Method and device for determining equipment failure rate, computer device and storage medium

Abstract

The application discloses a kind of determination method, device, computer equipment and storage medium of equipment failure rate, related to aviation technology field, for determining the failure rate of each equipment in integrated modular avionics system.The main technical scheme of the application is: according to the importance value, complexity value, maintenance value, test value of each device type in integrated modular avionics system, the distribution failure rate of each device type is determined;The device type with the distribution failure rate less than the corresponding estimated failure rate is determined as the target device type;According to the importance value, cost value, time value, quality value of the target device type, the distribution failure rate and the corresponding estimated failure rate, the failure rate of the target device type is redetermined.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of aviation technology, and in particular to a method and device for determining equipment failure rate, a computer device and a storage medium. BACKGROUND

[0002] Integrated Modular Architecture (IMA) is the development trend of the world aviation industry. The use of integration and modularization in the avionics system makes the avionics equipment significantly reduce in size and weight, and run more efficiently. However, the integration and modularization make the function structure of the avionics system more complex, and the complexity and importance of the equipment are continuously improved.

[0003] The failure rate of each equipment in the avionics system not only relates to the dispatch rate of the aircraft, but also affects the safety of the aircraft to some extent. Therefore, in the actual aircraft model design process, the failure rate of each equipment in the system must be allocated and implemented well, otherwise it will seriously affect the dispatch rate and safety of the aircraft, and lead to the decline of the competitiveness of the aircraft. SUMMARY

[0004] The present application provides a method and device for determining equipment failure rate, a computer device and a storage medium, which are used to determine the failure rate of each equipment in the integrated modular avionics system.

[0005] The present application provides a method for determining equipment failure rate, which comprises:

[0006] determining the allocated failure rate of each equipment type according to the importance value, complexity value, maintenance value and test value of each equipment type in the integrated modular avionics system;

[0007] determining the equipment type with the allocated failure rate less than the corresponding estimated failure rate as a target equipment type;

[0008] re-determining the failure rate of the target equipment type according to the importance value, cost value, time value, quality value, allocated failure rate and corresponding estimated failure rate of the target equipment type.

[0009] The present application provides a device for determining equipment failure rate, which comprises:

[0010] a first determining module, configured to determine the allocated failure rate of each equipment type according to the importance value, complexity value, maintenance value and test value of each equipment type in the integrated modular avionics system;

[0011] a second determining module, configured to determine the equipment type with the allocated failure rate less than the corresponding estimated failure rate as a target equipment type;

[0012] The first determination module is further configured to re-determine the failure rate of the target device type according to the importance value, the cost value, the time value, the quality value, the allocated failure rate and the corresponding estimated failure rate of the target device type.

[0013] A computer device includes a memory, a processor, and a computer program stored in the memory and executable on the processor, and the processor implements the above-mentioned device failure rate determination method when executing the computer program.

[0014] A computer readable storage medium stores a computer program, and the computer program is executable by a processor to implement the above-mentioned device failure rate determination method.

[0015] The present application provides a device failure rate determination method, device, computer device and storage medium. The importance value, complexity value, maintenance value and test value of each device type in the integrated modular avionics system are determined to determine the allocated failure rate of each device type. The device type with an allocated failure rate less than the corresponding estimated failure rate is determined as a target device type. The importance value, cost value, time value, quality value, allocated failure rate and corresponding estimated failure rate of the target device type are used to re-determine the failure rate of the target device type. Thus, the failure rate of each device in the integrated modular avionics system can be determined by the present application. BRIEF DESCRIPTION OF DRAWINGS

[0016] In order to more clearly illustrate the technical solutions of the embodiments of the present application, the following will briefly introduce the drawings needed to be used in the description of the embodiments of the present application. Obviously, the drawings in the following description are only some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative labor.

[0017] Figure 1 is the architecture diagram of the device failure rate determination method in an embodiment of the present application;

[0018] Figure 2 is the architecture diagram of the integrated modular avionics system in an embodiment of the present application;

[0019] Figure 3 is the reliability series connection model diagram of the device in an embodiment of the present application;

[0020] Figure 4 is the principle block diagram of the device failure rate determination device in an embodiment of the present application;

[0021] Figure 5is a schematic diagram of a computer device in an embodiment of the present application. DETAILED DESCRIPTION

[0022] The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are some but not all of the embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative work fall within the protection scope of the present application.

