A self-checking method for abnormal working state of a millimeter wave / terahertz security inspection device

Abstract

The application provides a self-checking method for abnormal working state of a millimeter wave / terahertz security inspection device, which can solve the problems of low efficiency, influence on intelligent operation of the device and normal security inspection work caused by the existing manual fault checking and correction method. The method comprises the following steps: reducing a J-frame original millimeter wave image obtained by a sampler of the millimeter wave / terahertz security inspection device and after imaging processing, to obtain a J-frame actual detection image corresponding to the J-frame original millimeter wave image; judging whether each frame of the actual detection image is abnormal; when it is detected in step S200 that K frames of the actual detection image are abnormal in the J-frame actual detection image, it is determined that the millimeter wave / terahertz security inspection device is abnormal, otherwise, the millimeter wave / terahertz security inspection device is normal; and when it is determined that the millimeter wave / terahertz security inspection device is abnormal, a reset operation is performed on the millimeter wave / terahertz security inspection device.

Description

Technical Field

[0001] This invention relates to the field of security inspection, and in particular to the field of millimeter wave / terahertz security inspection technology, specifically a self-inspection method for abnormal working conditions of millimeter wave / terahertz security inspection equipment. Background Technology

[0002] Millimeter-wave / terahertz security screening technology is a newly emerging type of human body security screening technology in recent years. It utilizes millimeter-wave or terahertz waves for non-contact security checks of the human body. Due to its advantages of being harmless to the human body, fast screening speed, and high accuracy, it is gradually replacing traditional metal detectors and X-ray screening methods. However, in practical applications, the sampler of millimeter-wave / terahertz security screening equipment is easily affected by external environmental factors during transportation and installation, as well as improper use, which can easily cause malfunctions in the sampler (e.g., ...). Figure 1 The abnormal sampling signal located in a straight line within the marked box 10) causes deviations in millimeter-wave / terahertz security imaging (such as...). Figure 2 The abnormal vertical line display on the human body image located within the marking frame 20 affects the normal operation of the entire millimeter-wave / terahertz security inspection equipment. In the past, when the above situation occurred, manual troubleshooting and correction were often required, which not only affected the intelligent operation of the equipment but also seriously affected the normal security inspection work. Summary of the Invention

[0003] To address the aforementioned issues, this invention provides a self-inspection method for abnormal operating conditions of millimeter-wave / terahertz security inspection equipment. This method solves the problems of low efficiency, impact on intelligent equipment operation, and disruption to normal security inspection work inherent in existing manual fault diagnosis and correction methods.

[0004] The technical solution is a self-testing method for abnormal operating conditions of millimeter-wave / terahertz security inspection equipment, characterized by the following steps:

[0005] Step S100: The original millimeter-wave image of frame J to be detected, which is acquired by the sampler of the millimeter-wave / terahertz security inspection equipment and processed by imaging, is reduced in size to obtain the actual detection image of frame J that corresponds one-to-one with the original millimeter-wave image of frame J.

[0006] Step S200: Determine whether there is an anomaly in each frame of the actual detected image;

[0007] Step S300: If an anomaly is detected in K frames of actual detection images in J frames in step S200, it is determined that the millimeter wave / terahertz security inspection equipment is malfunctioning; otherwise, the millimeter wave / terahertz security inspection equipment is functioning normally.

[0008] Step S400: When it is determined that the millimeter wave / terahertz security inspection equipment is malfunctioning, a reset operation is performed on the millimeter wave / terahertz security inspection equipment.

[0009] Furthermore, steps S100 to S400 form a cycle detection, and the millimeter wave / terahertz security inspection equipment performs a cycle detection once every X hours of continuous operation.

[0010] Furthermore, if the millimeter-wave / terahertz security inspection equipment is found to be malfunctioning in the previous cycle detection and a reset operation is performed on the equipment, and no malfunction is detected in the millimeter-wave / terahertz security inspection equipment in the next cycle detection, then the millimeter-wave / terahertz security inspection equipment was in the first abnormal working state in the previous cycle detection.

