Gas detector system with ring reflector

Abstract

The present invention relates to a gas detector system with a ring reflector, comprising: at least one emitter configured to emit radiation in a beam path; at least one detector configured to receive at least a portion of the emitted radiation; a ring reflector configured to direct the emitted radiation around the ring reflector towards the at least one detector, wherein the ring reflector comprises at least one portion that is spherical, and wherein the ring reflector is configured to allow a gas to flow through at least a portion of the beam path; and processing circuitry coupled to the one or more detectors and configured to process output from the at least one detector. The emitted radiation can be focused at at least two focal points at the at least one detector due to astigmatism within the ring reflector.

Description

[0001] This application is a divisional application of Chinese patent application No. 201780065495.8, filed on April 23, 2019, entitled "Gas Detector System with Ring Reflector". Background Technology

[0002] Non-dispersive infrared (NDIR) detectors typically include an IR source, a sample chamber (containing a gas sample), a sample detector, and a reference detector. The detector may include an optical bandpass filter determined by one or more target gases. The sample detector is used to detect the target gas, and the reference detector is used to ignore the target gas and any known contaminants. The reference detector provides a base point or zero, while the sample detector provides a differential signal that provides the instrument's actual range value. This sample / reference method can compensate for variations that may occur in the detector sensitivity or the source. For example, source intensity may be altered by contamination that causes zero-point drift.

[0003] Using two detectors by selecting different bands of source light is a common safety practice. For example, a reference signal can be used in conjunction with a sample signal to determine any decrease in radiation output intensity, and any decrease due to detector fouling (e.g., a blurred or dirty window) or any substances in the light path that might affect radiation intensity (e.g., dust, water vapor, etc.). The reference detector can also be used to ensure that radiation is being received. If the reference detector has no signal, an indication that radiation is not present can be generated. This helps ensure the system is functioning correctly. In contrast, a zero response in existing systems can be simply interpreted as the absence of the target gas when the light source is not actually operating. The reference signal can be used to compensate for the signal detected by the sample detector to produce a response with improved accuracy. Summary of the Invention

[0004] In one embodiment, the gas detector system may include at least one emitter configured to emit radiation in a beam path; at least one detector configured to receive at least a portion of the emitted radiation; a ring reflector configured to guide the emitted radiation around the ring reflector toward the at least one detector, wherein the ring reflector includes at least a spherical portion and wherein the ring reflector is configured to allow gas to flow through at least a portion of the beam path; and processing circuitry coupled to one or more detectors configured to process outputs from the one or more detectors.

[0005] In one embodiment, a method for gas detection may include generating a beam path of emitted radiation from an emitter; guiding the beam path of emitted radiation within a ring reflector through a gas sample; reflecting the beam path of emitted radiation around the ring reflector toward a detector, wherein the ring reflector includes at least a spherical portion; receiving the beam path of emitted radiation from the detector; and determining at least one gas concentration in the gas sample based on the received beam path of emitted radiation.

[0006] In one embodiment, the gas detector system may include at least one emitter configured to emit radiation in a beam path; at least one detector configured to receive at least a portion of the emitted radiation, wherein the emitted radiation generates at least two focal points at the at least one detector; a ring reflector configured to guide the emitted radiation around the ring reflector toward the at least one detector, wherein the ring reflector includes at least a spherical portion and wherein the ring reflector is configured to allow gas to flow through at least a portion of the beam path; and processing circuitry coupled to one or more detectors and configured to process outputs from one or more detectors. Attached Figure Description

[0007] To gain a more complete understanding of this disclosure, reference is now made to the following brief description in conjunction with the accompanying drawings and detailed embodiments, wherein similar reference numerals denote similar parts.

