Crystal oscillator health detection method, device and electronic equipment

Abstract

Embodiments of the present invention disclose a method, device, and electronic device for detecting the health of a crystal oscillator. The method comprises: obtaining characteristic parameters of a crystal oscillator; determining the frequency deviation parameters of the crystal oscillator based on the characteristic parameters; and determining the health of the crystal oscillator based on the frequency deviation parameters of the crystal oscillator and a preset threshold. The solution of the embodiments of the present invention can effectively assess the health of crystal oscillators, offering advantages such as rapid detection and high accuracy. It is particularly suitable for detecting the health of large quantities of crystal oscillators in use in the field, promptly identifying severely aged or abnormally frequency-hopping crystal oscillators, and thereby improving the quality of wireless network service.

Description

Technical Field

[0001] The present invention relates to the field of communication technology, and in particular to a method and device for detecting the health of a crystal oscillator, and electronic equipment. Background Art

[0002] In the real-world networks of major telecom operators, crystal oscillator failures often cause base station outages and cell network disruptions. In severe cases, even nearby base stations cannot function properly. Therefore, to ensure wireless network service quality, it is essential to assess the health of crystal oscillators within the network. However, effective solutions for crystal oscillator health testing are currently lacking. Summary of the Invention

[0003] The following is a summary of the subject matter described in detail herein. This summary is not intended to limit the scope of the claims.

[0004] Embodiments of the present invention provide a crystal oscillator health detection method, device, electronic device, and computer-readable storage medium, which can effectively evaluate the health of a crystal oscillator.

[0005] In a first aspect, an embodiment of the present invention provides a method for detecting the health of a crystal oscillator, the method comprising:

[0006] Obtain characteristic parameters of the crystal oscillator;

[0007] Determining a frequency deviation parameter of a crystal oscillator according to the characteristic parameters;

[0008] The health of the crystal oscillator is determined according to the frequency deviation parameter of the crystal oscillator and a preset threshold.

[0009] In a second aspect, an embodiment of the present invention provides a crystal oscillator health detection device, comprising:

[0010] An acquisition module, used to obtain characteristic parameters of a crystal oscillator;

[0011] A first determining module, configured to determine a frequency deviation parameter of a crystal oscillator according to the characteristic parameter;

[0012] The second determining module is configured to determine the health of the crystal oscillator according to a frequency deviation parameter of the crystal oscillator and a preset threshold.

[0013] In a third aspect, an embodiment of the present invention provides an electronic device comprising: a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, the crystal oscillator health detection method provided in an embodiment of the present invention is implemented.

[0014] In a fourth aspect, an embodiment of the present invention provides a computer-readable storage medium storing a computer program. When the computer program is executed by a processor, the crystal oscillator health detection method provided in an embodiment of the present invention is implemented.

[0015] In an embodiment of the present invention, characteristic parameters of a crystal oscillator are obtained; a frequency deviation parameter of the crystal oscillator is then determined based on the characteristic parameters; and the health of the crystal oscillator is further determined based on the frequency deviation parameter of the crystal oscillator and a preset threshold. This embodiment of the present invention can effectively assess the health of a crystal oscillator, offering advantages such as rapid detection and high accuracy. It is particularly suitable for testing the health of large quantities of crystal oscillators in use in the field, allowing for the timely identification of severely aged or abnormally frequency-hopping crystal oscillators, thereby improving the quality of wireless network service.

[0016] Other features and advantages of the present invention will be described in the following description, and in part will become apparent from the description, or will be understood by practicing the present invention. The purposes and other advantages of the present invention can be realized and obtained through the structures particularly pointed out in the description, claims and drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] The accompanying drawings are used to provide a further understanding of the technical solution of the present invention and constitute a part of the specification. Together with the embodiments of the present invention, they are used to explain the technical solution of the present invention and do not constitute a limitation to the technical solution of the present invention.

[0018] Figure 1 This is a flow chart of a method for detecting the health of a crystal oscillator provided by an embodiment of the present invention;

[0019] Figure 2 yes Figure 1 A schematic diagram of a specific implementation process of step S300;

[0020] Figure 3A is an aging coefficient distribution ratio analysis table involved in an embodiment of the present invention;

[0021] Figure 3B is a schematic diagram of the probability distribution of the aging coefficient involved in the embodiment of the present invention;

[0022] Figure 4 yes Figure 1 Another specific implementation process diagram of step S300;

[0023] Figure 5 yes Figure 1 Another specific implementation process diagram of step S300;

[0024] Figure 6 yes Figure 1Another specific implementation process diagram of step S300;

[0025] Figure 7A This is a temperature coefficient distribution ratio analysis table related to an embodiment of the present invention;

[0026] Figure 7B is a schematic diagram of the probability distribution of temperature coefficients involved in an embodiment of the present invention;

[0027] Figure 8 yes Figure 1 Another specific implementation process diagram of step S300;

[0028] Figure 9 yes Figure 1 Another specific implementation process diagram of step S300;

[0029] Figure 10 This is a schematic structural diagram of a crystal oscillator health detection device provided by an embodiment of the present invention;

[0030] Figure 11 It is a structural diagram of an electronic device provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0031] In order to make the purpose, technical solutions and advantages of the present invention more clearly understood, the present invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention.

[0032] It should be understood that in the description of the embodiments of the present invention, if there is a description of "first", "second", etc., it is only used for the purpose of distinguishing technical features, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features or implicitly indicating the order of the indicated technical features. "At least one" means one or more, and "more" means two or more. "And / or" describes the association relationship of associated objects, indicating that three relationships may exist. For example, A and / or B can indicate the existence of A alone, the existence of A and B at the same time, and the existence of B alone. A and B can be singular or plural. The character " / " generally indicates that the previous and next associated objects are in an "or" relationship. "At least one of the following" and similar expressions refer to any combination of these items, including any combination of single or plural items. For example, at least one of a, b and c can represent: a, b, c, a and b, a and c, b and c or a, b and c, where a, b, c can be single or multiple.

