A display panel point defect over-inspection rescue method, storage medium and device

Abstract

The present invention discloses a display panel point defect over-inspection and rescue method, storage medium and device, belonging to the field of display panel detection technology, which obtains a first target image under the L0 screen, identifies bright spot defects and their position information, and then obtains corresponding target images under the UP screen and the DP screen to obtain the pixel grayscale value at each bright spot defect in the two target images, and uses the two pixel grayscale values ​​and the first target image for combined analysis to further determine the authenticity of the bright spot defect. The display panel point defect over-inspection and rescue method, storage medium and device of the present invention can realize the judgment of the authenticity of the bright spot when the bright spot coincides with dust, over-inspect and rescue the point defects, improve the accuracy of the display panel point defect detection, ensure the efficiency and accuracy of the display panel AOI detection, and have good practical value and application prospects.

Description

Technical Field

[0001] The present invention belongs to the technical field of display panel detection, and in particular relates to a display panel point defect over-detection and rescue method, storage medium and equipment. Background Art

[0002] With the rapid development of the industrial field, the inspection tasks of LCD and OLED panels have gradually changed from manual inspection to machine inspection. In the process of machine inspection, the system commonly used is the AOI system (Automated Optical Inspection), which plays the role of manual inspection to perform a series of high-intensity and high-precision inspection tasks, greatly improving production efficiency and liberating productivity.

[0003] However, under the requirement of high precision, there are certain risks in machine vision inspection due to factors such as optical environment and physical environment. For example, when inspecting point defects on display panels, the panel image is often covered by dust due to interference from dust, making it impossible to separate defects from dust, resulting in false detection. Therefore, in order to ensure the accuracy of AOI inspection, it is often necessary to first perform a dust filtering process.

[0004] At present, there are many dust filtering methods in the prior art. One of the most widely used methods is to first turn on only the high side light (the angle of the illumination panel is adjustable) to illuminate the display panel in the Up Particle screen, and the display panel itself is not lit, and then take a picture. Then, in the Down Particle screen, only turn on the low side light (the angle of the illumination panel is adjustable) to illuminate the display panel, and the display panel itself is not lit, and then take a picture. The above method can meet the needs of dust removal to a certain extent. However, the above method will also filter out some real bright spot defects, resulting in missed detection of bright spot defects, affecting the detection accuracy. Summary of the invention

[0005] In response to one or more of the above defects or improvement needs in the prior art, the present invention provides a display panel point defect over-inspection and rescue method, storage medium and device, which can effectively solve the missed detection problem caused by the existing dust filtering method, improve the accuracy of the AOI system in detecting panel bright spots, and effectively realize the distinction and identification of true and false bright spot defects.

[0006] To achieve the above object, one aspect of the present invention provides a display panel point defect over-inspection and rescue method, comprising:

[0007] Taking an image of the display panel in the L0 image to obtain a first target image, identifying a bright spot defect from the first target image, and obtaining position information of the bright spot defect, wherein the L0 image is a picture taken when the panel screen is lit and the grayscale level is set to 0;

[0008] The display panel is not illuminated, and the high side light is turned on to obtain a second target image of the display panel, and a first pixel grayscale value at each bright spot defect is obtained according to the second target image and the position information of the bright spot defect;

[0009] The display panel is not illuminated, low side light is turned on, a third target image of the display panel is obtained, and a second pixel grayscale value at each bright spot defect is obtained according to the third target image and the position information of the bright spot defect;

[0010] The authenticity of the bright spot defect is determined according to the first target image, the first pixel grayscale value, and the second pixel grayscale value.

[0011] As a further improvement of the present invention, judging the authenticity of the bright spot defect according to the first target image and the first pixel grayscale value and the second pixel grayscale value includes:

[0012] The grayscale average values ​​of each bright spot defect in the second target image and the third target image are calculated respectively to obtain a ratio of the bright spot average values, and the authenticity of each bright spot defect is judged according to the ratio.

[0013] As a further improvement of the present invention, the ratio of the bright spot mean values ​​is obtained by the following formula:

[0014]

[0015] Wherein, MeanGray Ratio is the ratio of bright spot mean values; UP MeanGray is the grayscale mean value of a single bright spot defect in the second target image; and DP MeanGray is the grayscale mean value of a single bright spot defect in the third target image.

[0016] As a further improvement of the present invention, judging the authenticity of the bright spot defect according to the first target image and the first pixel grayscale value and the second pixel grayscale value specifically includes:

[0017] Acquire a third pixel grayscale value of the bright spot defect in the first target image;

[0018] Obtaining the brightness type of each bright spot defect in three different images according to a preset rule and the first, second and third pixel grayscale values;

[0019] The authenticity of each of the bright spot defects is determined according to the brightness type of each of the bright spot defects in three different images.