[0023] As shown in Figure 1 , the embodiment of the present application provides a method for determining the failure rate of equipment, comprising the following steps:

[0024] S101, according to the importance value, complexity value, maintenance value and test value of each type of equipment in the integrated modular avionics system, the allocation failure rate of each type of equipment is determined.

[0025] Wherein, the equipment of the integrated modular avionics system can include: general processing module, power control module, switching module, remote data concentrator, cabinet, switch, etc., which is not limited in this embodiment.

[0026] It should be noted that, since the integrated modular avionics system is a interconnected system, the relationship between the equipment is complex, and its architecture diagram is shown in Figure 2 . Wherein, the integrated modular avionics system contains: GPM (General process module, general processing module), which mainly completes the data calculation function of the system; PCM (Power control module, power control module), which mainly completes the functions of power conversion and power output control, fan control, etc.; SWM (Switch module, switching module), which mainly completes the system data forwarding transmission function; RDU (Remote data concentrator, remote data concentrator), which mainly completes the system data conversion function; cabinet, which mainly completes the system equipment interconnection and fan function; switch, which mainly completes the switching function of the system.

[0027] Since the integrated modular avionics system is a mixed series-parallel mode, and the GPM used for different resident applications is also different, the analysis is complex and not convenient for engineering practice. Considering that the reliability index of the equipment will be input when the reliability prediction is carried out subsequently, the IMA system is modeled according to the series model, and all the parallel models are simplified according to the series model. The reliability model is shown in Figure 3 .

[0028] The reliability R of the IMA system is sThe product of each device, i.e.:

[0029] R s = R n1 · R n2 · R n3 · R n4 · R n5 · R n6

[0030] Reliability of each device is:

[0031] (k = 1, 2,..., N)

[0032] The failure rate λ is assigned as another basic parameter of the reliability of the device, and its measurement method is generally: the ratio of the total number of product failures to the accumulated working time in the same time under the specified conditions and within the specified time. For example, if a machine produces two failures in 10000 hours (accumulated working time) of continuous operation (1000 days, specified time) from today (specified condition) at 27 degrees, then the failure rate λ = 2 / 10000.

[0033] The mean time between failures MTBF is a basic parameter of the reliability of the device, and is usually for repairable devices. Its measurement method is: the accumulated working time of the product divided by the total number of failures in the same time under the specified conditions and within the specified time. Thus, the relationship between the failure rate λ and the mean time between failures MTBF is:

[0034] Since the devices in the integrated modular avionics system are electronic devices, it is assumed that the failure rate function of the device is an exponential function, and the failure rate R s (t) is:

[0035]

[0036] From R s = R n1 · R n2 · R n3 · R n4 · R n5 · R n6 , we can get

[0037] Therefore, the system failure rate λ s is:

[0038] λ s = λ n1 + λ n2 + λ n3 + λ n4+ λ n5 + λ n6

[0039] Allocation failure rate of each device type For:

[0040] (k = 1, 2,..., N)

[0041] Wherein, N is the number in the corresponding device type, i represents the corresponding device type, the number of device types in the embodiment can be 6, that is, it includes general processing module, power control module, switching module, remote data concentrator, cabinet, switch, 6 kinds of device types.

[0042] In an optional embodiment provided by the application, the allocation failure rate of each device type is determined according to the importance value, complexity value, maintenance value and test value of each device type in the integrated modular avionics system, comprising:

[0043] S1011, for the importance value, complexity value, maintenance value and test value of each device type, determining the first score of the corresponding device type.

[0044] In the embodiment, the importance value, complexity value, maintenance value and test value can be scored according to 1-10 points. Among them, the importance value is used to represent the importance of the device, and for the evaluation of the importance value, the development guarantee level can be scored, and the development guarantee level is from A-E, A-E is allocated in 10-1 level by level, A is 10, B is 8, C is 6, D is 4, E is 2, and the interval of two points in each level is reduced by level, and the importance value of the same level device is measured according to the actual project difficulty; the complexity value is used to represent the complexity of the device, and the complexity value is scored according to the number of devices, and the number of devices is taken as the benchmark for unified measurement, and the more the number of devices, the lower the corresponding score, and the same number of devices with higher development guarantee level scores lower.

