A parallel anti-inrush diode fault detection system and method

Abstract

The embodiment of the application discloses a parallel anti-backflow diode fault detection system and method, the fault detection system comprises a channel control circuit, a sampling resistor, a signal processing module and a sampling processing module, wherein the channel control circuit is arranged between the to-be-tested element and the sampling resistor, and is used for switching a test mode; the sampling resistor is arranged in parallel with the channel control circuit, and is used for realizing signal collection of a leakage current of the to-be-tested element; the signal processing module is used for collecting a voltage signal at two ends of the sampling resistor, and performing limit protection, impedance matching and in-phase amplification processing on the voltage signal; and the sampling processing module is used for receiving a signal output by the signal processing module, and performing fault detection judgment on the to-be-tested element according to the signal.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of fault detection, in particular to a parallel anti-inrush diode fault detection system and method. BACKGROUND

[0002] In order to improve the reliability of the device, the power supply is often used to supply power to a load, so the anti-inrush diode is widely used in various industries to protect the DC power supply of the device. After the anti-inrush diode is connected in series at the output end of the power supply, the unidirectional conductivity of the diode can effectively prevent other higher voltage power supplies from being anti-inrush, and can avoid the influence of power supply short circuit fault on other power supplies. If the current output by the power supply is large, in order to reduce the heating power caused by the voltage drop of the diode and the current flowing through a single diode, a plurality of diodes in parallel are usually used to improve the reliability of power supply. The existing detection of anti-inrush diode failure mainly focuses on the device selection before installation, and the test after installation only detects the function or performance, which can only qualitatively detect the fault condition of the plurality of parallel diodes in the product. If a single diode fails due to some reason or its performance decreases seriously, the existing detection method cannot identify it, but in the case of passing through a large current for a long time, it will reduce the reliability of the anti-inrush diode.

[0003] In the application field of high reliability requirement such as aircraft power supply system, the reliability of power supply during work needs to be ensured, so the working state of parallel anti-inrush diode needs to be detected during the factory inspection of the device to identify the fault of parallel diode.

[0004] The parallel anti-inrush diode fault detection system and method of the present application can achieve the above-mentioned purpose, and can detect the fault of parallel anti-inrush diode before the device is shipped. SUMMARY

[0005] The present application aims to provide a parallel anti-inrush diode fault detection system and method to solve at least one of the defects of the prior art.

[0006] To this end, the present application provides a parallel anti-inrush diode fault detection system, which comprises

[0007] The channel control circuit, the sampling resistor, the signal processing module and the sampling processing module, wherein

[0008] The channel control circuit is arranged between the to-be-tested element and the sampling resistor, and is used for switching the test mode;

[0009] The sampling resistor is arranged in parallel with the channel control circuit, and is used for realizing signal collection of the leakage current of the to-be-tested element.

[0010] The signal processing module is configured to collect a voltage signal across the sampling resistor and perform limit protection, impedance matching and in-phase amplification on the voltage signal.

[0011] The sampling processing module is configured to receive the signal output by the signal processing module and perform fault detection and judgment on the to-be-tested element based on the signal.

[0012] Optionally, the first end of the channel control circuit is connected to the anode of the to-be-tested element, the second end of the channel control circuit is connected to the cathode of the to-be-tested element, and the third end and the fourth end of the channel control circuit are respectively connected to the two ends of the sampling resistor.

[0013] The input end of the signal processing module is connected to the third end of the channel control circuit, and the output end of the signal processing module is connected to the sampling processing module.

[0014] Optionally, the signal processing module comprises a voltage stabilizing diode, an operational amplifier, a first resistor, a second resistor, a third resistor and a fourth resistor, wherein

[0015] The anode of the voltage stabilizing diode is connected to the first end of the sampling resistor, and the cathode of the voltage stabilizing diode is grounded.

