Oscilloscope probes and oscilloscopes
By designing oscilloscope probes that can form single-row and double-row structures, the problem of single-scenarios that are suitable for multiple simultaneous use of existing probes is solved, and more efficient testing and a wider range of application scenarios are achieved.
Patent Information
- Application Number
- CN202210954489.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2022-08-10
- Publication Date
- 2025-03-25
- Estimated Expiration
- 2042-08-10
AI Technical Summary
When existing oscilloscope probes use multiple probes at the same time, structural limitations can only be used side by side, and the applicable scenarios are single.
An oscilloscope probe is designed, which can form a single-row structure and a double-row structure. Through the width design of the front end of the probe head and the main body part and the position design of the first electrical contact head, the first electrical contact heads of the upper and lower rows of probes are arranged in succession and side by side.
When multiple oscilloscope probes are formed in two rows of structures, they can synchronously contact multiple points to be tested on the circuit to be tested, improve the testing efficiency, and expand the applicable scenarios.
Smart Images

Figure CN115290950B_ABST
Abstract
Description
Technical Field
[0001] The invention relates to the field of electrical testing, and in particular to an oscilloscope probe and an oscilloscope. Background Art
[0002] An oscilloscope is an electronic measuring instrument with a wide range of uses. It can transform invisible electrical signals into visible images, making it easier for people to study the changing processes of various electrical phenomena. The oscilloscope probe is crucial to the accuracy and correctness of the measurement results. It is an electronic component that connects the circuit being measured to the input terminal of the oscilloscope.
[0003] When using multiple oscilloscope probes at the same time, existing oscilloscope probes are usually used in a single row side by side due to structural limitations of the oscilloscope probes, and are applicable to a single scenario. Summary of the invention
[0004] Based on the above-mentioned defects in the prior art, an object of the present invention is to provide an oscilloscope probe, which can be used in a single-row structure or a double-row structure, and is applicable to more scenarios.
[0005] To this end, the present invention provides the following technical solutions.
[0006] The present invention provides an oscilloscope probe, the oscilloscope probe comprising:
[0007] Main body;
[0008] A probe head is electrically connected to the main body; a first electrical contact is provided at the front end of the probe head for electrically contacting a test point of the circuit to be tested; a central axis of the first electrical contact extends along the front-to-back direction of the main body and is located in the same plane as the bottom surface of the main body;
[0009] Among them, the plurality of oscilloscope probes can form a double-row structure, in which case the bottom surfaces of the main bodies of the upper and lower rows of oscilloscope probes abut against each other, and the first electrical contacts of the plurality of oscilloscope probes are arranged crosswise and side by side.
[0010] Preferably, the width of the front end of the probe head is equal to half of the width of the main body, and the central axis of the first electrical contact is located at half of the width of the front end of the probe head.
[0011] Preferably, a central axis of the first electrical contact is located at one-half of the width of the main body.
[0012] Preferably, a first adsorption member and a second adsorption member are respectively provided on the left and right sides of the main body;
[0013] When two adjacent oscilloscope probes are arranged side by side, the two oscilloscope probes are connected by the magnetic attraction between the first adsorption member and the second adsorption member relative to each other.
[0014] Preferably, the probe head is snap-connected and / or bonded to the main body.
[0015] Preferably, the oscilloscope probe comprises an illumination assembly for illuminating the probe head.
[0016] Preferably, the oscilloscope probe comprises a first shielding shell for shielding interference signals generated by a touch control module of the lighting assembly.
[0017] Preferably, the lighting assembly comprises a lighting lamp and a light guide; the lighting lamp is arranged on the main body; the light guide is arranged on the probe head to guide the light emitted by the lighting lamp.
[0018] Preferably, the main body is provided with an indicator light for indicating channel information of an oscilloscope to which the probe head is electrically connected.
[0019] Preferably, the width of the main body is 5.08 mm; the width of the front end of the probe head is 2.54 mm.
[0020] The present invention also provides an oscilloscope, comprising the oscilloscope probe as described above.
