Automated arc fault test equipment and test method

Abstract

The present invention relates to an automated fault arc test device and test method, wherein the test device includes a test clause storage module for storing test clauses; a test power supply control module for reading the test clauses and controlling the parameters of the test power supply according to the test clauses; an arc generation control module for reading the test clauses and controlling the arc generation device to generate the arc required by the test standard; and a circuit load switching module for automatically switching the load. The present invention is aimed at standard files related to arc faults, obtains test standards, and develops a test device and test method based on the test standards, which can automatically switch line loads according to the test standards and automatically adjust test currents according to the test standards. It is used to verify and test related products such as circuit breakers, can automatically record test data, and is compatible with multiple different standards.

Description

Technical Field

[0001] The invention relates to a product testing technology that may generate a fault arc, and in particular to an automated fault arc testing device and a testing method. Background Art

[0002] In recent years, the situation of electrical fires in civil buildings has been severe, accounting for about 30% of the total number of fires. Among the causes of electrical fires, arc faults are the main cause. The research and development of detection and protection devices for arc faults has received attention from various countries. The United States is the first country to develop and promote the use of arc fault circuit breakers. Its corresponding standard is UL 1699 "Arc-Fault Circuit-Interrupters". The earliest version was released in 1999, and it has been continuously updated and developed rapidly. The International Electrotechnical Commission also released the standard IEC 62606 "General requirements for arcfault detection devices" in 2013. Subsequently, Shanghai Electric Science Research Institute took the lead in drafting GB / T 31143 "General requirements for arc fault protection devices (AFDD)". This standard is based on IEC 62606, modifies some deficiencies in the IEC standard, and adjusts certain clauses according to my country's actual situation. The standard was officially released in 2014. At the same time, the Shenyang Fire Research Institute of the Ministry of Public Security also took the lead in drafting GB 14287.4 "Electrical Fire Monitoring System Part 4: Fault Arc Detector" and officially released it in 2014. The four standards have roughly the same principles for the generation of fault arcs, but the specific requirements for each product are different, and the test conditions are also different.

[0003] There are many test items for arc fault products, including various circuit types, various load type tests, cross combinations, various types, complex wiring, and huge test workload. At present, there is no equipment on the market that can meet most test requirements, and the degree of automation is not high. Most of them are mainly manual wiring and oscilloscope recording waveforms. The test and experiment efficiency is low, the labor intensity is high, and the repeatability is poor. Summary of the invention

[0004] In view of the deficiencies in the prior art, the present invention discloses an automated fault arc test device and a test method.

[0005] The technical solution adopted by the present invention is as follows:

[0006] An automated fault arc test device, the test device is used to support different test standards, including: a test clause storage module, used to store test clauses; a test power supply control module, used to read the test clauses and control the parameters of the test power supply according to the test clauses; an arc generation control module, used to read the test clauses and control an arc generation device to generate the arc required by the test standard; a circuit load switching module, including: a correspondence table, storing the correspondence between a first contact switch group and the test clauses; the on or off state of the first contact switch group changes the topology of the circuit, so that different circuit loads are connected or disconnected; a first IO control card, used to output a first control signal to control the action of a first relay group; the first control signal responds to the test clauses, and reads the correspondence in the correspondence table, and controls the first contact switch group by controlling the first relay group;

[0007] Its further technical solution is that the test equipment also includes: a test current automatic adjustment module, including: an expected current value acquisition module, used to obtain the expected current value; the expected current value is the current parameter in the test clause or the received input current parameter; a preset resistance configuration value acquisition module, which obtains the preset resistance configuration value according to the expected current value; a current comparison module, which compares the actual pre-pass current value with the expected current value; the actual pre-pass current value is the current value collected after the circuit is pre-passed; a resistance configuration adjustment module, which receives the comparison result of the actual pre-pass current value and the expected current value, and calculates the adjusted resistance configuration value; a second IO control card, which is used to output a second control signal to control the action of the second relay group; the second control signal responds to the resistance configuration value output by the preset resistance configuration value acquisition module or the resistance configuration adjustment module, and controls the second contact switch group by controlling the second relay group;

[0008] A further technical solution is that the test equipment includes: a data acquisition module for collecting current and / or voltage data in the test equipment; the data acquisition module is installed in a load cabinet, a resistance cabinet, a function switching cabinet and / or an arc generation cabinet.