[0033] In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not conflict with each other.

[0034] The crystal oscillator (or crystal oscillator) involved in the embodiments of the present invention may specifically be an oven-controlled crystal oscillator (OCXO), which is widely used in various communication devices as a local clock source. In the actual network environments of major telecommunications operators, crystal oscillator failure often causes base station outages and cell network interruptions. In severe cases, it can even cause nearby base stations to malfunction. OCXO failure has become the most common type of equipment board failure.

[0035] In the prior art, the method for assessing the health of crystal oscillators relies on empirical data from past repairs and reference to process parameters provided by the crystal oscillator manufacturer. This approach has numerous shortcomings: it can only qualitatively analyze batches of crystal oscillators from a limited number of brands in the field through sampling, resulting in limited sample coverage; testing requires manual analysis by experts, resulting in low efficiency; and it cannot predict potential risks in advance. Therefore, there is no effective solution for testing the health of crystal oscillators in the prior art.

[0036] Based on the above, an embodiment of the present invention provides a crystal oscillator health detection method, device, electronic device and computer-readable storage medium, which obtains the characteristic parameters of the crystal oscillator, then determines the frequency deviation parameters of the crystal oscillator based on the characteristic parameters, and further determines the health of the crystal oscillator based on the frequency deviation parameters of the crystal oscillator and a preset threshold value, so as to achieve the purpose of effectively evaluating the health of the crystal oscillator.

[0037] See Figure 1 , Figure 1 FIG. 1 shows a process of a crystal oscillator health detection method provided by an embodiment of the present invention. Figure 1 As shown, the crystal oscillator health detection method according to the embodiment of the present invention includes the following steps:

[0038] S100, obtaining characteristic parameters of a crystal oscillator.

[0039] The characteristic parameters here may include the factory voltage control word, voltage control word and voltage control sensitivity.

[0040] Factory voltage control word, indicating the voltage control word of the crystal oscillator when it leaves the factory;

[0041] Voltage-controlled voltage control word, which indicates the voltage control word when the crystal oscillator is running;

[0042] Voltage control sensitivity indicates the change in aging frequency deviation caused by a unit change in voltage control voltage.

[0043] During the specific implementation process, the data collection cycle can be pre-set, such as 15 minutes, 30 minutes, 60 minutes, etc.; then, according to the preset data collection cycle, complete data of the crystal oscillator during field operation is collected; and then the collected complete data is filtered to eliminate abnormal data, and only retain the factory voltage control word, voltage-controlled voltage control word and voltage-controlled sensitivity data that are useful for crystal oscillator health detection.

[0044] S200 , determining a frequency deviation parameter of a crystal oscillator according to the characteristic parameter.

[0045] After obtaining the characteristic parameters of the crystal oscillator, namely, the factory voltage control word, the voltage-controlled voltage control word, and the voltage-controlled sensitivity, the frequency deviation parameter of the crystal oscillator can be determined using these characteristic parameters.

[0046] For example, the calculation method of the frequency deviation parameter of the crystal oscillator can refer to the following formula (1):

[0047] F=(fDa-cDa)*V0*kf / R0 (1)

[0048] In formula (1), F is the frequency deviation parameter, in ppb; fDa and cDa are the factory voltage control word and the voltage control word, respectively, both in mV; V0 and R0 are proportional coefficients used to map the control words fDa and cDa in the range of 0-R0 (mV) to the actual voltage values ​​in the range of 0-V0 (mV); kf is the voltage control sensitivity, in ppb / mV.

[0049] S300 , determining the health of the crystal oscillator according to a frequency deviation parameter of the crystal oscillator and a preset threshold.

[0050] See Figure 2 , based on the frequency deviation parameters of the crystal oscillator and the preset threshold, the health of the crystal oscillator can be determined by the following steps:

[0051] S311 , obtaining a time parameter and a temperature parameter corresponding to a frequency deviation parameter of a crystal oscillator.

[0052] It will be appreciated that when collecting the characteristic parameters of the crystal oscillator, the time of collection is also recorded to obtain a time parameter; and the temperature information of the crystal oscillator is also collected to obtain a temperature parameter, which may be the ambient temperature of the environment in which the crystal oscillator is located. In this way, the time parameter and temperature parameter corresponding to the characteristic parameters of the crystal oscillator are obtained. After the corresponding frequency deviation parameter is obtained based on the characteristic parameters of the crystal oscillator, the time parameter and temperature parameter corresponding to the frequency deviation parameter can be determined based on the corresponding relationship between the characteristic parameters and the frequency deviation parameter.

[0053] S312 , performing linear fitting on the frequency deviation parameter, time parameter, and temperature parameter of the crystal oscillator according to a preset aging frequency deviation linear regression model to obtain an aging coefficient of the crystal oscillator.

[0054] For example, the functional expression of the aging frequency deviation linear regression model can be referred to the following formula (2);

[0055] F=coa*dayval+cot*T+const (2)

[0056] In formula (2), F is the dependent variable, representing the frequency deviation parameter; dayval and T are independent variables, representing the time parameter and temperature parameter, respectively; coa is the aging coefficient, which can be understood as the frequency deviation change per unit time (e.g., one day); cot is the temperature coefficient, which can be understood as the frequency deviation change per unit temperature (e.g., 1°C); and const is a constant.

[0057] After obtaining the value of the frequency deviation parameter F through formula (1), the value of the frequency deviation parameter F and the time parameter dayval and temperature parameter T corresponding to the frequency deviation parameter can be substituted into formula (2), and then the aging coefficient coa of the crystal oscillator can be obtained through linear fitting. The credibility of the obtained aging coefficient coa can be determined based on the determination coefficient of the goodness of fit (R 2 ) OK, R 2 The closer it is to 1, the higher the credibility of the aging coefficient coa.

