Test circuit, test system, test method, storage medium and computer device

Abstract

The application provides a test circuit, a test system, a test method, a storage medium and a computer device. The test circuit comprises a direct-current voltage source module, a direct-current current source module, a first current circuit and a second current circuit. The direct-current voltage source module is connected in series with the second current circuit, and the second current circuit is used for connecting a test valve in series. The direct-current current source module is connected in parallel with the first current circuit and the second current circuit respectively. Through the test circuit composed of multiple sources, by adjusting the injection time of voltage and current, the direct-current current and positive and negative direct-current voltage stress are alternately applied to the test valve, so that the ability of the test valve to be turned on and turned off multiple times in a period and to be reliably turned on under negative voltage is verified.

Description

Technical Field

[0001] This invention relates to the field of DC power transmission technology, specifically to a test circuit, test system, test method, storage medium, and computer equipment. Background Technology

[0002] Line-commutated converters (LCCs) based on semi-controlled thyristor devices and voltage source converters (VSCs) based on fully controlled IGBT devices are widely used in high-voltage direct current (HVDC) transmission. The former offers high output power density and easy voltage level increases, but suffers from commutation failure. The latter offers flexible control but is bulky, heavy, has low power density, large submodule capacitors, significant difficulty in voltage level increases, and high equipment cost. With the development of semiconductor devices, current source converters (CSCs) based on fully controlled IGBT devices offer a new solution for HVDC transmission. They can utilize series technology, actively control switching on and off, effectively suppress fault currents, are low-cost, compact, and eliminate commutation failure issues, making them suitable for applications such as offshore wind power platforms and showing broad application prospects in HVDC transmission.

[0003] Because CSCs need to operate under high voltage and high power conditions, to ensure their high reliability in actual use, the converter must be tested before practical application to verify its ability to withstand electrical stresses under various operating conditions. CSCs have the characteristic of being able to conduct effectively even under negative voltage, unlike LCCs and VSCs which only conduct under positive voltage. This means that existing test methods and circuits cannot meet their testing requirements. Therefore, a new test circuit for CSCs is urgently needed to assess their ability to withstand various conditions during operation and to ensure they meet key performance requirements. Summary of the Invention

[0004] Therefore, the technical problem to be solved by the present invention is to overcome the shortcomings of the existing test methods and test circuits in the prior art that cannot meet the CSC test requirements, thereby providing a test circuit, test system, test method, storage medium and computer equipment.

[0005] To achieve the above objectives, the present invention provides the following technical solution:

[0006] In a first aspect, embodiments of the present invention provide a test circuit for testing a test valve. The test circuit includes: a DC voltage source module, a DC current source module, a first current circuit, and a second current circuit, wherein...

[0007] The DC voltage source module is connected in series with the second current circuit, and the second current circuit is used to connect the sample valve in series.

[0008] The DC current source module is connected in parallel with the first current circuit and the second current circuit, respectively. The first current circuit and the second current circuit are used to provide a current path for the DC current source module.

[0009] The DC voltage source module is used to alternately output positive test voltage and negative test voltage according to preset logic, and to alternately apply the positive test voltage and the negative test voltage to the test sample valve;

[0010] The DC current source module is used to output a test current to turn on the test valve when the positive test voltage or the negative test voltage is applied to the test valve.

[0011] Optionally, the DC voltage source module includes: a DC voltage source and a full-bridge submodule connected in parallel with the DC voltage source;

[0012] The DC voltage source is used to charge the capacitor of the full-bridge submodule, so that the full-bridge submodule outputs a test voltage. At the same time, the conduction sequence of the power electronic switches in the full-bridge submodule is controlled according to the preset logic to generate the positive test voltage and the negative test voltage, and the positive test voltage and the negative test voltage are alternately applied to the test valve.

[0013] Optionally, the full-bridge submodule includes: a first power electronic switch, a second power electronic switch, a third power electronic switch, a fourth power electronic switch, and a capacitor, wherein,

[0014] The first terminal of the first power electronic switch is connected to the first terminal of the third power electronic switch, the first terminal of the capacitor, and the positive terminal of the DC voltage source. The second terminal of the first power electronic switch is connected to the first terminal of the second power electronic switch and then an external wire is led out to connect to the first terminal of the test valve. The control terminal of the first power electronic switch is used to receive an external control signal.