[0020] As a further improvement of the present invention, the brightness type includes three types: obvious, weak, and no phenomenon;

[0021] When the brightness type of the same bright spot defect in the first target picture is obvious, and the brightness types in the second target picture and the third target picture are one obvious and the other non-phenomenon, the bright spot defect is a false bright spot; otherwise, it is a true bright spot.

[0022] Another aspect of the present invention further provides a computer-readable storage medium storing a computer program, and when the computer program is executed by a processor, the display panel dot defect over-inspection and rescue method is executed.

[0023] Another aspect of the present invention provides an electronic device, including a processor, a memory and a program, wherein the program is stored in the memory and is configured to be executed by the processor to execute the display panel dot defect over-inspection and rescue method.

[0024] The above-mentioned improved technical features can be combined with each other as long as they do not conflict with each other.

[0025] In general, the above technical solution conceived by the present invention has the following beneficial effects compared with the prior art:

[0026] (1) The display panel point defect over-inspection and rescue method of the present invention obtains corresponding target images by taking images of the display panel under the L0 screen, DP screen, and UP screen, and identifies the bright spot defect and the position information of the bright spot defect from the first target image (L0 screen), and obtains the pixel grayscale value at each bright spot defect from the target images of the DP screen and the UP screen. By using the combined analysis of the first target image and each pixel grayscale value, the true or false of the bright spot defect can be accurately determined, and the true bright spot can be rescued when dust and the bright spot overlap, thereby ensuring the accuracy of the display panel point defect detection.

[0027] (2) The display panel point defect over-inspection and rescue method of the present invention calculates the grayscale average value of each bright spot defect in the target image under the DP screen and the UP screen respectively, and sets corresponding formulas to obtain the ratio of the bright spot mean values, thereby judging the authenticity of each bright spot defect, realizing quantitative analysis of bright spot defects, and accurately judging the authenticity of bright spot defects.

[0028] (3) The display panel point defect over-inspection and rescue method of the present invention obtains the pixel grayscale value of each bright spot defect under different pictures and sets corresponding rules to determine the brightness type of the pixel grayscale value of the brightness defect under different pictures. According to the brightness type of each bright spot defect under three pictures, the authenticity of the bright spot defect is judged, and the qualitative analysis of the bright spot defect is realized, thereby improving the accuracy of bright spot defect determination.

[0029] (4) The display panel point defect over-inspection and rescue method of the present invention can realize the judgment of the authenticity of the bright spot defect by comparing the grayscale values ​​of the bright spot defect under the L0, UP and DP screens, and complete the judgment of the authenticity of the bright spot when the bright spot coincides with dust, and over-inspect and rescue the point defects, thereby improving the accuracy of the display panel point defect detection, ensuring the efficiency and accuracy of the display panel AOI detection, and having good practical value and application prospects. DETAILED DESCRIPTION

[0030] In order to make the purpose, technical scheme and advantages of the present invention clearer, the present invention is further described in detail below in conjunction with the embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not conflict with each other.

[0031] In the description of the present invention, it is to be understood that the terms “center”, “longitudinal”, “lateral”, “length”, “width”, “thickness”, “up”, “down”, “front”, “back”, “left”, “right”, “vertical”, “horizontal”, “top”, “bottom”, “inside”, “outside”, “clockwise”, “counterclockwise”, “axial”, “radial”, “circumferential” and the like to indicate orientations or positional relationships, which are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as limiting the present invention.

[0032] In addition, the terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of the features. In the description of the present invention, the meaning of "plurality" is at least two, such as two, three, etc., unless otherwise clearly and specifically defined.

[0033] In the present invention, unless otherwise clearly specified and limited, the terms "installed", "connected", "connected", "fixed" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements, unless otherwise clearly defined. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0034] In the present invention, unless otherwise clearly specified and limited, a first feature being "above" or "below" a second feature may mean that the first and second features are in direct contact, or the first and second features are in indirect contact through an intermediate medium. Moreover, a first feature being "above", "above" or "above" a second feature may mean that the first feature is directly above or obliquely above the second feature, or simply means that the first feature is higher in level than the second feature. A first feature being "below", "below" or "below" a second feature may mean that the first feature is directly below or obliquely below the second feature, or simply means that the first feature is lower in level than the second feature.

[0035] Example:

[0036] The display panel point defect over-inspection and rescue method in the preferred embodiment of the present invention is mainly used in special situations where the panel bright spots are covered by dust, resulting in missed detection of bright spot defects. This can reduce dust interference while rescuing some bright spot defects covered by dust, thereby improving the accuracy of bright spot defect detection and reducing the false detection rate.