[0011] Furthermore, if the millimeter-wave / terahertz security inspection equipment is found to be malfunctioning after W consecutive cycles of detection, then the millimeter-wave / terahertz security inspection equipment is determined to be in a second abnormal working state and an alarm is triggered.

[0012] Furthermore, the reduction processing of the original millimeter-wave image in step S100 specifically involves converting the original millimeter-wave image with a size of M rows × N columns from the color space to the grayscale space to obtain the actual detection image with a size of M' rows × N' columns.

[0013] Furthermore, step S200 includes the following steps performed sequentially:

[0014] Step S210: Calculate the mean and standard deviation of each column of data in each frame of the actual detected image to obtain N' sets of mean and standard deviation, and receive them using a container;

[0015] Step S220: Calculate the ratio λ between the mean and standard deviation of each group, i.e., λ = mean / standard deviation, and obtain N' ratios λ in total;

[0016] Step S230: Sort the N' ratios λ obtained in step S220 in descending order to obtain a sequence of ratios λ arranged in descending order;

[0017] Step S240: Perform a second ratio operation on all two ratios λ in adjacent positions in the sequence of ratios λ obtained in step S230. The second ratio operation is to compare the ratio λ in the next position with the ratio λ in the previous position in the adjacent positions to obtain (N'-1) second ratios λ'.

[0018] In step S250, if any one of the (N'-1) quadratic ratios λ' obtained in step S240 is greater than the preset threshold T, then it is determined that there is an anomaly in the actual detected image of that frame.

[0019] Further, the value range of J is 50 < J < 100, and the value range of K is 0 < K < J / 4.

[0020] Further, the value range of X is from 1 hour to 5 hours.

[0021] Further, observe the detected image determined to be abnormal in step S200. If it is determined that there is a problem with the image data in the U-th column of the abnormal detected image, then the (C×U / N')-th channel of the sampler of the millimeter-wave / terahertz security inspection device is abnormal, where C is the number of samplers of the millimeter-wave / terahertz security inspection device.

[0022] The beneficial effects of the present invention are as follows: It can realize the automatic detection of the abnormal working state of the millimeter-wave / terahertz security inspection device, greatly improve the detection efficiency, and meet the requirements of the daily intelligent operation of the millimeter-wave / terahertz security inspection device; at the same time, it performs real-time detection during the daily application of the millimeter-wave / terahertz security inspection device, with little impact on the normal security inspection work of the device; and the objects it detects are a large amount of original millimeter-wave image data collected locally, so the detection results have high accuracy, high detection precision, and strong reliability; in addition, it adopts a periodic detection form, so it will not cause a large amount of additional load on the device operation and is not likely to affect the operation efficiency of the millimeter-wave / terahertz security inspection device. Description of the Drawings

[0023] Figure 1 It is a schematic diagram of an example of an abnormal state of a sampler of an existing millimeter-wave / terahertz security inspection device;

[0024] Figure 2 It is a schematic diagram of an example of an abnormal working state of an existing millimeter-wave / terahertz security inspection device;

[0025] Figure 3 It is a schematic flowchart of a self-checking method for an abnormal working state of a millimeter-wave / terahertz security inspection device of the present invention. Detailed Embodiments

[0026] See Figure 3 , a self-checking method for an abnormal working state of a millimeter-wave / terahertz security inspection device of the present invention includes the following steps.

[0027] Step S100 involves reducing the size of the J-frame original millimeter-wave image to be detected, obtained by the sampler of the millimeter-wave / terahertz security inspection equipment after image processing, to obtain a J-frame actual detection image that corresponds one-to-one with the J-frame original millimeter-wave image. Reducing the size of the original millimeter-wave image reduces the amount of data processing, improving subsequent data processing speed and minimizing the excessive load on the equipment caused by large data volumes, thus ensuring the safe and stable operation of the equipment. Furthermore, since different models of millimeter-wave / terahertz security inspection equipment output different sizes of original millimeter-wave images, uniformly reducing the size of the original millimeter-wave image also improves the consistency of subsequent equipment anomaly detection data, thereby ensuring detection accuracy.

