Simulated temperature rise test system for magnetic device

Abstract

The invention provides a simulation temperature rise test system for a magnetic device, and the system comprises an upper computer which is connected with a display and is used for setting test parameters. The control signal processor is used for receiving the test parameters of the upper computer and performing signal conversion to obtain a test pulse signal; the inductance on-line simulator is used for receiving the test pulse signal, at least two test ends are arranged in the inductance on-line simulator, the test ends are connected with a magnetic device to be tested, and the test ends are used for driving the magnetic device according to the test pulse signal; the oscilloscope is electrically connected with the output end of the inductance online simulator and is used for receiving temperature rise and loss data of the magnetic device driven by the test pulse signal, exporting the received temperature rise and loss data and displaying the received temperature rise and loss data on the display in a curve mode; the magnetic device simulation temperature rise test system provided by the invention is good in integration, and facilitates performance comparison between different magnetic devices.

Description

Technical Field

[0001] The present invention relates to the technical field of magnetic device testing, and in particular to a magnetic device simulated temperature rise testing system. Background Art

[0002] With technological advances in modern power, communications, and new energy, high-power magnetic devices are becoming increasingly critical in various applications. Magnetic devices are components made using the magnetic properties of magnetic materials, primarily including inductors, transformers, magnetic heads, magnetoresistive devices, and magnetic storage devices. Because magnetic devices experience iron and copper losses during operation, this process generates significant heat, causing their temperature to rise, impacting their performance and lifespan. Therefore, temperature rise testing of magnetic devices is an important means of evaluating their quality and reliability. Temperature rise testing can examine parameters such as loss, temperature rise, and current-voltage curves under different operating conditions, as well as performance differences compared to other magnetic devices.

[0003] The existing temperature rise test of magnetic devices mainly places the magnetic devices one by one on a test platform, and the staff inputs certain current parameters to record the temperature rise of the magnetic devices under the action of the current. Because the current may fluctuate during the one-by-one testing and the test results between magnetic devices are scattered, it is difficult to ensure consistent input when comparing the performance of magnetic devices, and the accuracy of the magnetic device performance comparison is not high. Summary of the Invention

[0004] Based on this, an object of the present invention is to provide a magnetic device simulated temperature rise test system to solve the technical problems in the prior art.

[0005] The present invention provides a magnetic device simulated temperature rise test system, comprising: A host computer connected to the display and used to set test parameters; A control signal processor, wherein the input end of the control signal processor is electrically connected to the host computer, and is used to receive the test parameters of the host computer and perform signal conversion to obtain a test pulse signal; an inductor online simulator, wherein an input terminal of the inductor online simulator is electrically connected to an output terminal of the control signal processor and is used to receive the test pulse signal; the inductor online simulator is provided with at least two test terminals, each of which is connected to a magnetic device to be tested and is used to drive the magnetic device according to the test pulse signal; An oscilloscope is electrically connected to the output end of the inductor online simulator, and is used to receive the temperature rise and loss data of the magnetic device when driven by the test pulse signal, and to export the received temperature rise and loss data and display them on a display in the form of a curve.

[0006] The beneficial effects of the present invention are as follows: the present invention provides a magnetic device simulated temperature rise test system, comprising a host computer, a control signal processor, an inductor online simulator, and an oscilloscope; the host computer is connected to a display for setting test parameters; the input end of the control signal processor is electrically connected to the host computer for receiving the test parameters of the host computer and performing signal conversion to obtain a test pulse signal; the input end of the inductor online simulator is electrically connected to the output end of the control signal processor for receiving the test pulse signal, and the inductor online simulator is provided with at least two test ends, the test end is connected to the magnetic device to be tested, and the test end is used to drive the magnetic device according to the test pulse signal; during the test process, the oscilloscope is electrically connected to the output end of the inductor online simulator for receiving the temperature rise and loss data of the magnetic device under the drive of the test pulse signal, and the received temperature rise and loss data are exported and displayed on the display in the form of a curve; the magnetic device simulated temperature rise test system provided by the present application can test multiple magnetic devices at the same time, with a consistent test environment, which facilitates performance comparison of two magnetic devices.

[0007] Preferably, the host computer and the control signal processor are electrically connected via an RS485 interface, the test parameters include at least switching frequency, duty cycle, and test current, and the control signal processor is used to control the switching frequency and duty cycle of the MOSFET switch according to the test pulse signal.

[0008] Preferably, the switching frequency ranges from 20 kHz to 200 kHz; the duty cycle ranges from 30% to 85%; and the test current ranges from 0 A to 100 A.