[0015] The second terminal of the second power electronic switch is connected to the second terminal of the fourth power electronic switch, the second terminal of the capacitor, and the negative terminal of the DC voltage source, respectively. The control terminal of the second power electronic switch is used to receive external control signals.

[0016] The second terminal of the third power electronic switch is connected to the first terminal of the fourth power electronic switch, and an external wire is led out to connect to the second terminal of the test valve. The control terminals of the third power electronic switch and the fourth power electronic switch are both used to receive external control signals.

[0017] When the second power electronic switch and the third power electronic switch are turned on according to the control signal, and the first power electronic switch and the fourth power electronic switch are turned off, the DC voltage source module outputs the positive test voltage;

[0018] When the first power electronic switch and the fourth power electronic switch are turned on according to the control signal, and the second power electronic switch and the third power electronic switch are turned off, the DC voltage source module outputs the negative test voltage.

[0019] Optionally, the test circuit further includes: a bidirectional control valve, one end of which is connected to one end of the DC voltage source module, and the other end of which is connected to one end of the test sample valve in the second current circuit;

[0020] The bidirectional control valve is used to disconnect or connect the DC voltage source module and the second current circuit.

[0021] Optionally, the bidirectional control valve includes: a first controllable switch and a second controllable switch, wherein the first controllable switch and the second controllable switch are connected in parallel in reverse.

[0022] The DC voltage source module is used to apply the negative test voltage to the test sample valve when the first controllable switch is turned on;

[0023] The DC voltage source module is used to apply the positive test voltage to the test valve when the second controllable switch is turned on.

[0024] Optionally, the first current circuit includes a third controllable switch, and the second current circuit includes a fourth controllable switch.

[0025] The fourth controllable switch is connected in series with the sample valve;

[0026] The first end of the third controllable switch is connected to the first end of the fourth controllable switch, and the second end of the third controllable switch is connected to the sample valve;

[0027] After the DC voltage source outputs a positive test voltage, the second controllable switch is triggered to conduct, applying a positive test voltage to the test valve; the test valve and the fourth controllable switch are triggered to conduct, the third controllable switch is locked, and a test current is applied to the test valve; the third controllable switch is triggered to conduct, locking the test valve and the fourth controllable switch, while simultaneously triggering the first controllable switch to apply a negative test voltage to the test valve; the test valve and the fourth controllable switch are triggered to conduct, the third controllable switch is locked, and a test current is applied to the test valve to perform a controllable on / off test on the test valve.

[0028] Secondly, embodiments of the present invention provide a testing system, including the testing circuit, measurement and control unit, and heat dissipation unit described in the first aspect of the present invention, wherein...

[0029] The measurement and control unit is connected to the DC voltage source module, the DC current source module, the first current circuit, and the second current circuit respectively, and is used to provide control signals to the DC voltage source module, the DC current source module, the first current circuit, and the second current circuit, so that the DC voltage source module outputs a positive test voltage and a negative test voltage, and alternately applies the positive test voltage and the negative test voltage to the test valve, and controls the DC current source module to output a test current when the positive test voltage or the negative test voltage is applied to the test valve, so that the test valve is turned on;

[0030] The heat dissipation unit is used to dissipate heat from the test circuit through a water circulation system.

[0031] Thirdly, embodiments of the present invention provide a testing method based on the testing circuit described in the first aspect of the present invention, the testing method comprising:

[0032] The DC voltage source module outputs positive and negative test voltages according to preset logic control.

[0033] The DC current source module outputs the test current according to the preset logic control;

[0034] The positive test voltage and the negative test voltage are alternately applied to the test valve, and the test valve is opened when the positive test voltage or the negative test voltage is applied to the test valve.

[0035] Fourthly, embodiments of the present invention provide a computer-readable storage medium storing computer instructions for causing the computer to perform the experimental method described in the third aspect of the present invention.

[0036] Fifthly, embodiments of the present invention provide a computer device, including: a memory and a processor, wherein the memory and the processor are communicatively connected to each other, the memory stores computer instructions, and the processor executes the computer instructions to perform the experimental method described in the third aspect of the present invention.