[0009] Its further technical solution is that the test equipment includes: a function switching cabinet, including: a load switching circuit, including a first relay group and a first contact switch group, the first relay group receives a first control signal and changes the power-on state to control the action of the first contact switch group; the first contact switch group responds to the action of the first relay group, opens or closes, and controls the load in the load cabinet to be connected to the circuit or disconnected. A resistance switching circuit includes a second relay group and a second contact switch group, the second relay group receives a second control signal and changes the power-on state to control the action of the second contact switch group. The second contact switch group responds to the action of the second relay group, opens or closes, and controls the resistance of the resistance cabinet to be connected to the circuit or disconnected; the load cabinet receives the control signal of the function switching cabinet and changes the load connected or disconnected; the resistance cabinet receives the control signal of the function switching cabinet and changes the resistance connected or disconnected; the arc generation cabinet receives the control signal of the arc generation control module and generates an arc.

[0010] A method for testing an automated fault arc is implemented based on the automated fault arc testing equipment described in any one of the above items; the test method is used to automatically support different test standards; it includes the steps of automatically switching the circuit load: obtaining the test terms; reading a corresponding table, the corresponding table storing the corresponding relationship between the test terms and the first contact switch group; outputting a first control signal, the first control signal controlling the action of the first relay group; the first control signal responds to the test terms, and reads the corresponding relationship in the corresponding table to control the first contact switch group; in response to the action of the first relay group, the first contactor group corresponding to the first relay group is actuated to complete the line switching, so that the load connection method and the connection and disconnection sequence meet the test terms.

[0011] Its further technical solution is that, it also includes the step of automatic adjustment of the test current: obtaining an expected current value, which is a current parameter in the test clause or an input current parameter; obtaining a preset resistance configuration value according to the expected current value; outputting a second control signal, which controls the action of the second relay group; the second control signal responds to the resistance configuration value of the preset resistance configuration value acquisition module or the resistance configuration adjustment module to control the second contact switch group; in response to the action of the second relay group, the second contactor group corresponding to the second relay group is actuated to complete the line switching, so that the connection method and the connection and disconnection sequence of the resistor meet the test clause; connecting the circuit and sampling the current signal to obtain the pre-actual current value; comparing the pre-actual current value with the expected current value, if the pre-actual current value meets the tolerance range, the control process is terminated; if the pre-actual current value does not meet the tolerance range, the result is used as a feedback signal; according to the feedback signal, the adjusted resistance configuration value is calculated, and the second control signal is issued again.

[0012] A further technical solution is that it also includes a data collection step; the data collection step is performed before the test and / or during the test; the data collected before the test is used to detect the test conditions. The data collected during the test is used to determine whether the test is successful.

[0013] A further technical solution is to also include a test power supply control step: reading the test terms and controlling the parameters of the test power supply according to the test terms.

[0014] A further technical solution is to also include an arc generation control step: reading the test terms and controlling the generation of the arc according to the test terms.

[0015] The beneficial effects of the present invention are as follows:

[0016] The present invention is aimed at standard documents related to arc faults, obtains test standards, and develops a test device and test method based on the test standards, which can automatically switch line loads according to the test standards and automatically adjust test currents according to the test standards. It is used to verify and test related products such as circuit breakers, can automatically record test data, and is compatible with multiple different standards.

