A refrigerated infrared detector automatic testing system and method

Abstract

The present invention provides a refrigerated infrared detector automated testing system and method, the refrigerated infrared detector automated testing system includes a black body, a black body shifting stage, a device under test assembly console, a neck adapter plate, a refrigerator drive adapter plate, a device under test, a universal adapter plate, a power supply and bias control circuit, an analog signal processing circuit, a data transmission circuit, a timing control circuit, a focal temperature acquisition and feedback circuit, a power supply system and a computer, wherein the computer is equipped with a host computer control and processing software. During the entire testing process of the present invention, the device under test is manually operated only when placing and removing the assembly console, and other operations are completed by computer control, thereby avoiding test errors caused by human operation, realizing fully automatic control of the test system by the computer, and the results of each step of the operation are fed back to the computer so that the computer can accurately control the next operation, saving test time and improving test efficiency.

Description

Technical Field

[0001] The invention relates to an automatic testing system and method for a refrigeration type infrared detector, belonging to the technical field of infrared detector testing. Background Art

[0002] The description in this section merely provides background information related to the disclosure of this specification and does not constitute prior art.

[0003] A cooled infrared detector is a sensor device that converts incident infrared radiation into electrical signals. It has the characteristics of high sensitivity, long detection distance, and fast response speed. It is widely used in military, industrial, environmental monitoring and other fields.

[0004] Existing refrigerated infrared detector testing systems all test individual detectors manually, step by step, resulting in low test efficiency and poor status consistency. With increasing demand for refrigerated infrared detectors in both domestic and international markets, and the resulting surge in shipments, the need for automated detector testing is becoming more pressing.

[0005] With the continuous development of the application fields and demands of cooled infrared detectors, various cooled infrared detector manufacturers have developed and produced a wide variety of cooled infrared detectors, and the corresponding detector driving circuits are also diverse, so the detector test system must have universal characteristics.

[0006] It should be noted that the above technical background is merely provided to provide a clear and complete description of the technical solutions of this specification and to facilitate understanding by those skilled in the art. Simply because these solutions are described in the background technology section of this specification, it should not be assumed that the above technical solutions are well known to those skilled in the art. Summary of the Invention

[0007] The technical problem to be solved by the present invention is to provide an automatic testing system and method for refrigerated infrared detectors in response to the shortcomings of the existing technology. During the entire testing process of the present invention, the only manual operation is the placement and removal of the device under test from the assembly console, and all other operations are completed by computer control, avoiding test errors caused by human operation and realizing fully automatic and precise control of the test system by the computer.

[0008] This solution is achieved through the following technical measures: a refrigerated infrared detector automated test system, which includes a blackbody, a blackbody shift stage, a device under test assembly console, a neck adapter plate, a refrigerator drive adapter plate, a device under test, a universal adapter plate, a power supply and bias control circuit, an analog signal processing circuit, a data transmission circuit, a timing control circuit, a focus temperature acquisition and feedback circuit, a power supply system, and a computer, wherein the computer is installed with host computer control and processing software;

[0009] The blackbody is placed on a blackbody shift stage and includes a high-temperature blackbody radiation source I, a high-temperature blackbody radiation source II and a low-temperature blackbody radiation source;

[0010] Blackbody shift stage, used to control the translation alignment of the blackbody and the distance between the blackbody and the window of the device under test;

[0011] The device under test is mounted on a device under test assembly console;

[0012] The device under test assembly console connects the neck adapter plate and the refrigerator drive adapter plate to the device under test through shift alignment;

[0013] Universal adapter board, connecting all electrical signals of the device under test with the power supply and bias control circuit, analog signal processing circuit, focus temperature acquisition and feedback circuit, and timing control circuit;

[0014] The power supply and bias control circuit supplies power to the refrigerator and the device under test chip, controls the bias voltage of the device under test chip, reads the operating current and voltage in real time and transmits them to the computer;

[0015] The analog signal processing circuit outputs the analog voltage signal of the device under test, performs digital quantization after conditioning, and then transmits the data to the computer through the data transmission circuit;

[0016] Focus temperature acquisition and feedback circuit, real-time monitoring of the focal plane temperature and status of the device under test, and control of the power supply of the device under test;

[0017] The timing control circuit drives the device under test to work according to the timing requirements of the device under test configured by the computer;

[0018] The power supply system provides power to the entire test system, including real-time voltage and current monitoring.