[0058] The aging frequency deviation linear regression model provided in an embodiment of the present invention generates a time and temperature dual-parameter linear regression model based on the relationship between the frequency deviation of the crystal oscillator and time and temperature. The dual-parameter linear regression model can well fit the aging frequency deviation curve. The aging coefficient obtained by fitting the aging frequency deviation curve is more accurate and more reliable.

[0059] S313 : When the aging coefficient of the crystal oscillator is greater than a preset aging coefficient threshold, determine that the health of the crystal oscillator is severely aged.

[0060] The aging coefficient threshold value can be set after statistical analysis of the aging coefficient of the crystal oscillator in the external field.

[0061] For example, Figure 3A 、 Figure 3B The following are the aging coefficient distribution ratio analysis table and aging coefficient probability distribution diagram obtained after statistical analysis of the aging coefficient of 3092 constant temperature crystal oscillators in the external field. Figure 3A and Figure 3BThe aging coefficient distribution ratio / probability shown shows that the aging coefficient of the crystal oscillator is mainly concentrated in the range [-0.5, 0.5]. Therefore, the aging coefficient threshold can be set to 0.5. When the aging coefficient coa obtained in step S312 is greater than 0.5, the health of the crystal oscillator can be determined to be severely aged.

[0062] See Figure 4 , based on the frequency deviation parameters of the crystal oscillator and the preset threshold, the health of the crystal oscillator can be determined by the following steps:

[0063] S321 , obtaining a time parameter and a temperature parameter corresponding to a frequency deviation parameter of a crystal oscillator.

[0064] S322 , performing linear fitting on the frequency deviation parameter, time parameter, and temperature parameter of the crystal oscillator according to a preset aging frequency deviation linear regression model to obtain an aging coefficient of the crystal oscillator.

[0065] The specific implementation of steps S321 to S322 can refer to the relevant description of steps S311 to S312 above, which will not be repeated here.

[0066] S323, determining a residual frequency deviation parameter of the crystal oscillator according to the voltage control word, the voltage control sensitivity, and the aging coefficient;

[0067] After the aging coefficient of the crystal oscillator is obtained, the residual frequency deviation parameter of the crystal oscillator can be determined by combining the aging coefficient with the voltage control word and the voltage control sensitivity in the characteristic parameters.

[0068] The calculation method of the residual frequency deviation parameter of the crystal oscillator can be referred to the following formula (3):

[0069] RF=uDa*V0*kf / R0 (3)

[0070] In formula (3), uDa is the remaining adjustable voltage control word, representing the difference between cDa and the voltage control voltage threshold. It should be understood that uDa needs to be determined based on the aging coefficient obtained in the previous step. For crystal oscillators with an aging coefficient greater than 0, the voltage control voltage threshold is the upper limit R0 of the voltage control word; for crystal oscillators with an aging coefficient less than 0, the voltage control voltage threshold is the lower limit 0 of the voltage control voltage.

[0071] In formula (3), RF is the residual frequency deviation parameter, in ppb; kf is the voltage control sensitivity, in ppb / mV; V0 and R0 are proportional coefficients used to map the control words fDa and cDa in the range of 0-R0 (mV) to real voltage values ​​in the range of 0-V0 (mV).

[0072] S324 , determining a remaining life reference value of the crystal oscillator according to the remaining frequency deviation parameter and the aging coefficient of the crystal oscillator.

[0073] After the residual frequency deviation parameter of the crystal oscillator is obtained, the residual frequency deviation parameter and the aging coefficient can be combined to obtain a reference value of the remaining life of the crystal oscillator to predict the remaining service life of the crystal oscillator.

[0074] The calculation method of the remaining life reference value of the crystal oscillator can be referred to the following formula (4).

[0075] rul=(RF*0.95) / coa (4)

[0076] In formula (4), rul represents the remaining lifetime reference value, in days (d); RF is the remaining frequency offset parameter, in ppb; coa is the aging coefficient, in ppb / d.

[0077] S325 : When the remaining life reference value of the crystal oscillator is less than a preset remaining life threshold, determine that the health of the crystal oscillator is severely aged.

[0078] After determining the remaining life reference value of the crystal oscillator, the remaining life reference value is compared with a preset remaining life threshold. When the remaining life reference value is less than the preset remaining life threshold, the health of the crystal oscillator is determined to be severely aged. For example, if the remaining life reference value calculated by formula (4) is 8 days and the preset remaining life threshold is 10 days, the health of the crystal oscillator can be determined to be severely aged by comparing the remaining life reference value with the preset remaining life threshold.

[0079] See Figure 5 , according to the frequency deviation parameter of the crystal oscillator and the preset threshold, the health of the crystal oscillator can be determined by the following steps:

[0080] S331: Acquire multiple frequency deviation parameters of a crystal oscillator within a first preset time period.

[0081] It should be understood that the first preset time period may include multiple data acquisition cycles, with characteristic parameters of the crystal oscillator being acquired once during each data acquisition cycle, and then the frequency deviation parameter of the crystal oscillator being calculated based on the characteristic parameters. That is, each data acquisition cycle corresponds to a corresponding frequency deviation parameter, and therefore, multiple frequency deviation parameters may be obtained within the first preset time period. For example, if the first preset time period is one day and the data acquisition cycle is 15 minutes, then the first preset time period (one day) includes 96 data acquisition cycles, and thus, the first preset time period (one day) may correspond to 96 frequency deviation parameters.

[0082] S332: Determine a maximum frequency deviation parameter and a minimum frequency deviation parameter from a plurality of frequency deviation parameters of the crystal oscillator within a first preset time period.

[0083] After obtaining multiple frequency offset parameters of the crystal oscillator within the first preset time period, the frequency offset parameters are compared to determine a maximum frequency offset parameter and a minimum frequency offset parameter. For example, in step S331, 96 frequency offset parameters are obtained, and the maximum value of the 96 frequency offset parameters is 30 ppb and the minimum value is 15 ppb, i.e., the maximum frequency offset parameter is 30 ppb and the minimum frequency offset parameter is 15 ppb.

