Abnormal sound measuring jig and abnormal sound measuring method

Abstract

The application discloses a kind of abnormal sound measuring tool and corresponding abnormal sound measuring method, abnormal sound measuring tool includes base, upper cover, shaft piece, placement platform, fixed part, vibrator and test element, wherein upper cover is connected to the base, and with the base form sealable box;Shaft piece is connected to the upper cover;Placement platform is used to place the device to be measured;Fixed part is set to the placement platform, to fix the device to be measured;Vibrator is used to vibrate the placement platform;Test element includes at least one test unit, the test unit is carried on the shaft piece to slide on the shaft piece, the test element includes multiple pickup elements, each pickup element is used to connect one end of sound guide piece or first sound collecting element, and each pickup element is located in independent acoustic cavity;When the test unit is driven by electric signal to slide above the device to be measured, the other end of the sound guide piece or sound collecting element is used to receive the device to be measured.This application carries out one-time product debugging by mechanization and computerization, improves the accuracy of debugging and saves the burden of manpower.

Description

Technical Field

[0001] This application relates to the field of acoustic measurement, specifically to an abnormal sound measuring fixture and a corresponding abnormal sound measuring method. Background Technology

[0002] Electronic devices and audio sources, such as laptops, Bluetooth speakers, and keyboards, have become indispensable products in both work and daily life. However, when parts fall off or foreign objects are present in these devices, resonance can cause unusual noises. Furthermore, defective products may also produce noise due to internal structural flaws or defects. Such noises can cause mental or physical discomfort to listeners. Even if the listener may not be able to clearly perceive the noise, it can significantly affect the quality of music played simultaneously. Manufacturers of high-end laptops, smartphones, and tablets are now dedicated to improving the acoustic performance of their products. However, pinpointing the location of noise (referred to as a hotspot) requires comprehensive and precise measurements by engineers, consuming significant manpower during both product development and repair phases.

[0003] In conclusion, there is a genuine need for a novel inspection fixture and inspection method to improve the aforementioned problems. More precisely, a stable, mechanized approach to product debugging is needed to improve the accuracy of debugging and reduce the burden of manpower. Summary of the Invention

[0004] To address the above problems, this application provides an abnormal sound measuring fixture and a corresponding abnormal sound measuring method, which can effectively improve the problems of the prior art.

[0005] Specifically, this application discloses an abnormal sound measurement fixture, including a base, a top cover, a shaft, a placement platform, a fixing member, a vibrator, and a test element. The top cover is connected to the base and forms a sealable enclosure with the base. The shaft is connected to the top cover. The placement platform is used to place the device under test. The fixing member is disposed on the placement platform to fix the device under test. The vibrator is used to vibrate the placement platform. The test element includes at least one test unit, which is supported by the shaft and slides on the shaft. The test element includes multiple sound pickup elements, each of which is connected to one end of a sound guide or a first sound collecting element, and each sound pickup element is located in an independent acoustic cavity. When the test element is driven by an electrical signal to slide above the device under test, the other end of the sound guide or sound collecting element is used to collect sound from the device under test.

[0006] In addition to the aforementioned noise measurement fixture, this invention also discloses a noise measurement method applied to the noise measurement fixture, comprising: placing a standard device without noise on the placement platform, and obtaining calibrated sound data under vibration conditions in a state free of foreign objects; when the vibrator is activated, placing a device with noise on the placement platform and in a state with foreign objects, and obtaining multiple training data; performing a minimum error calculation on the training data based on the calibrated sound data to generate minimum error data, wherein if the minimum error data is not less than a threshold, iteratively calculating the training data based on the calibrated sound data to generate a new minimum error data, until the minimum error data is less than the threshold; after the minimum error calculation is completed, generating a training result with the final minimum error data; and placing the device under test on the placement platform, and vibrating the placement platform in a standard state free of foreign objects to collect sound from the device under test, so as to calculate the hot spot location of the device under test associated with the noise based on the training result.

[0007] Optionally, in some embodiments of this application, the device under test is disposed on the first surface of the placement platform, and both the device under test and the vibrator are disposed on the first surface or the second surface of the placement platform, wherein the first surface is opposite to the second surface.

[0008] Optionally, in some embodiments of this application, the noise measuring fixture further includes a conductive element disposed between the vibrator and the placement platform, and directly connected to the vibrator and the placement platform respectively.

