of the master chip, and the actual input information refers to the input information after passing through the switch tube group. Figure 5It can be seen that the actual input information includes the actual input information of the first group of switches M1-M16 and the actual input information of the second group of switches M17-M32. By controlling the conduction of the switches, different actual input information can be guaranteed, and then all data lines can be judged. Another point is that according to the control of the switches, the entire data line group can be judged as a whole, or the entire data line group can be judged individually. When making a single judgment, the second conduction information and the first conduction information of the target position will be directly used as the conduction information of the second group of current switches and the conduction information of the first group of current switches. Then, the actual input information is determined based on the current switch conduction information and the input information of the input main chip. The actual input information provides a practical basis for judging the data line.

[0065] Step S30, determining an input value corresponding to the actual input information according to a preset value table, and determining an output value corresponding to a preset output position;

[0066] In this embodiment, after the actual input information is obtained, the input value corresponding to the actual input information is determined according to the preset value table. The step of determining the input value corresponding to the actual input information according to the preset value table includes:

[0067] Step C21, obtaining the current position information of the switch tube group, and determining the binary value corresponding to the actual input information according to the current position information of the switch tube group;

[0068] After determining the actual input information, the current switch tube group position information will be obtained based on the actual input information. Secondly, the binary value corresponding to the actual input information will be determined based on the current switch tube group position information. The current switch tube group position information refers to the position arrangement of the switch tubes, and the binary value refers to the binary value arranged according to the position. For example, if the switch tubes are abc, and the current switch tube group position information is switch tube a, switch tube c, and switch tube b, when switch tube a and switch tube c are in the on state and switch tube b is in the off state, and it is defined that the signal input is 1 and the no signal input is 0, the binary value corresponding to the actual input information will be determined to be 110 based on the current switch tube group position information. The corresponding input value will be determined based on the binary value, because the display output of the display screen when detecting the data line group is a numerical value, the corresponding decimal value will be obtained based on the binary value, which is also the input value. The binary value provides a basis for obtaining the corresponding input value.

[0069] Step C22: searching a preset value table according to the binary value to determine an input value, wherein the actual input information includes the first group of actual input information or the second group of actual input information.

[0070] In this embodiment, the input value is determined by searching a preset value table based on the obtained binary value, wherein the input value refers to the decimal value corresponding to the binary value. For example, as shown in the following table, the present invention displays a preset value table for terminal screen self-test processing.

[0071]

[0072]

[0073] When the binary value is all 1, the corresponding decimal value 4294967296 will be obtained by looking up the preset value table. That is to say, the input value is 4294967296. Based on the determined input value, the output value will be judged to know whether the output value is accurate, and then the self-test problem of the screen can be located. When the input value is determined, it includes the first set of actual input information or the second set of actual input information. After obtaining the input value, the output value of the preset output position will be determined, where the preset output position refers to the position of the corresponding detection instrument set in advance, and the output value refers to the display value on the detection instrument. By determining the input value and the output value, the accuracy of the two values and the accuracy of the subsequent positioning operation can be guaranteed, providing a positioning basis for subsequent positioning.

[0074] Step S40: Positioning the screen self-check problem according to the output value and the input value.

[0075] In this embodiment, after obtaining the input value and the output value, the screen self-check problem is located. The step of locating the screen self-check problem based on the output value and the input value includes:

[0076] Step C31, detecting whether the output value matches the input value;

[0077] Step C32: if the output value does not match the input value, obtain current output position information, and locate the image self-check problem based on the current output position information;

[0078] In this embodiment, the screen self-test problem is located by detecting whether the input value and the output value match. Matching refers to numerical equality or determining a preset transmission rule. The theoretical output value corresponding to the input value is obtained according to the transmission rule, and then the theoretical output value is detected to determine whether it matches the output value. If the detection result is that the input value and the output value do not match, the current output position information is obtained, and the screen self-test problem is located based on this current output position information, where the current output position information refers to the actual arrangement of the data lines.