[0017] There are differences in test circuits for different standards, and the circuits for different test clauses are different. In particular, the shielded load test requires multiple circuits and multiple loads to switch back and forth, relying on manual wiring, which is a huge workload and inefficient. Compared with the prior art, the present invention is therefore configured with an automatic circuit switching function, which can greatly improve the test efficiency. It can also adjust different expected currents according to products with different current levels, different test clauses, and different loads. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] Figure 1 It is a structural block diagram of an embodiment of the automated arc fault test equipment of the present invention.

[0019] Figure 2 It is a flow chart of the steps of automatic switching of circuit loads in the present invention.

[0020] Figure 3 It is a flow chart of the test current automatic adjustment steps in the present invention.

[0021] Figure 4 It is a circuit diagram of a false tripping test in one embodiment of the present invention.

[0022] Figure 5 It is a series arc test circuit diagram in another embodiment of the present invention. DETAILED DESCRIPTION

[0023] The specific implementation of the present invention will be described below in conjunction with the accompanying drawings.

[0024] Example 1.

[0025] Embodiment 1 is an automated arc fault test device. Figure 1 FIG. 1 is a structural block diagram of an embodiment of the automated arc fault test equipment of the present invention. Figure 1 As shown, the test equipment includes a control console, a function switching cabinet, a resistance cabinet, a load cabinet and an arc generating cabinet.

[0026] The console is used to control the entire system, analyze data, send control signals and receive collected data. The console includes a test clause storage module, a circuit load switching module, a test current automatic adjustment module, a test power supply control module, an arc generation control module and a data processing module.

[0027] The test clause storage module stores test clauses, which are summarized from various test standards.

[0028] The circuit load switching module includes a corresponding table and a first IO control card. The corresponding table stores the corresponding relationship between the first contact switch group and the test clause. The on and off state of the first contact switch group can change the topological structure of the circuit, so that different circuit loads are connected or disconnected. The first IO control card is used to output a first control signal to control the action of the first relay group. The first control signal is in response to the test clause and reads the corresponding relationship in the corresponding table to control the first contact switch group. Specifically, the action of the first contact switch group corresponding to the first relay group is controlled by controlling the power-on state of the first relay group. The first control signal can be a group of signal sequences for controlling a series of action sequences of connection and disconnection of different loads. When the first relay group receives the first control signal and acts, it drives the first contact switch group to complete the line switching, so that the connection mode of the load and the order of connection and disconnection match the test clause. After the first contact switch acts, the action signal is transmitted back to the first IO control card to form a closed loop of the control signal.

[0029] The test current automatic adjustment module includes an expected current value acquisition module, a preset resistance configuration value acquisition module, a second IO control card and a resistance configuration adjustment module. The expected current value acquisition module is used to acquire the expected current value. The expected current value can be the current parameter in the acquired test clause, or it can receive the current parameter directly input by the input device. The preset resistance configuration value acquisition module obtains the preset resistance configuration value according to the expected current value. The second IO control card is used to output a second control signal to control the action of the second relay group. The second control signal is in response to the resistance configuration value of the preset resistance configuration value acquisition module or the resistance configuration adjustment module, and is used to control the second contact switch group, specifically by controlling the power-on state of the second relay group, thereby controlling the action of the second contact switch group corresponding to the second relay group. The second control signal can be a set of signal sequences, which are used to control a series of action sequences of connecting and disconnecting different resistors. The current comparison module compares the actual current value of the pre-passing and the expected current value according to the actual current value of the pre-passing collected by the data acquisition module after the current pre-passing, and inputs the result as a feedback signal to the resistance configuration adjustment module. The resistance configuration adjustment module calculates the resistance configuration adjustment method according to the feedback signal, and sends the second control signal again through the second IO control card. Until the current comparison module compares and obtains that the actual pre-pass current value is within the tolerance range.

[0030] The test power supply control module is used to read the test terms and control the test power supply parameters according to the test terms. Various fault arc test standards require the test power supply to provide a short-circuit current of 500A. The voltage and frequency of different standards are different. The test power supply control module is used to control the test power supply parameters.