[0008] Figure 1A A front view of a ring reflector according to one embodiment of the present disclosure is shown;

[0009] Figure 1B A perspective view of a ring reflector according to one embodiment of the present disclosure is shown;

[0010] Figure 2A A side view of a ring reflector according to one embodiment of the present disclosure is shown;

[0011] Figure 2B A perspective view of a ring reflector according to one embodiment of the present disclosure is shown;

[0012] Figure 3 A front view of a ring reflector including a central plug according to an embodiment of the present invention is shown;

[0013] Figures 4A to 4B A perspective view of a ring reflector according to one embodiment of the present disclosure is shown;

[0014] Figure 5 Another perspective view of a ring reflector according to one embodiment of the present disclosure is shown;

[0015] Figure 6 This is a detailed view of the light path within a ring reflector according to one embodiment of the present disclosure;

[0016] Figure 7A A perspective view of a ring reflector according to one embodiment of the present disclosure is shown;

[0017] Figure 7B An embodiment according to this disclosure is shown. Figure 7A Front view of the ring reflector;

[0018] Figure 7C An embodiment according to this disclosure is shown. Figure 7A Side view of the ring reflector;

[0019] Figure 7D An embodiment according to this disclosure is shown. Figure 7A A top view of the ring reflector;

[0020] Figure 8 A detector including a ring reflector is shown according to one embodiment of the present disclosure;

[0021] Figure 9 Another view of a detector including a ring reflector according to one embodiment of the present disclosure is shown;

[0022] Figure 10 Another view of a detector including a ring reflector according to one embodiment of the present disclosure is shown;

[0023] Figures 11A to 11B Detailed views of a detector and one or more reflectors according to one embodiment of the present disclosure are shown;

[0024] Figure 12 A front view of a ring reflector according to one embodiment of the present disclosure is shown; and

[0025] Figures 13A to 13B A view of a ring reflector assembled with electronic components according to one embodiment of the present disclosure is shown. Detailed Implementation

[0026] First, it should be understood that although exemplary embodiments of one or more implementations are shown below, the disclosed systems and methods can be implemented using any number of techniques, whether currently known or not yet available. This disclosure should in no way be limited to the exemplary embodiments, drawings, and techniques shown below, but modifications can be made within the scope of the appended claims and their equivalents.

[0027] The following brief terminology definitions should apply throughout the application:

[0028] The term "comprising" means including but not limited to, and should be interpreted in the manner commonly used in the patent context;

[0029] The phrases “in one embodiment”, “according to one embodiment”, etc., generally mean that the specific feature, structure or characteristic following the phrase may be included in at least one embodiment of the invention, and may be included in more than one embodiment of the invention (importantly, such phrases do not necessarily refer to the same embodiment).

[0030] If the instruction manual describes something as "exemplary" or "example," it should be understood as referring to a non-exclusive example;

[0031] The terms “about” or “approximately”, when used with numbers, may refer to a specific number, or alternatively, a range close to that specific number as understood by those skilled in the art; and

[0032] If the specification states that a component or feature “may,” “can,” “should,” “will,” “preferably,” “possibly,” “usually,” “optionally,” “for example,” “often,” or “may” (or other such words) be included or have that characteristic, then that particular component or feature is not necessarily included or has that characteristic. Such a component or feature may be optionally included in some embodiments or may be excluded.

[0033] Embodiments of this disclosure include systems and methods for improving response time in gas detectors. The gas detector may include a spherical ring reflector configured to direct radiation from an emitter to at least one detector, wherein the path length of the radiation can be determined by the circumference of the ring reflector.

[0034] Some applications for gas detectors (such as handheld, portable, wireless, and fixed-location detectors) may require low-profile, thin, and small gas detectors. However, effective detection may require a certain path length, especially in optical NDIR gas sensors. Furthermore, a large cross-sectional area for the gas exchange port is desirable to allow for improved sensor response time.

[0035] As described above, an NDIR detector typically includes an IR source, a sample chamber (containing a gas sample), a sample detector, and a reference detector. The IR source can be modulated. The detector may include an optical bandpass filter determined by the target gas. The sample detector is used to detect the target gas, and the reference detector is used to ignore the target gas and any known contaminants. The reference detector provides a base point or zero, while the sample detector provides a differential signal that provides the instrument's actual range value. This sample / reference method can compensate for variations that may occur in the detector sensitivity or the source. For example, the source strength may change due to contamination that causes zero-point drift.

[0036] Using two detectors by selecting different wavelengths of source light is a common safety practice. For example, a reference signal can be used to determine any decrease in radiation output intensity, and any decrease due to detector fouling (e.g., a blurred or dirty window) or any substances in the light path that may affect radiation intensity (e.g., dust, water vapor, etc.). The reference detector can also be used to ensure that radiation is being received. If the reference detector has no signal, an indication that radiation is not present can be generated. This helps ensure the system is functioning correctly. In contrast, a zero response in existing systems can be simply interpreted as the absence of the target gas when the light source is not actually operating. The reference signal can be used to compensate for the signal detected by the sample detector to produce a response with improved accuracy.