[0079] Step C33: If the output value matches the input value, the screen is displayed normally.

[0080] When the output value matches the input value, it is determined that there is no screen self-test problem in the detection area and the screen will be displayed normally. If there is still a screen self-test problem, according to the troubleshooting process of the existing technology, other unchecked locations will be checked. When it is a line problem, the technical solution of this application can also be used. By checking the line transmission through this embodiment, not only can resources be saved, for example, when a line on the mainboard is broken in the existing technology, it can be directly replaced, but it also provides the accuracy of locating the screen self-test problem.

[0081] Furthermore, this embodiment also provides a processing technology solution for displaying terminal screen self-checking, referring to Figure 4 In this embodiment, when a self-test screen appears on the product, instead of directly replacing every component to resolve the self-test issue, the self-test issue is pinpointed to the specific data line causing the abnormality. Instead, the switch determines the input and tests the status of each data line (T1-T32). T1-T16 refers to the status of the data line before entering the TCON IC, and T16-T32 refers to the status of the data line after entering the TCON IC. The status of each data line can be used to determine whether the self-test screen is caused by the data line before or after entering the TCON IC. This pinpoints the cause of the self-test screen to each data line, rather than simply replacing the data line group. This not only fully utilizes resources and ensures high data line utilization, but also improves the accuracy of resolving self-test issues.

[0082] In this embodiment, two groups of switch tubes are provided before and within the TCON IC to determine whether a circuit before or within the TCON IC is broken. Current switch tube conduction information is obtained, and actual input information is determined based on the current switch tube conduction information and input information from the main chip. Specifically, whether the switch tube is conducting is determined based on the current switch tube conduction information to determine whether a signal is present on the circuit. An input value corresponding to the actual input information is determined based on a preset value table, and an output value at a preset output position is also determined. The provided switch tube groups indicate that there will be two groups of input values and two corresponding groups of output values. Finally, the screen self-test problem is located based on the output and input values. By determining the different positions and actual positions of the output and input values, the actual circuit breakage can be determined. By comparing the different positions between the output value and the input value, the actual positions corresponding to the different positions can be determined, and the actual positions can be used as the source of the problem of the screen self-check, thereby avoiding the phenomenon in the existing technology that when the self-check screen appears, each component can only be directly replaced in turn. This screen self-check processing method not only does not need to directly replace the entire component, thereby improving resource utilization and shortening processing time, but also can accurately check different wiring groups, thereby improving the accuracy of locating screen self-check problems.

[0083] Furthermore, based on the first embodiment of the method for processing the self-check of the display terminal screen of the present invention, a second embodiment of the method for processing the self-check of the display terminal screen of the present invention is proposed. The method for processing the self-check of the display terminal screen includes:

[0084] Furthermore, the step of determining actual input information according to the current switch conduction information and the initial input information of the master chip includes:

[0085] Step a, determining a first group of current switch tube conduction information in the current switch tube conduction information, and determining a first group of actual input information corresponding to the initial input information of the master chip based on the first group of current switch tube conduction information;

[0086] In this embodiment, after obtaining the current switch conduction information, a first set of current switch conduction information in the current switch conduction information is determined. Based on the first set of current switch conduction information, a first set of actual input information corresponding to the initial input information of the master chip is determined. The first set of actual input information refers to the actual input information after passing through the first set of switches. For example, when switches abc in the first set are all conducting, and the master chip input information has input to switch abc, the first set of actual input information indicates that switch abc has input.

[0087] Step b: determining a second group of current switch tube conduction information in the current switch tube conduction information, and determining a second group of actual input information corresponding to the first group of actual input information based on the second group of current switch tube conduction information.

[0088] After obtaining the first set of actual input information, the first set of actual input information is used as the second set of input information. The second set of current switch conduction information is then determined, and the second set of actual input information corresponding to the second set of input information is ultimately determined based on the second set of current switch conduction information. The second set of actual input information refers to the actual input information after passing through the second set of switches. For example, if switches abc in the first set of actual input information have input, and only switch e in the second set of switches def is turned on, the second set of actual input information indicates that only switch e has input.

