Probe antenna and probe thereof

Abstract

The application relates to a probe antenna and a probe thereof, the probe antenna comprising two radiation units arranged orthogonally to each other, the radiation unit comprising a substrate, two radiation surfaces located on both sides of the substrate, and a feeding wire arranged in the substrate, the radiation surface comprising a first conductive area, a second conductive area, and a non-conductive area located between the first conductive area and the second conductive area, the width of the non-conductive area gradually increases along a first direction, and the feeding wire comprises a coupling feeding wire segment, which is located below the non-conductive area. In the application, the two radiation units are consistent and arranged orthogonally, thereby solving the problem of the asymmetry of the same polarization pattern of the probe antenna, and the poor consistency of the main polarization pattern and the influence of the cross polarization on the main polarization. Further, the feeding wire is arranged in the substrate, so that the electric signal is transmitted in a closed space, the electric signal cannot be leaked, the isolation of the probe antenna is improved, and the performance of the entire probe antenna is improved.

Description

Technical Field

[0001] This application relates to the field of antenna communication technology, and in particular to a probe antenna and its probe. Background Technology

[0002] With the rapid development of aerospace and 5G communication technologies, the performance requirements for radar and communication systems are becoming increasingly stringent. Antennas are a key component of radar, communication, and other radio systems, and their performance directly affects the overall performance of the radio system. Probes are an important component of antenna testing systems, and their performance directly determines the testing accuracy and efficiency of the antenna testing system. However, existing probes suffer from poor antenna performance. Summary of the Invention

[0003] Therefore, it is necessary to provide a high-performance probe antenna and its probe to address the aforementioned technical problems.

[0004] In a first aspect, this application provides a probe antenna, which includes two radiating elements arranged orthogonally to each other. Each radiating element includes a substrate, two radiating surfaces located on both sides of the substrate, and a feed line disposed inside the substrate. The radiating surfaces include a first conductive region, a second conductive region, and a non-conductive region located between the first conductive region and the second conductive region. The width of the non-conductive region gradually increases along a first direction. The feed line includes a coupling feed line segment located below the non-conductive region.

[0005] In one embodiment, both radiating units include machined gaps. The two radiating units include a first radiating unit and a second radiating unit. The machined gap of the first radiating unit is close to a first end of the first radiating unit, and the machined gap of the second radiating unit is close to a second end of the second radiating unit. The first end and the second end are opposite to each other, and the first radiating unit and the second radiating unit are interlocked through their respective machined gaps.

[0006] In one embodiment, the radiating element includes a first via, through which the two radiating surfaces of the radiating element are electrically connected.

[0007] In one embodiment, the probe antenna further includes two connectors, which are respectively connected to the feed lines in the two radiating elements, for inputting signals to the connected feed lines or receiving signals output by the connected feed lines.

[0008] In one embodiment, the radiating element further includes a target circuit, and the feed line further includes a first feed line segment and a second feed line segment;

[0009] One end of the first feeder line segment is connected to the connector, and the other end of the first feeder line segment is electrically connected to one end of the target circuit;

[0010] The other end of the target circuit is electrically connected to one end of the second feeder segment, and the other end of the second feeder segment is connected to one end of the coupling feeder segment.

[0011] In one embodiment, the feeder line further includes a feeder line end structure connected to the other end of the coupled feeder line segment;

[0012] The end structure of the feeder cable is a double arc shape.

[0013] In one embodiment, the radiating element further includes a second via and a third via;

[0014] The other end of the first feeder line segment is electrically connected to one end of the target circuit through the second via.

[0015] The other end of the target circuit is electrically connected to one end of the second feed line segment through the third via.

[0016] In one embodiment, the target circuit includes a resistor, an inductor, and a capacitor;

[0017] The first end of the resistor is electrically connected to the first end of the inductor, and the second end of the resistor is electrically connected to the second end of the inductor and the first end of the capacitor.

[0018] In one embodiment, the coupling feed line segment is curved, and the bending directions of the coupling feed line segments in the two radiating elements are opposite.

[0019] Secondly, this application also provides a probe, which includes a probe antenna as provided in any of the above embodiments.