[0021] The present invention has the following technical effects:
[0022] The present invention provides an oscilloscope probe. By designing the width of the front end of the probe head and the main body and the position of the first electrical contact, when multiple oscilloscope probes form a two-row structure, the first electrical contacts of the upper and lower rows of oscilloscope probes can be arranged crosswise and side by side in sequence, so as to facilitate synchronous electrical contact of multiple test points in the same row on the circuit to be tested in subsequent tests, thereby improving the test efficiency. By improving the structural design of the probe head, multiple oscilloscope probes can be used in a single row or in two rows, and more scenarios are applicable. BRIEF DESCRIPTION OF THE DRAWINGS
[0023] Figure 1 It is a schematic diagram of the three-dimensional structure of the oscilloscope probe of the present invention;
[0024] Figure 2 It is a schematic diagram of the exploded structure of the oscilloscope probe of the present invention;
[0025] Figure 3 It is an enlarged view of the local structure of the oscilloscope probe of the present invention;
[0026] Figure 4 An exploded view of the assembly structure of the probe head and the light guide of the present invention;
[0027] Figure 5 An exploded view of the assembly structure of the probe head, the lighting assembly and the circuit board assembly of the present invention;
[0028] Figure 6 It is a schematic diagram of the three-dimensional structure of the housing of the present invention;
[0029] Figure 7 It is a schematic diagram of an assembly structure for common use of multiple oscilloscope probes in one embodiment of the present invention.
[0030] Description of Reference Numerals
[0031] 100. Oscilloscope probe;
[0032] 1. probe head; 11. first electrical connector; 111. first electrical contact; 12. second electrical connector; 121. second electrical contact; 13. housing; 131. tip section; 132. connection section; 133. rear end connection section; 1331. recess; 134. buckle protrusion; 135. first through hole; 1351. second slot;
[0033] 2. Main body; 21. Shell; 211. First adsorption member; 212. Second adsorption member; 213. Second groove; 2131. First groove; 214. Film; 215. First card slot; 216. Second through hole; 217. Transparent sheet; 218. Third through hole; 2191. First convex rib; 2192. Second convex rib; 2193. Third convex rib; 22. Circuit board assembly; 221. First shielding shell; 222. Circuit board; 223. Indicator light; 224. Second shielding shell; 2241. Protective wall; 22411. First clearance hole; 22412. Second clearance hole; 225. First electrical connection pin; 226. Second electrical connection pin;
[0034] 3. lighting assembly; 31. lighting lamp; 32. light guide; 321. snap-fit protrusion;
[0035] 4. Signal line; 41. Raised structure. DETAILED DESCRIPTION
[0036] In order to make the technical solutions and beneficial effects of the present invention more clearly understood, the following is a detailed description by listing specific embodiments. Unless otherwise defined, the technical and scientific terms used herein have the same meanings as those in the technical field to which this application belongs.
[0037] In the description of the present invention, unless otherwise explicitly defined, terms such as “center”, “longitudinal”, “lateral”, “length”, “width”, “thickness”, “height”, “up”, “down”, “front”, “back”, “left”, “right”, “vertical”, “horizontal”, “top”, “bottom”, “inside”, “outside”, “clockwise”, “counterclockwise”, etc., indicating directions or positional relationships are based on the directions or positional relationships shown in the accompanying drawings, and are only for the convenience of simplified description of the present invention, and do not indicate that the referred device or element must have a specific direction, be constructed and operated in a specific direction, and should not be understood as a limitation on the present invention.
[0038] In the present invention, the terms "first" and "second" are only used for the purpose of clear description and cannot be understood as the relative importance of the indicated features or the number of the indicated technical features. Therefore, the features defined as "first" and "second" can explicitly include at least one of the features. In the description of the present invention, "multiple" means at least two; "several" means at least one, unless otherwise clearly defined.
[0039] In the present invention, unless otherwise clearly defined, the terms "install", "connect", "connect", "fix", "set", etc. should be understood in a broad sense. For example, "connection" can be a fixed connection, a detachable connection, or an integral molding; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, or it can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.
[0040] In the present invention, unless otherwise clearly defined, a first feature being “on”, “above”, “above”, “below”, “below”, “below” or “below” a second feature may mean that the first feature is in direct contact with the second feature, or the first feature and the second feature are in indirect contact with each other through an intermediate medium. Moreover, a first feature being “on”, “above” or “above” a second feature may mean that the first feature is directly above or obliquely above the second feature, or simply means that the horizontal height of the first feature is higher than the horizontal height of the second feature. A first feature being “below”, “below” or “below” a second feature may mean that the first feature is directly below or obliquely below the second feature, or simply means that the horizontal height of the first feature is lower than the horizontal height of the second feature.