[0037] Now for reference Figures 1A to 1B An exemplary spherical ring reflector 100 is illustrated. The spherical ring reflector 100 includes an emitter 102 (or radiation source) configured to emit radiation, which may include, for example, infrared (IR) radiation and / or a light-emitting diode (LED). In some embodiments, the emitter 102 may be modulated. The spherical ring reflector 100 may also include a detector 104 configured to receive the emitted radiation. In some embodiments, the spherical ring reflector 100 may include a curved wall 110, from which a beam path 120 from the emitter 102 may be reflected and directed toward the detector 104. The curved wall 110 may "enclose" the beam path 120 within the spherical ring reflector 100, thereby allowing the beam path 120 to be focused toward the detector 104 and preventing continuous expansion of the beam path 120. In the embodiment shown in FIG. 1, the emitter 102 and detector 104 may be oriented "back-to-back". However, other orientations of the emitter 102 and detector 104 may also be used.

[0038] In use, gas can pass through the spherical ring reflector 100 as radiation is directed from emitter 102 toward detector 104. In some embodiments, detector 104 may include one or more filters for a target wavelength and / or a reference wavelength. In some embodiments, emitter 102 may include one or more filters, and / or multiple filters may be used within the spherical ring reflector 100. Detection of the target wavelength may be correlated with the presence and / or amount of a target gas within the gas passing through the spherical ring reflector 100. For example, the gas passing through the spherical ring reflector 100 may include combustible gases, hydrocarbons, CO, and / or CO2, etc.

[0039] In some implementations, different methods can be used to extend the optical path 120 from the emitter 102 to the curved wall 110. For example, in Figure 1A In this context, the y-axis can be used for expansion. For example, in... Figure 1B In this configuration, the x-axis can be used for expansion. This expansion method offers various benefits for controlling the light path 120 within the spherical ring reflector 100.

[0040] Figures 2A to 2B A spherical ring reflector 200 is shown, which may be similar to the spherical ring reflector 100 described above. In the embodiment shown in FIG. 2, the emitter 202 and the detector 204 may be mounted side by side on the same surface. The spherical ring reflector 200 includes one or more reflectors 206 configured to direct radiation from the emitter 202 toward the detector 204. In some embodiments, the reflector 206 may be part of a right-angle prism. In some embodiments, the reflector 206 may include a mirror. In some embodiments, the reflector 206 may be directly incorporated into the spherical ring reflector 200, wherein the reflector 206 may include the same material as the curved wall 210.

[0041] Positioning the emitter 202 and detector 204 in the same plane, as shown in FIG2, allows the spherical ring reflector 200 to have a reduced thickness (or profile). The beam path 220 may be contained within the curved wall 210 of the ring reflector 200. In some embodiments, the distance 205 between the emitter 202 and detector 204 may be approximately 3 millimeters (mm). In some embodiments, the emitter 202 may include a 1mm by 1mm emitter. In some embodiments, the detector 204 may include a 1mm by 1mm detector. In some embodiments, the spherical ring reflector 200 may include a diameter of approximately 20mm. These measurements and dimensions are exemplary, and other dimensions for the emitter, detector, and ring diameter may be used.

[0042] In some implementation schemes, such as Figures 2A to 2B As shown, emitter 202 can emit radiation of multiple wavelengths. In other embodiments, emitter 202 can emit a single wavelength or a small range of wavelengths. In some embodiments, the direction and angle of beam path 220 can be controlled by the orientation of reflector 206. Beam path 220 can be controlled such that beam path 220 is focused at detector 204.

[0043] Utilizing the curved inner surface of the spherical ring reflector 200, the optical path length of the beam path 220 can be approximately the circumference of the inner diameter 203 of the ring. Due to the imaging characteristics of the spherical ring reflector 200, the reflected radiation beam path 220 can be confined to the inner ring width 201, thereby allowing both sides of the spherical ring reflector 200 to be fully open, thus providing a large cross-sectional area for gas exchange and flow. The spherical ring reflector 200 can include a first-stage 1:1 imager, so the size of the detector 204 can be the same as that of the emitter 202. Because the beam path 220 is contained within the spherical ring reflector 200, no top or bottom reflecting surfaces are needed to confine the radiation, which reduces the number of required components.

