Insertion piece mechanism and silicon steel sheet sample magnetic property measurement system

Abstract

The present application relates to a kind of insert piece mechanism and silicon steel sheet sample magnetic property measuring system, the mechanism includes vacuum generator and sample insertion structure, sample insertion structure one end is integrated vacuum generator and is used for mechanical connection feeding manipulator, sample insertion structure is equipped with air cavity in, and the sampling face of sample insertion structure is equipped with N air holes, each air hole is communicated with vacuum generator air passage by air cavity, sample insertion structure is matched with sample piece structure;Vacuum generator is used to drive sample insertion structure to suck sample piece and insert into epstein square, and release sample piece after inserting. The whole sample piece is adsorbed by the combination of vacuum generator and sample insertion structure, so that thin silicon steel sheet can also be sucked and inserted into epstein square for measurement. The above scheme combines the accurate positioning ability of feeding manipulator itself, and the above insert piece mechanism is used at the end of feeding manipulator, which can greatly improve the insert piece efficiency under the premise of higher insert piece precision.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of magnetic property measurement of silicon steel sheet sample, in particular to a sheet inserting mechanism and a silicon steel sheet sample magnetic property measurement system. BACKGROUND

[0002] Silicon steel sheet, also known as electrical steel, is an important soft magnetic alloy indispensable for power, electronics, new energy vehicles and military industries, and is also the largest metal functional material. It is a silicon-iron alloy containing 0.8%-4.8% silicon, which is hot and cold-rolled into a silicon steel sheet with a thickness of less than 1mm. Adding silicon can increase the electrical resistivity and maximum permeability of iron, reduce the coercive force, core loss (iron loss) and magnetic aging, and is mainly used as the core of various motors, generators and transformers. Before the actual use of silicon steel sheet, its magnetic properties need to be detected. At present, the international and domestic standards for measuring the magnetic properties of silicon steel sheet are all tested by using an Epstein square. Different numbers of samples need to be selected according to the thickness, and the previous test process needs manual operation. The tested sample needs to be crossed into the Epstein square from four directions by the operator for magnetic property measurement, and the manual operation has the problem of inaccurate placement position, which leads to insufficient detection accuracy and large labor consumption, and also directly affects the production inspection timeliness.

[0003] In recent years, there has also been a means of using an automatic sheet inserting machine to improve the sheet inserting position accuracy and inspection timeliness. The existing automatic sheet inserting machine mainly uses a guide rail to push the silicon steel sheet sample into the Epstein square, and is basically only suitable for the sheet insertion of non-oriented silicon steel sheet samples with a thickness of 0.5mm and above. The thickness of oriented silicon steel sheet samples is generally 0.23mm-0.35mm, and advanced manufacturing processes can even produce products with a thickness of 0.18mm or even thinner. However, the existing automatic sheet inserting machine is already not suitable for the actual test requirements of the steel plant. SUMMARY

[0004] Therefore, it is necessary to provide a sheet inserting mechanism and a silicon steel sheet sample magnetic property measurement system, which can enable thinner silicon steel sheet samples to be integrally adsorbed and inserted into an Epstein square with high precision, greatly improving the sheet insertion efficiency.

[0005] A sheet inserting mechanism, comprising a vacuum generator and a sample inserting structure, one end of the sample inserting structure is integrated with the vacuum generator and is used for mechanically connecting a feeding manipulator, a gas cavity is arranged in the sample inserting structure, and a sampling surface of the sample inserting structure is provided with N gas holes, each gas hole is in communication with a gas channel of the vacuum generator through the gas cavity, and the sample inserting structure is matched with a sample structure; N is a positive integer not less than 2.

[0006] The vacuum generator is used to drive the sample inserting structure to adsorb the sample and insert it into the Epstein square, and release the sample after the sheet insertion.

[0007] The above-mentioned sheet inserting mechanism, based on the premise of the inner width and height of the standard Epstein square, uses a combination of a vacuum generator and a sample inserting structure to adsorb the sample as a whole, so that thin silicon steel sheets can also be adsorbed and inserted into the Epstein square for measurement. Compared with the traditional slide rail pushing mechanism, the above-mentioned scheme of the present application combines the precise positioning capability of the feeding manipulator itself, and at the end of the feeding manipulator, the above-mentioned sheet inserting mechanism can greatly improve the sheet inserting efficiency under the premise of higher sheet inserting precision.