[0020] The aforementioned probe antenna and its probe include two orthogonally arranged radiating elements. Each radiating element includes a substrate, two radiating surfaces on either side of the substrate, and a feed line disposed within the substrate. The radiating surfaces include a first conductive region, a second conductive region, and a non-conductive region located between the first and second conductive regions. The width of the non-conductive region gradually increases along a first direction. The feed line includes a coupling feed line segment located below the non-conductive region. In this application, because the two radiating elements are identical, the problem of asymmetrical polarization patterns in the probe antenna is solved. Furthermore, the orthogonal arrangement of the two radiating elements resolves the issue of the direction of the main polarization of the two radiating elements. Figure 1This addresses the issue of poor polarization consistency and reduces the impact of cross-polarization on the main polarization. Furthermore, the feed line is located inside the substrate, and the two radiating surfaces on both sides of the substrate include a first conductive region and a second conductive region. This allows the electrical signal to be transmitted in a closed space, preventing signal leakage and improving the isolation of the probe antenna, thereby enhancing the overall performance of the probe antenna. Attached Figure Description

[0021] Figure 1 This is a schematic diagram of the first structure of the probe antenna in one embodiment;

[0022] Figure 2 This is a schematic diagram of the first planar aspect of a radiating element in one embodiment;

[0023] Figure 3 This is a schematic diagram of the second plane of a radiating element in one embodiment;

[0024] Figure 4 This is a schematic diagram of the third plane of a radiating element in one embodiment;

[0025] Figure 5 This is a schematic diagram of the second structure of the probe antenna in one embodiment;

[0026] Figure 6 This is a schematic diagram of the fourth plane of a radiating element in one embodiment;

[0027] Figure 7 This is a block diagram of the target circuit in one embodiment;

[0028] Figure 8 This is a schematic diagram of the fifth plane of a radiating element in one embodiment;

[0029] Figure 9 This is a schematic diagram of the sixth plane of a radiating element in one embodiment;

[0030] Figure 10 This is a schematic diagram illustrating the isolation of the probe antenna in one embodiment;

[0031] Figure 11 This is a schematic diagram of the standing wave ratio (SWR) of the probe antenna in one embodiment;

[0032] Figure 12 This is a schematic diagram of the radiation direction of the probe antenna in one embodiment.

[0033] Explanation of reference numerals in the attached figures:

[0034] 100. Probe antenna; 10. Radiation element;

[0035] 102. Radiation surface; 103. Feeder line; 1021. First conductive region;

[0036] 1022, Second conductive region; 1023, Non-conductive region; 1031, Coupled feeder line segment;

[0037] 104. Machining gap; 105. First radiating unit; 106. Second radiating unit;

[0038] 107. First via; 20. Connector; 108. Target circuit;

[0039] 1032. First feeder line segment; 1033. Second feeder line segment; 1034. Feeder line end structure;

[0040] 109. Second via; 110. Third via; 1081. Resistor;

[0041] 1082. Inductor; 1083. Capacitor. Detailed Implementation

[0042] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0043] In the description of this application, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", "clockwise", "counterclockwise", "axial", "radial", "circumferential", etc., indicating the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings, are only for the convenience of describing this application and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation, and therefore should not be construed as a limitation of this application.

[0044] In this application, the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one of that feature. In the description of this application, "multiple" means at least two, for example, two, three, etc., unless otherwise explicitly specified.

[0045] In this application, unless otherwise expressly specified and limited, the terms "installation," "connection," "joining," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components, unless otherwise expressly limited. Those skilled in the art can understand the specific meaning of the above terms in this application according to the specific circumstances.

[0046] In this application, unless otherwise expressly specified and limited, "above" or "below" the second feature can mean that the first feature is in direct contact with the second feature, or that the first feature is in indirect contact with the second feature through an intermediate medium. Furthermore, "above," "on top of," and "over" the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply that the first feature is at a lower horizontal level than the second feature.

[0047] It should be noted that when an element is referred to as being "fixed to" or "set on" another element, it can be directly on the other element or there may be an intervening element. When an element is considered to be "connected to" another element, it can be directly connected to the other element or there may be an intervening element. The terms "vertical," "horizontal," "upper," "lower," "left," "right," and similar expressions used herein are for illustrative purposes only and do not represent the only possible implementation.

[0048] Figure 1 This is a schematic diagram of the first structure of the probe antenna in one embodiment, as shown below. Figure 1 As shown, the probe antenna 100 includes two radiating elements 10 arranged orthogonally to each other. Each radiating element 10 includes a substrate, two radiating surfaces located on both sides of the substrate, and a feed line 103 disposed inside the substrate. The radiating surfaces include a first conductive region 1021, a second conductive region 1022, and a non-conductive region 1023 located between the first conductive region 1021 and the second conductive region 1022. The width of the non-conductive region 1023 gradually increases along a first direction. The feed line 103 includes a coupling feed line segment located below the non-conductive region 1023.