[0044] Minimizing the size of the gas detector is desirable, and therefore the size of the spherical ring reflector 200 should also be minimized. The inner ring width 201 of the spherical ring reflector 200 can be optimized based on the throughput efficiency from emitter 202 to detector 204, where there is a positive linear relationship between the inner ring width 201 and the throughput efficiency. Similarly, the inner diameter 203 of the spherical ring reflector 200 can be optimized based on the throughput efficiency and the path length of the beam path 220, where there is a negative relationship between the inner ring diameter 203 and the throughput efficiency, but the path length should be maximized. In some embodiments, the inner ring diameter 203 of the spherical reflector ring 200 can be approximately 20 mm. In some embodiments, the path length of the beam path 220 (from emitter 202 to detector 204) can be at least approximately 50 mm. In some embodiments, the path length of the beam path 220 can be approximately 56 mm. In some embodiments, the inner ring width 201 of the spherical ring reflector 200 can be approximately 8 mm. In some implementations, the inner ring width 201 of the spherical ring reflector 200 may be between approximately 5 mm and 10 mm.

[0045] Figure 2B A perspective view of a spherical ring reflector 200 is shown. A transmitter 202 and a detector 204 may be located on one side of the spherical ring reflector 200. A reflector 206 may be used to guide a beam path 220 into the spherical ring reflector 200.

[0046] Figure 3A spherical ring reflector 200 is shown, comprising a central plug 300 located within a central space of the spherical ring reflector 200. The central space within the spherical ring reflector 200 may be referred to as a “dead zone” because the beam path 220 does not pass through this region. Therefore, when gas passes through the spherical ring reflector 200, the gas passing through the dead zone may not interact with any of the beam paths 220 and may be wasted, resulting in a slower response time. The central plug 300 can block the central dead zone and guide gas flow through the region where the beam path 220 is located, preventing wasted gas flowing through the spherical ring reflector 200. The central plug 300 may also provide other effects on airflow (or provide airflow control), such as a chimney effect. In some embodiments, the dead zone may also be used to house other components, such as electronic components, for assembling a gas sensor.

[0047] In some implementations, the transmitter 202 and detector 204 may be mounted side-by-side, back-to-back, opposite sides, or in other orientations. The spherical ring reflector 200 itself, and optionally other reflector elements, can be used to direct radiation from the transmitter 202 toward the detector 204.

[0048] Figures 4A to 4B A perspective view of a spherical ring reflector 100 is shown, wherein the spherical ring reflector 100 further includes a second channel 400, which includes a second emitter 402, a second detector 404, and a second beam path 420. The second beam path 420 can be oriented such that it does not interfere with a first beam path 120. In some embodiments, the second beam path 420 can be oriented at an angle to the first beam path 120. Figures 4A to 4B In the illustrated embodiment, the second beam path 420 may be orthogonal to the first beam path 120, but in other embodiments, the beam paths may be oriented at another angle to each other.

[0049] like Figure 5 As shown, in some embodiments, the curved wall 110 may have certain regions 502 in which radiation is more focused on the surface of the curved wall 110. For example, at the four corners of the beam path 120, the radiation intensity may be higher than in other regions of the curved wall 110. In some embodiments, the regions of the curved wall 110 without high-intensity radiation can be used for other purposes, such as positioning other components, electronic parts, condensation removal components, etc.

[0050] See Figure 6The beam path 120, confined along the central plane of the spherical ring reflector 100, can generate a secondary focus, known as astigmatism, due to propagation from the emitter around a ring with a large emission angle. The radiance of the radiation can be focused into two points within the spherical ring reflector 100. A first focal point (or location) 602 can be used to position the detector 104 (as described above), and a second focal point (or location) 604 can be used as a reference position for a reference detector. In other words, the spherical ring reflector 100 can utilize the inherent defect caused by astigmatism to provide two focal points 602 and 604 without requiring additional optics (such as double mirrors or diffractive elements), thus saving space and cost for the spherical ring reflector 100. Guiding two separate beams at the detector 104 facilitates the provision of a sample signal and a reference signal. In some embodiments, both "points" (or signals) 602 and 604 can be received by the detector 104, which may include a "sample signal" portion and a "reference signal" portion. In another embodiment, a plurality of detectors 204 may be located within the spherical ring reflector 100.