[0008] In one of the embodiments, the sheet inserting mechanism includes two sample inserting structures, and the sheet inserting mechanism further includes a connecting piece, the two sample inserting structures are respectively arranged on the connecting piece, and the connecting piece is used for mechanically connecting the feeding manipulator, and the two sample inserting structures are used for synchronously inserting sheets into two same direction inserting ports of the Epstein square.

[0009] In one of the embodiments, the sample inserting structure includes a vacuum suction plate and a sealing layer, the sampling surface of the vacuum suction plate and the sealing layer are both provided with N air holes, the sealing layer is attached to the sampling surface of the vacuum suction plate, and the air holes on the sampling surface of the vacuum suction plate are positionally matched with the air holes on the sealing layer.

[0010] In one of the embodiments, the sealing layer is a sealing sponge.

[0011] A silicon steel sheet sample magnetic property measuring system includes a feeding station, an automatic control unit, a feeding manipulator, an Epstein square measuring station, a magnetic property measuring host, a control panel, a discharging manipulator, and a sheet inserting mechanism; the sheet inserting mechanism includes a vacuum generator and a sample inserting structure, one end of the sample inserting structure is integrated with the vacuum generator and mechanically connected with the feeding manipulator, and the vacuum generator is electrically connected with the automatic control unit.

[0012] The sample inserting structure is provided with an air cavity, and the sampling surface of the sample inserting structure is provided with N air holes, the air holes are in communication with the air duct of the vacuum generator through the air cavity, and the sample inserting structure is matched with a sample structure; N is a positive integer not less than 2;

[0013] The vacuum generator is used for driving the sample inserting structure to adsorb a sample and insert the sample into an Epstein square on the Epstein square measuring station, and release the sample after the sheet is inserted.

[0014] In one of the embodiments, the sheet inserting mechanism includes two sample inserting structures, and the sheet inserting mechanism further includes a connecting piece, the two sample inserting structures are respectively arranged on the connecting piece, and the connecting piece is used for mechanically connecting the feeding manipulator, and the two sample inserting structures are used for synchronously inserting sheets into two same direction inserting ports of the Epstein square.

[0015] In one of the embodiments, the sample inserting structure includes a vacuum suction plate and a sealing layer, the sampling surface of the vacuum suction plate and the sealing layer are both provided with N air holes, the sealing layer is attached to the sampling surface of the vacuum suction plate, and the air holes on the sampling surface of the vacuum suction plate are positionally matched with the air holes on the sealing layer.

[0016] In one of the embodiments, the vacuum suction plate is a T-shaped hollow aluminum alloy suction plate, and the T-shaped hollow aluminum alloy suction plate is integrated with a vacuum generator at the wide end.

[0017] In one of the embodiments, the sealing layer is a sealing sponge.

[0018] In one of the embodiments, the system further comprises a weighing and sorting station, a sample tank, a baling station, a stacking coefficient measuring station, and a sample recycling station.

[0019] In one of the embodiments, the system further comprises a protective fence for enclosing the components of the system.

[0020] The silicon steel sample magnetic property measuring system described above is based on the premise that the inside width and height of the standard Epstein square are known, and a specially designed sample inserting mechanism is mounted at the end of the feeding manipulator. The sample inserting mechanism uses a combination of a vacuum generator and a sample inserting structure to adsorb the sample as a whole, so that thin silicon steel sheets can also be adsorbed and inserted into the Epstein square for measurement. Compared with the traditional sliding rail pushing mechanism, the above-mentioned scheme of the present application combines the precise positioning capability of the feeding manipulator itself, and uses the above-mentioned sample inserting mechanism at the end of the feeding manipulator, which can greatly improve the sample inserting efficiency under the premise of higher sample inserting precision. BRIEF DESCRIPTION OF DRAWINGS

[0021] The accompanying drawings, which form a part of this application, are included to provide a further understanding of the application, and are incorporated in and constitute a part of this application. The embodiments of the application illustrated in the drawings, and their description, are presented to explain the application and not to limit or define the application.

