Striped tube field curvature measurement method and device, computer equipment and readable storage medium

Abstract

The application provides a streak tube field curvature measurement method and device, computer equipment and a readable storage medium, which are applied to a static test scene of a streak tube, and the static test scene of the streak tube comprises the streak tube and a flat fluorescent screen; the method comprises the following steps: adjusting a single experimental test image of an electron beam emitted by the streak tube on the flat fluorescent screen according to a preset focusing voltage; wherein the single experimental test image is an intensity curve of a beam spot formed on the flat fluorescent screen and obtained by an external CCD sensor; determining a modulation degree of the streak tube under the preset focusing voltage by the intensity curve in the single experimental test image; and calculating the field curvature of the streak tube according to the modulation degree. The method receives the electron beam emitted by the streak tube under the preset focusing voltage through the flat fluorescent screen, and calculates the field curvature corresponding to the electron beam emitted under the preset focusing voltage without replacing the flat fluorescent screen.

Description

Technical Field

[0001] This invention relates to the field of striped tube technology, and in particular to a method, apparatus, computer device, and readable storage medium for measuring the field curvature of striped tubes. Background Technology

[0002] One of the more popular research areas based on streak cameras in recent years is compressed sensing ultrafast imaging. These systems have very high frame rates in the visible light band, but their spatial resolution is very poor. A key image reconstruction step in these imaging systems is the use of compressed sensing algorithms. However, the use of compressed sensing algorithms requires the construction of a measurement matrix related to the imaging system coefficients. The constituent factors of the measurement matrix are necessarily related to the aberrations of the streak tube, and for wide-beam imaging devices like streak tubes, field curvature plays a major role in aberrations. Since streak tube design often uses numerical calculations to solve the Laplace equation, only special structures like concentric sphere systems have ideal analytical solutions. Therefore, for non-concentric sphere streak tube systems that cannot be analyzed analytically, aberration calculations can only use simple formulas. These aberration formulas require tracking the electron trajectory's landing point on the image plane, which means that the specific structure of the streak tube must be known. However, for streak tubes purchased from the commercial market, their internal components are generally unknown, making image correction using this set of aberration formulas impractical.

[0003] Therefore, there is currently a lack of an effective method for measuring the field curvature of striped tubes without replacing the fluorescent screen. Summary of the Invention

[0004] The purpose of this invention is to provide a method, apparatus, computer device, and readable storage medium for measuring the field curvature of a striped tube, so as to effectively measure the field curvature of the striped tube and generate an expression for the field curvature.

[0005] In a first aspect, embodiments of the present invention provide a method for measuring the field curvature of a striped tube, wherein the method is applied to a static testing scenario of the striped tube, the static testing scenario including the striped tube and a planar fluorescent screen; the method includes: adjusting a single experimental test pattern of the electron beam emitted by the striped tube on the planar fluorescent screen according to a preset focusing voltage; wherein the single experimental test pattern is an intensity curve of the beam spot formed on the planar fluorescent screen acquired by an external CCD sensor; determining the modulation degree of the striped tube under the preset focusing voltage through the intensity curve in the single experimental test pattern; and calculating the field curvature of the striped tube according to the modulation degree.

[0006] In conjunction with the first aspect, the present invention provides a first possible implementation of the first aspect, wherein the step of determining the modulation degree of the stripe tube under a preset focusing voltage using the intensity curve in the above-mentioned single experimental test image includes: calculating the modulation degree under the preset focusing voltage according to the following formula: Where C represents the aforementioned adjustment mechanism, This represents the peak value in the intensity curve above. Indicates the above The corresponding valley value, This represents the background noise value.

[0007] In conjunction with the first possible implementation of the first aspect, the present invention provides a first possible implementation of the first aspect, wherein the step of calculating the field curvature of the stripe tube according to the above modulation degree includes: determining a modulation transfer function according to the above modulation degree; and determining the field curvature of the stripe tube according to the above modulation transfer function.

[0008] In conjunction with the second possible implementation of the first aspect, this embodiment of the invention provides a third possible implementation of the first aspect, wherein the step of determining the field curvature of the stripe tube according to the modulation transfer function includes: determining the radius of the first scattering point of the electron beam corresponding to the preset focusing voltage on the planar fluorescent screen according to the modulation transfer function; and determining the field curvature of the stripe tube according to the radius of the first scattering point.