[0041] The terms “front”, “rear”, “left”, “right”, “up” and “down” mentioned in the present invention are all in the Figure 1 The markings in shall prevail.
[0042] Example 1
[0043] The present invention provides an oscilloscope probe, such as Figure 1 , Figure 3 , Figure 7 As shown, an oscilloscope probe 100 is included, and the oscilloscope probe 100 includes:
[0044] Main body 2;
[0045] A probe head 1 is electrically connected to the main body 2; a first electrical contact 111 is provided at the front end of the probe head 1 for electrically contacting a test point of the circuit to be tested; a central axis of the first electrical contact 111 extends along the front-to-back direction of the main body 2 and is located in the same plane as the bottom surface of the main body 2;
[0046] Among them, a plurality of oscilloscope probes can form a double-row structure, in which case the bottom surfaces of the main bodies 2 of the upper and lower rows of oscilloscope probes abut against each other, and the first electrical contacts of the plurality of oscilloscope probes are arranged crosswise and side by side.
[0047] In this embodiment, by designing the width of the front end of the probe head 1 and the main body 2 and the position design of the first electrical contact 111, when multiple oscilloscope probes form a two-row structure, the first electrical contacts 111 of the upper and lower rows of oscilloscope probes can be arranged crosswise and side by side in sequence, so as to facilitate the subsequent test to make synchronous electrical contact with multiple test points located in the same row on the circuit to be tested, thereby improving the test efficiency. By improving the structural design of the probe head 1, multiple oscilloscope probes 100 can be used in a single row or in two rows, and more scenarios are applicable. It is particularly noted that among the multiple first electrical contacts 111 arranged crosswise and side by side, the spacing between any two adjacent first electrical contacts 111 can be equal, or unequal to suit special scenarios.
[0048] In one embodiment, since the first electrical contacts 111 are small in size, a clearance structure, such as a clearance groove, is provided on the probe head 1 so that when the bottom surfaces of the main bodies 2 of the upper and lower rows of oscilloscope probes are abutted against each other, the first electrical contacts 111 of multiple oscilloscope probes can be arranged crosswise and side by side.
[0049] In another embodiment, the width of the front end of the probe head 1 is no more than half of the width of the main body 2, so that when the bottom surfaces of the main bodies 2 of the upper and lower rows of oscilloscope probes abut against each other, the front ends of the probe heads of the multiple oscilloscope probes can be arranged crosswise and side by side, thereby enabling the first electrical contacts of the multiple oscilloscope probes to be arranged crosswise and side by side.
[0050] It should be understood that the “cross-arranged in parallel” mentioned above means that the first electrical contacts of the plurality of oscilloscope probes are arranged in a row, and the first electrical contacts of the upper and lower rows of oscilloscope probes are cross-arranged in sequence.
[0051] Specifically, Figure 7As shown, the use of five oscilloscope probes together is used as an example for specific explanation. Among them, three oscilloscope probes 100 are arranged side by side in the first row, and the other two oscilloscope probes 100 are arranged side by side in the second row, and the bottom surface of the main body of the oscilloscope probes in the second row is attached to the bottom surface of the main body of the oscilloscope probes in the first row. Since the central axis of the first electrical contact head 111 of each oscilloscope probe is in the same plane with the bottom surface of its main body, and the width of the front end of the probe head where the first electrical contact head 111 is located is not greater than half of the width of the corresponding main body, by adjusting the relative position of the first row and the second row, the front ends of the three probe heads in the first row and the front ends of the two probe heads in the second row are crossed and arranged in sequence, and the three first electrical contacts 111 in the first row and the two first electrical contacts 111 in the second row are located in the same row, so that multiple points to be tested located in the same row on the circuit to be tested can be electrically contacted synchronously during subsequent testing, thereby improving the test efficiency. In one embodiment, the width of the front end of the probe head 1 is equal to one-half of the width of the main body 2, and the central axis of the first electrical contact 111 is located at one-half of the width of the front end of the probe head 1. When a plurality of oscilloscope probes 100 are used to form a two-row structure, the front ends of the upper and lower rows of probe heads 1 can be arranged crosswise and can abut against each other, playing a role of positioning and limiting, so as to facilitate the rapid formation of the two-row structure. It can be understood that the width of the front end of the probe head 1 is not limited to being equal to one-half of the width of the main body 2, and can also be less than one-half of the width of the main body 2, but at this time the front end of the probe head 1 does not have a positioning function, so it is necessary to set up a positioning structure for positioning, or manually adjust the position of each oscilloscope probe 100 when using it for testing.