[0049] In this embodiment, as Figure 1As shown, the probe antenna 100 includes two radiating elements 10 arranged orthogonally to each other. Each radiating element 10 is made by pressing two substrates together into a whole using a common processing method. The two outer sides of the pressed substrate are two radiating surfaces, and the feed line 103 is arranged inside the substrate. A first conductive region 1021 and a second conductive region 1022 are formed on the radiating surface by printing metal lines. The first conductive region 1021 and the second conductive region 1022 are shaped like "rabbit ears". A non-conductive medium is filled between the two radiating surfaces as a support. The conductive regions on the two radiating surfaces of each radiating unit 10 (i.e., the first conductive region 1021 on one radiating surface and the first conductive region 1021 on the other radiating surface, or the second conductive region 1022 on one radiating surface and the second conductive region 1022 on the other radiating surface) and the feed line 103 disposed inside the substrate constitute a stripline transmission network. When the electrical signal is transmitted through the feed line 103 inside the substrate, it can be ensured that the electrical signal is transmitted in a closed space and will not cause leakage of the electrical signal, thereby improving the isolation between the two ports of the dual-polarized probe antenna 100.

[0050] Antenna isolation refers to the ratio of the power of the signal transmitted by one antenna to the power of the signal received by another antenna. The greater the antenna isolation, the less interference can be avoided between antennas.

[0051] In this embodiment, a non-conductive region 1023 is included between the first conductive region 1021 and the second conductive region 1022 on the radiating surface. The width of the non-conductive region 1023 gradually increases along the first direction. Figure 1 As shown in the example, the width of the non-conductive region 1023 gradually increases from bottom to top. The feed line 103 includes a coupling feed line segment located below the non-conductive region 1023. When the wavelength of the electrical signal is comparable to the width of the non-conductive region 1023, it will resonate at the corresponding gap width, exciting an electromagnetic field to form an electromagnetic wave that is radiated outwards. Since the wavelength of the electrical signal will resonate at the corresponding gap width when it is comparable to the width of the non-conductive region 1023, the narrower the width of the non-conductive region 1023, the shorter the corresponding wavelength of the electrical signal, and the higher the frequency of the electromagnetic wave generated by the excited electromagnetic field. At the point where the width is greatest in the first direction, the frequency of the electromagnetic wave generated by the excited electromagnetic field is the lowest. The greater the range of variation in the width of the non-conductive region 1023, the wider the frequency range of the electromagnetic wave generated by the excited electromagnetic field, resulting in a wider coverage band and achieving the purpose of ultra-wideband for the probe antenna 100.

[0052] In this embodiment, the two radiating units 10 are orthogonally arranged, which can improve the consistency of the main polarization pattern of each of the two radiating units 10, reduce the level of cross polarization, and weaken the influence of cross polarization on the main polarization.

[0053] In this embodiment, the two radiating units 10 are identical, that is, the shape of the radiating units 10, the width of the first conductive region 1021, the second conductive region 1022, the width of the non-conductive region 1023 between the first conductive region 1021 and the second conductive region 1022 are the same, and the feed line 103 disposed inside the substrate is also the same, which can change the problem of asymmetry in the same polarization pattern of the probe antenna 100.

[0054] Optionally, the substrate can be a high-frequency dielectric printed circuit board (PCB). The radiating unit 10 is made by processing and pressing two PCBs together, and a feed line 103 is set between the two PCBs.

[0055] In this embodiment, the probe antenna includes two orthogonally arranged radiating elements. Each radiating element includes a substrate, two radiating surfaces on either side of the substrate, and a feed line disposed within the substrate. The radiating surfaces include a first conductive region, a second conductive region, and a non-conductive region located between the first and second conductive regions. The width of the non-conductive region gradually increases along a first direction. The feed line includes a coupling feed line segment located below the non-conductive region. In this application, because the two radiating elements are identical, the problem of asymmetrical polarization patterns in the probe antenna is solved. Furthermore, the orthogonal arrangement of the two radiating elements resolves the issue of the direction of the main polarization of the two radiating elements. Figure 1 This addresses the issue of poor polarization consistency and reduces the impact of cross-polarization on the main polarization. Furthermore, the feed line is located inside the substrate, and the two radiating surfaces on both sides of the substrate include a first conductive region and a second conductive region. This allows the electrical signal to be transmitted in a closed space, preventing signal leakage and improving the isolation of the probe antenna, thereby enhancing the overall performance of the probe antenna.