[0084] S333: Determine a frequency hopping parameter of the crystal oscillator according to the maximum frequency deviation parameter and the minimum frequency deviation parameter.

[0085] Exemplarily, the difference between the maximum frequency deviation parameter and the minimum frequency deviation parameter is used as the frequency hopping parameter of the crystal oscillator. For example, if the maximum frequency deviation parameter is 30 ppb and the minimum frequency deviation parameter is 15 ppb, and the difference between the maximum frequency deviation parameter and the minimum frequency deviation parameter is 15 ppb, then the frequency hopping parameter of the crystal oscillator is 15 ppb.

[0086] S334: When the frequency hopping parameter of the crystal oscillator is greater than a preset frequency hopping parameter threshold, determine that the health of the crystal oscillator is abnormal frequency hopping.

[0087] After the frequency hopping parameter of the crystal oscillator is determined, it can be determined whether the health of the crystal oscillator is abnormal frequency hopping according to the frequency hopping parameter of the crystal oscillator and a preset frequency hopping parameter threshold.

[0088] For example, the preset frequency hopping parameter threshold is 10ppb. If the frequency hopping parameter of the current crystal oscillator is 15ppb, that is, the frequency hopping parameter of the current crystal oscillator is greater than the preset frequency hopping parameter threshold, it can be determined that the health of the crystal oscillator is frequency hopping abnormality.

[0089] See Figure 6 , based on the frequency deviation parameters of the crystal oscillator and the preset threshold, the health of the crystal oscillator can be determined by the following steps:

[0090] S341: Acquire multiple frequency deviation parameters of a crystal oscillator within a first preset time period.

[0091] S342: Determine a maximum frequency deviation parameter and a minimum frequency deviation parameter from a plurality of frequency deviation parameters of the crystal oscillator within a first preset time period.

[0092] S343: Determine a frequency hopping parameter of the crystal oscillator according to the maximum frequency deviation parameter and the minimum frequency deviation parameter.

[0093] The specific implementation of the above steps S341 to S343 can be found in the relevant description of the previous steps S331 to S333, which will not be repeated here.

[0094] S344: Obtain a temperature parameter corresponding to the frequency deviation parameter of the crystal oscillator within a first preset time period.

[0095] It is understood that, for each data acquisition cycle, when acquiring the characteristic parameters of the crystal oscillator, the temperature information of the crystal oscillator is also acquired to obtain the temperature parameter. The temperature parameter here can be the ambient temperature of the environment in which the crystal oscillator is located. In this way, the temperature parameter corresponding to the characteristic parameter of the crystal oscillator is obtained. After obtaining the corresponding frequency deviation parameter based on the characteristic parameter of the crystal oscillator, the temperature parameter corresponding to the frequency deviation parameter can be determined based on the correspondence between the characteristic parameter and the frequency deviation parameter. In a specific implementation, when acquiring the frequency deviation parameter within the first preset time period, the temperature parameter corresponding to the frequency deviation parameter can be obtained at the same time.

[0096] S345: Determine a first correlation coefficient between the frequency deviation parameter and the temperature parameter of the crystal oscillator in a first preset time period.

[0097] To address the frequency hopping phenomenon caused by drastic temperature changes, the embodiment of the present invention further considers the correlation between the frequency offset parameter and the temperature parameter.

[0098] After the frequency offset parameter within the first preset time period and the temperature parameter corresponding to the frequency offset parameter are acquired, the correlation between the frequency offset parameter and the temperature parameter may be calculated.

[0099] As an example, the first correlation coefficient may be a Kendall correlation coefficient. In specific implementation, the Kendall correlation coefficient of the frequency offset parameter and the temperature parameter within the first preset time period is calculated to determine whether the frequency offset parameter and the temperature parameter are correlated according to the Kendall correlation coefficient.

[0100] It should be understood that the first correlation coefficient may also be a Pearson correlation coefficient or a Spearman correlation coefficient, and the embodiment of the present invention does not specifically limit the type of the first correlation coefficient.

[0101] S346, when the first correlation coefficient is greater than a preset correlation coefficient threshold, determining a first temperature fluctuation value in a first preset time period, adjusting a frequency hopping parameter of the crystal oscillator according to the first temperature fluctuation value, and updating the frequency hopping parameter of the crystal oscillator to the adjusted frequency hopping parameter.

[0102] After determining a first correlation coefficient between a frequency deviation parameter and a temperature parameter of the crystal oscillator in a first preset time period, the first correlation coefficient is compared with a preset correlation coefficient threshold, and a determination is made based on the comparison result as to whether the frequency deviation parameter and the temperature parameter are correlated. For example, if the preset correlation coefficient threshold is 0.3, if the value of the first correlation coefficient is greater than 0.3, it is determined that the frequency deviation parameter and the temperature parameter in the first time period are correlated; otherwise, it is determined that the frequency deviation parameter and the temperature parameter in the first time period are not correlated.

[0103] It is understandable that when it is determined that the frequency deviation parameter in the first time period is related to the temperature parameter, the frequency hopping parameter obtained in step S343 needs to be adjusted to eliminate the impact of temperature fluctuations on the frequency hopping parameter, so that subsequent health detection is more accurate.

[0104] The frequency hopping parameter adjustment process may include: determining a first temperature fluctuation value in a first preset time period, adjusting the frequency hopping parameter of the crystal oscillator according to the first temperature fluctuation value, and updating the frequency hopping parameter of the crystal oscillator to the adjusted frequency hopping parameter.

[0105] For example, F1 represents the frequency hopping parameter obtained in step S343, which can be defined as the initial frequency hopping parameter. When it is determined that the frequency offset parameter in the first time period is related to the temperature parameter, F=F1-F2, and F2=|α*ΔT|.