[0009] Optionally, in some embodiments of this application, the test element further includes a plurality of through holes, each of which is used to connect the sound guide or the sound collecting element, and each of the through holes has a first spacing with the adjacent through hole.

[0010] Optionally, in some embodiments of this application, the sound guide is a tubular structure.

[0011] Optionally, in some embodiments of this application, the other end of the sound guide is connected to a second sound collecting element.

[0012] Optionally, in some embodiments of this application, the design criteria for the distance between two adjacent sound guides or first sound collecting elements and the distance between them and the object under test are based on the following formula: , where x is the horizontal distance between two adjacent sound guides or first sound collecting elements, y is the vertical distance between the device under test and the sound guide or first sound collecting element, and dB is the unit of decibels.

[0013] Optionally, in some embodiments of this application, the placement platform is provided with multiple support members, and each support member has a fixed distance from the adjacent support member.

[0014] Optionally, in some embodiments of this application, the noise measurement fixture further includes a signal processor, wherein the sound pickup element is a miniature microphone unit, and the signal processor is coupled to each of the miniature microphone units to convert analog signals from each of the miniature microphone units into digital signals.

[0015] Optionally, in some embodiments of this application, the acoustic cavity and the pickup element are disposed within the test unit.

[0016] Optionally, in some embodiments of this application, the acoustic cavity and the pickup element are disposed within the signal processor.

[0017] Optionally, in some embodiments of this application, both the base and the sidewalls of the top cover are provided with sound-insulating foam.

[0018] Optionally, in some embodiments of this application, the noise measuring fixture further includes fasteners for locking the base and the top cover.

[0019] Optionally, in some embodiments of this application, the top of the base has an angled opening.

[0020] Optionally, in some embodiments of this application, the opening has an inclination angle of 30 to 60 degrees.

[0021] Optionally, in some embodiments of this application, when the pickup element is used to connect to the sound guide, the through hole includes an input port and an output port. The input port is used to connect to a second sound-collecting element, and the output port is used to connect to the other end of the sound guide. In summary, this application effectively solves the problems of the prior art through the novel solution described above, especially enabling one-time product debugging in a stable mechanized and computerized manner, greatly improving the accuracy of debugging and saving manpower. Furthermore, this invention does not increase costs significantly, effectively improving the problem of the prior art requiring a large amount of manpower to detect hotspots in electronic products while maintaining economic efficiency. Attached Figure Description

[0022] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the following description of the embodiments will be briefly introduced. Obviously, the accompanying drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0023] Figure 1 This is a schematic diagram of the noise measurement fixture according to an embodiment of the present invention.

[0024] Figure 2 This is a front view of the noise measurement fixture.

[0025] Figure 3 This is a schematic diagram of an abnormal sound measuring fixture that uses multiple adjacent sound guides to collect sound.

[0026] Figure 4 This is a detailed structural diagram of each test column unit within an abnormal sound measurement fixture according to an embodiment of the present invention.

[0027] Figure 5 This is a detailed structural diagram of each test element within the noise measurement fixture according to another embodiment of the present invention.

[0028] Figure 6 For the corresponding Figure 5 An enlarged schematic diagram of the test element inside the noise measurement fixture.

[0029] Figure 7 This is a flowchart of an abnormal sound measurement method according to an embodiment of the present invention.

[0030] Figure 8 This is a flowchart of data training using an AI algorithm according to an embodiment of the present invention. Detailed Implementation

[0031] The following embodiments are merely illustrative examples, as those skilled in the art can make various modifications and refinements without departing from the spirit and scope of the invention. Therefore, the scope of protection of this invention shall be determined by the appended claims. Throughout this specification and claims, unless explicitly specified, the terms "a" and "described" include a description comprising "a or at least one" of the stated elements or components. Furthermore, as used in this disclosure, the singular article also includes a description of a plurality of elements or components unless clearly excluded from the specific context. Moreover, when applied in this description and all the following claims, unless explicitly specified, "in which" may include both "in which" and "therein". The terms used throughout this specification and claims, unless otherwise specified, generally have their ordinary meaning in the art, in the content of this disclosure, and in the specific context. Certain terms used to describe this disclosure will be discussed below or elsewhere in this specification to provide additional guidance to those skilled in the art in describing this disclosure. Examples found anywhere in this specification, including examples of any terms used in discussion herein, are merely illustrative and do not limit the scope or meaning of this disclosure or any illustrative terms. Similarly, this disclosure is not limited to the various embodiments set forth in this specification.