[0031] The arc generation control module is used to read the test clauses and control the arc generation device to generate the arc required by the test standard.

[0032] The data processing module is responsible for displaying and automatically saving the collected test current and voltage waveforms. The saved data can be used to determine whether the test is successful, whether the action of the tested sample meets the requirements of the test terms, and to generate a test report. The saved test data can provide original data support for the continuous improvement and research and development of subsequent products.

[0033] The function switching cabinet has a built-in resistor switching circuit and a load switching circuit. Specifically, it includes a first relay group and a first contact switch group. The first relay group receives a first control signal and changes the power-on state, thereby controlling the action of the first contact switch group. The first contact switch group responds to the action of the first relay group, opens or closes, and controls the load in the load cabinet to connect to the circuit or disconnect. It also includes a second relay group and a second contact switch group. The second relay group receives a second control signal and changes the power-on state, thereby controlling the action of the second contact switch group. The second contact switch group responds to the action of the second relay group, opens or closes, and controls the resistor in the resistor cabinet to connect to the circuit or disconnect.

[0034] The arc generating cabinet includes a carbonized cable generating device, a series arc generator and a parallel arc metal cutting device, receives data from the arc generating control module and generates an arc.

[0035] The carbonized cable generating device is used to generate carbonized cables. The carbonized cables simulate the situation in which the insulation layer of the cables or loads is carbonized due to insulation aging, insulation damage, moisture, etc. during actual use, thereby causing a fault arc.

[0036] The series arc generator includes a stepper motor to control the distance between the two ends of the arc. In conjunction with the current and voltage data collected by the data acquisition module, the stepper motor can be reliably adjusted in real time when the arc is generated so as to generate a stable arc.

[0037] The parallel arc metal cutting device includes a stepper motor, which controls the operation of the cutting device to avoid close operation by operators and to avoid the safety problem of metal particles splashing due to large current and high arc energy generated during cutting.

[0038] The data acquisition module is used to collect current and voltage data in the test equipment. The data acquisition module is installed in the load cabinet, resistor cabinet, function switching cabinet and / or arc generation cabinet. And the collected data is transmitted back to the console. As the basis for adjusting the test current and voltage to meet the test conditions, after the fault arc is introduced, real-time current and voltage data are collected to determine whether the test is successful; provide data support for later product development. The data acquisition module includes current transformers and voltage transformers, and isolated transformers are preferably used to ensure the safety of equipment and personnel. Multiple transformers can be used for simultaneous sampling and subsequent hierarchical processing. The data collected by the data acquisition module is input into the analog input card, and then transmitted to the console for analysis and processing. The analog input card needs to have a high sampling rate to ensure that the sampled data is not distorted.

[0039] The test power supply receives the control signal from the test power supply control module and changes the frequency, current and other parameters for the test. The test power supply is a variable frequency adjustable power supply.

[0040] The resistor cabinet receives the control signal from the function switching cabinet, changes the connected or disconnected resistance, and realizes the function of adjusting the resistive load current.

[0041] The load cabinet receives the control signal from the function switch cabinet to change the connected or disconnected load. The load cabinet places various small loads in the cabinet, and arranges sockets and circuit breakers on the back for external large-volume and high-power electrical appliances.

[0042] In summary, the console controls the data acquisition module through the analog input card to sample the current and voltage, controls the line switching through the IO control card, and controls the test power supply and the arc generating device in the arc generating cabinet through the field bus.