[0009] In conjunction with the third possible implementation of the first aspect, this embodiment of the invention provides a fourth possible implementation of the first aspect, wherein the step of determining the field curvature of the stripe tube based on the first scattering point radius includes: determining the second scattering point radius of an ideal surface corresponding to the first scattering point radius based on the first scattering point radius; the ideal surface being a Betzval surface; and determining the field curvature of the stripe tube based on the first scattering point radius and the second scattering point radius.

[0010] In conjunction with the fourth possible implementation of the first aspect, this embodiment of the invention provides a fifth possible implementation of the first aspect, wherein the step of determining the field curvature of the stripe tube based on the first scattering point radius and the second scattering point radius includes: determining the field curvature of the stripe tube based on the first scattering point radius and the second scattering point radius using the following formula: Where d represents the field curve corresponding to the preset focusing voltage, This indicates the lateral magnification of the aforementioned striped tube. This represents the length of the striped tube, where k represents a preset constant. This represents half the angle of the electron beam on the object plane of the aforementioned striped tube. This represents the off-axis height of a point on the aforementioned surface; This represents the radius of the first scattering point mentioned above. This represents the radius of the second scattering point mentioned above.

[0011] In conjunction with the fifth possible implementation of the first aspect, this embodiment of the invention provides a sixth possible implementation of the first aspect, wherein, after determining the field curvature of the stripe tube based on the first scattering point radius and the second scattering point radius, the method further includes: determining a field curvature expression based on the field curvature corresponding to the preset focusing voltage.

[0012] Secondly, embodiments of the present invention provide a striped tube field curvature measurement device, applied to a static testing scenario of a striped tube, the static testing scenario including a striped tube and a planar fluorescent screen; the device includes: a test pattern acquisition module, used to adjust a single experimental test pattern of the electron beam emitted by the striped tube on the planar fluorescent screen according to a preset focusing voltage; wherein the single experimental test pattern is an intensity curve of the beam spot formed on the planar fluorescent screen acquired by an external CCD sensor; a modulation degree determination module, used to determine the modulation degree of the striped tube under the preset focusing voltage through the intensity curve in the single experimental test pattern; and a field curvature determination module, used to calculate the field curvature of the striped tube according to the modulation degree.

[0013] Thirdly, embodiments of the present invention provide an electronic device, wherein the electronic device includes a processor and a memory, the memory storing computer-executable instructions executable by the processor, and the processor executing the computer-executable instructions to implement the stripe tube field curvature measurement method of any one of the first to sixth possible embodiments of the first aspect.

[0014] Fourthly, embodiments of the present invention provide a readable storage medium storing a computer program that, when run on a processor, executes a stripe tube field curvature measurement method as described in any of the first to sixth possible embodiments of the first aspect.

[0015] The embodiments of the present invention bring the following beneficial effects:

[0016] This invention provides a method, apparatus, computer device, and readable storage medium for measuring the field curvature of a striped tube, applied to a static testing scenario for a striped tube, which includes the striped tube and a planar fluorescent screen. The method includes: adjusting a single experimental test pattern on the planar fluorescent screen of an electron beam emitted by the striped tube according to a preset focusing voltage; wherein the single experimental test pattern is an intensity curve of the beam spot formed on the planar fluorescent screen acquired by an external CCD sensor; determining the modulation degree of the striped tube under the preset focusing voltage based on the intensity curve in the single experimental test pattern; and calculating the field curvature of the striped tube based on the modulation degree. This method receives the electron beam emitted by the striped tube under the preset focusing voltage through the planar fluorescent screen and calculates the field curvature corresponding to the electron beam emitted under the preset focusing voltage without needing to replace the planar fluorescent screen.

[0017] Other features and advantages disclosed in this embodiment will be set forth in the following description, or some features and advantages may be inferred from the description or determined without doubt, or may be learned by practicing the techniques described above.