[0052] In one embodiment, the width of the main body 2 is 5.08 mm; the width of the front end of the probe head 1 is 2.54 mm. When two rows of multiple oscilloscope probes 100 are used together, the spacing between the first electrical contacts 111 of two adjacent oscilloscope probes 100 in a single row is 5.08 mm, and the spacing between the first electrical contacts 111 in the upper and lower rows arranged crosswise is 2.54 mm, and the pin headers with a spacing of 2.54 mm can be directly inserted to improve the test efficiency.
[0053] In one embodiment, if Figure 1 As shown, the central axis of the first electrical contact 111 is located at half the width of the main body 2, which facilitates the electrical connection between the first electrical contact 111 and the circuit board in the main body 2 and is also beneficial to the overall structural arrangement of the oscilloscope probe.
[0054] It should be understood that the central axis of the first electrical contact 111 may also be located at any position on the bottom surface of the main body 2 .
[0055] It should be understood that the width of the front end of the probe head in the above text refers to the maximum width of the outer contour of the front end of the probe head, and the width of the main body 2 refers to the maximum width of the outer contour of the main body 2.
[0056] In one embodiment, if Figure 1 and Figure 2 As shown, the probe head 1 includes a pointed section 131 and a connecting section 132, the pointed section 131 is used to form the front end of the probe head 1, and the connecting section 132 is located between the pointed section 131 and the main body 2; the width of the connecting section 132 is greater than half of the width of the main body 2, and the connecting section 132 is provided with an avoidance structure to make way for the cross arrangement of the first electrical contacts 111 of the upper and lower oscilloscope probes 100.
[0057] Further, in one embodiment, if Figure 1 and Figure 2 As shown, the probe head 1 is a downward-probing structure, and the connecting section 132 gradually narrows toward the front of the probe head 1 to form an avoidance structure. The structure is simple in design, and the outer contour lines of the probe head 1 are smooth and beautiful in appearance.
[0058] In one embodiment, if Figure 1 and Figure 2 As shown, the probe head 1 includes a pointed mouth section 131 , a connecting section 132 and a rear end connecting section 133 in sequence, and the rear end connecting section 133 is used to connect with the main body 2 .
[0059] In one embodiment, the probe head 1 further includes a second electrical contact 121 for electrically connecting to a reference voltage point of the circuit to be tested. The second electrical contact 121 can be electrically connected to the reference voltage point on the circuit to be tested through a wiring harness, so the second electrical contact 121 can be arranged at any position on the probe head 1 that does not interfere with the common use scenario of multiple rows. During the test process, the ground point on the circuit to be tested is usually used as the reference voltage point.
[0060] Furthermore, if Figure 1 , Figure 2 , Figure 3 and Figure 4 As shown, the second electrical contact 121 is disposed on the rear end connection section 133 of the probe head 1 to shorten the distance between the second electrical contact 121 and the circuit board 222 of the main body 2 for easy electrical connection.
[0061] In one embodiment, the probe head 1 includes a first electrical connector 11 , and a front end of the first electrical connector 11 constitutes a first electrical contact 111 .
[0062] In one embodiment, the probe head 1 includes a second electrical connector 12 , and a front end of the second electrical connector 12 constitutes a second electrical contact 121 .
[0063] In one embodiment, the first electrical connector 11 and / or the second electrical connector 12 is a probe structure or a tubular structure.
[0064] In one embodiment, the first electrical connector 11 and the second electrical connector 12 are both tubular structures, which are easy to assemble. Preferably, the first electrical connector 11 and the second electrical connector 12 are both copper tubes, which have stable signal transmission and low cost.
[0065] In one embodiment, the probe head 1 includes a housing 13, and the first electrical connector 11 and the second electrical connector 12 are pre-embedded in the housing 13 by injection molding. Of course, the present invention is not limited thereto, and the first electrical connector 11 and the second electrical connector 12 can also be arranged in the housing 13 by welding, clamping or other methods.