[0037] The technical solution of this invention has the following advantages:

[0038] This invention provides a test circuit comprising: a DC voltage source module, a DC current source module, a first current circuit, and a second current circuit. The DC voltage source module and the second current circuit are connected in series, with the second current circuit used to connect a test valve in series. The DC current source module is connected in parallel with both the first and second current circuits, which provide current paths for the DC current source module. The DC voltage source module is used to alternately output a positive test voltage and a negative test voltage according to preset logic, and to alternately apply these voltages to the test valve. The DC current source module is used to output a test current to turn on the test valve when either a positive or negative test voltage is applied. Through this multi-source composite test circuit, when either a positive or negative test voltage is applied to the test valve, the test valve is turned on by injecting a test current, thereby verifying that the test valve has the ability to repeatedly turn on and off within a cycle and to reliably turn on under a negative voltage.

[0039] This invention provides a testing system comprising: a testing circuit, a measurement and control unit, and a heat dissipation unit. The measurement and control unit is connected to the testing circuit and provides control signals to drive controllable devices within the testing circuit. The heat dissipation unit is connected to the testing circuit and provides heat dissipation to the testing circuit through a water circulation system. The measurement and control unit provides control signals to the testing circuit, enabling it to perform controllable on / off tests. Simultaneously, the heat dissipation unit cools the testing circuit, preventing excessively high operating temperatures that could compromise test safety.

[0040] This invention provides a testing method comprising: controlling a DC voltage source module to output a positive test voltage and a negative test voltage according to preset logic; controlling a DC current source module to output a test current according to preset logic; alternately applying the positive test voltage and the negative test voltage to a test valve, and turning on the test valve when either the positive or negative test voltage is applied. By designing a suitable control timing sequence to perform testing on the test sample, and alternately applying DC current and positive and negative DC voltage stress to the test valve, the method verifies that the test valve has the ability to repeatedly turn on and off within a cycle and to reliably turn on under a negative voltage. Attached Figure Description

[0041] To more clearly illustrate the specific embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the specific embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present invention. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0042] Figure 1This is a schematic block diagram of a specific example of the test circuit in an embodiment of the present invention;

[0043] Figure 2 This is a topology diagram of a specific example of the test circuit in an embodiment of the present invention;

[0044] Figure 3 This is a topology diagram of another specific example of the test circuit in an embodiment of the present invention;

[0045] Figure 4 A flowchart illustrating a specific example of the experimental method in this embodiment of the invention;

[0046] Figure 5 The test voltage and current waveforms are shown in the embodiments of the present invention;

[0047] Figure 6 This is a composition diagram of a specific example of a computer device provided in an embodiment of the present invention. Detailed Implementation

[0048] The technical solution of the present invention will now be clearly and completely described with reference to the accompanying drawings. Obviously, the described embodiments are only some, not all, of the embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0049] In the description of this invention, it should be noted that the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are used only for the convenience of describing the invention and for simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on the invention. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and should not be construed as indicating or implying relative importance.

[0050] In the description of this invention, it should be noted that, unless otherwise explicitly specified and limited, the terms "installation," "connection," and "linking" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can also refer to the internal connection of two components; and they can refer to a wireless connection or a wired connection. Those skilled in the art can understand the specific meaning of the above terms in this invention based on the specific circumstances.

[0051] Furthermore, the technical features involved in the different embodiments of the present invention described below can be combined with each other as long as they do not conflict with each other.

[0052] CSC (Continuous Switching Controller) consists of a large number of fully controlled power semiconductor devices connected in series. Its operating characteristics require multiple active turn-on and turn-off currents within the same cycle, and it must also maintain conduction capability under reverse voltage. Traditional test circuits cannot comprehensively evaluate CSC performance. To address this issue, this invention proposes a test circuit that can provide multiple voltage and current stresses within the same cycle, with the voltage stresses being both positive and negative, for comprehensively evaluating the performance indicators of the CSC.

[0053] This invention provides a test circuit for testing a sample valve. Figure 1 As shown, the test circuit includes: a DC voltage source module 1, a DC current source module 2, a first current circuit 3, and a second current circuit 4. The DC voltage source module 1 and the second current circuit 4 are connected in series, and the second current circuit 4 is used to connect the test valve T in series. The DC current source module 2 is connected in parallel with both the first current circuit 3 and the second current circuit 4. The test valve T is... Figure 1 This is not reflected in the text.