[0056] Figure 2 This is a schematic diagram of the first planar aspect of a radiating element in one embodiment. Figure 3 This is a second planar schematic diagram of a radiating element in one embodiment. The first planar schematic diagram is an example of a schematic diagram of the radiating surface of a first radiating element, and the second planar schematic diagram is an example of a schematic diagram of the radiating surface of a second radiating element. Figure 2 and Figure 3 As shown, both radiating units include a machining gap 104. The two radiating units include a first radiating unit 105 and a second radiating unit 106. The machining gap 104 of the first radiating unit 105 is close to the first end of the first radiating unit 105, and the machining gap 104 of the second radiating unit 106 is close to the second end of the second radiating unit 106. The first end and the second end are opposite to each other, and the first radiating unit 105 and the second radiating unit 106 are interlocked with each other through their respective machining gaps 104.

[0057] In this embodiment, the two radiating units are orthogonally interlocked, and a slit needs to be made at the junction of the two radiating units. Therefore, both radiating units include a machined slit 104.

[0058] In this embodiment, the two radiating elements include a first radiating element 105 and a second radiating element 106, such as... Figure 2 As shown, the machining gap 104 of the first radiating unit 105 is close to the first end of the first radiating unit 105, extending from the uppermost end of the first radiating unit 105 to the top of the annular shape, and the machining gap 104 is located at the exact center in the second direction. Figure 3 As shown, the machining gap 104 of the second radiation unit 106 is close to the second end of the second radiation unit 106, extending from the bottom end of the second radiation unit to the top of the annular shape. The bottom end of the machining gap 104 of the first radiation unit 105 (the point where the machining gap 104 ends) coincides with the top end of the machining gap 104 of the second radiation unit 106 (the point where the machining gap 104 ends). Similarly, the machining gap 104 of the second radiation unit 106 is also located in the middle of the second direction, ensuring that the two radiation units can be set up completely orthogonally.

[0059] Figure 4 This is a schematic diagram of the third plane of a radiating element in one embodiment, using the radiating surface 102 of the radiating element as an example. Figure 4 As shown, the radiation unit includes a first via 107, and the two radiation surfaces 102 of the radiation unit are electrically connected through the first via 107.

[0060] In this embodiment, the first via 107 is a metal via that connects the two radiating surfaces 102 of the radiating unit. It mainly connects the conductive areas on the two radiating surfaces 102 through the first via 107, and the conductive areas on the radiating surfaces 102 serve as "ground".

[0061] Figure 5 This is a schematic diagram of the second structure of the probe antenna in one embodiment, as shown below. Figure 5 As shown, the probe antenna 100 also includes two connectors 20, which are respectively connected to the feed lines 103 in the two radiating elements, for inputting signals to the connected feed lines 103 or receiving signals output by the connected feed lines 103.

[0062] In this embodiment, as Figure 5As shown, the two connectors 20 of the probe antenna 100 are respectively connected to the feed lines 103 in the two radiating elements. When the connector 20 serves as the input interface of the feed line 103, after the probe antenna 100 is connected to the external device body through the connector 20, the electrical signal from the device body flows through the feed line 103 to the first conductive area and the second conductive area of ​​the radiating surface, and the electrical signal is transmitted to the non-conductive area between the first conductive area and the second conductive area in a coupled manner, exciting an electromagnetic field to form an electromagnetic wave that radiates out along the first direction. When the connector 20 serves as the output interface of the feed line 103, the electromagnetic wave energy is received through the first conductive area and the second conductive area of ​​the radiating surface, and then the electromagnetic wave energy is converted into an electrical signal and transmitted to the device body.

[0063] Figure 6 This is a fourth planar schematic diagram of a radiating element in one embodiment. The fourth planar schematic diagram is based on the schematic diagram of the radiating surface 102 of the first radiating element, as shown below. Figure 6 As shown, the radiating unit also includes a target circuit 108, and the feed line includes a first feed line segment 1032 and a second feed line segment 1033; one end of the first feed line segment 1032 is connected to the connector 20, and the other end of the first feed line segment 1032 is electrically connected to one end of the target circuit 108; the other end of the target circuit 108 is electrically connected to one end of the second feed line segment 1033, and the other end of the second feed line segment is connected to one end of the coupling feed line segment 1031.