[0106] Wherein, F represents the adjusted frequency hopping parameter, which can be defined as the final frequency hopping parameter; F2 represents the adjustment change.

[0107] ΔT represents a first temperature fluctuation value in a first preset time period, and ΔT may be determined according to temperature parameters in the first time period.

[0108] α represents the boundary of the main variation range of the temperature coefficient. For example, Figure 7A 、 Figure 7B The following are the temperature coefficient distribution ratio analysis table and temperature coefficient probability distribution diagram obtained after statistical analysis of the temperature coefficients of 3092 constant temperature crystal oscillators in the external field. Figure 7A and Figure 7B From the aging coefficient distribution ratio / probability shown, we can see that the temperature coefficient of the crystal oscillator is mainly concentrated in the range of [-0.5, 0.5]. Therefore, we can determine that 0.5 is the boundary of the main temperature coefficient variation range, that is, we can determine the value of α to be 0.5.

[0109] After obtaining the adjusted frequency hopping parameter F, the frequency hopping parameter is replaced from the initial frequency hopping parameter F1 to the adjusted maximum frequency hopping parameter F. In subsequent steps, the final frequency deviation parameter F is compared with the preset frequency hopping parameter threshold to determine whether the health of the crystal oscillator is abnormal.

[0110] It should be understood that when it is determined that the frequency offset parameter in the first time period is unrelated to the temperature parameter, F=F1-F2, F2=0; that is, the final frequency offset parameter F is equal to the initial frequency offset parameter F1.

[0111] S347: When the frequency hopping parameter of the crystal oscillator is greater than a preset frequency hopping parameter threshold, determine that the health of the crystal oscillator is abnormal frequency hopping.

[0112] It should be understood that after judging the correlation between the frequency deviation parameter and the temperature parameter within the first time period, the adjusted frequency hopping parameter F is compared with the preset frequency hopping parameter threshold. When the frequency hopping parameter of the crystal oscillator is greater than the preset frequency hopping parameter threshold, the health of the crystal oscillator is determined to be frequency hopping abnormality.

[0113] See Figure 8 , based on the frequency deviation parameters of the crystal oscillator and the preset threshold, the health of the crystal oscillator can be determined by the following steps:

[0114] S351, obtaining multiple frequency deviation parameters of the crystal oscillator within a second preset time period;

[0115] It should be understood that the second preset time period should be greater than or equal to the length of a data collection cycle. For example, the length of a data collection cycle is 15 minutes, so the second preset time period can be set to a length of 15 minutes or more.

[0116] S352, determining an absolute value of a frequency deviation change of the crystal oscillator within the second preset time period based on a plurality of frequency deviation parameters of the crystal oscillator within the second preset time period;

[0117] For example, assuming the second preset time period is 15 minutes, since the length of a data collection cycle is 15 minutes, the time interval between the two consecutive data collection cycles is also 15 minutes. Therefore, two frequency deviation parameters can be obtained in the second preset time period. In a specific implementation, the absolute value of the frequency deviation change of the crystal oscillator during the second preset time period can be obtained by calculating the absolute value of the difference between the final frequency deviation parameter and the starting frequency deviation parameter within 15 minutes.

[0118] S353: Determine the number of times the absolute value of the frequency offset change falls within a preset frequency offset change interval within a third preset time period, and obtain number data corresponding to the frequency offset change interval, wherein the third preset time period is longer than the second preset time period.

[0119] It should be understood that the third preset time period should be longer than the second preset time period. For example, if the second preset time period is 15 minutes, the third preset time period is 4 days. Thus, the absolute value of the frequency deviation change of the crystal oscillator is collected every 15 minutes, and then the frequency deviation change intervals within which the respective absolute value of the frequency deviation change falls within the 4-day period are statistically analyzed.

[0120] It should be understood that the number of preset frequency offset variation intervals may be one or more.

[0121] When there are multiple preset frequency offset variation intervals, these multiple frequency offset variation intervals should be continuous within the numerical range, that is, the frequency offset variation interval includes multiple continuous frequency offset variation intervals. In addition, a corresponding number threshold should be set for each frequency offset variation interval to facilitate comparison in subsequent steps.

[0122] For example, the preset frequency offset variation intervals include: [0, 0.5), [0.5, 3.0), and [3.0, 10.0]. After collecting the absolute value of the frequency offset variation of the crystal oscillator every 15 minutes, the frequency offset variation interval in which the absolute value falls is determined. The cumulative number of frequency offset variation intervals corresponding to the absolute value of the frequency offset variation is incremented by 1. For each frequency offset variation interval, the number of times the absolute value of the frequency offset variation falls within the frequency offset variation interval within 4 days is counted.

[0123] S354: Determine the health of the crystal oscillator as abnormal frequency hopping based on the number data corresponding to the frequency deviation variation interval and a preset number threshold.

[0124] It is understandable that after obtaining the frequency data of the frequency deviation variation interval, the frequency data is compared with the corresponding preset frequency threshold, and then the health of the crystal oscillator is determined to be frequency hopping abnormality.

[0125] It should be understood that when there are multiple preset frequency deviation change intervals, the number of times data corresponding to each frequency deviation change interval should be greater than the preset number threshold corresponding to the frequency deviation change interval in order to determine that the health of the crystal oscillator is a frequency jump abnormality.

[0126] For example, the frequency offset variation ranges [0, 0.5), [0.5, 3.0), and [3.0, 10.0) correspond to the number of times thresholds 3, 9, and 2. If the absolute value of the frequency offset variation falls within these frequency offset variation ranges 5, 10, and 3 times within four days, the health of the crystal oscillator is determined to be abnormal with frequency hopping. If the absolute value of the frequency offset variation falls within these frequency offset variation ranges 5, 8, and 3 times within four days, the number of times data corresponding to [0.5, 3.0) is not greater than the corresponding number threshold, indicating that the preset comparison condition is not met, and the health of the crystal oscillator cannot be determined to be abnormal with frequency hopping.

