Method for detecting deep concealed ore deposit by using picometer particle

Abstract

The present application relates to the technical field of geological exploration, and discloses a method for detecting deep concealed ore deposit by using pico-meter particles. The method comprises the following steps: capturing pico-meter particles from a surface medium sample of a to-be-detected area, obtaining the ultra-microstructure and chemical composition of the pico-meter particles by using an ultra-microscopic analysis technology, judging whether the to-be-detected area has a concealed ore body by summarizing and arranging the obtained data, and further detecting the material composition of the deep concealed ore deposit according to the component and structure information carried by the pico-meter particles. The analysis of the ultra-microstructure and chemical composition of the pico-meter particles can effectively obtain information of a deeper concealed ore body, which is of great significance for detecting an ultra-deep concealed ore body. The present application uses an ultra-microscopic analysis technology to analyze the pico-meter particles, and the obtained information of the deep ore body is more sensitive, more comprehensive, more intuitive, and more conducive to the prediction of the material composition of the deep concealed ore body.

Description

Technical Field

[0001] This invention relates to the technical field of geological exploration, and more specifically, to a method for detecting deep, concealed mineral deposits using picometer particles. Background Technology

[0002] Currently, the main prospecting methods used for exploring concealed ore bodies are geophysical exploration and geochemical exploration. Geophysical methods detect concealed ore bodies through physical anomalies, requiring high instrument precision, covering a wide exploration area, involving a large workload, and incurring high costs, and cannot accurately obtain mineralization anomaly information. Geochemical methods mainly detect concealed ore bodies through high element content or isotope ratios, such as geothermal measurements, but are easily affected by other factors.

[0003] Existing technologies disclose nanoparticle mineral exploration techniques, such as a water microparticle geochemical mineral exploration method and its application, a method for finding concealed mineral deposits by utilizing ultramicroscopic anomalies caused by microparticles within biological tissues, and a method for preparing liquid nanoparticle samples for transmission electron microscopy analysis. The above-mentioned existing technologies have the following technical defects: the nanoparticles used are relatively large in size and cannot penetrate thicker overburden layers, so nanoparticles cannot be used to detect deeper concealed mineral bodies. Summary of the Invention

[0004] To overcome the aforementioned deficiencies in the prior art, this invention provides a method for detecting deep, concealed mineral deposits using picometer particles.

[0005] To solve the above-mentioned technical problems, the technical solution of the present invention is as follows:

[0006] A method for detecting deep, concealed mineral deposits using picometer particles includes the following steps:

[0007] Pitot particles are captured from surface media samples in the test area. The ultrastructure and chemical composition of the picot particles are obtained through ultramicroscopic analysis. The data obtained from the analysis are summarized and organized to determine whether there are concealed ore bodies in the test area. Based on the composition and structural information carried by the picot particles, the existence, material composition and type of deep concealed ore deposits are further explored.

[0008] Preferably, the method includes the following steps:

[0009] Select the area to be tested, collect surface medium samples from the area, capture picometer particles from the samples to make test samples, use ultramicroscopic analysis technology to test the picometer particles in the samples, summarize and organize the ultramicrostructure and chemical composition information of the detected picometer particles, and use this information to detect deep concealed mineral deposits and obtain mineral deposit information.

[0010] This invention innovatively analyzes the ultrastructure and chemical composition of picometer particles to obtain the types and combinations of atoms or ions that make up the picometer particles, summarizes the frequency of occurrence of the obtained chemical components and the combination rules of various elements, determines whether there are deep-seated hidden mineral deposits in the area to be tested, and at the same time determines the material composition and deposit type of the deep-seated hidden mineral bodies.

[0011] This invention innovatively uses picometer particles, which are smaller in size than nanoparticles and have better penetration and migration capabilities, making them more suitable for detecting deeper, concealed mineral bodies. Preferably, the picometer particles are particles with a size of 1 pm to 990 pm, and the ratio of the number of surface atoms to the total number of atoms is less than or equal to 1; they include single atoms or ions, a group of atoms, or a group of ions.

[0012] Preferably, the method for capturing picometer particles involves attaching the picometer particles to a metal or non-metal transmission electron microscope grid with an ultrathin support film.

[0013] Since picometer particles exist in different forms in different media, and different instruments have different sample requirements, this invention innovatively provides a method for capturing picometer particles and preparing test samples through different steps, depending on the specific medium and the instrument used. More preferably, the method for capturing picometer particles from surface medium samples to prepare test samples includes the following steps:

[0014] Pitot-sized particles are captured using a metal or non-metal transmission electron microscope grid with an ultrathin support film to prepare transmission electron microscope samples. The smallest particles are screened out to prepare powder samples, and plant and animal samples are fixed and embedded to prepare ultrathin section electron microscope samples.