[0064] In this embodiment, the radiating unit further includes a target circuit 108, which is disposed in the first conductive region of the radiating surface. A feed line is disposed inside the substrate, including a first feed line segment 1032 and a second feed line segment 1033. A connector 20 is electrically connected to the first feed line segment 1032, transmitting electrical signals from the external device body to the first feed line segment 1032 via the connector 20. The other end of the first feed line segment 1032 is electrically connected to one end of the target circuit 108, transmitting signals through the first feed line segment 1032 to the target circuit 108. The other end of the target circuit 108 is electrically connected to one end of the second feed line segment 1033, and the other end of the second feed line segment 1033 is connected to one end of the coupling feed line segment 1031. Finally, the electrical signals of the target circuit 108 are transmitted to the coupling feed line segment 1031 via the second feed line segment 1033. Optionally, the other end of the first feed line segment 1032 can be electrically connected to one end of the target circuit 108, and the other end of the target circuit 108 can be electrically connected to one end of the second feed line segment 1033. This connection can be made via metal vias, or two conductive components can be provided on the substrate during substrate processing. One end of each conductive component extends into the inside of the substrate, and the first ends of the two conductive components are connected to the first feed line segment 1032 and the second feed line segment 1033, respectively. The other ends of the two conductive components are connected to the two ends of the target circuit 108, respectively.

[0065] In this embodiment, the target circuit 108 is used to reduce the standing wave ratio (SWR) of the probe antenna. The higher the SWR of the probe antenna, the more power will be reflected back, and the less power will be radiated into the air. Therefore, the target circuit 108 is used to change the SWR of the probe antenna.

[0066] Specifically, the radiating unit also includes a second via 109 and a third via 110; the other end of the first feed line segment 1032 is electrically connected to one end of the target circuit 108 through the second via 109; the other end of the target circuit 108 is electrically connected to one end of the second feed line segment 1033 through the third via 110.

[0067] Among them, the second via 109 and the third via 110 are also metal vias.

[0068] In this embodiment, since the target circuit 108 is located in the conductive area of ​​the radiating surface 102, when the other end of the first feed line segment 1032 is electrically connected to one end of the target circuit 108, it is mainly connected through the second via 109. The second via 109 is used to conduct the first feed line segment 1032 to the target circuit 108. When the other end of the target circuit 108 is electrically connected to the second feed line segment 1033, it is connected through the third via 110. The third via 110 is used to conduct the second feed line segment 1033 to the target circuit 108.

[0069] Specifically, such as Figure 7 As shown, the target circuit 108 includes a resistor 1081, an inductor 1082, and a capacitor 1083; the first end of the resistor 1081 is electrically connected to the first end of the inductor 1082, and the second end of the resistor 1081 is electrically connected to the second end of the inductor 1082 and the first end of the capacitor 1083, respectively.

[0070] In this embodiment, as Figure 7 As shown, the target circuit 108 includes a resistor 1081, an inductor 1082 and a capacitor 1083. The resistor 1081 and the inductor 1082 are connected in parallel, and then connected in series with the capacitor 1083.

[0071] Figure 8 This is a schematic diagram of the fifth plane of a radiating element in one embodiment. The schematic diagram of the fifth plane is based on a schematic diagram of the radiating surface 102 of the first radiating element, as shown below. Figure 8 As shown, the feeder line also includes a feeder line end structure 1034, which is connected to the other end of the coupling feeder line segment 1031; the feeder line end structure 1034 has a double arc shape.

[0072] In this embodiment, the feed line end structure 1034 is connected to the other end of the coupling feed line segment 1031. The electrical signal flowing through the coupling feed line segment 1031 is transmitted to the non-conductive region of the radiating surface 102 in a coupled manner. When the signal wavelength is comparable to the width of the non-conductive region of the radiating surface 102, resonance will occur, exciting an electromagnetic field to form an electromagnetic wave that is radiated out. However, since some electrical signals are not completely coupled, they will continue to be transmitted through the coupling feed line segment 1031 to the feed line end structure 1034, and then return to the coupling feed line segment 1031 through the feed line end structure 1034. Then, some electrical signals will be transmitted to the non-conductive region of the radiating surface 102 in a coupled manner, thereby exciting an electromagnetic field to form an electromagnetic wave that is radiated out.

[0073] In this embodiment, the end structure 1034 of the feed line is changed from the traditional fan shape to a double arc shape, which can improve the isolation of the probe antenna. In this application, the isolation can reach more than 50dB.

[0074] Figure 9 This is a schematic diagram of the sixth plane of a radiating element in one embodiment. The schematic diagram of the sixth plane is based on the schematic diagram of the radiating surface 102 of the second radiating element, combined with the above. Figure 8 As shown, the coupling feed line segment 1031 is curved, and the bending directions of the coupling feed line segment 1031 in the two radiating units are opposite.