[0045] Specifically, the embodiment can first determine the importance value, complexity value, maintenance value and test value of each device type, as shown in Table 1, the importance value, complexity value, maintenance value and test value corresponding score, then add the data of each row to get the first score of the corresponding device type, as shown in Table 1, the first score of GPM is 38, and the first score of SWM is 35.

[0046] Table 1

[0047]

[0048] S1012, the first score of all device types is accumulated to obtain a system first score.

[0049] As shown in Table 1, the system first score is obtained by accumulating the first scores of all device types, which is 38+35+40+17+18+29=177.

[0050] S1013, the first index allocation coefficient of each device type is obtained by calculating the ratio of the first score of each device type to the system first score.

[0051] As shown in Table 1, the first score of each device type is M1-M6, and the system failure rate allocated by the IMA system is λ s or MTBF s , which can be converted to each other. Let:

[0052]

[0053] The first index allocation coefficient is:

[0054] (i=1, 2..., 6)

[0055] S1014, the allocation failure rate of each device type is determined by calculating the product of the first index allocation coefficient of each device type and the system allocation failure rate.

[0056] Specifically, the allocation failure rate of each device type in Table 1 can be represented by the following formula:

[0057] (i=1, 2..., 6)

[0058] Further, after determining the allocation failure rate of each device type by calculating the product of the first index allocation coefficient of each device type and the system allocation failure rate, the allocation failure rate of each device in the corresponding device type can be determined according to the ratio of the allocation failure rate of each device type to the number of devices.

[0059] Specifically, the allocation failure rate of each device can be calculated by the following formula:

[0060] (k=1, 2..., N)

[0061] Where N is the number of devices of the corresponding device type. λ k is the allocation failure rate of the specific device.

[0062] R(t)=e -λt

[0063] Since the multiplication of failure rates equals the addition of exponents, that is, the addition of failure rates, the allocation failure rate of a specific device is the average of the allocation failure rates of the corresponding type of device, because the failure rates of specific devices are the same.

[0064] S102, the device type with an allocation failure rate less than the corresponding estimated failure rate is determined as the target device type.

[0065] For the estimated failure rate of a device, the λ ki预估 (i = 1, 2... 6) is performed, and the estimated failure rate of each device type is:

[0066]

[0067] wherein, is the estimated failure rate of a certain device type, n i is the number of devices in the corresponding device type, λ ki预估 is the estimated failure rate of the device in the corresponding device type;

[0068] Thus, the estimated failure rate λ s预估 of the IMA system is:

[0069]

[0070] Specifically, the allocation failure rate of each device type is compared with the estimated failure rate, if it is excluded from the optimization sequence (without the need to re-determine the failure rate), if reliability optimization is needed, that is, the device type with an allocation failure rate less than the corresponding estimated failure rate is determined as the target device type (the device type that needs to be optimized).

[0071] Suppose there are L (L ≤ 6) types of devices that need to re-determine the failure rate, and the allocation failure rates of the device types that need to re-determine the failure rate are reordered from low to high and recorded as Then, the failure rate of the target device is re-determined according to the arrangement order.

[0072] S103, according to the importance value, cost value, time value, quality value, allocation failure rate and corresponding estimated failure rate of the target device type, the failure rate of the target device type is re-determined.

[0073] The importance value, cost value, time value and quality value of the target device type are scored from 1 to 10, and the device type that does not need to be re-determined failure rate is scored as 0. Specifically, for the importance value evaluation, the development guarantee level is scored, the development guarantee level is from A to E, and each level is reduced by two points, and the same level device is scored according to the actual project difficulty; the cost value is scored according to the estimated cost of reducing the failure rate, and the more the cost, the lower the score; the time value is scored according to the time required to improve reliability, and the longer the time, the lower the score; the quality value is scored according to whether the improvement of reliability will increase the system quality, and the more the quality increases, the lower the score.

[0074] In an optional embodiment provided by the application, the re-determination of the failure rate of the target device type according to the importance value, cost value, time value and quality value of the target device type, the allocated failure rate and the corresponding estimated failure rate comprises:

[0075] S1031, for the importance value, cost value, time value and quality value of each target device type, determine the second score of the corresponding target device type.