[0032] The terms “approximately,” “about,” or “nearly” as used herein should generally mean that a given value or error range is within 20%, preferably within 10%. Furthermore, the quantities provided herein may be approximate, and therefore mean that unless otherwise stated, they may be expressed using the terms “approximately,” “about,” or “nearly.” When a quantity, concentration, or other numerical value or parameter has a specified range, preferred range, or lists upper and lower ideal values, it should be considered as specifically disclosing all ranges consisting of any pairs of upper and lower limits or ideal values, regardless of whether such ranges are separately disclosed. For example, if a range of length X cm to Y cm is disclosed, it should be considered as disclosing a length of H cm, where H can be any real number between X and Y.

[0033] Furthermore, "electrical coupling" or "electrical connection" herein includes any direct and indirect means of electrical connection. For example, if a first device is described as electrically coupled to a second device, it means that the first device can be directly connected to the second device, or indirectly connected to the second device through other devices or connection means. Additionally, in descriptions concerning the transmission or provision of electrical signals, those skilled in the art will understand that attenuation or other non-ideal variations may occur during the transmission of electrical signals, but unless otherwise specified, the source and receiver of the transmitted or provided electrical signal should be considered substantially the same signal. For example, if an electrical signal S is transmitted (or provided) from terminal A of an electronic circuit to terminal B of the same electronic circuit, a voltage drop may occur across the source and drain of a transistor switch and / or possible stray capacitance. However, unless the purpose of this design is to intentionally utilize attenuation or other non-ideal variations during transmission to achieve certain specific technical effects, the electrical signal S at terminals A and B of the electronic circuit should be considered substantially the same signal.

[0034] It is understood that terms such as “comprising,” “having,” and “containing,” as used herein, are open-ended terms, meaning including but not limited to. Furthermore, no embodiment or claim of this application is required to achieve all the purposes, advantages, or features disclosed herein. In addition, the abstract and headings are merely illustrative of patent document searches and are not intended to limit the scope of this application.

[0035] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this application, and not all of them. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application. In addition, it should be understood that the specific embodiments described herein are only for illustration and explanation of this application and are not intended to limit this application. In this application, unless otherwise stated, directional terms such as "upper" and "lower" generally refer to the upper and lower positions of the device in actual use or operation, specifically the drawing directions in the accompanying drawings, while "inner" and "outer" refer to the outline of the device.

[0036] Please refer to the accompanying drawings, where the same element symbols represent the same elements. The following description is based on the specific embodiments illustrated in this application and should not be construed as limiting other specific embodiments not detailed herein.

[0037] Please refer to Figures 1 to 2 , Figure 1 This is a schematic diagram of the abnormal sound measuring fixture 100 according to an embodiment of the present invention. Figure 2 This is a front view of the noise measuring fixture 100. (Example) Figure 1 As shown, the abnormal sound measuring fixture 100 includes a base 10, a top cover 20, a placement platform 30, a fixing surface 40, a fixing element 50, and a vibrator 60 (e.g., Figure 2 As shown), the conductive element 65 (as shown) Figure 2The device 10 includes a base 10, a shaft 22, a connector 23, a test unit 72, sound-absorbing foam 80, and a fastener 90. The fastener 90 is used to lock the base 10 and the top cover 20 together, and both the base 10 and the top cover 20 have sound-absorbing foam 80 on their side walls. The top cover 20 is connected to the base 10 and together they form a sealable enclosure. In other embodiments, the top cover 20 and the base 10 can be connected by a pivot connection, but this invention is not limited thereto, and any mechanism can be used for connection, as long as the top cover 20 can move relative to the base 10. The top of the base 10 may have an inclined opening, and the angle of this opening is preferably between 30 degrees and 60 degrees, but this invention is not limited thereto. The upper surface of the placement platform 30 is used to place the device under test 110, which may be, for example, a laptop computer, a music device, a keyboard, or other electronic or other electronic / mechanical devices. This invention does not particularly limit the type of device. The fixing surface 40 can be locked inside the base 10, and the placement platform 30 can be further locked above the fixing surface 40. The fixing member 50 can be locked above the placement platform 30 to fix the device under test 110 and prevent it from moving. The vibrator 60 is disposed on the lower surface of the placement platform 30, and the conductive member 65 is located between the vibrator 60 and the placement platform 30, and is in direct contact with both the vibrator 60 and the placement platform 30. It transmits the vibration generated by the vibrator 60 to the placement platform 30 through contact conduction, so as to vibrate the placement platform 30 and remove foreign objects or defective structures (e.g., foreign objects or defective structures) on the device under test 110. Figure 3 The defect source B1 shown vibrates and produces non-ideal noise. The conductor 65 can be considered part of the vibrator 60, which can be a voice coil motor (VCM), consisting of a coil, a magnet, and a suspension mechanism. Depending on the application, if the coil is fixed, it becomes a "moving iron" voice coil motor; if the magnet is fixed, it becomes a "moving coil" voice coil motor. The conductor 65 in the figure is part of the coil of the vibrator 605, i.e., included within the vibrator 60. In this embodiment, the coil can be fixed, and after an AC signal is applied, the magnet will perform repetitive linear motion along the axis. Because the magnet has a larger mass than the coil, its motion generates a larger inertia (F=ma), and the vibration will also be larger, thereby providing variation in vibration intensity. In other embodiments, the conductor 65 can also be independently disposed outside the vibrator 60, preferably with its exterior made of metal. In another embodiment, the conductor 65 may not be provided between the vibrator 60 and the placement platform 30, and the vibrator 60 may be in direct contact with the placement platform 30, thereby causing the placement platform 30 to vibrate. In this embodiment, the vibrator 60 may be a voice coil motor, a speaker, a transducer, or other actuating device.