[0009] Preferably, the magnetic device simulated temperature rise test system further includes an AC / DC converter; The input end of the AC / DC converter is electrically connected to an external power source, and is used to convert the external power source into a DC voltage as needed to power the test system.

[0010] Preferably, the control signal processor is also electrically connected to the AC / DC converter, and the control signal processor is further used to regulate the DC voltage of the AC / DC converter.

[0011] Preferably, the magnetic device simulated temperature rise test system further includes a feedback electronic load; The feedback electronic load is electrically connected to the control signal processor and the inductor online simulator respectively, and the control signal processor is further used to control the working mode of the feedback electronic load; The feedback electronic load is used to simulate the load characteristics of the magnetic device according to the working mode, obtain the voltage signal and current signal corresponding to the magnetic device, and provide current feedback to the control signal processor.

[0012] Preferably, the operating modes include at least a constant voltage operating mode, a constant current operating mode, and a constant resistance operating mode.

[0013] Preferably, the feedback electronic load is electrically connected to the power input terminal of the AC / DC converter, and the feedback electronic load is also used to provide energy feedback to the AC / DC converter.

[0014] Additional aspects and advantages of the present invention will be set forth in part in the description which follows and, in part, will be obvious from the description which follows, or may be learned by practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 A schematic diagram of the signal transmission flow of the magnetic device simulation temperature rise test system provided by the present invention; Figure 2 This is a schematic diagram of the structure of the magnetic device simulation temperature rise test system provided by the present invention; Figure 3 This is a structural schematic diagram of another magnetic device simulation temperature rise test system provided by the present invention.

[0016] The following specific embodiments will further illustrate the present invention in conjunction with the above-mentioned drawings. DETAILED DESCRIPTION

[0017] To facilitate understanding of the present invention, the present invention will be described more fully below with reference to the accompanying drawings. The drawings illustrate several embodiments of the present invention. However, the present invention may be implemented in many different forms and is not limited to the embodiments described herein. Rather, these embodiments are provided to provide a more thorough and comprehensive understanding of the present invention.

[0018] It should be noted that when an element is referred to as being "fixed to" another element, it may be directly on the other element or there may be an intermediate element. When an element is referred to as being "connected to" another element, it may be directly connected to the other element or there may be an intermediate element. The terms "vertical," "horizontal," "left," "right," and similar expressions used herein are for illustrative purposes only.

[0019] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one skilled in the art to which this invention pertains. The terms used in this specification of the present invention are for the purpose of describing specific embodiments only and are not intended to limit the present invention. The term "and / or" as used herein includes any and all combinations of one or more of the associated listed items.

[0020] Specifically, such as Figure 1 As shown, an embodiment of the present invention provides a magnetic device simulation temperature rise test system, including: a host computer, the host computer is connected to a display, and is used to set test parameters; a control signal processor, the input end of the control signal processor is electrically connected to the host computer, and is used to receive the test parameters of the host computer and perform signal conversion to obtain a test pulse signal; an inductor online simulator, the input end of the inductor online simulator is electrically connected to the output end of the control signal processor, and is used to receive the test pulse signal, the inductor online simulator is provided with at least two test ends, the test end is connected to the magnetic device to be tested, and the test end is used to drive the magnetic device according to the test pulse signal; an oscilloscope, the oscilloscope is electrically connected to the output end of the inductor online simulator, and is used to receive the temperature rise and loss data of the magnetic device under the drive of the test pulse signal, and the received temperature rise and loss data are exported and displayed on the display in the form of a curve.

[0021] Optionally, the host computer and the control signal processor are electrically connected through an RS485 interface to achieve communication with the control signal processor and provide a user interface; the test parameters include at least switching frequency, duty cycle, and test current, and the control signal processor is used to control the switching frequency and duty cycle of the MOSFET switch according to the test pulse signal; the host computer is electrically connected to the display module, and the display module uses an LCD screen and buttons to display and operate the test parameters and results; optionally, the switching frequency range is: 20KHz-200KHz; the duty cycle range is: 30%-85%, and the test current range is: 0A-100A.

[0022] In this embodiment, two test terminals are set on the inductor online simulator, and the two test terminals are respectively connected to a magnetic device. By setting test parameters such as switching frequency, duty cycle, and test current, a PWM signal is formed, and the PWM signal is input into the inductor online simulator to drive the two magnetic devices, so as to realize simultaneous measurement of the two magnetic devices; the two test bits are independent of each other, but the test environment is exactly the same; then the measurement results of the two magnetic devices are output simultaneously through the oscilloscope, which facilitates timely comparative analysis of the performance of the two magnetic devices. Optionally, the test parameters and results displayed by the oscilloscope may include current and voltage curves, loss curves, temperature rise curves, etc., and provide data export and analysis functions; in this embodiment, the output voltage of the magnetic device should be greater than 30V, the temperature acquisition is 16 bits, and the temperature acquisition accuracy is 0.5%.