[0018] To make the above-mentioned objects, features and advantages of this disclosure more apparent and understandable, preferred embodiments are described below in detail with reference to the accompanying drawings. Attached Figure Description

[0019] To more clearly illustrate the specific embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the specific embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present invention. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0020] Figure 1 A schematic flowchart illustrating a method for measuring the field curvature of a striped tube according to an embodiment of the present invention;

[0021] Figure 2 This is a structural schematic diagram of a static test scenario provided in an embodiment of the present invention;

[0022] Figure 3 A schematic diagram of the distance between the Betzval image plane and the planar fluorescent screen provided in an embodiment of the present invention;

[0023] Figure 4 A schematic flowchart of another method for measuring the field curvature of a striped tube provided in an embodiment of the present invention;

[0024] Figure 5 This is a schematic diagram of the structure of a striped tube field curvature measuring device provided in an embodiment of the present invention;

[0025] Figure 6 This is a schematic diagram of the structure of an electronic device provided in an embodiment of the present invention.

[0026] Icons: 21-Object plane; 22-Planar fluorescent screen; 23-Ideal plane; 51-Test pattern acquisition module; 52-Modulation determination module; 53-Field curve determination module; 61-Memory; 62-Processor; 63-Bus; 64-Communication interface. Detailed Implementation

[0027] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. The components of the embodiments of the present invention described and shown in the accompanying drawings can generally be arranged and designed in various different configurations.

[0028] Since the design of streak tubes often employs numerical calculations to solve the Laplace equation, only special structures like concentric sphere systems possess ideal analytical solutions. Therefore, for non-concentric sphere streak tube systems that cannot be analyzed analytically, aberration calculations can only use simple formulas. The aforementioned aberration formulas require tracking the electron trajectory's landing point on the image plane, implying knowledge of the streak tube's specific structure. However, for commercially available streak tubes, their internal components are generally unknown, making image correction using this set of aberration formulas impractical. Therefore, an effective method for measuring the field curvature of streak tubes without replacing the fluorescent screen is currently lacking.

[0029] Based on this, embodiments of the present invention provide a method, apparatus, computer device, and readable storage medium for measuring the field curvature of a striped tube. This technology can alleviate the aforementioned technical problems and can calculate the field curvature corresponding to an electron beam emitted under a preset focusing voltage without replacing the aforementioned planar fluorescent screen. To facilitate understanding of the embodiments of the present invention, a detailed description of a method for measuring the field curvature of a striped tube disclosed in the embodiments of the present invention will be provided first.

[0030] Example 1

[0031] This invention provides a method for measuring the field curvature of a striped tube. The method is applied to a static testing scenario for the striped tube, which includes the striped tube and a planar fluorescent screen. Figure 1 This is a schematic flowchart illustrating a method for measuring the field curvature of a striped tube according to an embodiment of the present invention. Figure 1 As can be seen, the above methods include:

[0032] Step S101: Adjust the single experimental test pattern of the electron beam emitted by the stripe tube on the planar fluorescent screen according to the preset focusing voltage; wherein, the single experimental test pattern is the intensity curve of the beam spot formed on the planar fluorescent screen obtained by the external CCD sensor.

[0033] For ease of understanding, Figure 2 This is a structural schematic diagram of a static test scenario provided in an embodiment of the present invention. Figure 2 The object plane 21 in the figure is the part that emits the electron beam. Electrons are emitted at point O on the object plane, accelerated by an electric field to form the aforementioned electron beam, and imaged on the aforementioned planar fluorescent screen 22. The Betzval image plane in the figure is the ideal plane 23 corresponding to the aforementioned electron beam.

[0034] Furthermore, Figure 3 This is a schematic diagram illustrating the spacing between the Betzwerk image plane and a planar phosphor screen, provided as an embodiment of the present invention. In actual operation, the voltage is adjusted so that the position of the ideal image plane intersects with the position of the planar phosphor screen.

[0035] Step S102: Determine the modulation degree of the stripe tube under the preset focusing voltage by using the intensity curve in the above single experimental test image.

[0036] Step S103: Calculate the field curvature of the striped tube according to the above modulation.