[0038] Connector 23 connects shaft 22 and test unit 72, allowing test unit 72 to slide left and right on shaft 22. Shaft 22 can be a slide rail or other type of component, and connector 23 can be equipped with rollers that slide on the slide rail. Test unit 72 is driven by an electrical signal (e.g., Figure 4 As shown, it is electrically connected to the signal processor 71. The length of the test unit 72 can be designed to be greater than the width of the device under test 110. By sliding left and right, the test unit 72 can perform a uniform and comprehensive sound pickup scan of the device under test 110, and the movement speed of the test unit 72 can be programmably controlled to change the movement frequency to match the actual detection requirements. In this embodiment, a single shaft 22 is provided in the X direction and a single test unit 72 is used to perform a single-axis sound pickup scan in the X direction. However, in another embodiment, two or more shafts 22 can be provided, for example, dual shafts can be provided in the X and Y directions respectively, and one or more test units 72 can be used to perform a comprehensive sound pickup scan in the X and Y directions. Each test unit 72 includes multiple through holes, each of which is used to connect to a sound guide (see below). Figure 5 (The connection relationship between the through hole 79 and the sound guide tube 116 is shown) or the connection of the sound collecting element (see below). Figure 4 Each through-hole has a first spacing between it and the adjacent through-hole, for example, 1 to 5 centimeters apart, but not limited to this. The sound guide and sound collecting element can be soft or hard, and the material can be plastic, glass, metal, etc. The sound guide can be a long strip tubular structure with a hollow design to transmit sound through the air, but it can also be designed to be solid and transmit sound through the material itself.

[0039] like Figure 2 As shown, the device under test 110 is disposed on the first surface (i.e., the upper surface) of the placement platform 30, while the vibrator 60 can be disposed on the second surface (i.e., the lower surface) of the placement platform 30 and directly contact and connect with the second surface. However, in practice, it can also be disposed on the first surface of the placement platform 30, with the first surface relative to the second surface. Furthermore, the placement platform 30 is provided with multiple support members 35, each support member having a second distance from its adjacent support member. The present invention does not limit the number of support members 35, as long as the required support effect is achieved. The support members 35 are used to elevate the device under test 110, thereby avoiding the influence of unevenness of the placement platform 30 surface or dust on the surface on the measurement, thus the support members 35 can further improve the accuracy of the measurement.

[0040] When the test unit 72 moves left and right over the device under test 110, the sound guide (such as...) Figure 5 Sound tube 116) or sound collecting element (such as Figure 4The sound collecting element 75) begins close-range scanning sound detection of the device under test 110. Here, the test unit 72 may actually touch or approach the surface of the device under test 110 through the sound guide or sound collecting element. For example, Figure 3 A defect source (i.e., hot spot) B1 inside the device under test 110 is located below the sound guides A1-A3 or the sound collector 75. In this case, all sound guides A1-A3 can receive noise from the defect source B1 in the device under test 110. Since noise intensity is inversely proportional to distance, the exact location of the defect source B1 can be determined by the different noise intensities received by multiple sound guides. For example, when sound guide A2 is located directly below the defect source B1, and the noise intensity it receives is √2 times that of sound guide A3, it can be calculated that the defect source B1 is located directly below sound guide A2. (See reference) Figure 3 Assuming the horizontal distance between two adjacent sound guides or sound collectors is x, and the vertical distance between the defect source B1 of the device under test 110 and the sound guides or sound collectors in the vertical direction is y, then the optimal design criteria for the distance between adjacent sound guides or sound collectors and their distance from the object under test can be set to satisfy the following formula:

