Method, device, equipment and medium for obtaining characteristic information of detected object

Abstract

Embodiments of the present disclosure relate to the field of radiation detection technology and provide a method for obtaining characteristic information of an object under inspection, including: controlling the object under inspection to pass through a detection device; controlling an imaging system to perform radiation scanning on the object under inspection; obtaining a radiation scanning image of the object under inspection; and obtaining characteristic information of the object under inspection through the radiation scanning image, wherein the object under inspection includes a first part, a detection part, and a second part. In the process of controlling the imaging system to perform radiation scanning on the object under inspection, the detection part is located between the first part and the second part in a first direction, and obtaining characteristic information of the object under inspection through the radiation scanning image includes: obtaining a first dividing line between the detection part and the first part and a second dividing line between the detection part and the second part through the radiation scanning image; and calculating a size between the first dividing line and the second dividing line along the first direction to obtain a size of the detection part along the first direction.

Description

Technical Field

[0001] The present disclosure relates to the field of radiation detection technology, and more specifically, to a method, apparatus, device, and medium for acquiring characteristic information of an object under inspection. Background Art

[0002] Radiation detection technology uses radiation to inspect the interior of objects. This technology can obtain information about an object's internal structure and density without destroying it. It is currently widely used in chest X-rays in hospitals and security checks at train stations and airports.

[0003] Existing digital imaging (DR) image analysis is a feature analysis method based on complete DR or reconstructed images. Feature recognition and analysis are based on two-dimensional or three-dimensional information. For example, extracting the shape and location information of contraband requires the two-dimensional information of DR images or the three-dimensional information of reconstructed images. Summary of the Invention

[0004] In view of this, the present disclosure provides a method, apparatus, device and medium for acquiring characteristic information of an object under inspection.

[0005] In one aspect, a method for obtaining characteristic information of an object to be detected is provided, comprising:

[0006] Controlling the object to be inspected to pass through a detection device, wherein the detection device is used to scan and detect the object to be inspected, and the detection device comprises: a detection channel, through which the object to be inspected enters and exits the detection device along a first direction; and an imaging system for scanning and detecting the object to be inspected;

[0007] controlling the imaging system to perform radiation scanning on the object to be inspected;

[0008] Acquiring a radiation scanning image of the object under inspection;

[0009] Acquire characteristic information of the object under inspection through the radiation scanning image,

[0010] The object to be inspected includes a first part, a detection part, and a second part. When controlling the imaging system to perform radiation scanning on the object to be inspected, the detection part is located between the first part and the second part in the first direction.

[0011] Acquiring characteristic information of the object under inspection through the radiation scanning image includes:

[0012] acquiring, through the radiation scanning image, a first dividing line between the detection portion and the first portion and a second dividing line between the detection portion and the second portion;

[0013] The dimension between the first dividing line and the second dividing line along the first direction is calculated to obtain the dimension of the detection portion along the first direction.

[0014] According to some embodiments, the method further includes: obtaining the volume of the detection part, and obtaining the characteristic information of the object under inspection through the radiation scanning image further includes: obtaining the projection area of the detection part along the first direction based on the volume of the detection part and the size of the detection part along the first direction.

[0015] According to some embodiments, the method further includes: obtaining shape characteristic information of the projection of the detection part along the first direction, and obtaining the characteristic information of the object to be inspected through the radiation scanning image further includes: obtaining characteristic information of the cross section of the detection part perpendicular to the first direction based on the area of the projection of the detection part along the first direction and the shape characteristic information of the projection of the detection part along the first direction.

[0016] According to some embodiments, each of the first portion and the second portion has an attenuation characteristic for radiation emitted by the imaging system that is different from an attenuation characteristic for radiation emitted by the detection portion.

[0017] According to some embodiments, in the radiation scanning image, the grayscale of each of the first part and the second part is different from the grayscale of the detection part, and obtaining the first dividing line between the detection part and the first part and the second dividing line between the detection part and the second part through the radiation scanning image specifically includes: determining the first dividing line according to the difference in grayscale shown between the detection part and the first part in the radiation scanning image; and determining the second dividing line according to the difference in grayscale shown between the detection part and the second part in the radiation scanning image.

[0018] According to some embodiments, the shape of the projection of the detection part along the first direction is a circle, and the obtaining of the characteristic information of the cross section of the detection part perpendicular to the first direction based on the area of the projection of the detection part along the first direction and the shape characteristic information of the projection of the detection part along the first direction specifically includes: obtaining the radius of the cross section of the detection part perpendicular to the first direction according to the area of the projection of the detection part along the first direction, using the area calculation formula of the circle; or, the shape of the projection of the detection part along the first direction is a square, and the obtaining of the characteristic information of the cross section of the detection part perpendicular to the first direction based on the area of the projection of the detection part along the first direction and the shape characteristic information of the projection of the detection part along the first direction specifically includes: obtaining the side length of the cross section of the detection part perpendicular to the first direction according to the area of the projection of the detection part along the first direction, using the area calculation formula of the square.

[0019] According to some embodiments, the detection device also includes a posture adjustment structure, which is arranged in the detection channel and is used to adjust the posture of the object to be detected located in the detection channel. The controlling of the imaging system to perform radiation scanning on the object to be detected includes: under the drive of the posture adjustment structure, controlling the object to be detected to move along the first direction in the detection channel; during the movement of the object to be detected, controlling the imaging system to continuously emit beams to continuously perform radiation scanning on the object to be detected.

[0020] According to some embodiments, the imaging system includes a ray source for generating rays, and the ray source is arranged on one side of the detection channel. The rays at least form a main beam plane suitable for scanning and detecting the object to be inspected. Controlling the imaging system to perform radiation scanning on the object to be inspected also includes: adjusting the posture of the object to be inspected so that: during the radiation scanning process, the inspected surface of the object to be inspected and the main beam plane are in the same plane.

[0021] According to some embodiments, a ratio of an area value of a projection of the detection portion along the first direction to a size value of the detection portion in the first direction is greater than or equal to 10.

[0022] According to some embodiments, a ratio of a size of the detector in the first direction to a size of the detection portion in the first direction is in a range of 1-8.

[0023] According to some embodiments, before controlling the imaging system to perform radiation scanning on the object under inspection, the method further includes:

[0024] obtaining the posture of the object under inspection; and

[0025] Based on the acquired posture of the object under inspection, the posture adjustment structure is controlled to adjust the posture of the object under inspection so that the detection surface of the object under inspection and the main beam surface of the imaging system are in the same plane.

[0026] According to some embodiments, obtaining the posture of the object under inspection includes:

[0027] Scanning the object to be inspected using the imaging system or an additional imaging system to obtain a first image of the object to be inspected; and

[0028] The posture of the object to be inspected is obtained by analyzing the first image.

[0029] In another aspect, a device for acquiring characteristic information of an object under inspection is provided, comprising:

[0030] a motion control module, configured to control the object to be inspected to pass through a detection device, wherein the detection device is configured to scan and detect the object to be inspected, and the detection device comprises: a detection channel, through which the object to be inspected passes in and out of the detection device along a first direction; and an imaging system configured to scan and detect the object to be inspected;

[0031] a radiation scanning control module, configured to control the imaging system to perform radiation scanning on the object under inspection;

[0032] an image acquisition module, configured to acquire a radiation scanning image of the object under inspection; and

[0033] A feature information acquisition module is used to acquire feature information of the object under inspection through the radiation scanning image.

[0034] The object to be inspected includes a first part, a detection part, and a second part. When controlling the imaging system to perform radiation scanning on the object to be inspected, the detection part is located between the first part and the second part in the first direction.

[0035] Acquiring characteristic information of the object under inspection through the radiation scanning image includes:

[0036] acquiring, through the radiation scanning image, a first dividing line between the detection portion and the first portion and a second dividing line between the detection portion and the second portion;

[0037] The dimension between the first dividing line and the second dividing line along the first direction is calculated to obtain the dimension of the detection portion along the first direction.

[0038] In yet another aspect, an electronic device is provided, comprising:

[0039] one or more processors;

[0040] a storage device for storing one or more programs,

[0041] When the one or more programs are executed by the one or more processors, the one or more processors are enabled to execute the method as described above.

[0042] In yet another aspect, a computer-readable storage medium is provided, on which executable instructions are stored. When the instructions are executed by a processor, the processor is caused to perform the method described above. BRIEF DESCRIPTION OF THE DRAWINGS

[0043] The above and other objects, features and advantages of the present disclosure will become more apparent through the following description of the embodiments of the present disclosure with reference to the accompanying drawings, in which:

[0044] Figure 1 The overall structure of the detection device according to the embodiment of the present disclosure is schematically shown.

[0045] Figure 2 A schematic top view of a first transmission mechanism according to an embodiment of the present disclosure is shown schematically.

[0046] Figure 3 Schematically shows Figure 2 Sectional view of the AA plane.

[0047] Figure 4 The following schematically shows a simplified diagram of an adjustment method of the second adjustment component according to an embodiment of the present disclosure.