[0037] This invention provides a method for measuring the field curvature of a striped tube, applied to a static testing scenario of a striped tube, which includes a striped tube and a planar fluorescent screen. The method includes: adjusting a single experimental test pattern on the planar fluorescent screen of the electron beam emitted by the striped tube according to a preset focusing voltage; wherein the single experimental test pattern is an intensity curve of the beam spot formed on the planar fluorescent screen acquired by an external CCD sensor; determining the modulation degree of the striped tube under the preset focusing voltage based on the intensity curve in the single experimental test pattern; and calculating the field curvature of the striped tube based on the modulation degree. This method receives the electron beam emitted by the striped tube under the preset focusing voltage through the planar fluorescent screen, and calculates the field curvature corresponding to the electron beam emitted under the preset focusing voltage without replacing the planar fluorescent screen.

[0038] Example 2

[0039] exist Figure 1 Based on the method shown, this invention also provides another method for measuring the field curvature of a striped tube. This method is applied to a static testing scenario for a striped tube, which includes the striped tube and a planar fluorescent screen. Figure 4 This is a schematic flowchart of another method for measuring the field curvature of a striped tube provided in an embodiment of the present invention.

[0040] Step S401: Adjust the single experimental test pattern of the electron beam emitted by the stripe tube on the planar fluorescent screen according to the preset focusing voltage; wherein, the single experimental test pattern is the intensity curve of the beam spot formed on the planar fluorescent screen obtained by the external CCD sensor.

[0041] Step S402: Determine the modulation degree of the stripe tube under the preset focusing voltage using the intensity curve in the single experimental test image above. The modulation degree under the preset focusing voltage is calculated using the following formula:

[0042]

[0043] Where C represents the aforementioned adjustment mechanism, This represents the peak value in the intensity curve above. Indicates the above The corresponding valley value, This represents the background noise value.

[0044] Step S403: Determine the modulation transfer function based on the modulation level described above.

[0045] In this embodiment, the modulation transfer function is as follows:

[0046] ;

[0047] in, Here, f is the modulation function mentioned above, and f is the preset spatial resolution.

[0048] Step S404: Determine the field curvature of the stripe tube based on the modulation transfer function described above.

[0049] In one embodiment, step S404 includes the following steps A1-A2:

[0050] Step A1: Based on the modulation transfer function described above, determine the radius of the first scattering point of the electron beam on the aforementioned planar fluorescent screen corresponding to the preset focusing voltage.

[0051] Step A2: Determine the field curvature of the striped tube based on the radius of the first scattering point.

[0052] Here, step A2 includes: First, determining the second scattering point radius of the ideal surface corresponding to the first scattering point radius, based on the first scattering point radius; the ideal surface is a Betzval surface. Then, determining the field curvature of the striped tube based on the first scattering point radius and the second scattering point radius.

[0053] Furthermore, the field curvature of the stripe tube is determined using the following formula, based on the radius of the first scattering point and the radius of the second scattering point:

[0054] ;

[0055] Where d represents the field curve corresponding to the preset focusing voltage. This indicates the lateral magnification of the aforementioned striped tube. This represents the length of the striped tube, where k represents a preset constant. This represents half the angle of the electron beam on the object plane of the aforementioned striped tube. This represents the off-axis height of a point on the aforementioned surface; This represents the radius of the first scattering point mentioned above. This represents the radius of the second scattering point mentioned above.

[0056] In practice, the formula derived from analytical geometry regarding the relationship between the beam spot diameter of the electron beam on the aforementioned planar fluorescent screen and the beam spot diameter on the corresponding ideal image plane of the electron beam is as follows: ;in, The elevation angle between the image height of the aforementioned planar fluorescent screen and the intersection point of the electron beam emitted from the corresponding object and the axis. This is half the angle subtended by the beam spot on the aforementioned planar phosphor screen at the intersection point. Expanding the formula relating the diameters of the beam spot on the ideal image plane to the aforementioned electron beam: Formula 1 is obtained: and formula 2: ;in, The height of the object on the aforementioned surface, M is the image height on the beam spot of the aforementioned planar phosphor screen, and M is the lateral magnification of the aforementioned stripe tube; according to the universally valid Lagrange-Helmholtz relation in electron optics systems: In the formula The axial energy of the aforementioned point is... This refers to the total anode pressure of the aforementioned striped tube; The angular magnification of the aforementioned stripe tube is equal to the ratio of the angular subtended by the image electron beam to the angular subtended by the object electron beam, i.e.: From the above formula, we can obtain: ; The value of can be taken as the most probable energy of the photocathode material. When the cathode material of the stripe tube is cesium iodide... When the cathode material is gold, Therefore, when the cathode material, the transverse magnification of the stripe tube, and the total anode voltage are all known, the right side of the above equation, excluding... All parameters outside can be represented by a single constant. This means, that is: ;in: Based on the above formula, the expression for determining the field curvature of the stripe tube based on the radius of the first scattering point and the radius of the second scattering point can be derived.