[0041]

[0042] Where dB is the unit of decibels, this design criterion will result in a better intensity difference in the detected signal, thereby improving the accuracy of signal interpretation. In another embodiment, the design criterion is preferably set to satisfy the following formula:

[0043]

[0044] In another embodiment, the design criteria can be set to satisfy the following formula:

[0045]

[0046] In the signal-to-noise ratio (SNR) = D2 / D1, D2 is the maximum amplitude of the sound source signal received by the sound guide A2, which is closest to the sound source, while D1 is the amplitude of the sound source signal received by the sound guide farthest from the sound guide A2, which can be regarded as the ambient noise (floor noise). The value of 20*log10 (SNR) can generally fall between 10dB and 40dB, but is not limited to this.

[0047] Please refer to Figure 4 , Figure 4 A detailed structural diagram of the test unit 72 within the noise measurement fixture 100 according to an embodiment of the present invention. Figure 4As shown, the noise measurement fixture 100 may further include a signal processor 71. The test unit 72 and the signal processor 71 together form a test element. Each test unit 72 includes a pickup module with multiple pickup elements 74 and multiple acoustic cavities 78. Each acoustic cavity 78 is provided with a through hole, and a pickup element 74 is provided corresponding to the through hole. That is, each pickup element 74 is located in an independent acoustic cavity 78. The acoustic cavities 78 are separated from each other by acoustic shielding material to avoid crosstalk between the pickup elements 74 and interference with external sounds. The acoustic cavities 78 can be located on the top or back of the test unit 72, and in this figure, it is set on the back as an example. The pickup element 74, such as a microphone, can be a MEMS microphone, an EMC microphone, or other forms of microphone / pickup device. Preferably, it is a miniature microphone, and it is mounted on the PCB board 73 and located in the acoustic cavity 78. In another embodiment, the acoustic cavity 78 may not have a through hole, and the pickup element 74 may be directly disposed inside the acoustic cavity 78 and electrically connected to the PCB board 73. Since the pickup element 74 is fixed to the PCB board 73, the PCB board 73 is separated from the placement platform 30 and will not be affected or interfered with by its vibration.

[0048] The signal processor 71 may include a pre-amplifier and a signal processing unit. The signal processor 71 can be wirelessly connected to each pickup element 74 via a shielded cable 79 to convert analog signals from each pickup element 74 into digital signals. Furthermore, as... Figure 4 As shown, each pickup element 74 is provided with a corresponding sound collecting element 75, such as a sound collecting cone. The sound collecting element 75 is connected to the pickup element 74 through an acoustic cavity 78 to transmit the collected sound waves to the pickup element 74. In another embodiment, a short sound guide (not shown), such as a short sound tube, can be provided between the pickup element 74 and the sound collecting element 75 for connection. The sound collecting element 75 can cover the top cover 112 of the device under test 110 (e.g., a laptop computer) to detect the status of the internal circuit 114 of the device under test 110, or it can be used to collect sound in close proximity to the top cover 112. Generally, the sound collecting element 75 is preferably attached to or very close to the device under test for better sound collection. During the signal training phase, test components, such as nails, transistors, and binder clips, can be placed in the internal circuitry 114 or the top cover 112 of the device under test 110 to produce abnormal noise when the vibrator 60 vibrates. Since the positions of the aforementioned test components are known, the hotspot locations can be used as one of the parameters of the AI ​​algorithm. In this embodiment, the device under test 110 can be a laptop computer, but the present invention is not limited thereto.

[0049] Because of the near-field sound pickup effect of the sound guide and sound collector, signal feature analysis is facilitated, followed by abnormal sound enhancement. Furthermore, unlike existing technologies that utilize conventional microphones for far-field sound pickup, this invention not only reduces hardware costs but also, due to the small size of MEMS or EMC microphones combined with the near-field effect of the sound guide and sound collector, helps reduce inter-line interference and improve signal characteristic analysis. In other words, this invention detects the object under test by sound vibration while leveraging the near-field effect of the sound guide and sound collector to facilitate signal analysis and enhance feature extraction, thereby detecting abnormal sounds and their locations. This avoids the need for beamforming algorithms required for far-field sound pickup with conventional microphones, thus significantly improving hotspot accuracy and reducing software costs.