[0048] Figure 5 The figure schematically shows a simplified diagram of the adjustment method of the first adjustment component according to an embodiment of the present disclosure.

[0049] Figure 6 A front view of a first adjustment assembly according to an embodiment of the present disclosure is schematically shown.

[0050] Figure 7 A top view of a first adjustment assembly according to an embodiment of the present disclosure is schematically shown.

[0051] Figure 8 Schematically shows Figure 7 Cross-sectional view at AA in the middle.

[0052] Figure 9 Schematically shows Figure 7 Cross-sectional view at the middle BB.

[0053] Figure 10 The structural diagram of the dial head according to the embodiment of the present disclosure is schematically shown.

[0054] Figure 11 Schematically shows Figure 7Cross-sectional view at CC.

[0055] Figure 12 A side view of a first transmission mechanism according to an embodiment of the present disclosure is schematically shown.

[0056] Figure 13 The figure schematically shows a simplified diagram of the principle of radiation imaging according to an embodiment of the present disclosure.

[0057] Figure 14 A top view of a second adjustment assembly according to an embodiment of the present disclosure is schematically shown.

[0058] Figure 15 A front view of a second adjustment assembly according to an embodiment of the present disclosure is schematically shown.

[0059] Figure 16 Schematically shows Figure 15 Cross-sectional view at DD in the middle.

[0060] Figure 17 A top view of another implementation of a second adjustment assembly according to an embodiment of the present disclosure is schematically shown.

[0061] Figure 18 A front view of a posture adjustment structure according to an embodiment of the present disclosure is schematically shown.

[0062] Figure 19 A top view of a posture adjustment structure according to an embodiment of the present disclosure is schematically shown.

[0063] Figure 20 A perspective view of an object to be inspected according to some exemplary embodiments of the present disclosure is schematically shown.

[0064] Figure 21 is a schematic diagram of a detection device according to an embodiment of the present disclosure.

[0065] Figure 22 A schematic diagram schematically illustrates a radiographic image generated by an inspection device according to some exemplary embodiments of the present disclosure.

[0066] Figure 23 4 is a flowchart of a method for acquiring characteristic information of an object under inspection according to an embodiment of the present disclosure.

[0067] Figure 24 The following schematically shows a structural block diagram of a device for acquiring characteristic information of an object under inspection according to an embodiment of the present disclosure.

[0068] Figure 25 The block diagram schematically shows an electronic device suitable for implementing a method for acquiring characteristic information of a detected object according to an embodiment of the present disclosure.

[0069] List of reference numerals:

[0070] 1. Detection channel, 11. Protective cover,

[0071] 2. Object to be inspected, 21. Inspection surface

[0072] 3. The first transmission mechanism,

[0073] 31. Drive device,

[0074] 32. Screw,

[0075] 33. First slide rail,

[0076] 34. Sliding mechanism,

[0077] 35. Second slide rail,

[0078] 36. Slide, 4. Attitude adjustment structure,

[0079] 41. Support structure,

[0080] 411, bearing surface,

[0081] 42. The first adjustment component,

[0082] 421, rack,

[0083] 422, rotating parts,

[0084] 4221 lever,

[0085] 4222 dial head,

[0086] 42221, counterweight, 42222, push surface, 42223, guide surface, 42224, limit structure,

[0087] 4223, shaft,

[0088] 4224, transfer block,

[0089] 42241, screw sleeve,

[0090] 4225, bearings,

[0091] 4226, retaining ring,

[0092] 4227, first drive unit,

[0093] 42271, push rod, 42272, first motor,

[0094] 43. The second adjustment component,

[0095] 431, support plate,

[0096] 432. Second drive unit,

[0097] 4321, second motor, 4322, lifting rod,

[0098] 433, articulated seat,

[0099] 434, connector,

[0100] 5. Second transmission mechanism,

[0101] 6. Imaging system, 61. Primary beam surface, 62. Scanning area. DETAILED DESCRIPTION

[0102] Hereinafter, embodiments of the present disclosure will be described with reference to the accompanying drawings. However, it should be understood that these descriptions are merely exemplary and are not intended to limit the scope of the present disclosure. In the detailed description below, for ease of explanation, many specific details are set forth to provide a comprehensive understanding of the embodiments of the present disclosure. However, it is apparent that one or more embodiments may also be implemented without these specific details. In addition, in the following description, descriptions of well-known structures and technologies are omitted to avoid unnecessary confusion of the concepts of the present disclosure.

[0103] The terms used herein are only for describing specific embodiments and are not intended to limit the present disclosure. The terms "comprise," "include," etc. used herein indicate the presence of the features, steps, operations, and / or components, but do not exclude the presence or addition of one or more other features, steps, operations, or components.

[0104] When using expressions such as "at least one of A, B, or C," they should generally be interpreted in accordance with the meaning of the expression commonly understood by those skilled in the art (for example, "a system having at least one of A, B, or C" should include but is not limited to systems having A alone, B alone, C alone, A and B, A and C, B and C, and / or A, B, C, etc.). The terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly specifying the number of the indicated technical features. Therefore, features defined as "first" or "second" may explicitly or implicitly include one or more of the aforementioned features.

[0105] In the embodiments of the present disclosure, unless otherwise specified, the X, Y, and Z directions are used to describe relative positional relationships. It should be understood that they should not be regarded as limitations on the embodiments of the present disclosure. In general, the X direction may also be referred to as the first direction, the Y direction may also be referred to as the second direction, and the Z direction may also be referred to as the third direction.

[0106] Existing technologies are ineffective for DR images of certain structures. For example, if we use a narrow, long detector (with an aspect ratio greater than 5) to acquire DR data, the information reflected by a single projection is more like one-dimensional information. With only one dimension remaining, existing 2D analysis and extraction, as well as 3D segmentation techniques, struggle to extract effective information.

[0107] Current inspection equipment can use CT scanning technology to inspect objects. For example, if the object includes a thin layer structure, especially a "sandwich" thin layer structure, the thin layers are thin and there is imaging interference between adjacent layers. Traditional spiral scanning will cause adjacent layers to interfere with the central layer (i.e., the thin layer). In other words, when the radiation passes through the central layer, it also passes through the adjacent layers, thus affecting image resolution and recognition.

[0108] An embodiment of the present disclosure provides a method for obtaining characteristic information of an object under inspection, comprising: controlling the object under inspection to pass through a detection device, wherein the detection device is used to scan and detect the object under inspection, the detection device comprising: a detection channel, through which the object under inspection enters and exits the detection device along a first direction; and an imaging system for scanning and detecting the object under inspection; controlling the imaging system to perform radiation scanning on the object under inspection; obtaining a radiation scanning image of the object under inspection; and obtaining characteristic information of the object under inspection through the radiation scanning image, wherein the object under inspection comprises a first portion, a detection portion, and a second portion, and in the process of controlling the imaging system to perform radiation scanning on the object under inspection, the detection portion is located between the first portion and the second portion in the first direction, and obtaining the characteristic information of the object under inspection through the radiation scanning image comprises: obtaining a first dividing line between the detection portion and the first portion and a second dividing line between the detection portion and the second portion through the radiation scanning image; and calculating a dimension between the first dividing line and the second dividing line along the first direction to obtain a dimension of the detection portion along the first direction.

[0109] In the embodiments of the present disclosure, key size information can be extracted from an approximately one-dimensional radiation scanning image, thereby being able to infer characteristic information of a portion of interest (eg, a detection portion) of the object under inspection.

[0110] Figure 1 is a schematic structural diagram of a detection device according to an embodiment of the present disclosure. Figure 21 Schematic diagram of a detection device according to an embodiment of the present disclosure. Figure 1 、 Figure 13 and Figure 21, the detection device is used to scan and detect the object to be inspected 2. The detection device provided by the embodiment of the present disclosure includes: a detection channel 1, a first transmission mechanism 3, a posture adjustment structure 4 and an imaging system 6. For example, the object to be inspected enters and exits the detection device through the detection channel 1. The first transmission mechanism 3 is arranged on one side of the entrance of the detection area 63, and is used to transport the object to be inspected to the detection area. The posture adjustment structure 4 is arranged in the detection area, and is used to adjust the posture of the object to be inspected 2 located in the detection area. The imaging system 6 is used to scan and detect the object to be inspected, and the imaging system 6 includes: a ray source 6S for generating rays, the ray source 6S is arranged on one side of the detection channel 1, and the rays at least form a main beam surface 61 suitable for scanning and detecting the object to be inspected; and a detector 6T for receiving rays passing through the object to be inspected, the detector is arranged on the other side of the detection channel 1, and a detection area 63 is formed between the ray source and the detector, and the detection area includes an entrance and an exit. The object under inspection has a detection surface 21 , and the posture adjustment structure 4 can adjust the posture of the object under inspection 2 so that the detection surface 21 and the main beam surface 61 are in the same plane.

