A method for automatic identification and verification of LCD driving waveform

Abstract

The present invention discloses a method for automatic identification and verification of LCD drive waveforms. The method includes four stages: Stage 1, the test machine initializes the extraction and production of the LCD parameter template: the test machine extracts and produces the LCD parameter template data based on the LCD output waveform characteristics. Stage 2, the ADC analog-to-digital conversion module quickly forms an LCD waveform information table: the test machine sends the duty cycle and SEG number in the LCD parameter template data to the ADC module operating parameters, uses the ADC module to collect all COM / SEG port waveforms through multiple channels, and quickly forms an LCD information table. Stage 3, the ADC analog-to-digital conversion module periodically updates the LCD information table: the ADC module continuously samples the LCD waveform to be tested, and when a certain amount of data is reached, the LCD information table is updated. Stage 4, the test machine parses the LCD information table and determines the correctness of the waveform: the ADC module feeds the information table back to the test machine, and the test machine parses the fed-back information table into a specific LCD waveform, compares it with the LCD parameter template data, and determines the correctness of the waveform.

Description

Technical Field

[0001] The present invention relates to the technical field of LCD segment code screens, in particular to a method for self-identification and verification of driving waveforms of LCD segment code screens. Background Art

[0002] Segment LCDs are monochrome passive liquid crystal displays. Each pixel in the display is driven by a voltage applied between two electrodes. This voltage must be AC ​​to prevent electrophoresis in the liquid crystal. Therefore, a specific drive waveform must be applied between the electrodes to avoid DC.

[0003] Identifying and verifying LCD drive waveforms is challenging in environments where the drive waveform changes frequently and duty cycles and biases vary. Without efficient self-identification methods, work efficiency is severely impacted. Furthermore, stress testing of LCD waveforms can require several days of monitoring. Without real-time waveform monitoring, completing stress testing of LCD waveforms is difficult. Summary of the Invention

[0004] The present invention provides a method for self-identification and verification of an LCD driving waveform, which is used for automatically identifying and verifying the LCD driving waveform and accelerating the efficiency of LCD driving waveform identification and verification.

[0005] The present invention provides a method for self-identification and verification of LCD driving waveforms, which is characterized by comprising four stages:

[0006] In stage 1, the test machine initializes the LCD parameter template extraction and production.

[0007] In stage 2, the ADC analog-to-digital conversion module quickly forms an LCD waveform information table.

[0008] In stage 3, the ADC analog-to-digital conversion module periodically updates the LCD information table.

[0009] In stage 4, the tester parses the LCD information table to determine the correctness of the waveform.

[0010] The test machine initialization LCD parameter template extraction and production described in Phase 1 is a set of parameter template data set according to the LCD waveform characteristics, including one or more of the frame rate, duty cycle, voltage bias, number of SEG ports, and maximum driving voltage. The parameter template is loaded into the LCD waveform generator to simulate the normal LCD waveform. The parameter template data is saved in the test machine Python script.

[0011] The ADC analog-to-digital conversion module described in stage 2 quickly generates an LCD waveform information table in the following format:

[0012]

[0013] Among them A xy , x is the xth time slot of the current frame, y is the port number of COM or SEG, so A xy is the voltage value of COM or SEG of port number y in odd frame x time slot; similarly, B xy It is the voltage value of COM or SEG of port number y in even frame x time slot.

[0014] m is the maximum number of time slots in the current frame, i.e., the duty cycle. n is the total number of COM and SEG ports. T is the timestamp of the current time slot.

[0015] The ADC module's conversion channels are connected sequentially, numbered, to COM1 through COMx and SEG1 through SEGx. The tester sends the duty cycle and SEG port number from the LCD parameter template data to the ADC module via the UART serial port, creating an LCD waveform information table of the corresponding scale. The tester then sequentially collects data from the LCD waveform generator, which forms the LCD waveform information table. If a single ADC module's channel count is insufficient to capture all LCD COM and SEG ports, multiple ADC modules can be connected. Each ADC module must be connected to all COM ports, and then to the SEG ports sequentially, numbered.