[0050] Please refer to Figure 5 and Figure 6 , Figure 5 This is a detailed structural diagram of each test unit 72 within the noise measurement fixture 100 according to another embodiment of the present invention. Figure 6 For the corresponding Figure 5 An enlarged schematic diagram of another embodiment of the test unit 72 within the noise measurement fixture 100. (See diagram below.) Figure 5 As shown, the test unit 72 and the signal processor 71 together form a test element. In this embodiment, in addition to the pre-amplifier and signal processing unit, the signal processor 71 also has a pickup module containing multiple pickup elements 74. The sound guide tube 116, which is connected to the through hole on the test unit 72, is responsible for converging and focusing the sound to a smaller pickup range. The picked-up sound waves are transmitted along the sound guide tube 116 to the pickup elements 74. Since the tube wall of the sound guide tube 116 has a sound wave shielding effect, it isolates the ambient sound and prevents the sound waves inside the sound guide tube 116 from escaping. It is worth mentioning that in other embodiments, the pickup module and its pickup elements 74 can also be separately set from the signal processor 71 and electrically connected to each other, that is, the signal processor 71 is independent of the pickup module.

[0051] In this embodiment, one end of each sound guide tube 116 is connected to a corresponding pickup element 74, and each pickup element 74 is located in an independent acoustic cavity 78. Figure 6In another embodiment, the sound waves picked up by the sound collecting element 75 are transmitted to the output port 77 and then to the corresponding sound collecting element 74 via the sound guides A1 to A3 (such as sound tubes). Depending on actual needs, sound collecting elements 75 of different shapes and materials can be adapted to the input port 76 of the test unit 72. The sound collecting element 75 helps adjust the focal point size of the sound reception, and its shape can be trumpet-shaped, cone-shaped, or square. The sound collecting element 75 is connected to one end of the sound guides A1 to A3 and they are interconnected. Furthermore, the length, diameter, shape, hardness, and shielding of the sound guides A1 to A3 can be freely adjusted. The support member 81 at the receiving end connects the input port 76 of the device under test 110 to the sound collecting element 75.

[0052] Reference Figure 5 The PCB board 73 in the test component can be considered as a support for the pickup element 74, and its purpose is to fix one or more pickup elements (such as microphones or other pickups). Each pickup element 74 is located in an independent acoustic cavity 78, which is separated from adjacent acoustic cavities by acoustic shielding material to avoid crosstalk and interference from external sounds. Each independent cavity 78 is connected to one end of a corresponding sound guide tube 116. After the pickup element 74 converts the sound wave signal into an electrical signal, it is connected to the signal processing unit of the signal processor 71 at the back end for abnormal sound analysis and hot spot location determination. It is worth mentioning that... Figure 5 and Figure 6 Although one end of the sound tube 116 or one end of the sound guide A1~A3 of the test unit 72 is equipped with a sound collecting element 75, in other embodiments, one end of the sound tube 116 or one end of the sound guide A1~A3 may not be equipped with a sound collecting element 75, and the port of the sound tube 116 or the sound guide A1~A3 can be used directly to perform near-field sound reception on the device under test 110.

[0053] This invention enables near-field, very near-field, and even contact sound pickup through the structure of the sound guide tube 116 or the sound collecting element 75, achieving precise positioning. Furthermore, the size of the focal spot is adjustable, and the pickup element can be positioned far from the sound port, allowing the sound port end to have a high degree of freedom in arranging the spotarray pattern, such as arrangement and spacing, according to the device under test 110, without being limited by the size of the pickup element or the constraints of the cable.

[0054] This invention primarily utilizes a fixture to automatically detect the source of noise, especially the location and diagnosis of abnormal noise. Specifically, when an object or device under test causes abnormal noise due to resonance caused by vibrations from the environment or surrounding objects, the fixture helps to pinpoint the exact location of the noise for targeted repair. Furthermore, this invention primarily uses sound guides A1-A3 or a sound collector 75 for near-field (or very near-field) sound collection and conduction, converting the sound into an electrical signal for automatic signal processing and interpretation by a computer. By using signal processing and AI training to obtain near-field signal characteristics, abnormal noise can be amplified while vibration source noise is removed, achieving a high degree of resolution. Multi-point sound detection using sound guides A1-A3 or a sound collector 75 allows for one-time noise localization, thus avoiding repeated manual single-point measurements. For example, when the device under test is a keyboard or a laptop, its size may be 13.3 to 17 inches. Manually scanning each fixed point is not only time-consuming but also ineffective (hot spots may not be found due to human error). However, by using the noise measurement fixture 100 of this invention for one-time scanning combined with AI algorithm positioning, hot spots can be effectively located in a very short time, which is convenient for engineers to carry out subsequent maintenance or design changes.