[0111] Specifically, the imaging system 6 is used to scan and detect the object to be inspected; the first transmission mechanism 3 is arranged at the entrance side of the imaging system, and is used to transport the object to be inspected to the imaging system; the support structure 43 passes through the scanning area 62 of the imaging system 6 and is extended along the X direction. The support structure 43 has a bearing surface 411, and the bearing surface 411 is suitable for placing the object to be inspected 2. Under the push of the first transmission mechanism 3, the object to be inspected 2 can slide along the X direction and pass through the imaging system 6; wherein, the first transmission mechanism 3 includes: a transmission frame; a driving device 31, the driving device is fixed on the transmission frame; a screw 32, the screw is connected to the driving device, and the screw can be driven by the driving device; a first slide rail 33, the first slide rail 33 is fixed on the transmission frame, and the extension direction of the first slide rail 33 is parallel to the extension direction of the screw 32; a sliding mechanism 34, the sliding mechanism is connected to the screw, and the screw can drive the sliding mechanism to move, so that the sliding mechanism can push the object to be inspected 2 to slide on the first slide rail 33 and the support structure 43. Through the above structural design, the use of a lead screw for transmission can accurately position the object to be inspected in the scanning area 62 of the imaging system of the detection equipment, effectively solving the problem of insufficient positioning accuracy of the transmission system of the detection equipment and meeting the image detection quality requirements of certain products.

[0112] In the embodiment of the present disclosure, after the object to be inspected is transported to a designated position by the first transmission mechanism and the supporting structure, it is scanned and inspected by the imaging system. Specifically, the first transmission mechanism includes a driving device, a lead screw, a sliding mechanism, a first slide rail and other structures. The lead screw is driven to rotate by the driving device, and the rotation of the lead screw can drive the sliding mechanism to move. The object to be inspected is placed on the first slide rail, and when the sliding mechanism is driven by the lead screw, the sliding mechanism can push the object to be inspected to move on the first slide rail. The end of the first slide rail is connected to the supporting structure, one end of the supporting structure cooperates with the end of the first slide rail, and the other end of the supporting structure passes through the scanning area of the imaging system. Driven by the driving device, the sliding mechanism can extend outside the first slide rail, thereby pushing the object to be inspected to slide on the supporting structure and accurately positioning the object to be inspected on the scanning area of the imaging system, thereby improving the positioning accuracy of the transmission system of the detection equipment.

[0113] It should be noted that the "designated position" mentioned above means that the portion of the object to be inspected is located exactly within the scanning area of the imaging system (i.e., the main beam plane of the imaging system), facilitating scanning and inspection. The meaning of the "designated position" herein should be understood as described herein and will not be further elaborated.

[0114] It should also be noted that in the disclosed embodiment, the first transmission mechanism and the support structure are arranged sequentially along the conveying direction of the object to be inspected. In this case, a gap of a certain width may exist between the first transmission mechanism and the support structure. It should be understood that this gap is permitted as long as the object to be inspected can smoothly pass through the gap during the process of being conveyed from the first transmission mechanism to the support structure.

[0115] In another embodiment of the present disclosure, the first transmission mechanism and the support structure may also be an integrated structure, that is, the first transmission mechanism and the support structure belong to different sections of the same conveying device. For example, when the above-mentioned "same conveying device" is a conveyor belt, the first transmission mechanism includes the front half of the conveyor belt, and the support structure includes the back half of the conveyor belt. In this case, the object to be inspected can also be accurately positioned on the scanning area of the imaging system. It should be understood that in the embodiment of the present disclosure, the "conveyor belt" is used as an example only for the convenience of understanding this solution, and it does not limit the transmission form of the first transmission mechanism and the support structure.

[0116] For example, in an embodiment of the present disclosure, the imaging system 6 may include at least one of a CT imaging system and a DR imaging system, which is used to scan and detect the object to be inspected 2. For example, the CT imaging system includes structures such as a ray source and a detector. CT imaging is to use an X-ray beam to scan a layer of a certain thickness on the object to be inspected, and the X-rays passing through the layer are received by the detector, converted into visible light, and then converted into electrical signals by a photoelectric converter, and then converted into digital signals by an analog / digital converter. After being processed by a computer, a CT image is obtained. CT imaging has high resolution and good spatial resolution, thereby obtaining a clear three-dimensional image. For example, the DR imaging system includes structures such as an electronic cassette, a scanning controller, and an image monitor. DR imaging is to directly convert X-ray photons into digital images through an electronic cassette, that is, to obtain a DR image. DR imaging is fast, has a small amount of radiation, and also has high spatial resolution and low noise rate.

[0117] To ensure imaging integrity and accuracy, the detection surface and the primary beam plane must be coplanar. The axis parallel to the primary beam plane is defined as the Z axis, and the axis parallel to the object's travel direction is defined as the X axis. The Y axis is defined as perpendicular to both the X and Z axes. The scanning area formed by the radiation emitted by the radiation source is approximately conical.

[0118] In the embodiment of the present disclosure, the posture adjustment structure is used to adjust the object to be inspected 2 to a preset inspection position.

[0119] In the plane where the main beam plane is located, the relative positions of the imaging system and the object under test can be changed, so that the imaging system can scan and detect the object under test at multiple angles.

[0120] For example: the ray source and detector in the imaging system are stationary, and the object under test rotates around the X-axis; or the ray source and detector in the imaging system rotate around the axis of the detection channel, and the object under test is stationary; or the ray source and detector in the imaging system rotate around the axis of the detection channel, and the object under test rotates around the X-axis.

[0121] Of course, an imaging system may include multiple ray sources and multiple detectors, and the multiple ray sources are respectively arranged opposite to the multiple detectors. The ray sources and the detectors form a source-detector assembly, wherein a main beam plane is formed between each source-detector assembly, and the main beam planes of the multiple source-detector assemblies are located in the same plane.

[0122] It should be noted that a source-detector assembly includes at least one ray source and one detector, that is, the source-detector assembly can be composed of one ray source and one detector, or it can be composed of one ray source and multiple detectors.

[0123] The posture adjustment structure can adjust the posture of the object to be inspected so that the detection surface and the main beam planes of the multiple source-detector assemblies are in the same plane.

[0124] In some exemplary embodiments of the present disclosure, within the plane where the main beam plane is located, the relative positions of the imaging system and the object under inspection can be changed, so that the imaging system can scan and inspect the object under inspection at multiple angles.

[0125] In some exemplary embodiments of the present disclosure, the imaging system is capable of rotating relative to the object under inspection within a plane where the main beam plane is located.

[0126] In some exemplary embodiments of the present disclosure, the imaging system includes multiple radiation sources and multiple detectors, and the multiple radiation sources are respectively arranged relative to the multiple detectors to form multiple source-detector assemblies, and a main beam plane is formed between each source-detector assembly, and the main beam planes of the multiple source-detector assemblies are located in the same plane; the posture adjustment structure can adjust the posture of the object to be inspected so that the detection plane and the main beam planes of the multiple source-detector assemblies are in the same plane.

[0127] In some exemplary embodiments of the present disclosure, the posture adjustment structure is capable of moving the object to be inspected in a first direction so that the object to be inspected has multiple detection surfaces, wherein the first direction is parallel to a conveying direction of the object to be inspected.

[0128] In some exemplary embodiments of the present disclosure, for each detection plane, the posture adjustment structure can position the object to be detected so that the detection plane and the main beam plane are in the same plane.

[0129] In some exemplary embodiments of the present disclosure, the object to be inspected includes a detection portion having the detection surface, and a ratio of an area value of a projection of the detection portion along the first direction to a size value of the detection portion in the first direction is greater than or equal to 10.

[0130] In some exemplary embodiments of the present disclosure, the ratio of the size of the detector in the first direction to the size of the detection part in the first direction is in the range of 1 to 8. That is, the detector only needs to cover the detection part of the object to be inspected. In this way, in the embodiments of the present disclosure, a detector with a narrow width and high resolution can be selected. For example, the width of the detector (that is, the size in the first direction) can be less than 100 mm, and the pixel size of the detector can be less than 500 microns. In the embodiments of the present disclosure, a detector with a narrow width and high resolution can be selected, which is conducive to reducing costs.

[0131] In some exemplary embodiments of the present disclosure, the focal spot size of the ray source is less than or equal to 1 mm. In other words, a ray source with a smaller focal spot size can be selected to ensure spatial resolution.

[0132] It is understandable that in the field of radiation detection, radiation imaging technology can image the damage inside an object, which is convenient for detection personnel to judge. Among the objects to be detected, there are areas to be detected with a relatively small detection size. For example, in the embodiments of the present disclosure, the objects to be detected may include items such as lithium batteries. In the detection process of lithium batteries, it is necessary to detect the thin film or glue layer of the lithium battery, but the thickness of the thin film or glue layer of the lithium battery is relatively small. Combined with reference Figure 20 and Figure 21 For example, the object under test 2, such as a lithium battery, may include a first portion 2A, a detection portion 2B, and a second portion 2C. For example, the detection portion 2B may be a thin film or adhesive layer, which has a thin layer structure. In other words, the object under test 2 has a "sandwich" thin layer structure, with the detection portion 2B being the center thin layer, and the first portion 2A and the second portion 2C being slightly located on either side of the front and back layers.