[0057] In another implementation, after determining the field curvature of the stripe tube based on the first scattering point radius and the second scattering point radius, the method further includes: determining a field curvature expression based on the field curvature corresponding to the preset focusing voltage.

[0058] This invention provides a method for measuring the field curvature of a striped tube, applied to a static testing scenario of a striped tube, which includes the striped tube and a planar fluorescent screen. The method includes: adjusting a single experimental test pattern on the planar fluorescent screen of the electron beam emitted by the striped tube according to a preset focusing voltage; wherein the single experimental test pattern is an intensity curve of the beam spot formed on the planar fluorescent screen acquired by an external CCD sensor; determining the modulation degree of the striped tube under the preset focusing voltage based on the intensity curve in the single experimental test pattern; determining a modulation transfer function based on the modulation degree; and determining the field curvature of the striped tube based on the modulation transfer function. This method improves the measurement efficiency of the field curvature of the striped tube by calculating the field curvature corresponding to the electron beam emitted under the preset focusing voltage through the modulation transfer function.

[0059] Example 3

[0060] This invention also provides a device for measuring the field curvature of a striped tube. This device is applied to a static testing scenario for striped tubes, which includes the striped tube and a planar fluorescent screen. Figure 5 The diagram shown is a structural schematic of a striped tube field curvature measuring device provided in an embodiment of the present invention. The device includes:

[0061] The test pattern acquisition module 51 is used to adjust the single experimental test pattern of the electron beam emitted by the stripe tube on the planar fluorescent screen according to the preset focusing voltage; wherein the single experimental test pattern is the intensity curve of the beam spot formed on the planar fluorescent screen acquired by the external CCD sensor.

[0062] The modulation determination module 52 is used to determine the modulation of the stripe tube under the preset focusing voltage by using the intensity curve in the single experimental test image.

[0063] Field curvature determination module 53 is used to calculate the field curvature of the striped tube based on the above modulation index.

[0064] The test diagram acquisition module 51, the modulation determination module 52, and the field music determination module 53 are connected in sequence.

[0065] In one embodiment, the modulation determination module 52 is further configured to calculate the modulation at a preset focusing voltage according to the following formula: Where C represents the aforementioned adjustment mechanism, This represents the peak value in the intensity curve above. Indicates the above The corresponding valley value, This represents the background noise value.

[0066] In one embodiment, the field curvature determination module 53 is further configured to determine a modulation transfer function based on the modulation degree; and to determine the field curvature of the stripe tube based on the modulation transfer function.

[0067] In one embodiment, the field curvature determination module 53 is further configured to determine the radius of the first scattering point of the electron beam corresponding to the preset focusing voltage on the planar fluorescent screen according to the modulation transfer function; and determine the field curvature of the stripe tube according to the radius of the first scattering point.

[0068] In one embodiment, the field curvature determination module 53 is further configured to determine the second scattering point radius of the ideal surface corresponding to the first scattering point radius based on the first scattering point radius; the ideal surface is a Betzval surface; and to determine the field curvature of the stripe tube based on the first scattering point radius and the second scattering point radius.

[0069] In one embodiment, the field curvature determination module 53 is further configured to determine the field curvature of the stripe tube based on the first scattering point radius and the second scattering point radius using the following formula: Where d represents the field curve corresponding to the preset focusing voltage, This indicates the lateral magnification of the aforementioned striped tube. This represents the length of the striped tube, where k represents a preset constant. This represents half the angle of the electron beam on the object plane of the aforementioned striped tube. This represents the off-axis height of a point on the aforementioned surface; This represents the radius of the first scattering point mentioned above. This represents the radius of the second scattering point mentioned above.