[0054] In one specific embodiment, the first current circuit 3 and the second current circuit 4 are used to provide a current path for the DC current source module 2. The DC voltage source module 1 is used to alternately output a positive test voltage and a negative test voltage according to preset logic, and to alternately apply the positive test voltage and the negative test voltage to the test valve T. The DC current source module 2 is used to output a test current to turn on the test valve when the positive test voltage or the negative test voltage is applied to the test valve, so as to perform a controllable on-off test on the test valve.

[0055] In this embodiment of the invention, the DC voltage source module 1 outputs a positive test voltage and a negative test voltage according to preset logic, and alternately applies the positive test voltage and the negative test voltage to the test valve T at preset times. Further, the DC current source module 2 outputs a test current according to preset logic, and controls the on / off times of the first current circuit 3 and the second current circuit 4 according to preset logic. When the positive test voltage or the negative test voltage is applied to the test valve, the test valve is turned on to perform a controllable on / off test on the test valve. Through the multi-source composite test circuit, when the positive test voltage or the negative test voltage is applied to the test valve T, the test valve T is turned on by injecting a test current to verify that the test valve T has the ability to perform multiple on / off cycles within a period and to reliably turn on under a negative voltage. At the same time, this test circuit does not require a large power output and is easy to implement.

[0056] Furthermore, during the period when the sample valve T is turned off in the second current circuit 4, the first current circuit 3 must be turned on. Similarly, during the period when the first current circuit 3 is turned off, the second current circuit 4 must be turned on, so that the DC current source is connected.

[0057] In one embodiment, such as Figure 1 As shown, the test circuit also includes: a bidirectional control valve 5, one end of which is connected to one end of the DC voltage source module 1, and the other end of which is connected to one end of the test sample valve T in the second current circuit 4. The test sample valve T is... Figure 1 This is not reflected in the text.

[0058] In one specific embodiment, the bidirectional control valve 5 is used to disconnect or connect the DC voltage source module 1 and the second current circuit 4. By controlling the bidirectional control valve, a positive or negative test voltage is applied to the test sample valve at a preset time. Further, as... Figure 2 As shown, the bidirectional control valve 5 includes a first controllable switch T1 and a second controllable switch T2, which are connected in parallel in reverse. Specifically, the DC voltage source module 1 is used to apply a negative test voltage to the test valve T when the first controllable switch T1 is turned on. The DC voltage source module 1 is used to apply a positive test voltage to the test valve T when the second controllable switch T2 is turned on. By setting the bidirectional control valve 5, the positive or negative test voltage can be applied to the test valve T at a specific time, thereby improving the accuracy of the voltage test.

[0059] In this embodiment of the invention, the first controllable switch T1 and the second controllable switch T2 are thyristor valves, which is only an example and not a limitation.

[0060] In one embodiment, such as Figure 2 As shown, the DC voltage source module 1 includes: a DC voltage source DC and a full-bridge submodule connected in parallel with the DC voltage source DC.

[0061] In one specific embodiment, a DC voltage source (DC) charges capacitor C0 on the full-bridge submodule, outputting a test voltage. By controlling the conduction timing of the power electronic switches in the full-bridge submodule, the output times of the positive and negative test voltages are controlled. Simultaneously, the opening direction of the bidirectional control valve 5 is controlled, alternately applying the positive and negative test voltages to the test valve T.

[0062] In one embodiment, such as Figure 2 As shown, the full-bridge submodule includes: a first power electronic switch G1, a second power electronic switch G2, a third power electronic switch G3, a fourth power electronic switch G4, and a capacitor C0.

[0063] Specifically, the first terminal of the first power electronic switch G1 is connected to the first terminal of the third power electronic switch G3, the first terminal of the capacitor C0, and the positive terminal of the DC voltage source DC. The second terminal of the first power electronic switch G1 is connected to the first terminal of the second power electronic switch G2, and an external wire is led out to connect to the first terminal of the test valve. The control terminal of the first power electronic switch G1 is used to receive external control signals. The second terminal of the second power electronic switch G2 is connected to the second terminal of the fourth power electronic switch G4, the second terminal of the capacitor C0, and the negative terminal of the DC voltage source DC. The control terminal of the second power electronic switch G2 is used to receive external control signals. The second terminal of the third power electronic switch G3 is connected to the first terminal of the fourth power electronic switch G4, and an external wire is led out to connect to the second terminal of the test valve. The control terminals of both the third power electronic switch G3 and the fourth power electronic switch G4 are used to receive external control signals.

