Test point inspection method, device and equipment of printed circuit board and storage medium

Abstract

The application discloses a printed circuit board test point inspection method, device and equipment and a storage medium, relates to the field of PCB board testing, and comprises the following steps: acquiring a plurality of target databases for querying whether a test point of a signal meets a test condition; determining a test point on a printed circuit board to be detected, then traversing the target databases by using a preset program language, and determining the number of the test point contained in a target signal according to a signal name in the target databases to obtain a detection value; comparing the detection value with a rule value previously set in the target databases, so as to output an inspection result of the test point according to a comparison result. Through the technical scheme, the accuracy and reliability of the test point adding link during board card design are ensured, and the added test point can pass the inspection at one time, and the detection efficiency is improved.

Description

Technical Field

[0001] This invention relates to the field of PCB board testing, and in particular to a method, apparatus, equipment, and storage medium for inspecting test points on printed circuit boards. Background Technology

[0002] In the PCBA (Printed Circuit Board Assembly) factory production process, ICT (In-Circuit Test) is a very important step. It uses electronic principles to test whether the circuit of the board under test is qualified, that is, to detect whether there are problems such as open circuit, short circuit, unsoldered components, missing components, and defective components. Therefore, in order to meet the design for testability in the production process, PCB layout engineers need to add test points that meet the ICT test conditions to the PCB when drawing the layout. ICT test can only be performed on the PCBA when it is manufactured.

[0003] Currently, most DFT (Design for Testability) test points on PCBs are manually added by PCB layout engineers. This manual addition introduces subjective judgment, potentially leading to test points that do not meet testing requirements, or missing or incorrectly added test points for critical signals. Therefore, the PCB with added test points must undergo inspection and verification before being put into production. Currently, the main inspection method involves sending the completed PCB design to the engineer responsible for Design Layout Test (DFT). The DFT team then provides feedback to the PCB engineer for modification, and the revised PCB is sent back to the DFT engineer for confirmation (the layout engineer's modification process may introduce new DFT issues). This process continues until the DFT conditions are met before the PCB is released. This results in repeated back-and-forth checks and confirmations, leading to low efficiency in DFT inspections. Furthermore, from the perspective of signal reliability within the PCB, for example, on high-speed PCBs, high-speed signals are not allowed to have test points added. Adding a test point changes the trace width at the test point, causing impedance abrupt changes and making it difficult to guarantee signal quality, leading to PCB reliability issues. Whether these signals that are not allowed to have test points added have been mistakenly added is also a part of the inspection. The current practice is manual visual inspection, but manual processing is prone to omissions. If an omission occurs, test points may be added to signals that are not allowed to have test points, causing signal integrity problems and potentially leading to reliability issues for the entire PCB and even the product.

[0004] In summary, how to ensure that all added test points pass the DFT review on the first attempt, improve detection efficiency, and how to prevent important signals from being added as test points are urgent problems to be solved. Summary of the Invention

[0005] In view of this, the purpose of this invention is to provide a method, apparatus, device, and storage medium for inspecting test points on printed circuit boards, enabling the added test points to pass DFT review in one go, improving inspection efficiency, and avoiding the addition of test points to important signals. The specific solution is as follows:

[0006] In a first aspect, this application discloses a method for inspecting test points on a printed circuit board, including:

[0007] Obtain multiple target databases for querying whether the test points of the signal meet the test conditions;

[0008] The test points on the printed circuit board to be tested are identified, and then the target database is traversed using a preset programming language. The number of test points contained in the target signal is determined according to the signal name in the target database to obtain the detection value.

[0009] The detected value is compared with the rule value pre-set in the target database so that the inspection result of the test point is output based on the comparison result.

[0010] Optionally, the step of obtaining a multiple target database for querying whether the test points of the signal meet the test conditions includes:

[0011] Acquire all signals on the printed circuit board;

[0012] The signals in the signal that are not allowed to have test points added are added to the first database, the signals in the signal that must have test points added are added to the second database, and the signals in the signal that have a corresponding number of test points are added to the third database.

[0013] The target database is determined using the first database, the second database, and the third database.

[0014] Optionally, the method for inspecting test points on the printed circuit board further includes:

[0015] The voltage range in the third database is set, and a range of the number of test points is set within the voltage range so that the printed circuit board to be tested can determine the corresponding signal according to the voltage range.