[0037] Specifically, the method for over-inspection and rescue of dot defects of display panels in the preferred embodiment mainly includes the following process:

[0038] (1) capturing an image of the display panel in the L0 image to obtain a first target image, identifying all bright spot defects from the first target image, and obtaining position information of each bright spot defect; wherein the L0 image is a captured image when the panel screen is lit and the grayscale level is set to 0;

[0039] (2) capturing an image of the display panel in an Up Particle screen (hereinafter referred to as the "UP screen") to obtain a second target image of the display panel, and obtaining a first pixel grayscale value at each bright spot defect according to the second target image and the position information of each bright spot defect; wherein the UP screen refers to a screen captured when the display panel is not illuminated and only the high side light (the angle of illumination of the panel is adjustable) is turned on to illuminate the display panel;

[0040] (3) capturing an image of the display panel in a Down Particle image (hereinafter referred to as “DP image”) to obtain a third target image of the display panel, and obtaining a second pixel grayscale value at each bright spot defect according to the third target image and the position information of each bright spot defect; wherein the DP image refers to an image captured when the display panel is not illuminated and only a low side light (the angle of illumination of the panel is adjustable) is turned on to illuminate the display panel;

[0041] (4) judging the authenticity of the bright spot defect according to the first target image, the first pixel grayscale value, and the second pixel grayscale value.

[0042] When actually taking pictures, in the process of taking pictures under the three screens, the relative position of the camera position used for taking pictures and the display panel is preferably kept unchanged. In this way, it is equivalent to obtaining the corresponding views of the display panel in three different states. The positions on the three views correspond to each other, so as to judge whether the bright spot defects under the three screens are the same. In addition, in the process of acquiring the second and third target images, "high side light" is the side view light placed on one side of the display panel and at a relatively high position, preferably refers to the detection light whose optical axis and the display panel have an illumination angle of 50° to 70°; "low side light" is the side view light placed on one side of the display panel and at a relatively low position, preferably refers to the detection light whose optical axis and the display panel have an illumination angle of 20° to 40°. By taking pictures under the DP screen and the UP screen, bright spot dust detection of the display panel is performed.

[0043] In more detail, when actually extracting bright spots, it is preferred to use a differential algorithm to detect bright spots by grayscale, size, and intensity. That is, a region of a corresponding size is selected to smooth the image, and the difference between the smoothed image and the original image is made, so that the brightness of the bright spots in the obtained image will be greater, and then the bright spots are extracted by grayscale threshold.

[0044] Furthermore, when determining whether a bright spot defect is real or fake, it is preferably done through qualitative analysis and / or quantitative analysis. Among them, the qualitative analysis is to determine the clarity (brightness type) of each bright spot defect in three images respectively, so as to formulate rules based on the actual situation to determine whether the bright spot defect is a real bright spot or a fake bright spot.

[0045] Specifically, the qualitative analysis in the preferred embodiment preferably includes the following process:

[0046] (4.1) Obtaining a third pixel grayscale value of a bright spot defect in the first target image;

[0047] (4.2) Obtaining the brightness type of each bright spot defect in three different images according to a preset rule and the grayscale values ​​of the first, second and third pixels;

[0048] (4.3) Judging whether each of the bright spot defects is true or false according to the brightness type of each of the bright spot defects in three different images.

[0049] In more detail, the preset rules in the preferred embodiment define the brightness types of bright spots as three types: obvious, weak, and no phenomenon, where "obvious" refers to the measurement point with a gray value between 15 and 255; "weak" refers to the measurement point with a gray value between 3 and 15; and "no phenomenon" refers to the measurement point with a gray value between 0 and 3. By performing brightness detection on the DP and UP screens on the bright spots detected on the L0 screen, the authenticity of the bright spots can be qualitatively determined.

[0050] Specifically, when the brightness type of the same bright spot defect in the first target picture is obvious, and the brightness types in the second target picture and the third target picture are obvious in one and no phenomenon in the other, the bright spot defect is a false bright spot; otherwise, it is a true bright spot. For example: when the brightness type of a bright spot defect in the L0 picture is obvious, and it is obvious in the DP picture, and no phenomenon in the UP picture, the bright spot defect is a false bright spot.

[0051] Furthermore, for quantitative analysis, the grayscale average values ​​of each bright spot defect in the second target image and the third target image are calculated respectively to obtain the ratio of the bright spot mean values, and the authenticity of each bright spot defect is quantitatively judged based on the ratio.