[0051] In some embodiments, the multiple focal points 602 and 604 may include different intensities. In some embodiments, lower intensity points may be used for a reference detector, and higher intensity points may be used for a sample detector. Alternatively, lower intensity points may be used for a sample detector, and higher intensity points may be used for a reference detector.

[0052] Figures 7A to 7D A spherical ring reflector 700, which may resemble spherical ring reflector 200, is shown, wherein an emitter 702 and a detector 704 are located on opposite sides of the spherical ring reflector 700 and are not in the same plane. A beam path 720 may be guided from the emitter 702 toward the wall 710 of the spherical ring reflector 700 and toward the detector 704 through one or more reflectors 706 located within the spherical ring reflector 700. The beam path 720 may be similar to the beam path 220 described above. In some embodiments, the reflector 706 may include a parallel reflector. In some embodiments, the spherical ring reflector 700 may include at least one filter 740 positioned such that the beam path 720 passes through the filter 740 before reaching the detector 704. The filter 740 may be configured to filter one or more wavelengths.

[0053] In some embodiments, the emitter 702 may include an LED with a package diameter of approximately 5.2 mm. In some embodiments, the detector 704 may include a package diameter of approximately 5.2 mm. In some embodiments, the center of the spherical ring reflector 700 may be hollow.

[0054] like Figure 7BAs shown, the transmitter 702 and detector 704 can be located in different planes (and not side by side) because the size and position of the package of transmitter 702 and detector 704 would cause the transmitter and detector to overlap. By positioning transmitter 702 and detector 704 in different planes, the dimensions are not constrained as if they were located in the same plane.

[0055] Figure 8 A detector 800 is shown, in which a spherical ring reflector 700 may be used. The wall 710 of the spherical ring reflector 700 is transparent to reveal internal components. The detector 800 may include a top plate 804 and a bottom plate 806, the bottom plate including additional components. In some embodiments, a transmitter 702 may be mounted on the bottom plate 806 and a detector 704 may be mounted on the top plate 804. In some embodiments, the reflector 706 may be located between the top plate 804 and the bottom plate 806. In some embodiments, the transmitter 702 and the detector 704 may be attached to a lead 802, which may allow control of inputs and outputs to / from the transmitter 702 and the detector 704. In some embodiments, the detector 800 may include processing circuitry 810 (which may be one or more printed circuit boards). In some embodiments, the detector 800 may include a gas inlet 814 and a gas outlet 812, wherein gas can pass through the spherical ring reflector 700.

[0056] Figures 9 to 10 An additional view of detector 800 is shown. Figure 9 In the middle, the top plate 804 is attached to the spherical ring reflector 700. Figure 10 In this configuration, detector 800 is assembled with top plate 804 and bottom plate 806. Additionally, filter 740 can be positioned such that filter 740 is removable, allowing it to be interchanged to perform tests with multiple filters. In an alternative embodiment, filter 740 can be more permanently incorporated into detector 800.

[0057] In some embodiments, the spherical ring reflector 700 may comprise an acrylic material. In some embodiments, the spherical ring reflector 700 may comprise a copper material. In some embodiments, the spherical ring reflector 700 may comprise any suitable reflective material. The ring may be made of a variety of materials, wherein the materials may be treated to improve the surface finish and surface reflectivity of the inner ring. In some embodiments, a reflective coating may be applied to the ring (such as gold or chromium) to enable light to be effectively reflected from the surface, and this can be selected based on wavelength and performance.

[0058] exist Figures 8 to 10In the diagram, the spherical ring reflector 700 is shown assembled within the detector assembly. However, in other embodiments, the spherical ring reflectors 100, 200, and / or 700 may be mounted within an open tube, where a top or bottom plate is not required to contain the emitted radiation of the emitter.

[0059] See Figures 11A to 11B A detailed view of the detector 1104 and reflector 1106 within the spherical ring reflector 100 is shown. Detector 1104 may be similar to detectors 104, 204, and 704 described above. In some embodiments, reflector 1106 may be configured to control two focal points 1110 and 1112 generated by the emitted radiation. Figure 11A In this context, it is desirable to provide greater separation between the two focal points 1110 and 1112, therefore a double-mirror configuration can be used as reflector 1106. Figure 11B In this case, it is desirable to provide approximately equal intensity for the two focal points 1110 and 1112, so the diffraction grating can be used as a reflector 1106. Figures 11A to 11B An example is shown using reflector 1106 to control two focal points 1110 and 1112, but other variations may also be used. In some embodiments, reflector 1106 may be selected or designed to generate a single focal point on detector 1104.