[0076] For example, the target device types include GPM, SWM, RDU, cabinet, switch and PCM. The importance value, cost value, time value and quality value of each target device type can be shown in Table 2.

[0077] Table 2

[0078]

[0079] For example, the second score M'1 of the device type GPM is 38.

[0080] S1032, the second scores of all target device types are accumulated to obtain the system second score.

[0081] As shown in Table 2, the second scores of each target device type are M'1-M'6, and the system second score is:

[0082]

[0083] S1033, by calculating the ratio of the second score of each target device type to the system second score, the second index allocation coefficient of each target device type is obtained.

[0084] According to the content in Table 2, the second index allocation coefficient is:

[0085] (i=1, 2..., L)

[0086] S1034, re-determine the failure rate of the target device type according to the second index allocation coefficient, the allocation failure rate and the estimated failure rate of each target device type.

[0087] Specifically, the re-determination of the failure rate of the target device type according to the second index allocation coefficient, the allocation failure rate and the estimated failure rate of each target device type comprises:

[0088] The failure rate of the target device type is re-determined by the following formula:

[0089]

[0090] Wherein, is the failure rate of the target device type, λ s预估 is the estimated failure rate of the target device type, α' i is the second index allocation coefficient of the target device type, Δλ is the difference between the system estimated failure rate and the system allocation failure rate, and L is the number of target device types. Δλ = λ s预估 - λ s .

[0091] Further, after re-determining the failure rate of the target device type according to the second index allocation coefficient, the allocation failure rate and the estimated failure rate of each target device type, the ratio of the allocation failure rate to the number of devices of each target device type can be re-determined, and the allocation failure rate of each device in the corresponding target device type can be determined.

[0092] Specifically, the allocation failure rate of each device in the target device type can be calculated by the following formula:

[0093]

[0094] Wherein, N is the number of devices of the corresponding target device type. λ k优化 is the allocation failure rate of the specific device.

[0095] The method for determining the failure rate of the device provided by the application determines the allocation failure rate of each device type according to the importance value, complexity value, maintenance value and test value of each device type in the integrated modular avionics system, determines the device type with an allocation failure rate less than the corresponding estimated failure rate as a target device type, and re-determines the failure rate of the target device type according to the importance value, cost value, time value and quality value of the target device type, the allocation failure rate and the corresponding estimated failure rate. Thus, the failure rate of each device in the integrated modular avionics system can be determined by the application.

[0096] It should be understood that the size of the serial number of each step in the above embodiment does not mean the order of execution, and the execution order of each process should be determined according to its function and inherent logic, and should not constitute any limitation on the implementation process of the embodiment of the application.

[0097] In an embodiment, a device failure rate determination apparatus is provided, which corresponds to the device failure rate determination method in the above embodiment. As shown in the figure, the device failure rate determination apparatus comprises a first determination module 10 and a second determination module 20. The functions of each module are described in detail as follows: Figure 4 The first determination module 10 is configured to determine the allocation failure rate of each device type according to the importance value, complexity value, maintenance value and test value of each device type in the integrated modular avionics system.

[0098] The second determination module 20 is configured to determine the device type with an allocation failure rate less than the corresponding estimated failure rate as a target device type.

[0099] The first determination module 10 is further configured to re-determine the failure rate of the target device type according to the importance value, cost value, time value and quality value of the target device type, the allocation failure rate and the corresponding estimated failure rate.

[0100] In an optional embodiment provided by the application, the first determination module 10 is specifically configured to:

[0101] determine a first score of the corresponding device type according to the importance value, complexity value, maintenance value and test value of each device type;

[0102] accumulate the first scores of all device types to obtain a system first score;

[0103] obtain a first index allocation coefficient of each device type by calculating the ratio of the first score of each device type to the system first score;

[0104] determine the allocation failure rate of each device type by calculating the product of the first index allocation coefficient of each device type and the system allocation failure rate.

[0105] In an optional embodiment provided by the application, the first determination module 10 determines the allocation failure rate of each device in the corresponding device type according to the ratio of the allocation failure rate of each device type and the number of devices.

[0106] In an optional embodiment provided by the application, the first determination module 10 is specifically configured to:

[0107]

[0108] ​The second score of the corresponding target device type is determined according to the importance value, the cost value, the time value and the quality value of each target device type;

[0109] The second scores of all target device types are accumulated to obtain a system second score;

[0110] The second index distribution coefficient of each target device type is obtained by calculating the ratio of the second score of each target device type to the system second score.