[0070] In one embodiment, the field curvature determination module 53 is further configured to determine a field curvature expression based on the field curvature corresponding to the preset focusing voltage.

[0071] The striped tube field curvature measuring device provided in this embodiment of the invention has the same technical features as the striped tube field curvature measuring method provided in the above embodiments, and therefore can solve the same technical problems and achieve the same technical effects. Those skilled in the art will clearly understand that, for the sake of convenience and brevity, the specific working process of the device described above can be referred to the corresponding process in the foregoing method embodiments, and will not be repeated here.

[0072] Example 4

[0073] This embodiment provides an electronic device, including a processor and a memory. The memory stores computer-executable instructions that can be executed by the processor. The processor executes the computer-executable instructions to implement the steps of the method for measuring the field curvature of a memory chip stripe tube.

[0074] See Figure 6 The diagram shows the structure of an electronic device, which includes a memory 61 and a processor 62. The memory stores a computer program that can run on the processor 62. When the processor executes the computer program, it implements the steps provided by the above-mentioned memory chip stripe tube field curvature measurement method.

[0075] like Figure 6 As shown, the device also includes a bus 63 and a communication interface 64. The processor 62, the communication interface 64 and the memory 61 are connected via the bus 63. The processor 62 is used to execute executable modules, such as computer programs, stored in the memory 61.

[0076] The memory 61 may include high-speed random access memory (RAM) or non-volatile memory, such as at least one disk storage device. Communication between this system network element and at least one other network element is achieved through at least one communication interface 64 (which can be wired or wireless), such as the Internet, wide area network, local area network, metropolitan area network, etc.

[0077] Bus 63 can be an ISA bus, PCI bus, or EISA bus, etc. Buses can be divided into address buses, data buses, control buses, etc. For ease of representation, Figure 6 The symbol is represented by a single double-headed arrow, but this does not mean that there is only one bus or one type of bus.

[0078] In this invention, memory 61 stores the program, and processor 62 executes the program after receiving the execution instruction. The method executed by the memory chip stripe field curvature measurement device disclosed in any of the foregoing embodiments of the present invention can be applied to processor 62, or implemented by processor 62. Processor 62 may be an integrated circuit chip with signal processing capabilities. In the implementation process, each step of the above method can be completed by the integrated logic circuit in the hardware of processor 62 or by instructions in the form of software. The processor 62 may be a general-purpose processor, including a central processing unit (CPU), a network processor (NP), etc.; it may also be a digital signal processor (DSP), an application-specific integrated circuit (ASIC), a field-programmable gate array (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, or discrete hardware components. It can implement or execute the methods, steps, and logic block diagrams disclosed in the embodiments of the present invention. The general-purpose processor may be a microprocessor or any conventional processor. The steps of the method disclosed in the embodiments of this invention can be directly manifested as being executed by a hardware decoding processor, or executed by a combination of hardware and software modules in the decoding processor. The software modules can reside in random access memory, flash memory, read-only memory, programmable read-only memory, electrically erasable programmable memory, registers, or other mature storage media in the art. This storage medium is located in memory 61, and processor 62 reads information from memory 61 and, in conjunction with its hardware, completes the steps of the above method.

[0079] Furthermore, this embodiment of the invention also provides a readable storage medium storing a computer program, which, when run on the processor 62, executes the above-described method for measuring the field curvature of the storage chip stripe tube.

[0080] The verification device for measuring the field curvature of a memory chip stripe and the field curvature measuring device of the memory chip stripe provided in this embodiment of the invention have the same technical features, so they can also solve the same technical problems and achieve the same technical effects.

[0081] Furthermore, in the description of the embodiments of the present invention, unless otherwise explicitly specified and limited, the terms "installation," "connection," and "linking" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in the present invention based on the specific circumstances.

[0082] In the description of this invention, it should be noted that the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are used only for the convenience of describing the invention and for simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on the invention. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and should not be construed as indicating or implying relative importance.