[0043] Embodiment 1 can solve the following problems through the circuit load switching module: there are differences in test circuits of different standards, and the circuits of different test clauses are different. In particular, the shielded load test requires multiple circuits and multiple loads to switch back and forth, relying on manual wiring, which is a huge workload and inefficient. Embodiment 1 can greatly improve the test efficiency by configuring the automatic line switching function. When the tester selects a certain test clause, the circuit load switching module automatically selects a series of corresponding first contact switch groups, controls the action of the first relay group through the first IO control card, and the first relay group drives the first contact switch group to complete the line switching. Furthermore, Embodiment 1 also automatically adjusts the expected current before arcing occurs in the test circuit by setting a test current automatic adjustment module. According to products with different current levels and different test clauses, different loads can be automatically transferred to adjust different expected currents.

[0044] Example 2.

[0045] Example 2 is based on Example 1, and further refines the method of obtaining the test clauses stored in the test clause storage module. The test clauses are summarized according to the test standards. It includes the analysis of the test clauses and the judgment criteria for the arc. The test standard here refers to the standard documents involving fault arc content recognized by the domestic and foreign fields, which can be used to test whether the relevant products meet the relevant standards. First, according to the standard documents, the test clauses are obtained and summarized; secondly, according to the test clauses, the test conditions are obtained and summarized; the test conditions include test parameters, test steps and the working order of the test equipment; finally, the topology and electrical structure of the circuit are designed according to the test conditions.

[0046] Based on the three standards of UL 1699-2008, GB / T 31143-2014 and GB 14287.4-2014, the test clauses are summarized as shown in Table 1.

[0047] Table 1 shows the test items organized based on the three standards.

[0048]

[0049] The arc evaluation criteria of each standard are also different. Take UL 1699-2008 as an example.

[0050] The UL 1699-2008 series arc evaluation criteria are shown in Table 2. The maximum number of half-waves allowed within 0.5s in the parallel arc test is 8. The other two standard documents also have arc evaluation rules, which will not be repeated here.

[0051] Table 2 UL 1699-2008 Series Arc Evaluation Standard

[0052]

[0053] Based on the summary analysis, it can be concluded that the three standards have the following common points in test methods: they all need to use carbonized cables; they all need to use series arc generators; they all need to use parallel arc metal cutting devices; they all need to do series arc and parallel arc tests, and the circuits are roughly the same; they all need to do shielding tests, and the four circuits ABCD are consistent; they all need to do false operation tests, and the operating methods are basically the same.

[0054] The differences in test conditions and evaluation criteria are:

[0055] (1) The test power supply is different.

[0056] The test power parameters of UL 1699-2008 are AC 110V, 120V, 240V, 60Hz;

[0057] The test power supply parameters of GB / T 31143-2014 and GB 14287.4-2014 are AC 220V, 230V, 50Hz;

[0058] UL 1699-2008 and GB / T 31143-2014 do not require the power factor of the power supply;

[0059] GB 14287.4-2014 requires testing under different power factors of the power supply.

[0060] (2) There are differences in the test procedures and number of samples.

[0061] (3) The load types and quantities of the tests are different.

[0062] (4) Different evaluation standards. UL 1699-2008 and GB / T 31143-2014 require the tested sample to disconnect the circuit, and the time requirements are slightly different. GB 14287.4-2014 does not disconnect the circuit, but only outputs an alarm signal.

[0063] According to the similarities and differences summarized in the above analysis, the electrical modules and circuit topology corresponding to each test clause are designed, so that the system can adjust the specific working methods and working sequence of the circuit load switching module, test current automatic adjustment module, test power supply control module, arc generation control module and data processing module according to the test clause.

[0064] Example 3.

[0065] Example 3 is a test method performed by the test equipment based on Example 1 and Example 2. The circuit load switching control method includes the steps of controlling the test power supply parameters according to the test terms, controlling the arc generation according to the test terms, and also includes the steps of automatically switching the circuit load according to the test terms and automatically adjusting the test current.

[0066] Figure 2 It is a flow chart of the steps of automatic switching of circuit load. Figure 2 As shown, the steps of automatic circuit load switching include:

[0067] Get the trial terms.

[0068] The corresponding table is read, wherein the corresponding table stores the corresponding relationship between the test clauses and the first contact switch group.