[0066] In one embodiment, if Figure 3 As shown, the first electrical connector 11 is a curved copper tube, and the second electrical connector 12 is a straight copper tube.
[0067] In one embodiment, a first adsorption member 211 and a second adsorption member 212 are respectively disposed on the left and right sides of the main body 2 .
[0068] When two adjacent oscilloscope probes are arranged side by side, the two oscilloscope probes are connected by the magnetic attraction between the first adsorbing member 211 and the second adsorbing member 212. The magnetic connection and fixation is conducive to forming a stable connection between multiple oscilloscope probes, which is conducive to improving the operational convenience when multiple oscilloscope probes are used together.
[0069] It should be understood that the connection method between two adjacent oscilloscope probes is not limited to magnetic connection, and may also include snap connection, bonding or other connection forms.
[0070] The first adsorption member 211 and the second adsorption member 212 may be fixed to the main body 2 by snap connection, bonding, fastening connection or other methods.
[0071] In one embodiment, if Figure 2 As shown, the main body 2 includes a shell 21, and the left and right side walls of the shell 21 are respectively provided with a first groove 2131 and a second groove 213, and the first groove 2131 is arranged in the second groove 213. The first grooves 2131 of the two side walls of the shell 21 are used to respectively accommodate the first adsorbent 211 and the second adsorbent 212, and the second groove 213 is used to accommodate the film 214. Among them, the film 214 is arranged in the second groove 213 in an adhesive manner to press the first adsorbent 211 and the second adsorbent 212. At this time, the first adsorbent 211 and the second adsorbent 212 can be clamped or bonded in the first groove 2131, or can be movably placed in the first groove 2131. It should be understood that the number of the first grooves 2131 can be as follows: Figure 2The number of the second grooves 213 may be one, three, four or more, and the number of the second grooves 213 may be the same as the number of the first grooves 2131. The number of the second grooves 213 may be the same as the number of the first grooves 2131, and the number of the films 214 may be the same as the number of the second grooves 213. In addition, the films 214 may be replaced by rigid clamps, which are directly clamped in the second grooves 213.
[0072] Furthermore, if Figure 2 As shown, the first groove 2131 is a circular structure, and the second groove 213 is a long strip structure. Of course, the present invention is not limited thereto, and the shape of the first groove 2131 can also be a polygon or other shapes, and the shape of the second groove 213 can be an ellipse or other shapes.
[0073] In one embodiment, one of the first adsorption component 211 and the second adsorption component 212 is a magnet, and the other is a magnet or a metal material component.
[0074] It should be understood that in order to facilitate the arrangement of multiple oscilloscope probes 100 in a single row, the left and right sides of the main body 2 are at least partially formed into planes, so that the side walls of two adjacent oscilloscope probes 100 can abut against each other. Further, in order to simplify the structural design of the main body 2, the left and right side surfaces and the bottom surface of the main body 2 are formed as a whole into planes.
[0075] In one embodiment, the probe head 1 is snap-connected and / or bonded to the main body 2 , and the connection structure is simple and occupies little space.
[0076] Specifically, the probe head 1 is snap-fitted to the main body 2, which is quick to assemble and easy to disassemble; or,
[0077] The probe head 1 and the main body 2 are bonded together by means of glue or tape, thereby simplifying the structural design of the probe head 1 and the main body 2; or,
[0078] The probe head 1 and the main body 2 are connected by snap-fit connection and bonding at the same time, which can achieve the effects of quick connection and stable connection.
[0079] In a specific embodiment, if Figure 2 As shown, the probe head 1 includes a shell 13, and snap-on protrusions 134 are respectively provided on both sides of the rear end of the shell 13; the main body 2 includes a shell 21, and the shell 21 is provided with a cavity with an open front end, and first snap-on grooves 215 are respectively provided on both sides of the front end side walls of the cavity; the rear end of the shell 13 is inserted into the cavity of the shell 21, and is fixed by snapping the snap-on protrusion 134 with the first snap-on groove 215.
[0080] Furthermore, if Figure 2As shown, the housing 13 includes a pointed mouth section 131, a connecting section 132 and a rear connecting section 133 in sequence; snap-fit protrusions 134 are provided on both sides of the rear connecting section 133. When the rear connecting section 133 is inserted into the chamber of the housing 21 and snap-fitted, the rear wall of the connecting section 132 abuts against the front wall of the housing 21 to seal the chamber.