Claims

1. A method for measuring the field curvature of a striped tube, characterized in that, A static testing scenario for a striped tube, comprising the striped tube and a flat fluorescent screen; the method includes: According to the preset focusing voltage, the single experimental test pattern of the electron beam emitted by the stripe tube on the planar fluorescent screen is adjusted; wherein, the single experimental test pattern is the intensity curve of the beam spot on the planar fluorescent screen obtained by the external CCD sensor; The modulation degree of the stripe tube under the preset focusing voltage is determined by the intensity curve in the single experimental test image. Calculate the field curvature of the striped tube based on the modulation index; The step of calculating the field curvature of the stripe tube based on the modulation index includes: Based on the modulation scheme, determine the modulation transfer function; Based on the modulation transfer function, determine the radius of the first scattering point of the electron beam on the planar fluorescent screen corresponding to the preset focusing voltage; Based on the radius of the first scattering point, determine the radius of the second scattering point of the ideal surface corresponding to the radius of the first scattering point; the ideal surface is a Betzval surface. The field curvature of the stripe tube is determined based on the radius of the first scattering point and the radius of the second scattering point; The field curvature of the stripe tube is determined using the following formula, based on the radius of the first scattering point and the radius of the second scattering point: ； Where d represents the field curve corresponding to the preset focusing voltage. This indicates the lateral magnification factor of the striped tube. This represents the length of the striped tube, and k represents a preset constant. This represents half the angle of the electron beam on the object plane of the striped tube. This represents the off-axis height of a point on the surface of the object; This represents the radius of the first scattering point. This represents the radius of the second scattering point.

2. The method for measuring the field curvature of a striped tube according to claim 1, characterized in that, The steps for determining the modulation degree of the stripe tube under a preset focusing voltage using the intensity curve in the single experimental test image include: Calculate the modulation intensity under the preset focusing voltage using the following formula: Wherein, C represents the modulation index. This represents the peak value in the intensity curve. Indicates the above The corresponding valley value, This represents the background noise value.

3. The method for measuring the field curvature of a striped tube according to claim 1, characterized in that, After determining the field curvature of the stripe tube based on the first scattering point radius and the second scattering point radius, the method further includes: The field curvature expression is determined based on the field curvature corresponding to the preset focusing voltage.

4. A striped tube field curvature measuring device, characterized in that, An apparatus for static testing of striped tubes, comprising a striped tube and a flat fluorescent screen; the apparatus includes: The test pattern acquisition module is used to adjust a single experimental test pattern on the planar fluorescent screen of the electron beam emitted by the stripe tube according to a preset focusing voltage; wherein, the single experimental test pattern is the intensity curve of the beam spot on the planar fluorescent screen acquired by an external CCD sensor; The modulation determination module is used to determine the modulation degree of the stripe tube under a preset focusing voltage by using the intensity curve in the single experimental test image. The field curvature determination module is used to calculate the field curvature of the stripe tube based on the modulation index; The field curvature determination module is further configured to: determine a modulation transfer function based on the modulation degree; determine the radius of a first scattering point of the electron beam corresponding to the preset focusing voltage on the planar fluorescent screen based on the modulation transfer function; determine the radius of a second scattering point of an ideal surface corresponding to the first scattering point radius based on the first scattering point radius; wherein the ideal surface is a Betzval surface; and determine the field curvature of the stripe tube based on the first scattering point radius and the second scattering point radius. The field curvature of the stripe tube is determined using the following formula, based on the radius of the first scattering point and the radius of the second scattering point: ； Where d represents the field curve corresponding to the preset focusing voltage. This indicates the lateral magnification factor of the striped tube. This represents the length of the striped tube, and k represents a preset constant. This represents half the angle of the electron beam on the object plane of the striped tube. This represents the off-axis height of a point on the surface of the object; This represents the radius of the first scattering point. This represents the radius of the second scattering point.

5. A computer device, characterized in that, The device includes a memory and a processor, the memory storing a computer program, and the processor running the computer program to cause the computer device to perform the stripe tube field curvature measurement method according to any one of claims 1 to 3.

6. A readable storage medium, characterized in that, It stores a computer program that, when run on a processor, executes the stripe tube field curvature measurement method according to any one of claims 1 to 3.

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