[0133] It should be noted that, in the embodiments of the present disclosure, a thin-layer structure can be understood as a structure whose thickness and cross-sectional area are not on the same order of magnitude. For example, the ratio of the area value of the projection of the thin-layer structure along its thickness direction to the size value of the thin-layer structure in the thickness direction is greater than or equal to 10.

[0134] An embodiment of the present disclosure provides a posture adjustment structure including: a base extending along a first direction, the base having a bearing surface, the bearing surface being suitable for placing an object to be inspected; a first adjustment component arranged below the base, wherein the first adjustment component includes: a frame that can slide relative to the base in a first direction; a shift rod that is rotatably arranged on the frame with a Y-axis as the rotation axis; a shift head that is arranged on the shift rod, and under the drive of the shift rod, the shift head can abut against the object to be inspected to drive the object to be inspected to deflect around a second direction on the bearing surface, and / or drive the object to be inspected to move along the first direction on the bearing surface.

[0135] The posture adjustment structure provided in the embodiments of the present disclosure can be used to adjust the motion posture of objects conveyed on a production line; it can also be used in the field of radiation detection to adjust the object to a preset detection position. When applied in the field of radiation detection, there are at least the following scenarios where the posture adjustment structure of the present disclosure is required, which are described as follows:

[0136] It is understandable that in the field of radiation detection, radiation imaging technology can image the damage inside an object, which is convenient for the inspectors to judge. Among the objects to be inspected, there are areas to be inspected with small dimensions. For example, in the inspection process of lithium batteries, it is necessary to inspect the film or glue layer of the lithium battery, but the thickness of the film or glue layer of the lithium battery is small. Figure 4 、 Figure 5 、 Figure 20 and Figure 21As shown in the figure, the area represented by 2B in the figure is the film or adhesive layer mentioned above, and the axis parallel to the main beam plane 61 is defined as the Z axis, and the axis parallel to the forward direction of the object under test 2 is defined as the X axis. The Y axis is defined to be perpendicular to both the X axis and the Z axis. The scanning area 62 formed by the rays emitted by the ray source 6S is approximately conical. During actual detection, the inventors found that when the measured layer of the film or adhesive layer (the detection surface parallel to the main beam plane) is offset in the third direction or the second direction, the measured layer is affected by the shape of the scanning area and is offset out of the scanning area. When the measured layer is offset out of the scanning area, part of the measured layer cannot be detected, and thus there is a problem of inaccurate detection.

[0137] In the embodiments of the present disclosure, for an object to be inspected having a thin layer structure, the thin layer to be inspected is accurately positioned so that the thin layer to be inspected is positioned within the main beam plane, and scanning detection such as circular orbit scanning can be performed on the specified thin layer. During the imaging process, it can be ensured that the rays only pass through the central layer (i.e., the thin layer structure 2B), or pass through the front and rear layers as little as possible, thereby improving image accuracy.

[0138] For example, refer to Figures 6 to 19 The posture adjustment structure 4 includes a first adjustment assembly 42 disposed on the first transmission mechanism 3. The first adjustment assembly 42 includes a lever 4221 rotatably disposed on the frame 421 about the Y-axis; and a shift head 4222 disposed on the lever 4221. Driven by the lever 4221, the shift head 4222 can abut against the object 2 to cause the object 2 to deflect in the Y direction on the carrying surface 411 and / or to move in the X direction on the carrying surface 411.

[0139] The supporting structure 41 in the embodiment of the present disclosure is arranged to extend along the X direction, and multiple objects 2 can be placed at intervals on the supporting surface 411 of the supporting structure 41. The supporting structure 41 can be a common production conveyor line, such as a production operating table, a placement flow line, etc.

[0140] The support structure 41 is designed as an assembly line-style support frame, comprising two opposing frames, with the first adjustment assembly positioned between the two frames. The frames have an L-shaped cross-section, comprising a horizontal support arm and a vertical support arm. Support rails are mounted on the horizontal support arms, and the upper surfaces of the support rails are configured as the support surfaces 411. The object 2 is positioned across the two support rails and supported by the support rail support surfaces 411, thereby providing support for the object 2.

[0141] The object under inspection 2 in the embodiment of the present disclosure may be a lithium battery. When the lithium battery is placed on the carrying surface 411 , it is necessary to ensure that the plane where the thickness of its adhesive layer or film layer is located faces the radiation source of the imaging system 6 .

[0142] In the embodiment of the present disclosure, the first adjustment assembly 42 further includes a rotating member 422. The rotating member 422 is rotatably disposed on the frame 421 with the Y axis as its rotation axis. Driven by an external force, the rotating member 422 is used to drive the object under inspection 2 to deflect around the Y direction on the supporting surface 411. Driven by the frame 421, the rotating member 422 can also drive the object under inspection 2 to move along the X direction.

[0143] It is understood that the rotating member 422 may have various structural forms. The rotating member 422 in the embodiment of the present disclosure is in the form of a combination of a lever 4221 and a lever head 4222. The specific structure is as follows:

[0144] A lever 4221 is mounted on the frame 421. The lever 4221 is rotatably mounted on the frame 421 about the Y-axis. A rotating shaft 4223 is mounted on the frame 421 along the Y-axis and is fixed to the frame 421. Furthermore, the frame 421 has a frame extending horizontally between the frame members. The rotating shaft 4223 is located at the center of the upper end of the frame. This central location ensures that the length of the rotating arm of the lever 4221, which is mounted on the rotating shaft 4223, remains consistent, facilitating subsequent adjustment of the offset angle.

[0145] It will be appreciated that, in order to rotatably mount the shift lever 4221 on the rotating shaft 4223, in the disclosed embodiment, the shift lever 4221 is mounted on an adapter block 4224, with the two shift levers 4221 positioned opposite each other on the adapter block 4224. A mounting hole is machined in the center of the adapter block 4224, into which a bearing 4225 and a retaining ring 4226 are embedded, preventing the bearing 4225 from being dislodged from the mounting hole. The rotating shaft 4223 is fitted within the bearing 4225, enabling the adapter block 4224 to rotate about the rotating shaft 4223, thereby driving the shift lever 4221 to rotate about the Y direction.

[0146] The first adjustment component 42 in the embodiment of the present disclosure also includes a dial head 4222, which is arranged on the dial rod 4221. Under the drive of the dial rod 4221, the dial head 4222 can abut against the object under test 2 to drive the object under test 2 to deflect around the Y direction on the carrying surface 411, and drive the object under test 2 to move along the X direction on the carrying surface 411.

[0147] In the embodiment of the present disclosure, a dial head 4222 is respectively installed at the end of the two dial rods 4221. The dial head 4222 protrudes from the bearing surface 411 and can abut against the end surface of the object 2 facing away from the direction of movement when the frame 421 moves. In order to achieve deflection of the object 2, the abutting position of the dial head 4222 deviates from the center position of the end surface.

[0148] It can be understood that the process by which the shifting head 4222 causes the object 2 to deviate in the Y direction on the carrying surface 411 is as follows: when the frame 421 is driven by an external force to move to the object 2, if it is detected that the object 2 has deviated in the Y direction, the adapter block 4224 rotates, driving the shifting rod 4221 to rotate, causing the shifting head 4222 on the shifting rod 4221 to act on the object 2. The shifting head 4222 pushes the object 2 to rotate, thereby correcting the deviation of the object 2. Whether the object 2 has deviated in the Y direction can be detected by using a position sensor to detect the spatial position coordinates of the current object 2 to determine whether it has deviated; it can also be determined based on the detection result of the previous object 2. If the detection result of the previous object 2 indicates that it has deviated, the deviation of the current object 2 needs to be adjusted.

[0149] It can be understood that after the deviation correction of the object 2 is completed, when the rack 421 continues to move along the X direction, the dial head 4222 can push the object 2 to move along the X direction to enter the next detection step.

[0150] It is understood that in some embodiments, under the drive of the lever 4221, the shift head 4222 may only contact the object 2 to drive the object 2 to deflect around the Y direction on the supporting surface 411. The movement of the object 2 in the X direction may be driven by other structures.

[0151] It can be understood that in some embodiments, the rotating member 422 can also be a combination of a turntable and a lifting structure. Specifically, the turntable is arranged on the lifting structure, and driven by the lifting structure, the turntable can perform lifting movement in the Y direction. When the turntable rises, it can support the object to be inspected 2 on the supporting structure 41. The turntable is also rotatably arranged on the lifting structure. Driven by an external force, the turntable can rotate around the Y direction while supporting the object to be inspected 2. Furthermore, the lifting structure is fixed on the frame 421. Driven by the frame 421, the turntable can also move along the X direction, thereby realizing the adjustment of the offset of the object to be inspected 2 in the Y direction.

[0152] Reference Figures 6 to 12 In the embodiment of the present disclosure, the first adjustment assembly 42 further includes a first drive unit 4227, which is used to drive the rotation of the adapter block 4224. Specifically, the first drive unit 4227 includes a push rod 42271 that can move toward or away from the adapter block 4224, and a first motor 42272. One end of the push rod 42271 is movably connected to the adapter block 4224, and the other end is connected to the first motor 42272. In order to ensure that the push rod 42271 can drive the adapter block 4224 to rotate around the rotation axis 4223, the push rod 42271 needs to be connected to the end of the adapter block 4224 away from the rotation axis 4223 to generate a rotational torque when pushing.