[0016] Optionally, comparing the detected value with a rule value pre-set in the target database to output the inspection result of the test point based on the comparison result includes:

[0017] If the signal is in the first database, determine whether the detected value is zero;

[0018] If the detected value is zero, then the test point is determined to meet the test conditions;

[0019] If the detected value is not zero, the test point is determined not to meet the test conditions, and the test point is output so that it can be modified.

[0020] Optionally, comparing the detected value with a rule value pre-set in the target database to output the inspection result of the test point based on the comparison result includes:

[0021] If the signal is in the second database, determine whether the detected value is greater than or equal to one;

[0022] If the detected value is greater than or equal to one, then the test point is determined to meet the test conditions;

[0023] If the detected value is less than one, the test point is determined not to meet the test conditions, and the test point is output so that it can be modified.

[0024] Optionally, comparing the detected value with a rule value pre-set in the target database to output the inspection result of the test point based on the comparison result includes:

[0025] If the signal is in the third database, determine whether the detected value within the voltage range meets the range of the preset number of test points;

[0026] If the detected value within the voltage range meets the range of the preset number of test points, then the test point is determined to meet the test conditions.

[0027] If the detected value within the voltage range does not meet the range of the preset number of test points, then the test point is determined to not meet the test conditions, and the test point is output so that it can be modified.

[0028] Optionally, after comparing the detected value with a rule value pre-set in the target database, the method further includes:

[0029] The process involves outputting the problematic test points whose detected values ​​do not conform to the rule values, modifying the problematic test points, determining the test points on the printed circuit board to be tested, traversing the target database using a preset programming language, and determining the number of test points contained in the target signal based on the signal names in the target database, until all test points meet the test conditions.

[0030] Secondly, this application discloses a test point inspection device for printed circuit boards, comprising:

[0031] The target database acquisition module is used to acquire multiple target databases for querying whether the test points of the signal meet the test conditions;

[0032] The test point determination module is used to determine the test points on the printed circuit board to be tested;

[0033] The test point detection module is used to traverse the target database using a preset programming language and determine the number of test points contained in the target signal based on the signal name in the target database in order to obtain the detection value.

[0034] The result output module is used to compare the detected value with the rule value pre-set in the target database, so as to output the inspection result of the test point based on the comparison result.

[0035] Thirdly, this application discloses an electronic device including a processor and a memory; wherein the memory is used to store a computer program, which is loaded and executed by the processor to implement the test point inspection method for printed circuit boards as described above.

[0036] Fourthly, this application discloses a computer-readable storage medium for storing a computer program; wherein the computer program, when executed by a processor, implements the test point inspection method for printed circuit boards as described above.

[0037] In this application, multiple target databases are first obtained to query whether test points of signals meet test conditions; test points on the printed circuit board to be tested are determined; then, the target databases are traversed using a preset programming language, and the number of test points contained in the target signal is determined according to the signal name in the target database to obtain the detection value; finally, the detection value is compared with the rule value pre-set in the target database, so as to output the inspection result of the test point based on the comparison result. It can be seen that multiple target databases are obtained according to the requirements of the test point design stage on the printed circuit board. Because the target databases contain the requirements of test points in the signal, traversing the target databases using a preset programming language can quickly check and calculate the information in the target databases. The detection value of the detected target signal is calculated and compared with the rule value of the corresponding inspection rule, thereby determining whether the test points on the printed circuit board meet the requirements of the relevant field, thus improving design quality and efficiency. Furthermore, this method reduces the workload of frequent communication with relevant fields, ensuring that the added test points pass the inspection on the first attempt, guaranteeing the accuracy and reliability of the test point addition stage during board design, thereby improving product quality and work efficiency. Attached Figure Description

[0038] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on the provided drawings without creative effort.

[0039] Figure 1 This application discloses a flowchart of a test point inspection method for a printed circuit board.