[0016] The positive input end of the operational amplifier is connected to the first end of the sampling resistor through the second resistor, the negative input end of the operational amplifier is grounded through the first resistor, the negative input end of the operational amplifier is connected to the output end of the operational amplifier through the third resistor, and the output end of the operational amplifier is connected to the input end of the sampling processing module through the fourth resistor.

[0017] Optionally, the sampling processing module performs digital filtering on the voltage signal output by the signal processing module after receiving the voltage signal.

[0018] Optionally, the fault detection system further comprises an other function test module and a test power supply, wherein

[0019] The other function test module is connected to the to-be-tested element through the channel control circuit.

[0020] The test power supply is configured to provide power required for detection, and the test power supply is connected to the cathode of the to-be-tested element through the channel control circuit.

[0021] The channel control circuit comprises a first switch, a second switch, a third switch, a fourth switch and a fifth switch, wherein

[0022] One end of the first switch is connected to the anode of the to-be-tested element, and the other end of the first switch is connected to the first end of the other function test module.

[0023] One end of the second switch is connected with the cathode of the to-be-tested element, and the other end is connected with the second end of the other functional test module;

[0024] One end of the third switch is connected with the anode of the to-be-tested element, and the other end is connected with the cathode of the to-be-tested element through the fourth switch;

[0025] One end of the fifth switch is connected with the anode of the to-be-tested element, and the other end is connected with one end of the sampling resistor.

[0026] Another aspect of the present application provides a parallel anti-backflow diode fault detection method, and the steps of the method comprise

[0027] S101: switching the switch state of the channel control circuit to start fault detection;

[0028] S102: the signal processing module receives the voltage signal collected by the sampling resistor for limit protection, impedance matching and in-phase amplification processing;

[0029] S103: the sampling processing module receives the signal output by the signal processing module and judges the fault of the to-be-tested element according to the signal.

[0030] Optionally, the S101 comprises

[0031] The first switch, the second switch and the third switch of the channel control circuit are turned off, the fourth switch and the fifth switch are turned on, so that the to-be-tested element is disconnected with the other functional test module of the test equipment, the positive electrode of the test power supply is connected with the cathode of the to-be-tested element, and the sampling resistor measures the leakage current of the to-be-tested element.

[0032] Optionally, the step S103 comprises

[0033] S1031: the sampling processing module receives the signal to obtain the voltage value V collected by the sampling resistor R , and judges whether the voltage value V R is greater than or equal to the short-circuit threshold voltage V max .

[0034] If the judgment result is no, the to-be-tested element does not have a short-circuit fault, and the step S1032 is jumped to;

[0035] If the judgment result is yes, it indicates that the to-be-tested element has a short-circuit fault, and the judgment process is ended;

[0036] S1032: whether the voltage value V R is less than the open-circuit threshold voltage V min .

[0037] If the judgment result is yes, it indicates that there is an open circuit fault in the to-be-tested element, and the judgment process ends.

[0038] If the judgment result is no, it indicates that there is no open circuit fault in the to-be-tested element.

[0039] Optionally, the fault detection method further comprises:

[0040] detecting other functions of the to-be-tested element by other detection modules.

[0041] The beneficial effects of the present application are as follows:

[0042] The parallel anti-backflow diode fault detection system provided by the present application can simultaneously identify short circuit and open circuit faults of the to-be-tested element, accurately identify the fault mode of the diode, and ensure the reliability of the system. BRIEF DESCRIPTION OF DRAWINGS

[0043] The specific embodiments of the present application will be further described in detail below with reference to the accompanying drawings.

[0044] Figure 1 Fig. 1 shows a structure schematic diagram of a parallel anti-backflow diode fault detection system provided by one embodiment of the present application.

[0045] Figure 2 Fig. 2 shows a flow chart of a parallel anti-backflow diode fault detection method provided by another embodiment of the present application. DETAILED DESCRIPTION

[0046] In order to more clearly illustrate the present application, the present application will be further described below with reference to the embodiments and the accompanying drawings. Similar components are denoted by the same reference numerals in the drawings. Those skilled in the art should understand that the specific descriptions below are illustrative rather than limiting, and should not limit the protection scope of the present application.