[0069] The first IO control card outputs a first control signal, and the first control signal controls the action of the first relay group. The first control signal is responsive to the test clause and reads the corresponding relationship in the corresponding table to control the first contact switch group.

[0070] In response to the action of the first relay group, the first contactor group corresponding to the first relay group is actuated to complete line switching, so that the connection method and the connection and disconnection sequence of the load meet the test terms.

[0071] After the line switching is completed, the state of the first contact switch group is returned to the first IO control card.

[0072] Figure 3 This is a flow chart of the test current automatic adjustment steps. Figure 3 As shown in the figure, the test current automatic adjustment steps include:

[0073] Obtaining the expected current value. The expected current value acquisition module is used to obtain the expected current value. The expected current value can be the current parameter obtained in the test clause, or the current parameter directly input by the input device.

[0074] The preset resistance configuration value acquisition module obtains the preset resistance configuration value according to the expected current value.

[0075] The second IO control card outputs a second control signal, which controls the action of the second relay group. The second control signal is in response to the resistance configuration value of the preset resistance configuration value acquisition module or the resistance configuration adjustment module, and is used to control the second contact switch group.

[0076] In response to the action of the second relay group, the second contactor group corresponding to the second relay group is actuated to complete the line switching, so that the connection method and the connection and disconnection sequence of the resistors meet the test terms.

[0077] The circuit is turned on and the current signal is sampled to obtain the actual pre-on current value.

[0078] The actual pre-pass current value is compared with the expected current value. If the actual pre-pass current value meets the tolerance range, the control process is terminated. If the actual pre-pass current value does not meet the tolerance range, the result is input into the resistance configuration adjustment module as a feedback signal. The resistance configuration adjustment module calculates the resistance configuration adjustment method according to the feedback signal, and sends a second control signal again through the second IO control card.

[0079] Furthermore, the method also includes a data collection step.

[0080] The data collection step is performed before and / or during the test. The data collected before the test is used to detect the test conditions. The data collected during the test is used to determine whether the test is successful.

[0081] In the test method of Example 3, by adding the step of automatic circuit load switching and the step of automatic test current adjustment, the load switching and the test current adjustment can be automatically performed according to the test terms. Manual wiring and switch operation are not required, which reduces the workload and improves efficiency.

[0082] Example 4.

[0083] Embodiment 4 is based on UL 1699-2008 standard, test clause 41.2.1 false tripping test. Embodiment 4 is a specific example of the test method based on Embodiment 3. Figure 4 1 is a circuit diagram of a false tripping test in one embodiment of the present invention. Figure 4 , the test methods include:

[0084] Step 101: Obtain test clause data.

[0085] Step 102: The circuit load automatic switching module controls to disconnect the switch S11 and the switch S13.

[0086] Step 103: The test power control module sets the power parameters to AC110V / 60Hz and outputs it.

[0087] Step 104: The circuit load automatic switching module controls the switch S11 to turn on the AFCI (Arc-Fault Circuit-Interrupter).

[0088] Step 105 , the circuit load automatic switching module is connected to 4 150W and 100W tungsten filament lamps, with a total of 1000W.

[0089] Step 106: The circuit load automatic switching module turns on the switch S13, and the load is powered on.

[0090] Step 107: The power-on time lasts for 1 second.

[0091] Step 108: The circuit load automatic switching module disconnects the switch S13.

[0092] Step 109: Cool for 1 minute.

[0093] Step 110: Repeat steps 106 to 109 60 times.

[0094] Step 111, the circuit load automatic switching module is connected to the capacitor to start the motor.

[0095] Step 112: The circuit load automatic switching module turns on switch S3, and the load is powered on.

[0096] Step 113: The power-on time lasts for 60 seconds.

[0097] Step 114: The circuit load automatic switching module disconnects the switch S3.