[0040] Figure 2 This is a schematic diagram of a test point inspection tool for a printed circuit board disclosed in this application;

[0041] Figure 3 This is a schematic diagram of the input interface of a test point inspection tool for a printed circuit board disclosed in this application;

[0042] Figure 4 This is a schematic diagram showing the output results of a test point inspection tool for a printed circuit board disclosed in this application;

[0043] Figure 5 This is a flowchart of a specific test point inspection method for a printed circuit board disclosed in this application;

[0044] Figure 6 A schematic diagram of the first database disclosed in this application is created;

[0045] Figure 7 A schematic diagram illustrating the creation of the second database disclosed in this application;

[0046] Figure 8 A schematic diagram illustrating the creation of the third database disclosed in this application;

[0047] Figure 9 This is a schematic diagram of the structure of a test point inspection device for a printed circuit board disclosed in this application;

[0048] Figure 10 This is a structural diagram of an electronic device disclosed in this application. Detailed Implementation

[0049] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0050] Currently, when inspecting test points on printed circuit boards (PCBs), the completed PCB design is sent to the engineer responsible for Design Frame Testing (DFT). The DFT team then provides feedback to the PCB engineer for modification. After modification, the PCB is sent back to the DFT for confirmation until it meets the DFT requirements before being released. This results in repeated back-and-forth inspections and confirmations, leading to low efficiency in DFT checks. Furthermore, when checking for signals where test points are not allowed to be added, manual visual inspection can lead to omissions, causing signal integrity issues and potentially resulting in reliability problems for the entire PCB and even the product.

[0051] Therefore, this application provides a test point inspection scheme for printed circuit boards, which enables the added test points to pass the DFT review in one go, improves the inspection efficiency, and provides a way to avoid adding test points to important signals.

[0052] This invention discloses a method for inspecting test points on a printed circuit board. See [link to relevant documentation]. Figure 1 As shown, the method includes:

[0053] Step S11: Obtain multiple target databases for querying whether the test points of the signal meet the test conditions.

[0054] In this embodiment of the application, in order to check the reliability of the test points added on the printed circuit board, and to improve the efficiency of DFT engineers in checking the test points' manufacturability, the signals that have conditional requirements for the test points can be classified and stored to obtain multiple target databases.

[0055] In one specific implementation, signals whose reliability would be affected by the addition of test points are categorized and stored to form database A; according to the inspection criteria of the DFT engineer, the set of signals on the printed circuit board that require test points to be added forms database B; signals on the printed circuit board with a required number of test points are grouped together to form database C. In this way, databases A, B, and C are multiple target databases that can be used to query whether the test points of a signal meet the test conditions.

[0056] like Figure 2 The tool shown in this application embodiment is a tool for quickly and automatically checking the design of test points on printed circuit boards. Because of the existence of multiple target databases, the tool has two core components: one is for checking the reliability of the test points added on the printed circuit board, and the other is for checking the manufacturability testability to improve the efficiency of DFT engineers.

[0057] Step S12: Determine the test points on the printed circuit board to be tested, then use a preset programming language to traverse the target database, and determine the number of test points contained in the target signal according to the signal name in the target database to obtain the detection value.

[0058] In this embodiment, after determining multiple target databases of test points that can be used to query whether the test points meet the test conditions, it is necessary to check the test points on the printed circuit board to be tested. Specifically, multiple target databases can be imported, the PAD names of the test points used on the printed circuit board to be tested can be determined, and then the test points can be checked.

[0059] In this embodiment, the development can be performed using Cadence SKILL language or other programs; no specific limitation is made here. When inspecting test points on a printed circuit board, multiple target databases are traversed. The program can find the corresponding signal based on the signal name in the multiple target databases and extract the information of its entire trace. After determining the target signal, the number of input test point PADs contained in its information can be found to obtain the detection value.

[0060] like Figure 3 The image shows a specific tool input interface for inspecting test points on a printed circuit board. It is divided into a database import section and a test point PAD name input section. When using the tool, the user needs to import the target database corresponding to the printed circuit board to be inspected, and then input the PAD names of the test points on the printed circuit board to be inspected into the corresponding positions. When the "Start Inspection" button is clicked, the inspection can be performed. Clicking "Results" will output the actual PAD detection values ​​(quantity), which is the detection value.

[0061] Step S13: Compare the detected value with the rule value pre-set in the target database, so as to output the inspection result of the test point based on the comparison result.

[0062] In this embodiment, after obtaining the detection value of the actual PAD test point, it is compared with the rule value set in the target database. If it meets the rule value, the test point can pass, indicating that it meets the requirements. If it does not meet the rule value, it proves that the test point has a problem and needs to be output for modification. Specifically, the problematic test points whose detection values ​​do not meet the rule values ​​are output, and the problematic test points are modified. Then, the process of determining the test points on the printed circuit board to be tested is executed. Then, the target database is traversed using a preset programming language, and the number of test points contained in the target signal is determined according to the signal name in the target database to obtain the detection value. This process continues until all test points meet the test conditions.