[0022] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed in the embodiment description will be briefly introduced. Obviously, the drawings in the following description are only some embodiments of the present application, and other drawings can also be obtained by those skilled in the art without creative labor.

[0023] Figure 1 The structure of the sample inserting mechanism in one embodiment is shown in the schematic diagram.

[0024] Figure 2 The structure of the sample inserting mechanism in another embodiment is shown in the schematic diagram.

[0025] Figure 3 The structure of the sample inserting mechanism in another embodiment is shown in the schematic diagram.

[0026] Figure 4 The structure of the silicon steel sample magnetic property measuring system in one embodiment is shown in the schematic diagram.

[0027] Figure 5Fig. 1 is a structural schematic diagram of a silicon steel sheet sample magnetic property measurement system in another embodiment. DETAILED DESCRIPTION

[0028] In order to make the above objectives, characteristics and advantages of the present application more apparent, specific embodiments of the present application are described in detail below with reference to the accompanying drawings. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present application. However, the present application can be practiced in a number of different ways beyond the specific embodiments described herein and with modifications thereof, without departing from the scope of the present application, and it is understood that similar improvements can be made by those skilled in the art without departing from the spirit of the present application, and therefore the present application is not limited to the specific embodiments disclosed below.

[0029] In one embodiment, referring to Figure 1 , a sheet inserting mechanism 100 is provided, which includes a vacuum generator 12 and a sample inserting structure 14. The sample inserting structure 14 is integrated with the vacuum generator 12 at one end and is used for mechanical connection with a feeding robot. The sample inserting structure 14 is provided with an air cavity and a sampling surface of the sample inserting structure 14 is provided with N air holes, each air hole being in communication with an air passage of the vacuum generator 12 through the air cavity, and the sample inserting structure 14 is matched with a sample structure. N is a positive integer not less than 2. The vacuum generator 12 is used to drive the sample inserting structure 14 to suck a sample and insert the sample into an Epstein square, and release the sample after the sample is inserted.

[0030] The sheet inserting mechanism 100 described above, based on the premise of the inside width and height of a standard Epstein square, uses a combination of the vacuum generator 12 and the sample inserting structure 14 to integrally adsorb the sample, so that thin silicon steel sheets can also be integrally sucked and inserted into the Epstein square for measurement. Compared with the traditional slide rail pushing mechanism, the above-mentioned scheme in combination with the precise positioning capability of the feeding robot itself can greatly improve the sheet inserting efficiency under the premise of higher sheet inserting precision by using the above-mentioned sheet inserting mechanism at the end of the feeding robot.

[0031] It should be noted that the vacuum generator 12 can use existing vacuum generating equipment in the art, and the specific type can be selected according to the structure and size of the sample to be measured, as long as it can reliably adsorb and release the sample through the sample inserting structure 14. In actual application, the electrical control signal required by the vacuum generator 12 itself can be directly provided by the system, that is, it can be used immediately without additional interface development or adaptive adjustment. The sample inserting structure 14 can be a hollow columnar elongated suction plate structure, and the length and width and other structural parameters thereof can be determined based on the length and width and other structural parameters of the sample to be measured and the inside width and height of the standard Epstein square in the system, as long as it can reliably suck the sample and accurately insert it into the Epstein square for measurement under the pneumatic driving action of the vacuum generator 12.

[0032] The sampling surface of the sample inserting structure 14 refers to the structure surface for sucking the sample, and the air holes formed on the sampling surface are in communication with the air passage of the vacuum generator 12. The number of the air holes formed on the sampling surface of the sample inserting structure 14 can be determined according to the reliable adsorption requirement corresponding to the structure size of the sample. Therefore, when the sample is attached to the surface of the sampling surface of the sample inserting structure 14, the gas in the air cavity inside the sample inserting structure 14 is instantaneously evacuated by the vacuum generator 12 to generate negative pressure, so that the sample is firmly adsorbed on the sampling surface of the sample inserting structure 14 at the air holes. Thus, the sample can be lifted and inserted into the Epstein square, so that the oriented silicon steel sheet sample with a thickness of 0.23-0.35 mm and the product produced by the advanced manufacturing process with a thickness of 0.18 mm or less can be efficiently inserted.