[0019] Preferably, the bottom of the blackbody shifting stage is sequentially connected with a longitudinal guide rail and a transverse guide rail from top to bottom.

[0020] Preferably, limit switches are provided on both the transverse guide rail and the longitudinal guide rail of the blackbody shifting platform.

[0021] The present invention also provides a method for automatically testing a refrigerated infrared detector. The method is based on the above-mentioned automatic testing system for refrigerated infrared detectors and includes the following steps:

[0022] Step 1: System power-on self-test: If the power-on self-test passes, proceed to step 2; if the power-on self-test fails, a warning alarm will sound and the test will end immediately, waiting for technicians to troubleshoot the problem;

[0023] Step 2: After the power-on self-test passes, power off the driver part of the device under test in the test system;

[0024] Step 3: Detector assembly;

[0025] Step 4: The computer automatically sends a command to the refrigerator to power on, and reads the refrigerator's operating voltage, current, and the focal plane temperature of the device under test in real time, and records the time from powering on to frequency reduction of the refrigerator;

[0026] Step 5: Turn on the blackbody and set the high and low temperature blackbody radiation source temperatures as required, and provide real-time feedback on the blackbody problem to the computer;

[0027] Step 6: The computer controls the horizontal and vertical movement of the high-temperature blackbody radiation source II. After it moves to the designated position, the operation results are fed back to the computer.

[0028] Step 7: After the computer determines that steps 4, 5, and 6 are completed, the device under test chip is powered on and the timing and bias voltage are sent;

[0029] Step 8: Within the specified GPOL bias range, the GPOL bias value and integration time are automatically set in fixed steps, and the raw data output by the detector is collected. After the collection is completed, the detector output corresponding to each GPOL bias value is averaged according to the specified regional range. The GPOL curve of each region is then drawn separately. The GPOL curve value of each region from start-up to completion is calculated. The completion values ​​of each region are compared, and the maximum completion value obtained is determined as the normal operating GPOL bias value of the device under test chip.

[0030] Step 9: After the computer sends instructions to the device under test to set the GPOL bias value and timing integration time for normal operation, the computer controls the horizontal and vertical movement of the low-temperature blackbody radiation source, and feedback is sent to the computer when the movement is completed;

[0031] Step 10: The computer collects and saves N frames of raw data output by the device under test receiving radiation from the low-temperature blackbody radiation source;

[0032] Step 11: The computer controls the horizontal and vertical movement of the high-temperature blackbody radiation source I, and feedback is sent to the computer upon completion of the movement;

[0033] Step 12: The computer collects and saves N frames of raw data output by the device under test receiving radiation from the high-temperature blackbody radiation source I;

[0034] Step 13: The computer analyzes and calculates the two N frames of data collected in steps 10 and 12, calculates various performance indicators of the device under test, and outputs a test report for the device under test;

[0035] Step 14: The entire system is powered off and the test is complete.

[0036] Preferably, the detector assembly process in step 3 is: the computer automatically sends instructions to control the assembly console of the device under test to shift and align the connection, so that the electrical lead ring of the device under test is connected to the neck adapter plate, and the refrigerator drives the adapter plate to assemble and connect with the device under test. The connection is completed and the operation results are fed back to the computer.

[0037] Preferably, in step 6, the computer controls the horizontal movement of the position of the high-temperature blackbody radiation source II so that the window of the device under test is aligned with the center of the blackbody surface source of the high-temperature blackbody radiation source II, and then moves the position of the high-temperature blackbody radiation source II longitudinally so that the window of the device under test is 5 mm away from the blackbody surface source of the high-temperature blackbody radiation source II.

[0038] Preferably, in step 9, the computer controls the horizontal movement of the position of the low-temperature blackbody radiation source so that the window of the device under test is aligned with the center of the blackbody surface source of the low-temperature blackbody radiation source, and then moves the position of the low-temperature blackbody radiation source vertically so that the window of the device under test is 5 mm away from the blackbody surface source of the low-temperature blackbody radiation source.