[0127] See Figure 9 , based on the frequency deviation parameters of the crystal oscillator and the preset threshold, the health of the crystal oscillator can be determined by the following steps:

[0128] S361, obtaining multiple frequency deviation parameters of the crystal oscillator within a second preset time period;

[0129] S362, determining an absolute value of a frequency deviation change of the crystal oscillator within the second preset time period based on a plurality of frequency deviation parameters of the crystal oscillator within the second preset time period;

[0130] The specific implementation of the above steps S361 to S362 can be found in the relevant description of the previous steps S351 to S352, which will not be repeated here.

[0131] S363: Acquire a temperature parameter corresponding to the frequency deviation parameter of the crystal oscillator within a third preset time period.

[0132] It should be understood that the length of the third preset time period is greater than the length of the second preset time period. In a specific implementation, for each data acquisition cycle, when obtaining the characteristic parameters of the crystal oscillator, the temperature information of the crystal oscillator can also be collected to obtain the temperature parameter. The temperature parameter here can be the ambient temperature of the environment in which the crystal oscillator is located. In this way, the temperature parameter corresponding to the characteristic parameter of the crystal oscillator is obtained. After obtaining the corresponding frequency deviation parameter based on the characteristic parameter of the crystal oscillator, the temperature parameter corresponding to the frequency deviation parameter can be determined based on the correspondence between the characteristic parameter and the frequency deviation parameter. In a specific implementation, when obtaining the frequency deviation parameter within the third preset time period, the temperature parameter corresponding to the frequency deviation parameter can be obtained at the same time.

[0133] S364: Determine a second correlation coefficient between the frequency offset parameter and the temperature parameter.

[0134] After the frequency offset parameter within the third preset time period and the temperature parameter corresponding to the frequency offset parameter are obtained, the correlation between the frequency offset parameter and the temperature parameter can be calculated.

[0135] As an example, the second correlation coefficient may be a Kendall correlation coefficient. In specific implementation, the Kendall correlation coefficient of the frequency offset parameter and the temperature parameter within the second preset time period is calculated to determine whether the frequency offset parameter and the temperature parameter are correlated according to the Kendall correlation coefficient.

[0136] It should be understood that the second correlation coefficient may also be a Pearson correlation coefficient or a Spearman correlation coefficient, and the embodiment of the present invention does not specifically limit the type of the first correlation coefficient.

[0137] S365, when the second correlation coefficient is greater than the preset correlation coefficient threshold, determine the second temperature fluctuation value of the third preset time period, adjust the absolute value of the frequency deviation change of the crystal oscillator according to the second temperature fluctuation value, and update the absolute value of the frequency deviation change of the crystal oscillator to the adjusted absolute value of the frequency deviation change.

[0138] After determining a second correlation coefficient between the frequency deviation parameter and the temperature parameter of the crystal oscillator in the third preset time period, the second correlation coefficient is compared with a preset correlation coefficient threshold, and a determination is made based on the comparison result as to whether the frequency deviation parameter and the temperature parameter are correlated. For example, if the preset correlation coefficient threshold is 0.3, if the value of the second correlation coefficient is greater than 0.3, it is determined that the frequency deviation parameter in the third time period is correlated with the temperature parameter; otherwise, it is determined that the frequency deviation parameter in the third time period is not correlated with the temperature parameter.

[0139] It is understandable that when it is determined that the frequency deviation parameter in the third time period is related to the temperature parameter, the absolute value of the frequency deviation change obtained in step S362 needs to be adjusted to deduct the impact of temperature fluctuations on the absolute value of the frequency deviation change, so that subsequent health detection is more accurate.

[0140] The frequency hopping parameter adjustment process may include: determining a second temperature fluctuation value in a third preset time period, adjusting the absolute value of the frequency deviation change of the crystal oscillator according to the second temperature fluctuation value, and updating the absolute value of the frequency deviation change of the crystal oscillator to the adjusted absolute value of the frequency deviation change.

[0141] For example, B1 represents the absolute value of the frequency offset change obtained in step S362, which can be defined as the initial absolute value of the frequency offset change. When it is determined that the frequency offset parameter in the third time period is related to the temperature parameter, B=B1-B2, and B2=|α*ΔT|.

[0142] Wherein, B represents the absolute value of the frequency offset change after adjustment, which can be defined as the final absolute value of the frequency offset change; and B2 represents the adjustment change amount.

[0143] ΔT represents a first temperature fluctuation value in the first preset time period, and ΔT may be determined according to a temperature parameter in the third time period.

[0144] α represents the boundary of the temperature coefficient's main variation range. For example, according to statistics, the temperature coefficient of a crystal oscillator is mainly concentrated in the range [-0.5, 0.5]. Therefore, 0.5 can be determined as the boundary of the temperature coefficient's main variation range, and the value of α can be determined to be 0.5.

[0145] After obtaining the adjusted frequency offset change absolute value B, the frequency offset change absolute value B1 is replaced with the adjusted final frequency offset change absolute value B. In the subsequent step S366, the final frequency offset change absolute value B is used to count which preset frequency offset change interval the final frequency offset change absolute value B falls into.

[0146] It should be understood that when it is determined that the frequency offset parameter in the third time period is unrelated to the temperature parameter, B=B1-B2, B2=0; that is, the final frequency offset change absolute value B is equal to the initial frequency offset change absolute value B1.

[0147] S366, determining the number of times the absolute value of the frequency offset change falls within a preset frequency offset change interval within a third preset time period, and obtaining number data corresponding to the frequency offset change interval, wherein the third preset time period is longer than the second preset time period.

[0148] S367: Determine the health of the crystal oscillator as abnormal frequency hopping based on the number data corresponding to the frequency deviation variation interval and a preset number threshold.

[0149] The specific implementation of the above steps S366 to S367 can be found in the relevant description of the previous steps S353 to S354, which will not be repeated here.