[0033] In some embodiments, the number of the sample inserting mechanism 100 can be more than one, and can be determined according to the number of the Epstein square arranged in the system. For example, a plurality of Epstein squares are arranged in the Epstein square measuring station of the system, and a plurality of sample inserting mechanisms 100 can be arranged, each of which corresponds to an Epstein square sample inserting mechanism 100. Each sample inserting mechanism 100 can be directly installed at the end of the corresponding feeding manipulator, for example, but not limited to, one sample inserting mechanism 100 is installed at the end of each feeding manipulator, two or more sample inserting mechanisms 100, and the specific number of installation can be determined according to the number of the Epstein square connected by each feeding manipulator.

[0034] In addition, it should be noted that the structure connection between the vacuum generator 12 and the sample inserting structure 14 can be various, such as, but not limited to, bolt connection, clamping, riveting or welding, etc. Preferably, the vacuum generator 12 and the sample inserting structure 14 are detachable. The installation connection between the sample inserting structure 14 and the end of the feeding manipulator can be, but not limited to, bolt connection or clamping, etc., as long as it can facilitate the feeding manipulator to accurately insert the sample sucked by the sample inserting mechanism 100 into the Epstein square. Preferably, the sample inserting structure 14 and the end of the feeding manipulator are also detachable, which is more convenient for component maintenance.

[0035] In one embodiment, referring to Figure 2 Further, the sample inserting mechanism 100 includes two sample inserting structures 14, and the sample inserting mechanism 100 further includes a connecting piece 16. The two sample inserting structures 14 are respectively arranged on the connecting piece 16, and the connecting piece 16 is used for mechanically connecting the feeding manipulator. The two sample inserting structures 14 are used for synchronously inserting the sample into the two same direction ports of the Epstein square 2041.

[0036] It can be understood that in the embodiment, the sample inserting mechanism 100 can include two sample inserting structures 14 (which can share the same vacuum generator 12 to provide pneumatic driving), or two sets of vacuum generators 12 and sample inserting structures 14, forming a double suction plate structure, so as to correspond to the Epstein frame 2041 arranged on the Epstein frame measuring station in the system. One standard Epstein frame 2041 can include four insertion ports, and the two insertion ports in the same direction and the two insertion ports in the other direction are in an orthogonal relationship. In this way, the feeding mechanical arm can complete the sample inserting operation of the two insertion ports in the same direction of the Epstein frame 2041 in one action, thereby further improving the sample inserting and measuring efficiency of the system.

[0037] Alternatively, the connection mode of the sample inserting structure 14 on the connecting piece 16 can be, but is not limited to, bolt connection, clamping, riveting or welding, and the connection mode between the connecting piece 16 and the end of the feeding mechanical arm can be, but is not limited to, bolt connection or clamping, and the two are preferably connected in a detachable manner. The specific shape and size of the connecting piece 16 are not uniquely limited in the specification, as long as the connection and fixation and synchronous sample inserting of each sample inserting structure 14 thereon can be achieved.

[0038] In some embodiments, preferably, the connecting piece 16 adopts a hollow carrier plate as shown in Figure 2 , which reduces the self-weight of the sample inserting mechanism 100 and reduces the manufacturing cost.

[0039] In one embodiment, referring to Figure 2 and Figure 3 , the sample inserting structure 14 includes a vacuum suction plate 141 and a sealing layer 142. The sampling surface of the vacuum suction plate 141 and the sealing layer 142 are both provided with N air holes 143. The sealing layer 142 is attached to the sampling surface of the vacuum suction plate 141, and each air hole 143 on the sampling surface of the vacuum suction plate 141 is positionally matched with each air hole 143 on the sealing layer 142.

[0040] It can be understood that in the embodiment, the sample inserting structure 14 specifically includes two main parts of the vacuum suction plate 141 and the sealing layer 142 which are matched in structure (shape and size, etc.) with the sample sheet. The sealing layer 142 is attached to the sampling surface of the vacuum suction plate 141. The vacuum suction plate 141 can be, but is not limited to, an elongated suction plate obtained by hollow machining of high-strength aluminum alloy, or a hollow elongated suction plate obtained by machining of high-strength composite material. The sealing layer 142 can be a existing pneumatic seal or a seal made of soft material. By adopting the structure design of the vacuum suction plate 141 and the sealing layer 142 as described above, a more reliable sample sheet suction effect can be achieved. The air tightness of the vacuum suction plate 141 is better when the sample sheet is sucked, and air leakage is less likely to occur. At the same time, the vacuum suction plate 141 can have a buffering effect on the sample sheet, increase the suction surface and prevent the sample sheet from being damaged by friction.