[0015] More preferably, the method for capturing picometer particles in a water sample and preparing it into a transmission electron microscopy sample includes the following steps:

[0016] Place the electron microscope screen with an ultrathin support film at an angle. Aspirate the water sample into a pipette rinsed with ultrapure water and drop it onto the screen in small amounts, allowing the sample to flow down the surface of the ultrathin support film until it is just saturated. Do not drop too much sample. Allow it to air dry naturally before adding more samples. Repeat this process 3-5 times to obtain the aberration-corrected transmission electron microscope (TEM) sample. Place the screen with the adsorbed particles in a sample holder and store it in a desiccator in the dark until testing is complete, ensuring the sample remains uncontaminated during preparation.

[0017] More preferably, the method for capturing picometer particles in a water sample and preparing it into a transmission electron microscopy sample includes the following steps:

[0018] After rinsing the container with ultrapure water, pour the water sample into the container. Use tweezers to hold the edge of the electron microscope screen with the ultrathin support film attached, being careful not to pinch the middle of the ultrathin support film to avoid damaging it. The movement time should not be too long; allow the electron microscope screen to move slowly in the water sample for 5-30 minutes to obtain the transmission electron microscope sample. Seal and store the electron microscope screen with adsorbed particles in a light-proof container until it is ready for instrumental testing.

[0019] More preferably, the method for capturing picometer particles in soil solids and preparing them into transmission electron microscopy samples includes the following steps:

[0020] After drying the sample in an oven at 80°C for 48 hours, it is screened through an 80-mesh sieve. The screened sample is then placed in a beaker, and an electron microscope screen with an ultrathin support film is suspended in the beaker. The sample is then blown up with a syringe to allow the small particles to rise and settle freely onto the screen. This process is repeated more than 10 times to prepare a spherical aberration transmission electron microscope sample, ensuring that the sample is not contaminated during the preparation process.

[0021] More preferably, the method for capturing picometer particles from plant and animal samples and preparing them into transmission electron microscopy samples includes the following steps:

[0022] First, the collected plant and animal samples were fixed and embedded using the conventional biological transmission electron microscopy procedure, and then ultrathin sections were prepared. Finally, the sections were retrieved using an electron microscope screen with an ultrathin support film to prepare spherical aberration transmission electron microscopy samples.

[0023] When conducting chemical analysis experiments, the test results can be affected by the screen substrate, so a suitable screen substrate should be selected based on the element of interest. Preferably, the electron microscope screen substrate includes single-layer graphene film, double-layer graphene film, multilayer graphene film, ultrathin carbon film, silicon nitride film, and microgrid.

[0024] This invention uses an electron microscope grid with an ultrathin support film to prepare transmission electron microscope (TEM) samples. The ultra-thin support film used in this invention is thin, has good crystallinity and strong adsorption force, easily adsorbs picometer particles, and has little impact on the characterization of picometer particles during testing. When using instruments such as aberration-corrected transmission electron microscopes to characterize picometer particles, the imaging effect is good, and the morphology of picometer particles and the atomic-level ultramicrostructure can be clearly observed.

[0025] This invention innovatively uses ultrathin carbon films, which have strong adsorption capacity and can better adsorb picometer particles in the sample. At the same time, it improves the sample preparation time, so that picometer particles can be better imaged under spherical aberration electron microscopy.

[0026] Preferably, the ultramicroscopic analysis technology includes ultramicroscopic characterization analysis technology and ultramicroscopic chemical composition analysis technology.

[0027] Preferably, the ultramicroscopic characterization and analysis techniques include one or more of the following: spherical aberration-corrected transmission electron microscope, double spherical aberration-corrected transmission electron microscope, field emission electron microscope, and atomic force microscope.

[0028] This invention uses a double aberration-corrected transmission electron microscope to observe the ultrastructure of picometer particles, and to capture the morphology and electron diffraction patterns of picometer particles; using an atomic force transmission electron microscope, it is possible to observe the process of atoms or ions combining into picometer particles, and the process of atoms or ions changing from random combination to regular arrangement.

[0029] Preferably, the ultramicroscopic chemical composition analysis techniques include electron energy loss spectroscopy (EELS) and energy dispersive spectroscopy (EDS).

[0030] The distribution map of selected chemical elements in picometer particles can be obtained by electron energy loss spectroscopy and energy dispersive spectroscopy, and their chemical composition can be quantitatively analyzed by electron energy loss spectroscopy.