[0064] In one specific embodiment, a DC voltage source (DC) charges capacitor C0 on the full-bridge submodule, outputting a test voltage. The test voltage is applied to the test valve T by controlling the conduction timing of the power electronic switches in the full-bridge submodule and the opening direction of the bidirectional control valve 5. Specifically, when the second power electronic switch G2 and the third power electronic switch G3 are turned on according to the control signal, and the first power electronic switch G1 and the fourth power electronic switch G4 are turned off, the DC voltage source module outputs a positive test voltage, turning on the second controllable switch T2 and applying the positive test voltage to the test valve T. When the first power electronic switch G1 and the fourth power electronic switch G4 are turned on according to the control signal, and the second power electronic switch G2 and the third power electronic switch G3 are turned off, the DC voltage source module outputs a negative test voltage, turning on the first controllable switch T1 and applying the negative test voltage to the test valve T.

[0065] This allows the direction of the voltage applied to the test valve T to be changed. By controlling the on and off states of the IGBT devices in the full-bridge submodule and the on / off times of the bidirectional control valves T1 and T2, the timing and direction of the withstand voltage of the test valve T can be rapidly adjusted.

[0066] In this embodiment of the invention, the first power electronic switch G1, the second power electronic switch G2, the third power electronic switch G3, and the fourth power electronic switch G4 all include an IGBT device and a diode connected in reverse parallel with the IGBT device.

[0067] In one embodiment, such as Figure 3 As shown, multiple DC voltage source modules 1 can also be set up, and the multiple DC voltage source modules 1 are connected in series. By setting up multiple DC voltage source modules 1, the output voltage range of the DC voltage source modules 1 can be expanded. Specifically, the number of DC voltage source modules 1 connected in series is determined according to the required voltage value.

[0068] In one embodiment, such as Figure 2 As shown and Figure 3 As shown, the first current circuit 3 includes a third controllable switch C2, and the second current circuit 4 includes a fourth controllable switch C1.

[0069] In one specific embodiment, the fourth controllable switch C1 is connected in series with the test valve T; the first terminal of the third controllable switch C2 is connected to the first terminal of the fourth controllable switch C1, and the second terminal of the third controllable switch C2 is connected to the test valve. After the DC voltage source outputs a positive test voltage, the second controllable switch T2 is triggered to conduct, applying a positive test voltage to the test valve T; the test valve T and the fourth controllable switch C1 are triggered to conduct, locking the third controllable switch C2, and applying a test current to the test valve T; the third controllable switch C2 is triggered to conduct, locking the test valve T and the fourth controllable switch C1, and simultaneously the first controllable switch T1 is triggered, applying a negative test voltage to the test valve T; the test valve T and the fourth controllable switch C1 are triggered to conduct, locking the third controllable switch C2, and applying a test current to the test valve T, thereby performing a controllable on / off test on the test valve T. The third controllable switch C2 and the fourth controllable switch C1 are IGCT valves, used only as an example and not as a limitation.

[0070] In this embodiment of the invention, IGCT valve C2 must be on during the period when test valve T is off. Similarly, during the period when IGCT valve C2 is off, test valve T and IGCT valve C1 must be on, so that the DC current source forms a path. By coordinating the on and off times of IGCT valves C1 and C2 and test valve T, the current injection time and current flow time can be adjusted, flexibly regulating the time that test valve T can withstand voltage and current stress.

[0071] This invention also provides a testing system, such as... Figure 2 As shown and Figure 3 As shown, the test system includes, Figure 2 As shown or Figure 3 The diagram shows the test circuit, control unit, and heat dissipation unit. The control unit is connected to DC voltage source module 1, DC current source module 2, first current circuit 3, and second current circuit 4, respectively. It provides control signals to these modules to enable DC voltage source module 1 to output positive and negative test voltages, which are then alternately applied to the test valve T. The control unit also controls DC current source module 2 to output test current when either a positive or negative test voltage is applied to the test valve T, thus activating the valve. The heat dissipation unit provides cooling to the test circuit via a water circulation system.