[0041] Specifically, when the sealing layer 142 is directly attached to the surface of the sample piece, the vacuum generator 12 is used to instantaneously evacuate the gas in the air cavity inside the vacuum suction plate 141 to generate negative pressure, so that the sample piece is firmly adsorbed on the sampling surface of the vacuum suction plate 141 at the air hole 143 of the vacuum suction plate 141. Thus, the sample piece can be lifted and inserted into the Epstein square 2041. Therefore, the oriented silicon steel sheet sample with a thickness of 0.23-0.35 mm and the product produced by advanced manufacturing process with a thickness of 0.18 mm or less can be efficiently inserted.

[0042] Further, referring to Figure 3 , the vacuum suction plate 141 is a T-shaped hollow aluminum alloy suction plate, and the T-shaped hollow aluminum alloy suction plate is integrated with the vacuum generator 12 at one end with a relatively large width. This structure has low manufacturing cost and is more convenient to install and use. Specifically, the end of the T-shaped hollow aluminum alloy suction plate connected and installed with the vacuum generator 12 has a relatively large width than the other end used for adsorbing the sample piece, so as to ensure the direct fixed installation and air tightness requirement with the vacuum generator 12. The specific width of the other end of the T-shaped hollow aluminum alloy suction plate used for adsorbing the sample piece can be determined according to the width of the sample piece, and the length can also be determined according to the length of the sample piece, as long as the reliable adsorption and insertion of the sample piece into the Epstein square 2041 can be ensured.

[0043] Further, referring to Figure 3 , the sealing layer 142 is a sealing sponge. In this way, a common sealing sponge can be directly used as the pneumatic seal of the vacuum suction plate 141, which has low cost and good air tightness.

[0044] In one embodiment, referring to Figure 2 , Figure 3 and Figure 4 , a silicon steel sheet sample magnetic property measurement system 200 includes a feeding station 201, an automatic control unit 202, a feeding manipulator 203, an Epstein square measurement station 204, a magnetic property measurement host 205, a control panel 206, a discharging manipulator 207, and a sample inserting mechanism 100. The sample inserting mechanism 100 includes a vacuum generator 12 and a sample inserting structure 14. The sample inserting structure 14 is integrated with the vacuum generator 12 at one end and mechanically connected to the feeding manipulator 203. The vacuum generator 12 is electrically connected to the automatic control unit 202. The sample inserting structure 14 is provided with an air cavity, and the sampling surface of the sample inserting structure 14 is provided with N air holes. Each air hole is in communication with the air duct of the vacuum generator 12 through the air cavity. The sample inserting structure 14 is matched with the sample piece structure. N is a positive integer not less than 2. The vacuum generator 12 is used to drive the sample inserting structure 14 to adsorb the sample piece and insert it into the Epstein square 2041 on the Epstein square measurement station 204, and release the sample piece after insertion.

[0045] The silicon steel sheet sample magnetic property measurement system 200 described above, based on the premise of the inner width and height of the standard Epstein square 2041, carries a special sheet inserting mechanism at the end of the feeding manipulator 203, which uses a combination of a vacuum generator 12 and a sample inserting structure 14 to adsorb the sample as a whole, so that thin silicon steel sheets can also be sucked and inserted into the Epstein square 2041 for measurement. Compared with the traditional sliding rail pushing mechanism, the above-mentioned scheme of the present application combines the precise positioning capability of the feeding manipulator 203 itself, and at the end of the feeding manipulator 203, the above-mentioned sheet inserting mechanism can greatly improve the sheet inserting efficiency under the premise of higher sheet inserting precision.

[0046] It should be noted that in addition to the above-mentioned sheet inserting mechanism 100, the other constituent mechanisms are the existing constituent mechanisms of the system itself, and the functions, installation positions, electrical connection relationships and process cooperation of each mechanism itself can be understood in the same way as the corresponding constituent mechanisms in the existing silicon steel sheet sample magnetic property measurement system in the art, which will not be repeated here. The silicon steel sheet sample magnetic property measurement system 200 described above uses an industrial robot to carry the above-mentioned sheet inserting mechanism 100 to realize efficient feeding, sheet inserting and sampling, etc., greatly improving the working efficiency of the system.