[0063] For example, in Figure 3 The printed circuit board (PCB) inspection tool shown has different inspection rules for different target databases. These rules are used to set the required test point addition values ​​for signals in different target databases. For example, database A consists of signals whose reliability would be affected by adding test points. Therefore, for database A, if the number of test point PADs detected is 0, the test point meets the requirements and passes. Database B consists of signals on the PCB that require test points. Therefore, for database B, if the number of test point PADs detected is greater than or equal to one, the test point meets the requirements and passes. Database C consists of signals on the PCB where the number of test point additions is required. Therefore, for database C, if the number of test point PADs detected is the required number, the test point meets the requirements and passes. Furthermore, an inspection report can be automatically popped up after the inspection is completed, or the report can be viewed by clicking the "View Results" button. Figure 4 This is a schematic diagram of the output report. Users can modify it according to the report prompts until all parts pass.

[0064] In this application, multiple target databases are first obtained to query whether test points of signals meet test conditions; test points on the printed circuit board to be tested are determined; then, the target databases are traversed using a preset programming language, and the number of test points contained in the target signal is determined according to the signal name in the target database to obtain the detection value; finally, the detection value is compared with the rule value pre-set in the target database, so as to output the inspection result of the test point based on the comparison result. It can be seen that multiple target databases are obtained according to the requirements of the test point design stage on the printed circuit board. Because the target databases contain the requirements of test points in the signal, traversing the target databases using a preset programming language can quickly check and calculate the information in the target databases. The detection value of the detected target signal is calculated and compared with the rule value of the corresponding inspection rule, thereby determining whether the test points on the printed circuit board meet the requirements of the relevant field, thus improving design quality and efficiency. Furthermore, this method reduces the workload of frequent communication with relevant fields, ensuring that the added test points pass the inspection on the first attempt, guaranteeing the accuracy and reliability of the test point addition stage during board design, thereby improving product quality and work efficiency.

[0065] This application discloses a specific method for inspecting test points on a printed circuit board. See [link to relevant documentation]. Figure 5 As shown, the method includes:

[0066] Step S21: Acquire all signals on the printed circuit board, add the signals for which test points are not allowed to be added to the first database, add the signals for which test points must be added to the second database, and add the signals for which a certain number of test points are required to the third database.

[0067] In this embodiment, during the process of determining whether the test points for querying signals meet the test conditions from multiple target databases, all signals on the printed circuit board are acquired, and then signals with different test point requirements are categorized and stored. It should be noted that the PCB design software Cadence has a built-in function that can export all signal names on the PCB; this function can be used to export all signals. Alternatively, all signal names on the PCB can be obtained in other ways, such as exporting from the schematic diagram or obtaining files provided by the hardware engineer; no specific limitations are made here.

[0068] In the first specific implementation, signals from the signal pool that are not allowed to have test points added are added to the first database. That is, the first database contains signals for which test points are not allowed. Generally, high-speed differential signals, DDR (Double Data Rate) signals, clock signals, etc., on printed circuit boards are not allowed to have test points added. Therefore, the first database can be divided into these categories according to actual needs. Based on the names of all the signals obtained, it can be determined which category each signal belongs to. Then, signals that meet the entry conditions of the first database are sequentially filled into the first database, such as... Figure 6 As shown, this establishes the first database.

[0069] In the second specific implementation, the signals that require test points are added to the second database. That is, the second database contains signals that must have at least one test point. The schematic file and all signals from the exported printed circuit board are sent to the DFT engineer according to... Figure 7 The table shown is used to fill in signals that meet the entry conditions of the second database in order to determine the second database.

[0070] In the third specific implementation, signals with a required number of test points are added to a third database. That is, the third database contains a library of signals for which the DFT requires a certain number of test points, typically power signals requiring multiple test points. To reduce the workload of DFT engineers, database C can be made a universal database. Specifically, voltage ranges are set in the third database, and a range of test point numbers is set within these voltage ranges so that the printed circuit board under test can determine the corresponding signal based on the voltage range. In other words, the voltage range and the required number of test points for that range are designed. After the DFT engineer fills in the initial version of the database, each PCB board can use this database. The signal name should be the power signal from the corresponding voltage range on the actual PCB board under test, such as... Figure 8 As shown.

[0071] Step S22: Determine the target database using the first database, the second database, and the third database.