[0072] In one specific embodiment, the measurement and control system provides control, protection, and measurement functions for the entire test circuit. Specifically, the measurement and control system is connected to the control terminals of each controllable device in the test circuit, provides drive signals to each controllable device, and collects data information from the test valve T, evaluating various performance aspects of the test valve T based on this data information. Furthermore, the heat dissipation unit provides a water circulation system for the test valve T, IGCT valves C1 and C2, and the DC current source, thereby performing heat dissipation.

[0073] This invention provides a testing system comprising: a testing circuit, a measurement and control unit, and a heat dissipation unit. The measurement and control unit is connected to the testing circuit and provides control signals to drive controllable devices within the testing circuit. The heat dissipation unit is connected to the testing circuit and provides heat dissipation to the testing circuit through a water circulation system. The measurement and control unit provides control signals to the testing circuit, enabling it to perform controllable on / off tests. Simultaneously, the heat dissipation unit cools the testing circuit, preventing excessively high operating temperatures that could compromise test safety.

[0074] This invention also provides a testing method, such as... Figure 2 The following is an example of a current source converter test circuit that includes only one DC voltage source submodule.

[0075] like Figure 4 As shown, the test method includes the following steps:

[0076] Step S1: Control the DC voltage source module to output positive and negative test voltages according to the preset logic.

[0077] In one specific embodiment, step S1 includes the following steps:

[0078] Step S11: Use a DC voltage source DC to charge capacitor C0 on the full-bridge submodule and output the test voltage.

[0079] Step S12: When the second power electronic switch G2 and the third power electronic switch G3 are turned on, and the first power electronic switch G1 and the fourth power electronic switch G4 are turned off, a positive test voltage is output.

[0080] Step S13: When the first power electronic switch G1 and the fourth power electronic switch G4 are turned on, and the second power electronic switch G2 and the third power electronic switch G3 are turned off, a negative test voltage is output.

[0081] Step S2: Control the DC current source module to output the test current according to the preset logic.

[0082] In one specific embodiment, the IGCT valve C2 is triggered and the DC current source is started. The DC current source and the IGCT valve C2 form a circuit, and the output current of the DC current source is adjusted to the test current.

[0083] Step S3: Apply positive and negative test voltages alternately to the test valve T, and open the test valve T when either positive or negative test voltage is applied to it.

[0084] In one specific embodiment, step S3 includes the following steps:

[0085] Step S31: After the DC voltage source outputs a positive test voltage, the second controllable switch T2 is triggered to conduct, and a positive test voltage is applied to the test valve T.

[0086] Step S32: Trigger the test valve T and the fourth controllable switch C1 to conduct, lock the third controllable switch C2, and apply test current to the test valve T.

[0087] Step S33: Trigger the third controllable switch C2 to conduct, lock the test valve T and the fourth controllable switch C1, and simultaneously trigger the first controllable switch T1 to apply a negative test voltage to the test valve T.

[0088] Step S34: Trigger the test valve T and the fourth controllable switch C1 to conduct, lock the third controllable switch C2, and apply test current to the test valve T.

[0089] In this embodiment of the invention, G2 and G3 in the full-bridge submodule and T2 in the bidirectional control valve are triggered to apply a positive voltage to the test valve T. Test valve T and valve C1 are triggered, valve C2 is locked, and the DC current is transferred from the C2 branch to the test valve T branch, at which point the test current flows through test valve T. G3 and G2 in the full-bridge submodule are locked, and G1 and G4 are triggered, causing the full-bridge submodule to output a negative voltage. Valve C2 is turned on, test valve T and valve C1 are locked, and simultaneously valve T1 in the bidirectional control valve is triggered, applying the negative voltage output by the full-bridge submodule to test valve T, at which point test valve T experiences a negative voltage. Valve C1 and test valve T are triggered, valve C2 is turned off, and the test current flows through test valve T, achieving effective conduction of test valve T under negative voltage. By controlling the direction of the output voltage of the full-bridge submodule, the direction of the voltage that the test valve T withstands after being turned off can be controlled. Through the coordination of the opening and closing times of valves C2 and C1 and test valve T, the current withstand time of test valve T can be controlled. For example... Figure 5 The figure shows the waveforms of the test voltage and current during the test.

[0090] When the test circuit has multiple DC voltage source sub-modules, the control method is the same as the test method described above, and will not be detailed here.