[0089] In this embodiment, by determining a first set of current switch conduction information in the current switch conduction information, determining a first set of actual input information corresponding to the initial input information of the master chip based on the first set of current switch conduction information, determining a second set of current switch conduction information in the current switch conduction information, and determining a second set of actual input information corresponding to the first set of actual input information based on the second set of current switch conduction information, the actual input information can be accurately determined, providing a basis for locating screen self-test issues. Different actual input information can also be provided based on different switch conduction conditions, facilitating judgment by test personnel.

[0090] Furthermore, the step of determining the output value corresponding to the preset output position includes:

[0091] Step e, determining the preset output position of the output position and position information of the first switching tube and the second switching tube;

[0092] Step f, if the position information is after the second switch tube, taking the output value of the preset output position as the second output value corresponding to the second set of actual input information;

[0093] In this embodiment, the process of determining the output value of the preset output position is mainly carried out by determining the position information of the preset output position and the first switching tube and the second switching tube, wherein the position information refers to the comparison information between the first switching tube and the second switching tube. When the position information is after the second switching tube, the output value of the preset output position will be used as the second output value corresponding to the second set of actual input information.

[0094] Step g: If the position information is between the first switch tube and the second switch tube, the output value of the preset output position is used as the first output value corresponding to the first group of actual input information.

[0095] When the position information is between the first switch tube and the second switch tube, the output value of the preset output position will be used as the first output value corresponding to the first set of actual input information. Figure 4 For explanation, when the comparison position information is that the position is after M25 (the second switch tube, any switch tube can be used for judgment), the corresponding output data is the second output value. When the position information is that the position is before M25 (the second switch tube) but after M8 (the first switch tube), the corresponding output data is the first output value. The judgment requirement for the first output value is two switch tubes at the same target position.

[0096] In this embodiment, by determining the preset output position and the position information of the first and second switching transistors, if the position information is after the second switching transistor, the output value of the preset output position is used as the second output value corresponding to the second set of actual input information; if the position information is between the first and second switching transistors, the output value of the preset output position is used as the first output value corresponding to the first set of actual input information. This allows accurate positioning of the output value, thereby ensuring the accuracy of the output value and providing an accurate basis for subsequent judgment.

[0097] Furthermore, the step of locating the image self-check problem according to the current output position information includes:

[0098] Step h, determining an output binary value corresponding to the output numerical value and an input binary value corresponding to the input numerical value;

[0099] In this embodiment, when the output value does not match the input value, it is determined that the screen self-detection problem occurs in this area, and the binary values corresponding to the output value and the input value are determined as the output binary value and the input binary value, and the screen self-detection problem is located based on the two binary values, which can provide a positioning basis for locating the screen self-detection problem.

[0100] Step i: determining a distinguishing position according to the output binary value and the input binary value, and determining an actual wiring corresponding to the distinguishing position according to the current output position, and locating the screen self-check problem as the actual wiring.

[0101] After obtaining the output binary value and the input binary value, the difference between the two will be determined, and the actual wiring in the current output position will be determined by the difference. Finally, the actual wiring is used as the screen self-test problem. Among them, the difference position refers to the different positions of the two binary values, and the actual wiring refers to the wiring in the current output position corresponding to the different position. For example, Figure 4As shown, when the output binary value is 01111111111111111, and the input binary value is 11111111111111111, that is to say, the distinguishing position is the first, and according to the figure, the actual wiring corresponding to the first position M1 in the current output position is D3P, that is to say, the actual circuit break is at D3P. Secondly, the theoretical output binary value can be determined according to the input binary value, and the distinguishing position between the theoretical output binary value and the output binary value can be determined, and the actual wiring in the current output position can be determined according to the distinguishing position. It is also worth noting that when the first output value does not match the first input value, it can be known that the line break occurs before the position corresponding to the first output value; when the second output value does not match the second input value, it can be known that the line break occurs before the position corresponding to the second output value and after the position corresponding to the first output value. According to Figure 4 It can be seen that when the first output value does not match the first input value, a broken line appears in the middle of S1-S16 to T1-T16 in the figure; when the second output value does not match the second input value, a broken line appears in the middle of T1-T16 to T17-T32 in the figure.