[0039] Preferably, in step 11, the computer controls the horizontal movement of the position of the high-temperature blackbody radiation source I so that the window of the device under test is aligned with the center of the blackbody surface source of the high-temperature blackbody radiation source I, and then moves the position of the high-temperature blackbody radiation source I longitudinally so that the window of the device under test is 5 mm away from the blackbody surface source of the high-temperature blackbody radiation source I.

[0040] Preferably, the content of the system power-on self-test in step 1 includes: ensuring that the working state of the test system is normal, and confirming that the power supply, timing and bias voltage supplied to the device under test are normal.

[0041] Preferably, in step 4, the time taken for the refrigerator to switch from power supply to frequency reduction is determined based on the change in current.

[0042] The beneficial effects of the present invention are as follows: During the entire testing process of the present invention, the only manual operation is the placement and removal of the device under test from the assembly console; all other operations are completed by computer control, thus avoiding test errors caused by manual operation and achieving fully automatic control of the test system by the computer. The results of each operation are fed back to the computer so that the computer can accurately control the next operation, saving test time and improving test efficiency. The detector test mainly drives the detector to operate normally, collects the detector output data, sends it to the host computer for processing and analysis, and compares the analysis results with the judgment criteria to determine whether the detector is qualified or unqualified. Different detectors have different drive timings, power supplies, and bias voltages. In the design of the test system, the test system power supply and bias control circuit output, timing control circuit output, analog signal processing circuit common mode voltage and range output, etc. are directly controlled by the host computer according to the configuration parameters of different detectors, adapting to the test drive of different types of detectors, ensuring the normal operation of the detector, and having strong versatility. It can be seen that the present invention has outstanding substantive features and significant progress compared with the prior art, and the beneficial effects of its implementation are also obvious. BRIEF DESCRIPTION OF THE DRAWINGS

[0043] Figure 1 This is a block diagram of the composition of the automatic testing system for refrigerated infrared detectors in the present invention.

[0044] Figure 2 This is a flowchart of the automated testing method for refrigerated infrared detectors in the present invention.

[0045] Figure 3 The invention provides a GPOL bias curve diagram for the automated testing method of the refrigerated infrared detector.

[0046] Figure 4 Schematic diagram of the partial three-dimensional assembly structure of the blackbody shift stage.

[0047] Figure 5 It is a structural diagram of the longitudinal guide rail and the transverse guide rail.

[0048] Figure 6 Schematic diagram of the relative positions of the universal adapter board and the device under test.

[0049] Figure 7 This is a schematic diagram of the structure of the detector's electrical pins.

[0050] In the figure, 1-transverse guide rail, 101-transverse guide rail frame, 102-motor, 103-transverse threaded rod, 104-threaded sleeve, 2-longitudinal guide rail, 201-longitudinal guide rail frame, 202-longitudinal threaded rod, 203-motor, 3-blackbody shift stage, 4-high-temperature blackbody radiation source I, 5-low-temperature blackbody radiation source, 6-high-temperature blackbody radiation source II, 7-device under test, 701-electrical lead pin of detector, 702-front and rear horizontal moving threaded slide platform, 8-left and right horizontal slide rails, 9-detector electrical lead pin plug-in bullet hole, 10-universal adapter plate, 11-vertical slide rail, 12-front and rear moving sleeve. DETAILED DESCRIPTION

[0051] In order to clearly illustrate the technical features of this solution, the solution is described below through specific implementation methods and in conjunction with the accompanying drawings.

[0052] A cooling type infrared detector automatic test system, such as Figure 1 As shown, it includes a black body, a black body shifting stage, a device under test assembly console, a neck adapter plate, a refrigerator drive adapter plate, a device under test, a universal adapter plate 10, a power supply and bias control circuit, an analog signal processing circuit, a data transmission circuit, a timing control circuit, a focus temperature acquisition and feedback circuit, a power supply system and a computer.