[0055] Please refer to Figure 7 , Figure 7 This is a flowchart of an abnormal sound measurement method according to an embodiment of the present invention. Please note that these steps do not necessarily need to be followed if substantially the same result can be obtained. Figure 7 The execution will proceed in the order shown. Figure 7 The method shown can be Figure 1 The 100 noise measurement fixtures shown are used and can be summarized as follows:

[0056] Step 602: Place a standard device (Golden sample) without abnormal noise on the placement platform and obtain corrected sound data under vibration. The corrected sound data is obtained by setting multiple sound guides / sound collection units and their corresponding microphones on the placement platform, and converting the analog signal obtained by the microphones into a digital signal.

[0057] Step 604: When the vibrator is activated, place the device (sample device) with abnormal sound on the placement platform and record the sound of multiple sample devices to obtain multiple training data.

[0058] Step 606: Perform minimum error calculation on the training data based on the corrected sound data to generate minimum error data. If the minimum error data is not less than the threshold, perform iterative calculation on the training data based on the corrected sound data to generate a new minimum error data until the minimum error data is less than the threshold.

[0059] Step 608: After the minimum error calculation is completed, generate the training result using the final minimum error data;

[0060] Step 610: Place the device under test on the placement platform and vibrate the placement platform to collect sound from the device under test, so as to calculate the hot spot location of the device under test associated with the abnormal sound based on the training results.

[0061] It should be noted that during the actual operation of the following steps, the abnormal sound measuring fixture 100 should be in a closed state, that is, the upper cover 20 should be locked to the base 10, so that the collected sound is not affected by the external environment. Regarding step 602, the purpose of this step is to calibrate the internal environment of the abnormal sound measuring fixture, so that the measured white noise can be filtered out when the AI ​​algorithm is executed subsequently.

[0062] In step 602, the "standard state" of the placement platform refers to obtaining calibration sound data by placing a standard test sample (Goldensample) without any abnormal noise on the placement platform 30. The calibration sound data can be obtained by converting analog signals from multiple sound collection units at different locations of a sound source device placed on the placement platform into digital signals.

[0063] Regarding steps 604 to 608, different sample devices are sequentially placed on the platform. The purpose of this step is to feed in training data. For example, the above steps can be further subdivided into the following processes, such as... Figure 8 As shown:

[0064] 1) Take N recording files from the X best samples (Golden sample) (N = number of sound collectors * X);

[0065] 2) Take the P-pen samples for testing, and perform computer analysis using training elements (based on the best samples) to obtain the error difference values ​​e0~eP and the corresponding feature parameters C0~Cn for each sample device;

[0066] 3) Based on the error difference values ​​e0~eP and the threshold, select the corresponding K samples;

[0067] 4) Perform steps 1) to 3) iteratively using the above K samples and X optimal samples until the parameters C0~Cn converge;

[0068] 5) Finally, when the parameters converge, the parameters K0~Kn are trained again based on the current K samples, which is the final training result.

[0069] 6) Based on the parameters K0~Kn, the abnormal sounds of each sound collector can be analyzed separately, and the results of the abnormal sound differences can be amplified.

[0070] In summary, this application effectively solves the problems of the prior art through the novel solution described above. In particular, it enables one-time product debugging in a stable, mechanized, and computerized manner, significantly improving the accuracy of debugging and saving manpower. Furthermore, this invention does not increase costs significantly, effectively improving the problem of prior art requiring substantial manpower to detect hotspots in electronic products while maintaining economic efficiency.

[0071] In the above embodiments, the descriptions of each embodiment have their own emphasis. Parts not described in detail in a certain embodiment can be referred to in the relevant descriptions of other embodiments. The embodiments described above are only some embodiments of this application, not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort, except for designs consistent with the solutions of the embodiments of this application mentioned in this application, are within the scope of protection of this application.