[0111] The failure rate of each target device type is re-determined according to the second index distribution coefficient, the distribution failure rate and the estimated failure rate of each target device type.

[0112] In an optional embodiment provided by the application, the first determining module 10 is specifically configured to:

[0113] The failure rate of each target device type is re-determined according to the following formula:

[0114]

[0115] wherein, is the failure rate of the target device type, λ s预估 is the estimated failure rate of the target device type, α i is the second index distribution coefficient of the target device type, Δλ is the difference between the system estimated failure rate and the system distribution failure rate, and L is the number of target device types.

[0116] In an optional embodiment provided by the application, the first determining module 10 is specifically configured to re-determine the ratio of the distribution failure rate to the number of devices for each target device type, and determine the distribution failure rate of each device in the corresponding target device type.

[0117] In an optional embodiment provided by the application, the device types in the integrated modular avionics system at least include a general processing module, a power supply control module, a switching module, a remote data concentrator, a cabinet and a switch.

[0118] The specific limitations of the device failure rate determination device can refer to the limitations of the device failure rate determination method in the above, which will not be repeated here. Each module in the device failure rate determination device can be realized by software, hardware and their combinations in whole or in part. The above modules can be embedded in or independent of the processor in the computer device in hardware form, or can be stored in the memory in the computer device in software form, so as to call and execute the operations corresponding to the above modules by the processor.

[0119] In one embodiment, a computer device is provided, which may be a server, and its internal structure diagram may be as follows: Figure 5 As shown, the computer device includes a processor, memory, network interface, and database connected via a system bus. The processor provides computing and control capabilities. The memory includes non-volatile storage media and internal memory. The non-volatile storage media stores the operating system, computer programs, and database. The internal memory provides an environment for the operation of the operating system and computer programs stored in the non-volatile storage media. The network interface is used to communicate with external terminals via a network connection. When executed by the processor, the computer program implements a method for determining device failure rate.

[0120] In one embodiment, a computer device is provided, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to perform the following steps:

[0121] Based on the importance value, complexity value, maintenance value, and test value of each equipment type in the integrated modular avionics system, determine the allocated failure rate for each equipment type;

[0122] The equipment types whose allocated failure rate is less than the corresponding estimated failure rate are identified as the target equipment types;

[0123] Based on the importance value, cost value, time value, and quality value of the target equipment type, the allocated failure rate and the corresponding estimated failure rate, the failure rate of the target equipment type is re-determined.

[0124] In one embodiment, a computer-readable storage medium is provided having a computer program stored thereon, the computer program performing the following steps when executed by a processor:

[0125] Based on the importance value, complexity value, maintenance value, and test value of each equipment type in the integrated modular avionics system, determine the allocated failure rate for each equipment type;

[0126] The equipment types whose allocated failure rate is less than the corresponding estimated failure rate are identified as the target equipment types;

[0127] Based on the importance value, cost value, time value, and quality value of the target equipment type, the allocated failure rate and the corresponding estimated failure rate, the failure rate of the target equipment type is re-determined.

[0128] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program. The computer program can be stored in a non-volatile computer readable storage medium, and when executed, can include the processes of the above-mentioned embodiment methods. Any reference to memory, storage, database or other medium used in the embodiments provided by the present application can include non-volatile and / or volatile memory. Non-volatile memory can include read-only memory (ROM), programmable ROM (PROM), electrically programmable ROM (EPROM), electrically erasable programmable ROM (EEPROM) or flash memory. Volatile memory can include random access memory (RAM) or external cache memory. As an illustration but not limitation, RAM is available in various forms, such as static RAM (SRAM), dynamic RAM (DRAM), synchronous DRAM (SDRAM), double data rate SDRAM (DDR SDRAM), enhanced SDRAM (ESDRAM), synchronous link (Synchlink) DRAM (SLDRAM), memory bus (Rambus) direct RAM (RDRAM), direct memory bus dynamic RAM (DRDRAM), and memory bus dynamic RAM (RDRAM), etc.