[0102] In this embodiment, the output binary value corresponding to the output numerical value and the input binary value corresponding to the input numerical value are determined, a distinguishing position is determined based on the output binary value and the input binary value, and the actual wiring corresponding to the distinguishing position is determined based on the current output position. The screen self-test problem can be accurately determined as the actual wiring. The two binary values and the current output position can accurately determine the actual wiring with the problem, achieving precise location of the screen self-test problem.

[0103] The present invention also provides a schematic diagram of a device module for processing a display terminal screen self-check, referring to Figure 3 , the processing device for display terminal screen self-check includes:

[0104] A first acquisition module A01, configured to acquire current switch conduction information based on the switch group;

[0105] A second acquisition module A02 is configured to determine actual input information based on the current switch conduction information and the initial input information of the master chip;

[0106] Detection module A03, used to determine the input value corresponding to the actual input information according to a preset value table, and determine the output value corresponding to the output position;

[0107] The processing module A04 is used to locate and process the screen self-check problem according to the output value and the input value.

[0108] Optionally, the first acquisition module A01 is further configured to:

[0109] Determining target positions of all switching tubes in the switching tube group, and determining first conduction information of all first switching tubes and second conduction information of all second switching tubes according to the target positions;

[0110] Aggregate the first conduction information to obtain a first group of current switch conduction information, and aggregate the second conduction information to obtain a second group of current switch conduction information, wherein the current switch conduction information includes the first group of current switch conduction information and the second group of current switch conduction information.

[0111] Optionally, the second acquisition module A02 is further configured to:

[0112] Determining a first group of current switch tube conduction information in the current switch tube conduction information, and determining a first group of actual input information corresponding to the initial input information of the master chip based on the first group of current switch tube conduction information;

[0113] A second group of current switch tube conduction information in the current switch tube conduction information is determined, and a second group of actual input information corresponding to the first group of actual input information is determined according to the second group of current switch tube conduction information.

[0114] Optionally, the detection module A03 is further configured to:

[0115] Acquire current switch tube group position information, and determine a binary value corresponding to the actual input information according to the current switch tube group position information;

[0116] An input value is determined by searching a preset value table according to the binary value, wherein the actual input information includes the first group of actual input information or the second group of actual input information.

[0117] Optionally, the detection module A03 is further configured to:

[0118] Determining the output position and position information of the first switching tube and the second switching tube;

[0119] If the position information is after the second switch tube, the output value of the preset output position is used as the second output value corresponding to the second set of actual input information;

[0120] If the position information is between the first switch tube and the second switch tube, the output value of the preset output position is used as the first output value corresponding to the first group of actual input information.

[0121] Optionally, the processing module A04 is further configured to:

[0122] detecting whether the output value matches the input value;

[0123] If the output value does not match the input value, obtaining current output position information, and locating the screen self-check problem according to the current output position information;

[0124] If the output value matches the input value, the screen is displayed normally.

[0125] Optionally, the processing module A04 is further configured to:

[0126] Determining an output binary value corresponding to the output numerical value and an input binary value corresponding to the input numerical value;

[0127] A distinguishing position is determined according to the output binary value and the input binary value, and an actual wiring corresponding to the distinguishing position is determined according to the current output position, and the screen self-check problem is located in the actual wiring.

[0128] The methods executed by the above program modules can refer to the various embodiments of the processing method for display terminal screen self-check of the present invention, and will not be described in detail here.

[0129] The present invention also provides a processing device for displaying terminal screen self-check.