[0098] Step 115, cool for 1 minute.

[0099] Step 116: Repeat steps 112 to 115 5 times

[0100] Example 4 automatically completes the test requirements of the false tripping test based on the test clause 41.2.1 of UL 1699-2008, and a total of 65 tests are performed. During the test, the test progress, test data, and test results are displayed in real time on the application interface. There is no manual wiring and switch switching in the middle, which also avoids the problems of huge workload and low efficiency. Multiple steps in Example 4 involve the step of automatic switching of circuit loads.

[0101] Example 5.

[0102] Embodiment 5 is based on the test clause 9.9.2.2 in GB / T 31143-2014 standard to verify the correct action when a series arc fault suddenly occurs in the circuit. Embodiment 5 is a specific example of the test method based on Embodiment 3. Figure 5is a series arc test circuit diagram in another embodiment of the present invention, refer to Figure 5 , the test methods include:

[0103] Step 201: Obtain test clause data.

[0104] Step 202: The circuit load automatic switching module controls to disconnect the switch S21, the switch S22, the switch S3 and the switch S24.

[0105] Step 203: The test power control module sets the power parameters to AC220V / 50Hz and outputs it.

[0106] Step 204 , the circuit load automatic switching module turns on switch S2 , switch S3 , switch S4 , and switch S1 to complete the circuit.

[0107] Step 205: The test current automatic adjustment module adjusts the test current to the minimum test current. The minimum test current required by this test clause is 3A.

[0108] Step 206, turn off switch S21, switch S22, switch S23, switch S24, reset and turn on AFDD (Arc Fault Detection Devices), and adjust the copper contacts of the series arc generator to be in close contact with the carbon rod. At this point, the test preparation is completed, and the formal test begins.

[0109] Step 207 , turn on switch S23 and switch S21 to connect the circuit and stabilize it to the test current adjusted in step 204 .

[0110] Step 208: The arc generation control module controls the series arc generator to generate a fault arc.

[0111] Step 209: AFDD takes action, and the data processing module calculates the action time.

[0112] Step 210: Repeat steps 206 to 209 three times.

[0113] Step 211: According to the test terms, the test current automatic adjustment module adjusts the test current to the rated current of 40A, and repeats steps 204 to 210.

[0114] So far, the test equipment has automatically completed the test requirements of this clause, and a total of 6 tests have been conducted. During this period, the test progress, test data, and test results are displayed in real time on the application interface. In the test method of Example 5, by adding the steps of automatic switching of circuit load and automatic adjustment of test current, various test clauses can be flexibly responded to, and loads and test currents can be automatically switched according to the requirements of the test clauses, without manual wiring, reducing workload and improving efficiency.

[0115] The above description is an explanation of the present invention, not a limitation of the present invention. The scope of the present invention is defined in the claims. The present invention may be modified in any form without violating the basic structure of the present invention.

Claims

1. An automated arc fault test device, characterized in that: The test equipment is used to support different test standards, including: A test clause storage module, used for storing test clauses; A test power supply control module, used for reading the test clauses and controlling the parameters of the test power supply according to the test clauses; An arc generation control module, used for reading the test clause and controlling the arc generation device to generate the arc required by the test standard; Circuit load switching module, comprising: A correspondence table storing a correspondence between the first contact switch group and the test clauses; the on or off state of the first contact switch group changes the topology of the circuit, so that different circuit loads are connected or disconnected; A first IO control card is used to output a first control signal to control the action of the first relay group; the first control signal responds to the test clause, and reads the corresponding relationship in the corresponding table, and controls the first contact switch group by controlling the first relay group; The test equipment also includes: a test current automatic adjustment module, including: an expected current value acquisition module, used to acquire the expected current value; the expected current value is the current parameter in the test clause or the received input current parameter; a preset resistance configuration value acquisition module, which obtains the preset resistance configuration value according to the expected current value; a current comparison module, which compares the actual pre-pass current value with the expected current value; the actual pre-pass current value is the current value collected after the circuit is pre-passed; a resistance configuration adjustment module, which receives the comparison result of the actual pre-pass current value and the expected current value, and calculates the adjusted resistance configuration value; a second IO control card, which is used to output a second control signal to control the action of the second relay group; the second control signal responds to the resistance configuration value output by the preset resistance configuration value acquisition module or the resistance configuration adjustment module, and controls the second contact switch group by controlling the second relay group.