[0016] The ADC analog-to-digital conversion module described in Phase 3 periodically updates the LCD information table, requiring the ADC module to be compatible with the UART interface, communicate with the tester, and provide feedback on the LCD waveform information table. The method for updating the LCD information table is that the xth time slot of the odd frame is determined by the maximum value collected at the xth COM terminal, and the xth time slot of the even frame is determined by the minimum value collected at the xth COM terminal. The ADC module starts collecting data from the 1st time slot of the odd frame and ends at the mth time slot of the even frame. The collected data forms a new LCD information table. The new LCD information table is compared with the old information table. If there are changes in the information, the information table is updated; otherwise, the information table is not updated. If multiple ADC modules are required to collect LCD waveforms, the tester sends a synchronization instruction to each ADC module each time the LCD information table is updated, so that each ADC module collects the LCD waveform synchronously.

[0017] The tester's parsing of the LCD information table described in Phase 4 involves parsing the LCD information table fed back by the ADC module via the UART interface into the corresponding LCD waveform within a Python script. If multiple ADC modules are collecting LCD waveforms, the feedback also includes the ID of each ADC. The tester parses the LCD information table by comparing the voltage values ​​of all COM and SEG components within a time slot with the different bias voltages set by the tester in the LCD parameter template, following the LCD Type B drive waveform pattern. This determines the correctness of the LCD waveform within the time slot. The tester then compares and parses all time slots in odd and even frames. The difference in timestamps between adjacent time slots, ΔT, determines the time slot width. Dividing ΔT by the duty cycle yields the frame rate. Finally, the tester compares the initialization of the LCD parameter template to determine the correctness of the entire LCD waveform.

[0018] The present invention provides a method for automatically identifying and verifying LCD drive waveforms. The method collects LCD waveforms through an ADC to form an LCD waveform information table of a certain size. A Python script is used to parse the LCD waveform information fed back by the ADC module. The entire process is automatically identified and verified by the script, which can quickly identify LCD waveforms and realize real-time monitoring of LCD waveforms, thereby reducing error rates and improving work efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0019] Figure 1 A flow chart of a method for automatically identifying LCD drive waveforms provided in Example 1 of the present invention; DETAILED DESCRIPTION

[0020] The following will be combined with the accompanying drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the present invention.

[0021] Example 1

[0022] Embodiment 1 of the present invention provides a method for self-identification and verification of LCD driving waveforms, such as Figure 1 As shown, specifically:

[0023] Step 101: The test machine initializes the extraction and production of LCD parameter templates.

[0024] Step 102: The ADC analog-to-digital conversion module quickly forms an LCD waveform information table.

[0025] Step 103: The ADC analog-to-digital conversion module periodically updates the LCD information table.

[0026] Step 104: The tester parses the LCD information table to determine the correctness of the waveform.

[0027] The test machine initialization LCD parameter template extraction and production described in step 101 is a set of parameter template data set according to the LCD waveform characteristics, including one or more of the frame rate, duty cycle, voltage bias, number of SEG ports, and maximum driving voltage. The parameter template is downloaded to the LCD waveform generator to simulate the normal LCD waveform. The parameter template data is saved in the test machine Python script.

[0028] The ADC module rapidly generates the LCD waveform information table described in step 102 by sending the duty cycle and SEG port number from the LCD parameter template data to the ADC module via the UART serial port. This creates an LCD waveform information table of a corresponding size and then sequentially collects data from the LCD waveform generator. If a single ADC module does not have enough channels to capture all LCD COMs and SEGs, multiple ADC modules can be connected. Each ADC module must be connected to all COM ports, followed by the SEG ports, in sequence.