[0129] Those skilled in the art can clearly understand that, for the convenience and brevity of description, only the division of the above-mentioned functional units and modules is exemplified, and in actual application, the above-mentioned functions can be completed by different functional units and modules according to needs, that is, the internal structure of the device is divided into different functional units or modules to complete all or part of the functions described above.

[0130] The above embodiments are only used to illustrate the technical solutions of the present application, but not limit it. Although the present application has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that they can modify the technical solutions recorded in the foregoing embodiments, or make equivalent replacement for part of the technical features. The modification or replacement does not make the essence of the corresponding technical solution deviate from the spirit and scope of the technical solutions of the embodiments of the present application, and should be included in the protection scope of the present application.

Claims

1. A method of determining a device failure rate, characterized by, The method comprises: determining an allocation failure rate of each device type according to an importance value, a complexity value, a maintenance value and a test value of each device type in the integrated modular avionics system; determining a target device type from among the device types whose allocation failure rate is less than a corresponding estimated failure rate; determining a second score of the corresponding target device type according to the importance value, a cost value, a time value and a quality value of each target device type; accumulating the second scores of all target device types to obtain a system second score; obtaining a second index allocation coefficient of each target device type by calculating a ratio of the second score of each target device type to the system second score; redetermining a failure rate of each target device type according to the second index allocation coefficient, the allocation failure rate and the estimated failure rate of each target device type; the redetermining of the failure rate of each target device type according to the second index allocation coefficient, the allocation failure rate and the estimated failure rate of each target device type comprises: redetermining the failure rate of each target device type by the following formula: wherein, λ is the failure rate of the target device type, s预估 α' is the estimated failure rate of the target device type, i Δλ is the difference between the system estimated failure rate and the system allocated failure rate, and L is the number of target device types.

2. The method of claim 1, wherein, the determining of the allocation failure rate of each device type according to the importance value, the complexity value, the maintenance value and the test value of each device type in the integrated modular avionics system comprises: determining a first score of each device type according to the importance value, the complexity value, the maintenance value and the test value of each device type; accumulating the first scores of all device types to obtain a system first score; obtaining a first index allocation coefficient of each device type by calculating a ratio of the first score of each device type to the system first score; determining the allocation failure rate of each device type by calculating a product of the first index allocation coefficient of each device type and the system allocation failure rate.

3. The method of claim 2, wherein, after the determining of the allocation failure rate of each device type by calculating the product of the first index allocation coefficient of each device type and the system allocation failure rate, the method further comprises: determining an allocation failure rate of each device in the corresponding device type according to a ratio of the allocation failure rate of each device type and a device quantity.

4. The method of claim 1, wherein, after the redetermining of the failure rate of each target device type according to the second index allocation coefficient, the allocation failure rate and the estimated failure rate of each target device type, the method further comprises: determining an allocation failure rate of each device in the corresponding target device type according to a ratio of the redetermined allocation failure rate of each target device type and a device quantity.

5. The method of claim 1, wherein, The device types in the integrated modular avionics system at least comprise a general processing module, a power supply control module, a switching module, a remote data concentrator, a cabinet and a switch.

6. An apparatus for determining a device failure rate, comprising: The device comprises: a first determining module configured to determine an allocation failure rate of each device type according to an importance value, a complexity value, a maintenance value and a test value of each device type in the integrated modular avionics system; a second determining module configured to determine a target device type from among the device types whose allocation failure rate is less than a corresponding estimated failure rate; the first determining module is specifically configured to: determining a second sub-score of each target device type according to the importance value, the cost value, the time value and the quality value of the corresponding target device type; accumulating the second sub-score of all target device types to obtain a system second sub-score; obtaining a second index distribution coefficient of each target device type by calculating the ratio of the second sub-score of each target device type to the system second sub-score; redetermining the failure rate of the target device type by the following formula: wherein, is the failure rate of the target device type, λ s预估 is the estimated failure rate of the target device type, α′ i is the second index allocation coefficient of the target device type, Δλ is the difference between the system estimated failure rate and the system allocation failure rate, and L is the number of target device types.

7. A computer device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, The processor executes the computer program to realize the determination method of the failure rate of the device according to any one of claims 1 to 5.

8. A computer-readable storage medium storing a computer program, the computer-readable storage medium comprising: The computer program is executed by the processor to realize the determination method of the failure rate of the device according to any one of claims 1 to 5.

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