[0153] The first motor 42272 is mounted on the frame 421. The rotation of the first motor 42272 drives the push rod 42271. A threaded sleeve 42241 is mounted on the end surface of the adapter block 4224 facing the push rod 42271. The push rod 42271 is provided with a threaded section that mates with the threaded sleeve 42241. When the push rod 42271 rotates, the threaded section rotates within the threaded sleeve 42241, driving the adapter block 4224 to rotate.

[0154] It can be understood that in the embodiment of the present disclosure, there are two sets of first drive units 4227, which are arranged symmetrically about the rotating shaft 4223. When the two sets of first drive units 4227 drive the lever 4221 to rotate, the push rod 42271 of one first drive unit 4227 moves toward the lever 4221, and the push rod 42271 of the other first drive unit 4227 moves away from the lever 4221.

[0155] It can be understood that in some other embodiments, the number of first drive units 4227 can be one set. When the first drive unit 4227 is a set, the push rod 42271 and the adapter block 4224 can be adjusted by a universal joint in conjunction with the telescopic rod to achieve reciprocating swing of the lever 4221 around the Y direction.

[0156] It can be understood that in some embodiments, there may be multiple dial heads 4222 installed on the dial rod 4221 to adjust the dial position.

[0157] As described above, in the embodiment of the present disclosure, when the frame 421 moves, it has the function of pushing the object 2 to be inspected along the X-direction through the dial head 4222. The objects 2 to be inspected are placed on the support structure 41 in an interval manner. When the frame 421 drives the previous object 2 to move to the next process along the X-direction, the frame 421 can be driven backward, and the dial head 4222 can be again abutted against the end face of the object 2 facing away from the direction of movement to push the object 2 to move along the X-direction. In order to achieve continuous conveyance of the object 2 on the support structure 41 by the first adjustment component 42, in the embodiment of the present disclosure, it is also necessary that the dial head 4222 is rotatably disposed on the dial rod 4221 and can rotate around the axis of the dial rod 4221. It is constructed as an eccentric structure, wherein the dial head 4222 has a first position in which it extends out of the carrying surface 411 under the drive of the eccentric force and a second position in which it flips to below the carrying surface 411 under the action of an external force; when the frame 421 moves along the X direction, the dial head 4222 is at the first position and is used to push the object under inspection 2 to move along the X direction.

[0158] The dial head 4222 has: a push surface 42222, suitable for abutting against the object 2 to be inspected; a guide surface 42223, which is set at an angle to the push surface 42222 and suitable for bearing external forces. The dial head 4222 in this embodiment is in the shape of a right triangle, the above-mentioned push surface 42222 is equivalent to the plane where the right-angled side is located, and the guide surface 42223 is equivalent to the plane where the oblique angled side is located. The limiting structure 42224 is used to limit the rotation of the dial head 4222 when it moves to the first position, wherein, when the frame 421 moves in the negative direction along the X-axis, the guide surface 42223 hits the object 2 to drive the dial head 4222 to move to the second position. The limiting structure 42224 is a limiting block set on the guide surface 42223 and protruding from the guide surface 42223.

[0159] In order to ensure that the center of the dial head 4222 and the rotation center do not coincide, a counterweight block 42221 is provided on the dial head 4222 for adjusting the eccentricity of the dial head 4222 so as to realize that the push surface 42222 is parallel to the YZ plane at the first position. The parallel setting of the push surface 42222 and the YZ plane can ensure that when the push surface 42222 pushes the object to be inspected 2, the push surface 42222 is in contact with the object to be inspected 2, thereby ensuring the smooth movement of the object to be inspected 2 on the carrying surface 411.

[0160] In the embodiment of the present disclosure, the incoming material of the inspected object 2 is transmitted at the incoming material point of the support structure 41 at regular intervals. However, the incoming material point of the inspected object 2 is relatively far away from the scanning area, resulting in a relatively long forward or backward travel of the rack 421 between the incoming material point and the scanning area, which increases the transmission time of the inspected object 2. In order to solve the above problem, in the embodiment of the present disclosure, the dial head 4222 is rotatably provided at the end of the rack 421 away from the first adjustment component 42, and the dial head 4222 is spaced apart from the dial head 4222 in the first component in the X direction. The distance of the above interval can be half of the distance between the incoming material point and the scanning area. When the rack 421 retreats a certain distance, it can drive two inspected objects 2 to move forward at a time when it moves forward again, thereby improving the transmission efficiency of the inspected objects 2.

[0161] It can be understood that when there are multiple objects 2 to be inspected at one time, multiple dial heads 4222 can be adaptively provided in the X direction to improve the transmission efficiency of the objects 2 to be inspected.

[0162] As described above, in the thin film or adhesive layer to be tested, there is a detection surface 21 parallel to the main beam plane 61. When the detection surface is offset in the Z direction, it may also be offset outside the scanning area due to the shape of the scanning area. Based on this, the embodiment of the present disclosure also includes a second adjustment assembly 43. After the detection object 2 completes its Y-direction offset correction on the first adjustment assembly 42, it enters the second adjustment assembly 43 under the push of the dial head 4222.

[0163] In the embodiment of the present disclosure, the detection device also includes a second slide rail 35, which is fixed to the frame 421, and the second slide rail 35 is used to support the sliding mechanism 34. The sliding mechanism 34 is provided with a slide groove 36 for cooperating with the second slide rail 35, and the sliding mechanism 34 can slide on the second slide rail 35 through the slide groove 36. At the same time, the cooperation between the slide groove 36 and the second slide rail 35 supports the sliding mechanism 34, increasing the stability of the sliding mechanism 34 when moving. In addition, the extension direction of the second slide rail 35 is parallel to the extension direction of the lead screw 32. When the lead screw 32 drives the sliding mechanism 34 to move, the second slide rail 35 can cooperate with the lead screw 32 to guide the movement direction of the sliding mechanism 34, ensuring that the direction in which the sliding mechanism 34 pushes the object 2 to move does not deviate. For example, the second slide rail 35 can be a linear guide rail parallel to the extension direction of the lead screw 32.

[0164] like Figure 3 As shown, the rack 421 is a square frame structure, with slide grooves 36 installed on its two oppositely arranged frame edges respectively, and a second slide rail 35 is installed on the inner side surface of the vertical wall of the supporting structure 41. The slide groove 36 is slidably arranged on the second slide rail 35, and under the drive of external force, the rack 421 is moved in the X direction relative to the supporting structure 41.

[0165] It can be understood that the external force can be driven by human power, electric drive, hydraulic drive, pneumatic drive, etc.

[0166] Optionally, in the embodiment of the present disclosure, if Figure 2 and Figure 3 As shown, two first and second slide rails 33, 35 are provided, one on each side of the sliding mechanism 34. Multi-point support can increase the stability of the sliding mechanism 34 and the movement of the object 2. However, it should be understood that the number of first and second slide rails 33, 35 in the embodiment of the present disclosure is not limited to this, and multiple first and / or second slide rails 33, 35 may also be provided.

[0167] In some exemplary embodiments, the drive device 31 includes a servo motor. A servo motor can convert voltage signals into torque and speed to drive a controlled object. The servo motor's rotor speed is controlled by an input signal and responds quickly. In an automatic control system, the received electrical signal can be converted into an angular displacement or angular velocity output on the motor shaft, achieving highly accurate position control. One end of the lead screw 32 is connected to the output end of the servo motor, and the other end of the lead screw 32 is connected to the frame 421. The lead screw 32 can rotate relative to the frame 421 about the central axis of the lead screw 32 as the rotation axis 4223.

[0168] The servo motor can drive the lead screw 32 to drive the sliding mechanism 34 to move back and forth along the second slide rail 35 through forward and reverse rotation, thereby realizing the transportation of the test objects 2 in batches.

[0169] In the embodiment of the present disclosure, at least one first adjustment component 42 is provided on the sliding mechanism 34. When the sliding mechanism 34 moves along the extension direction of the lead screw 32, the first adjustment component 42 can move with the sliding mechanism 34 and simultaneously push the object 2 to move on the first slide rail 33.

[0170] Furthermore, the distance between the connection point between the sliding mechanism 34 and the lead screw 32 and the first adjustment assembly 42 should be no less than the length of the support structure 41, so that when the object 2 is transferred from the first slide rail 33 to the support structure 41, one end of the pushing assembly provided on the sliding mechanism 34 can extend outside the second slide rail 35, thereby continuing to push the object 2 to slide on the support structure 41 until the object 2 passes through the scanning area 62 of the imaging system 6 and is finally transferred out from the exit side of the imaging system 6, as shown in FIG. Figure 13 shown.