[0081] Furthermore, if Figure 2 As shown, a recessed portion 1331 is provided on the top wall of the rear end connecting section 133 for accommodating glue so as to form a bond between the top wall of the shell 13 and the inner wall of the chamber of the shell 21 after the shell 13 and the shell 21 are buckled together.
[0082] In one embodiment, if Figure 2 and Figure 5 As shown, the oscilloscope probe includes an illumination assembly 3 for illuminating the probe head 1 so as to perform testing in a dark environment.
[0083] Furthermore, the oscilloscope probe includes a first shielding shell 221 for shielding interference signals generated by the touch module of the lighting assembly 3, thereby providing lighting while ensuring the accuracy of the test.
[0084] Furthermore, in order to simplify the arrangement of electronic components of the oscilloscope probe 100 , the touch module of the lighting assembly 3 is integrated on the circuit board 222 of the main body 2 , and the first shielding shell 221 and the circuit board 222 together form the circuit board assembly 22 of the main body 2 .
[0085] Furthermore, the first shielding shell 221 is a cover structure, which covers the touch module of the lighting assembly 3. In addition, the installation structure of the first shielding shell 221 is not limited to the above form.
[0086] In one embodiment, if Figure 2 , Figure 3 and Figure 5 As shown, the lighting assembly 3 includes a lighting lamp 31 and a light guide 32; the lighting lamp 31 is arranged on the main body 2; the light guide 32 is arranged on the probe head 1 to guide the light of the lighting lamp 31. In this way, the light can be made more uniform by arranging the light guide 32.
[0087] Furthermore, the light guide member 32 includes but is not limited to a light guide column or a light guide sheet.
[0088] Furthermore, the illuminating lamp 31 is an LED lamp bead, which is integrated on the circuit board 222 of the main body 2, and is easy to assemble. The assembling method of the illuminating lamp 31 and the circuit board 222 includes but is not limited to welding.
[0089] Furthermore, if Figures 2 to 5As shown, the light guide 32 is a light guide column; the probe head 1 includes a housing 13, the housing 13 is provided with a first through hole 135 extending in the front-to-back direction, and the light guide 32 is inserted into the first through hole 135. One end of the light guide 32 faces the illuminating lamp 31 to guide the light of the illuminating lamp 31 to the outside of the housing 13.
[0090] Furthermore, if Figure 4 As shown, a second card groove 1351 is provided on the inner wall of one end of the first through hole 135 facing the main body 2, and a card protrusion 321 matching the second card groove 1351 is provided on the outer surface of one end of the light guide 32 facing the main body 2; when the light guide 32 is inserted from the back of the shell 13, the card protrusion 321 is carded into the second card groove 1351 to limit the assembly of the light guide 32 axially and circumferentially.
[0091] In another embodiment, the lighting assembly 3 may also be disposed on the outer wall of the main body 2 or the probe head 1 to directly illuminate the exterior of the probe head 1 without providing a light guide 32 .
[0092] In one embodiment, if Figure 2 and Figure 5 As shown, the main body 2 is provided with an indicator light 223 to indicate the channel information of the oscilloscope electrically connected to the probe head 1. When multiple oscilloscope probes 100 are used together, in order to facilitate the user to understand that each channel on the oscilloscope corresponds to the oscilloscope probe 100 electrically connected, by providing the indicator light 223 on the main body 2, the channel of the oscilloscope corresponding to the oscilloscope probe 100 can be intuitively displayed.
[0093] Furthermore, the indicator light 223 can display different colors for distinguishing indications. For example, when the oscilloscope probe 100 is electrically connected to the red-marked channel of the oscilloscope, the indicator light 223 is displayed in red for indication. In addition, the indicator light 223 can also be distinguished by lights with different flashing frequencies. The indication form of the indicator light 223 is not limited to the above manner.
[0094] Furthermore, if Figure 5 As shown, in order to simplify the arrangement of the electronic components of the oscilloscope probe 100, the indicator light 223 can be integrated on the circuit board 222 in the main body 2. The assembly method of the indicator light 223 and the circuit board 222 includes but is not limited to welding.
[0095] In a specific embodiment, if Figure 2 As shown, the main body 2 includes a shell 21, and the shell 21 is provided with a second through hole 216 corresponding to the position of the indicator light 223, and a light-transmitting sheet 217 is provided in the second through hole 216 to form an indication window.