[0031] This invention uses aberration-corrected transmission electron microscopy combined with electron energy loss spectroscopy, which can perform morphological analysis of picometer particles with high resolution and good imaging effect, and can observe atomic-level images of picometer particles; at the same time, using electron energy loss spectroscopy, it can not only achieve atomic-level composition analysis, but also perform quantitative analysis of the composition.

[0032] Preferably, the ultrastructure of the picometer particles includes the size and shape of the picometer particles, the arrangement and bonding of the same type of atoms or ions in the picometer particles, the arrangement and bonding of different types of atoms or ions, and the aggregation relationship between the picometer particles.

[0033] Preferably, the chemical composition of the picometer particles includes the elemental composition, the combination method, and the content ratio of the constituent elements.

[0034] Preferably, the area to be tested has no exposed ore bodies on the surface and no pollution from artificial mining;

[0035] Preferably, the surface medium samples of the area to be tested include groundwater, surface water, soil solids, soil gases, animals, plants, and fault gouge.

[0036] Compared with the prior art, the beneficial effects of the technical solution of the present invention are:

[0037] This invention applies picometer particles to mineral exploration technology. The method we use can directly capture atomic-level particles that exist in nature and are related to concealed ore bodies, and use instruments to characterize and detect them. This technology represents a qualitative leap in mineral exploration and even in the field of geology.

[0038] This invention provides a method for detecting deep concealed mineral deposits using picometer particles. By capturing picometer particles generated within deep ore bodies, these particles carry information about the deep ore bodies, migrate through the overburden layer to the surface, and distribute throughout various surface media. Ultrastructural and chemical composition analysis of these picometer particles can effectively obtain information about deeper concealed ore bodies, which is of great significance for detecting ultra-deep concealed ore bodies.

[0039] This invention utilizes an electron microscope grid with an ultrathin support film to capture picometer particles and prepare transmission electron microscopy (TEM) samples. This method effectively avoids the influence of thicker carbon films used in previous methods on characterization and imaging. Furthermore, the ultrathin support film used has strong adsorption capacity, which is more conducive to the acquisition of picometer particles.

[0040] This invention uses ultra-micro analysis technology to analyze picometer particles, obtaining more sensitive, comprehensive and intuitive geochemical information about deep ore bodies, which is more conducive to predicting the material composition of deep concealed ore bodies. Attached Figure Description

[0041] Figure 1 The image shown is a HADDAF image taken using a spherical aberration electron microscope in Example 1.

[0042] Figure 2 The component spectrum was obtained by EELS line scanning in Example 1. Detailed Implementation

[0043] To make the objectives, technical solutions, and advantages of this invention clearer, the technical solutions in the embodiments of this invention are described clearly and completely below. Obviously, the described embodiments are only some, not all, of the embodiments of this invention. All other embodiments obtained by those skilled in the art based on the embodiments of this invention without creative effort are within the scope of protection of this invention. The raw materials used in the following embodiments and comparative examples are all commercially available.

[0044] A method for detecting deep, concealed mineral deposits using picometer particles includes the following steps:

[0045] 1. Select areas with no exposed ore bodies and no artificial mining pollution as the inspection area, and collect surface medium samples, such as groundwater, soil gas, and plant and animal samples, at appropriate times.

[0046] 2. Using an electron microscope grid with an ultrathin support film, picometer particles in the sample are captured to prepare a transmission electron microscope sample, which is then dried and stored in the dark. Picometer particles are captured using a grid; depending on the sample medium, different steps are taken to adsorb the picometer particles onto the grid. This invention uses picometer particles in an aqueous medium as an example.

[0047] Steps for capturing picometer particles in an aqueous medium:

[0048] Method 1: After rinsing the container with ultrapure water, pour the water sample into the container. Use tweezers to hold the edge of the electron microscope screen with the ultrathin support film attached, being careful not to pinch the middle of the ultrathin support film to avoid damaging it. The movement time should not be too long. Allow the electron microscope screen to move slowly in the water sample for 5-30 minutes to obtain the transmission electron microscope sample. Seal and store the electron microscope screen with adsorbed particles in a light-proof container until it is ready for instrumental testing.

[0049] Method 2:

[0050] Place the electron microscope screen with an ultrathin support film at an angle. Aspirate the water sample into a pipette rinsed with ultrapure water and drop it onto the screen in small amounts, allowing the sample to flow down the surface of the ultrathin support film until it is just saturated. Do not drop too much sample. Allow it to air dry naturally before adding more samples. Repeat this process 3-5 times to obtain the aberration-corrected transmission electron microscope (TEM) sample. Place the screen with the adsorbed particles in a sample holder and store it in a desiccator in the dark until testing is complete, ensuring the sample remains uncontaminated during preparation.