[0072] The embodiments of this application have been described in detail above. Specific examples have been used to illustrate the principles and implementation methods of this application. The descriptions of the embodiments above are only for the purpose of helping to understand the technical solutions and core ideas of this application. Those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features. These modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of this application.

[0073] In summary, although the present application has disclosed the preferred embodiments as described above, the above preferred embodiments are not intended to limit the present application. Those skilled in the art can make various modifications and refinements without departing from the spirit and scope of the present application. Therefore, the scope of protection of the present application shall be determined by the scope defined in the claims.

Claims

1. An unevenness measuring jig characterized by comprising: The utility model relates to a testing device, comprising: a base; a cover connected to the base and forming a sealable box with the base; a shaft connected to the cover; a platform for placing a device to be tested; a fixing member provided on the platform for fixing the device to be tested; a vibrator for vibrating the platform; and a testing element comprising at least one testing unit carried on the shaft for sliding on the shaft, the testing element comprising a plurality of pickup elements each for connecting one end of a sound guide or a first sound collector, and each pickup element being located in an independent acoustic cavity; wherein when the testing unit is driven by an electrical signal to slide above the device to be tested, the other end of the sound guide or the first sound collector is used to collect sound from the device to be tested. The device to be tested is arranged on a first surface of the platform, and the vibrator is arranged on the first surface or a second surface of the platform, wherein the first surface is opposite to the second surface.

2. The off-note measuring jig according to claim 1, wherein A conducting member is arranged between the vibrator and the platform.

3. The off-note measuring tool of claim 1, wherein The testing unit further comprises a plurality of through holes each for connecting the sound guide or the first sound collector, and each through hole has a first spacing with an adjacent through hole.

4. The off-note measuring tool of claim 1, wherein The sound guide is in a tubular structure.

5. The off-note measuring tool of claim 1, wherein The other end of the sound guide is connected to a second sound collector.

6. The off-note measuring tool of claim 1, wherein The platform is provided with a plurality of support members each having a fixed spacing with an adjacent support member.

7. The aberrant sound measuring tool according to claim 1, wherein The design criteria of the distance between two adjacent sound guides or the first sound collecting elements and the distance between the sound guides or the first sound collecting elements and the object to be measured satisfy the formula: wherein x is the horizontal distance between two adjacent sound guides or the first sound collecting elements, y is the vertical distance between the object to be measured and the sound guides or the first sound collecting elements, and dB is the unit of decibel.

8. The off-note measuring tool of claim 1, wherein The testing element further comprises a signal processor, wherein the pickup elements are micro microphone units, and the signal processor is coupled to each micro microphone unit to convert an analog signal from each micro microphone unit into a digital signal.

9. The aberrant sound measuring tool according to claim 1, wherein The acoustic cavity and the pickup element are arranged in the testing unit.

10. The aberrant sound measuring tool according to claim 1, wherein The acoustic cavity and the pickup element are arranged in the signal processor.

11. The aberrant sound measuring tool according to claim 9, wherein The base and the cover are provided with soundproof foam on their side walls.

12. The aberrant sound measuring tool according to claim 1, wherein A fastener is further included for locking the base and the cover.

13. The aberrant sound measuring tool according to claim 1, wherein The top of the base is provided with an inclined opening.

14. The aberrant sound measuring tool according to claim 1, wherein The opening has an inclination angle of 30 to 60 degrees.

15. The aberrant sound measuring tool according to claim 14, wherein When the pickup element is used to connect the sound guide, the through hole comprises an input port and an output port, the input port is used to connect a second sound collector, and the output port is used to connect the other end of the sound guide.

16. The aberrant sound measuring tool according to claim 4, wherein The utility model relates to a testing device, comprising:

17. A method for measuring abnormal sound, applied to the abnormal sound measuring jig of claim 1, characterized in that, placing a standard device without abnormal sound on the platform and collecting sound under vibration to obtain calibration sound data; when the vibrator is actuated, placing a device with abnormal sound on the platform and collecting sound from a plurality of sample devices to obtain a plurality of training data; performing minimum error operation on the training data according to the calibration sound data to generate minimum error data, wherein if the minimum error data is not less than a threshold value, performing iterative operation on the training data according to the calibration sound data to generate a new piece of minimum error data until the minimum error data is less than the threshold value; generating training results using the final minimum error data after the minimum error operation is completed; and ​ ​ The device under test is placed on the placement platform, and the placement platform is vibrated to collect sound of the device under test, so that the hot spot position associated with the abnormal sound of the device under test is calculated according to the training result.

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