[0150] It should be understood that the embodiment of the present invention can output health indication information corresponding to the health of the crystal oscillator after determining that the health of the crystal oscillator is severely aged or has abnormal frequency hopping. For example, the first indication information is output for a severely aged crystal oscillator, and the second indication information is output for a crystal oscillator with abnormal frequency hopping, so as to prompt the staff to replace the severely aged or frequency-hopping abnormal crystal oscillator in a timely manner.

[0151] The crystal oscillator health detection method provided by the embodiment of the present invention is applicable to detecting crystal oscillators of the entire network, can promptly and quickly feedback detection results, avoid the disadvantages of manual detection, and improve the quality of wireless network services.

[0152] See also Figure 10 , Figure 10 It is a structural diagram of the crystal oscillator health detection device provided by an embodiment of the present invention. The entire process of the crystal oscillator health detection method provided by an embodiment of the present invention involves the following modules in the crystal oscillator health detection device: an acquisition module, a first determination module and a second determination module.

[0153] The acquisition module is used to obtain characteristic parameters of the crystal oscillator.

[0154] The first determination module is used to determine the frequency deviation parameter of the crystal oscillator according to the characteristic parameter.

[0155] The second determination module is used to determine the health of the crystal oscillator according to the frequency deviation parameter of the crystal oscillator and a preset threshold.

[0156] It should be noted that the information interaction, execution process, etc. between the modules of the above-mentioned device are based on the same concept as the embodiment of the method of the present invention. Their specific functions and technical effects can be found in the method embodiment part and will not be repeated here.

[0157] Figure 11 An electronic device 500 provided by an embodiment of the present invention is shown. The electronic device 500 includes but is not limited to:

[0158] Memory 501, used for storing programs;

[0159] The processor 502 is configured to execute the program stored in the memory 501 . When the processor 502 executes the program stored in the memory 501 , the processor 502 is configured to execute the above-mentioned crystal oscillator health detection method.

[0160] The processor 502 and the memory 501 may be connected via a bus or other means.

[0161] Memory 501, as a non-transitory computer-readable storage medium, can be used to store non-transitory software programs and non-transitory computer-executable programs, such as the crystal oscillator health detection method described in any embodiment of the present invention. Processor 502 implements the aforementioned crystal oscillator health detection method by executing the non-transitory software program and instructions stored in memory 501.

[0162] The memory 501 may include a program storage area and a data storage area, wherein the program storage area may store an operating system and application programs required for at least one function; the data storage area may store the execution of the above-mentioned crystal oscillator health detection method. In addition, the memory 501 may include a high-speed random access memory, and may also include a non-volatile memory, such as at least one disk storage device, a flash memory device, or other non-volatile solid-state storage device. In some embodiments, the memory 501 may optionally include a memory remotely located relative to the processor 502, and these remote memories may be connected to the processor 502 via a network. Examples of the above-mentioned network include, but are not limited to, the Internet, an intranet, a local area network, a mobile communication network, and combinations thereof.

[0163] The non-transient software program and instructions required to implement the above-mentioned crystal oscillator health detection method are stored in the memory 501. When executed by one or more processors 502, the crystal oscillator health detection method provided by any embodiment of the present invention is executed.

[0164] An embodiment of the present invention further provides a storage medium storing computer-executable instructions, wherein the computer-executable instructions are used to execute the above-mentioned crystal oscillator health detection method.

[0165] In one embodiment, the storage medium stores computer-executable instructions, which are executed by one or more control processors 502, for example, by a processor 502 in the above-mentioned electronic device 500, so that the above-mentioned one or more processors 502 can execute the crystal oscillator health detection method provided by any embodiment of the present invention.

[0166] The embodiments described above are merely illustrative. The units described as separate components may or may not be physically separate, i.e., they may be located in one place or distributed across multiple network units. Some or all of the modules may be selected based on actual needs to achieve the objectives of this embodiment.

[0167] Those skilled in the art will appreciate that all or some of the steps and systems in the method disclosed above can be implemented as software, firmware, hardware, and appropriate combinations thereof. Some physical components or all physical components can be implemented as software executed by a processor, such as a central processing unit, a digital signal processor, or a microprocessor, or implemented as hardware, or implemented as an integrated circuit, such as an application-specific integrated circuit. Such software can be distributed on a computer-readable medium, and the computer-readable medium can include computer storage media (or non-transitory media) and communication media (or temporary media). As known to those skilled in the art, the term computer storage media is included in any method or technology for storing information (such as computer-readable instructions, data structures, program modules, or other data) and is volatile and non-volatile, removable, and non-removable. Computer storage media includes, but is not limited to, RAM, ROM, EEPROM, flash memory, or other memory technology, CD-ROM, digital versatile disks (DVD), or other optical disk storage, magnetic cassettes, magnetic tapes, disk storage, or other magnetic storage devices, or any other medium that can be used to store desired information and can be accessed by a computer. Furthermore, as is well known to those skilled in the art, communication media typically includes computer-readable instructions, data structures, program modules, or other data in a modulated data signal such as a carrier wave or other transport mechanism, and may include any information delivery media.

[0168] The above is a detailed description of the preferred embodiments of the present invention, but the present invention is not limited to the above embodiments. Those skilled in the art can make various equivalent modifications or substitutions without departing from the spirit of the present invention. These equivalent modifications or substitutions are all within the scope defined by the claims of the present invention.