2. The automated arc fault test equipment according to claim 1, characterized in that: The test equipment includes: The data acquisition module is used to collect current and / or voltage data in the test equipment; the data acquisition module is installed in the load cabinet, the resistance cabinet, the function switching cabinet and / or the arc generation cabinet.

3. The automated arc fault test equipment according to claim 1, characterized in that: The test equipment includes: Function switching cabinet, including: The load switching circuit includes a first relay group and a first contact switch group. The first relay group receives a first control signal and changes a power-on state to control the action of the first contact switch group. The first contact switch group opens or closes in response to the action of the first relay group to control the electric load in the load cabinet to be connected to the circuit or disconnected. The resistance switching circuit includes a second relay group and a second contact switch group. The second relay group receives a second control signal and changes a power-on state to control the action of the second contact switch group. The second contact switch group opens or closes in response to the action of the second relay group to control the resistance of the resistance cabinet to be connected to the circuit or disconnected. The load cabinet receives the control signal of the function switching cabinet and changes the connected or disconnected load; The resistor cabinet receives the control signal of the function switching cabinet and changes the connected or disconnected resistor; The arc generating cabinet receives the control signal of the arc generating control module and generates an arc.

4. An automated arc fault test method, characterized in that: The test method is implemented based on the automated arc fault test equipment according to any one of claims 1 to 3; the test method is used to automatically support different test standards; and includes the steps of automatic switching of circuit loads: Get trial terms; Reading a correspondence table, the correspondence table storing a correspondence between the test terms and the first contact switch group; Outputting a first control signal, wherein the first control signal controls the action of the first relay group; The first control signal responds to the test clause and reads the corresponding relationship in the corresponding table to control the first contact switch group; In response to the action of the first relay group, the first contactor group corresponding to the first relay group is actuated to complete line switching, so that the connection method and the connection and disconnection sequence of the load meet the test clauses.

5. The automated arc fault test method according to claim 4, characterized in that: It also includes the test current automatic adjustment steps: Obtaining the expected current value, which is the current parameter in the test clause or the input current parameter; Obtain a preset resistance configuration value according to the expected current value; Output a second control signal, the second control signal controls the action of the second relay group; the second control signal responds to the resistance configuration value of the preset resistance configuration value acquisition module or the resistance configuration adjustment module to control the second contact switch group; In response to the action of the second relay group, the second contactor group corresponding to the second relay group is actuated to complete the line switching, so that the connection method and the connection and disconnection sequence of the resistors meet the test clauses; Connect the circuit and sample the current signal to obtain the actual pre-current value; Compare the actual pre-pass current value with the expected current value, and if the actual pre-pass current value meets the tolerance range, end the control process; If the actual pre-on current value does not meet the tolerance range, the result is used as a feedback signal; based on the feedback signal, the adjusted resistance configuration value is calculated and the second control signal is issued again.

6. The automated arc fault test method according to claim 4, characterized in that: It also includes a data collection step; the data collection step is performed before the test and / or during the test; the data collected before the test is used to detect the test conditions; the data collected during the test is used to determine whether the test is successful.

7. The automated arc fault test method according to claim 4, characterized in that: It also includes a test power supply control step: reading the test terms and controlling the parameters of the test power supply according to the test terms.

8. The automated arc fault test method according to claim 4, characterized in that: The method also includes an arc generation control step of reading the test terms and controlling the generation of the arc according to the test terms.

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