[0047] In the description of this invention, relational terms such as "first" and "second" are used merely to distinguish one entity or operation from another, without necessarily requiring or implying any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0048] Existing methods for detecting the failure of parallel anti-reverse-current diodes mainly focus on component screening before installation. Post-installation testing typically only performs functional or performance checks, providing only a qualitative assessment of the overall fault status of multiple parallel diodes. If a single diode experiences an open circuit or significant performance degradation for any reason, existing testing methods struggle to identify it. Furthermore, prolonged exposure to high currents can drastically reduce the reliability of the anti-reverse-current diodes. To improve system reliability, a testing method for parallel anti-reverse-current diodes is needed. This method should allow for quantitative testing of the electrical performance of the parallel anti-reverse-current diodes, both after installation and before factory inspection, eliminating potential problems before the equipment leaves the factory.

[0049] One embodiment of the present invention provides a parallel anti-reverse-feedback diode fault detection system, such as... Figure 1 As shown, the fault detection system includes a channel control circuit 101, a sampling resistor 102, a signal processing module 103, and a sampling processing module 104, wherein...

[0050] The channel control circuit 101 is disposed between the component under test and the sampling resistor 102, and is used to switch the test mode;

[0051] The sampling resistor 102 is connected in parallel with the channel control circuit 101 to acquire the current signal of the component under test;

[0052] The signal processing module 103 is used to collect the voltage signal across the sampling resistor 102 and perform limit protection, impedance matching and in-phase amplification on it.

[0053] The sampling processing module 104 is used to receive the processed voltage signal output by the signal processing module 103 and to perform fault detection and judgment on the component under test based on it.

[0054] This embodiment, by setting up a channel control circuit, a sampling resistor, an information processing module, and a sampling processing module connected to the device under test, can simultaneously identify short-circuit and open-circuit faults in the device under test, accurately identify the fault modes of diodes, and ensure the reliability of the system.

[0055] In one possible implementation, the first terminal of the channel control circuit is connected to the anode of the device under test, the second terminal is connected to the cathode of the device under test, and the third and fourth terminals are respectively connected to the two ends of the sampling resistor.

[0056] The input terminal of the signal processing module is connected to the third terminal of the channel control circuit, and the output terminal is connected to the sampling processing module.

[0057] In one possible implementation, the signal processing module includes a Zener diode V1, an operational amplifier U1, a first resistor R1, a second resistor R2, a third resistor R3, and a fourth resistor R4, wherein...

[0058] The positive terminal of the Zener diode V1 is connected to the first end of the sampling resistor RL, and its negative terminal is grounded.

[0059] The positive input terminal of the operational amplifier U1 is connected to the first terminal of the sampling resistor RL through the second resistor R2, and its negative input terminal is grounded through the first resistor R1. At the same time, its negative input terminal is connected to the output terminal of the operational amplifier U1 through the third resistor R3, and its output terminal is connected to the input terminal of the sampling processing module 104 through the fourth resistor R4.

[0060] In one possible implementation, the sampling processing module performs digital filtering on the voltage signal output by the signal processing module after receiving it.

[0061] In one specific embodiment, the fault detection system further includes other functional testing modules 106 and a test power supply 105, wherein,

[0062] The other functional test module 106 is connected to the component under test through the channel control circuit 101;

[0063] The test power supply 105 is used to provide the power required for testing, and it is connected to the cathode of the device under test through the channel control circuit 101.

[0064] In this embodiment, the detection of parallel anti-reverse-current diodes can be integrated into a dedicated testing device. The test mode can be switched by controlling the switch. The parallel anti-reverse-current diode test and other functional tests on the device under test do not interfere with each other, and the test power supply is reused, reducing hardware costs.