[0051] Capturing picometer particles in soil solids includes the following steps:

[0052] After drying the sample in an oven at 80°C for 48 hours, it is screened through an 80-mesh sieve. The screened sample is then placed in a beaker, and an electron microscope screen with an ultra-thin support film is suspended in the beaker. The sample is then blown up with a rubber bulb to allow the small particles to rise and settle freely onto the screen. This process is repeated more than 10 times to prepare a transmission electron microscope sample, ensuring that the sample is not contaminated during the preparation process.

[0053] Capturing picometer particles in animal and plant tissue cells includes the following steps:

[0054] First, the collected plant and animal samples are fixed and embedded using the conventional biological transmission electron microscopy procedure, and then ultrathin sections are prepared. Finally, the sections are retrieved using an electron microscope screen with an ultrathin support film to prepare transmission electron microscopy samples.

[0055] Electron microscopy (EM) screens with ultrathin support films can be made of metallic or non-metallic materials. These ultrathin support films include single-layer graphene films, double-layer graphene films, and multilayer graphene films. During chemical analysis experiments, the test results can be affected by the screen, so a suitable screen should be selected based on the element of interest.

[0056] 3. The prepared transmission electron microscope samples were analyzed using a double aberration-corrected transmission electron microscope coupled with electron energy loss spectroscopy (EELS). The main observations included the atomic bonding and arrangement patterns of picometer particles, their size, shape, and distribution within the samples. Electron energy loss spectroscopy was used to detect the types of elements in the picometer particles, and the composition of the picometer particles was quantitatively analyzed.

[0057] 4. Integrate the obtained picometer particle characterization and chemical composition analysis data to determine the types of atoms that make up the picometer particles, the combination mode and arrangement rules of the same or different types of atoms, and determine the types of ore-forming elements by observing the combination forms of various atoms in the picometer particles, thereby obtaining information about the ore deposit.

[0058] Example 1

[0059] Collection and Analysis of Surface Medium Samples from the Shijiangshan Polymetallic Deposit in Inner Mongolia

[0060] 1. Selection of mining area and its geological background

[0061] The Shijiangshan polymetallic deposit in Guandi Town, Linxi County, Chifeng City, Inner Mongolia Autonomous Region was selected as the research object. The deposit is in the exploration stage. Sampling was conducted in areas where the ore body has been explored but not yet mined. The surface medium has not been contaminated by human activities, and the deposit is a concealed deposit, making it an ideal sampling point.

[0062] The sulfides in the Shijiangshan mining area of ​​Inner Mongolia include galena, sphalerite, arsenopyrite, chalcopyrite, and pyrite. Silver exists in two forms: lattice silver in galena and independent silver minerals in pyrite. The main ore-forming elements are Pb, Zn, Cu, Ag, Sb, and As.

[0063] 2. Sample Collection and Preparation of Transmission Electron Microscopy Samples

[0064] Samples of various surface media were collected from the study area. Groundwater samples were collected from the study area, and the water samples were sealed in polyethylene bottles washed with ultrapure water. Solid soil samples were collected, dried indoors for 72 hours, and then stored in sealed bags. Plant and animal samples were collected from the study area, and the collected samples were washed with ultrapure water. The tissues to be tested were cut with a clean knife and stored at low temperature in electron microscopy fixative.

[0065] Indoors, after rinsing the beaker with ultrapure water, about two-thirds of the groundwater sample was poured into the beaker. The edge of the copper mesh with a single-layer graphene film was held with tweezers, avoiding gripping the middle of the film to prevent damage. Due to the strong adsorption capacity of graphene, the movement time should not be too long; the mesh was allowed to move slowly in the water sample for about 10 minutes to obtain the transmission electron microscope (TEM) sample. The TEM sample with adsorbed particles was sealed, dried, and protected from light for later instrumental testing. Soil solids and plant / animal samples were prepared using a double-layer graphene mesh and an ultrathin carbon film mesh, respectively.

[0066] 3. Sample Analysis

[0067] A Titan Cubed Themis G2 300 aberration-corrected transmission electron microscope with an accelerating voltage of 300 kV was used to capture images in HADDAF mode, and EELS was used to detect the composition of picometer particles.

[0068] 4. Sample test results

[0069] Appendix Figure 1 These are picometer particles found in groundwater samples from Shijiangshan, Inner Mongolia. Figure 1 Image a is a HADDAF image taken using a spherical aberration electron microscope. The image shows a single picometer particle; the brighter atoms within the particle are metal atoms. The particle size is approximately 220 x 870 pm. The HADDAF image reveals an irregular atomic distribution within the picometer particle. Compositional spectra were obtained by performing an EELS line scan on the picometer particle. Figure 2 The L2 edge of the particle shows Zn with an energy of 1044 eV, indicating that the picometer contains Zn.