[0052] In a preferred embodiment, the calculation of the above-mentioned "ratio of the bright spot mean values" is preferably completed using the following formula:

[0053]

[0054] Wherein, MeanGray Ratio is the ratio of bright spot mean values; UP MeanGray is the grayscale mean value of a single bright spot defect in the second target image; and DP MeanGray is the grayscale mean value of a single bright spot defect in the third target image.

[0055] Through the above quantitative calculation, the indicator "ratio of bright spot mean" is used to characterize true and false bright spots. When the MeanGray Ratio value is large, it means that the bright spot is obvious in a certain Particle screen, but there is no bright spot in another Particle screen. At this time, the bright spot is a false bright spot. Therefore, by defining the MeanGray Ratio threshold, it is possible to distinguish between true and false bright spots, so that the true bright spots can be saved.

[0056] Another aspect of the present invention further provides a computer-readable storage medium having a computer program stored thereon, wherein the computer program is executed by a processor to execute the above-mentioned display panel dot defect over-inspection and rescue method.

[0057] Another aspect of the present invention provides an electronic device, comprising a processor, a memory and a program, wherein the program is stored in the memory and is configured to execute the above-mentioned display panel dot defect over-inspection and rescue method by the processor.

[0058] The display panel point defect over-inspection and rescue method of the present invention determines whether the bright spot detected in the L0 screen is a real defect through the overlap of the corresponding positions of the bright spots in the L0, UP and DP screens. It can judge whether the bright spot is real or fake when it overlaps with dust, and over-inspect and rescue the point defects, thereby improving the accuracy of point defect detection of the display panel, ensuring the efficiency and accuracy of AOI detection of the display panel, and having good practical value and application prospects.

[0059] It will be easily understood by those skilled in the art that the above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the protection scope of the present invention.

Claims

1. A display panel point defect over-inspection and rescue method, characterized in that: include: Taking an image of the display panel under the L0 screen to obtain a first target image, identifying a bright spot defect from the first target image, and obtaining position information of the bright spot defect, wherein the L0 screen is a screen taken when the panel screen is lit and the grayscale level is set to 0; The display panel is not illuminated, and the high side light is turned on to obtain a second target image of the display panel, and a first pixel grayscale value at each bright spot defect is obtained according to the second target image and the position information of the bright spot defect; The display panel is not illuminated, low side light is turned on, a third target image of the display panel is obtained, and a second pixel grayscale value at each bright spot defect is obtained according to the third target image and the position information of the bright spot defect; The authenticity of the bright spot defect is determined according to the first target image, the first pixel grayscale value, and the second pixel grayscale value; when the brightness type of the same bright spot defect in the first target picture is obvious, and the brightness types in the second target picture and the third target picture are one obvious and the other no phenomenon, the bright spot defect is a false bright spot; otherwise, it is a true bright spot; wherein, the brightness type of obvious refers to the measurement point with a grayscale value between 15 and 255, and the brightness type of no phenomenon refers to the measurement point with a grayscale value between 0 and 3.

2. The display panel point defect over-inspection and rescue method according to claim 1, characterized in that: Judging the authenticity of the bright spot defect according to the first target image, the first pixel grayscale value, and the second pixel grayscale value includes: The grayscale average values ​​of each bright spot defect in the second target image and the third target image are calculated respectively to obtain a ratio of the bright spot average values, and the authenticity of each bright spot defect is judged according to the ratio.

3. The display panel point defect over-inspection and rescue method according to claim 2, characterized in that: The ratio of the bright spot mean is obtained by the following formula: Wherein, MeanGray Ratio is the ratio of bright spot mean values; UP MeanGray is the grayscale mean value of a single bright spot defect in the second target image; and DP MeanGray is the grayscale mean value of a single bright spot defect in the third target image.

4. The display panel point defect over-inspection and rescue method according to claim 1, characterized in that: Judging the authenticity of the bright spot defect according to the first target image and the first pixel grayscale value and the second pixel grayscale value specifically includes: Acquire a third pixel grayscale value of the bright spot defect in the first target image; Obtaining the brightness type of each bright spot defect in three different images according to a preset rule and the first, second and third pixel grayscale values; The authenticity of each of the bright spot defects is determined according to the brightness type of each of the bright spot defects in three different images.

5. A computer-readable storage medium storing a computer program, characterized in that: When the computer program is executed by a processor, the display panel dot defect over-inspection and rescue method according to any one of claims 1 to 4 is executed.

6. An electronic device comprising a processor, a memory and a program, characterized in that: The program is stored in the memory and is configured to be executed by a processor to implement the display panel dot defect over-inspection and rescue method according to any one of claims 1 to 4.

Images