[0072] In this embodiment of the application, after determining the first database, the second database, and the third database for the test point requirements of different signals, the target database is determined.

[0073] Step S23: Determine the test points on the printed circuit board to be tested, then use a preset programming language to traverse the target database, and determine the number of test points contained in the target signal according to the signal name in the target database to obtain the detection value.

[0074] For a more detailed explanation of step S23, please refer to the relevant content disclosed in the foregoing embodiments, which will not be repeated here.

[0075] Step S24: Compare the detected value with the rule value pre-set in the target database, so as to output the inspection result of the test point based on the comparison result.

[0076] Accordingly, in the first specific implementation, if the signal is in the first database, it is determined whether the detection value is zero; if the detection value is zero, it is determined that the test point meets the test condition; if the detection value is not zero, it is determined that the test point does not meet the test condition, and the test point is output for modification. It is understood that because adding test points to signals in the first database is not allowed, only when a signal in the first database is found to have zero PADs in its signal information is it judged as pass, proving that the test point meets the test condition; otherwise, it fails, and the signal name is output for modification.

[0077] In the second specific implementation, if the signal is in the second database, it is determined whether the detected value is greater than or equal to one. If the detected value is greater than or equal to one, the test point is determined to meet the test condition. If the detected value is less than one, the test point is determined not to meet the test condition, and the test point is output for modification. It is understood that because test points must be added to the signals in the second database, the number of test points must be at least one. Therefore, only when a signal in the second database is found to contain a PAD count greater than or equal to one is it considered a pass, proving that the test point meets the test condition; otherwise, it fails, and the signal name is output for modification.

[0078] In the third specific implementation, if the signal is in the third database, it is determined whether the detected value within the voltage range meets the range of the preset number of test points. If the detected value within the voltage range meets the range of the preset number of test points, the test point is determined to meet the test conditions. If the detected value within the voltage range does not meet the range of the preset number of test points, the test point is determined to not meet the test conditions, and the test point is output for modification. It is understood that because the number of test points added to the signal in the third database is subject to requirements, generally for large power signals, a pass is only determined when the number of PADs contained in the signal information of a signal in the third database is within its corresponding rule range, proving that the test point meets the test conditions; otherwise, a fail is determined, and the signal name is output for modification.

[0079] In this way, the embodiments of this application ensure that important signals on the printed circuit board will not have signal quality problems due to the addition of tests, reducing the communication and design costs of repeated modification confirmations during DFT inspection, improving inspection efficiency, and thus improving PCB delivery time.

[0080] In this application, all signals on the printed circuit board are first acquired, and signals from which test points are not allowed are added to a first database, signals from which test points must be added are added to a second database, and signals from which a certain number of test points are required are added to a third database. A target database is then determined using the first, second, and third databases. Test points on the printed circuit board to be inspected are identified, and then the target database is traversed using a preset programming language. The number of test points contained in the target signals is determined based on the signal names in the target database to obtain a detection value. Finally, the detection value is compared with a rule value pre-set in the target database to output the inspection result of the test points based on the comparison result. As can be seen, based on the requirements of all areas in the test point design process on printed circuit boards, three major target databases were established: the requirement that important signals in the signal integrity field are not allowed to have test points added, the requirement that test points must be added in the DFT production testing field, and the requirement for the number of test points for critical signals. A convenient tool was created using a pre-defined programming language to quickly check and calculate the information in the three target databases, thereby determining whether the test points added to the printed circuit board meet the requirements of the relevant fields. This reduces the workload of frequent communication with relevant fields. In addition, this method ensures that the added test points pass the inspection on the first try, guaranteeing the accuracy and reliability of the DFT test point addition process in the board design, thereby improving product quality and work efficiency.

[0081] Accordingly, this application also discloses a test point inspection device for printed circuit boards, see [link to relevant documentation]. Figure 9 As shown, the device includes:

[0082] The target database acquisition module 11 is used to acquire multiple target databases for querying whether the test points of the signal meet the test conditions;

[0083] Test point determination module 12 is used to determine the test points on the printed circuit board to be tested;

[0084] The test point detection module 13 is used to traverse the target database using a preset programming language and determine the number of test points contained in the target signal according to the signal name in the target database in order to obtain the detection value.

[0085] The result output module 14 is used to compare the detected value with the rule value pre-set in the target database, so as to output the inspection result of the test point based on the comparison result.