[0070] By capturing picometer particles from groundwater in the Shijiangshan polymetallic deposit in Inner Mongolia, morphological analysis using aberration-corrected transmission electron microscopy revealed that the captured picometer particles were formed by the aggregation of metallic elements. Compositional analysis of the particles identified Zn as the metallic element. Simultaneously, transmission electron microscopy analysis of picometer particles in soil solids and plant / animal tissue cells also detected picometer particles containing mineral-bearing elements. Therefore, picometer particles in the surface medium can reflect information about underground ore bodies to a certain extent, providing more accurate and intuitive information for the detection of medium-to-deep concealed ore bodies, and showing great application potential in the detection of medium-to-deep concealed ore bodies.

[0071] Comparative Example 1

[0072] The same groundwater samples were collected from an area within the same tectonic unit as the mining area in Example 1, but without any nearby geochemical or ore body anomalies. The picometer particles in the water medium were prepared using the aberration-transmission electron microscopy method of Example 1. The picometer particles were detected, and it was found that mineral-related elements such as Zn were not present in the background sample of this comparative example.

[0073] The embodiments of the present invention are not limited to the above embodiments. Any changes, modifications, substitutions, combinations, or simplifications made without departing from the spirit and principle of the present invention shall be considered equivalent substitutions and shall be included within the protection scope of the present invention.

Claims

1. A method for detecting deep, concealed mineral deposits using picometer particles, characterized in that, Includes the following steps: Pitot particles were captured from surface media samples in the test area. The ultrastructure and chemical composition of the picot particles were obtained through ultramicroscopic analysis. The data obtained from the analysis were summarized and organized to determine whether there were concealed ore bodies in the test area. Based on the composition and structural information carried by the picot particles, the composition and type of deep concealed ore deposits were further explored. The picometer particles are particles with a size of 1 pm to 990 pm, and the ratio of the number of surface atoms to the total number of atoms is less than or equal to 1; including single atoms or ions, groups of atoms or groups of ions; The method for capturing picometer particles involves attaching the picometer particles to a metal or non-metal transmission electron microscope grid with an ultrathin support film. The steps to capture picolinite particles in soil solids are as follows: After drying the sample in a drying oven at 80°C for 48 hours, the sample is sieved through an 80-mesh sieve. The sieved sample is placed in a beaker, and an electron microscope screen with an ultrathin support film is suspended in the beaker. The sample is blown up with a rubber bulb to make the small particles float up and settle freely and be adsorbed on the screen. This process is repeated more than 10 times to prepare a transmission electron microscope sample. The capture of picometer particles in plant and animal tissue cells includes the following steps: First, the collected plant and animal samples are fixed and embedded using a conventional biological transmission electron microscope (TEM) procedure, followed by ultrathin sectioning. Then, the sections are retrieved using an electron microscope screen with an ultrathin support membrane to prepare TEM samples. The electron microscope screen with the ultrathin support membrane is made of metallic or non-metallic material, and the ultrathin support membrane includes a single-layer graphene film and a multilayer graphene film; the multilayer graphene film includes a bilayer graphene film. The ultramicroscopic analysis technology includes ultramicroscopic characterization analysis technology and ultramicroscopic chemical composition analysis technology; The ultra-microscopic characterization and analysis techniques include one or more of the following: spherical aberration-corrected transmission electron microscopy, double spherical aberration-corrected transmission electron microscopy, field emission electron microscopy, and atomic force microscopy. The ultramicroscopic chemical composition analysis techniques include electron energy loss spectroscopy and energy dispersive spectroscopy. The ultrastructure of the picometer particles includes the size and shape of the picometer particles, the arrangement and bonding of the same type of atoms or ions in the picometer particles, the arrangement and bonding of different types of atoms or ions, and the aggregation relationship between the picometer particles. The chemical composition of the picometer particles includes the elemental composition, the combination method, and the content ratio of the constituent elements; The area to be tested has no exposed ore bodies and no artificial mining pollution; the surface medium samples of the area to be tested include groundwater, surface water, soil solids, soil gases, animals, plants and fault gouge.

2. The method for detecting deep concealed mineral deposits using picometer particles according to claim 1, characterized in that, The electron microscope grid includes an ultrathin carbon film, a silicon nitride film, and a microgrid; the ultrathin carbon film includes a single-layer graphene film and a multilayer graphene film; the multilayer graphene film includes a bilayer graphene film.

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