[0060] See Figure 12 Another embodiment of the spherical ring reflector 1200 is shown, which includes a transmitter 1202 and a detector 1204, wherein the beam path 1220 of the transmitter 1202 is reflected from the curved wall 1210 of the spherical ring reflector 1200 toward the detector 1204. Figure 12 This illustrates how beam path 1220 generates more than one focal point at detector 1204 due to the propagation of beam path 1220.

[0061] Figures 13A to 13B A ring reflector 1200 assembled with electronic components (including PCB 1306) is shown. A transmitter 1202 and a detector 1204 can be attached to one or more connectors 1302 and 1304 configured to allow communication between the transmitter 1202, the detector 1204, and the PCB 1306. As described above, one or more of the electronic components 1302 and 1304 can be located within the central dead zone of the ring reflector 1200.

[0062] In a first embodiment, the gas detector system may include at least one emitter configured to emit radiation in a beam path; at least one detector configured to receive at least a portion of the emitted radiation; a ring reflector configured to guide the emitted radiation around the ring reflector toward the at least one detector, wherein the ring reflector includes at least a spherical portion and wherein the ring reflector is configured to allow gas to flow through at least a portion of the beam path; and processing circuitry coupled to one or more detectors and configured to process outputs from one or more detectors.

[0063] The second embodiment may include the gas detector system according to the first embodiment, and further include one or more reflectors configured to guide the beam path from the emitter toward the wall of the ring reflector.

[0064] The third embodiment may include the gas detector system according to the first or second embodiment, and further include one or more reflectors configured to direct the beam path toward at least one detector.

[0065] The fourth embodiment may include the gas detector system according to the third embodiment, wherein one or more reflectors include right-angle prisms.

[0066] The fifth embodiment may include the gas detector system according to the third or fourth embodiment, wherein one or more reflectors include two parallel mirrors.

[0067] The sixth embodiment may include a gas detector system according to any one of the first to fifth embodiments, wherein the emitted radiation generates at least two focal points at at least one detector.

[0068] The seventh embodiment may include the gas detector system according to the sixth embodiment, wherein a first focal point is used for a sample signal and a second focal point is used for a reference signal.

[0069] The eighth embodiment may include a gas detector system according to any one of the first to seventh embodiments, wherein the transmitter and detector are oriented side by side in the same plane.

[0070] The ninth embodiment may include a gas detector system according to any one of the first to eighth embodiments, wherein the transmitter and the detector are oriented relative to each other in different planes within the ring reflector.

[0071] The tenth embodiment may include a gas detector system according to any one of the first to ninth embodiments, and further includes at least one filter positioned such that the emitted radiation passes through the filter before reaching the detector.

[0072] The eleventh embodiment may include a gas detector system according to any one of the first to tenth embodiments, further including a second emitter configured to emit radiation in a second beam path; and a second detector configured to receive at least a portion of the radiation emitted in the second beam path, wherein the second beam path is oriented at an angle to the first beam path.

[0073] The twelfth embodiment may include a gas detector system according to any one of the first to eleventh embodiments, and further includes a plug configured to minimize airflow through the dead zone within the ring reflector.

[0074] The thirteenth embodiment may include a gas detector system according to any one of the first to twelfth embodiments, wherein the ring reflector includes a diameter between approximately 10 mm and 20 mm.

[0075] The fourteenth embodiment may include a gas detector system according to any one of the first to thirteenth embodiments, wherein the ring reflector includes a width between approximately 5 mm and 10 mm.

[0076] In a fifteenth embodiment, the method for gas detection may include generating a beam path of emitted radiation from an emitter; guiding the beam path of emitted radiation within a ring reflector through a gas sample; reflecting the beam path of emitted radiation around the ring reflector toward a detector, wherein the ring reflector includes at least a spherical portion; receiving the beam path of emitted radiation from the detector; and determining at least one gas concentration in the gas sample based on the received beam path of emitted radiation.

[0077] The sixteenth embodiment may include the method according to the fifteenth embodiment, and further include filtering the beam path via a filter located between the transmitter and the detector.