[0065] In one specific embodiment, the channel control circuit 101 includes a first switch, a second switch, a third switch, a fourth switch, and a fifth switch, wherein,

[0066] One end of the first switch is connected to the anode of the component under test, and the other end is connected to the first end of the other functional test module;

[0067] One end of the second switch is connected to the cathode of the component under test, and the other end is connected to the second end of the other functional test module;

[0068] One end of the third switch is connected to the anode of the device under test, and the other end is connected to the cathode of the device under test via the fourth switch;

[0069] One end of the fifth switch is connected to the anode of the element under test, and the other end is connected to one end of the sampling resistor.

[0070] In one specific embodiment, the device under test is a parallel anti-reverse-current diode under test.

[0071] It should be noted that when the first, second, and third switches of the channel control circuit 101 are open, and the fourth and fifth switches are closed, the test mode is a short-circuit open-circuit test, so that the two sides of the component under test are disconnected from other functional test modules of the test equipment, the positive terminal of the test power supply is connected to the cathode of the component under test, and the sampling resistor measures the leakage current of the component under test; when the first, second, and third switches of the channel control circuit are closed, and the fourth and fifth switches are open, the test mode is other functional tests.

[0072] The parallel anti-reverse current diode fault detection system provided by this invention determines whether multiple parallel anti-reverse current diodes have short-circuit or open-circuit fault modes based on the characteristic that the electrical performance difference of leakage current of diodes in the same batch is extremely small. The fault detection system can be integrated into the dedicated test equipment of the device under test, and the hardware cost of the detection system can be reduced by reusing the power supply.

[0073] One embodiment of the present invention provides a method for detecting faults in parallel anti-reverse-feeding diodes, such as... Figure 2 As shown, the method steps include

[0074] S101: Switch the switching state of the channel control circuit to enable fault detection;

[0075] S102: The signal processing module receives the voltage signal collected by the sampling resistor and performs limit protection, impedance matching and in-phase amplification processing.

[0076] S103: The sampling and processing module receives the signal output by the signal processing module and performs fault detection and judgment on the component under test based on it.

[0077] In one specific embodiment, the device under test is a parallel anti-reverse-current diode.

[0078] In one possible implementation, S101 includes

[0079] The first, second, and third switches of the channel control circuit are opened, and the fourth and fifth switches are closed, so that the two sides of the device under test are disconnected from other functional test modules of the test equipment. The positive terminal of the test power supply is connected to the cathode of the device under test, and the sampling resistor measures the leakage current of the device under test.

[0080] In one possible implementation, step S103 includes

[0081] S1031: The sampling processing module receives the signal to obtain the voltage value V collected by the sampling resistor. R Determine the voltage value V R Is it greater than or equal to the short-circuit threshold voltage V? max ,

[0082] If the judgment result is negative, then there is no short-circuit fault in the parallel anti-reverse-feed diodes, and the process jumps to step S1032.

[0083] If the judgment result is yes, it means that there is a short-circuit fault in the parallel anti-reverse-feeding diode, and the judgment process ends.

[0084] S1032: Determine the voltage value V R Is it less than the circuit breaker threshold voltage V? min ,

[0085] If the judgment result is yes, it means that there is a diode with an open circuit fault in the parallel anti-reverse-feeding diodes, and the judgment process ends.

[0086] If the judgment result is negative, it means that there is no open-circuit fault in the parallel anti-reverse-feed diodes.

[0087] In one possible implementation, the fault detection method further includes:

[0088] Other functions of the component under test are tested using other testing modules.

[0089] Obviously, the above embodiments of the present invention are merely examples for clearly illustrating the present invention, and are not intended to limit the implementation of the present invention. For those skilled in the art, other variations or modifications can be made based on the above description. It is impossible to exhaustively list all the implementation methods here. All obvious variations or modifications derived from the technical solutions of the present invention are still within the protection scope of the present invention.