[0096] Furthermore, the second through hole 216 is disposed on the top of the housing 21 for easy observation by the user.
[0097] In one embodiment, if Figure 2 and Figure 5 As shown, the main body 2 includes a shell 21 and a circuit board assembly 22 disposed in the shell 21; the circuit board assembly 22 includes a circuit board 222 and a second shielding shell 224, and the second shielding shell 224 is used to prevent external interference with the oscilloscope probe signal.
[0098] Furthermore, the second shielding shell 224 covers the periphery of the electronic components of the circuit board 222 to ensure effective shielding.
[0099] Furthermore, the second shielding shell 224 is disposed on the circuit board 222. The assembly method of the second shielding shell 224 and the circuit board 222 includes but is not limited to welding.
[0100] In one embodiment, if Figure 5 As shown, the length of the circuit board 222 extends along the front-to-back direction of the main body 2, and the second shielding shell 224 is bent toward the side wall of the probe head 1 to form a protective wall 2241. The protective wall 2241 is used to wrap the side wall of the circuit board 222 toward the probe head 1 to play a protective role and avoid damage to the circuit board 222 when the main body 2 and the probe head 1 are assembled.
[0101] Furthermore, the protective wall 2241 is provided with a first clearance hole 22411 for allowing the light emitted by the illuminating lamp arranged on the circuit board 222 to enter the light guide member 32 arranged on the probe head 1 .
[0102] Furthermore, the protective wall 2241 is provided with two second clearance holes 22412 for respectively allowing two electrical connectors on the probe head 1 to be electrically connected to the circuit board 222 .
[0103] In one embodiment, if Figure 2 , Figure 5 As shown, in order to facilitate the electrical connection between the main body 2 and the probe head 1 , the main body 2 is provided with a first electrical connection pin 225 and a second electrical connection pin 226 to be electrically connected to the first electrical connection member 11 and the second electrical connection member 12 of the probe head 1 , respectively.
[0104] Furthermore, the first electrical connection pin 225 and the second electrical connection pin 226 are disposed on the circuit board 222. The assembly method of the first electrical connection member 11 and the second electrical connection member 12 and the circuit board 222 includes but is not limited to welding.
[0105] In a specific embodiment, the first electrical connector 11 and the second electrical connector 12 are copper tubes, and the main body 2 is buckled with the probe head 1. When the main body 2 and the probe head 1 are buckled in place, the first electrical connector 225 is inserted into the first electrical connector 11 to achieve electrical connection, and the second electrical connector 226 is inserted into the second electrical connector to achieve electrical connection.
[0106] In one embodiment, if Figure 2 and Figure 5 As shown, when the oscilloscope probe 100 includes the lighting assembly 3 , the circuit board assembly 22 further includes a first shielding shell 221 for shielding interference signals generated by the touch module of the lighting assembly 3 .
[0107] In one embodiment, if Figure 1 and Figure 2 As shown, the oscilloscope probe 100 further includes a signal line 4, and the signal line 4 is connected to the circuit board 222 of the main body 2. The assembly method of the signal line 4 and the circuit board 222 includes but is not limited to welding.
[0108] Furthermore, the assembly point of the signal line 4 and the circuit board 222 is located in the cavity of the shell 21 of the main body 2; Figure 1 and Figure 6 As shown, the rear wall of the shell 21 of the main body 2 is provided with a third through hole 218 so that the signal line 4 can be connected to the circuit board 222 after being inserted into the shell 21 .
[0109] Furthermore, if Figure 2 As shown, a protruding structure 41 is provided on the periphery of one end of the signal line 4 close to the circuit board 222 of the main body 2 , and the protruding structure 41 abuts against the rear surface of the cavity of the shell 21 of the main body 2 to limit the signal line 4 .
[0110] Furthermore, the insulating layer of the signal line 4 is integrally formed with a protruding structure 41 ; or, the protruding structure 41 is a rubber layer wrapped around the outer periphery of the signal line 4 .
[0111] In one embodiment, the main body 2 includes a shell 21 , a slot structure is provided in a cavity of the shell 21 , and the circuit board 222 is snapped into the slot structure to limit the circuit board 222 from moving left and right and / or up and down in the shell 21 .