[0171] Reference Figure 14 、 Figure 18 and Figure 19 The second adjustment component 43 is arranged on the support structure 41. The second adjustment component 43 includes: a support plate 431, which is rotatably arranged on the support structure 41 with the Z axis as the rotation axis, and is suitable for receiving the object under test 2. The support plate 431 in the embodiment of the present disclosure is a support beam structure. In order to achieve stable support for the object under test 2, the number of support plates 431 is two, and they are respectively arranged on the support structure 41 in a hinged manner, wherein the horizontal support arms of the two frames of the support structure 41 are respectively provided with hinged seats 433 to achieve connection with the support plates 431.

[0172] One end of the support plate 431 close to the first adjustment assembly 42 is hinged to the support structure 41. In order to ensure that the object 2 moves smoothly from the first adjustment assembly 42 to the second adjustment assembly 43, the height of the bearing surface 411 can be controlled to be higher than the upper surface of the support plate 431 in the Y direction.

[0173] In order to drive the support plate 431 to rotate, the second adjustment assembly 43 further includes: a second driving unit 432, which is provided on the supporting structure 41 and arranged below the support plate 431 away from the hinge end, for driving the support plate 431 to rotate.

[0174] like Figure 15 and Figure 16As shown, the second driving unit 432 includes: a second motor 4321, which is arranged on the supporting structure 41; a lifting rod 4322, which is arranged on the motor shaft of the second motor 4321, one end of which is connected to the support plate 431, and the second motor 4321 drives the lifting rod 4322 to rotate through a coupling, one end of the lifting rod 4322 is connected to the joint 434 arranged on the lower end surface of the support plate 431, and the lifting rod 4322 can be screwed to the joint 434. As the second motor 4321 rotates forward and reverse, the lifting rod 4322 can be rotated forward and reverse, thereby driving the support plate 431 to rotate clockwise or counterclockwise around the hinge axis.

[0175] It can be understood that the second driving unit 432 can be driven in various ways. In some embodiments, common push rod 42271 motor drive, cylinder telescopic drive, etc. are adopted.

[0176] The object 2 placed on the support surface 411 is adjusted for displacement in the Y direction by the lever 4221 of the first adjustment assembly 42 and the lever head 4222. Then, driven by the frame 421 and the lever head 4222, it moves in the X direction and enters the second adjustment assembly 43. Driven by the support plate 431 of the second adjustment assembly 43, the object 2 is adjusted for displacement in the Z direction, thereby adjusting its posture and entering the next step of the radiation imaging process.

[0177] It should be noted that the radiation in the imaging process is susceptible to attenuation when passing through metal objects, so the support plate 431 and other structures in the second adjustment assembly 43 of this embodiment are preferably made of carbon fiber material.

[0178] It should be noted that the inventors discovered in actual production that the stiffness of supports made of carbon fiber is average. After repeated use, the support plate 431 is prone to bending and deformation. When different types of test objects 2 are placed on the support plate 431, the degree of bending and deformation of the support plate 431 varies due to the weight changes of the test objects 2. This requires adjusting the rotation angle of the support plate 431 each time, which increases the operation process. Based on this, the present disclosure provides another embodiment of the second adjustment component 43.

[0179] In the X direction, the two sets of second adjustment components 43 are spaced apart. When performing radiation imaging, the scanning area 62 of the radiation imaging is exactly within the spaced apart area. This arrangement ensures that the support plate 431 uses a metal with better rigidity without causing attenuation of the radiation.

[0180] In the disclosed embodiment, the transport system for the detection device may further include a second transmission mechanism 5. The second transmission mechanism 5 is disposed on the exit side of the imaging system 6 and is coupled to the support structure 41. The second transmission mechanism 5 is used to transport the test object 2 from the support structure 41. After the test object 2 passes the inspection of the imaging system 6, it is transported to the transfer area via the second transmission mechanism 5 to await subsequent processing. Furthermore, by providing the second transmission mechanism 5, the test object 2 can be transported to a location away from the imaging system 6, thereby preventing the test object 2 from being affected by radiation when it is removed.

[0181] It should be noted that the connection relationship between the support structure 41 and the second transmission mechanism 5 is similar to the connection relationship between the first transmission mechanism 3 and the support structure 41, and the connection relationship between the first transmission mechanism 3 and the support structure 41 has been introduced in detail above and will not be repeated here.

[0182] Optionally, in the disclosed embodiment, the second transmission mechanism 5 can be used for conveying objects 2 using unpowered conveying. Specifically, after the object 2 is conveyed by the support structure 41 onto the second transmission mechanism 5, the object 2 can slide along the second transmission mechanism 5 under its own weight, achieving conveyance of the object 2. This unpowered conveying method offers low conveying costs and ensures normal conveyance of the object 2.

[0183] For example, the second transmission mechanism 5 can be an unpowered roller conveyor platform, which is tilted and equipped with multiple freely rotatable rollers. After the object 2 is transferred from the support structure 41 to the roller conveyor platform, the object 2 slides to the bottom of the roller conveyor platform using the rollers on the roller conveyor platform, completing the conveyance process of the object 2.

[0184] Optionally, in the disclosed embodiment, the second transmission mechanism 5 can also utilize a powered conveying method. Powered conveying provides a longer conveying distance, a more stable conveying process, and higher conveying efficiency. For example, the second transmission mechanism 5 can utilize various conveying methods, such as belt conveying, powered roller conveying, synchronous belt conveying, or screw conveying.

[0185] In the disclosed embodiment, protective covers 11 are provided on both the inlet and outlet sides of the imaging system 6 to shield the radiation emitted by the imaging system 6. Furthermore, the protective covers 11 are positioned outside the first transmission mechanism 3, the support structure 41, and the second transmission mechanism 5, thereby largely isolating the scanning and detection radiation, providing effective radiation protection.

[0186] Furthermore, in the embodiment of the present disclosure, the protective cover 11 is formed by bending sheet metal, and a lead layer is provided on the outer surface of the protective cover 11 to enhance the radiation shielding effect.

[0187] The operating principle of the transmission system for detection equipment in the disclosed embodiment is as follows: the first transmission mechanism 3, the support structure 41, and the second transmission mechanism 5 are all arranged inside the protective cover 11 to reduce the radiation radiation of the imaging system 6. In the first transmission mechanism 3, the servo motor drives the lead screw 32 to drive the sliding mechanism 34 along the second slide rail 35. The first adjustment assembly 42 is installed on the sliding mechanism 34. The first adjustment assembly 42 pushes the inspection object 2 to move on the first slide rail 33 to the support structure 41, and then slides along the support structure 41 to the scanning area 62 of the imaging system 6, where it is inspected by the imaging system 6. After the inspection of the inspection object 2 is completed, it is moved out of the protective cover 11 along the second transmission mechanism 5.

[0188] It should be noted that the conveyor system for inspection equipment in the disclosed embodiments is suitable for use in the security inspection field, and is particularly suitable for inspecting products requiring high-quality image inspection. For example, it can precisely locate ultra-thin layers such as battery adhesives and films, thereby obtaining high-quality inspection images. It should be understood that the conveyor system in the disclosed embodiments is not limited to the battery field.

[0189] According to another aspect, an embodiment of the present disclosure provides a method for acquiring characteristic information of an object to be detected, such as Figure 23 As shown, the method may include the following steps.

[0190] In step S201, the object to be inspected is controlled to pass through a detection device, wherein the detection device is used to scan and detect the object to be inspected, and the detection device includes: a detection channel, through which the object to be inspected enters and exits the detection device along a first direction; and an imaging system for scanning and detecting the object to be inspected.

[0191] In step S202, the imaging system is controlled to perform radiation scanning on the object to be inspected.

[0192] In step S203, a radiation scanning image of the object under inspection is obtained.

[0193] In step S204, characteristic information of the object under inspection is acquired through the radiation scanning image.

[0194] For example, the object 2 includes a first part 2A, a detection part 2B and a second part 2C. When controlling the imaging system to perform radiation scanning on the object, the detection part is located between the first part and the second part in the first direction.

[0195] In the embodiment of the present disclosure, the object under test 2 can be controlled to be positioned in the scanning area, and after the slice area of interest reaches the scanning area, the imaging system is controlled to collect data for the slice of interest. In terms of the data collection method, the object can be stationary and complete circular orbit data can be collected, or the object can be slowly moved and complete spiral orbit data can be collected. After the slice of interest is collected, data reconstruction is performed. The posture adjustment structure can quickly adjust the object under test 2 to the next slice of interest, and after the next slice area of interest reaches the scanning area, the imaging system is controlled to collect data for the next slice of interest. In this way, the entire scanning process of all slices of interest of the object under test 2 is completed. Therefore, in the embodiment of the present disclosure, high-resolution inspection of the slice of interest can be achieved while ensuring detection efficiency. In addition, the components of the imaging system can be adaptively adjusted according to the specific circumstances of the object under test, and there are more options in flexibility.