[0053] The blackbody is placed on the blackbody shifting stage 3 and includes a high-temperature blackbody radiation source I 4 , a high-temperature blackbody radiation source II 6 and a low-temperature blackbody radiation source 5 .

[0054] The blackbody shift stage 3 is used to control the translation alignment of the blackbody and the distance between the blackbody and the window of the device under test. The bottom of the blackbody shift stage 3 is connected to the longitudinal guide rail 2 and the transverse guide rail 1 from top to bottom. Limit switches are provided on the transverse guide rail 1 and the longitudinal guide rail 2 of the blackbody shift stage 3; the transverse and longitudinal limit switches of the blackbody shift stage 3 can ensure the safety of the test process to avoid damage to the device under test 7. Among them, the transverse guide rail 1 includes a transverse guide rail frame 101, in which a transverse threaded rod 103 driven by a motor 102 is rotatably connected. A threaded sleeve 104 is threadedly connected to the transverse threaded rod 103, and the longitudinal guide rail 2 is fixedly connected to the threaded sleeve 104. The motor 102 drives the transverse threaded rod 103 to rotate forward or reverse, so that the threaded sleeve 104 threadedly connected to the transverse threaded rod 103 moves left or right along the transverse threaded rod 103. The threaded sleeve 104 drives the longitudinal guide rail 2 and the blackbody shift stage 3 to move synchronously to the left or right, thereby realizing the adjustment of the distance from the blackbody to the window of the device under test. The longitudinal guide rail 2 includes a longitudinal guide rail frame 201, in which a longitudinal threaded rod 202 driven by a motor 203 is rotatably connected. A threaded sleeve is threadedly connected to the longitudinal threaded rod 202, and the blackbody shifting platform 3 is fixedly connected to the threaded sleeve. The motor 203 drives the longitudinal threaded rod 202 to rotate forward or reverse, so that the threaded sleeve threadedly connected to the longitudinal threaded rod 202 moves forward or backward along the longitudinal threaded rod 202, and the threaded sleeve drives the blackbody shifting platform 3 to move forward or backward synchronously, thereby realizing the translational alignment of the blackbody.

[0055] The device under test 7 is mounted on a device under test assembly console.

[0056] The device under test assembly console, the device under test 7 is manually installed in the middle position of the device under test assembly console, the neck adapter plate and the refrigerator drive adapter plate are respectively arranged on the front and rear sides of the device under test 7 in the device under test assembly console, and the neck adapter plate and the refrigerator drive adapter plate are assembled and connected with the device under test 7 through shift alignment. The specific shift alignment structure is as follows: the device under test assembly console is located at the front and rear sides of the device under test 7 and are rotatably installed with screws, both screws are arranged along the front and rear directions, and the two screws are driven by electric motors respectively. Threaded sleeves are respectively threaded on the two screws, and the two threaded sleeves are respectively fixedly connected to the neck adapter plate and the refrigerator drive adapter plate, and the screw is driven to rotate by the motor. The rotation of the screw causes the neck adapter plate and the refrigerator drive adapter plate to rotate toward each other and be assembled and connected with the device under test 7.