[0023] Optional, such as Figure 1 As shown, the magnetic device is equivalent to an inductor. In another optional embodiment, it can also be equivalent to a magnetic core. The simulated temperature rise test system also includes an AC / DC converter; the input end of the AC / DC converter is electrically connected to an external power supply, and is used to convert the external power supply into a DC voltage as needed to power the test system; in this embodiment, the AC / DC converter is mainly responsible for converting the 220V AC input into various DC voltage outputs required by the system, such as 12V, 5V, 3.3V, etc.; the control signal processor is also electrically connected to the AC / DC converter, and the control signal processor is also used to adjust the DC voltage of the AC / DC converter.

[0024] Optionally, the simulated temperature rise test system also includes a feedback electronic load. In this embodiment, there are two feedback electronic loads; the feedback electronic loads are electrically connected to the control signal processor and the inductor online simulator respectively, and the control signal processor is also used to control the working mode of the feedback electronic load; the feedback electronic load is used to simulate the load characteristics of the magnetic device according to the working mode, obtain the voltage signal and current signal corresponding to the magnetic device, and provide current feedback to the control signal processor. The working mode can at least include a constant voltage working mode, a constant current working mode, and a constant resistance working mode. The control signal processor controls the current and other data of the feedback electronic load, thereby controlling the drive of the magnetic device, and the feedback electronic load provides current feedback to the control signal processor. Optionally, the feedback electronic load is electrically connected to the power input terminal of the AC / DC converter, and the feedback electronic load is also used to provide energy feedback to the AC / DC converter, thereby controlling the voltage and other data of the input system; in this embodiment, the magnetic device simulated temperature rise test system can adjust the power and waveform adjustment changes of the system in a timely manner to achieve self-balancing by arranging the feedback electronic load; the system can also regularly update software and implement remote maintenance through 5G Internet of Things.

[0025] Optionally, in this embodiment, the structure of the magnetic device simulation temperature rise test system can be as follows: Figure 2 As shown, the magnetic device simulation temperature rise test system uses a 19-inch chassis. The 19-inch chassis structure is easy to install and disassemble, and the entire system can be placed in a cabinet or rack, saving space and cost. It is also convenient for heat dissipation and dust prevention. The fan or air conditioner inside the chassis can be used for temperature control and dust removal, improving the stability and life of the system. It is also easy to expand and maintain. Modules can be added or replaced as needed, facilitating system upgrades and troubleshooting. In addition, it supports multi-channel synchronous sampling and analysis and can be expanded through an Ethernet switch. A single computer can achieve parallel synchronous testing and analysis of quasi-dynamic and dynamic stress-strain signals of unlimited channels. It also supports online synchronous loading with various loading testers, which can simulate the performance differences of different products in real application scenarios.

[0026] In some other optional embodiments, the structure of the magnetic device simulation temperature rise test system can be as follows: Figure 3 As shown, the AC / DC converter, inductor online simulator, and electronic load are placed in a single chassis, with the oscilloscope placed on top and the host computer placed separately. This desktop design is easy to carry and move, allowing the system to be used as a standalone device for testing and demonstrations anytime, anywhere. It is also easy to observe and operate, with test parameters and results visible directly on the desktop and settings and controls performed via the display module or host computer. It can also connect and interact with other devices, transmitting and analyzing data with other instruments or computers via RS485 or USB interfaces. It also supports CCM (continuous conduction mode) and DCM (discontinuous conduction mode) operating modes, allowing you to select the appropriate mode based on the characteristics of the inductor or magnetic core, improving test accuracy and flexibility. It also supports a variety of inductor types, such as air core, iron core, and ferrite, allowing you to test different inductor parameters such as inductance, loss, and temperature rise.