[0047] In one embodiment, referring to Figure 2 , the sheet inserting mechanism includes two sample inserting structures 14, and further includes a connecting piece 16. The two sample inserting structures 14 are respectively arranged on the connecting piece 16, and the connecting piece 16 is used for mechanically connecting the feeding manipulator 203. The two sample inserting structures 14 are used for synchronously inserting sheets into two same direction ports of the Epstein square 2041.

[0048] In one embodiment, referring to Figure 3 , the sample inserting structure 14 includes a vacuum suction plate 141 and a sealing layer 142. The sampling surface of the vacuum suction plate 141 and the sealing layer 142 are both provided with N air holes. The sealing layer 142 is attached to the sampling surface of the vacuum suction plate 141, and each air hole on the sampling surface of the vacuum suction plate 141 is matched with each air hole on the sealing layer 142 in position.

[0049] In one embodiment, referring to Figure 3 , the vacuum suction plate 141 is a T-shaped hollow aluminum alloy suction plate, and the T-shaped hollow aluminum alloy suction plate is integrated with a vacuum generator 12 at one end with a large width.

[0050] In one embodiment, referring to Figure 3 , the sealing layer 142 is a sealing sponge.

[0051] For specific explanation and description of the sheet inserting mechanism 100 in the silicon steel sheet sample magnetic property measurement system 200 described above, the corresponding explanation and description in each embodiment of the sheet inserting mechanism 100 can be understood in the same way, which will not be repeated here.

[0052] In one embodiment, referring to Figure 4 The silicon steel sample magnetic property measurement system 200 further comprises a weighing and sorting station 208, a sample groove 209, a bundling station 210, a stacking coefficient measurement station 211 and a sample recycling station 212.

[0053] It can be understood that the silicon steel sample magnetic property measurement system 200 further comprises the weighing and sorting station 208, the sample groove 209, the bundling station 210, the stacking coefficient measurement station 211 and the sample recycling station 212, and the structure, installation position, electrical connection relationship and realized process of each component can be understood in the same way as the corresponding components in the existing silicon steel sample magnetic property measurement system, and will not be repeated here.

[0054] Specifically, the silicon steel sample magnetic property measurement system 200 uses an industrial robot to realize the processes of feeding and inserting samples, sampling and bundling. The feeding manipulator 203 picks up the group of silicon steel samples from the feeding station 201 and places them in the weighing and sorting station 208. After weighing and sorting, the sample insertion mechanism 100 at the end of the feeding manipulator 203 sucks the sample and inserts it into the Epstein square 2041 for magnetic property measurement. After the measurement is completed, the discharging manipulator 207 extracts the measured sample and arranges it in the stacking coefficient measurement station 211 for stacking coefficient measurement. After the stacking coefficient measurement is completed, the discharging manipulator 207 takes away the sample and bundles it at the bundling station 210, and then places the bundled sample in the sample recycling station 212.

[0055] Preferably, the silicon steel sample magnetic property measurement system 200 uses double Epstein squares, which can alternately perform the operations of inserting and extracting samples, thereby greatly improving the work efficiency of the system.

[0056] In one embodiment, referring to Figure 5 The silicon steel sample magnetic property measurement system 200 further comprises a protective fence 213 for enclosing the components of the system. By enclosing the components of the system with the protective fence 213, the silicon steel sample magnetic property measurement system 200 can work in a closed or semi-closed space, improving the integration and safety of the system, ensuring a dust-free environment for the internal work of the system, and improving the cleanliness of the silicon steel test.

[0057] It should be noted that the specific shape and size of the protective fence 213 can be determined according to the size and location of the components of the system, as long as it can provide effective protection for the system.

[0058] Any technical features in the above-described embodiments can be combined in any manner, and for the sake of brevity, not all possible combinations are described, but it is understood that the scope of the specification includes all possible combinations.