[0057] The universal adapter plate 10 is connected to each electrical pin of the refrigerated infrared detector. The universal adapter plate 10 includes two symmetrically arranged front and rear pieces. The opposite sides of the two universal adapter plates 10 are symmetrically provided with detector electrical pin plug-in holes 9. The bottom of the two universal adapter plates 10 is provided with left and right horizontal slide rails 8. The front and rear sides inside the left and right horizontal slide rails 8 are respectively rotatably connected with forward and backward threaded rods driven by a motor. The outer sides of the two forward and backward threaded rods are respectively fitted with forward and backward movable sleeves 12 threadedly connected thereto. The tops of the two forward and backward movable sleeves 12 are respectively fixedly connected with vertical slide rails 11. The vertical slide rails 11 are rotatably connected with vertical threaded rods driven by a motor. The outer sides of the vertical threaded rods are fitted with vertical movable sleeves threaded thereto. Vertical through holes are respectively opened on the two universal adapter plates 10. The two universal adapter plates 10 slide with the two vertical slide rails 11 through the vertical through holes, and one side of the vertical movable sleeve is fixedly connected to the inner wall of the vertical through hole. The universal adapter plate 10 and the detector are assembled and disassembled automatically using the aforementioned structure. The assembly process for the universal adapter plate 10 and the detector is as follows: The detector is manually mounted and fixed to the DUT assembly console. The computer is then activated, and the computer's host computer controls the horizontal forward and backward movement of the threaded slide 702, ensuring a certain distance between the universal adapter plate 10 and the detector's electrical pins 701. The computer's host computer then controls the activation of the motor connected to the forward and backward threaded rods, rotating the rods and causing the forward and backward moving sleeve 12 to drive the universal adapter plate 10 toward the detector. Based on the height difference of the detectors, the computer's host computer controls the motor connected to the vertical threaded rod to activate, rotating the vertical threaded rod. This in turn drives the vertically movable sleeve to move the universal adapter plate 10, aligning the height of the detector electrical pin insertion holes 9 on the universal adapter plate 10 with the detector electrical pins 701. Finally, the computer controls the horizontal movement of the threaded slide 702, aligning the detector electrical pin insertion holes 9 on the universal adapter plate 10 with the detector electrical pins 701, completing the assembly of the detector and the universal adapter plate 10. The assembly process is controlled by a program set by the host computer. Furthermore, the bus connects to the power supply and bias control circuit, analog signal processing circuit, focal temperature acquisition and feedback circuit, and timing control circuit, connecting all electrical signals of the device under test to these circuits.

[0058] The power supply and bias control circuit supplies power to the refrigerator and the device under test chip, controls the bias voltage of the device under test chip, reads the operating current and voltage in real time and transmits them to the computer.

[0059] The analog signal processing circuit is used to collect and quantize the analog voltage signal output by the device under test in real time. Specifically, the analog voltage signal output of the device under test is conditioned and digitally quantized, and then the data is transmitted to the computer through the data transmission circuit. That is, the data transmission circuit is used to transmit the collected and quantized data of the device under test to the computer.

[0060] The focal temperature acquisition and feedback circuit monitors the focal plane temperature and status of the device under test in real time, and controls the power supply of the device under test.

[0061] The timing control circuit provides the timing and configuration for the normal operation of the device under test (detector), that is, it drives the device under test to work according to the timing requirements of the device under test configured by the computer.

[0062] The power supply system provides power to the entire test system, including real-time voltage and current monitoring.

[0063] The computer is internally installed with host control and processing software for the control and feedback of the blackbody, the control and feedback of the blackbody shift stage 3, the control and feedback of the DUT assembly console, and the processing, calculation and report output of the test data.

[0064] The present invention also provides a method for automatically testing a refrigerated infrared detector. The method is based on the above-mentioned automatic testing system for refrigerated infrared detectors and includes the following steps:

[0065] Step 1: System Power-On Self-Test: Ensure the test system is operating normally and verify that the power supply, timing, and bias voltages supplied to the device under test are normal. If the power-on self-test passes, proceed to Step 2. If the power-on self-test fails, a warning alarm sounds, and the test ends immediately, waiting for technicians to troubleshoot the problem.

[0066] Step 2: After the power-on self-test passes, the driving part of the device under test 7 in the test system is powered off.

[0067] Step 3: Detector assembly. The detector assembly process is as follows: the computer automatically sends instructions to control the assembly console of the device under test to shift and align the connection, so that the electrical lead ring of the device under test is connected to the neck adapter plate, and the refrigerator drives the adapter plate to assemble and connect with the device under test. After the connection is completed, the operation results are fed back to the computer.

[0068] Step 4: The computer automatically sends a command to the refrigerator to power on, and reads the refrigerator's operating voltage, current and the focal plane temperature of the device under test in real time, and records the time it takes for the refrigerator to power on and then reduce its frequency. The time it takes for the refrigerator to power on and then reduce its frequency is determined based on the change in current.

[0069] Step 5: Turn on the blackbody and set the high and low temperature blackbody radiation source temperatures as required, and provide real-time feedback on the blackbody problem to the computer.