[0130] The device of the present invention includes: a memory, a processor, and a display terminal screen self-check processing program stored in the memory and capable of running on the processor. When the display terminal screen self-check processing program is executed by the processor, the steps of the display terminal screen self-check processing method described above are implemented.

[0131] The present invention also provides a storage medium.

[0132] The storage medium of the present invention stores a processing program for display terminal screen self-checking. When the processing program for display terminal screen self-checking is executed by a processor, the steps of the processing method for display terminal screen self-checking as described above are implemented.

[0133] The method implemented when the display terminal screen self-check processing program running on the processor is executed can refer to the various embodiments of the display terminal screen self-check processing method of the present invention, and will not be repeated here.

[0134] It should be noted that, in this document, the terms "comprises," "includes," or any other variations thereof are intended to encompass non-exclusive inclusion, such that a process, method, article, or system comprising a series of elements includes not only those elements but also other elements not explicitly listed, or elements inherent to such process, method, article, or system. In the absence of further limitations, an element defined by the phrase "comprising a ..." does not exclude the presence of other identical elements in the process, method, article, or system comprising the element.

[0135] The serial numbers of the above embodiments of the present invention are for description only and do not represent the advantages or disadvantages of the embodiments.

[0136] Through the description of the above embodiments, those skilled in the art can clearly understand that the above-mentioned embodiment methods can be implemented by means of software plus the necessary general hardware platform, and of course can also be implemented by hardware, but in many cases the former is a better embodiment. Based on this understanding, the technical solution of the present invention is essentially or the part that contributes to the prior art can be embodied in the form of a software product, which is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk) as described above, and includes a number of instructions for enabling a terminal device (which can be a mobile phone, computer, server, or network device, etc.) to execute the methods described in each embodiment of the present invention.

[0137] The above are only preferred embodiments of the present invention and are not intended to limit the patent scope of the present invention. Any equivalent structure or equivalent process transformation made using the contents of the present invention description and drawings, or directly or indirectly applied in other related technical fields, are also included in the patent protection scope of the present invention.

Claims

1. A method for processing a display terminal screen self-check, characterized in that: The display terminal includes a liquid crystal panel, and the display terminal screen self-test processing method is applied to the liquid crystal panel. The liquid crystal panel includes a main chip, a first wiring group, a timing control chip, and a second wiring group. The first wiring group is connected to the main chip and the input end of the timing control chip, and the second wiring group is connected to the VBO receiving module in the timing control chip and the input end of the timing control chip. The first wiring group and the second wiring group are sequentially provided with a switch tube group and an output position. The processing method and steps of the display terminal screen self-check include: Acquiring current switch tube conduction information based on the switch tube group, wherein the switch tube group includes a first switch tube provided on the first wiring group and a second switch tube provided on the second wiring group; determining actual input information according to the current switch tube conduction information and initial input information of the master chip, wherein the initial input information refers to the original input of the master chip, and the actual input information refers to the input information after passing through the switch tube group; Determining an input value corresponding to the actual input information according to a preset value table, and determining an output value corresponding to a preset output position, wherein the step of determining the input value corresponding to the actual input information according to the preset value table includes: obtaining current switch tube group position information, determining a binary value corresponding to the actual input information according to the current switch tube group position information; and searching a preset value table according to the binary value to determine the input value, wherein the actual input information includes the first group of actual input information or the second group of actual input information; The step of determining the output value corresponding to the preset output position includes: determining position information of the preset output position and the first switching transistor and the second switching transistor; if the position information is after the second switching transistor, using the output value of the output position as the second output value corresponding to the second set of actual input information; if the position information is between the first switching transistor and the second switching transistor, using the output value of the output position as the first output value corresponding to the first set of actual input information; Positioning and processing of the screen self-check problem are performed according to the output value and the input value.