[0027] In summary, the present invention provides a magnetic device simulation temperature rise test system, including a host computer, a control signal processor, an inductor online simulator, and an oscilloscope; by connecting the host computer to a display, operations such as setting test parameters, starting the test, stopping the test, displaying the results, and exporting can be performed; the host computer sets the test parameters, including switching frequency, duty cycle, current, etc., and the host computer starts the test. The system will test two inductors or magnetic cores according to the parameters and measure the loss, temperature rise, and other results. When the host computer stops the test, the system will stop outputting current and save the test results. The host computer views the test results, including current and voltage curves, loss curves, temperature rise curves, etc., and can compare the performance differences of the two inductors or magnetic cores; the host computer exports the test data for further analysis and processing; the control signal processor; the control signal processor The input end is electrically connected to the host computer, and is used to receive the test parameters of the host computer and perform signal conversion to obtain a test pulse signal; the input end of the inductor online simulator is electrically connected to the output end of the control signal processor, and is used to receive the test pulse signal. The inductor online simulator is provided with at least two test ends, and the test end is connected to the magnetic device to be tested, and the test end is used to drive the magnetic device according to the test pulse signal; during the test process, the oscilloscope is electrically connected to the output end of the inductor online simulator, and is used to receive the temperature rise and loss data of the magnetic device under the drive of the test pulse signal, and the received temperature rise and loss data are exported and displayed on the display in the form of a curve; the magnetic device simulation temperature rise test system provided in the present application can test multiple magnetic devices at the same time, and the test environment is consistent, which facilitates the performance comparison of two magnetic devices.

[0028] It should be noted that the above implementation process is only to illustrate the feasibility of this application, but this does not mean that the magnetic device simulation temperature rise test system of this application only has the above-mentioned implementation processes. On the contrary, as long as the magnetic device simulation temperature rise test system of this application can be implemented, it can be included in the feasible implementation plan of this application.

[0029] Throughout this specification, reference to terms such as "one embodiment," "some embodiments," "examples," "specific examples," or "some examples" means that a specific feature, structure, material, or characteristic described in conjunction with that embodiment or example is included in at least one embodiment or example of the present invention. In this specification, schematic representations of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.

[0030] The above embodiments merely illustrate several implementations of the present invention, and while their descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the present invention. It should be noted that a person skilled in the art would be able to make numerous modifications and improvements without departing from the spirit of the present invention, all of which fall within the scope of protection of the present invention. Therefore, the scope of protection of the present invention shall be determined by the appended claims.

Claims

1. A magnetic device simulation temperature rise test system, characterized in that: include: A host computer connected to the display and used to set test parameters; A control signal processor, wherein the input end of the control signal processor is electrically connected to the host computer, and is used to receive the test parameters of the host computer and perform signal conversion to obtain a test pulse signal; an inductor online simulator, wherein an input terminal of the inductor online simulator is electrically connected to an output terminal of the control signal processor and is used to receive the test pulse signal; the inductor online simulator is provided with at least two test terminals, each of which is connected to a magnetic device to be tested and is used to drive the magnetic device according to the test pulse signal; An oscilloscope is electrically connected to the output end of the inductor online simulator, and is used to receive the temperature rise and loss data of the magnetic device when driven by the test pulse signal, and to export the received temperature rise and loss data and display them on a display in the form of a curve.

2. The magnetic device simulation temperature rise test system according to claim 1, characterized in that: The host computer and the control signal processor are electrically connected via an RS485 interface. The test parameters include at least switching frequency, duty cycle, and test current. The control signal processor is used to control the switching frequency and duty cycle of the MOSFET switch according to the test pulse signal.

3. The magnetic device simulation temperature rise test system according to claim 2, characterized in that: The switching frequency ranges from 20 kHz to 200 kHz; the duty cycle ranges from 30% to 85%; and the test current ranges from 0 A to 100 A.

4. The magnetic device simulation temperature rise test system according to claim 1, characterized in that: The magnetic device simulation temperature rise test system also includes an AC / DC converter; The input end of the AC / DC converter is electrically connected to an external power source, and is used to convert the external power source into a DC voltage as needed to power the test system.

5. The magnetic device simulation temperature rise test system according to claim 4, characterized in that: The control signal processor is also electrically connected to the AC / DC converter, and is further configured to regulate the DC voltage of the AC / DC converter.

6. The magnetic device simulation temperature rise test system according to claim 4, characterized in that: The magnetic device simulated temperature rise test system also includes a feedback electronic load; The feedback electronic load is electrically connected to the control signal processor and the inductor online simulator respectively, and the control signal processor is further used to control the working mode of the feedback electronic load; The feedback electronic load is used to simulate the load characteristics of the magnetic device according to the working mode, obtain the voltage signal and current signal corresponding to the magnetic device, and provide current feedback to the control signal processor.

7. The magnetic device simulation temperature rise test system according to claim 6, characterized in that: The working modes include at least a constant voltage working mode, a constant current working mode, and a constant resistance working mode.

8. The magnetic device simulation temperature rise test system according to claim 6, characterized in that: The feedback electronic load is electrically connected to the power input terminal of the AC / DC converter, and the feedback electronic load is also used to provide energy feedback to the AC / DC converter.

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