[0070] Step 6: The computer controls the horizontal and vertical movement of the position of the high-temperature blackbody radiation source II6. Specifically, the computer controls the horizontal movement of the position of the high-temperature blackbody radiation source II6 so that the window of the device under test 7 is aligned with the center of the blackbody surface source of the high-temperature blackbody radiation source II6, and then moves the position of the high-temperature blackbody radiation source II6 vertically so that the window of the device under test 7 is 5 mm away from the blackbody surface source of the high-temperature blackbody radiation source II6. After moving to the specified position, the operation results are fed back to the computer.

[0071] Step 7: After the computer determines that steps 4, 5, and 6 are completed, the device under test chip is powered on and timing and bias voltage are sent.

[0072] Step 8: Within the specified GPOL bias range, the GPOL bias value and integration time are automatically set in fixed steps to collect the raw data output by the detector. After the collection is completed, the detector output corresponding to each GPOL bias value is averaged according to the specified regional range, and then the GPOL curve of each region is drawn separately. The value of the GPOL curve of each region from start to completion is calculated, and the completion values ​​of each region are compared. The maximum completion value obtained is defined as the normal working GPOL bias value of the device under test chip. The GPOL bias diagram is shown as follows: Figure 3 shown.

[0073] Step 9: After the computer host computer sends instructions to the device under test to set the GPOL bias value and timing integration time for normal operation, the computer controls the horizontal and vertical movement of the position of the low-temperature blackbody radiation source 5. Specifically, the computer controls the horizontal movement of the low-temperature blackbody radiation source 5 so that the window of the device under test 7 is aligned with the center of the blackbody surface source of the low-temperature blackbody radiation source 5, and then moves the position of the low-temperature blackbody radiation source 5 vertically so that the window of the device under test 7 is 5 mm away from the blackbody surface source of the low-temperature blackbody radiation source 5. Feedback is then sent to the computer when the movement is completed.

[0074] Step 10: The computer collects and saves N frames of raw data output by the device under test when receiving radiation from the low-temperature blackbody radiation source 5 .

[0075] Step 11: The computer controls the horizontal and vertical movement of the position of the high-temperature blackbody radiation source I4. Specifically, the computer controls the horizontal movement of the position of the high-temperature blackbody radiation source I4 so that the window of the device under test 7 is aligned with the center of the blackbody surface source of the high-temperature blackbody radiation source I4, and then vertically moves the position of the high-temperature blackbody radiation source I4 so that the window of the device under test 7 is 5 mm away from the blackbody surface source of the high-temperature blackbody radiation source I4. The movement is completed and feedback is sent to the computer.

[0076] Step 12: The computer collects and saves N frames of raw data output by the device under test when receiving radiation from the high-temperature blackbody radiation source I4.

[0077] Step 13: The computer analyzes and calculates the two N frames of data collected in steps 10 and 12, calculates various performance indicators of the device under test, and outputs a test report of the device under test 7.

[0078] Step 14: The entire system is powered off and the test is complete.

[0079] Technical features not described in the present invention can be implemented by existing technologies and will not be described in detail here. The present invention is not limited to the above-mentioned specific embodiments, and changes, modifications, additions or substitutions made by ordinary technicians in this field within the scope of the essence of the present invention should also fall within the scope of protection of the present invention.

