Test method, test device and computer readable storage medium for resistive devices

Abstract

This application provides a testing method, testing apparatus, and computer-readable storage medium for resistive devices. The testing method includes: acquiring the resistance of each test unit in a test structure to obtain multiple resistance values, wherein the test structure includes multiple test units, each test unit includes multiple groups of resistive devices connected in series, and each group of resistive devices includes multiple resistive devices connected in parallel; determining the number of failed test units based on the multiple resistance values; and determining the failure rate of the resistive device based on the number of failed test units. This method only requires acquiring multiple resistance values ​​of multiple test units, determining the number of failed test units based on the multiple resistance values, and then determining the failure rate of the resistive device. This testing method does not require acquiring other data of the test units, thus ensuring that the method for determining the failure rate of the resistive device is relatively simple and efficient, thereby solving the problem of difficulty in efficiently detecting low-probability failures of resistive devices in the prior art.

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