[0091] By designing appropriate control timing for testing the sample, multiple on / off cycles of the sample within a cycle can be achieved, as well as conduction of the sample under negative voltage. By controlling the on / off times of the IGBT devices in the full-bridge submodule and the on / off times of the bidirectional control valves T1 and T2, the withstand voltage timing and direction of the sample valve T can be rapidly adjusted. Through the coordination of IGCT valves C1 and C2 and the on / off times of the sample valve T, the current injection timing and current flow time can be adjusted, flexibly regulating the withstand voltage and current stress time of the sample valve T. This allows for equivalent testing of the sample valve T under different operating conditions, resulting in good test equivalence.

[0092] This invention provides a computer device, such as... Figure 6 As shown, the device may include a processor 81 and a memory 82, wherein the processor 81 and the memory 82 may be connected via a bus or other means. Figure 6 Take a bus connection as an example.

[0093] Processor 81 can be a central processing unit (CPU). Processor 81 can also be other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, or combinations of the above types of chips.

[0094] The memory 82, as a non-transitory computer-readable storage medium, can be used to store non-transitory software programs, non-transitory computer-executable programs, and modules, such as the corresponding program instructions / modules in the embodiments of the present invention. The processor 81 executes various functional applications and data processing of the processor by running the non-transitory software programs, instructions, and modules stored in the memory 82, thereby implementing the experimental method in the above method embodiments.

[0095] The memory 82 may include a program storage area and a data storage area. The program storage area may store the operating system and applications required for at least one function; the data storage area may store data created by the processor 81, etc. Furthermore, the memory 82 may include high-speed random access memory and may also include non-transitory memory, such as at least one disk storage device, flash memory device, or other non-transitory solid-state storage device. In some embodiments, the memory 82 may optionally include memory remotely located relative to the processor 81, and these remote memories may be connected to the processor 81 via a network. Examples of such networks include, but are not limited to, the Internet, corporate intranets, mobile communication networks, and combinations thereof.

[0096] One or more modules are stored in memory 82, and when executed by processor 81, they perform actions such as... Figure 3 The experimental method in the illustrated embodiment.

[0097] For specific details regarding the aforementioned computer equipment, please refer to the relevant documentation. Figures 1-5 The relevant descriptions and effects in the illustrated embodiments are for understanding purposes only and will not be repeated here.

[0098] Those skilled in the art will understand that all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. The program can be stored in a computer-readable storage medium, and when executed, it can include the processes of the embodiments of the above methods. The storage medium can be a magnetic disk, optical disk, read-only memory (ROM), random access memory (RAM), flash memory, hard disk drive (HDD), or solid-state drive (SSD), etc.; the storage medium can also include combinations of the above types of memory.

[0099] Obviously, the above embodiments are merely illustrative examples for clear explanation and are not intended to limit the implementation. Those skilled in the art will recognize that other variations or modifications can be made based on the above description. It is neither necessary nor possible to exhaustively list all possible implementations here. However, obvious variations or modifications derived therefrom are still within the scope of protection of this invention.

Claims

1. A test circuit for testing a test valve, characterized by The test circuit comprises a direct current voltage source module, a direct current source module, a first current circuit and a second current circuit, wherein The direct current voltage source module is connected in series with the second current circuit, and the second current circuit is used for connecting the test valve in series; The direct current source module is connected in parallel with the first current circuit and the second current circuit respectively, and the first current circuit and the second current circuit are used for providing a current path for the direct current source module; The direct current voltage source module is used for alternately outputting a positive test voltage and a negative test voltage according to a preset logic, and alternately applying the positive test voltage and the negative test voltage on the test valve; The direct current source module is used for outputting a test current to make the test valve conductive when the positive test voltage or the negative test voltage is applied on the test valve; Further comprising a bidirectional control valve, one end of the bidirectional control valve is connected with one end of the direct current voltage source module, and the other end of the bidirectional control valve is connected with one end of the test valve in the second current circuit; The bidirectional control valve is used for disconnecting or conducting the connection between the direct current voltage source module and the second current circuit; The direct current voltage source module comprises a direct current voltage source and a full-bridge submodule connected in parallel with the direct current voltage source; The direct current voltage source is used for charging the capacitor of the full-bridge submodule, so that the full-bridge submodule outputs a test voltage, and according to the conduction timing of the power electronic switch in the full-bridge submodule controlled according to the preset logic, the positive test voltage and the negative test voltage are generated and alternately applied on the test valve.