Claims

1. A refrigerated infrared detector automatic test system, characterized by: It includes a blackbody, a blackbody shifting stage, a device under test assembly console, a neck adapter plate, a refrigerator drive adapter plate, a device under test, a universal adapter plate, a power supply and bias control circuit, an analog signal processing circuit, a data transmission circuit, a timing control circuit, a focal temperature acquisition and feedback circuit, a power supply system, and a computer, wherein the computer is installed with host computer control and processing software; The blackbody is placed on a blackbody shift stage and includes a high-temperature blackbody radiation source I, a high-temperature blackbody radiation source II and a low-temperature blackbody radiation source; Blackbody shift stage, used to control the translation alignment of the blackbody and the distance between the blackbody and the window of the device under test; The device under test is mounted on a device under test assembly console; The DUT is manually installed in the middle of the DUT assembly console. The neck adapter plate and the refrigerator drive adapter plate are respectively arranged on the front and rear sides of the DUT in the DUT assembly console. The neck adapter plate and the refrigerator drive adapter plate are assembled and connected to the DUT by shifting and aligning. The universal adapter plate is connected to each electrical pin of the refrigerated infrared detector, and the universal adapter plate includes two symmetrically arranged front and rear pieces, and the electrical pin connector holes of the detector are symmetrically opened on the opposite sides of the two universal adapter plates. The bottom of the two universal adapter plates is provided with left and right horizontal slide rails, and the front and rear sides inside the left and right horizontal slide rails are respectively rotatably connected to the front and rear threaded rods driven by the motor, and the outer sides of the two front and rear threaded rods are respectively provided with front and rear movable sleeves threadedly connected thereto, and the tops of the two front and rear movable sleeves are respectively fixedly connected to the vertical slide rails, and the vertical slide rails are rotatably connected to the vertical threaded rods driven by the motor, and the outer sides of the vertical threaded rods are provided with vertical movable sleeves threadedly connected thereto, and vertical through holes are respectively opened on the two universal adapter plates, and the two universal adapter plates are slidably matched with the two vertical slide rails through the vertical through holes, and one side of the vertical movable sleeve is fixedly connected to the inner wall of the vertical through hole; the assembly process of the universal adapter plate and the detector is as follows: manually assemble and fix the detector to the assembly control of the device under test On the platform, start the computer, and control the front and rear horizontal movement of the threaded slide table through the upper computer of the computer, so that there is a distance between the universal adapter plate and the electrical pins of the detector in the front and rear positions; the upper computer of the computer then controls the start of the motor connected to the front and rear threaded rods to rotate the front and rear threaded rods, so that the front and rear moving sleeves drive the universal adapter plate to move toward the detector; according to the height difference of the detectors, the upper computer of the computer controls the start of the motor connected to the vertical threaded rods, the vertical threaded rods rotate, and the vertical moving sleeve drives the universal adapter plate to move, so that the height of the plug-in holes of the electrical pins of the detectors on the universal adapter plate is consistent with the height of the electrical pins of the detectors, and finally controls the front and rear horizontal movement of the threaded slide table to connect the plug-in holes of the electrical pins of the detectors on the universal adapter plate with the electrical pins of the detectors, thereby completing the assembly of the detector and the universal adapter plate; the assembly process is all controlled by the program set by the upper computer, and all electrical signals of the device under test are connected with the power supply and bias control circuit, the analog signal processing circuit, the focus temperature acquisition and feedback circuit, and the timing control circuit; The power supply and bias control circuit supplies power to the refrigerator and the device under test chip, controls the bias voltage of the device under test chip, reads the operating current and voltage in real time and transmits them to the computer; The analog signal processing circuit outputs the analog voltage signal of the device under test, performs digital quantization after conditioning, and then transmits the data to the computer through the data transmission circuit; Focus temperature acquisition and feedback circuit, real-time monitoring of the focal plane temperature and status of the device under test, and control of the power supply of the device under test; The timing control circuit drives the device under test to work according to the timing requirements of the device under test configured by the computer; The power supply system provides power to the entire test system, including real-time voltage and current monitoring.

2. The refrigerated infrared detector automatic testing system according to claim 1 is characterized in that: The bottom of the blackbody shifting platform is sequentially connected with a longitudinal guide rail and a transverse guide rail from top to bottom.

3. The refrigerated infrared detector automatic testing system according to claim 2 is characterized in that: Limit switches are provided on the transverse guide rail and the longitudinal guide rail of the blackbody shifting platform.