[0028] As a preferred embodiment of the present invention, the original millimeter-wave image is reduced in size by converting the original millimeter-wave image with size M rows × N columns from color space to grayscale space to obtain the actual detection image with size M' rows × N' columns.

[0029] Step S200: Determine whether there are any anomalies in each frame of the actual detected image; specifically, this includes the following steps performed sequentially:

[0030] Step S210: Calculate the mean and standard deviation of each column of data in each frame of the actual detected image to obtain N' sets of mean and standard deviation, and receive them using a container;

[0031] Step S220: Calculate the ratio λ between the mean and standard deviation of each group, i.e., λ = mean / standard deviation, and obtain N' ratios λ in total;

[0032] Step S230: Sort the N' ratios λ obtained in step S220 in descending order to obtain a sequence of ratios λ arranged in descending order;

[0033] Step S240: Perform a second ratio operation on all two ratios λ in adjacent positions in the sequence of ratios λ obtained in step S230. The second ratio operation is to compare the ratio λ in the next position with the ratio λ in the previous position in the adjacent positions to obtain (N'-1) second ratios λ'.

[0034] In step S250, if any one of the (N'-1) quadratic ratios λ' obtained in step S240 is greater than the preset threshold T, then it is determined that there is an anomaly in the actual detected image of that frame.

[0035] Step S300: When it is detected in step S200 that there are K frames of actual detection images with anomalies among the J frames of actual detection images, it is determined that the millimeter-wave / terahertz security inspection device is operating abnormally; otherwise, the millimeter-wave / terahertz security inspection device is operating normally. Here, the value range of J is 50 < J < 100, and the value range of K is 0 < K < J / 4.

[0036] Step S400: When it is determined that the millimeter-wave / terahertz security inspection device is operating abnormally, perform a reset operation on the millimeter-wave / terahertz security inspection device.

[0037] In the above self-checking method for the abnormal operating state of a millimeter-wave / terahertz security inspection device of the present invention, steps S100 to S400 form a periodic detection. The millimeter-wave / terahertz security inspection device performs a periodic detection every X hours of continuous operation, that is, the device performs a cyclic periodic detection every X hours of continuous operation. It adopts a form of regular automatic detection, which can further reduce the load pressure on the device's calculation during automatic detection and ensure the normal and reliable operation of the device. In practical applications, the time interval X (i.e., the single continuous operating time X of the device) between two adjacent periodic detections is preferably within the range of 1 hour to 5 hours.

[0038] During the operation of the method of the present invention, after the previous periodic detection determines that the millimeter-wave / terahertz security inspection device is operating abnormally and a reset operation is performed on the device, and no anomaly of the millimeter-wave / terahertz security inspection device is detected during the next periodic detection, then the millimeter-wave / terahertz security inspection device was in the first abnormal operating state during the previous periodic detection, that is, the fault has been eliminated after the previous periodic detection and reset operation, and this abnormal operating state can be solved through the reset operation.

[0039] When the millimeter-wave / terahertz security inspection device is determined to be operating abnormally in W consecutive periodic detections and the device still shows an abnormal operating state after the reset operation, it is determined that the millimeter-wave / terahertz security inspection device is in the second abnormal operating state and an alarm prompt is given, and then maintenance personnel perform manual troubleshooting intervention.

[0040] In addition, during the periodic detection process, observe the detection images determined to be abnormal in step S200. If it is determined that there is a problem with the image data in the U-th column of the abnormal detection image, then the C×U / N'-th channel of the sampler of the millimeter-wave / terahertz security inspection device is abnormal, where C is the number of samplers of the millimeter-wave / terahertz security inspection device.

[0041] The above has described the specific implementation of the present invention in detail, but the content is only a preferred implementation of the present invention, and cannot be considered as limiting the scope of implementation of the present invention. All equivalent changes and improvements made according to the scope of the application of the present invention shall still fall within the scope covered by the patent of the present invention.