[0112] Furthermore, if Figure 6 As shown, the upper and lower walls of the chamber are respectively provided with a first convex rib 2191 and a second convex rib 2192, and the left or right wall of the chamber is provided with a third convex rib 2193. The first convex rib 2191, the second convex rib 2192 and the third convex rib 2193 together with the surface wall of the chamber form a slot structure.
[0113] When the circuit board 222 is snapped into the slot structure, the rear end of the circuit board 222 abuts against the signal line 4, and the front end surface of the circuit board assembly 22 abuts against the rear end surface of the probe head 1, thereby completing the fixation of the circuit board assembly 22. The assembly is quick and the fixing structure is simple, which is conducive to the miniaturized design of the main body 2.
[0114] Example 2
[0115] The present invention provides an oscilloscope, comprising the oscilloscope probe as described above. The oscilloscope probe 100 can be used individually, in a single row or in a double row, so as to improve the test efficiency and facilitate the user's operation.
[0116] It should be understood that the above embodiments are exemplary and are not intended to include all possible implementations included in the claims. Various modifications and changes may be made on the basis of the above embodiments without departing from the scope of the present disclosure. Similarly, the various technical features of the above embodiments may be arbitrarily combined to form other embodiments of the present invention that may not be explicitly described. Therefore, the above embodiments only express several implementations of the present invention and do not limit the scope of protection of the patent of the present invention.
Claims
1. An oscilloscope probe, characterized in that: The oscilloscope probe comprises: Main body (2); A probe head (1) electrically connected to the main body (2); a first electrical contact (111) is provided at the front end of the probe head (1) for electrically contacting a test point of the circuit to be tested; a central axis of the first electrical contact (111) extends along the front-rear direction of the main body (2) and is located in the same plane as the bottom surface of the main body (2); The plurality of oscilloscope probes can form a double-row structure, in which case the bottom surfaces of the main bodies (2) of the upper and lower rows of oscilloscope probes abut against each other, and the first electrical contacts of the plurality of oscilloscope probes are arranged crosswise and side by side; the crosswise and side by side arrangement means that the first electrical contacts of the plurality of oscilloscope probes are arranged in one row and the first electrical contacts of the upper and lower rows of oscilloscope probes are arranged crosswise in sequence.
2. The oscilloscope probe according to claim 1, characterized in that: The width of the front end of the probe head (1) is equal to half the width of the main body (2), and the central axis of the first electrical contact is located at half the width of the front end of the probe head (1).
3. The oscilloscope probe according to claim 1, characterized in that: The central axis of the first electrical contact (111) is located at half the width of the main body (2).
4. The oscilloscope probe according to claim 1, characterized in that: A first adsorption component and a second adsorption component are respectively provided on the left and right sides of the main body (2); When two adjacent oscilloscope probes are arranged side by side, the two oscilloscope probes are connected by the magnetic attraction between the first adsorption member and the second adsorption member relative to each other.
5. The oscilloscope probe according to any one of claims 1 to 4, characterized in that: The probe head (1) is snap-connected and / or bonded to the main body (2).
6. The oscilloscope probe according to any one of claims 1 to 4, characterized in that: The oscilloscope probe comprises an illumination assembly (3) for illuminating the probe head (1).
7. The oscilloscope probe according to claim 6, characterized in that: The oscilloscope probe comprises a first shielding shell (221) for shielding interference signals generated by a touch control module of the lighting assembly (3).
8. The oscilloscope probe according to claim 6, characterized in that: The lighting assembly (3) comprises a lighting lamp (31) and a light guide (32); the lighting lamp (31) is arranged on the main body (2); and the light guide (32) is arranged on the probe head (1) to guide the light emitted by the lighting lamp (31).
9. The oscilloscope probe according to any one of claims 1 to 4, characterized in that: The main body (2) is provided with an indicator light (223) for indicating channel information of an oscilloscope to which the probe head (1) is electrically connected.
10. The oscilloscope probe according to any one of claims 1 to 4, characterized in that: The width of the main body (2) is 5.08 mm; the width of the front end of the probe head (1) is 2.54 mm.
11. An oscilloscope, characterized in that: The invention comprises an oscilloscope probe as claimed in any one of claims 1 to 10.
Citation Information
Patent Citations
Multichannel signal obtaining probe with adaptor
CN103884881A
Probe structure and measuring device
CN213748486U