[0196] In the embodiments of the present disclosure, the posture of the object under test can be first obtained, and then the posture of the object under test can be automatically adjusted to realize the automatic positioning scanning process of the thin layer. Specifically, the imaging system 6 can be used to scan the object under test 2 to obtain a first image of the object under test 2. By analyzing the first image, the posture of the object under test 2 can be obtained; based on the obtained posture of the object under test 2, the posture adjustment structure can be controlled to adjust the posture of the object under test 2 so that the detection surface of the object under test 2 and the main beam plane of the imaging system 6 are in the same plane; then, the imaging system 6 is controlled to perform radiation scanning on the object under test 2 to obtain a second image of the object under test 2, for example, the second image can be a slice image of the object under test 2.

[0197] In some embodiments, an additional imaging system may be used to scan the object 2 to obtain a first image of the object 2. For example, the additional imaging system may be a CT imaging system, a DR imaging system, or a visible light imaging system.

[0198] For example, refer to Figure 22 , the step of obtaining characteristic information of the object under inspection through the radiation scanning image includes: obtaining a first dividing line 2L between the detection part and the first part and a second dividing line 2R between the detection part and the second part through the radiation scanning image; calculating the size between the first dividing line 2L and the second dividing line 2R along the first direction to obtain the size of the detection part along the first direction.

[0199] According to some exemplary embodiments, the method further comprises: acquiring the volume of the detection portion.

[0200] Acquiring characteristic information of the detected object through the radiation scanning image further includes: acquiring an area of a projection of the detection portion along the first direction based on the volume of the detection portion and the size of the detection portion along the first direction.

[0201] According to some exemplary embodiments, the method further comprises: acquiring shape feature information of a projection of the detection portion along the first direction.

[0202] The obtaining of characteristic information of the object under inspection through the radiation scanning image further includes: obtaining characteristic information of a cross section of the inspection part perpendicular to the first direction based on the area of the projection of the inspection part along the first direction and the shape characteristic information of the projection of the inspection part along the first direction.

[0203] According to some exemplary embodiments, the attenuation characteristics of each of the first portion and the second portion to the radiation emitted by the imaging system are different from the attenuation characteristics of the radiation emitted by the detection portion to the imaging system.

[0204] According to some exemplary embodiments, in the radiation scanning image, the grayscale of each of the first part and the second part is different from the grayscale of the detection part, and obtaining the first dividing line between the detection part and the first part and the second dividing line between the detection part and the second part through the radiation scanning image specifically includes: determining the first dividing line according to the difference in grayscale between the detection part and the first part shown in the radiation scanning image; and determining the second dividing line according to the difference in grayscale between the detection part and the second part shown in the radiation scanning image.

[0205] For example, the shape of the projection of the detection part along the first direction is a circle, and the method of obtaining the characteristic information of the cross section of the detection part perpendicular to the first direction based on the area of the projection of the detection part along the first direction and the shape characteristic information of the projection of the detection part along the first direction specifically includes: according to the area of the projection of the detection part along the first direction, using the area calculation formula of the circle, obtaining the radius of the cross section of the detection part perpendicular to the first direction.

[0206] For example, the shape of the projection of the detection part along the first direction is a square, and the method of obtaining the characteristic information of the cross section of the detection part perpendicular to the first direction based on the area of the projection of the detection part along the first direction and the shape characteristic information of the projection of the detection part along the first direction specifically includes: obtaining the side length of the cross section of the detection part perpendicular to the first direction according to the area of the projection of the detection part along the first direction using the area calculation formula of the square.

[0207] According to some exemplary embodiments, the detection device further includes a posture adjustment structure, which is disposed in the detection channel and is used to adjust the posture of the object to be detected in the detection channel.

[0208] Controlling the imaging system to perform radiation scanning on the object under inspection includes: controlling the object under inspection to move along the first direction in the detection channel under the drive of the posture adjustment structure; and controlling the imaging system to continuously emit beams during the movement of the object under inspection to continuously perform radiation scanning on the object under inspection.

[0209] According to some exemplary embodiments, the imaging system includes a ray source for generating rays, the ray source is arranged on one side of the detection channel, and the rays at least form a main beam plane suitable for scanning and detecting the object to be inspected.

[0210] The controlling the imaging system to perform radiation scanning on the object under inspection further includes: adjusting the posture of the object under inspection so that: during the radiation scanning process, the inspected surface of the object under inspection and the main beam plane are in the same plane.

[0211] For example, a ratio of an area value of a projection of the detection portion along the first direction to a size value of the detection portion in the first direction is greater than or equal to 10.

[0212] For example, a ratio of a size of the detector in the first direction to a size of the detection portion in the first direction is in a range of 1 to 8.

[0213] Figure 24 The structure block diagram of the apparatus for acquiring characteristic information of an object under test according to an embodiment of the present disclosure is schematically shown. The apparatus 800 for acquiring characteristic information of an object under test comprises a motion control module 810 , a radiation scanning control module 820 , an image acquisition module 830 and a characteristic information acquisition module 840 .

[0214] The motion control module 810 is used to control the object to be inspected to pass through the detection device, wherein the detection device is used to scan and detect the object to be inspected, and the detection device includes: a detection channel, through which the object to be inspected enters and exits the detection device along a first direction; and an imaging system for scanning and detecting the object to be inspected.

[0215] The radiation scanning control module 820 is used to control the imaging system to perform radiation scanning on the object to be inspected.

[0216] The image acquisition module 830 is used to acquire a radiation scanning image of the object under inspection.

[0217] The characteristic information acquisition module 840 is used to acquire characteristic information of the object under inspection through the radiation scanning image, wherein the object under inspection includes a first part, a detection part and a second part. In the process of controlling the imaging system to perform radiation scanning on the object under inspection, the detection part is located between the first part and the second part in the first direction. The acquiring characteristic information of the object under inspection through the radiation scanning image includes: acquiring a first dividing line between the detection part and the first part and a second dividing line between the detection part and the second part through the radiation scanning image; and calculating the size between the first dividing line and the second dividing line along the first direction to obtain the size of the detection part along the first direction.

[0218] According to an embodiment of the present disclosure, any multiple modules among the motion control module 810, the radiation scanning control module 820, the image acquisition module 830 and the feature information acquisition module 840 can be combined into one module for implementation, or any one of the modules can be split into multiple modules. Alternatively, at least part of the functions of one or more of these modules can be combined with at least part of the functions of other modules and implemented in one module. According to an embodiment of the present disclosure, at least one of the motion control module 810, the radiation scanning control module 820, the image acquisition module 830 and the feature information acquisition module 840 can be at least partially implemented as a hardware circuit, such as a field programmable gate array (FPGA), a programmable logic array (PLA), a system on a chip, a system on a substrate, a system on a package, an application specific integrated circuit (ASIC), or can be implemented by hardware or firmware such as any other reasonable way of integrating or packaging the circuit, or can be implemented in any one of the three implementation methods of software, hardware and firmware or in an appropriate combination of any of them. Alternatively, at least one of the motion control module 810, the radiation scanning control module 820, the image acquisition module 830 and the feature information acquisition module 840 can be at least partially implemented as a computer program module, which can perform corresponding functions when executed.

[0219] Figure 25 The block diagram schematically shows an electronic device suitable for implementing a method for acquiring characteristic information of a detected object according to an embodiment of the present disclosure.

[0220] like Figure 25 As shown, the electronic device 900 according to an embodiment of the present disclosure includes a processor 901, which can perform various appropriate actions and processes according to a program stored in a read-only memory (ROM) 902 or a program loaded from a storage part 908 into a random access memory (RAM) 903. The processor 901 may, for example, include a general-purpose microprocessor (e.g., a CPU), an instruction set processor and / or a related chipset and / or a dedicated microprocessor (e.g., an application-specific integrated circuit (ASIC)), etc. The processor 901 may also include an onboard memory for caching purposes. The processor 901 may include a single processing unit or multiple processing units for performing different actions of the method flow according to an embodiment of the present disclosure.

[0221] Various programs and data required for the operation of the electronic device 900 are stored in the RAM 903. The processor 901, the ROM 902, and the RAM 903 are connected to each other via a bus 904. The processor 901 executes the various operations of the method flow according to the embodiment of the present disclosure by executing the programs in the ROM 902 and / or the RAM 903. It should be noted that the programs may also be stored in one or more memories other than the ROM 902 and the RAM 903. The processor 901 may also execute the various operations of the method flow according to the embodiment of the present disclosure by executing the programs stored in the one or more memories.

[0222] According to an embodiment of the present disclosure, the electronic device 900 may further include an input / output (I / O) interface 905, which is also connected to the bus 904. The electronic device 900 may further include one or more of the following components connected to the I / O interface 905: an input portion 906 including a keyboard, a mouse, etc.; an output portion 907 including a cathode ray tube (CRT), a liquid crystal display (LCD), etc., and a speaker; a storage portion 908 including a hard disk, etc.; and a communication portion 909 including a network interface card such as a LAN card or a modem. The communication portion 909 performs communication processing via a network such as the Internet. A drive 910 is also connected to the I / O interface 905 as needed. A removable medium 911, such as a magnetic disk, an optical disk, a magneto-optical disk, a semiconductor memory, etc., is installed in the drive 910 as needed, so that a computer program read therefrom can be installed into the storage portion 908 as needed.