[0078] The seventeenth embodiment may include the method according to the fifteenth or sixteenth embodiment, and further includes receiving two focal points from the beam path via a detector, wherein the two focal points are generated by astigmatism within the ring reflector.

[0079] The eighteenth embodiment may include the method according to any one of the fifteenth to seventeenth embodiments, wherein a first focal point is used to determine a sample signal and a second focal point is used to determine a reference signal.

[0080] In a nineteenth embodiment, the gas detector system may include at least one emitter configured to emit radiation in a beam path; at least one detector configured to receive at least a portion of the emitted radiation, wherein the emitted radiation generates at least two focal points at the at least one detector; a ring reflector configured to guide the emitted radiation around the ring reflector toward the at least one detector, wherein the ring reflector includes at least a spherical portion and wherein the ring reflector is configured to allow gas to flow through at least a portion of the beam path; and processing circuitry coupled to one or more detectors and configured to process outputs from one or more detectors.

[0081] The twentieth embodiment may include the gas detection system according to the nineteenth embodiment, wherein the path length of the beam path is at least about 20 millimeters.

[0082] Although various embodiments based on the principles disclosed herein have been shown and described above, modifications can be made by those skilled in the art without departing from the spirit and teachings of this disclosure. The embodiments described herein are representative only and not intended to be limiting. Many variations, combinations, and modifications are possible and are within the scope of this disclosure. Alternative embodiments resulting from the merging, integration, and / or omission of features of one or more embodiments are also within the scope of this disclosure. Therefore, the scope of protection is not limited by the description given above, but is defined by the following claims, which include all equivalents of the subject matter of the claims. Each claim is incorporated into the specification as further disclosure, and the claims are one or more embodiments of the invention. Furthermore, any of the foregoing advantages and features may relate to specific embodiments, but the application of these published claims should not be limited to methods and structures that achieve any or all of the above advantages or have any or all of the above features.

[0083] Furthermore, the section headings used herein are intended to align with or provide organizational guidance for the recommendations of 37 CFR 1.77. These headings should not limit or characterize one or more inventions that can be set forth in any of the claims published in this disclosure. Specifically, and by way of example, although a heading may refer to “technical field,” the claims should not be limited by the language chosen under that heading to describe a so-called field. Moreover, the description of the technology in the “Background Art” section should not be construed as an admission that a particular technology is prior art to any one or more inventions of this disclosure. “Summary of the Invention” should also not be considered a limiting characterization of one or more inventions set forth in the published claims. Furthermore, any reference to the singular form “invention” in this disclosure should not be used to prove that there is only one novel point in this disclosure. Multiple inventions may be set forth according to the limitations of the multiple claims published in this disclosure, and these claims accordingly define one or more inventions protected by them and their equivalents. In all cases, the scope of these claims should be considered in accordance with the advantages of the claims themselves, and should not be limited by the headings set forth herein.

[0084] It should be understood that the use of broad terms such as “comprising,” “including,” and “having” provides support for narrower terms such as “consisting of,” “substantially composed of,” and “substantially constituted by.” The use of terms such as “optionally,” “may,” “possibly,” etc., for any element of an embodiment indicates that the element is not required, or alternatively, that the element is required, both of which are within the scope of one or more embodiments. Furthermore, references to examples are for illustrative purposes only and are not intended to be exclusive.

[0085] While several embodiments are provided in this disclosure, it should be understood that the disclosed systems and methods may be embodied in many other specific forms without departing from the spirit or scope of this disclosure. The examples of the invention should be considered illustrative rather than restrictive, and the invention is not limited to the details set forth herein. For example, various elements or components may be combined or integrated into another system, or certain features may be omitted or not implemented.

[0086] Furthermore, without departing from the scope of this disclosure, technologies, systems, subsystems, and methods described and illustrated as separate or independent in the various embodiments may be combined or integrated with other systems, modules, technologies, or methods. Other items shown or discussed as directly coupled or communicating with each other may be indirectly coupled or communicating through some interface, device, or intermediate component, whether such coupling or communication is carried out electrically, mechanically, or otherwise. Other examples of variations, substitutions, and modifications that can be identified by those skilled in the art without departing from the spirit and scope of the disclosure herein will also be provided.