[0059] The above-described embodiments only express several implementation manners of the present application, and the description is relatively specific and detailed, but it should not be understood as a limitation on the scope of the patent. It should be pointed out that, for those skilled in the art, without departing from the concept of the present application, a number of modifications and improvements can be made, which are all within the protection scope of the present application. Therefore, the protection scope of the patent of the present application should be subject to the appended claims.

[0060] In the description of the present application, it should be understood that the terms "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "inner", "outer", "axial", "radial", "normal" and the like indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the device or element referred to must have a particular orientation, be constructed and operated in a particular orientation, and therefore cannot be understood as a limitation on the present application.

[0061] In addition, the terms "first", "second" are only for descriptive purposes, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Therefore, the features defined with "first", "second" can explicitly or implicitly include at least one of the features. In the description of the present application, the meaning of "a plurality of" is at least two, for example, two, three, etc., unless otherwise explicitly specified.

[0062] In the present application, unless otherwise explicitly specified and limited, the terms "mounting", "connection", "connection", "fixing" and the like should be understood in a broad sense, for example, it can be fixed connection, or detachable connection, or integral; it can be mechanical connection, or electrical connection; it can be directly connected, or indirectly connected through an intermediate medium, it can be the internal communication of two elements or the interaction relationship between two elements, unless otherwise explicitly limited. For those skilled in the art, the specific meaning of the above terms in the present application can be understood according to the specific circumstances.

[0063] In the present application, unless explicitly stated and limited otherwise, a first feature "on", "above", or "under" a second feature can be directly in contact with the second feature, or indirectly in contact with the second feature through an intermediate medium. Also, a first feature "over", "above", and "on top of" a second feature can be directly above or diagonally above the second feature, or simply mean that the first feature is horizontally higher than the second feature. A first feature "under", "below", and "underneath" a second feature can be directly below or diagonally below the second feature, or simply mean that the first feature is horizontally lower than the second feature.

[0064] It is to be understood that when an element is referred to as being "on" or "connected to" another element, it can be directly on or connected to the other element or intervening elements can be present. As used herein, the term "and / or" includes any and all combinations of one or more of the associated listed items. Other than in the operating examples or where otherwise indicated, as used herein, the terms "comprising", "comprises" and "comprised of" are to be construed as meaning "including, but not limited to".

Claims

1. A magnetic property measurement system for silicon steel sheet samples, comprising a feeding station, an automated control unit, a feeding robot, an Epstein square ring measuring station, a magnetic property measuring host, a control panel, and an unloading robot, characterized in that, The system also includes a insert mechanism, which includes a vacuum generator and an insert structure. One end of the insert structure integrates the vacuum generator and is mechanically connected to the feeding robot. The vacuum generator is electrically connected to the automation control unit. The insertion structure has an internal air cavity and the sampling surface of the insertion structure has N air holes. Each air hole is connected to the air channel of the vacuum generator through the air cavity. The insertion structure matches the sample structure. N is a positive integer not less than 2. The vacuum generator is used to drive the insertion structure to pick up the sample and insert it into the Epstein square on the Epstein square measuring station, and to release the sample after insertion; The insertion mechanism includes two insertion structures and a connector. The two insertion structures are respectively mounted on the connector. The connector is used to mechanically connect the feeding robot. The two insertion structures are used to synchronously insert the sample into the two symmetrical insertion ports of the Epstein square. The silicon steel sheet sample magnetic property measurement system uses an industrial robot as the feeding robot to realize the feeding and insertion of the sample.

2. The magnetic property measurement system for silicon steel sheet samples according to claim 1, characterized in that, The sample insertion structure includes a vacuum suction plate and a sealing layer. The sampling surface of the vacuum suction plate and the sealing layer are provided with N air holes. The sealing layer is attached to the sampling surface of the vacuum suction plate, and the positions of each air hole on the sampling surface of the vacuum suction plate and each air hole on the sealing layer are matched.

3. The magnetic property measurement system for silicon steel sheet samples according to claim 2, characterized in that, The sealing layer is a sealing sponge.

4. The magnetic property measurement system for silicon steel sheet samples according to claim 1, characterized in that, The system also includes a weighing and sorting station, a sample tank, a bundling station, a stacking coefficient measuring station, and a sample recycling station.

5. The magnetic property measurement system for silicon steel sheet samples according to claim 4, characterized in that, The system also includes a protective fence used to enclose the various components of the system.

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