Claims

1. A parallel anti-reverse-feedback diode fault detection system, characterized in that, include The circuit includes a channel control circuit, a sampling resistor, a signal processing module, and a sampling processing module. The channel control circuit is located between the component under test and the sampling resistor, and is used to switch the test mode; The sampling resistor is connected in parallel with the channel control circuit to acquire the leakage current signal of the component under test. The signal processing module is used to acquire the voltage signal across the sampling resistor and perform limit protection, impedance matching, and in-phase amplification on it. The sampling and processing module is used to receive the signal output by the signal processing module and perform fault detection and judgment on the component under test based on it. Also includes Other functional test modules and test power supplies, among which... The other functional test modules are connected to the component under test through the channel control circuit; The test power supply is used to provide the power required for testing, and it is connected to the cathode of the device under test through a channel control circuit; The channel control circuit includes a first switch, a second switch, a third switch, a fourth switch, and a fifth switch, wherein... One end of the first switch is connected to the anode of the component under test, and the other end is connected to the first end of the other functional test module; One end of the second switch is connected to the cathode of the component under test, and the other end is connected to the second end of the other functional test module; One end of the third switch is connected to the anode of the device under test, and the other end is connected to the cathode of the device under test via the fourth switch; One end of the fifth switch is connected to the anode of the element under test, and the other end is connected to one end of the sampling resistor.

2. The fault detection system according to claim 1, characterized in that, The first terminal of the channel control circuit is connected to the anode of the device under test, the second terminal is connected to the cathode of the device under test, and the third and fourth terminals are respectively connected to the two ends of the sampling resistor. The input terminal of the signal processing module is connected to the third terminal of the channel control circuit, and the output terminal is connected to the sampling processing module.

3. The fault detection system according to claim 1, characterized in that, The signal processing module includes a Zener diode, an operational amplifier, a first resistor, a second resistor, a third resistor, and a fourth resistor, wherein... The positive terminal of the Zener diode is connected to the first end of the sampling resistor, and its negative terminal is grounded. The positive input terminal of the operational amplifier is connected to the first terminal of the sampling resistor through the second resistor, its negative input terminal is grounded through the first resistor, its negative input terminal is connected to the output terminal of the operational amplifier through the third resistor, and its output terminal is connected to the input terminal of the sampling processing module through the fourth resistor.

4. The fault detection system according to claim 1, characterized in that, After receiving the voltage signal output by the signal processing module, the sampling processing module performs digital filtering on it.

5. A fault detection method for a parallel anti-reverse-current diode in a system as described in any one of claims 1 to 4, characterized in that, The steps of the method include S101: Switch the switching state of the channel control circuit to enable fault detection; S102: The signal processing module receives the voltage signal collected by the sampling resistor and performs limit protection, impedance matching and in-phase amplification processing. S103: The sampling and processing module receives the signal output by the signal processing module and uses it to perform fault detection and judgment of the component under test.

6. The fault detection method according to claim 5, characterized in that, S101 includes The first, second, and third switches of the channel control circuit are opened, and the fourth and fifth switches are closed, so that the two sides of the device under test are disconnected from other functional test modules of the test equipment. The positive terminal of the test power supply is connected to the cathode of the device under test, and the sampling resistor measures the leakage current of the device under test.

7. The fault detection method according to claim 5, characterized in that, Step S103 includes S1031: The sampling processing module receives the signal to obtain the voltage value V collected by the sampling resistor. R Determine the voltage value V R Is it greater than or equal to the short-circuit threshold voltage V? max , If the judgment result is negative, then the component under test does not have a short circuit fault, and the process jumps to step S1032; If the judgment result is yes, it indicates that there is a short circuit fault in the component under test, and the judgment process ends; S1032: Determine the voltage value V R Is it less than the circuit breaker threshold voltage V? min , If the judgment result is yes, it indicates that there is an open circuit fault in the component under test, and the judgment process ends. If the result is negative, it means that there is no open circuit fault in the component under test.

8. The fault detection method according to claim 5, characterized in that, Also includes Other functions of the component under test are tested using other testing modules.

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