2. The test circuit of claim 1, wherein The full-bridge submodule comprises a first power electronic switch, a second power electronic switch, a third power electronic switch, a fourth power electronic switch and a capacitor, wherein The first end of the first power electronic switch is connected with the first end of the third power electronic switch, the first end of the capacitor and the positive pole of the direct current voltage source respectively, the second end of the first power electronic switch is connected with the first end of the second power electronic switch and then leads out an external connection line for connecting with the first end of the test valve, and the control end of the first power electronic switch is used for external connection of a control signal; The second end of the second power electronic switch is connected with the second end of the fourth power electronic switch, the second end of the capacitor and the negative pole of the direct current voltage source respectively, and the control end of the second power electronic switch is used for external connection of a control signal; The second end of the third power electronic switch is connected with the first end of the fourth power electronic switch and then leads out an external connection line for connecting with the second end of the test valve, and the control end of the third power electronic switch and the control end of the fourth power electronic switch are both used for external connection of a control signal; When the second power electronic switch and the third power electronic switch are turned on and the first power electronic switch and the fourth power electronic switch are turned off according to the control signal, the direct current voltage source module outputs the positive test voltage; The DC voltage source module outputs the negative test voltage when the first power electronic switch and the fourth power electronic switch are turned on and the second power electronic switch and the third power electronic switch are turned off according to the control signal.

3. The test circuit of claim 1, wherein, The bidirectional control valve comprises a first controllable switch and a second controllable switch, and the first controllable switch and the second controllable switch are connected in reverse parallel; The DC voltage source module is configured to apply the negative test voltage to the test valve when the first controllable switch is turned on. The DC voltage source module is configured to apply the positive test voltage to the test valve when the second controllable switch is turned on.

4. The test circuit of claim 3, wherein The first current circuit comprises a third controllable switch, and the second current circuit comprises a fourth controllable switch, The fourth controllable switch is connected in series with the test valve. The first end of the third controllable switch is connected with the first end of the fourth controllable switch, and the second end of the third controllable switch is connected with the test valve. After the DC voltage source outputs the positive test voltage, the second controllable switch is triggered to be turned on to apply the positive test voltage to the test valve; the test valve and the fourth controllable switch are triggered to be turned on to lock the third controllable switch and apply the test current to the test valve; the third controllable switch is triggered to be turned on to lock the test valve and the fourth controllable switch, and the first controllable switch is triggered at the same time to apply the negative test voltage to the test valve; the test valve and the fourth controllable switch are triggered to be turned on to lock the third controllable switch and apply the test current to the test valve, so as to perform the controllable on-off test on the test valve.

5. A test system, characterized by The test circuit, the measurement and control unit, and the heat dissipation unit according to any one of claims 1-4, wherein The measurement and control unit is connected with the DC voltage source module, the DC current source module, the first current circuit, and the second current circuit respectively, and is configured to provide control signals for the DC voltage source module, the DC current source module, the first current circuit, and the second current circuit, so that the DC voltage source module outputs the positive test voltage and the negative test voltage, and alternately applies the positive test voltage and the negative test voltage to the test valve, and the DC current source module outputs the test current to turn on the test valve when the positive test voltage or the negative test voltage is applied to the test valve; The heat dissipation unit is configured to perform heat dissipation treatment on the test circuit through a water supply circulation system.

6. A test method characterized by, The test method based on the test circuit according to any one of claims 1-4, comprising: controlling the DC voltage source module to output the positive test voltage and the negative test voltage according to a preset logic; controlling the DC current source module to output the test current according to a preset logic; alternately applying the positive test voltage and the negative test voltage to the test valve, and turning on the test valve when the positive test voltage or the negative test voltage is applied to the test valve.

7. A computer readable storage medium characterized by The computer readable storage medium stores computer instructions for causing the computer to perform the test method according to claim 6.

8. A computer device, comprising: The test circuit, the measurement and control unit, and the heat dissipation unit according to any one of claims 1-4, wherein A memory and a processor, which are communicatively connected to each other, the memory storing computer instructions, and the processor executing the computer instructions to perform the test method of claim 6.

Images