2. The method for processing a display terminal screen self-check according to claim 1, wherein: The step of obtaining the current switch tube conduction information based on the switch tube group includes: determining target positions of all switching tubes in the switching tube group, and determining first conduction information of all the first switching tubes and second conduction information of all the second switching tubes according to the target positions; Aggregate the first conduction information to obtain a first group of current switch conduction information, and aggregate the second conduction information to obtain a second group of current switch conduction information, wherein the current switch conduction information includes the first group of current switch conduction information and the second group of current switch conduction information.

3. The method for processing a display terminal screen self-diagnosis according to claim 1, wherein: The step of determining actual input information according to the current switch conduction information and the initial input information of the master chip includes: Determining a first group of current switch tube conduction information in the current switch tube conduction information, and determining a first group of actual input information corresponding to the initial input information of the master chip based on the first group of current switch tube conduction information; A second group of current switch tube conduction information in the current switch tube conduction information is determined, and a second group of actual input information corresponding to the first group of actual input information is determined according to the second group of current switch tube conduction information.

4. The method for processing a display terminal screen self-check according to claim 1, wherein: The step of locating the screen self-check problem according to the output value and the input value includes: detecting whether the output value matches the input value; If the output value does not match the input value, current output position information is obtained, and the image self-check problem is located and processed according to the current output position information; If the output value matches the input value, the screen is displayed normally.

5. The method for processing a display terminal screen self-diagnosis according to claim 4, characterized in that: The step of locating the image self-check problem according to the current output position information includes: Determining an output binary value corresponding to the output numerical value and an input binary value corresponding to the input numerical value; A distinguishing position is determined according to the output binary value and the input binary value, and an actual wiring corresponding to the distinguishing position is determined according to the current output position, and the screen self-check problem is located and processed as the actual wiring.

6. A processing device for displaying terminal screen self-check, characterized in that: The display terminal screen self-test processing device is applied to a liquid crystal panel, which includes a main chip, a first wiring group, a timing control chip, and a second wiring group. The first wiring group is connected to the main chip and the input end of the timing control chip, and the second wiring group is connected to the VBO receiving module in the timing control chip and the input end of the timing control chip. The first wiring group and the second wiring group are sequentially provided with a switch tube group and an output position. The processing device for display terminal screen self-check includes: a first acquiring module, configured to acquire current switch conduction information based on the switch tube group, wherein the switch tube group includes a first switch tube provided on the first wiring group and a second switch tube provided on the second wiring group; a second acquisition module, configured to determine actual input information based on the current switch tube conduction information and initial input information of the master chip, wherein the initial input information refers to the original input of the master chip, and the actual input information refers to the input information after passing through the switch tube group; a detection module, configured to determine an input value corresponding to the actual input information and an output value corresponding to a preset output position according to a preset value table, wherein the step of determining the input value corresponding to the actual input information according to the preset value table comprises: obtaining current switch tube group position information, determining a binary value corresponding to the actual input information according to the current switch tube group position information; and searching the preset value table according to the binary value to determine the input value, wherein the actual input information includes the first group of actual input information or the second group of actual input information; The step of determining the output value corresponding to the preset output position includes: determining position information of the preset output position and the first switching transistor and the second switching transistor; if the position information is after the second switching transistor, using the output value of the output position as the second output value corresponding to the second set of actual input information; if the position information is between the first switching transistor and the second switching transistor, using the output value of the output position as the first output value corresponding to the first set of actual input information; The processing module is used to locate and process the screen self-check problem according to the output value and the input value.

7. A processing device for displaying terminal screen self-test, characterized in that: The processing device for display terminal screen self-check includes: a memory, a processor, and a computer program stored in the memory and executable on the processor. When the computer program is executed by the processor, the steps of the processing method for display terminal screen self-check as described in any one of claims 1 to 5 are implemented.

8. A storage medium, characterized in that: The storage medium stores a display terminal screen self-check processing program, which, when executed by a processor, implements the steps of the display terminal screen self-check processing method according to any one of claims 1 to 5.

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