[0075] In this embodiment, to avoid the intersection of the coupling feed line segments 1031 of the first and second radiating elements, the coupling feed line segments 1031 are configured as curves. The bending directions of the coupling feed line segments 1031 in the two radiating elements are opposite, such as... Figure 8 , Figure 9 As shown, the coupling feed line segment 1031 of the first radiating unit bends downward, and the coupling feed line segment 1031 of the second radiating unit bends upward.

[0076] This application also provides a probe, including the probe antenna provided in any of the above embodiments.

[0077] In this embodiment, the antenna provided in this application is used in a probe to test the performance of the probe antenna. Figure 10 This is a schematic diagram of the isolation of the probe antenna in one embodiment, such as... Figure 10 The figures show the isolation of the probe antenna ports at different frequencies. Figure 11 This is a schematic diagram of the standing wave ratio (VSWR) of the probe antenna in one embodiment, as shown below. Figure 11 As shown, the standing wave ratio (VSWR) varies at different frequencies. Figure 12 This is a schematic diagram of the radiation direction of the probe antenna in one embodiment, such as... Figure 12 As shown, Figure 12The curve at the top center is a schematic diagram of the main polarization direction of the probe antenna. Figure 12 The curve at the bottom center is a schematic diagram of the cross-polarization direction of the probe antenna. From the above... Figure 10 , Figure 11 and Figure 12 It can be seen that the radiation pattern of the probe antenna changes smoothly without abrupt changes; when the radiation pattern meets the requirements, the antenna can cover a frequency range of 0.6GHz-6GHz, and the VSWR of the probe antenna in the frequency range of 0.6GHz-6GHz is <2.6; the isolation between the two input ports of dual polarization is >50dB, and the cross-polarization ratio is >15dB.

[0078] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0079] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are specific and detailed, they should not be construed as limiting the scope of this patent application. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this application should be determined by the appended claims.

Claims

1. A probe antenna, characterized in that, The probe antenna includes two radiating elements arranged orthogonally to each other. Each radiating element includes a substrate, two radiating surfaces located on both sides of the substrate, and a feed line disposed inside the substrate. The radiating surface includes a first conductive region, a second conductive region, and a non-conductive region located between the first conductive region and the second conductive region. The width of the non-conductive region gradually increases along a first direction. The feed line includes a coupling feed line segment located below the non-conductive region. The radiating unit includes a first via, and the two radiating surfaces of the radiating unit are electrically connected through the first via; the feed line also includes a feed line end structure, which is connected to the other end of the coupled feed line segment; the feed line end structure is a double arc shape. The coupling feed line segment is curved, and the bending directions of the coupling feed line segments in the two radiating units are opposite.

2. The probe antenna according to claim 1, characterized in that, Both radiation units include machined gaps. The two radiation units include a first radiation unit and a second radiation unit. The machined gap of the first radiation unit is close to the first end of the first radiation unit, and the machined gap of the second radiation unit is close to the second end of the second radiation unit. The first end and the second end are opposite to each other, and the first radiation unit and the second radiation unit are interlocked with each other through their respective machined gaps.

3. The probe antenna according to claim 1, characterized in that, The probe antenna also includes two connectors, which are respectively connected to the feed lines in the two radiating elements, for inputting signals to the connected feed lines or receiving signals output by the connected feed lines.

4. The probe antenna according to claim 3, characterized in that, The radiating unit also includes a target circuit, and the feed line also includes a first feed line segment and a second feed line segment; One end of the first feeder line segment is connected to the connector, and the other end of the first feeder line segment is electrically connected to one end of the target circuit; The other end of the target circuit is electrically connected to one end of the second feeder segment, and the other end of the second feeder segment is connected to one end of the coupling feeder segment.

5. The probe antenna according to claim 4, characterized in that, The radiating element further includes a second via and a third via; The other end of the first feeder line segment is electrically connected to one end of the target circuit through the second via. The other end of the target circuit is electrically connected to one end of the second feed line segment through the third via.

6. The probe antenna according to claim 4, characterized in that, The target circuit includes resistors, inductors, and capacitors; The first end of the resistor is electrically connected to the first end of the inductor, and the second end of the resistor is electrically connected to the second end of the inductor and the first end of the capacitor.

7. A probe, characterized in that, The probe includes the probe antenna as described in any one of claims 1 to 6.

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