Claims

1. A method for detecting the health of a crystal oscillator, the method comprising: Acquiring characteristic parameters of the crystal oscillator, the characteristic parameters including: voltage control word and voltage control sensitivity; Determining a frequency deviation parameter of a crystal oscillator according to the characteristic parameters; The health of the crystal oscillator is determined based on the frequency deviation parameters of the crystal oscillator and a preset threshold value, including: obtaining time parameters and temperature parameters corresponding to the frequency deviation parameters of the crystal oscillator; linearly fitting the frequency deviation parameters of the crystal oscillator, the time parameters and the temperature parameters according to a preset aging frequency deviation linear regression model to obtain the aging coefficient of the crystal oscillator, and determining the residual frequency deviation parameters of the crystal oscillator based on the voltage-controlled voltage control word, the voltage-controlled sensitivity and the aging coefficient; determining the remaining life reference value of the crystal oscillator based on the residual frequency deviation parameters and the aging coefficient of the crystal oscillator, and when the remaining life reference value of the crystal oscillator is less than a preset remaining life threshold, the health of the crystal oscillator is determined to be severely aged.

2. The method according to claim 1, characterized in that The characteristic parameters also include: factory voltage control word.

3. The method according to claim 1, characterized in that The determining the health of the crystal oscillator according to the frequency deviation parameter of the crystal oscillator and a preset threshold value further includes: When the aging coefficient of the crystal oscillator is greater than a preset aging coefficient threshold, it is determined that the health of the crystal oscillator is severely aged.

4. The method according to claim 1, wherein Determining the health of the crystal oscillator according to the frequency deviation parameter of the crystal oscillator and a preset threshold value includes: Acquiring multiple frequency deviation parameters of the crystal oscillator within a first preset time period; Determining a maximum frequency deviation parameter and a minimum frequency deviation parameter from a plurality of frequency deviation parameters of the crystal oscillator within a first preset time period; Determining a frequency hopping parameter of the crystal oscillator according to the maximum frequency deviation parameter and the minimum frequency deviation parameter; When the frequency hopping parameter of the crystal oscillator is greater than a preset frequency hopping parameter threshold, it is determined that the health of the crystal oscillator is abnormal frequency hopping.

5. The method according to claim 4, characterized in that Before determining that the health of the crystal oscillator is abnormal in frequency hopping when the frequency hopping parameter of the crystal oscillator is greater than a preset frequency hopping parameter threshold, the method further includes: Acquiring a temperature parameter corresponding to a frequency deviation parameter of the crystal oscillator within a first preset time period; Determining a first correlation coefficient between a frequency deviation parameter of the crystal oscillator and the temperature parameter in a first preset time period; When the first correlation coefficient is greater than a preset correlation coefficient threshold, a first temperature fluctuation value of a first preset time period is determined, and the frequency hopping parameter of the crystal oscillator is adjusted according to the first temperature fluctuation value, and the frequency hopping parameter of the crystal oscillator is updated to the adjusted frequency hopping parameter.

6. The method according to claim 1, wherein Determining the health of the crystal oscillator according to the frequency deviation parameter of the crystal oscillator and a preset threshold value includes: Acquiring multiple frequency deviation parameters of the crystal oscillator within a second preset time period; determining an absolute value of a frequency deviation change of the crystal oscillator within the second preset time period according to a plurality of frequency deviation parameters of the crystal oscillator within the second preset time period; determining the number of times the absolute value of the frequency offset change falls within a preset frequency offset change interval within a third preset time period, and obtaining number data corresponding to the frequency offset change interval, wherein the third preset time period is longer than the second preset time period; According to the number data corresponding to the frequency deviation change interval and a preset number threshold, it is determined that the health of the crystal oscillator is a frequency hopping abnormality.

7. The method according to claim 6, characterized in that The frequency offset change interval includes a plurality of continuous frequency offset change intervals, each frequency offset change interval corresponds to a number threshold; The determining, based on the number data corresponding to the frequency deviation change interval and a preset number threshold, that the health of the crystal oscillator is a frequency hopping abnormality includes: When the number data corresponding to each frequency deviation change interval is greater than the preset number threshold corresponding to the frequency deviation change interval, it is determined that the health of the crystal oscillator is a frequency hopping abnormality.

8. The method according to claim 6, characterized in that Before determining the number of times the absolute value of the frequency offset change falls within a preset frequency offset change interval within the third preset time period, the method further includes: Acquiring a temperature parameter corresponding to the frequency deviation parameter of the crystal oscillator within a third preset time period; determining a second correlation coefficient between the frequency offset parameter and the temperature parameter; When the second correlation coefficient is greater than the preset correlation coefficient threshold, the second temperature fluctuation value of the third preset time period is determined, and the absolute value of the frequency deviation change of the crystal oscillator is adjusted according to the second temperature fluctuation value, and the absolute value of the frequency deviation change of the crystal oscillator is updated to the adjusted absolute value of the frequency deviation change.

9. A crystal oscillator health detection device, characterized in that: include: An acquisition module is used to acquire characteristic parameters of the crystal oscillator, wherein the characteristic parameters include: a voltage control word and a voltage control sensitivity; A first determining module, configured to determine a frequency deviation parameter of a crystal oscillator according to the characteristic parameter; The second determination module is used to determine the health of the crystal oscillator based on the frequency deviation parameter of the crystal oscillator and a preset threshold value, including: obtaining the time parameter and temperature parameter corresponding to the frequency deviation parameter of the crystal oscillator; linearly fitting the frequency deviation parameter of the crystal oscillator, the time parameter and the temperature parameter according to a preset aging frequency deviation linear regression model to obtain the aging coefficient of the crystal oscillator, and determining the residual frequency deviation parameter of the crystal oscillator according to the voltage-controlled voltage control word, the voltage-controlled sensitivity and the aging coefficient; determining the remaining life reference value of the crystal oscillator according to the residual frequency deviation parameter and the aging coefficient of the crystal oscillator, and when the remaining life reference value of the crystal oscillator is less than the preset remaining life threshold, determining the health of the crystal oscillator as severely aged.

10. An electronic device, characterized in that: include: A memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the computer program, the method for detecting the health of a crystal oscillator according to any one of claims 1 to 8 is implemented.

11. A computer-readable storage medium, characterized in that A computer program is stored, and when the computer program is executed by a processor, the crystal oscillator health detection method according to any one of claims 1 to 8 is implemented.

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