Claims

1. A self-testing method for abnormal operating conditions of millimeter-wave / terahertz security inspection equipment, characterized in that: It includes the following steps: Step S100: Reduce the J-frame original millimeter-wave images to be detected, which are collected by the sampler of the millimeter-wave / terahertz security inspection device and obtained after imaging processing, to obtain J-frame actual detection images corresponding one by one to the J-frame original millimeter-wave images. Step S200: Determine whether there is any abnormality in each frame of the actual detection images. Step S300: When it is detected in step S200 that K frames of the actual detection images in the J-frame actual detection images are abnormal, it is determined that the millimeter-wave / terahertz security inspection device is operating abnormally; otherwise, the millimeter-wave / terahertz security inspection device is operating normally. Step S400: When it is determined that the millimeter-wave / terahertz security inspection device is operating abnormally, perform a reset operation on the millimeter-wave / terahertz security inspection device. The specific reduction process of the original millimeter-wave images in step S100 is to convert the original millimeter-wave images with the size of M rows × N columns from the color space to the grayscale space to obtain the actual detection images with the size of M' rows × N' columns. Step S200 includes the following steps executed in sequence: Step S210: Calculate the mean and standard deviation of each column of data in each frame of the actual detection images respectively, obtain N' groups of mean and standard deviation, and receive them using a container. Step S220: Calculate the ratio λ between each group of mean and standard deviation, that is, λ = mean / standard deviation, and a total of N' ratios λ are obtained. Step S230: Sort the N' ratios λ obtained in step S220 in descending order to obtain a sequence of ratios λ arranged in descending order one by one. Step S240: Perform a secondary ratio calculation on all two adjacent ratios λ in the sequence of ratios λ obtained in step S230, and this secondary ratio calculation is to calculate the ratio of the ratio λ in the latter position to the ratio λ in the former position among the adjacent positions, and obtain (N' - 1) secondary ratios λ'. Step S250: If any one of the (N' - 1) secondary ratios λ' obtained in step S240 is greater than the preset threshold T, it is determined that this frame of the actual detection image is abnormal.

2. The self-testing method for abnormal operating status of millimeter-wave / terahertz security inspection equipment according to claim 1, characterized in that: Steps S100 to S400 form a periodic detection, and the millimeter-wave / terahertz security inspection device performs a periodic detection once every X consecutive hours of operation.

3. The self-testing method for abnormal operating status of millimeter-wave / terahertz security inspection equipment according to claim 2, characterized in that: After the previous periodic detection determines that the millimeter-wave / terahertz security inspection device is operating abnormally and performs a reset operation on the device, and no abnormality of the millimeter-wave / terahertz security inspection device is detected in the next periodic detection, the millimeter-wave / terahertz security inspection device in the previous periodic detection is in the first abnormal operating state.

4. The self-testing method for abnormal working state of millimeter-wave / terahertz security inspection equipment according to claim 2, characterized in that: When it is determined that the millimeter-wave / terahertz security inspection device is operating abnormally in W consecutive periodic detections, it is determined that the millimeter-wave / terahertz security inspection device is in the second abnormal operating state and an alarm prompt is given.

5. The self-testing method for abnormal working state of millimeter-wave / terahertz security inspection equipment according to claim 1, characterized in that: The value range of J is 50 < J < 100, and the value range of K is 0 < K < J / 4.

6. The self-testing method for abnormal operating status of millimeter-wave / terahertz security inspection equipment according to claim 1, characterized in that: If the detection image determined to be abnormal in step S200 is observed, and it is determined that there is a problem with the image data in column U of the abnormal detection image, then the C×U / N' channel of the sampler of the millimeter-wave / terahertz security inspection equipment is abnormal, where C is the number of samplers of the millimeter-wave / terahertz security inspection equipment.

7. The self-testing method for abnormal working state of millimeter-wave / terahertz security inspection equipment according to claim 2, characterized in that: The value of X ranges from 1 hour to 5 hours.

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