Claims

1. A gas detector system (800), comprising: At least one emitter (202) is configured to emit radiation in a beam path that serves as a first beam path (220); At least one detector (204) is configured to receive at least a portion of the emitted radiation; A ring reflector (200), comprising one or more reflectors configured to direct emitted radiation along the first beam path toward the at least one detector (204), wherein the optical path length of the emitted radiation is substantially equal to the inner circumference of the ring reflector, wherein the ring reflector (200) includes at least a spherical portion, and wherein the ring reflector (200) is configured to allow gas to flow through at least a portion of the first beam path (220); and A processing circuit (810) is coupled to the at least one detector (204) and configured to process the output from the at least one detector (204).

2. The gas detector system (800) of claim 1 further includes one or more reflectors (206) configured to guide the first beam path (220) from the at least one emitter (202) toward the wall of the ring reflector (200).

3. The gas detector system (800) according to claim 1, wherein, The one or more reflectors (206) include right-angle prisms.

4. The gas detector system (800) according to claim 1, wherein, The one or more reflectors (206) include two parallel mirrors.

5. The gas detector system (800) according to claim 1, wherein, The emitted radiation generates at least two focal points (602, 604) at at least one detector (104).

6. The gas detector system (800) according to claim 5, wherein, The first focal point is used for the sample signal and the second focal point is used for the reference signal.

7. The gas detector system (800) according to claim 1, wherein, The at least one transmitter (202) and the at least one detector (204) are oriented side by side in the same plane.

8. The gas detector system (800) according to claim 1, wherein, The at least one transmitter (202) and the at least one detector (204) are oriented relative to each other in different planes within the ring reflector (200).

9. The gas detector system (800) of claim 1 further includes at least one filter (740) positioned such that emitted radiation passes through the filter (740) before reaching the at least one detector (204).

10. The gas detector system (800) according to claim 1, further comprising: A second emitter (402) is configured to emit radiation in a second beam path (420); and A second detector (404) is configured to receive at least a portion of the radiation emitted in the second beam path (420), wherein the second beam path (420) is oriented at an angle to the first beam path (220).

11. The gas detector system (800) of claim 1 further includes a plug (600) configured to minimize airflow through dead zones within the ring reflector (200).

12. The gas detector system (800) according to claim 1, wherein, The ring reflector (200) has a diameter between 10 mm and 20 mm.

13. The gas detector system (800) according to claim 1, wherein, The ring reflector (200) has a width between 5 mm and 10 mm.

14. A method for gas detection, comprising: The beam path (220) of the emitted radiation from the transmitter (202) is generated; The beam path (220) of the emitted radiation within the guide ring reflector (200) passes through the gas sample; The beam path (220) of the emitted radiation is reflected along the circumference of the ring reflector (200), wherein the optical path length of the emitted radiation is substantially equal to the inner circumference of the ring reflector, wherein the ring reflector (200) includes at least a spherical portion. The beam path (220) is guided to the detector (204) via one or more reflectors (206); The beam path (220) that receives the emitted radiation from the detector (204); and The gas concentration of the gas sample is determined based on the beam path (220) of the received emitted radiation.

15. The method of claim 14, further comprising filtering the beam path (220) via a filter (740) located between the transmitter (202) and the detector (204).

16. The method of claim 14, further comprising receiving two focal points (602, 604) from the beam path (120) via the detector (204), wherein, The two focal points (602, 604) are generated by astigmatism within the ring reflector (200).

17. The method of claim 14, wherein, The first focal point is used to determine the sample signal, and the second focal point is used to determine the reference signal.

18. A gas detector system (800), comprising: At least one emitter (102) is configured to emit radiation in a beam path (120); At least one detector (104) is configured to receive at least a portion of the emitted radiation; A ring reflector (100) configured to guide emitted radiation along the circumference of the ring reflector (100) toward the at least one detector (104), wherein the optical path length of the emitted radiation is substantially equal to the inner circumference of the ring reflector, wherein the ring reflector (100) includes at least a spherical portion, and wherein the ring reflector (100) is configured to allow gas to flow through at least a portion of the beam path (120); One or more reflectors (206) configured to guide the beam path toward the at least one detector (204); and A processing circuit (810) is coupled to the one or more detectors (104) and configured to process the output from the one or more detectors (104).

19. The gas detector system according to claim 18, wherein, The path length of the beam path (220) is at least 20 mm.

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