[0086] For more detailed information on the working process of each of the above modules, please refer to the relevant content disclosed in the foregoing embodiments, which will not be repeated here.

[0087] Therefore, the above-described scheme in this embodiment first obtains multiple target databases for querying whether test points of signals meet test conditions; determines the test points on the printed circuit board to be tested; then uses a preset programming language to traverse the target databases and determines the number of test points contained in the target signal according to the signal name in the target databases to obtain the detection value; finally, compares the detection value with the rule value pre-set in the target databases to output the inspection result of the test points based on the comparison result. It is evident that obtaining multiple target databases according to the requirements of the test point design stage on the printed circuit board, since the target databases contain the requirements for test points in the signals, allows for rapid inspection and calculation of the information in the target databases by using a preset programming language. The detection value of the detected target signal is compared with the rule value of the corresponding inspection rule to determine whether the test points on the printed circuit board meet the requirements of the relevant field, thereby improving design quality and efficiency. Furthermore, this method reduces the workload of frequent communication with relevant fields, ensuring that the added test points pass the inspection on the first attempt, guaranteeing the accuracy and reliability of the test point addition stage during board design, thus improving product quality and work efficiency.

[0088] Furthermore, embodiments of this application also disclose an electronic device, Figure 10 This is a structural diagram of an electronic device 20 according to an exemplary embodiment. The content of the diagram should not be construed as limiting the scope of this application.

[0089] Figure 10 This is a schematic diagram of the structure of an electronic device 20 provided in an embodiment of this application. Specifically, the electronic device 20 may include: at least one processor 21, at least one memory 22, a power supply 23, a communication interface 24, an input / output interface 25, and a communication bus 26. The memory 22 stores a computer program, which is loaded and executed by the processor 21 to implement the relevant steps in the printed circuit board test point inspection method disclosed in any of the foregoing embodiments. Alternatively, the electronic device 20 in this embodiment may specifically be a computer.

[0090] In this embodiment, the power supply 23 is used to provide operating voltage for each hardware device on the electronic device 20; the communication interface 24 can create a data transmission channel between the electronic device 20 and external devices, and the communication protocol it follows can be any communication protocol applicable to the technical solution of this application, and is not specifically limited here; the input / output interface 25 is used to acquire external input data or output data to the outside world, and its specific interface type can be selected according to specific application needs, and is not specifically limited here.

[0091] In addition, the memory 22, as a carrier for resource storage, can be a read-only memory, random access memory, disk, or optical disk, etc. The resources stored on it can include an operating system 221, computer programs 222, and data 223, etc. The data 223 can include various types of data. The storage method can be temporary storage or permanent storage.

[0092] The operating system 221 is used to manage and control the various hardware devices on the electronic device 20 and the computer program 222, which may be Windows Server, Netware, Unix, Linux, etc. In addition to including a computer program capable of performing the printed circuit board test point inspection method executed by the electronic device 20 as disclosed in any of the foregoing embodiments, the computer program 222 may further include a computer program capable of performing other specific tasks.

[0093] Furthermore, this application also discloses a computer-readable storage medium, which includes random access memory (RAM), main memory, read-only memory (ROM), electrically programmable ROM, electrically erasable programmable ROM, registers, hard disks, magnetic disks, optical disks, or any other form of storage medium known in the art. The computer program, when executed by a processor, implements the aforementioned test point inspection method for printed circuit boards. Specific steps of this method can be found in the corresponding content disclosed in the foregoing embodiments, and will not be repeated here.

[0094] The various embodiments in this specification are described in a progressive manner, with each embodiment focusing on its differences from other embodiments. Similar or identical parts between embodiments can be referred to interchangeably. For the apparatus disclosed in the embodiments, since it corresponds to the method disclosed in the embodiments, the description is relatively simple; relevant parts can be referred to in the method section.

[0095] The steps of the test point inspection or algorithm for printed circuit boards described in conjunction with the embodiments disclosed herein can be implemented directly by hardware, a software module executed by a processor, or a combination of both. The software module can be located in random access memory (RAM), main memory, read-only memory (ROM), electrically programmable ROM, electrically erasable programmable ROM, registers, hard disk, removable disk, CD-ROM, or any other form of storage medium known in the art.