4. A method for automatically testing a refrigerated infrared detector, characterized by: The automatic test system for refrigerated infrared detectors is based on the automatic test system for refrigerated infrared detectors according to any one of claims 1 to 3, and comprises the following steps: Step 1: System power-on self-test: If the power-on self-test passes, proceed to step 2; if the power-on self-test fails, a warning alarm will sound and the test will end immediately, waiting for technicians to troubleshoot the problem; Step 2: After the power-on self-test passes, power off the driver part of the device under test in the test system; Step 3: Detector assembly; Step 4: The computer automatically sends a command to the refrigerator to power on, and reads the refrigerator's operating voltage, current, and the focal plane temperature of the device under test in real time, and records the time from powering on to frequency reduction of the refrigerator; Step 5: Turn on the blackbody and set the high and low temperature blackbody radiation source temperatures as required, and provide real-time feedback on the blackbody problem to the computer; Step 6: The computer controls the horizontal and vertical movement of the high-temperature blackbody radiation source II. After it moves to the designated position, the operation results are fed back to the computer. Step 7: After the computer determines that steps 4, 5, and 6 are completed, the device under test chip is powered on and the timing and bias voltage are sent; Step 8: Within the specified GPOL bias range, the GPOL bias value and integration time are automatically set in fixed steps, and the raw data output by the detector is collected. After the collection is completed, the detector output corresponding to each GPOL bias value is averaged according to the specified regional range. The GPOL curve of each region is then drawn separately. The GPOL curve value of each region from start-up to completion is calculated. The completion values ​​of each region are compared, and the maximum completion value obtained is determined as the normal operating GPOL bias value of the device under test chip. Step 9: After the computer sends instructions to the device under test to set the GPOL bias value and timing integration time for normal operation, the computer controls the horizontal and vertical movement of the low-temperature blackbody radiation source, and feedback is sent to the computer when the movement is completed; Step 10: The computer collects and saves N frames of raw data output by the device under test receiving radiation from the low-temperature blackbody radiation source; Step 11: The computer controls the horizontal and vertical movement of the high-temperature blackbody radiation source I, and feedback is sent to the computer upon completion of the movement; Step 12: The computer collects and saves N frames of raw data output by the device under test receiving radiation from the high-temperature blackbody radiation source I; Step 13: The computer analyzes and calculates the two N frames of data collected in steps 10 and 12, calculates various performance indicators of the device under test, and outputs a test report for the device under test; Step 14: The entire system is powered off and the test is complete.

5. The automated testing method for refrigerated infrared detectors according to claim 4, wherein: The detector assembly process in step 3 is as follows: the computer automatically sends instructions to control the assembly console of the device under test to shift and align the connection, so that the electrical lead ring of the device under test is connected to the neck adapter plate, and the refrigerator drives the adapter plate to assemble and connect with the device under test. After the connection is completed, the operation results are fed back to the computer.

6. The automated testing method for a refrigerated infrared detector according to claim 5, wherein: In step 6, the computer controls the horizontal movement of the position of the high-temperature blackbody radiation source II so that the window of the device under test is aligned with the center of the blackbody surface source of the high-temperature blackbody radiation source II, and then moves the position of the high-temperature blackbody radiation source II vertically so that the window of the device under test is 5 mm away from the blackbody surface source of the high-temperature blackbody radiation source II.

7. The automated testing method for a refrigerated infrared detector according to claim 6, wherein: In step 9, the computer controls the horizontal movement of the low-temperature blackbody radiation source so that the window of the device under test is aligned with the center of the blackbody surface source of the low-temperature blackbody radiation source, and then moves the position of the low-temperature blackbody radiation source vertically so that the window of the device under test is 5 mm away from the blackbody surface source of the low-temperature blackbody radiation source.

8. The automated testing method for a refrigerated infrared detector according to claim 7, wherein: In step 11, the computer controls the horizontal movement of the position of the high-temperature blackbody radiation source I so that the window of the device under test is aligned with the center of the blackbody surface source of the high-temperature blackbody radiation source I, and then moves the position of the high-temperature blackbody radiation source I vertically so that the window of the device under test is 5 mm away from the blackbody surface source of the high-temperature blackbody radiation source I.

9. The automated testing method for a refrigerated infrared detector according to claim 8, wherein: The content of the system power-on self-test in step 1 includes: ensuring that the working state of the test system is normal, and confirming that the power supply, timing and bias voltage supplied to the device under test are normal.

10. The automated testing method for a refrigerated infrared detector according to claim 9, wherein: In step 4, the time from power supply to frequency reduction of the refrigerator is determined based on the change of current.

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