[0223] The present disclosure also provides a computer-readable storage medium, which may be included in the device / apparatus / system described in the above embodiments, or may exist independently and not be incorporated into the device / apparatus / system. The computer-readable storage medium carries one or more programs, and when executed, implements the method according to the embodiments of the present disclosure.

[0224] According to an embodiment of the present disclosure, a computer-readable storage medium may be a non-volatile computer-readable storage medium, for example, it may include but is not limited to: a portable computer disk, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination thereof. In the present disclosure, a computer-readable storage medium may be any tangible medium containing or storing a program that can be used by or in combination with an instruction execution system, apparatus, or device. For example, according to an embodiment of the present disclosure, a computer-readable storage medium may include the ROM 902 and / or RAM 903 described above and / or one or more memories other than ROM 902 and RAM 903.

[0225] The embodiments of the present disclosure also include a computer program product, which includes a computer program containing program code for executing the method shown in the flowchart. When the computer program product is executed in a computer system, the program code is used to cause the computer system to implement the item recommendation method provided by the embodiments of the present disclosure.

[0226] The computer program executes the above functions defined in the system / device of the embodiment of the present disclosure when the processor 901 executes the computer program. According to the embodiment of the present disclosure, the system, device, module, unit, etc. described above can be implemented by a computer program module.

[0227] In one embodiment, the computer program may be stored on a tangible storage medium such as an optical storage device or a magnetic storage device. In another embodiment, the computer program may be transmitted and distributed in the form of a signal on a network medium, downloaded and installed via the communication portion 909, and / or installed from a removable medium 911. The program code contained in the computer program may be transmitted using any appropriate network medium, including but not limited to wireless, wired, or any suitable combination thereof.

[0228] In such an embodiment, the computer program can be downloaded and installed from a network via the communication section 909, and / or installed from a removable medium 911. When the computer program is executed by the processor 901, the above-described functions defined in the system of the embodiment of the present disclosure are performed. According to the embodiment of the present disclosure, the systems, devices, means, modules, units, etc. described above can be implemented by computer program modules.

[0229] The embodiments of the present disclosure are described above. However, these embodiments are for illustrative purposes only and are not intended to limit the scope of the present disclosure. Although each embodiment has been described separately above, this does not mean that the measures in each embodiment cannot be used in combination to advantage. The scope of the present disclosure is defined by the appended claims and their equivalents. Without departing from the scope of the present disclosure, those skilled in the art may make various substitutions and modifications, which should all fall within the scope of the present disclosure.

Claims

1. A method for obtaining characteristic information of an object under inspection, characterized in that: include: Controlling the object to be inspected to pass through a detection device, wherein the detection device is used to scan and detect the object to be inspected, and the detection device comprises: a detection channel, through which the object to be inspected enters and exits the detection device along a first direction; and an imaging system for scanning and detecting the object to be inspected; controlling the imaging system to perform radiation scanning on the object to be inspected; Acquiring a radiation scanning image of the object under inspection; Acquire characteristic information of the object under inspection through the radiation scanning image, The object to be inspected includes a first part, a detection part, and a second part. When controlling the imaging system to perform radiation scanning on the object to be inspected, the detection part is located between the first part and the second part in the first direction. Acquiring characteristic information of the object under inspection through the radiation scanning image includes: acquiring, through the radiation scanning image, a first dividing line between the detection portion and the first portion and a second dividing line between the detection portion and the second portion; The dimension between the first dividing line and the second dividing line along the first direction is calculated to obtain the dimension of the detection portion along the first direction.

2. The method according to claim 1, characterized in that Also includes: Obtaining the volume of the detection portion, The acquiring characteristic information of the object under inspection through the radiation scanning image further includes: Based on the volume of the detection portion and the size of the detection portion along the first direction, an area of a projection of the detection portion along the first direction is acquired.

3. The method according to claim 2, characterized in that Also includes: acquiring shape feature information of the projection of the detection portion along the first direction, The acquiring characteristic information of the object under inspection through the radiation scanning image further includes: Based on the area of the projection of the detection portion along the first direction and the shape feature information of the projection of the detection portion along the first direction, feature information of a cross section of the detection portion perpendicular to the first direction is acquired.

4. The method according to any one of claims 1 to 3, characterized in that Each of the first portion and the second portion has an attenuation characteristic for the radiation emitted by the imaging system that is different from an attenuation characteristic for the radiation emitted by the detection portion.

5. The method according to claim 4, characterized in that In the radiation scanning image, the grayscale of each of the first portion and the second portion is different from the grayscale of the detection portion, The step of obtaining, by the radiation scanning image, a first boundary line between the detection portion and the first portion and a second boundary line between the detection portion and the second portion, specifically includes: determining the first dividing line according to a difference in grayscale between the detection portion and the first portion in the radiation scanning image; and The second dividing line is determined according to a difference in grayscale between the detection portion and the second portion in the radiation scanning image.

6. The method according to claim 3, characterized in that The shape of the projection of the detection portion along the first direction is a circle, and obtaining characteristic information of a cross section of the detection portion perpendicular to the first direction based on the area of the projection of the detection portion along the first direction and the shape characteristic information of the projection of the detection portion along the first direction specifically includes: obtaining a radius of the cross section of the detection portion perpendicular to the first direction according to the area of the projection of the detection portion along the first direction using a formula for calculating the area of a circle; or The shape of the projection of the detection part along the first direction is a square. The method of obtaining characteristic information of the cross section of the detection part perpendicular to the first direction based on the area of the projection of the detection part along the first direction and the shape characteristic information of the projection of the detection part along the first direction specifically includes: obtaining the side length of the cross section of the detection part perpendicular to the first direction according to the area of the projection of the detection part along the first direction and using the area calculation formula of the square.

7. The method according to any one of claims 1 to 3, characterized in that The detection device further includes a posture adjustment structure, which is arranged in the detection channel and is used to adjust the posture of the object to be detected in the detection channel. Controlling the imaging system to perform radiation scanning on the object to be inspected includes: Under the drive of the posture adjustment structure, controlling the object to be inspected to move along the first direction in the inspection channel; During the movement of the object under inspection, the imaging system is controlled to continuously emit beams, so as to continuously perform radiation scanning on the object under inspection.

8. The method according to any one of claims 1 to 3, characterized in that The imaging system includes a ray source for generating rays, the ray source being arranged on one side of the detection channel, the rays at least forming a main beam plane suitable for scanning and detecting the object to be detected, The controlling the imaging system to perform radiation scanning on the object under inspection further comprises: The posture of the object under inspection is adjusted so that: during the radiation scanning process, the inspected surface of the object under inspection and the main beam plane are in the same plane.

9. The method according to any one of claims 1 to 3, characterized in that A ratio of an area value of a projection of the detection portion along the first direction to a size value of the detection portion in the first direction is greater than or equal to 10.

10. The method according to any one of claims 1 to 3, characterized in that A ratio of a size of the detector in the first direction to a size of the detection portion in the first direction is in a range of 1 to 8.

11. The method according to claim 8, characterized in that Before controlling the imaging system to perform radiation scanning on the object under inspection, the method further includes: obtaining the posture of the object under inspection; and Based on the acquired posture of the object under inspection, the posture adjustment structure is controlled to adjust the posture of the object under inspection so that the detection surface of the object under inspection and the main beam surface of the imaging system are in the same plane.

12. The method according to claim 11, characterized in that The obtaining of the posture of the object under inspection includes: Scanning the object to be inspected using the imaging system or an additional imaging system to obtain a first image of the object to be inspected; and The posture of the object to be inspected is obtained by analyzing the first image.

13. A device for acquiring characteristic information of an object under inspection, characterized in that: include: a motion control module, configured to control the object to be inspected to pass through a detection device, wherein the detection device is configured to scan and detect the object to be inspected, and the detection device comprises: a detection channel, through which the object to be inspected passes in and out of the detection device along a first direction; and an imaging system configured to scan and detect the object to be inspected; a radiation scanning control module, configured to control the imaging system to perform radiation scanning on the object under inspection; an image acquisition module, configured to acquire a radiation scanning image of the object under inspection; and A feature information acquisition module is used to acquire feature information of the object under inspection through the radiation scanning image. The object to be inspected includes a first part, a detection part, and a second part. When controlling the imaging system to perform radiation scanning on the object to be inspected, the detection part is located between the first part and the second part in the first direction. Acquiring characteristic information of the object under inspection through the radiation scanning image includes: acquiring, through the radiation scanning image, a first dividing line between the detection portion and the first portion and a second dividing line between the detection portion and the second portion; The dimension between the first dividing line and the second dividing line along the first direction is calculated to obtain the dimension of the detection portion along the first direction.

14. An electronic device comprising: one or more processors; a storage device for storing one or more programs, When the one or more programs are executed by the one or more processors, the one or more processors are enabled to execute the method according to any one of claims 1 to 12.

15. A computer-readable storage medium having executable instructions stored thereon, which, when executed by a processor, causes the processor to perform the method according to any one of claims 1 to 12.

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