[0096] Finally, it should be noted that in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0097] The above provides a detailed description of the test point inspection method, apparatus, equipment, and storage medium for printed circuit boards provided by the present invention. Specific examples have been used to illustrate the principles and implementation methods of the present invention. The descriptions of the above embodiments are only for the purpose of helping to understand the method and core ideas of the present invention. At the same time, for those skilled in the art, there will be changes in the specific implementation methods and application scope based on the ideas of the present invention. Therefore, the content of this specification should not be construed as a limitation of the present invention.

Claims

1. A method of testing point inspection of a printed circuit board, characterized by, The method comprises the following steps: acquiring a plurality of target databases for querying whether test points of a signal meet a test condition; determining test points on a printed circuit board to be detected, then traversing the target databases by using a preset program language, and determining the number of test points contained in a target signal according to a signal name in the target databases to obtain a detection value; the preset program language is a Cadence SKILL language; comparing the detection value with a rule value previously set in the target databases, so as to output a test result of the test points according to a comparison result; wherein the acquiring of the plurality of target databases for querying whether test points of a signal meet a test condition comprises: acquiring all signals on a printed circuit board; adding signals in which test points are not allowed to be added to a first database, adding signals in which test points must be added to a second database, and adding signals in which test points corresponding to a number requirement to a third database; determining target databases by using the first database, the second database and the third database.

2. The test point inspection method of a printed circuit board according to claim 1, characterized by, It further comprises: setting a voltage interval in the third database, and setting a range of the number of test points in the voltage interval, so that the printed circuit board to be detected determines a corresponding signal according to the voltage interval.

3. The test point inspection method of a printed circuit board according to Claim 1, wherein The comparing of the detection value with a rule value previously set in the target databases, so as to output a test result of the test points according to a comparison result, comprises: if the signal is in the first database, judging whether the detection value is zero; if the detection value is zero, determining that the test point meets the test condition; if the detection value is not zero, determining that the test point does not meet the test condition, and outputting the test point so as to modify the test point.

4. The test point inspection method of a printed circuit board according to Claim 1, characterized by, The comparing of the detection value with a rule value previously set in the target databases, so as to output a test result of the test points according to a comparison result, comprises: if the signal is in the second database, judging whether the detection value is greater than or equal to one; if the detection value is greater than or equal to one, determining that the test point meets the test condition; if the detection value is less than one, determining that the test point does not meet the test condition, and outputting the test point so as to modify the test point.

5. The test point inspection method of a printed circuit board according to claim 2, wherein The comparing of the detection value with a rule value previously set in the target databases, so as to output a test result of the test points according to a comparison result, comprises: if the signal is in the third database, judging whether the detection value meets a range of the number of test points previously set in the voltage interval; if the detection value meets the range of the number of test points previously set in the voltage interval, determining that the test point meets the test condition; if the detection value does not meet the range of the number of test points previously set in the voltage interval, determining that the test point does not meet the test condition, and outputting the test point so as to modify the test point.

6. The test point inspection method of a printed circuit board according to any one of claims 1 to 5, characterized by, The step of comparing the detected value with a rule value previously set in the target database further comprises: outputting a problem test point that does not meet the rule value, modifying the problem test point, and then performing the steps of determining the test points on the printed circuit board to be detected, traversing the target database using a preset program language, and determining the number of test points contained in the target signal according to the signal name in the target database to obtain the detected value until all test points meet the test condition.

7. A test point inspection apparatus for printed circuit boards, characterized by comprising: comprise: a target database acquisition module configured to acquire a plurality of target databases for querying whether test points of a signal meet a test condition; a test point determination module configured to determine test points on a printed circuit board to be detected; a test point detection module configured to traverse the target database using a preset program language and determine the number of test points contained in the target signal according to a signal name in the target database to obtain a detected value; the preset program language is a Cadence SKILL language; a result output module configured to compare the detected value with a rule value previously set in the target database, and output an inspection result of the test points according to a comparison result; wherein the target database acquisition module is configured to: acquire all signals on a printed circuit board; add signals in the signals that do not allow test points to a first database, add signals in the signals that must add test points to a second database, and add signals in the signals that correspond to test points with quantity requirements to a third database; determine a target database using the first database, the second database, and the third database.

8. An electronic device, comprising: The electronic device comprises a processor and a memory; wherein the memory is configured to store a computer program, the computer program is loaded and executed by the processor to implement the printed circuit board test point inspection method of any one of claims 1 to 6.

9. A computer-readable storage medium, characterized in that, The computer program is stored in the memory and executed by the processor to implement the printed circuit board test point inspection method of any one of claims 1 to 6.

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