[0029] The ADC analog-to-digital conversion module periodically updates the LCD information table described in step 103. This requires the ADC module to communicate with the tester via a compatible UART interface and provide feedback on the LCD waveform information table. The ADC module collects data starting in the first time slot of an odd frame and ending in the mth time slot of an even frame. The collected data forms a new LCD information table. The new LCD information table is compared with the old one, and if there are any changes, the table is updated; otherwise, the table remains unchanged. If multiple ADC modules are required to collect LCD waveforms, the tester sends a synchronization command to each ADC module each time the LCD information table is updated, ensuring that each ADC module collects LCD waveforms synchronously.

[0030] The test machine described in step 104 parses the LCD information table to determine the correctness of the waveform. This is done by parsing the LCD information table fed back by the ADC module via the UART interface into the corresponding LCD waveform. If multiple ADC modules are jointly collecting LCD waveforms, the fed-back information must also include the ID of each ADC. The test machine parses the LCD information table by comparing the voltage values ​​of all COMs and SEGs in the same time slot with the different bias voltages set by the test machine in the LCD parameter template, following the LCD Type B drive waveform pattern. This determines the correctness of the LCD waveform within the time slot, and then compares and parses all time slots of odd and even frames. The time slot width is obtained by dividing the timestamp difference ΔT between adjacent time slots, and the frame rate can be obtained by dividing ΔT by the duty cycle. Finally, the waveform correctness of the entire LCD is determined by comparison with the initialized LCD parameter template.

Claims

1. A method for automatic identification and verification of LCD driving waveform, characterized in that: It consists of 4 stages: Phase 1: The test machine initializes the LCD parameter template extraction and production; In stage 2, the ADC analog-to-digital conversion module quickly forms an LCD waveform information table; In stage 3, the ADC module periodically updates the LCD waveform information table; In stage 4, the tester analyzes the LCD waveform information table to determine the correctness of the waveform; The test machine uses the Jlink interface to connect to the LCD waveform generator, and uses a Python script to send the LCD parameter template to the LCD waveform generator to simulate normal LCD waveforms and implement all types of Type B waveforms. The test machine uses the UART interface to connect to the ADC analog-to-digital conversion module, and uses a Python script to parse the LCD waveform information table fed back by the ADC analog-to-digital conversion module. The entire process is automatically identified and verified by the script to reduce the error rate.

2. The method according to claim 1, wherein The data of the LCD parameter template includes one or more of a frame rate, a duty cycle, a voltage bias, a number of SEG ports, and a maximum driving voltage.

3. The method according to claim 1, wherein The LCD waveform information table: Among them A xy , x is the xth time slot of the current frame, y is the port number of COM or SEG, so A xy is the voltage value of COM or SEG of port number y in odd frame x time slot; similarly, B xy It is the voltage value of COM or SEG of port number y in the even frame x time slot; m is the maximum number of time slots in the current frame, i.e., the duty cycle; n is the total number of COM and SEG ports; T is the timestamp of the current time slot.

4. The method according to claim 1, wherein The ADC analog-to-digital conversion module periodically updates the LCD information table, which means that the odd frame x time slot is determined by the maximum value collected by the xth COM terminal, and the even frame x time slot is determined by the minimum value collected by the xth COM terminal; The ADC module starts collecting data from the 1st time slot of the odd frame to the mth time slot of the even frame. The collected data forms a new LCD information table. The new LCD information table is compared with the old information table. If there is a change in the waveform data information, the information table is updated; otherwise, the information table is not updated.

5. The method according to claim 1, wherein The test machine analyzes the LCD waveform information table by comparing the voltage values ​​of all COMs and SEGs in the same time slot with the different bias voltages set by the test machine in the LCD parameter template according to the LCD Type B driving waveform rules, determining the correctness of the LCD waveform in the time slot, and then comparing and analyzing all time slots of odd frames and even frames; the time slot width is obtained by the difference ΔT in the timestamps of adjacent time slots, and the frame rate can be obtained by dividing ΔT by the duty cycle; finally, the waveform correctness of the entire LCD is determined by comparing with the initialized LCD parameter template.

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